NTHS4101P Power MOSFET −20 V, 6.7 A, P−Channel ChipFETt Features • Offers an Ultra Low RDS(on) Solution in the ChipFET Package • Miniature ChipFET Package 40% Smaller Footprint than TSOP−6 • • • • • making it an Ideal Device for Applications where Board Space is at a Premium Low Profile (<1.1 mm) Allows it to Fit Easily into Extremely Thin Environments such as Portable Electronics Designed to Provide Low RDS(on) at Gate Voltage as Low as 1.8 V, the Operating Voltage used in many Logic ICs in Portable Electronics Simplifies Circuit Design since Additional Boost Circuits for Gate Voltages are not Required Operated at Standard Logic Level Gate Drive, Facilitating Future Migration to Lower Levels using the same Basic Topology Pb−Free Package is Available http://onsemi.com RDS(on) TYP V(BR)DSS ID MAX 21 mW @ −4.5 V −20 V −6.7 A 30 mW @ −2.5 V 42 mW @ −1.8 V S G Applications • Optimized for Battery and Load Management Applications in • • D Portable Equipment such as MP3 Players, Cell Phones, Digital Cameras, Personal Digital Assistant and other Portable Applications Charge Control in Battery Chargers Buck and Boost Converters P−Channel MOSFET 1 MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) Rating Value Unit Drain−to−Source Voltage VDSS −20 Vdc Gate−to−Source Voltage − Continuous VGS "8.0 Vdc Drain Current − Continuous − 5 seconds ID ID −4.8 −6.7 A Total Power Dissipation Continuous @ TA = 25°C (5 sec) @ TA = 25°C Continuous @ 85°C (5 sec) @ 85°C PD Pulsed Drain Current − tp = 10 ms IDM −190 A Is −4.8 A RqJA RqJA 50 95 TL 260 Thermal Resistance (Note 1) Junction−to−Ambient, 5 sec Junction−to−Ambient, Continuous Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds W 1.3 2.5 0.7 1.3 °C/W °C February, 2007 − Rev. 3 1 MARKING DIAGRAM D 8 1 D 1 D 7 2 D 2 D 6 3 D 3 S 5 4 G 4 8 7 6 5 C6 = Specific Device Code M = Month Code G = Pb−Free Package ORDERING INFORMATION Package Shipping † NTHS4101PT1 ChipFET 3000 Tape / Reel NTHS4101PT1G ChipFET (Pb−free) 3000 Tape / Reel Device Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. Surface Mounted on FR4 Board using 1 in sq pad size (Cu area = 1.27 in sq [1 oz] including traces). © Semiconductor Components Industries, LLC, 2007 PIN CONNECTIONS C6 M G Symbol Continuous Source Current ChipFET CASE 1206A STYLE 1 8 †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. Publication Order Number: NTHS4101P/D NTHS4101P ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) Symbol Test Condition Min V(Br)DSS VGS = 0 Vdc, ID = −250 mAdc −20 Gate−Body Leakage Current Zero IGSS VDS = 0 Vdc, VGS = "8.0 Vdc "100 nAdc Zero Gate Voltage Drain Current IDSS VDS = −16 Vdc, VGS = 0 Vdc VDS = −16 Vdc, VGS = 0 Vdc, TJ = 85°C −1.0 −5.0 mAdc Gate Threshold Voltage VGS(th) VDS = VGS, ID = −250 mAdc −1.5 Vdc Static Drain−to−Source On−Resistance RDS(on) VGS = −4.5 Vdc, ID = −4.8 Adc VGS = −2.5 Vdc, ID = −4.2 Adc VGS = −1.8 Vdc, ID = −1.0 Adc 21 30 42 34 40 52 mW Forward Transconductance gFS VDS = −5.0 Vdc, ID = −4.8 Adc 15 Diode Forward Voltage VSD IS = −4.8 Adc, VGS = 0 Vdc −0.8 Input Capacitance Ciss 2100 Output Capacitance Coss VDS = −16 Vdc VGS = 0 V f = 1.0 MHz Transfer Capacitance Crss Characteristic Typ Max Unit OFF CHARACTERISTICS Drain−to−Source Breakdown Voltage (Note 2) Temperature Coefficient (Positive) Vdc ON CHARACTERISTICS (Note 2) −0.45 S −1.2 V DYNAMIC CHARACTERISTICS pF 290 200 SWITCHING CHARACTERISTICS (Note 3) Turn−On Delay Time Rise Time Turn−Off Delay Time Fall Time Gate Charge td(on) VDD = −16 Vdc 8.0 tr VGS = −4.5 Vdc 28 td(off) ID = −4.5 Adc 75 tf RG = 2.5 W 60 Qg VGS = −4.5 Vdc 25 Qgs ID = −4.5 Adc 4.0 Qgd VDS = −16 Vdc (Note 3) 7.0 2. Pulse Test: Pulse Width = 250 ms, Duty Cycle = 2%. 