TA1274F TOSHIBA BIPOLAR LINEAR INTEGRATED CIRCUIT SILICON MONOLITHIC TA1274F PIF / SIF SYNCHRONOUS DEMODULATOR IC FEATURES · Compatible pin assignment to TA1267AF PIF CIRCUIT · True synchronous PIF demodulator · 3-stages gain controlled PIF amplifier · High speed response PIF AGC detector · Buzz reducer · Equalizer for video output · AFT detector without extra reference circuit SIF CIRCUIT · Wide range gain controlled SIF amplifier (control range : 70dB typ.) Weight: 0.27 g (typ.) · Alignment-free PLL-FM demodulator 1 2002-12-20 TA1274F BLOCK DIAGRAM 2 2002-12-20 TA1274F TERMINAL FUNCTION PIN No. NAME FUNCTION 1 24 PIF input Differential type inputs. Typical input level is 85 dBµV. 2 RF AGC output Open collector (PNP) type output. Maximum output current is 0.5 mA. 3 AGC filter Connect a capacitor (0.47 µF) between GND. 4 5 EQ amplifier output EQ filter No.4 terminal is EQ amplifier output. Maximum output current of this terminal is 5 mA. No.5 terminal is for EQ filter. 6 7 ― N.C. Bias filter INTERFACE CIRCUIT Connect a capacitor (10 µF) between GND. 3 2002-12-20 TA1274F PIN No. 8 NAME FUNCTION EQ amplifier input EQ amplifier inputs. 9 APC filter Connect a resister (330 Ω) and a capacitor (0.47 µF) between GND in series. And connect a capacitor (1000 pF) between this terminal and GND. Sensitivity of phase detector is 400 µA / rad (Typ.), and sensitivity of VCO is 1.8 MHz / V (Typ.). 10 Video output Connect a resister (1 kΩ) between GND. Maximum output current is 10 mA. 11 2 nd SIF output 2 nd SIF signal is outputted from this terminal. 12 FM demodulating filter Connect a capacitor (2.2 µF) between GND. 4 INTERFACE CIRCUIT 2002-12-20 TA1274F PIN No. NAME FUNCTION RF AGC delay adj. This terminal is for RF AGC delay point adjustment.100 µA current is outputted from this terminal. Connect a resister (5.6 kΩ) and a volume (10 kΩ) between GND in series. 14 AFT Defeat SW This terminal is AFT defeat switch. To open this terminal, AFT function is activate. To connect GND this terminal, AFT function is not activate. And terminal No.20 goes to 1 / 2 VCC. 15 (No function) This terminal must be connected to VCC. 16 2 nd SIF input This terminal 2nd SIF input. This terminal must be decoupled outer circuit on D.C. 17 AF output Output resistance of this terminal is 7.5 kΩ. 18 19 VCO tank Connect tank for VCO between these terminals. Capacitance of the VCO tank is 27 pF. 13 5 INTERFACE CIRCUIT ― 2002-12-20 TA1274F PIN No. NAME FUNCTION 20 AFT output Push-pull type current output. Reverse type AFT. 21 VCC Operating voltage range is 9.0 V ± 10%. 22 SIF input In use inter-carrier application, connect this terminal to GND. In this condition, the SIF amplifier sets gain minimum. 