NTLUF4189NZ Power MOSFET and Schottky Diode 30 V, N−Channel with 0.5 A Schottky Barrier Diode, 1.6 x 1.6 x 0.55 mm mCoolt Package Features • • • • • • http://onsemi.com Low Qg and Capacitance to Minimize Switching Losses Low Profile UDFN 1.6x1.6 mm for Board Space Saving Low VF Schottky Diode ESD Protected Gate This is a Halide−Free Device This is a Pb−Free Device MOSFET V(BR)DSS 30 V Applications Value Units Drain-to-Source Voltage VDSS 30 V Gate-to-Source Voltage VGS ±8.0 V ID 1.5 A Power Dissipation (Note 1) Continuous Drain Current (Note 2) TA = 85°C 1.1 t≤5s TA = 25°C 1.9 Steady State TA = 25°C t≤5s TA = 25°C Steady State TA = 25°C PD TA = 85°C 30 V 0.52 V 0.5 A A G K Schottky Diode MARKING DIAGRAM UDFN6 CASE 517AT mCOOLt 6 A 1.2 0.9 PD 0.5 W Pulsed Drain Current tp = 10 ms IDM 8.0 A MOSFET Operating Junction and Storage Temperature TJ, TSTG -55 to 150 °C Schottky Operating Junction & Storage Temperature TJ, TSTG -55 to 125 °C Source Current (Body Diode) (Note 2) IS 1.5 A Lead Temperature for Soldering Purposes (1/8″ from case for 10 s) TL 260 °C ESD 1000 V Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. Surface Mounted on FR4 Board using 1 in sq pad size (Cu area = 1.127 in sq [2 oz] including traces). 2. Surface-mounted on FR4 board using the minimum recommended pad size of 30 mm2, 2 oz. Cu. March, 2009 − Rev. 1 0.5 A W 0.8 TA = 25°C © Semiconductor Components Industries, LLC, 2009 350 mW @ 2.5 V S N−Channel MOSFET Power Dissipation (Note 2) Gate-to-Source ESD Rating (HBM) per JESD22−A114F 0.5 A IF MAX 1.3 ID 250 mW @ 3.0 V D Symbol TA = 25°C 1.5 A VF TYP MAXIMUM RATINGS (TJ = 25°C unless otherwise stated) Steady State 200 mW @ 4.5 V VR MAX Products, such as Cell Phones, PMP, DSC, GPS, and others Continuous Drain Current (Note 1) ID MAX SCHOTTKY DIODE • DC-DC Boost Converter • Color Display and Camera Flash Regulators • Optimized for Power Management Applications for Portable Parameter RDS(on) MAX 1 1 1 AA MG G AA = Specific Device Code M = Date Code G = Pb−Free Package PIN CONNECTIONS A 1 N/C 2 D 3 K 6 K 5 G 4 S D (Top View) ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 2 of this data sheet. Publication Order Number: NTLUF4189NZ/D NTLUF4189NZ DEVICE ORDERING INFORMATION Package Shipping† NTLUF4189NZTAG UDFN6 (Pb−Free) 3000 / Tape & Reel NTLUF4189NZTBG UDFN6 (Pb−Free) 3000 / Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. Schottky Diode Maximum Ratings (TJ = 25°C unless otherwise stated) Parameter Peak Repetitive Reverse Voltage Symbol Value Units VRRM 30 V DC Blocking Voltage VR 30 V Average Rectified Forward Current IF 0.5 A Symbol Max Units Junction-to-Ambient – Steady State (Note 3) RθJA 155 °C/W Junction-to-Ambient – t ≤ 5 s (Note 3) RθJA 100 Junction-to-Ambient – Steady State min Pad (Note 4) RθJA 245 Thermal Resistance Ratings Parameter MOSFET Electrical Characteristics (TJ = 25°C unless otherwise specified) Parameter Symbol Test Condition Min Drain−to−Source Breakdown Voltage V(BR)DSS VGS = 0 V, ID = 250 μA 30 Drain−to−Source Breakdown Voltage Temperature Coefficient V(BR)DSS/TJ ID = 250 μA, ref to 25°C Typ Max Units OFF CHARACTERISTICS Zero Gate Voltage Drain Current Gate-to-Source Leakage Current IDSS VGS = 0 V, VDS = 24 V V 22 mV/°C TJ = 25°C 1.0 TJ = 85°C 10 IGSS VDS = 0 V, VGS = ± 8.0 V VGS(TH) VGS = VDS, ID = 250 mA mA 10 mA 1.5 V ON CHARACTERISTICS (Note 5) Gate Threshold Voltage Negative Threshold Temp. Coefficient Drain−to−Source On Resistance Forward Transconductance 0.4 VGS(TH)/TJ RDS(on) gFS 1.1 3.0 mV/°C VGS = 4.5 V, ID = 1.5 A 145 200 mW VGS = 3.0 V, ID = 0.5 A 185 250 VGS = 2.5 V, ID = 0.5 A 220 350 VDS = 4.0 V, ID = 0.15 A 1.1 S 95 pF CHARGES & CAPACITANCES Input Capacitance CISS Output Capacitance COSS Reverse Transfer Capacitance CRSS VGS = 0 V, f = 1 MHz, VDS = 15 V 15 10 Total Gate Charge QG(TOT) 1.4 Threshold Gate Charge QG(TH) 0.2 Gate-to-Source Charge QGS Gate-to-Drain Charge QGD 3. 4. 5. 6. VGS = 4.5 V, VDS = 15 V; ID = 1.5 A 0.4 0.4 Surface-mounted on FR4 board using 1 in sq pad size (Cu area = 1.127 in sq [2 oz] including traces) Surface-mounted on FR4 board using the minimum recommended pad size of 30 mm2, 2 oz. Cu. Pulse Test: pulse width ≤ 300 ms, duty cycle ≤ 2% Switching characteristics are independent of operating junction temperatures http://onsemi.com 2 3.0 nC NTLUF4189NZ MOSFET Electrical Characteristics (TJ = 25°C unless otherwise specified) Parameter Symbol Test Condition Min Typ Max Units SWITCHING CHARACTERISTICS, VGS = 4.5 V (Note 6) Turn-On Delay Time td(ON) Rise Time tr Turn-Off Delay Time td(OFF) Fall Time ns 7.0 4.5 VGS = 4.5 V, VDD = 15 V, ID = 1A, RG = 6 W 10.2 tf 1.2 DRAIN-SOURCE DIODE CHARACTERISTICS Forward Diode Voltage Reverse Recovery Time Charge Time VSD Reverse Recovery Charge TJ = 25°C 0.8 TJ = 85°C 0.75 tRR ta Discharge Time VGS = 0 V, IS = 1A tb 1.2 V ns 10.5 8.9 VGS = 0 V, dISD/dt = 100 A/ms, IS = 1 A 1.6 QRR 2.1 nC SCHOTTKY DIODE ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified) Symbol Test Condition Maximum Instantaneous Forward Voltage VF Maximum Instantaneous Reverse Current IR Parameter Min Typ Max Units IF = 10 mA 0.27 0.37 V IF = 100 mA 0.36 0.46 IF = 500 mA 0.52 0.62 VR = 10 V 2.0 10 VR = 30 V 20 200 mA SCHOTTKY DIODE ELECTRICAL CHARACTERISTICS (TJ = 85°C unless otherwise specified) Maximum Instantaneous Forward Voltage VF Maximum Instantaneous Reverse Current IR IF = 10 mA 0.2 IF = 100 mA 0.3 IF = 500 mA 0.51 VR = 10 V 80 VR = 30 V 525 V mA SCHOTTKY DIODE ELECTRICAL CHARACTERISTICS (TJ = 125°C unless otherwise specified) Maximum Instantaneous Forward Voltage Maximum Instantaneous Reverse Current VF IR IF = 10 mA 0.14 IF = 100 mA 0.27 IF = 500 mA 0.51 VR = 10 V 600 VR = 30 V 3000 V mA SCHOTTKY DIODE ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified) Capacitance 3. 