FREESCALE MRF5S9150HR3

Freescale Semiconductor
Technical Data
Document Number: MRF5S9150H-1
Rev. 2, 12/2009
RF Power Field Effect Transistor
MRF5S9150HR3
Designed for N-CDMA base station applications with frequencies from 869
to 960 MHz. Suitable for multicarrier amplifier applications.
• Typical Single-Carrier N-CDMA Performance @ 880 MHz: VDD = 28 Volts,
IDQ = 1500 mA, Pout = 33 Watts Avg., IS-95 CDMA (Pilot, Sync, Paging,
Traffic Codes 8 Through 13). Channel Bandwidth = 1.2288 MHz. PAR =
9.8 dB @ 0.01% Probability on CCDF.
Power Gain — 19.7 dB
Drain Efficiency — 28.4%
ACPR @ 750 kHz Offset — -46.8 dBc in 30 kHz Bandwidth
• Capable of Handling 10:1 VSWR, @ 28 Vdc, 880 MHz, 150 Watts CW
Output Power
Features
• Characterized with Series Equivalent Large-Signal Impedance Parameters
• Internally Matched for Ease of Use
• Qualified Up to a Maximum of 32 VDD Operation
• Integrated ESD Protection
• Lower Thermal Resistance Package
• Low Gold Plating Thickness on Leads, 40μ″ Nominal.
• RoHS Compliant
• In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel.
880 MHz, 33 W AVG., 28 V
SINGLE N-CDMA
LATERAL N-CHANNEL
RF POWER MOSFET
ARCHIVE INFORMATION
ARCHIVE INFORMATION
N-Channel Enhancement-Mode Lateral MOSFET
CASE 465-06, STYLE 1
NI-780
Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Drain-Source Voltage
VDSS
-0.5, +68
Vdc
Gate-Source Voltage
VGS
-0.5, +15
Vdc
Storage Temperature Range
Tstg
-65 to +150
°C
Case Operating Temperature
TC
150
°C
Operating Junction Temperature
TJ
200
°C
Symbol
Value (1)
Unit
Table 2. Thermal Characteristics
Characteristic
Thermal Resistance, Junction to Case
Case Temperature 80°C, 150 W CW
Case Temperature 76°C, 33 W CW
°C/W
RθJC
0.34
0.34
Table 3. ESD Protection Characteristics
Test Methodology
Human Body Model (per JESD22-A114)
Class
1C (Minimum)
Machine Model (per EIA/JESD22-A115)
A (Minimum)
Charge Device Model (per JESD22-C101)
III (Minimum)
1. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes - AN1955.
© Freescale Semiconductor, Inc., 2006, 2009. All rights reserved.
RF Device Data
Freescale Semiconductor
MRF5S9150HR3
1
Table 4. Electrical Characteristics (TC = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
Zero Gate Voltage Drain Leakage Current
(VDS = 68 Vdc, VGS = 0 Vdc)
IDSS
—
—
10
μAdc
Zero Gate Voltage Drain Leakage Current
(VDS = 28 Vdc, VGS = 0 Vdc)
IDSS
—
—
1
μAdc
Gate-Source Leakage Current
(VGS = 5 Vdc, VDS = 0 Vdc)
IGSS
—
—
500
nAdc
Gate Threshold Voltage
(VDS = 10 Vdc, ID = 600 μAdc)
VGS(th)
2
3
4
Vdc
Gate Quiescent Voltage
(VDS = 28 Vdc, ID = 1500 mAdc, Measured in Functional Test)
VGS(Q)
3
4
5
Vdc
Drain-Source On-Voltage
(VGS = 10 Vdc, ID = 3.15 Adc)
VDS(on)
0.1
0.2
0.3
Vdc
Reverse Transfer Capacitance
(VDS = 28 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Crss
—
3.1
—
pF
Output Capacitance
(VDS = 28 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Coss
—
91.5
—
pF
Off Characteristics
Dynamic Characteristics (1)
Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ = 1500 mA, Pout = 33 W Avg. N-CDMA,
f = 880 MHz, Single-Carrier N-CDMA, 1.2288 MHz Channel Bandwidth Carrier. ACPR measured in 30 kHz Channel Bandwidth @ ±750 kHz
Offset. PAR = 9.8 dB @ 0.01% Probability on CCDF.
