FREESCALE MRF281SR1_06

Freescale Semiconductor
Technical Data
Document Number: MRF281
Rev. 5, 5/2006
RF Power Field Effect Transistors
MRF281SR1
MRF281ZR1
N - Channel Enhancement - Mode Lateral MOSFETs
Designed for digital and analog cellular PCN and PCS base station
applications with frequencies from 1000 to 2500 MHz. Characterized for
operation Class A and Class AB at 26 volts in commercial and industrial
applications.
• Specified Two - Tone Performance @ 1930 and 2000 MHz, 26 Volts
Output Power — 4 Watts PEP
Power Gain — 11 dB
Efficiency — 30%
Intermodulation Distortion — - 29 dBc
• Capable of Handling 10:1 VSWR, @ 26 Vdc,
2000 MHz, 4 Watts CW Output Power
Features
• Excellent Thermal Stability
• Characterized with Series Equivalent Large - Signal Impedance Parameters
• S - Parameter Characterization at High Bias Levels
• RoHS Compliant
• Available in Tape and Reel. R1 Suffix = 500 Units per
12 mm, 7 inch Reel.
2000 MHz, 4 W, 26 V
LATERAL N - CHANNEL
BROADBAND
RF POWER MOSFETs
CASE 458B - 03, STYLE 1
NI - 200S
MRF281SR1
CASE 458C - 03, STYLE 1
NI - 200Z
MRF281ZR1
Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Drain - Source Voltage
VDSS
- 0.5, +65
Vdc
Gate - Source Voltage
VGS
± 20
Vdc
Total Device Dissipation @ TC = 25°C
Derate above 25°C
PD
20
0.115
W
W/°C
Storage Temperature Range
Tstg
- 65 to +150
°C
Case Operating Temperature
TC
150
°C
Operating Junction Temperature
TJ
200
°C
Symbol
Value
Unit
RθJC
5.74
°C/W
Table 2. Thermal Characteristics
Characteristic
Thermal Resistance, Junction to Case
Table 3. Electrical Characteristics (TC = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
V(BR)DSS
65
74
—
Vdc
Zero Gate Voltage Drain Current
(VDS = 28 Vdc, VGS = 0)
IDSS
—
—
10
μAdc
Gate - Source Leakage Current
(VGS = 20 Vdc, VDS = 0)
IGSS
—
—
1
μAdc
Off Characteristics
Drain - Source Breakdown Voltage
(VGS = 0, ID = 10 μAdc)
NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and
packaging MOS devices should be observed.
© Freescale Semiconductor, Inc., 2006. All rights reserved.
RF Device Data
Freescale Semiconductor
MRF281SR1 MRF281ZR1
1
Table 3. Electrical Characteristics (TC = 25°C unless otherwise noted) (continued)
Characteristic
Symbol
Min
Typ
Max
Unit
Gate Threshold Voltage
(VDS = 10 Vdc, ID = 20 μAdc)
VGS(th)
2.4
3.2
4
Vdc
Gate Quiescent Voltage
(VDS = 26 Vdc, ID = 25 mAdc)
VGS(q)
3
4.1
5
Vdc
Drain - Source On - Voltage
(VGS = 10 Vdc, ID = 0.1 A)
VDS(on)
0.18
0.24
0.30
Vdc
Input Capacitance
(VDS = 26 Vdc, VGS = 0, f = 1.0 MHz)
Ciss
—
5.5
—
pF
Output Capacitance
(VDS = 26 Vdc, VGS = 0, f = 1.0 MHz)
Coss
—
3.3
—
pF
Reverse Transfer Capacitance
(VDS = 26 Vdc, VGS = 0, f = 1.0 MHz)
Crss
—
0.17
—
pF
Common - Source Amplifier Power Gain
(VDD = 26 Vdc, Pout = 4 W PEP, IDQ = 25 mA,
f1 = 2000.0 MHz, f2 = 2000.1 MHz)
Gps
11
12.5
—
dB
Drain Efficiency
(VDD = 26 Vdc, Pout = 4 W PEP, IDQ = 25 mA,
f1 = 2000.0 MHz, f2 = 2000.1 MHz)
η
30
33
—
%
Input Return Loss
(VDD = 26 Vdc, Pout = 4 W PEP, IDQ = 25 mA,
f1 = 2000.0 MHz, f2 = 2000.1 MHz)
IRL
—
