FAIRCHILD KSC2333

KSC2333
KSC2333
High Speed Switching Application
• Low Collector Saturation Voltage
• Specified of Reverse Biased SOA With Inductive Load
TO-220
1
1.Base
NPN Epitaxial Silicon Transistor
2.Collector
3.Emitter
Absolute Maximum Ratings TC=25°C unless otherwise noted
Symbol
VCBO
Parameter
Collector-Base Voltage
Value
500
Units
V
400
V
VCEO
Collector-Emitter Voltage
VEBO
Emitter-Base Voltage
7
V
IC
Collector Current (DC)
2
A
ICP
*Collector Current (Pulse)
4
A
IB
Base Current (DC)
1
A
PC
Collector Dissipation (TC=25°C)
15
W
TJ
Junction Temperature
150
°C
TSTG
Storage Temperature
- 55 ~ 150
°C
*PW≤350µs, Duty Cycle≤10%
Electrical Characteristics TC=25°C unless otherwise noted
Symbol
VCEO(sus)
Parameter
Collector-Emitter Sustaining Voltage
Test Condition
IC = 0.5A, IB =0.1A, L = 1mH
Min.
400
VCEX(sus)1
Collector-Emitter Sustaining Voltage
IC = 0.5A, IB1 = -IB2 = 0.1A
TC = 125°C, L = 180µH, clamped
450
V
VCEX(sus)2
Collector-Emitter Sustaining Voltage
IC = 1A, IB1 = 0.2A, -IB2 =0.2A
TC= 125°C, L = 180µH, clamped
400
V
ICBO
Collector Cut-off Current
VCB = 400V, IE = 0
ICER
Collector Cut-off Current
VCE = 400V, RBE =51Ω, TC = 125°C
ICEX1
Collector Cut-off Current
VCE = 400V, VBE(off) = -5V
10
µA
ICEX2
Collector Cut-off Current
VCE = 400V, VBE(off) = -5V @
TC = 125°C
1
mA
10
µA
IEBO
Emitter Cut-off Current
VEB = 5V, IC = 0
hFE1
hFE2
* DC Current Gain
VCE = 5V, IC = 0.1A
VCE = 5V, IC = 0.5A
Max.
20
10
Units
V
10
µA
1
mA
80
VCE(sat)
* Collector-Emitter Saturation Voltage
IC = 0.5A, IB = 0.1A
1
V
VBE(sat)
* Base-Emitter Saturation Voltage
IC = 0.5A, IB = 0.1A
1.2
V
VCC = 150V, IC = 0.5A
IB1 = - IB2 = 0.1A
RL = 300Ω
1
µs
2.5
µs
1
µs
tON
Turn ON Time
tSTG
Storage Time
tF
Fall Time
* Pulse Test: PW≤350µs, Duty Cycle≤2%Pulsed
hFE Classification
Classification
R
O
Y
hFE1
20 ~ 40
30 ~ 60
40 ~ 80
©2001 Fairchild Semiconductor Corporation
Rev. A1, June 2001
KSC2333
Typical Characteristics
1000
IB = 100mA
0.8
VCE = 5V
Pulsed
IB = 90mA
IB = 80mA
IB = 70mA
IB = 60mA
0.6
hFE, DC CURRENT GAIN
Ic[A], COLLECTOR CURRENT
1.0
IB = 50mA
IB = 40mA
IB = 30mA
IB = 20mA
0.4
IB = 10mA
0.2
100
10
0.0
0
1
2
3
4
1
5
1
10
VCE[V], COLLECTOR-EMITTER VOLTAGE
1000
IC[mA], COLLECTOR CURRENT
Figure 1. Static Characteristic
Figure 2. DC current Gain
10
10
IC = 5IB1 = -5IB2
Pulsed
IC /IB = 5
Pulsed
1
tstg
ton[µs], TURN ON TIME
tstg[µs], STORAGE TIME
tf[µs], FALL TIME
VBE(sat), VCE(sat)[V], SATURATION VOLTAGE
100
V BE(sat)
0.1
V CE(sat)
1
tf
ton
0.1
0.01
0.01
1
10
100
10
1000
100
1000
IC[mA], COLLECTOR CURRENT
IC[mA], COLLECTOR CURRENT
Figure 3. Collector-Emitter Saturation Voltage
Base-Emitter Saturation Voltage
Figure 4. Turn On, Storage and Fall Time
vs Collector Current
1.0
10000
1000
ipati
on L
1m
imit
ed
10
S
ite
m
Li
10
m
0µ
S
=1
0µ
S
S
0.7
0.6
0.5
0.4
0.3
0.2
VCEX(SUS)
d
100
0.8
VCEO(SUS)
IC(A), COLLECTOR CURRENT
Diss
b
S/
IC[mA], COLLECTOR CURRENT
0.9
PW
0.1
0.0
10
1
10
100
1000
VCE[V], COLLECTOR-EMITTER VOLTAGE
Figure 5. Forward Bias Safe Operating Area
©2001 Fairchild Semiconductor Corporation
0
50
100
150
200
250
300
350
400
450
500
VCE (V), COLLECTOR-EMITTER VOLTAGE
Figure 6. Reverse Bias Safe Operating Area
Rev. A1, June 2001
KSC2333
Typical characteristics (Continued)
20.0
140
17.5
PC[W], POWER DISSIPATION
160
dT(%), Ic DERATING
120
100
80
S/b Limited
60
Dissipation Limited
40
20
0
15.0
12.5
10.0
7.5
5.0
2.5
0.0
0
25
50
75
100
125
150
175
200
o
TC[ C], CASE TEMPERATURE
Figure 7. Derating Curve of Safe Operating Areas
©2001 Fairchild Semiconductor Corporation
0
25
50
75
100
125
150
175
200
o
TC[ C], CASE TEMPERATURE
Figure 8. Power Derating
Rev. A1, June 2001
KSC2333
Package Demensions
TO-220
4.50 ±0.20
2.80 ±0.10
(3.00)
+0.10
1.30 –0.05
18.95MAX.
(3.70)
ø3.60 ±0.10
15.90 ±0.20
1.30 ±0.10
(8.70)
(1.46)
9.20 ±0.20
(1.70)
9.90 ±0.20
1.52 ±0.10
0.80 ±0.10
2.54TYP
[2.54 ±0.20]
10.08 ±0.30
(1.00)
13.08 ±0.20
)
(45°
1.27 ±0.10
+0.10
0.50 –0.05
2.40 ±0.20
2.54TYP
[2.54 ±0.20]
10.00 ±0.20
Dimensions in Millimeters
©2001 Fairchild Semiconductor Corporation
Rev. A1, June 2001
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PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY
LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR
CORPORATION.
As used herein:
2. A critical component is any component of a life support
1. Life support devices or systems are devices or systems
device or system whose failure to perform can be
which, (a) are intended for surgical implant into the body,
reasonably expected to cause the failure of the life support
or (b) support or sustain life, or (c) whose failure to perform
device or system, or to affect its safety or effectiveness.
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in significant injury to the user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or In
Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
©2001 Fairchild Semiconductor Corporation
Rev. H3