TK40J60T TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (DTMOS) TK40J60T Switching Regulator Applications Unit: mm 20.0±0.3 9.0 2.0 3.3max. 1.0 2.0 Low drain-source ON resistance: RDS (ON) = 0.068Ω (typ.) High forward transfer admittance: ⎪Yfs⎪ = 25 S (typ.) Low leakage current: IDSS = 100 μA (VDS = 600 V) Enhancement-mode: Vth = 3.0~5.0 V (VDS = 10 V, ID = 1 mA) 4.5 Ф3.2±0.2 15.9max. • • • • Absolute Maximum Ratings (Ta = 25°C) VDSS 600 V Gate-source voltage VGSS ±30 V (Note 1) ID 40 Pulse (t = 1 ms) (Note 1) IDP 80 DC Drain current A 5.45±0.2 1 Drain power dissipation (Tc = 25°C) PD 400 W Single pulse avalanche energy (Note 2) EAS 576 mJ Avalanche current IAR 40 A Repetitive avalanche energy EAR 40 mJ Channel temperature Tch 150 °C Storage temperature range Tstg -55~150 °C (Note 3) 5.45±0.2 4.8max. Drain-source voltage +0.3 1.0 -0.25 2 2.8 Unit +0.3 Rating 0.6-0.1 Symbol 1.8max. Characteristics 20.5±0.5 2.0±0.3 3 1. Gate 2. Drain(heat sink) 3. Source ⎯ JEDEC JEITA SC-65 TOSHIBA 2-16C1B Weight : 4.6 g (typ.) Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/’’Derating Concept and Methods’’) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Thermal Characteristics Characteristics Symbol Max Unit Thermal resistance, channel to case Rth (ch-c) 0.313 °C/W Thermal resistance, channel to ambient Rth (ch-a) 50 °C/W 2 Note 1: Please use devices on conditions that the channel temperature is below 150°C. 1 Note 2: VDD = 90 V, Tch = 25 °C (initial), L = 0.63 mH, RG = 25 Ω, IAR = 40 A Note 3: Repetitive rating: pulse width limited by maximum channel temperature This transistor is an electrostatic sensitive device. Please handle with caution. 1 3 2007-08-30 TK40J60T Electrical Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Gate leakage current IGSS VGS = ±30 V, VDS = 0 V ― ― ±1 μA Drain cut-off current IDSS VDS = 600 V, VGS = 0 V ― ― 100 μA V (BR) DSS ID = 10 mA, VGS = 0 V 600 ― ― V Vth VDS = 10 V, ID = 1 mA 3.0 ― 5.0 V Drain-source ON resistance RDS (ON) VGS = 10 V, ID = 20 A ― 0.068 0.08 Ω Forward transfer admittance ⎪Yfs⎪ VDS = 20 V, ID = 20 A 6 25 ― S Input capacitance Ciss ― 3900 ― Reverse transfer capacitance Crss ― 280 ― Output capacitance Coss ― 9200 ― ― 60 ― ― 120 ― Gate threshold voltage Rise time VDS = 10 V, VGS = 0 V, f = 1 MHz Turn-on time ton Switching time Fall time ID = 20A 10 V VGS 0V tr tf Turn-off time VDD ∼ − 300 V Duty < = 1%, tw = 10 μs toff Total gate charge VOUT RL = 15Ω 50 Ω Drain-source breakdown voltage Qg Gate-source charge Qgs Gate-drain charge Qgd VDD ∼ − 400 V, VGS = 10 V, ID = 40 A pF ns ― 15 ― ― 200 ― ― 67 ― ― 45 ― ― 22 ― nC Source-Drain Ratings and Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit (Note 1) IDR ― ― ― 40 A (Note 1) IDRP ― ― ― 80 A Continuous drain reverse current Pulse drain reverse current Forward voltage (diode) VDSF IDR = 40 A, VGS = 0 V ― ― -1.7 V Reverse recovery time trr IDR = 40 A, VGS = 0 V, ― 550 ― ns Reverse recovery