- 16
- 10
dB
Intermodulation Distortion
(VDD = 26 Vdc, Pout = 4 W PEP, IDQ = 25 mA,
f1 = 2000.0 MHz, f2 = 2000.1 MHz)
IMD
—
- 31
- 29
dBc
Common - Source Amplifier Power Gain
(VDD = 26 Vdc, Pout = 4 W PEP, IDQ = 25 mA,
f1 = 1930.0 MHz, f2 = 1930.1 MHz)
Gps
11
12.5
—
dB
η
30
—
—
%
Input Return Loss
(VDD = 26 Vdc, Pout = 4 W PEP, IDQ = 25 mA,
f1 = 1930.0 MHz, f2 = 1930.1 MHz)
IRL
—
- 16
- 10
dB
Intermodulation Distortion
(VDD = 26 Vdc, Pout = 4 W PEP, IDQ = 25 mA,
f1 = 1930.0 MHz, f2 = 1930.1 MHz)
IMD
—
- 31
—
dBc
Common - Source Amplifier Power Gain
(VDD = 26 Vdc, Pout = 4 W CW, IDQ = 25 mA,
f1 = 2000.0 MHz)
Gps
10.5
12
—
dB
Drain Efficiency
(VDD = 26 Vdc, Pout = 4 W CW, IDQ = 25 mA,
f1 = 2000.0 MHz)
η
40
44
—
%
On Characteristics
Dynamic Characteristics
Functional Tests (In Freescale Test Fixture)
Drain Efficiency
(VDD = 26 Vdc, Pout = 4 W, IDQ = 25 mA,
f1 = 1930.0 MHz, f2 = 1930.1 MHz)
MRF281SR1 MRF281ZR1
2
RF Device Data
Freescale Semiconductor
Zo = 25 Ω
f = 2000 MHz
Zin
f = 2000 MHz
ZOL*
f = 1500 MHz
f = 1500 MHz
VDD = 26 V, IDQ = 25 mA, Pout = 4 W (PEP)
f
MHz
Zin
Zin
Ω
ZOL*
Ω
1500
3.15 - j5.3
15.5 - j13.6
1600
3.1 - j3.8
14.7 - j12.5
1700
3.1 - j2.3
14.0 - j11.7
1800
3.1 - j0.7
13.4 - j11.0
1900
3.1 + j0.9
12.8 - j10.1
2000
3.1 + j2.4
12.2 - j9.2
= Complex conjugate of source impedance.
ZOL* = Complex conjugate of the optimum load
impedance at given output power, voltage,
IMD, bias current and frequency.
Input
Matching
Network
Output
Matching
Network
Device
Under Test
Z
in
Z
*
OL
Figure 1. Series Equivalent Input and Output Impedance
MRF281SR1 MRF281ZR1
RF Device Data
Freescale Semiconductor
3
Table 4. Common Source S - Parameters at VDS = 26 Vdc, ID = 250 mAdc
f
GHz
S11
S21
S12
S22
|S11|
∠f
dB
∠f
|S12|
∠f
|S22|
∠f
0.1
.982
-28
18.9
160
.008
73
.851
-13
0.2
.947
-52
17.0
143
.015
58
.811
-25
0.3
.912
-73
15.0
129
.019
45
.770
-33
0.4
.886
-90
12.9
117
.022
36
.741
-42
0.5
.859
-103
11.1
108
.022
28
.719
-47
0.6
.854
-114
9.69
100
.023
23
.718
-51
0.7
.841
-123
8.54
93
.022
18
.709
-56
0.8
.837
-131
7.57
87
.021
15
.714
-59
0.9
.838
-138
6.69
81
.019
12
.719
-62
1.0
.841
-143
6.01
76
.018
11
.728
-64
1.1
.840
-149
5.41
72
.015
12
.742
-66
1.2
.849
-153
4.91
68
.013
13
.745
-68
1.3
.848
-158
4.51
64
.012
18
.758
-69
1.4
.856
-162
4.12
60
.010
26
.769
-70
1.5
.858
-167
3.78
57
.009
36
.786
-70
1.6
.871
-170
3.50
54
.008
54
.797
-72
1.7
.868
-173
3.22
51
.009
69
.808
-71
1.8
.870
-176
3.00
49
.009
82
.823
-72
1.9
.872
-180
2.80
46
.011
95
.828
-72
2.0
.877
178
2.63
44
.013
104
.845
-72
2.1
.876
174
2.47
41
.015
109
.843
-72
2.2
.880
171
2.36
39
.018
111
.859
-71
2.3
.882
168
2.21
36
.021
114
.858
-72
2.4
.886
165
2.12
34
.024
114
.872
-70
2.5
.896
162
1.97
32
.027
115
.863
-70
2.6
.897
158
1.89
29
.029
117
.873
-69
MRF281SR1 MRF281ZR1
4
RF Device Data
Freescale Semiconductor
NOTES
MRF281SR1 MRF281ZR1
RF Device Data
Freescale Semiconductor
5
NOTES
MRF281SR1 MRF281ZR1
6
RF Device Data
Freescale Semiconductor
PACKAGE DIMENSIONS
ccc
T A
M
B
M
M
M
NOTES:
