212952

AEC-Q100G Qualification Summary
144ld LQFP
Objective: Spectrum 1.0M POR Fix Qualification
Freescale PN:
Part Name:
Technology:
Package:
Fab / Assembly /
Final Test Sites:
Maskset#:
Rev#:
Die Size (in mm)
WxLxT
Part Operating
Temp. Grade:
Customer Name(s):
PN(s):
Design Engr:
Phone #:
Product Engr:
Phone #:
Prod. Package
Phone #:
NPI PRQE:
Phone #:
PC5606S
Spectrum 1.0M
0.09um CMOS90 Z3 core
LQFP 144ld 20x20 x 1.4 Pitch 0.5
FSL-ATMC / FSL-KLM-FM
FSL-KLM-FM
M25V
2
5.465 x 5.430 x 0.3302
125°C
Grade 1
Trace/DateCode
Summary Revision # 1.2
Date: 15th March 2013
Amardeep Punhani
QUARTZ Tracking #:
212952
Donald McPhie
(Signature/Date shown below may be electronic)
PPE Approval
Signature & Date:
NPI PRQE Plan Approval
Signature & Date:
CAB Approval
Signature & Date:
Chasity Fleming
Douglas Blackwood
DD87896
QAA1116A
Douglas Blackwood
30th June 2011
eCAB: 11161289M
Neil Ross 30th June 2011
Qualification Argument
2M25V: Minor Via fix to address Power On Reset (POR) errata e3321, this does not impact the reliability performance or NVM performance of the device; generic data applies as detailed below.
Mask Set Errata MPC560XS_1M25V
e3321 MC_RGM: A non-monotonic ramp on the VDDR line can cause the RGM module to clear all flags in the DES register, meaning that code cannot tell if a POR has occurred.
Qualification Results/Conclusion
The 2M25V qualification was successfully completed and passed without issue. No degradation was seen across measured parameters and the POR design fix was validated.
Tests highlighted in yellow will be performed for this study
This testing is performed by Freescale FSL-EKB, FSL-KLM, and FSL-ATX where noted in the Comments
GROUP A - ACCELERATED ENVIRONMENTAL STRESS TESTS
STRESS TEST
PC
HAST
Reference
J=JESD22
Test Conditions
End Point
(Surface Mount Devices Only - PC required
Requirements
for THB, HAST, AC, UHST, TC, PC+PTC)
JESD22- Preconditioning :
TEST @ RHC
A113
MSL 3 @ 260°C, +5/-0°C
J-STD-020 Pre and Post CSAM SS=11 units per lot per stress
test
JESD22- PC before HAST required for SMDs.
TEST @ RH
A110
Highly Accelerated Stress Test, Biased:
HAST = 130°C/85%RH for 96 hrs.
Bias = 5.5V
AC
JESD22A102
TC
JESD22A104
AEC Q100Appendix 3
PTC
HTSL
PC before AC required for SMDs.
Autoclave:
AC = 121°C/100%RH/15 psig for 96 hrs
TEST @ R
Minimum
Sample Size
# of Lots
Total Units
Results
LotID-(#Rej/SS)
NA=Not Applicable
All surface mount devices prior to THB, HAST, AC, Pass by similarity
UHST, TC, PC+PTC
77
0
0
Pass by similarity
77
0
0
Pass by similarity
77
0
0
Pass by similarity
22
0
0
JESD22A105
PC before TC required for SMDs
TEST @ HC
Temperature Cycle:
WBP =/> 3 grams
TC = -65°C to 150°C for 500 cycles.
WBP after TC on 5 devices from 1 lot; 2 bonds per
corner and one mid-bond per side on each device.
Record which pins were used.
Preconditioning plus Power Temperature Cycle:
TEST @ RH
PTC = -40ºC to +125ºC for 1000 cycles.
JESD22A105
Power Temperature Cycle:
PTC = -40ºC to +125ºC for 1000 cycles.
