PHILIPS 74LVC244A-Q100

Automotive
Innovative package options
Suffix
BQ
PW
D
PW
BQ
PW
GW
GM
SOT763-1
SOT403-1
SOT108-1
SOT402-1
SOT764-1
SOT360-1
SOT363
SOT886
16-pin
16-pin
14-pin
14-pin
20-pin
20-pin
6-pin
6-pin
Width (mm)
2.50
6.40
6.00
6.40
2.50
6.40
2.10
1.00
Length (mm)
3.50
5.00
8.65
5.00
4.50
6.50
2.00
1.45
Pitch (mm)
0.50
0.65
1.27
0.65
0.50
0.65
0.65
0.50
Q100 Logic samples available in e-sample store. Order them today!
Haven’t found your function? Please contact your local NXP representative.
NXP Logic – Q100 logic portfolio
www.nxp.com
© 2012 NXP Semiconductors N.V.
All rights reserved. Reproduction in whole or in part is prohibited without the prior written consent of the
copyright owner. The information presented in this document does not form part of any quotation or contract,
is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by
the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under
patent- or other industrial or intellectual property rights.
Date of release: November 2012
Document order number: 9397 750 17356
Printed in the Netherlands
Continuing to lead the way in automotive logic
Introduction
The operating environment of automobile semiconductor components is much more hostile than that of semiconductors used
in home or portable applications. A television set will generally spend its operating lifetime within an ambient temperature
range of 0 ˚C to 40 ˚C. Due to internal heating, its semiconductor devices can be expected to operate between 20 ˚C and 60 ˚C.
By comparison, an automobile is expected to start at temperatures lower than -20 ˚C and, in some cases, operate within the
engine compartment at temperatures approaching 125 ˚C.
To ensure the reliability of automotive electronics, the Automotive Electronics Council introduced its AEC-Q100 standard which
outlines procedures to be followed to ensure integrated circuits meet the quality and reliability levels required by automotive
applications. As the global number one supplier, the introduction of its Q100 logic portfolio shows NXP continuing to lead the
way in automotive logic.
Six sigma design, zero defect test and inspection methodology
Six sigma design philosophy is applied to all Q100 devices. This ensures that an end user application designed to the datasheet
limits can tolerate a shift as high as one and a half sigma in NXP’s manufacturing processes. As the process control limits are
much tighter than one and a half sigma, this virtually guarantees trouble free end user applications. During electrical test
process, average test limits or statistical test limits are applied to screen outliers within automotive lots. Figure 1 shows the
distribution of devices passing a test and the calculated statistical test limits in red. Although the outliers are within the upper
and lower specification limits they are not delivered as Q100 products.
LSL
Display drivers
Display drivers integrate serial-in, parallel-out shift registers, which are common I/O expansion devices, with a number of
MOSFET LED drivers. With 8-bit and 12-bit solutions, shift register based display drivers enable a controller to drive 8 or 12 LED’s
using 3 output lines. Cascading devices as shown in figure 3 increases the number of LED’s controlled by the same 3 output lines.
Display drivers reduce the size, complexity, pin count and ultimately cost of any micro-controller based solution.
USL
Statistical test
limits
Key benefits of the Q100 logic portfolio
AEC-Q100 product qualification and reliability monitoring
Outliers
Outliers
Fig. 1 Application of statistical test limits
Quality Summary
Logic Products & MCU
Q1/Q2 – 2012
Emile Busink
Quality Assurance
Logic Products / MCU
NXP Semiconductors
Building FB-3.107
Gerstweg 2
6534 AE Nijmegen
The Netherlands
Date:
Report:
September 01st, 2012
RNR-31/O2172 (rev. CT)
Tel:
Fax:
Email:
int + 31 24 353 2116
int + 31 24 353 2820
[email protected]
Operating at elevated temperatures reduces the lifetime of a
semiconductor and temperature cycling has a negative impact on
the stability of a package. In cases where there is no history of a
product’s reliability within automotive applications, a series of
stresses to simulate the life cycle within an automotive environment
must be applied to guarantee conformance to the AEC-Q100
standard.
To ensure continued reliability, NXP logic maintains an extensive
reliability monitoring program; the results of which are published
half yearly. These QSUM reports are available upon request via
your NXP sales representative.
NXP Semiconductors B.V., Gerstweg 2, 6534 AE Nijmegen, The Netherlands
Tel:+ 31 24 3539111 www.nxp.com, Commercial Register Eindhoven no. 17070621
Tightened manufacturing process controls
Q100 devices are
 manufactured in TS16949 certified and VDA approved production facilities
 flagged as automotive lots
 subjected to additional process flow quality gates and stricter rules for lot dis-positioning and maverick lot handling
Dedicated website and datasheets
A summary of NXP logic’s Q100 portfolio including a search by function and a parametric search within each function can be
found at www.nxp.com/products/automotive/logic, and unlike the standard types, each Q100 device has a dedicated datasheet
confirming that it has been qualified in accordance with AEC-Q100 and is suitable for automotive applications.