Power Gain
Gps
18.5
19.7
21.5
dB
Drain Efficiency
ηD
26.5
28.4
—
%
ACPR
—
- 46.8
- 45
dBc
IRL
—
-20
-9
dB
Adjacent Channel Power Ratio
Input Return Loss
1. Part internally input matched.
MRF5S9150HR3
2
RF Device Data
Freescale Semiconductor
ARCHIVE INFORMATION
ARCHIVE INFORMATION
On Characteristics
VBIAS
VSUPPLY
B1
R2
+
+
C14
C18 C19
R1
C15
C16
C20
C21
C22
L2
C17
L1
C8
Z9
RF
INPUT Z1
Z2
Z3
Z4
Z5
Z6
Z7
Z13
Z14 Z15
Z16
C5
Z17
RF
OUTPUT
C2
C7
C4
Z12
C6 Z8
C1
C3
C10 Z10 Z11
C11
C9
C12
C13
L3
DUT
VSUPPLY
+
Z1
Z2
Z3, Z17
Z4
Z5
Z6
Z7
Z8
Z9
0.416″ x 0.080″ Microstrip
0.851″ x 0.080″ Microstrip
0.410″ x 0.080″ Microstrip
0.055″ x 0.220″ Microstrip
0.434″ x 0.220″ Microstrip
0.200″ x 0.220″ x 0.630″ Taper
0.077″ x 0.630″ Microstrip
0.221″ x 0.630″ Microstrip
0.193″ x 0.630″ Microstrip
Z10
Z11
Z12
Z13
Z14
Z15
Z16
PCB
C25
C26
C27
ARCHIVE INFORMATION
ARCHIVE INFORMATION
C23 C24
0.105″ x 0.630″ Microstrip
0.200″ x 0.630″ x 0.220″ Taper
0.236″ x 0.220″ Microstrip
0.195″ x 0.220″ Microstrip
0.059″ x 0.220″ Microstrip
0.989″ x 0.080″ Microstrip
0.284″ x 0.080″ Microstrip
Arlon GX-0300-55-22, 0.030″, εr = 2.55
Figure 1. MRF5S9150HR3 Test Circuit Schematic
Table 5. MRF5S9150HR3 Test Circuit Component Designations and Values
Part
Description
Part Number
Manufacturer
B1
Small Ferrite Bead
2743019447
Fair Rite
C1, C2, C17
47 pF Chip Capacitors
ATC100B470JT500XT
ATC
C3, C12
0.8-8.0 pF Variable Capacitors, Gigatrim
27291SL
Johanson
C4
13 pF Chip Capacitor
ATC100B130JT500XT
ATC
C5, C6
15 pF Chip Capacitors
ATC100B150JT500XT
ATC
C7, C8
12 pF Chip Capacitors
ATC100B120JT500XT
ATC
C9, C10
4.3 pF Chip Capacitors
ATC100B4R3JT500XT
ATC
C11
8.2 pF Chip Capacitor
ATC100B8R2JT500XT
ATC
C13
0.6-4.5 pF Variable Capacitor, Gigatrim
27271SL
Johanson
C14
22 pF Chip Capacitor
ATC100B220JT500XT
ATC
C15
1 μF, 50 V Tantalum Capacitor
T491C105K050AT
Kemit
C16
20K pF Chip Capacitor
CDR35BP203AKYM
Kemit
C18, C23
180 pF Chip Capacitors
ATC100B181JT500XT
ATC
C19, C20, C21, C24, C25, C26
10 μF, 50 V Chip Capacitors
GRM55DR61H106KA88B
Murata
C22, C27
470 μF, 63 V Electrolytic Capacitors
EMVY630GTR471MMH0S
Nippon Chemi-Con
L1, L2, L3
12.5 nH Inductors
A04T
Coilcraft
R1
180 kΩ, 1/4 W Chip Resistor
CRCW12061803FKEA
Vishay
R2
10 Ω, 1/4 W Chip Resistor
CRCW120610R0FKEA
Vishay
MRF5S9150HR3
RF Device Data
Freescale Semiconductor
3
C22
C14
900 MHz
Rev. 3
B1
C16
C19
C15
C20 C21
R2
R1
C18
C17
C5
C7 C9
L2
C3
C4
C6
L3
C11
C12
C8 C10
C13
C2
C23
C24
C25 C26
C27
Figure 2. MRF5S9150HR3 Test Circuit Component Layout
MRF5S9150HR3
4
RF Device Data
Freescale Semiconductor
ARCHIVE INFORMATION
ARCHIVE INFORMATION
C1
CUT OUT AREA
L1
TYPICAL CHARACTERISTICS
17.6
17.2
24
-40
-45
-50
IRL
ACPR
-55
-60
ALT1
16
840
850
860
870
880
890
900
910
-65
920
-3
-8
-13
-18
-23
-28
ARCHIVE INFORMATION
18
16.8
f, FREQUENCY (MHz)
Figure 3. Single-Carrier N-CDMA Broadband Performance
@ Pout = 33 Watts Avg.
