FAIRCHILD CD4027BCM

Revised January 2004
CD4027BC
Dual J-K Master/Slave Flip-Flop with Set and Reset
General Description
Features
The CD4027BC dual J-K flip-flops are monolithic complementary MOS (CMOS) integrated circuits constructed with
N- and P-channel enhancement mode transistors. Each
flip-flop has independent J, K, set, reset, and clock inputs
and buffered Q and Q outputs. These flip-flops are edge
sensitive to the clock input and change state on the positive-going transition of the clock pulses. Set or reset is
independent of the clock and is accomplished by a high
level on the respective input.
■ Wide supply voltage range:
3.0V to 15V
■ High noise immunity: 0.45 VDD (typ.)
■ Low power TTL compatibility:
or 1 driving 74LS
■ Low power:
Fan out of 2 driving 74L
50 nW (typ.)
■ Medium speed operation: 12 MHz (typ.) with 10V
supply
All inputs are protected against damage due to static discharge by diode clamps to VDD and VSS.
Ordering Code:
Order Number
Package Number
Package Description
CD4027BCM
M16A
16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
CD4027BCN
N16E
16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Connection Diagram
Truth Table
Inputs tn−1
(Note 1)
CL
(Note 3)
J
Outputs tn
(Note 2)
K
S
R
Q
Q
Q
I
X
O
O
O
I
O
X
O
O
O
I
I
O
O
X
O
O
O
O
I
X
I
O
O
I
O
I
X
X
O
O
X
X
X
X
I
O
X
I
(No Change)
X
X
X
O
I
X
O
I
X
X
X
I
I
X
I
I
O
I = HIGH Level
O = LOW Level
X = Don’t Care
= LOW-to-HIGH
= HIGH-to-LOW
Top View
Note 1: tn−1 refers to the time interval prior to the positive clock pulse
transition
Note 2: tn refers to the time intervals after the positive clock pulse
transition
Note 3: Level Change
© 2004 Fairchild Semiconductor Corporation
DS005958
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CD4027BC Dual J-K Master/Slave Flip-Flop with Set and Reset
October 1987
CD4027BC
Logic Diagram
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2
Recommended Operating
Conditions (Note 5)
(Note 5)
DC Supply Voltage (VDD )
Input Voltage (VIN)
−0.5 VDC to +18 VDC
DC Supply Voltage (VDD)
−0.5V to VDD +0.5 VDC
−65°C to +150°C
Storage Temperature Range (TS)
700 mW
Small Outline
500 mW
−55°C to +125°C
Note 4: “Absolute Maximum Ratings” are those values beyond which the
safety of the device cannot be guaranteed. They are not meant to imply
that the devices should be operated at these limits. The table of “Recommended Operating Conditions” and “Electrical Characteristics” provides
conditions for actual device operation.
Lead Temperature (TL)
Note 5: VSS = 0V unless otherwise specified.
