FREESCALE MHVIC2115NR2

Freescale Semiconductor
Technical Data
Document Number: MHVIC2115NR2
Rev. 5, 5/2006
RF LDMOS Wideband Integrated
Power Amplifier
MHVIC2115NR2
The MHVIC2115NR2 wideband integrated circuit is designed for base station
applications. It uses Freescale’s newest High Voltage (26 to 28 Volts) LDMOS
IC technology and integrates a multi - stage structure. Its wideband On - Chip
matching design makes it usable from 1600 to 2600 MHz. The linearity
performances cover W - CDMA modulation formats.
Final Application
• Typical W - CDMA Performance: - 45 dBc ACPR, 2110 - 2170 MHz, VDD =
27 Volts, IDQ1 = 56 mA, IDQ2 = 61 mA, IDQ3 = 117 mA, Pout = 34 dBm,
3GPP Test Model 1, Measured in 1.0 MHz BW @ 4 MHz offset, 64 DTCH
Power Gain — 30 dB
PAE = 16%
Driver Application
• Typical W - CDMA Performance: - 53 dBc ACPR, 2110 - 2170 MHz, VDD =
26 Volts, IDQ1 = 96 mA, IDQ2 = 204 mA, IDQ3 = 111 mA, Pout = 23 dBm,
3GPP Test Model 1, Measured in 3.84 MHz BW @ 5 MHz offset, 64 DTCH
Power Gain — 34 dB
• Gain Flatness = 0.3 dB from 2110 - 2170 MHz
• P1dB = 15 Watts, Gain Flatness = 0.2 dB from 2110 - 2170 MHz
• Capable of Handling 3:1 VSWR, @ 26 Vdc, 2140 MHz, 15 Watts CW
Output Power
Features
• Characterized with Series Equivalent Large - Signal Impedance Parameters
• On - Chip Matching (50 Ohm Input, DC Blocked, >5 Ohm Output)
• Integrated Temperature Compensation with Enable/Disable Function
• Integrated ESD Protection
• RoHS Compliant
• In Tape and Reel. R2 Suffix = 1,500 Units per 16 mm, 13 inch Reel.
2170 MHz, 26 V, 23/34 dBm
W - CDMA
RF LDMOS WIDEBAND
INTEGRATED POWER AMPLIFIER
16
1
CASE 978 - 03
PFP - 16
Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Drain- Source Voltage
VDSS
- 0.5, +65
Vdc
Gate- Source Voltage
VGS
- 0.5, +15
Vdc
Storage Temperature Range
Tstg
- 65 to +150
°C
Operating Junction Temperature
TJ
150
°C
VGS3
VGS2
VGS1
Quiescent Current
Temperature Compensation
RFin IC
VDS1
VDS2
VDS3/RFout
3 Stages IC
1
16
N.C.
2
15
VDS3/RFout
VGS2
3
14
VDS3/RFout
VGS1
4
13
VDS3/RFout
RFin
5
12
VDS3/RFout
RFin
6
11
VDS3/RFout
VDS1
VDS2
7
8
10
9
VDS3/RFout
N.C.
(Top View)
Note: Exposed backside flag is source
terminal for transistors.
Figure 1. Block Diagram
© Freescale Semiconductor, Inc., 2006. All rights reserved.
RF Device Data
Freescale Semiconductor
N.C.
VGS3
Figure 2. Pin Connections
MHVIC2115NR2
1
Table 2. Thermal Characteristics
Characteristic
Symbol
Thermal Resistance, Junction to Case
Value
Unit
RθJC
°C/W
Driver Application
(Pout = +0.2 W CW)
Stage 1, 26 Vdc, IDQ = 96 mA
Stage 2, 26 Vdc, IDQ = 204 mA
Stage 3, 26 Vdc, IDQ = 111 mA
3.5
Output Application
(Pout = +2.5 W CW)
Stage 1, 27 Vdc, IDQ = 56 mA
Stage 2, 27 Vdc, IDQ = 61 mA
Stage 3, 27 Vdc, IDQ = 117 mA
2.7
Table 3. ESD Protection Characteristics
Test Conditions
Class
Human Body Model
1 (Minimum)
Machine Model
M1 (Minimum)
Charge Device Model
C2 (Minimum)
Table 4. Moisture Sensitivity Level
Test Methodology
Rating
Package Peak Temperature
Unit
3
260
°C
Per JESD 22 - A113, IPC/JEDEC J - STD - 020
Table 5. Electrical Characteristics (TC = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
W - CDMA Characteristics (In Freescale Test Fixture, 50 ohm system) VDD = 26 Vdc, IDQ1 = 96 mA, IDQ2 = 204 mA, IDQ3 = 111 mA,
Pout = 23 dBm, 2110- 2170 MHz
Power Gain
Gps
31
34
—
dB
Gain Flatness
GF
—
0.3
0.5
dB
Input Return Loss
IRL
—
- 12
- 10
dB
Group Delay
—
—
1.7
—
ns
Phase Linearity
—
—
0.2
—
°