TEST @ RH
23
0
0
JESD22A103
High Temperature Storage Life:
150°C for 1008 hrs
TEST @ RHC
77
0
0
Comments
Generic Data
175437: 0/11 Bolero1.5M 144ld 0M03Y
175437: 0/11 Bolero1.5M 144ld 0M03Y
175437: 0/11 Bolero1.5M 144ld 0M03Y
Generic Data
175437: 0/77 Bolero1.5M 144ld 0M03Y
175437: 0/77 Bolero1.5M 144ld 0M03Y
175437: 0/77 Bolero1.5M 144ld 0M03Y
Generic Data
175437: 0/77 Bolero1.5M 144ld 0M03Y
175437: 0/77 Bolero1.5M 144ld 0M03Y
175437: 0/77 Bolero1.5M 144ld 0M03Y
Generic Data
175437: 0/77 Bolero1.5M 144ld 0M03Y
175437: 0/77 Bolero1.5M 144ld 0M03Y
175437: 0/77 Bolero1.5M 144ld 0M03Y
Wirepull post 500 cycles >3g
Not required.
1. P< 1W
2. DTj < 40°C
3. No Inductive Load
Pass by similarity
See EDR data to cover this item
TEST GROUP B - ACCELERATED LIFETIME SIMULATION TESTS
STRESS TEST
Reference
HTOL
JESD22A108
ELFR
EDR
Test Conditions
End Point
Requirements
Minimum
Sample Size
# of Lots
Total Units
High Temperature Operating Life:
Ta= 125°C for 168 Qual Point, 1008hrs FIO
Bias:
Vdd I/O= 5.0V nom : 6.0V Stress
Vdd core = 1.2V nom : 1.56V Stress
NVM cycling @125°C, as shown in EDR below, is
required
NVM in Checkerboard
AEC Q100- Early Life Failure Rate:
008
Ta = 125°C for 48 hrs;
Bias:
Vdd I/O= 5.0V nom : 6.0V Stress
Vdd core = 1.2V nom : 1.56V Stress
10% of NVM cycling @125°C, as shown in EDR
below, is required
NVM in Checkerboard
TEST @ RHC
77
0
0
Results
LotID-(#Rej/SS)
NA=Not applicable
Pass, performed on 176ld
Comments
TEST @ RHC
800
0
0
Pass by similarity
Generic Data
173479: 0/800 Bolero1.5M 176ld 0M03Y
163078: 0/908 Bolero 512k 144ld 0M27V
163078: 0/843 Bolero 512k 144ld 0M27V
159917: 0/685 Pictus 512k 100ld 0M26V
AEC Q100- NVM Endurance, Data Retention,
005
C-Flash 0: 512Kb Block @ -40°C
100K W/E for 2x16k block size
10K W/E for 3x32k block size
1K W/E for 3x128k block size
C-Flash 1: 512Kb Block @ -40°C
1K W/E for 4x128k block size
D-Flash 0: 64Kb Block @ -40°C
100K W/E for 16k block size
TEST @ RHC
77
0
0
Pass by similarity
Generic Data Performed in EKB
193757: Lot 1 0/77 Spectrum 176ld 1M25V
193757: Lot 2 0/77 Spectrum 176ld 1M25V
193757: Lot 3 0/77 Spectrum 176ld 1M25V
TEST @ RHC
77
0
0
Pass by similarity
Generic Data Performed in EKB
193757: Lot 1 0/77 Spectrum 176ld 1M25V
193757: Lot 2 0/77 Spectrum 176ld 1M25V
193757: Lot 3 0/77 Spectrum 176ld 1M25V
Performed on 176ld
212552: Spectrum 2M25V 176ld 0/77
NVM in Checkerboard 1008hrs @ 150°C
NVM Endurance, Data Retention,
C-Flash 0: 512Kb Block @ 125°C
100K W/E for 2x16k block size
10K W/E for 3x32k block size
1K W/E for 3x128k block size
C-Flash 1: 512Kb Block @ 125°C
1K W/E for 4x128k block size
D-Flash 0: 64Kb Block @ 125°C
100K W/E for 16k block size
NVM in Checkerboard 1008hrs @ 150°C
FORMPPAP004XLS
1 of 3
Freescale Rev U
Freescale PN: PC5606S
Part Name: Spectrum 1.0M
Customer Name(s):
PN(s):
Summary Revision # 1.2
Date: 15th March 2013
TEST GROUP C - PACKAGE ASSEMBLY INTEGRITY TESTS
STRESS TEST
WBS
AEC Q100- Wire Bond shear
001
Cpk = or > 1.67
30 bonds
from minimum
5 units
0
0
Results
LotID-(#Rej/SS)
NA=Not applicable
Pass by similarity
WBP
MilStd883- Wire Bond Pull
2011
Cond. C or D
Cpk = or > 1.67
30 bonds
from minimum
5 units
0
0
Pass by similarity
Generic Data
193777: Spectrum 1.0M 144ld 1M25V
Cpk = 2.51
>95% lead coverage
of critical areas
15
0
0
Pass by similarity
Standard package, generic data can be supplied on
request
Cpk = or > 1.67
10
0
0
Pass by similarity
Standard package, In-line data can be supplied on request
Cpk = or >1.67
10
0
0
Pass by similarity
5
0
0
N/A - not required for SM
devices.
