NTHD4P02F Power MOSFET and Schottky Diode −20 V, −3.0 A, Single P−Channel with 3.0 A Schottky Barrier Diode, ChipFETt Features http://onsemi.com • Leadless SMD Package Featuring a MOSFET and Schottky Diode • 40% Smaller than TSOP−6 Package with Similar Thermal • • • Characteristics Independent Pinout to each Device to Ease Circuit Design Ultra Low VF Schottky Pb−Free Package is Available RDS(on) TYP SCHOTTKY DIODE VR MAX VF TYP IF MAX 20 V 0.510 V 3.0 A G Symbol Value Units Drain−to−Source Voltage VDSS −20 V Gate−to−Source Voltage VGS ±12 V ID −2.2 A Steady State TJ = 25°C tv5s TJ = 25°C Pulsed Drain Current TJ = 85°C ID −3.0 A IDM −9.0 A PD 1.1 W Steady State TJ = 25°C TJ = 85°C 0.6 tv5s TJ = 25°C 2.1 Continuous Source Current (Body Diode) C P−Channel MOSFET SCHOTTKY DIODE ChipFET CASE 1206A STYLE 3 1 8 2 7 A IS −2.1 A TJ, TSTG −55 to 150 °C TL 260 °C A C 1 8 C 2 7 D 3 D 4 6 S Lead Temperature for Soldering Purposes (1/8″ from case for 10 s) MARKING DIAGRAM PIN CONNECTIONS C3 M G Operating Junction and Storage Temperature D −1.6 tp = 10 ms Power Dissipation A S MOSFET MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) Continuous Drain Current −3.0 A 200 mW @ −2.5 V Li−Ion Battery Charging High Side DC−DC Conversion Circuits High Side Drive for Small Brushless DC Motors Power Management in Portable, Battery Powered Products Parameter ID MAX −130 mW @ −4.5 V −20 V Applications • • • • MOSFET V(BR)DSS 6 3 G 4 5 5 SCHOTTKY DIODE MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) Parameter Peak Repetitive Reverse Voltage DC Blocking Voltage Average Rectified Forward Current Steady State Symbol Value Units VRRM 20 V VR 20 V IF 2.2 A 3.0 A TJ = 25°C tv5s Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected. © Semiconductor Components Industries, LLC, 2005 November, 2005 − Rev. 7 1 C3 = Specific Device Code M = Month Code G = Pb−Free Package ORDERING INFORMATION Device Package Shipping † NTHD4P02FT1 ChipFET 3000/Tape & Reel NTHD4P02FT1G ChipFET (Pb−free) 3000/Tape & Reel †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. Publication Order Number: NTHD4P02F/D NTHD4P02F THERMAL RESISTANCE RATINGS Parameter Junction−to−Ambient (Note 1) Steady State tv5s Symbol Max Units RqJA 110 °C/W TJ = 25°C 60 1. Surface Mounted on FR4 Board using 1 in sq pad size (Cu area = 1.27 in sq [1 oz] including traces). MOSFET ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) Parameter Symbol Test Conditions Min Typ V(BR)DSS VGS = 0 V, ID = −250 mA −20 −23 IDSS VDS = −16 V, VGS = 0 V, TJ = 25°C Max Units −1.0 mA OFF CHARACTERISTICS Drain−to−Source Breakdown Voltage Zero Gate Voltage Drain Current V VDS = −16 V, VGS = 0 V, TJ = 85°C −5.0 IGSS VDS = 0 