1 - Carrier W - CDMA Conditions: Adjacent Channel Power Ratio
@ Pout = 23 dBm, 5 MHz Offset
ACPR
—
- 53
- 50
dBc
1 - Carrier W - CDMA Conditions: Adjacent Channel Power Ratio
@ Pout = 28 dBm, 5 MHz Offset
ACPR
—
- 50
—
dBc
W - CDMA Characteristics (In Freescale Test Fixture, 50 ohm system) VDD = 27 Vdc, IDQ1 = 56 mA, IDQ2 = 61 mA, IDQ3 = 117 mA,
Pout = 34 dBm, 2110- 2170 MHz
Power Gain
Gps
—
30
—
dB
Gain Flatness
GF
—
0.2
—
dB
Input Return Loss
IRL
—
- 12
—
dB
Power Added Efficiency
PAE
—
16
—
%
ACPR
—
- 45
—
dBc
1 - Carrier W - CDMA Conditions: Adjacent Channel Power Ratio
@ Pout = 34 dBm, 4 MHz Offset
MHVIC2115NR2
2
RF Device Data
Freescale Semiconductor
1
16
2
15
Vbias3
+
R3
C1
C2
C15
Vbias2
+
R2
C5
14
3
C3
Vbias1
4
13
5
12
C16
RF
OUTPUT
+
R1
C14
RF
INPUT
C4
6
VD1
+
C21
VD2
+
C13
7
+
C8
C7
C1, C5, C8, C12, C14, C19
C2, C3, C4, C7, C11, C18
C6, C10, C17
C9, C15, C16
VD3
10
+
C17
8
C11
11
C6
+
C12
Quiescent Current
Temperature Compensation
C9
C18
C19
+
C20
9
C10
1 mF SMT Tantalum Chip Capacitors
0.01 mF Chip Capacitors (0805C103K5RACTR)
6.8 pF Chip Capacitors, ACCU - P (AVX 08051J6R8BBT)
1.8 pF Chip Capacitors, ACCU - P (AVX 08051J1R8BBT)
C13, C20, C21 330 mF Electrolytic Capacitors
(MCR35V337M10X16)
R1, R2, R3
1 kW Chip Resistors (0805)
PCB
Arlon, 0.020,, er = 2.55
Figure 3. MHVIC2115NR2 Demo Board Schematic
MHVIC2115NR2
RF Device Data
Freescale Semiconductor
3
Vbias1
Vbias2
Vbias3
R1
R2
R3
VGS
C2
C14
C5
C4
VG1
VG2
VG3
C1
MHVIC2115R2
Rev 1
C3
C15
C9
C16
C6
C10
C17
C7
C18
C12
C8
C19
C11
C21
VDD1
C13
VDD2
C20
VDD3
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor
signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have
no impact on form, fit or function of the current product.
Figure 4. MHVIC2115NR2 Demo Board Component Layout
MHVIC2115NR2
4
RF Device Data
Freescale Semiconductor
TYPICAL CHARACTERISTICS
50
0
40
1.8
1.6
−5
S21
TC = 85_C
1.4
25_C
20
−15
S11
10
−20
0
−25
S11 (dB)
−10
DELAY, (nSEC)
S21 (dB)
30
1.2
−30_C
1
0.8
0.6
0.4
−10
−30
VDD = 27 Vdc, Pout = 23 dBm CW
VDD = 27 Vdc, Pout = 23 dBm CW
0.2
IDQ1 = 96 mA, IDQ2 = 204 mA, IDQ3 = 111 mA
−20
−35
1000 1200 1400 1600 1800 2000 2200 2400 2600 2800 3000
0
2100
IDQ1 = 96 mA, IDQ2 = 204 mA, IDQ3 = 111 mA
2110
2120
2130
2140
2150
2160
f, FEQUENCY (MHz)
f, FREQUENCY (MHz)
Figure 5. Broadband Frequency Response
Figure 6. Delay versus Frequency
40
2170
2180
2170
2180
20
38
TC = −30_C
37
36
25_C
35
34
85_C
33
32
IRL, INPUT RETURN LOSS (dB)
G ps , POWER GAIN (dB)
39
TC = 85_C
15
25_C
−30_C
10
5
VDD = 27 Vdc, Pout = 23 dBm CW
VDD = 27 Vdc, Pout = 23 dBm CW
31
30
2100
IDQ1 = 96 mA, IDQ2 = 204 mA, IDQ3 = 111 mA
IDQ1 = 96 mA, IDQ2 = 204 mA, IDQ3 = 111 mA
2110
2120
2130
2140
2150
2160
2170
0
2100
2180
2110
2120
2130
2140
2150
2160
f, FREQUENCY (MHz)
f, FREQUENCY, (MHz)
Figure 7. Power Gain versus Frequency
Figure 8. Input Return Loss versus Frequency
40
70
39
37
65
TC = 25_C
TC = −30_C
S21 PHASE(_)
G ps , POWER GAIN (dB)
38
36
25_C
35
34
85_C
33
60
−30_C
55
50
85_C
32
45
VDD = 27 Vdc, f = 2140 MHz
31
IDQ1 = 96 mA, IDQ2 = 204 mA, IDQ3 = 111 mA
30
20
25
30
35
VDD = 27 Vdc, f = 2140 MHz
IDQ1 = 96 mA, IDQ2 = 204 mA, IDQ3 = 111 mA
40
40
45
20
25
30
35
40
Pout, OUTPUT POWER (dBm)
Pout, OUTPUT POWER (dBm)
Figure 9. Power Gain versus Output Power
Figure 10. S21 Phase versus Output Power
45
MHVIC2115NR2
RF Device Data
Freescale Semiconductor
5
−40
−40
VDD = 27 Vdc
3GPP Test Model 1
64 DPCH
−42
−44
−45
−46
VDD = 27 Vdc
Pout = 23 dBm Two−Tone Avg.