41
Gps, POWER GAIN (dB)
39
Gps
18
37
VDD = 28 Vdc, Pout = 66 W (Avg.)
IDQ = 1500 mA, N-CDMA IS-95
(Pilot, Sync, Paging, Traffic Codes
8 Through 13)
17.5
17
35
-35
-40
16.5
16
ACPR
-45
IRL
-50
15.5
15
-55
ALT1
14.5
840
850
860
870
880
890
900
910
-60
920
-3
-8
-13
-18
-23
-28
IRL, INPUT RETURN LOSS (dB)
19
18.5
ηD, DRAIN
EFFICIENCY (%)
43
ηD
ACPR (dBc), ALT1 (dBc)
19.5
f, FREQUENCY (MHz)
Figure 4. Single-Carrier N-CDMA Broadband Performance
@ Pout = 66 Watts Avg.
-10
IMD, THIRD ORDER
INTERMODULATION DISTORTION (dBc)
22
IDQ = 2250 mA
21
Gps, POWER GAIN (dB)
ARCHIVE INFORMATION
26
VDD = 28 Vdc, Pout = 33 W (Avg.)
IDQ = 1500 mA, N-CDMA IS-95
(Pilot, Sync, Paging, Traffic Codes
8 Through 13)
18.4
16.4
28
IRL, INPUT RETURN LOSS (dB)
Gps, POWER GAIN (dB)
19.2
18.8
30
ηD
ACPR (dBc), ALT1 (dBc)
Gps
19.6
ηD, DRAIN
EFFICIENCY (%)
32
20
1875 mA
20
1500 mA
19
1125 mA
18
VDD = 28 Vdc
f1 = 880 MHz, f2 = 880.1 MHz
Two-Tone Measurements
750 mA
17
16
VDD = 28 Vdc
f1 = 880 MHz, f2 = 880.1 MHz
Two-Tone Measurements
-20
2250 mA
-30
IDQ = 750 mA
-40
-50
1875 mA
1500 mA
-60
1125 mA
-70
1
10
100
Pout, OUTPUT POWER (WATTS) PEP
Figure 5. Two-T one Power Gain versus
Output Power
400
1
10
100
400
Pout, OUTPUT POWER (WATTS) PEP
Figure 6. Third Order Intermodulation Distortion
versus Output Power
MRF5S9150HR3
RF Device Data
Freescale Semiconductor
5
TYPICAL CHARACTERISTICS
0
VDD = 28 Vdc, IDQ = 1500 mA
f1 = 880 MHz, f2 = 880.1 MHz
Two-Tone Measurements
-2 0
-3 0
-4 0
3rd Order
-5 0
-6 0
5th Order
-7 0
-8 0
7th Order
-90
1
10
100
VDD = 28 Vdc, Pout = 150 W (PEP)
IDQ = 1500 mA, Two-Tone Measurements
(f1 + f2)/2 = Center Frequency of 880 MHz
-1 0
-2 0
-3 0
3rd Order
-4 0
5th Order
-5 0
7th Order
-60
1
0.1
400
10
Pout, OUTPUT POWER (WATTS) PEP
TWO-T ONE SPACING (MHz)
Figure 7. Intermodulation Distortion Products
versus Output Power
Figure 8. Intermodulation Distortion Products
versus Tone Spacing
61
100
Ideal
P6dB = 54.52 dBm (283.14 W)
Pout, OUTPUT POWER (dBm)
59
P3dB = 53.84 dBm (242.1 W)
57
55
P1dB = 52.87 dBm (193.64 W)
Actual
53
51
49
VDD = 28 Vdc, IDQ = 1500 mA
Pulsed CW, 8 μsec(on), 1 msec(off)
f = 880 MHz
47
45
25
27
29
31
33
35
37
39
41
Pin, INPUT POWER (dBm)
-20
60
-30 _C
85_C
VDD = 28 Vdc, IDQ = 1500 mA
f = 880 MHz, N-CDMA IS-95
(Pilot, Sync, Paging, Traffic Codes
8 Through 13)
50
25_C
-30 _C
40
85_C
30
ηD
20
Gps
TC = -30 _C
85_C 25_C
10
0
1
-40
25_C
-50
ACPR
ALT1
-30
10
100
-60
-70
-80
300
ACPR, ADJACENT CHANNEL POWER RATIO (dBc)
ALT1, CHANNEL POWER (dBc)
ηD, DRAIN EFFICIENCY (%), Gps, POWER GAIN (dB)
Figure 9. Pulse CW Output Power versus
Input Power
Pout, OUTPUT POWER (WATTS) AVG.