3. Switching characteristics are independent of operating junction temperatures. http://onsemi.com 2 ns 35 nC NTHS4101P TYPICAL PERFORMANCE CURVES (TJ = 25°C unless otherwise noted) −1.8 V 8 7 6 5 −1.6 V 4 3 2 −1.4 V 1 −1.2 V 0 0 1 2 3 4 5 9 8 7 6 5 4 125°C 3 25°C 2 TJ = −55°C 1 0 6 7 8 −VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) 0.5 1 1.5 2 2.5 −VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics 0 3 1.5 0.1 RDS(on), DRAIN−TO−SOURCE RESISTANCE (NORMALIZED) VGS = −1.8 V 0.08 0.06 0.04 VGS = −2.5 V 0.02 VGS = −4.5 V 2 4 8 10 12 −ID, DRAIN CURRENT (AMPS) 6 14 VGS = −4.5 V 1.3 1.1 0.9 0.7 0.5 −50 0 16 −25 0 25 75 100 125 Figure 4. On−Resistance Variation with Temperature 10000 VGS = 0 V TJ = 125°C 1000 TJ = 100°C 100 10 TJ = 25°C 1 0.1 0 50 TJ, JUNCTION TEMPERATURE (°C) Figure 3. On−Resistance vs. Drain Current and Gate Voltage −IDSS, LEAKAGE (nA) RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) 10 TJ = 25°C VGS = −10 V to −2.4 V 9 −ID, DRAIN CURRENT (AMPS) −ID, DRAIN CURRENT (AMPS) 10 2 4 6 −VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) Figure 5. Drain−to−Source Leakage Current vs. Voltage http://onsemi.com 3 8 150 NTHS4101P 5000 C, CAPACITANCE (pF) 4500 VDS = 0 V VGS = 0 V −VGS, GATE−TO−SOURCE VOLTAGE (VOLTS) TYPICAL PERFORMANCE CURVES (TJ = 25°C unless otherwise noted) TJ = 25°C 4000 3500 3000 2500 2000 Ciss Crss 1500 1000 Coss 500 0 −6 −4 −2 0 2 −VGS −VDS 4 6 10 12 14 16 18 20 8 GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS) QT 4 3 2 Q2 Q1 1 ID = −4.5 A TJ = 25°C 0 0 3 12 21 6 9 15 18 Qg, TOTAL GATE CHARGE (nC) 24 27 Figure 7. Gate−to−Source and Drain−to−Source Voltage vs. Total Gate Charge Figure 6. Capacitance Variation 1000 5 100 −IS, SOURCE CURRENT (AMPS) VDD = −16 V ID = −4.5 A VGS = −4.5 V td(off) tf tr 10 td(on) 1 1 10 VGS = 0 V TJ = 25°C 4 3 2 1 0 0.4 100 0.5 0.6 Figure 8. Resistive Switching Time Variation vs. Gate Resistance 10 10 ms 100 ms 1 ms VGS = −8 V SINGLE PULSE TC = 25°C 0.1 0.01 0.1 0.8 0.9 1.0 Figure 9. Diode Forward Voltage vs. Current 100 1 0.7 −VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS) RG, GATE RESISTANCE (OHMS) −I D, DRAIN CURRENT (AMPS) t, TIME (ns) 5 RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT dc 1 10 −VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) Figure 10. Maximum Rated Forward Biased Safe Operating Area http://onsemi.com 4 100 NTHS4101P PACKAGE DIMENSIONS ChipFETt CASE 1206A−03 ISSUE H D 8 7 NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. MOLD GATE BURRS SHALL NOT EXCEED 0.13 MM PER SIDE. 4. LEADFRAME TO MOLDED BODY OFFSET IN HORIZONTAL AND VERTICAL SHALL NOT EXCEED 0.08 MM. 5. DIMENSIONS A AND B EXCLUSIVE OF MOLD GATE BURRS. 6. NO MOLD FLASH ALLOWED ON THE TOP AND BOTTOM LEAD SURFACE. q 6 L 5 HE 5 6 7 8 4 3 2 1 E 1 2 3 e1 4 b c e MILLIMETERS NOM MAX 1.05 1.10 0.30 0.35 0.15 0.20 3.05 3.10 1.65 1.70 0.65 BSC 0.55 BSC 0.28 0.35 0.42 1.80 1.90 2.00 5° NOM DIM A b c D E e e1 L HE q A 0.05 (0.002) MIN 1.00 0.25 0.10 2.95 1.55 INCHES NOM 0.041 0.012 0.006 0.120 0.065 0.025 BSC 0.022 BSC 0.011 0.014 0.071 0.075 5° NOM MIN 0.039 0.010 0.004 0.116 0.061 MAX 0.043 0.014 0.008 0.122 0.067 0.017 0.079 STYLE 1: PIN 1. DRAIN 2. DRAIN 3. DRAIN 4. GATE 5. SOURCE 6. DRAIN 7. DRAIN 8. DRAIN SOLDERING FOOTPRINTS* 1 2.032 0.08 1 2.032 0.08 1.727 0.068 2.362 0.093 0.635 0.025 PITCH 2.362 0.093 8X 8X 0.66 0.026 0.457 0.018 2X 2X mm Ǔ ǒinches 0.457 0.018 Basic 0.66 0.026 Style 1 *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. http://onsemi.com 5 mm Ǔ ǒinches NTHS4101P ChipFET is a trademark of Vishay Siliconix. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. 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