260°C
(Soldering, 10 seconds)
0V to VDD VDC
Operating Temperature Range (TA)
Power Dissipation (PD)
Dual-In-Line
3V to 15 VDC
Input Voltage (VIN)
DC Electrical Characteristics (Note 6)
Symbol
IDD
VOL
VOH
VIL
VIH
IOL
IOH
IIN
Parameter
Quiescent Device Current
−55°C
Conditions
Min
+25°C
Max
Min
Typ
+125°C
Max
Min
Max
VDD = 5V, VIN = VDD or VSS
1
1
VDD = 10V, VIN = VDD or VSS
2
2
60
VDD = 15V, VIN = VDD or VSS
4
4
120
30
LOW Level
|IO| < 1 µA
Output Voltage
VDD = 5V
0.05
0
0.05
0.05
VDD = 10V
0.05
0
0.05
0.05
VDD = 15V
0.05
0
0.05
0.05
HIGH Level
|IO| < 1 µA
Output Voltage
VDD = 5V
4.95
4.95
5
VDD = 10V
9.95
9.95
10
9.95
VDD = 15V
14.95
14.95
15
14.95
µA
V
4.95
V
LOW Level
VDD = 5V, VO = 0.5V or 4.5V
1.5
1.5
1.5
Input Voltage
VDD = 10V, VO = 1V or 9V
3.0
3.0
3.0
VDD = 15V, VO = 1.5V or 13.5V
4.0
4.0
4.0
HIGH Level
VDD = 5V, VO = 0.5V or 4.5V
3.5
3.5
3.5
Input Voltage
VDD = 10V, VO = 1V or 9V
7.0
7.0
7.0
VDD = 15V, VO = 1.5V or 13.5V
11.0
11.0
11.0
LOW Level Output
VDD = 5V, VO = 0.4V
0.64
0.51
0.88
Current (Note 7)
VDD = 10V, VO = 0.5V
1.6
1.3
2.25
0.9
VDD = 15V, VO = 1.5V
4.2
3.4
8.8
2.4
HIGH Level Output
VDD = 5V, VO = 4.6V
−0.64
−0.51
−0.88
−0.36
Current (Note 7)
VDD = 10V, VO = 9.5V
−1.6
−1.3
−2.25
−0.9
VDD = 15V, VO = 13.5V
−4.2
−3.4
−8.8
−2.4
Input Current
Units
V
V
0.36
mA
mA
VDD = 15V, VIN = 0V
−0.1
−10−5
−0.1
−1.0
VDD = 15V, VIN = 15V
0.1
10−5
0.1
1.0
µA
Note 6: VSS = 0V unless otherwise specified.
Note 7: IOH and IOL are tested one output at a time.
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CD4027BC
Absolute Maximum Ratings(Note 4)
CD4027BC
AC Electrical Characteristics
(Note 8)
TA = 25°C, CL = 50 pF, trCL = tfCL = 20 ns, unless otherwise specified
Symbol
tPHL or tPLH
tPHL or tPLH
tPHL or tPLH
tS
tTHL or tTLH
fCL
trCL or tfCL
tW
tWH
Typ
Max
Propagation Delay Time
Parameter
VDD = 5V
Conditions
Min
200
400
from Clock to Q or Q
VDD = 10V
80
160
VDD = 15V
65
130
Propagation Delay Time
VDD = 5V
170
340
from Set to Q or Reset to Q
VDD = 10V
70
140
VDD = 15V
55
110
Propagation Delay Time
VDD = 5V
110
220
from Set to Q or
VDD = 10V
50
100
Reset to Q
VDD = 15V
40
80
Minimum Data Setup Time
Transition Time
VDD = 5V
135
270
VDD = 10V
55
110
VDD = 15V
45
90
VDD = 5V
100
200
VDD = 10V
50
100
VDD = 15V
40
80
Maximum Clock Frequency
VDD = 5V
2.5
5
(Toggle Mode)
VDD = 10V
6.2
12.5
VDD = 15V
7.6
15.5
Maximum Clock Rise
VDD = 5V
15
and Fall Time
VDD = 10V
10
VDD = 15V
5
Units
ns
ns
ns
ns
ns
MHz
µs
Minimum Clock Pulse
VDD = 5V
100
200
Width (tWH = tWL)
VDD = 10V
40
80
VDD = 15V
32
65
Minimum Set and
VDD = 5V
80
160
Reset Pulse Width
VDD = 10V
30
60
VDD = 15V
25
50
7.5
CIN
Average Input Capacitance
Any Input
5
CPD
Power Dissipation Capacity
Per Flip-Flop
35
ns
ns
pF
pF
(Note 9)
Note 8: AC Parameters are guaranteed by DC correlated testing.
Note 9: CPD determines the no load AC power consumption of any CMOS device. For complete explanation, see 74C Family Characteristics application
note, AN-90.
Typical Applications
Ripple Binary Counters
Shift Registers
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CD4027BC
Physical Dimensions inches (millimeters) unless otherwise noted
16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
Package Number M16A
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CD4027BC Dual J-K Master/Slave Flip-Flop with Set and Reset
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Package Number N16E
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
user.
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