SD
PD
SBS
LI
Reference
Test Conditions
JESD22B102
Solderability;
8hr. Steam age (1 hr. for Au-plated leads) prior to
test.
If production burn-in is done, samples must also
undergo burn-in.
JESD22- Physical Dimensions B100
PD per 98A drawing
AEC-Q100- Solder Ball Shear;
Performed on all solder ball mounted packages e.g.
010
PBGA, Chip Scale, Micro Lead Frame (but NOT
Flip Chip).
Two 260°C reflow cycles before shear.
JESD22- Lead Integrity
B105
Not required for surface mount devices;
End Point
Requirements
Minimum
Sample Size
# of Lots
Total Units
Comments
Generic Data
193777: Spectrum 1.0M 144ld 1M25V
Cpk = 1.86
(5 balls from a min. of
10 devices)
No lead breakage or
cracks
TEST GROUP D - DIE FABRICATION RELIABILITY TESTS
STRESS TEST
Reference
Test Conditions
End Point
Requirements
Minimum
Sample Size
# of Lots
Total Units
Electro Migration
Negative Bias Temperature Instability
Time Dependent Dielectric Breakdown
Hot Carrier Injection
Stress Migration
EM
NBTI
TDDB
HCI
SM
Results
LotID-(#Rej/SS)
NA=Not applicable
Report available on request
Report available on request
Report available on request
Report available on request
Report available on request
Comments
Comments
TEST GROUP E - ELECTRICAL VERIFICATION TESTS
STRESS TEST
Reference
TEST
Freescale
48A
Test Conditions
Pre- and Post Functional / Parametrics
Test software shall meet requirements of AECQ100-007.
Testing performed to the limits of device
specification in temperature and limit value.
End Point
Requirements
Minimum
Sample Size
# of Lots
Total Units
0 Fails
All
All
All
Results
LotID-(#Rej/SS)
NA=Not applicable
Lot 1: DD87896 Pass
AEC-Q100- ElectroStatic Discharge/
ESD
002
Human Body Model Classification:
(HBM)
Test @ 500 / 1000 / 1500 / 2000Volts
CLASSIFICATION
See AEC-Q100-002 for classification levels.
TEST @ RH
2KV min.
3 units per
Voltage level
0
0
Pass, performed on 176ld
Performed on 176ld
212552: Spectrum 2M25V 176ld
500V 0/3
1000V 0/3
1500V 0/3
2000V 0/3
AEC-Q100- ElectroStatic Discharge/
ESD
003
Machine Model Classification:
(MM)
Test @ 50 / 100 / 150 / 200Volts
CLASSIFICATION
See AEC-Q100-003 for classification levels.
TEST @ RH
200V min.
3 units per
Voltage level
0
0
Pass, performed on 176ld
Performed on 176ld
212552: Spectrum 2M25V 176ld
50V 0/3
100V 0/3
150V 0/3
200V 0/3
AEC-Q100- ElectroStatic Discharge/
ESD
011
Charged Device Model Classification:
(CDM)
Test @ 250 / 500 / 750 Volts
CLASSIFICATION
See AEC-Q100-011 for classification levels.
TEST @ RH
3 units per
Corner pins =/> 750V; Voltage level
All other pins =/>
500V
1
9
Lot1:
250V 0/3
500V 0/3
750V 0/3 Corner pins
Performed in KLM
6
Lot1: 0/6
Performed in KLM
Pass, performed on 176ld
Performed on 176ld
212552: Spectrum 2M25V 176ld 0/30
LU
JESD78 Latch-up:
Test per JEDEC JESD78 with the AEC-Q100-004
plus
AEC-Q100- requirements. 100mA @ 125C
TEST @ RH
6
1
ED
AEC-Q100- Electrical Distribution
009,
Freescale
48A spec
AEC-Q100- Fault Grading
007
TEST @ RHC
Cpk = or > 1.67
30
0
FG
CHAR
GL
FG shall be = or >
98% for qual units
99.11%
AEC-Q003 Characterization:
Performed on new technologies and part families.
