STMICROELECTRONICS STU7NB90

STU7NB90
STU7NB90I
N-CHANNEL 900V - 1.1 Ω - 7.3 A Max220/Max220I
PowerMesh™ MOSFET
■
■
■
■
■
■
TYPE
VDSS
RDS(on)
ID
STU7NB90
900 V
< 1.45 Ω
7.3 A
STU7NB90I
900 V
< 1.45 Ω
7.3 A
TYPICAL RDS(on) = 1.1 Ω
EXTREMELY HIGH dv/dt CAPABILITY
100% AVALANCHE TESTED
VERY LOW INTRINSIC CAPACITANCES
GATE CHARGE MINIMIZED
REDUCED VOLTAGE SPREAD
DESCRIPTION
Using the latest high voltage MESH OVERLAY™
process, STMicroelectronics has designed an advanced family of power MOSFETs with outstanding
performances. The new patent pending strip layout
coupled with the Company’s proprieraty edge termination structure, gives the lowest R DS(on) per area,
exceptional avalanche and dv/dt capabilities and
unrivalled gate charge and switching characteristics.
1
2
3
Max220
Max220I
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ HIGH CURRENT, HIGH SPEED SWITCHING
■ SWITH MODE POWER SUPPLIES (SMPS)
■ DC-AC CONVERTERS FOR WELDING
EQUIPMENT
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
STU7NB90
VDS
VDGR
VGS
Unit
STU7NB90I
Drain-source Voltage (VGS = 0)
900
V
Drain-gate Voltage (RGS = 20 kΩ)
900
V
Gate- source Voltage
±30
V
ID
Drain Current (continuos) at TC = 25°C
7.3
7.3 (*)
A
ID
Drain Current (continuos) at TC = 100°C
4.6
4.6 (*)
A
Drain Current (pulsed)
29.2
29.2 (*)
A
Total Dissipation at TC = 25°C
170
60
W
Derating Factor
1.36
0.47
W/°C
IDM (●)
PTOT
dv/dt (1)
Peak Diode Recovery voltage slope
VISO
Insulation Withstand Voltage (DC)
Tstg
Storage Temperature
Tj
Max. Operating Junction Temperature
(•)Pulse width limited by safe operating area
May 2001
4
-
V/ns
2500
V
–65 to 150
°C
150
°C
(1) I SD ≤7.3 A, di/dt ≤200A/µs, V DD ≤ V(BR)DSS, Tj ≤ TJMAX.
(*) Current Limited by Package
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STU7NB90 - STU7NB90I
THERMAL DATA
Rthj-case
Rthj-amb
Tl
Thermal Resistance Junction-case Max
Max220
Max220I
0.734
2.1
°C/W
Thermal Resistance Junction-ambient Max
62.5
°C/W
Maximum Lead Temperature For Soldering Purpose
300
°C
AVALANCHE CHARACTERISTICS
Symbol
Parameter
Max Value
Unit
IAR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max)
7.3
A
EAS
Single Pulse Avalanche Energy
(starting Tj = 25 °C, ID = IAR, VDD = 50 V)
600
mJ
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
Symbol
V(BR)DSS
IDSS
IGSS
Parameter
Test Conditions
Min.
Typ.
Max.
900
Unit
Drain-source
Breakdown Voltage
ID = 250 µA, VGS = 0
V
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
1
µA
VDS = Max Rating, TC = 125 °C
50
µA
Gate-body Leakage
Current (VDS = 0)
VGS = ±30V
±100
nA
ON (1)
Symbol
Parameter
Test Conditions
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250 µA
RDS(on)
Static Drain-source On
Resistance
VGS = 10 V, ID = 4 A
Min.
Typ.
Max.
Unit
2
3
4
V
1.1
1.45
Ω
Typ.
Max.
Unit
DYNAMIC
Symbol
gfs (1)
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Parameter
Forward Transconductance
Test Conditions
VDS > ID(on) x RDS(on)max,
ID = 4 A
VDS = 25V, f = 1 MHz, VGS = 0
Min.