23 GND ― INTERFACE CIRCUIT ― ― 6 2002-12-20 TA1274F MAXIMUM RATINGS (Ta = 25°C) CHARACTERISTIC SYMBOL RATING UNIT VCC 13 V PD max 1040 (Note 1) mW Operating Temperature Topr −20~75 °C Storage Temperature Tstg −55~150 °C Supply Voltage Power Dissipation Note 1: This value is on condition that the IC is mounted on PCB (50 mm × 50 mm). When using the device at Ta = 25°C, decrease the power dissipation by 8.3 mW for each increase of 1°C. OPERATING SUPPLY VOLTAGE PIN No. PIN NAME MIN TYP. MAX UNIT 21 VCC 8.1 9.0 9.9 V ELECTRICAL CHARACTERISTICS DC current characteristics (VCC = 9.0 V, Ta = 25°C) PIN No. PIN NAME SYMBOL MIN TYP. MAX UNIT 21 VCC ICC 36 45 60 mA DC voltage characteristics (VCC = 9.0 V, Ta = 25°C) PIN No. SYMBOL TEST CIRCUIT TEST CONDITION MIN TYP. MAX 1 V1 ― ― 3.5 4.0 4.5 4 V4 ― 4.7 5.2 5.7 5 V5 ― ― 4.7 5.2 5.7 ― 6.3 7.0 7.7 4.7 5.2 5.7 No signal input 7 V7 ― 10 V10 ― 11 V11 ― ― 3.1 3.5 3.9 14 V14 ― ― 2.5 3.1 3.7 15 V15 ― ― 2.5 3.1 3.7 16 V16 ― ― 2.5 3.1 3.7 17 V17 ― 3.2 3.7 4.2 18 V18 ― 7.2 7.6 7.9 19 V19 ― 20 V20 ― 22 V22 ― 24 V24 ― No signal input 2nd SIF 4.5 MHz ― ― 7.2 7.6 7.9 4.3 4.5 4.7 ― 4.9 5.3 5.7 ― 3.5 4.0 4.5 In AFT defeat 7 UNIT V 2002-12-20 TA1274F AC CHARACTERISTICS (VCC = 9.0 V, Ta = 25°C) PIF section SYMBOL TEST CIRCUIT PIF Input Sensitivity vin min (p) ― PIF Maximum Input Signal vin max (p) ― PIF Gain Control Range RAGC (p) ― RF AGC Maximum Output Voltage VAGC max ― RF AGC Minimum Output Voltage VAGC min ― PIF Input Resistance (*) Zin R (p) ― PIF Input Capacitance (*) Zin C (p) ― Differential Gain DG ― Differential Phase DP ― Intermodulation IM ― Video Output Signal Amplitude vDet (p) ― Video Output S / N CHARACTERISTIC TEST CONDITION MIN TYP. MAX ― 40 45 105 113 ― 68 73 ― dB 8.5 8.9 ― V ― 0.0 0.1 V ― 1.2 ― kΩ ― 3.6 ― pF ― 1.0 3.0 % ― 3.0 5.0 deg (Note 5) 50 55 ― dB (Note 6) 2.0 2.2 2.4 V dB (Note 1) (Note 2) (Note 3) (Note 4) UNIT dBµV S / N (p) ― (Note 7) 55 60 ― Synchronous Signal Level Vsync ― (Note 8) 2.4 2.7 3.0 Threshold Level of the Black Noise Inverter VthB ― 1.7 2.0 2.3 Clamp Level of the Black Noise Inverter VcpB ― 3.3 3.6 3.9 Video Bandwidth (−3 dB) fDet (p) ― 6 8 10 Capture Range of the PLL (Upper) fp (p) H ― 1.8 2.3 ― Capture Range of the PLL (Lower) fp (p) L ― ― −2.0 −1.5 Hold Range of the PLL (Upper) fh (p) H ― 1.8 2.3 ― Hold Range of the PLL (Lower) fh (p) L ― ― −2.0 −1.5 Control Steepness of the VCO β ― ― 1.8 ― MHz / V SAFT ― 20 25 30 kHz / V AFT Maximum Output Voltage VAFT max ― 8.5 8.8 ― AFT Minimum Output Voltage VAFT min ― ― 0.4 0.6 AFT Output Voltage On Defeating VAFT Def ― 4.3 4.5 4.7 Steepness of the AFT Detection *: (Note 9) (Note 10) (Note 11) (Note 12) (Note 13) (Note 14) V MHz MHz V Not tested 8 2002-12-20 TA1274F SIF section CHARACTERISTIC SIF Maximum Input Signal SIF Gain Control Range SYMBOL TEST CIRCUIT vin max (s) ― RAGC (s) ― SIF Input Resistance (*) Zin R (s) ― SIF Input Capacitance (*) TEST CONDITION (Note 15) (Note 16) MIN TYP. MAX UNIT 105 118 ― dBµV 55 75 ― dB ― 10 ― kΩ Zin C (s) ― ― 2.8 ― pF Limiting Sensitivity vin lim ― (Note 17) ― 40 45 dBµV AM Reduction Ratio AMR ― (Note 18) 55 68 ― dB AF Output Signal Amplitude VDet (s) ― 350 500 710 mVrms