4. 5. 6. C VR = 5 V, f = 1.0 MHz Surface-mounted on FR4 board using 1 in sq pad size (Cu area = 1.127 in sq [2 oz] including traces) Surface-mounted on FR4 board using the minimum recommended pad size of 30 mm2, 2 oz. Cu. Pulse Test: pulse width ≤ 300 ms, duty cycle ≤ 2% Switching characteristics are independent of operating junction temperatures http://onsemi.com 3 6.0 pF NTLUF4189NZ TYPICAL MOSFET CHARACTERISTICS 4.0 V 6 3.5 V 3.0 V 4 2.5 V 2 0 1 2 3 4 3 2 1 ID = 1.5 A ID = 0.5 A 2.0 2.5 3.0 4.0 3.5 4.5 VGS, GATE−TO−SOURCE VOLTAGE (V) 0.35 2.5 3.5 3 2.0 V 2.5 V 3.0 V 4 3.5 V 0.30 4.0 V 0.25 0.20 VGS = 4.5 V 0.15 0.10 TJ = 25°C 0 1 2 3 4 5 6 7 8 9 10 ID, DRAIN CURRENT (A) Figure 3. On−Resistance vs. Gate Voltage Figure 4. On−Resistance vs. Drain Current and Gate Voltage 1.7 1000 VGS = 4.5 V ID = 1.5 A VGS = 0 V TJ = 150°C IDSS, LEAKAGE (nA) 1.4 1.3 1.2 1.1 1.0 0.9 100 TJ = 125°C 10 0.8 0.7 0.6 −50 2 Figure 2. Transfer Characteristics 0.15 RDS(on), DRAIN−TO−SOURCE RESISTANCE (NORMALIZED) TJ = −55°C 1.5 Figure 1. On−Region Characteristics 0.20 1.5 1 VGS, GATE−TO−SOURCE VOLTAGE (V) 0.30 1.6 TJ = 25°C VDS, DRAIN−TO−SOURCE VOLTAGE (V) TJ = 25°C 0.10 1.5 4 0 0.5 5 0.35 0.25 VDS = 4 V TJ = 125°C 2.0 V RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) ID, DRAIN CURRENT (A) 8 0 RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) 5 VGS = 4.5 V TJ = 25°C ID, DRAIN CURRENT (A) 10 TJ = 85°C −25 0 25 50 75 100 125 150 1 0 5 10 15 20 25 TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN−TO−SOURCE VOLTAGE (V) Figure 5. On−Resistance Variation with Temperature Figure 6. Drain−to−Source Leakage Current vs. Voltage http://onsemi.com 4 30 NTLUF4189NZ TYPICAL MOSFET CHARACTERISTICS VGS, GATE−TO−SOURCE VOLTAGE (V) C, CAPACITANCE (pF) 125 VGS = 0 V TJ = 25°C f = 1 MHz Ciss 100 75 50 Coss 25 0 Crss 0 5 10 15 25 20 30 5 4 VGS 3 QGS 10 0 5 VGS = 15 V ID = 1.5 A TJ = 25°C 1 0 0.25 0.5 0.75 1 0 1.5 1.25 Qg, TOTAL GATE CHARGE (nC) Figure 8. Gate−to−Source and Drain−to−Source Voltage vs. Total Charge VGS = 4.5 V VDD = 15 V ID = 1.0 A IS, SOURCE CURRENT (A) 10 100 td(off) td(on) tr 10 1 tf 1 10 TJ = 150°C TJ = 125°C TJ = 25°C 100 RG, GATE RESISTANCE (W) VSD, SOURCE−TO−DRAIN VOLTAGE (V) Figure 9. Resistive Switching Time Variation vs. Gate Resistance Figure 10. Diode