Priority technical support
NXP’s first and second tier technical support teams give Q100 product design-in assistance their highest priority and upon
request AEC-Q100 production part approval process (PPAP) qualification data will be made available. Due to the stricter
qualification requirements of automotive end user applications, a 180 day process change notification (PCN) approval cycle is
applied for Q100 products instead of the 90 day PCN approval cycle for standard types. In the unlikely event of a quality issue,
NXP logic guarantees a 10 day through put time with initial verification within 24 hours for its Q100 portfolio.
Examples of NXP Q100 logic automotive application areas
i/o expansion
Large pin count controllers are expensive, so when possible to reduce the complexity and pin-count of control solutions, input/
output expansion devices such as multiplexer/de-multiplexer devices are used. Figure 2 shows an example of an 8:1 multiplexer
used to sequentially switch analog sensor signals to a single analog to digital pin of a micro-controller.
This ensures that automotive products
 receive highest priority
 have greater traceability for improved quality analysis

that become outlier lots, passing a quality gate but outside of the acceptable distribution, are assigned to standard,
non-Q100, types.
Interface logic
With high impedance inputs and low impedance outputs, interface logic such as registered or unregistered buffers and line
drivers are used to interface between low drive outputs of a controller and higher loads of, for example, water pumps and
window motors.
Control logic
Control applications such as engine control units and body control modules change settings based upon a combination of input
signals. Control logic consists of simple Boolean functions, such as AND or NAND, to facilitate changing settings in simple
sub-systems that don’t require a micro-controller.
Display Logic
HEF4894B-Q100
NPIC6C595-Q100
NPIC6C596-Q100
Function
12-stage shift-and-store register
LED driver
power logic 8-bit shift register;
open-drain
power logic 8-bit shift register;
open-drain
Control Logic
Function
74LVC1G125-Q100
bus buffer/line driver; 3-state
74LVC1G14-Q100
single Schmitt trigger inverter
74LVC1G17-Q100
single Schmitt trigger buffer
Interface logic
Function
74LVC1G32-Q100
single 2-input OR gate
HEF4093BT-Q100
quad 2-input NAND Schmitt trigger
74LVC244A-Q100
octal buffer/line driver; 3-state
HEF4094BT-Q100
8-stage shift-and-store register
74LVC245A-Q100
octal bus transceiver; 3-state
74HC(T)14-Q100
hex inverting Schmitt trigger
I/O expansion
Function
74HC(T)151-Q100
quad 2-input multiplexer
NX3L4051-Q100
low-ohmic single-pole octal-throw analog switch
74HC(T)244-Q100
octal buffer/line driver; 3-state
HEF4051B-Q100
8-channel analog multiplexer/demultiplexer
74AHC(T)14-Q100
hex inverting Schmitt trigger
HEF4052B-Q100
dual 4-channel analog multiplexer/demultiplexer
74AHC(T)1G08-Q100
2-input AND gate
HEF4066BT-Q100
quad single-pole single-throw analog switch
74AHC1G09-Q100
2-input AND gate with open-drain
74HC(T)138-Q100
3-to-8 line decoder/demultiplexer; inverting
74AHC(T)1G125-Q100
bus buffer/line driver; 3-state
74HC(T)165-Q100
8-bit parallel-in/serial out shift register
74AHC(T)244-Q100
bus buffer/line driver; 3-state
74HC(T)4051-Q100
8-channel analog multiplexer/demultiplexer
74AHC(T)125-Q100
quad buffer/line driver; 3-state
74HC(T)4052-Q100
dual 4-channel analog multiplexer/demultiplexer
Control Logic
Function
74HC(T)4053-Q100
triple 2-channel analog multiplexer/demultiplexer
HEF40106B-Q100
hex inverting Schmitt trigger
74HC(T)4066-Q100
16-channel analog multiplexer/demultiplexer
74HC(T)00-Q100
quad 2-input NAND gate
74HC(T)4851-Q100
8-channel analog mux/demux; injection-current control
74HC(T)04-Q100
hex inverter
74HC(T)4852-Q100
dual 4-channel analog mux/demux; injection-current control
74HC(T)08-Q100
quad 2-input AND gate
74HC(T)595-Q100
8-bit serial-in, serial or parallel-out shift register; 3-state
74HC(T)132-Q100
quad 2-input NAND Schmitt trigger
74LVC08-Q100
quad 2-input AND gate
74HC(T)1G08-Q100
2-input AND gate
74LVC14-Q100
hex inverting Schmitt trigger with 5 V tolerant input
74LVC1G08-Q100
single 2-input AND gate