AF Output S / N S / N (s) ― 55 63 ― dB THD ― ― 0.2 1.0 % Hold Range of the FM Demodulator (Lower) fh (s) L ― ― ― 3.9 Hold Range of the FM Demodulator (Upper) fh (s) H ― 5.3 ― ― Capture Range of the FM Demodulator (Upper) fp (s) H ― ― ― 4.0 Capture Range of the FM Demodulator (Lower) fp (s) L ― 5.2 ― ― RR ― ― ― −22 Total Harmonics Distortion Ripple Rejection *: (Note 19) (Note 20) MHz (Note 21) (Note 22) MHz dB Not tested 9 2002-12-20 J1 J1 ― Note 2 Note 3 INPU TPOI NT Note 1 NOTE TP1 TP24 TP2 TP10 MEAS .POIN T MEASUREMENTS PIF section OFF OFF OFF SW3 ON ON ON SW8 ― Min. Max. ― VR13 OFF OFF OFF SW14 b 10 TEST CONDITION ON ON ON ON ON ON SW17 SW22 2002-12-20 · Measure resistance (Zin R (p) kΩ) and capacitance (Zin C (p) pF) of TP1 and TP24 by the impedance meter. · Remove all connections from terminal 1 and terminal 24. · Measure voltage at TP 2 (VAGC min V.) · Set VR13 to the maximum. · Measure voltage at TP 2 (VAGC max V.) · Set VR13 to the minimum. · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, 15 kHz sine wave / 30% AM) to J1. · Calculate RAGC (p) show as below. · Change amplitude of the input signal, and measure amplitude of the output signal at TP10. · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, 15 kHz sine wave / 30% AM) to J1. TA1274F J1 J1 Note 4 Note 5 NOTE TP4 TP4 INPUT MEAS POIN .POIN T T OFF OFF SW3 ON ON SW8 ― ― VR13 OFF OFF SW14 b 11 TEST CONDITION ON ON ON ON SW17 SW22 2002-12-20 · Measure frequency spectrum of the output signal at TP4. · Apply DC voltage to TP3 and adjust it so that the bottom of the output signal at TP4 is equal to Vmin. · Input the mixture of 3 signals (signal 1 Frequency : 45.75 MHz, Amplitude : 85 dBµV, signal 2 Frequency : 42.17 MHz, Amplitude : 75 dBµV, and signal 3 Frequency : 41.25 MHz, Amplitude : 75 dBµV ) to J1. · Measure the minimum voltage of the output signal at TP4 (Vmin). · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, 15 kHz sine wave / 30% AM) from J1. · Measure DG and DP at TP4. · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, amplitude modulated by 10 step signal) to J1. TA1274F J1 J1 J1 J1 Note 6 Note 7 Note 8 Note 9 NOTE INPU TPOI NT TP4 TP4 TP4 TP4 MEAS .POIN T OFF OFF OFF OFF SW3 ON ON ON ON SW8 ― ― ― ― VR13 OFF OFF OFF OFF SW14 b 12 TEST CONDITION ON ON ON ON ON ON ON ON SW17 SW22 · Measure VthB V and VcpB V at TP4. 2002-12-20 · Apply DC voltage to TP3 and adjust it to get the waveform shown as below at TP4. · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, 15 kHz triangle wave / 50% AM) to J1. · Measure voltage of the sync. tip at TP4 (vsync V) · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, amplitude modulated by 100 IRE white picture) to J1. · Measure video S / N at TP4 (HPF : 100 kHz, LPF : 4.2 MHz, CCIR Weighted) (S / N (p) dB). · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, amplitude modulated by black picture) to J1. · Measure amplitude of the output signal at TP4 (VDet (p) V). · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV, amplitude modulated by 100 IRE white picture) to J1. TA1274F Note 10 NOTE J1 TP4 INPUT MEAS. POINT POINT OFF SW3 ON SW8 ― VR13 OFF SW14 b 13 TEST CONDITION ON ON SW17 SW22 · Measure f Det (p) show as below. 