Forward Voltage vs. Current 175 1.4 ID = 250 mA 1.3 150 1.2 125 1.1 1.0 0.9 100 75 50 0.8 25 0.7 0.6 −50 1.0 TJ = −55°C 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 1.3 1.4 POWER (W) t, TIME (ns) QGD 2 Figure 7. Capacitance Variation VGS, GATE−TO−SOURCE VOLTAGE (V) 15 VDS VDS, DRAIN−TO−SOURCE VOLTAGE (V) 0.1 20 QT VDS, DRAIN−TO−SOURCE VOLTAGE (V) 150 −25 0 25 50 75 100 125 0 150 0.0000001 0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000 TJ, TEMPERATURE (°C) SINGLE PULSE TIME (s) Figure 11. Threshold Voltage Figure 12. Single Pulse Maximum Power Dissipation http://onsemi.com 5 NTLUF4189NZ TYPICAL MOSFET CHARACTERISTICS ID, DRAIN CURRENT (AMPS) 10 10 ms 1 100 ms VGS = 8 V 0.1 SINGLE PULSE TC = 25°C 0.01 1 ms 10 ms RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT 0.1 dc 1 100 10 VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) Figure 13. Maximum Rated Forward Biased Safe Operating Area 175 150 R(t) (°C/W) 125 100 75 0.5 50 0.2 25 0.1 0.05 0 0.000001 0.02 0.01 Single Pulse 0.00001 0.0001 0.001 0.01 0.1 PULSE TIME (sec) Figure 14. FET Thermal Response http://onsemi.com 6 1 10 100 1000 NTLUF4189NZ TYPICAL SCHOTTKY CHARACTERISTICS C, TOTAL CAPACITANCE (pF) 20 TA = 25°C 18 16 14 12 10 8 6 4 2 0 0 5 10 15 20 25 30 VR, REVERSE VOLTAGE (V) IF, INSTANTANEOUS FORWARD CURRENT (mA) Figure 15. Total Capacitance 10000 TJ = 125°C 100 TJ = 85°C 10 TJ = 25°C 1 0.1 IR, REVERSE CURRENT (mA) 1000 TJ = −55°C 0 100 200 300 400 500 600 700 TJ = 85°C 100 10 TJ = 25°C 1 0.1 800 TJ = 125°C 1000 0 5 10 15 20 25 VR, REVERSE VOLTAGE (V) VF, INSTANTANEOUS FORWARD VOLTAGE (mV) Figure 16. Typical Forward Voltage Figure 17. Typical Reverse Current http://onsemi.com 7 20 NTLUF4189NZ PACKAGE DIMENSIONS UDFN6 1.6x1.6, 0.5P CASE 517AT−01 ISSUE O A B D 2X 0.10 C PIN ONE REFERENCE 2X 0.10 C DETAIL A E OPTIONAL CONSTRUCTION EXPOSED Cu TOP VIEW A (A3) DETAIL B 0.05 C 6X A1 0.05 C SIDE VIEW D1 DETAIL A 6X L L1 ÉÉ ÉÉ NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETERS. 3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS MEASURED BETWEEN 0.15 AND 0.30 mm FROM TERMINAL. 4. COPLANARITY APPLIES TO THE EXPOSED PAD AS WELL AS THE TERMINALS. C A1 SEATING PLANE ÉÉÉ ÈÈÈ ÈÈÈ MOLD CMPD 1 A3 DETAIL B OPTIONAL CONSTRUCTION SOLDERMASK DEFINED MOUNTING FOOTPRINT* 3 E1 6X L 6 MILLIMETERS MIN MAX 0.45 0.55 0.00 0.05 0.13 REF 0.20 0.30 1.60 BSC 1.60 BSC 0.50 BSC 1.14 1.34 0.38 0.58 0.54 0.74 0.20 −−− 0.15 0.35 −−− 0.10 2X D2 K DIM A A1 A3 b D E e D1 D2 E1 K L L1 4 6X 1.34 2X 0.58 b e 0.10 C A B BOTTOM VIEW 0.05 C NOTE 3 6X 0.48 0.74 1.90 1 0.50 PITCH 6X 0.32 DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. 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