AEC-Q100- Electro-Thermally Induced Gate Leakage;
006
155°C, 2.0 min, +400/-400 V
FORMPPAP004XLS
TEST @ R
6
0
2 of 3
0
Pass
Completed on 1M25V. Validation performed on 176ld for fix
to POR.
Pass by similarity
Generic Data
193777: Spectrum 1M25V 0/6
Freescale Rev U
Freescale PN: PC5606S
Part Name: Spectrum 1.0M
Electromagnetic Compatibility
SAE
EMC
J1752/3 - (see AEC Q100 Appendix 5 for test applicability;
Radiated done on case-by-case basis per
Emissions customer/Freescale agreement)
SC
Customer Name(s):
PN(s):
<40dBuV
150kHz - 1GHz
AEC Q100- Short Circuit Characterization
012
Applicable to all smart power devices. This test
and statistical evaluation (see section 4 of Q100012) shall be performed per agreement between
user and supplier on a case-by-case basis.
SER
JEDEC Unaccelerated:
JESD89-1 or
Accelerated:
JESD89-2 &
JESD89-3
Soft Error Rate
Applicable to devices with memory sizes 1Mbit
SRAM or DRAM based cells. Either test option (unaccelerated or accelerated) can be performed, in
accordance to the referenced specifications. This
test and its accept criteria is user and supplier on a
case-bycase basis. Final test report shall include
detailed test facility location and altitude data.
STRESS TEST
Reference
Test Conditions
Summary Revision # 1.2
Date: 15th March 2013
Pass by similarity
Generic Data
193757: Spectrum 1M25V Passed
1
0
0
10
0
0
NA - Not applicable to
microcontroller
NA - Not applicable to microcontroller
3
0
0
Pass by similarity
Generic Data
193757: Spectrum 1M25V Passed
TEST GROUP F - DEFECT SCREENING TESTS
PAT
AEC Q001 Part Average Testing
SBA
AEC Q002 Statistical Bin Analysis
Generic
Quartz
173479
175437
163078
159917
193757
193777
212552
Data:
Device
PC5607B
PC5607B
PC5604B
PC5604P
PC5606S
PC5606S
PC5606S
Revision
1.0
1.1
1.2
FORMPPAP004XLS
Mask
0M03Y
0M03Y
0M27V
0M26V
1M25V
1M25V
2M25V
Title
Bolero 1.5M AEC 176ld Qual
Bolero 1.5M AEC 144ld Qual
Bolero 512k 144ld NPI Qual
Pictus 512k 100ld NPI Qual
Spectrum 1.0M 176ld NPI Qual
Spectrum 1.0M 144ld NPI Qual
Spectrum 1.0M 176ld NPI Qual
Revision Date
4th April 2011
30th June 2011
15th March 2013
End Point
Requirements
Minimum
Sample Size
# of Lots
Total Units
Has PAT been
established for this
part?
Has SBYA been
established for this
part?
Fab
ATMC
ATMC
ATMC
ATMC
ATMC
ATMC
ATMC
Mould
HITACHI CEL-9240
SUMITOMO EME-G700E
SUMITOMO EME-G700E
SUMITOMO EME-G700E
HITACHI CEL-9240
SUMITOMO EME-G700E
HITACHI CEL-9240
Results
LotID-(#Rej/SS)
NA=Not applicable
Implemented
Comments
Implemented
Die Size
5.082 x 5.301
5.082 x 5.301
4.261 x 4.471
4.351 x 4.062
5.465 x 5.430
5.465 x 5.430
5.465 x 5.430
x
x
x
x
x
x
x
0.33mm
0.33mm
0.33mm
0.33mm
0.33mm
0.33mm
0.33mm
Description
Original Plan.
Updated results
Updated format for web reporting, Added qualification argument
3 of 3
CAB
09412905M
09412906M
08462238M
08462222M
08462223M
08462224M
11161289M
Douglas Blackwood
Douglas Blackwood
Douglas Blackwood
Freescale Rev U