2002-12-20 · Decrease frequency of the input signal at J1, and measure amplitude of the output signal at TP4. · Apply DC voltage to TP3 and adjust it so that the minimum voltage of the output signal at TP4 is equal to VoTP4. · Measure the minimum voltage of the output signal at TP4 (VoTP4). · Input the mixture of 2 signals (signal 1 Frequency : 45.75 MHz, Amplitude : 82 dBµV, signal 2 Frequency : 45.65 MHz, Amplitude : 69 dBµV to J1. TA1274F J1 TP9 Note 11 Note 12 NOTE Pin 18 Pin 19 TP20 MEAS INPUT .POIN POINT T OFF OFF SW3 ON ON SW8 ― ― VR13 OFF OFF SW14 b 14 TEST CONDITION ON ON ON ON SW17 SW22 · β MHz / V = (fHVCO − fLVCO) / 0.4 2002-12-20 · Apply 4.7 V to TP9, and measure frequency of the VCO oscillation by the spectrum analyzer (fHVCO MHz). · Apply 4.3 V to TP9, and measure frequency of the VCO oscillation by the spectrum analyzer (fLVCO MHz). · Set the FET probe which connected to the spectrum analyzer near by pin 18 or pin 19 (Don’t touch the probe directly to pin 18 or to pin 19). · Measure the voltage at TP20. · Sweep down the input signal frequency to 41.75 MHz, and sweep up to 49.75 MHz. Sweep down the input signal frequency to 45.75 MHz. · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV) to J1. TA1274F Note 14 Note 13 NOTE ― J1 INPU TPOI NT TP20 TP20 MEAS .POIN T OFF OFF SW3 ON ON SW8 ― ― VR13 ON OFF SW14 b 15 TEST CONDITION ON ON ON ON SW17 SW22 · Measure voltage at TP20 (VAFT Def V ). · Measure voltage at TP20 (VAFT min V). 2002-12-20 · Input the signal (Frequency : 45.75 MHz + 500 kHz, Amplitude : 85 dBµV) to J1. · Measure voltage at TP20 (VAFT max V). · Input the signal (Frequency : 45.75 MHz − 500 kHz, Amplitude : 85 dBµV) to J1. · S AFT kHz / V = 40 / (VHTP20 − VLTP20) · Measure voltage at TP20 (VLTP20 V). · Input the signal (Frequency : 45.75 MHz + 20 kHz, Amplitude : 85 dBµV) to J1. · Measure voltage at TP20 (VHTP20 V). · Input the signal (Frequency : 45.75 MHz − 20 kHz, Amplitude : 85 dBµV) to J1. TA1274F J1 J2 ― J3 Note 16 Note 17 INPU TPOI NT Note 15 NOTE SIF section TP17 TP22 TP11 MEAS .POIN T ON ON OFF SW3 ON ON ON SW8 ― ― ― VR13 OFF OFF OFF SW14 b 16 TEST CONDITION ON ON ON ON ― OFF SW17 SW22 2002-12-20 · Measure the input signal amplitude when the output amplitude from TP17 becomes −3 dB of voTP17, by decreasing the input signal amplitude to J3 (vin lim dBµV). · Measure amplitude of the output signal at TP17 (voTP17). · Input the signal (Frequency : 4.5 MHz, Amplitude : 100 dBµV, 400 Hz sine wave / 25 kHz Devi FM) to J3. · Measure resistance (Zin R (s) kΩ and capacitance (Zin C (s) pF) of TP1 and TP24 by the impedance meter. · Remove all connections from terminal 22. · Change the