V, VGS = ±12 V ±100 nA Gate Threshold Voltage VGS(TH) VGS = VDS, ID = −250 mA −0.75 −1.2 V Drain−to−Source On− Resistance RDS(on) VGS = −4.5, ID = −2.2 A 0.130 0.155 W VGS = −2.5, ID = −1.7 A 0.200 0.240 VDS = −10 V, ID = −1.7 A 5.0 Gate−to−Source Leakage Current ON CHARACTERISTICS (Note 2) Forward Transconductance gFS −0.6 S CHARGES AND CAPACITANCES Input Capacitance CISS Output Capacitance COSS Reverse Transfer Capacitance pF 185 300 95 150 CRSS 30 50 Total Gate Charge QG(TOT) 3.0 6.0 nC Threshold Gate Charge QG(TH) 0.2 Gate−to−Source Charge QGS Gate−to−Drain Charge QGD 0.9 td(ON) 7.0 12 ns tr 13 25 33 50 27 40 −0.85 −1.15 VGS = 0 V, f = 1.0 MHz, VDS = −10 V VGS = −4.5 V, VDS = −10 V, ID = −2.2 A 0.5 SWITCHING CHARACTERISTICS (Note 3) Turn−On Delay Time Rise Time Turn−Off Delay Time Fall Time td(OFF) VGS = −4.5 V, VDD = −16 V, ID = −2.2 A, RG = 2.5 W tf DRAIN−SOURCE DIODE CHARACTERISTICS (Note 2) Forward Diode Voltage VSD Reverse Recovery Time tRR Charge Time ta Discharge Time tb Reverse Recovery Charge VGS = 0 V, IS = −2.1 A V ns 32 10 VGS = 0 V, IS = −2.1 A , dIS/dt = 100 A/ms 22 QRR 15 nC SCHOTTKY DIODE ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) Parameter Symbol Test Conditions Maximum Instantaneous Forward Voltage VF IF = 0.1 A 0.425 IF = 0.5 A 0.480 IF = 1.0 A 0.510 Maximum Instantaneous Reverse Current IR Typ Max 0.575 1.0 VR = 20 V 5.0 dv/dt VR = 20 V Non−Repetitive Peak Surge Current IFSM Halfwave, Single Pulse, 60 Hz 2. Pulse Test: Pulse Width v 300 ms, Duty Cycle v 2%. 3. Switching characteristics are independent of operating junction temperatures. http://onsemi.com Units V VR = 10 V Maximum Voltage Rate of Change 2 Min 10,000 mA V/ns 23 A NTHD4P02F TYPICAL MOSFET PERFORMANCE CURVES (TJ = 25°C unless otherwise noted) 4 TJ = 25°C VGS = −6 V to −3 V VGS = −2.4 V −2.2 V −2 V −ID, DRAIN CURRENT (AMPS) −ID, DRAIN CURRENT (AMPS) 4 3 −1.8 V 2 −1.6 V 1 −1.4 V 3 2 TC = −55°C 1 25°C 100°C −1.2 V 0 0 1 2 3 4 5 7 6 0 0.5 8 −VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) 1 1.5 2 2.5 −VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) VDS ≥ −10 V 0.5 ID = −2.1 A TJ = 25°C 0.4 0.3 0.2 0.1 0 1 2 3 4 5 6 −VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) 0.25 TJ = 25°C 0.225 VGS = −2.5 V 0.2 0.175 0.15 VGS = −4.5 V 0.125 0.1 0.5 1.5 2.5 3.5 −ID, DRAIN CURRENT (AMPS) Figure 4. On−Resistance vs. Drain Current and Gate Voltage Figure 3. On−Resistance vs. Gate−to−Source Voltage 1.6 10000 ID = −2.1 A VGS = −4.5 V VGS = 0 V 1.4 −IDSS, LEAKAGE (A) RDS(on), DRAIN−TO−SOURCE RESISTANCE (NORMALIZED) 3 1.2 1 TJ = 150°C 1000 TJ = 100°C 100 0.8 0.6 −50 10 −25 0 25 50 75 100 125 150 2 4 6 8 10 12 14 16 18 −TJ, JUNCTION TEMPERATURE (°C) −VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) Figure 5. On−Resistance Variation with Temperature Figure 6. Drain−to−Source Leakage Current vs. Voltage http://onsemi.com 3 20 NTHD4P02F 600 VDS = 0 V TJ = 25°C CISS 500 C, CAPACITANCE (pF) VGS = 0 V 400 CRSS 300 200 COSS 100 0 10 5 −VGS 0 −VDS 5 10 15 5 15 QT −VGS −VDS 4 12 3 9 QGD QGS 2 6 1 0 20 0 1 GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (V) 2 3 4 0 QG, TOTAL GATE CHARGE (nC) Figure 7. Capacitance Variation Figure 8. Gate−to−Source and Drain−to−Source Voltage vs. Total Charge 1000 2.5 −IS, SOURCE CURRENT (AMPS) VDD = −16 V ID = −2.1 A VGS = −4.5 V 100 t, TIME (ns) 3 ID = −2.1 A TJ = 25°C −VDS, DRAIN−TO−SOURCE VOLTAGE (V) −VGS, GATE−TO−SOURCE VOLTAGE (V) TYPICAL MOSFET PERFORMANCE CURVES (TJ = 25°C unless otherwise noted) td(OFF) tf tr 10 td(ON) 1 1 10 100 VGS = 0 V TJ = 25°C 2 1.5 1 0.5 0 0.3 0.5 0.7 0.9 RG, GATE RESISTANCE (W) −VSD, SOURCE−TO−DRAIN VOLTAGE (V) Figure 9. Resistive Switching Time Variation vs. Gate Resistance Figure 10. Diode Forward Voltage vs. Current r(t), NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE 1.0 0.1 D = 0.5 0.2 0.1 Normalized to qja at 10s. 0.05 Chip 0.02 0.0175 W 0.0710 W 0.2706 W 0.5776 W 0.7086 W 0.0154 F 0.0854 F 0.3074 F 1.7891 F 107.55 F 0.01 SINGLE PULSE 0.01 1.0E−03 1.0E−02 1.0E−01 1.0E+00 t, TIME (s) Figure 11. Thermal Response http://onsemi.com 4 1.0E+01 1.0E+02 Ambient 1.0E+03 NTHD4P02F TYPICAL SCHOTTKY PERFORMANCE CURVES (TJ = 25°C unless otherwise noted) 10 IF, INSTANTANEOUS FORWARD CURRENT (AMPS) IF, INSTANTANEOUS FORWARD CURRENT (AMPS) 10 TJ = 150°C 1 TJ = 25°C TJ = −55°C 0.1 0.20 0.40 0.60 TJ = 150°C 1 TJ = 25°C 0.1 0.20 0.80 VF, INSTANTANEOUS FORWARD VOLTAGE (VOLTS) IR, REVERSE CURRENT (AMPS) 0.80 Figure 13. Maximum Forward Voltage 1.0E+1 TJ = 150°C TJ = 150°C 1.0E+0 100E−6 1.0E−1 TJ = 100°C 1.0E−2 10E−6 TJ = 100°C 1.0E−3 1E−6 1.0E−4 1.0E−5 100E−9 TJ = 25°C 1.0E−6 10E−9 TJ = 25°C 1.0E−7 0 10 VR, REVERSE VOLTAGE (VOLTS) 20 0 PFO, AVERAGE POWER DISSIPATION (WATTS) 3.5 freq = 20 kHz 3 dc 2.5 square wave 2 Ipk/Io = p 1.5 Ipk/Io = 5 1 Ipk/Io = 10 Ipk/Io = 20 0.5 0 25 45 65 85 105 125 10 VR, REVERSE VOLTAGE (VOLTS) 20 Figure 15. Maximum Reverse Current Figure 14. Typical Reverse Current IO, AVERAGE FORWARD CURRENT (AMPS) 0.60 IR, MAXIMUM REVERSE CURRENT (AMPS) Figure 12. Typical Forward Voltage 1E−3 0.40 VF, MAXIMUM INSTANTANEOUS FORWARD VOLTAGE (VOLTS) 145 165 TL, LEAD TEMPERATURE (°C) 1.8 1.6 1.4 square wave dc Ipk/Io = p 1.2 1 Ipk/Io = 5 0.8 Ipk/Io = 10 0.6 Ipk/Io = 20 0.4 0.2 0 0 Figure 16. Current Derating 0.5 1 1.5 2 2.5 3 IO, AVERAGE FORWARD CURRENT (AMPS) Figure 17. Forward Power Dissipation http://onsemi.com 5 3.5 