1. CONTROLLING DIMENSIONS: INCHES.
2. INTERPRET DIMENSIONS AND TOLERANCES
PER ASME Y14.5M, 1994.
3. ALL DIMENSIONS ARE SYMMETRICAL ABOUT
CENTERLINE UNLESS OTHERWISE NOTED.
(INSULATOR)
R
1
4X
2X
(LID)
ccc
T A
M
M
B
M
Z
K
S (INSULATOR)
ccc M T A
2
M
B
B
M
D
2X
3
bbb
T A
M
B
M
B
M
(FLANGE)
ccc
T A
M
B
M
M
DIM
A
B
C
D
E
F
H
K
M
N
R
S
Z
bbb
ccc
INCHES
MIN
MAX
0.180
0.190
0.140
0.150
0.082
0.116
0.047
0.053
0.004
0.010
0.004
0.006
0.025
0.031
0.060
0.110
0.197
0.203
0.177
0.183
0.147
0.153
0.157
0.163
−−−
0.020
0.010 REF
0.015 REF
MILLIMETERS
MIN
MAX
4.572
4.83
3.556
3.81
2.083
2.946
1.194
1.346
0.102
0.254
0.102
0.152
0.635
0.787
1.524
2.794
5.004
5.156
4.496
4.648
3.734
3.886
3.988
4.14
−−−
0.508
0.254 REF
0.381 REF
STYLE 1:
PIN 1. DRAIN
2. GATE
3. SOURCE
N
(LID)
E
F
C
H
A
T
A
CASE 458B - 03
ISSUE D
NI - 200S
MRF281SR1
SEATING
PLANE
(FLANGE)
ccc
T A
M
M
B
M
F
M
(INSULATOR)
4X
Z
R
ccc
1
Y
(LID)
M
T A
M
B
M
3
S
B
(INSULATOR)
ccc
M
T A
M
B
(FLANGE)
M
B
2
2X
D
bbb
M
T A
ccc
M
B
M
T A
2X
K
M
B
M
M
N
(LID)
H
E
A
C
A
(FLANGE)
T
SEATING
PLANE
NOTES:
1. CONTROLLING DIMENSIONS: INCHES.
2. INTERPRET DIMENSIONS AND TOLERANCES
PER ASME Y14.5M, 1994.
3. DIMENSION H (PACKAGE COPLANARITY): THE
BOTTOM OF LEADS AND REFERENCE PLANE T
MUST BE COPLANAR WITHIN DIMENSION H.
DIM
A
B
C
D
E
F
H
K
M
N
R
S
Y
Z
bbb
ccc
INCHES
MIN
MAX
0.180
0.190
0.140
0.150
0.082
0.116
0.047
0.053
0.004
0.010
0.004
0.006
0.000
0.004
0.050
0.090
0.197
0.203
0.177
0.183
0.147
0.153
0.157
0.163
0.020
0.040
−−− R .020
.010 REF
.015 REF
MILLIMETERS
MIN
MAX
4.572
4.830
3.556
3.810
2.083
2.946
1.194
1.346
0.102
0.254
0.102
0.152
0.000
0.102
1.270
2.286
5.004
5.156
4.496
4.648
3.734
3.886
3.988
4.140
0.508
1.016
−−− R .508
0.254 REF
0.381 REF
STYLE 1:
PIN 1. DRAIN
2. GATE
3. SOURCE
CASE 458C - 03
ISSUE D
NI - 200Z
MRF281ZR1
MRF281SR1 MRF281ZR1
RF Device Data
Freescale Semiconductor
7
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© Freescale Semiconductor, Inc. 2006. All rights reserved.
MRF281SR1 MRF281ZR1
Document Number: MRF281
8Rev. 5, 5/2006
RF Device Data
Freescale Semiconductor