Figure 10. Single-Carrier N-CDMA ACPR, ALT1, Power Gain
and Drain Efficiency versus Output Power
MRF5S9150HR3
6
RF Device Data
Freescale Semiconductor
ARCHIVE INFORMATION
IMD, INTERMODULATION DISTORTION (dBc)
IMD, INTERMODULATION DISTORTION (dBc)
ARCHIVE INFORMATION
-1 0
TYPICAL CHARACTERISTICS
23
70
-30 _C
85_C 50
21
25_C
20
40
85_C
30
19
18
VDD = 28 Vdc
IDQ = 1500 mA
f = 880 MHz
17
ARCHIVE INFORMATION
Gps
20
ηD
10
16
ARCHIVE INFORMATION
Gps, POWER GAIN (dB)
TC = -30 _C
ηD, DRAIN EFFICIENCY (%)
60
22
0
0.1
1
10
100
Pout, OUTPUT POWER (WATTS) CW
Figure 11. Power Gain and Drain Efficiency
versus CW Output Power
21
IDQ = 1500 mA
f = 880 MHz
Gps, POWER GAIN (dB)
20
19
18
17
16 V
20 V
24 V
28 V
32 V
VDD = 12 V
16
0
50
100
150
200
250
300
Pout, OUTPUT POWER (WATTS) CW
Figure 12. Power Gain versus Output Power
MTTF FACTOR (HOURS X AMPS2)
1010
109
108
107
90
100 110 120 130 140 150 160 170 180 190 200 210
TJ, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours x ampere2
drain current. Life tests at elevated temperatures have correlated to
better than ±10% of the theoretical prediction for metal failure. Divide
MTTF factor by ID2 for MTTF in a particular application.
Figure 13. MTTF Factor versus Junction Temperature
MRF5S9150HR3
RF Device Data
Freescale Semiconductor
7
100
-10
-20
-30
1
-40
-50
0.1
(dB)
PROBABILITY (%)
10
IS-95 CDMA (Pilot, Sync, Paging, Traffic Codes 8
Through 13) 1.2288 MHz Channel Bandwidth
Carriers. ACPR Measured in 30 kHz Bandwidth @
±750 kHz Offset. ALT1 Measured in 30 kHz
Bandwidth @ ±1.98 MHz Offset. PAR = 9.8 dB @
0.01% Probability on CCDF.
0.01
0.001
-70
-80
-90
0.0001
ARCHIVE INFORMATION
-60
0
2
4
6
8
10
1.2288 MHz
Channel BW
.....................................................
. . . .
...........
..
..
..
..
..
..
.
..
...
.
..
.
-AL T1 in 30 kHz
+ALT1 in 30 kHz
.
..
.
Integrated BW
Integrated BW
..................
.........
..........
.....
..........
.
. ................
...... ... ..
.
.
.
.
.
.
.
..............
.................
.........
............
...
......
......
........
..........
.
.
.
.
.
.
.
.
.
.........
............. .
.
.
.
....... -ACPR in 30 kHz
.
.
.
.
..
....
.
.
+ACPR in 30 kHz ......................
.......
...............
.
