TOSHIBA 2SA2070

2SA2070
TOSHIBA Transistor Silicon PNP Epitaxial Type
2SA2070
High-Speed Switching Applications
DC-DC Converter Applications
Unit: mm
•
High DC current gain: hFE = 200 to 500 (IC = -0.1 A)
•
Low collector-emitter saturation voltage: VCE (sat) =- 0.20 V (max)
•
High-speed switching: tf = 70 ns (typ.)
Maximum Ratings (Ta = 25°C)
Characteristics
Symbol
Rating
Unit
Collector-base voltage
VCBO
−50
V
Collector-emitter voltage
VCEO
−50
V
Emitter-base voltage
VEBO
−7
V
DC
IC
−1.0
Pulse
ICP
−2.0
IB
−0.1
Collector current
Base current
DC
Collector power
dissipation
t = 10 s
Junction temperature
Storage temperature range
PC (Note)
1.0
2.0
A
A
W
JEDEC
―
Tj
150
°C
JEITA
SC-62
Tstg
−55 to 150
°C
TOSHIBA
2-5K1A
Note: Mounted on an FR4 board (glass epoxy, 1.6 mm thick, Cu area:
2
645 mm )
Weight: 0.05 g (typ.)
Electrical Characteristics (Ta = 25°C)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
Collector cut-off current
ICBO
VCB = −50 V, IE = 0
―
―
−100
nA
Emitter cut-off current
IEBO
VEB = −7 V, IC = 0
―
―
−100
nA
V (BR) CEO
IC = −10 mA, IB = 0
−50
―
―
V
hFE (1)
VCE = −2 V, IC = −0.1 A
200
―
500
hFE (2)
VCE = −2 V, IC = −0.3 A
125
―
―
Collector-emitter breakdown voltage
DC current gain
Collector-emitter saturation voltage
VCE (sat)
IC = −0.3 A, IB = −0.01 mA
―
―
−0.20
Base-emitter saturation voltage
VBE (sat)
IC = −0.3 A, IB = −0.01 mA
―
―
−1.10
V
VCB = −10 V, IE = 0, f = 1 MHz
―
8
―
pF
―
60
―
―
280
―
―
70
―
Collector output capacitance
Rise time
Switching time
Storage time
Fall time
Cob
tr
tstg
tf
See Figure 1.
VCC ≈ −30 V, RL = 100 Ω
IB1 = −IB2 = −10 mA
1
V
ns
2004-07-07
2SA2070
Marking
IB2
Input
IB1
IB1
Part No. (or abbreviation code)
RL
VCC
20 µs
4
Output
IB2
Lot No.
Duty cycle < 1%
Figure 1
C
A line indicates
lead (Pb)-free package or
lead (Pb)-free finish.
Switching Time Test Circuit &
Timing Chart
2
2004-07-07
2SA2070
IC − VCE
−1
hFE − IC
−50
−40
3000 Common emitter
VCE = −2 V
Single nonrepetitive pulse
−30
−0.8
hFE
−20
−15
−10
−0.6
DC current gain
IC (A)
−100
Collector current
5000
−5
−0.4
−2
IB = −1mA
−0.2
−0.2
−0.4
−0.8
−0.6
Collector-emitter voltage
−1
VCE
Ta = 100°C
300
25
−55
100
30
Common emitter
Ta = 25°C
Single nonrepetitive pulse
0
−0
0
1000
10
−0.001
−1.2
−0.003 −0.01
(V)
−0. 1
−0.3
−1
Collector current IC (A)
VCE (sat) − IC
VBE (sat) − IC
−10
−5
−3 Common emitter
IC/IB = 30
Single nonrepetitive pulse
Common emitter
Base-emitter saturation voltage
VBE (sat) (V)
Collector-emitter saturation voltage
VCE (sat) (V)
−0.03
−1
−0.3
−0.1
Ta = 100°C
−0.03
25
−0.01
−0.001
−55
−0.03
25
−1
Ta = 100°C
−0.3
−0.1
−55
−0.03
−0.001
−0.003 −0.01
IC/IB = 30
Single nonrepetitive pulse
−3
−0. 1
−0.3
−1
−0.003
−0.01
−0.03
−0.1
−0.3
−1
Collector current IC (A)
Collector current IC (A)
IC – VBE
Collector current
IC (A)
−1
−0.8
Common emitter
VCE = −2 V
Single nonrepetitive pulse
−0.6
−0.4
Ta = 100°C
25
−0.2
0
0
−0.2
−0.4
−0.6
Base-emitter voltage
−0.8
VBE
−55
−1.0
−1.2
(V)
3
2004-07-07
2SA2070
rth – tw
Transient thermal resistance
rth (j-a) (°C/W)
1000
100
10
Curves should be applied in thermal limited area.
Single nonrepetitive pulse
Ta = 25°C
Mounted an on FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645
1
0.001
2
0.01
0.1
1
Pulse width
10
tw
100
1000
(s)
Safe Operating Area
−3
−1
IC max (pulsed)*
IC max (continuous)
10 ms* 1 ms* 100 µs*
10 µs*
10 s*
DC operation
(Ta = 25°C)
−0.3
100 ms*
*: Single nonrepetitive pulse
Ta = 25°C
−0.1 Note that the curves for 100 ms,
10 s and DC operation will be
different when the devices aren’t
mounted on an FR4 board (glass
−0.03 epoxy, 1.6 mm thick, Cu area:
645 mm2). These characteristic
curves must be derated linearly
with increase in temperature.
−0.01
−0.1
−0.3
−1
−3
Collector-emitter voltage
VCEO max
Collector current IC
(A)
−10
−10
VCE
−30
−100
(V)
4
2004-07-07
2SA2070
RESTRICTIONS ON PRODUCT USE
030619EAA
• The information contained herein is subject to change without notice.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of
TOSHIBA or others.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
• TOSHIBA products should not be embedded to the downstream products which are prohibited to be produced
and sold, under any law and regulations.
5
2004-07-07