NTHD4P02F SOLDERING FOOTPRINT* 2.032 0.08 2.032 0.08 0.457 0.018 0.711 0.028 0.635 0.025 1.092 0.043 0.178 0.007 0.457 0.018 0.711 0.028 0.66 0.026 SCALE 20:1 mm Ǔ ǒinches 0.254 0.010 0.66 0.026 SCALE 20:1 mm Ǔ ǒinches Figure 19. Style 3 Figure 18. Basic *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. BASIC PAD PATTERNS The basic pad layout with dimensions is shown in Figure 18. This is sufficient for low power dissipation MOSFET applications, but power semiconductor performance requires a greater copper pad area, particularly for the drain leads. The minimum recommended pad pattern shown in Figure 19 improves the thermal area of the drain connections (pins 5, 6) while remaining within the confines of the basic footprint. The drain copper area is 0.0019 sq. in. (or 1.22 sq. mm). This will assist the power dissipation path away from the device (through the copper lead−frame) and into the board and exterior chassis (if applicable) for the single device. The addition of a further copper area and/or the addition of vias to other board layers will enhance the performance still further. http://onsemi.com 6 NTHD4P02F PACKAGE DIMENSIONS ChipFET] CASE 1206A−03 ISSUE G D 8 7 q 6 L 5 HE 5 6 7 8 4 3 2 1 E 1 2 3 e1 4 b MILLIMETERS NOM MAX 1.05 1.10 0.30 0.35 0.15 0.20 3.05 3.10 1.65 1.70 0.65 BSC 0.55 BSC 0.28 0.35 0.42 1.80 1.90 2.00 5° NOM DIM A b c D E e e1 L HE q c e NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. MOLD GATE BURRS SHALL NOT EXCEED 0.13 MM PER SIDE. 4. LEADFRAME TO MOLDED BODY OFFSET IN HORIZONTAL AND VERTICAL SHALL NOT EXCEED 0.08 MM. 5. DIMENSIONS A AND B EXCLUSIVE OF MOLD GATE BURRS. 6. NO MOLD FLASH ALLOWED ON THE TOP AND BOTTOM LEAD SURFACE. A 0.05 (0.002) STYLE 3: PIN 1. 2. 3. 4. 5. 6. 7. 8. MIN 1.00 0.25 0.10 2.95 1.55 INCHES NOM 0.041 0.012 0.006 0.120 0.065 0.025 BSC 0.022 BSC 0.011 0.014 0.071 0.075 5° NOM MIN 0.039 0.010 0.004 0.116 0.061 MAX 0.043 0.014 0.008 0.122 0.067 0.017 0.079 A A S G D D C C ChipFET is a trademark of Vishay Siliconix. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: N. American Technical Support: 800−282−9855 Toll Free Literature Distribution Center for ON Semiconductor USA/Canada P.O. Box 61312, Phoenix, Arizona 85082−1312 USA Phone: 480−829−7710 or 800−344−3860 Toll Free USA/Canada Japan: ON Semiconductor, Japan Customer Focus Center 2−9−1 Kamimeguro, Meguro−ku, Tokyo, Japan 153−0051 Fax: 480−829−7709 or 800−344−3867 Toll Free USA/Canada Phone: 81−3−5773−3850 Email: [email protected] http://onsemi.com 7 ON Semiconductor Website: http://onsemi.com Order Literature: http://www.onsemi.com/litorder For additional information, please contact your local Sales Representative. NTHD4P02F/D