........
.
................
...
.
.
.
.
.
Integrated BW
Integrated BW
........
......
...........
......
...
..........
...........
-100
PEAK-T O-A VERAGE (dB)
Figure 14. Single-Carrier CCDF N-CDMA
-1 10
-3.6 -2.9 -2.2
-1.5
-0.7
0
0.7
1.5
2.2
2.9
3.6
f, FREQUENCY (MHz)
Figure 15. Single-Carrier N-CDMA Spectrum
MRF5S9150HR3
8
RF Device Data
Freescale Semiconductor
ARCHIVE INFORMATION
N-CDMA TEST SIGNAL
f = 910 MHz
Zload
f = 850 MHz
Zo = 5 Ω
f = 850 MHz
ARCHIVE INFORMATION
ARCHIVE INFORMATION
Zsource
f = 910 MHz
VDD = 28 Vdc, IDQ = 1500 mA, Pout = 33 W Avg.
f
MHz
Zsource
W
Zload
W
850
3.61 - j2.30
1.12 + j0.09
865
2.85 - j2.54
1.24 + j0.22
880
2.13 - j2.47
1.31 + j0.36
895
1.53 - j2.27
1.46 + j0.48
910
1.02 - j1.90
1.61 + j0.53
Zsource = Test circuit impedance as measured from
gate to ground.
Zload
= Test circuit impedance as measured
from drain to ground.
Output
Matching
Network
Device
Under
Test
Input
Matching
Network
Z
source
Z
load
Figure 16. Series Equivalent Source and Load Impedance
MRF5S9150HR3
RF Device Data
Freescale Semiconductor
9
PACKAGE DIMENSIONS
G
2X
1
Q
bbb
M
T A
M
B
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M-1994.
2. CONTROLLING DIMENSION: INCH.
3. DELETED
4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY
FROM PACKAGE BODY.
M
3
B
K
2
(FLANGE)
D
bbb
M
T A
M
B
M
M
bbb
N
M
T A
M
B
M
ccc
M
T A
M
M
aaa
M
T A
M
S
(LID)
ccc
ARCHIVE INFORMATION
R
(INSULATOR)
M
T A
M
B
(LID)
B
M
(INSULATOR)
B
M
H
C
F
E
A
T
SEATING
PLANE
A
DIM
A
B
C
D
E
F
G
H
K
M
N
Q
R
S
aaa
bbb
ccc
INCHES
MIN
MAX
1.335
1.345
0.380
0.390
0.125
0.170
0.495
0.505
0.035
0.045
0.003
0.006
1.100 BSC
0.057
0.067
0.170
0.210
0.774
0.786
0.772
0.788
.118
.138
0.365
0.375
0.365
0.375
0.005 REF
0.010 REF
0.015 REF
MILLIMETERS
MIN
MAX
33.91
34.16
9.65
9.91
3.18
4.32
12.57
12.83
0.89
1.14
0.08
0.15
27.94 BSC
1.45
1.70
4.32
5.33
19.66
19.96
19.60
20.00
3.00
3.51
9.27
9.53
9.27
9.52
0.127 REF
0.254 REF
0.381 REF
STYLE 1:
PIN 1. DRAIN
2. GATE
3. SOURCE
(FLANGE)
CASE 465-06
ISSUE G
NI-780
MRF5S9150HR3
MRF5S9150HR3
10
RF Device Data
Freescale Semiconductor
ARCHIVE INFORMATION
B
REVISION HISTORY
The following table summarizes revisions to this document.
Revision
Date
2
Dec. 2009
Description
• Data sheet revised to reflect part status change, p. 1, 3-4, including use of applicable overlay.
• Data sheet archived. Part no longer manufactured. See MRF5S9150H-2 for MRF5S9150HS part.
• Updated Part Numbers in Table 5, Component Designations and Values, to RoHS compliant part
numbers, p. 3
ARCHIVE INFORMATION
ARCHIVE INFORMATION
• Added Revision History, p. 11
MRF5S9150HR3
RF Device Data
Freescale Semiconductor
11
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MRF5S9150HR3
Document Number: MRF5S9150H-1
Rev. 2, 12/2009
12
RF Device Data
Freescale Semiconductor
ARCHIVE INFORMATION
ARCHIVE INFORMATION
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