8
S
2120
pF
Ciss
Input Capacitance
Coss
Output Capacitance
225
pF
Crss
Reverse Transfer
Capacitance
23
pF
STU7NB90 - STU7NB90I
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol
td(on)
tr
Parameter
Turn-on Delay Time
Rise Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
Test Conditions
Min.
VDD = 450 V, ID = 3.5 A
RG = 4.7Ω VGS = 10 V
(see test circuit, Figure 3)
VDD = 720V, ID = 7.4A,
VGS = 10V
Typ.
Max.
Unit
25
ns
12
ns
51
72
nC
12.5
nC
23.5
nC
SWITCHING OFF
Symbol
tr(Voff)
Parameter
Off-voltage Rise Time
tf
Fall Time
tc
Cross-over Time
Test Conditions
Min.
VDD = 720V, ID = 7.4 A,
RG = 4.7Ω, VGS = 10V
(see test circuit, Figure 5)
Typ.
Max.
Unit
22
ns
15
ns
31
ns
SOURCE DRAIN DIODE
Symbol
ISD
Parameter
Test Conditions
Min.
Typ.
Source-drain Current
ISDM (2)
Source-drain Current (pulsed)
VSD (1)
Forward On Voltage
ISD = 7.3 A, VGS = 0
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
ISD = 7.4 A, di/dt = 100A/µs,
VDD = 100V, Tj = 150°C
(see test circuit, Figure 5)
IRRM
Reverse Recovery Current
Max.
Unit
7.3
A
29.2
A
1.6
V
700
ns
6.3
µC
18
A
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
Safe Operating Area for Max220
Safe Operating Area for Max220I
3/9
STU7NB90 - STU7NB90I
Thermal Impedence for Max220
Output Characteristics
Transconductance
4/9
Thermal Impedence for Max220I
Transfer Characteristics
Static Drain-source On Resistance
STU7NB90 - STU7NB90I
Gate Charge vs Gate-source Voltage
Normalized Gate Thereshold Voltage vs Temp.
Capacitance Variations
Normalized On Resistance vs Temperature
Source-drain Diode Forward Characteristics
5/9
STU7NB90 - STU7NB90I
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
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STU7NB90 - STU7NB90I
Max220 MECHANICAL DATA
mm
DIM.
MIN.
inch
MAX.
MIN.
A
4.3
TYP.
4.6
0.169
TYP.
MAX.
0.181
A1
2.2
2.4
0.087
0.094
A2
2.9
3.1
0.114
0.122
b
0.7
0.93
0.027
0.036
b1
1.25
1.4
0.049
0.055
b2
1.2
1.38
0.047
0.054
c
0.45
0.6
0.18
0.023
D
15.9
16.3
0.626
0.641
D1
9
9.35
0.354
0.368
D2
0.8
1.2
0.031
0.047
D3
2.8
3.2
0.110
0.126
e
2.44
2.64
0.096
0.104
E
10.05
10.35
0.396
0.407
L
13.2
13.6
0.520
0.535
L1
3
3.4
0.118
0.133
D1
D2
A1
A2
A
C
D3
b
b2
b1
D
e
E
L1
L
P011R
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STU7NB90 - STU7NB90I
I-Max220 MECHANICAL DATA
mm
DIM.
MIN.
TYP.
inch
MAX.
MIN.
TYP.
MAX.
A
4.3
4.6
0.169
0.181
A1
2.6
2.75
0.102
0.108
A2
1.95
2.15
0.077
0.084
b
0.7
0.93
0.027
0.036
b1
1.25
1.4
0.049
0.055
b2
1.2
1.38
0.047
0.054
c
0.45
0.6
0.017
0.023
D
15.9
16.3
0.626
0.641
D1
12.5
12.9
0.492
0.508
D2
0.6
1
0.023
0.039
D3
1.75
2.15
0.069
0.084
e
2.44
2.64
0.096
0.104
E
10.05
10.35
0.396
0.407
L
13.2
13.6
0.520
0.535
L1
3
3.4
0.118
0.133
P011S
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STU7NB90 - STU7NB90I
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of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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