charge Qrr dIDR/dt = 100 A/μs ― 14 ― μC Marking TOSHIBA K40J60T Part No. (or abbreviation code) Lot No. A line indicates Lead (Pb)-Free Finish 2 2007-08-30 TK40J60T ID – VDS 40 ID – VDS 80 Common source Tc = 25°C Pulse Test 8 10 (A) (A) ID 24 6.3 16 Drain current ID Drain current 6.5 6 8 1 2 3 Drain-source voltage 4 VDS 7 48 6.5 32 6 16 VGS = 5.5V 0 VGS = 5.5 V 0 5 0 (V) 10 40 VDS 50 (V) VDS – VGS (V) Common source Tc = 25°C Pulse Test 8 VDS 48 Drain-source voltage ID (A) Drain current 30 10 Common source VDS = 20 V Pulse Test 64 20 Drain-source voltage ID – VGS 80 Common source 7.5 Tc = 25°C Pulse Test 8 64 32 0 10 7 32 Tc = −55°C 100 25 16 6 4 ID = 40 A 2 20 10 0 0 2 4 6 Gate-source voltage 8 VGS 0 10 0 (V) Common source Tc = −55°C 10 100 25 1 1 16 VGS 20 (V) RDS (ON) – ID Drain-source ON resistance RDS (ON) (Ω) (S) Forward transfer admittance ⎪Yfs⎪ 12 1 VDS = 10 V Pulse Test 0.1 0.1 8 Gate-source voltage |Yfs| – ID 100 4 10 0.1 0.01 100 Drain current ID (A) Common source Tc = 25°C Pulse Test VGS = 10,15 V 1 10 100 Drain current ID (A) 3 2007-08-30 TK40J60T IDR − VDS RDS (ON) − Tc Common source VGS = 10 V Pulse Test ID = 40A 20 0.15 10 0.1 0.05 0 −80 −40 0 40 80 120 Common source Tc = 25°C Pulse Test 10 10,15 5 1 3 0.1 0 160 Case temperature Tc (°C) 0.3 0.6 0.9 1.2 VDS 1.5 (V) Vth − Tc Capacitance – VDS 5 (pF) Ciss 1000 Coss 100 Crss Common source VGS = 0 V f = 1 MHz Tc = 25°C 1 0.1 1 10 Drain-source voltage 100 4 3 2 1 Common source VDS = 10 V ID = 1mA 0 Pulse Test −80 −40 0 40 80 120 160 Case temperature Tc (°C) VDS (V) Dynamic input / output characteristics PD − Tc 500 (V) 500 400 VDS VDS 400 20 Common source ID = 40 A Tc = 25°C 16 Pulse Test Drain-source voltage 300 200 100 0 0 40 80 120 160 300 400V Case temperature Tc (°C) 200V 200 8 VGS 4 100 0 200 12 VDD = 100V 0 20 40 60 80 VGS (V) 10 Gate threshold voltage Vth (V) 10000 Capacitance C VGS = 0 V Drain-source voltage 100000 Drain power dissipation PD (W) 1 Gate-source voltage 0.2 100 Drain reverse current IDR (A) Drain-source ON resistance RDS (ON) (Ω) 0.25 0 100 Total gate charge Qg (nC) 4 2007-08-30 TK40J60T Normalized transient thermal impedance rth (t)/Rth (ch-c) rth – tw 10 1 Duty=0.5 0.2 0.1 0.1 PDM SINGLE PULSE 0.05 t 0.02 T Duty = t/T Rth (ch-c) = 0.313°C/W 0.01 0.01 10μ 100μ 1m 10m Pulse width 100m EAS – Tch ID max (pulse) * 100 μs * Avalanche energy Drain current ID (A) EAS (mJ) 800 ID max (continuous) 1 ms * 10 DC OPEATION Tc = 25°C 1 0.1 ※ Single pulse Ta=25℃ Curves must be derated linearly with increase in temperature. 0.01 1 10 tw (s) SAFE OPERATING AREA 1000 100 1 10 Drain-source voltage 600 400 200 0 25 VDSS max 100 50 75 100 125 Channel temperature (initial) 150 Tch (°C) 1000 VDS (V) 15 V BVDSS IAR −15 V VDD TEST CURCUIT RG = 25 Ω VDD = 90 V, L = 0.63 mH 5 VDS WAVE FORM Ε AS = ⎛ ⎞ 1 B VDSS ⎟ ⋅ L ⋅ I2 ⋅ ⎜ ⎜B ⎟ − 2 V DD ⎠ ⎝ VDSS 2007-08-30 TK40J60T RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 6 2007-08-30