amplitude of the signal at J2, and measure amplitude of the output signal at TP11. · Input the signal (Frequency : 45.75 MHz, Amplitude : 85 dBµV ) to J1, and input the signal (Frequency : 41.25 MHz, Amplitude : 75 dBµV) to J2. TA1274F J3 J3 J3 Note 18 Note 19 Note 20 NOTE INPU TPOI NT TP12 TP17 TP17 MEAS .POIN T ON ON ON SW3 ON ON ON SW8 ― ― ― VR13 OFF OFF OFF SW14 b 17 TEST CONDITION ON ON ON ON ON ON SW17 SW22 2002-12-20 · Input the signal (Frequency : 4.5 MHz, Amplitude : 100 dBµV to J3. · Change the frequency of the input signal, and measure voltage at TP12. · Input the signal (Frequency : 4.5 MHz, Amplitude : 100 dBµV to J3. · Measure amplitude of the output signal at TP17 (vNTP17 mVrms). · S / N4.5 = 20ℓog ( vDet (s) 4.5 / vNTP17) · Input the signal (Frequency : 4.5 MHz, Amplitude : 100 dBµV, 400 Hz sine wave / 25 kHz Devi FM) to J3. · Measure amplitude of the output signal at TP17 (vDet (s) 4.5L mVrms). · Measure distortion of the TP17 output (THD4.5L %). · Input the signal (Frequency : 4.5 MHz, Amplitude : 100 dBµV, 400 Hz sine wave / 25 kHz Devi FM) to J3. · Measure amplitude of the output signal at TP17 (vFMTP17 mVrms). · Input the signal (Frequency : 4.5 MHz, Amplitude : 100 dBµV, 400 Hz sine wave / 30% AM) to J3. · Measure amplitude of the output signal at TP17 (vAMTP17 mVrms). · AMR4.5 dB = 20ℓog (vFMTP17 / vAMTP17) TA1274F J3 J3 Note 21 Note 22 NOTE INPU TPOI NT TP17 TP12 MEAS .POIN T ON ON SW3 ON ON SW8 ― ― VR13 OFF OFF SW14 b 18 TEST CONDITION ON ON ON ON SW17 SW22 · RR dB = 20ℓog (vTP17 / 100) · Measure amplitude of TP17 (vTP17 mVp-p). 2002-12-20 · Input the signal (Frequency : 1 MHz, Amplitude : 100 dBµV) to J3. · Input the signal (DC 9 V + AC Frequency : 60 Hz, Amplitude : 100 mVp-p) to VCC terminal. · Measure frequency of the input signal when VTP122 = VTP123 (fp (s) H MHz). · Measure voltage of TP12 (VTP123 V). · Open TP12. · Connect TP12 to GND. · Measure voltage of TP12 (VTP122 V). · Decrease frequency of the input signal. · Input the signal (Frequency : 10 MHz, Amplitude : 100 dBµV) to J3. · Measure frequency of the input signal when VTP120 = VTP121 (fp (s) L MHz). · Measure voltage of TP12 (VTP121 V). · Stop appling 5 V to TP12. · Apply 5 V to TP12. · Measure voltage of TP12 (VTP120 V). · Increase frequency of the input signal. · Input the signal (Frequency : 1 MHz, Amplitude : 100 dBµV) to J3. TA1274F TA1274F TEST CIRCUIT 19 2002-12-20 TA1274F APPLICATION CIRCUIT 20 2002-12-20 TA1274F PACKAGE DIMENSIONS Weight: 0.27 g (typ.) 21 2002-12-20 TA1274F RESTRICTIONS ON PRODUCT USE 000707EBA · TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc.. · The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer’s own risk. · The products described in this document are subject to the foreign exchange and foreign trade laws. · The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. · The information contained herein is subject to change without notice. 22 2002-12-20