Tone Spacing = 100 kHz
IDQ3 = 100 mA
−50
−50
IMR (dBc)
−48
2110 MHz
−52
2170 MHz
−54
−56
−58
17
19
21
−55
3rd Order
23
25
27
29
31
111 mA
100 mA
−65
2140 MHz
−60
15
122 mA
−60
5th Order
33
−70
2000
35
122 mA
2050
2100
2150
2200
2250
Pout, OUTPUT POWER (dBm)
f, FREQUENCY (MHz)
Figure 11. W - CDMA ACPR versus Output Power
Figure 12. Two - Tone IMR versus Frequency
−50
6.00
−52
5.75
5.50
VBIAS1
5.25
VBIAS2
Vbias, FIXTURE BIAS VOLTAGE (V)
−54
3rd Order
−56
−58
VDD = 27 Vdc, f = 2140
Pout = 23 dBm, Two−Tone Avg.
−60
−62
5th Order
−64
−66
−68
−70
5
10
15
20
25
5.00
VDD = 27 Vdc
R1 = R2 = R3 = 1000 Ohms
4.75
4.50
4.25
VBIAS3
4.00
3.75
3.50
3.25
3.00
−40 −30 −20 −10
0
10 20 30 40
50 60 70 80 90 100
TONE SPACING (MHz)
T, TEMPERATURE (C)
Figure 13. Two - Tone Broadband Performance
Figure 14. Fixture Bias versus Temperature
Vgs, IC GATE BIAS VOLTAGE (V)
0
4.20
2.00
4.10
1.80
4.00
3.90
1.60
Vgs1 & Vgs2
Igs1 & Igs2
3.80
3.60
1.40
1.20
VDD = 27 Vdc
R1 = R2 = R3 = 1000 Ohms
3.70
Vgs3
1.00
0.80
3.50
0.60
3.40
0.40
Igs3
3.30
3.20
−40 −30 −20 −10
2300
Igs, GATE BIAS CURRENT (mA)
IMD, INTERMODULATION DISTORTION (dBc)
ACPR, ADJACENT CHANNEL POWER RATIO (dBc)
TYPICAL CHARACTERISTICS
0.20
0.00
0
10 20 30 40
50 60 70 80 90 100
T, TEMPERATURE (C)
Figure 15. Gate Bias versus Temperature
MHVIC2115NR2
6
RF Device Data
Freescale Semiconductor
Zo = 50 Ω
f = 2170 MHz
f = 2110 MHz
Zin
Zload
f = 2170 MHz
f = 2110 MHz
VDD = 27 Vdc, IDQ = 1411 mA, Pout = 15 W Avg.
Zin
f
MHz
Zin
Ω
Zload
Ω
2110
72.55 + j12.8
4.25 + j1.00
2140
71.40 + j9.9
4.13 + j1.37
2170
70.20 + j7.1
4.12 + j1.46
= Device input impedance as measured from
gate to ground.
Zload = Test circuit impedance as measured
from drain to ground.
Output
Matching
Network
Device
Under Test
Z
in
Z
load
Figure 16. Series Equivalent Input and Load Impedance
MHVIC2115NR2
RF Device Data
Freescale Semiconductor
7
NOTES
MHVIC2115NR2
8
RF Device Data
Freescale Semiconductor
NOTES
MHVIC2115NR2
RF Device Data
Freescale Semiconductor
9
NOTES
MHVIC2115NR2
10
RF Device Data
Freescale Semiconductor
PACKAGE DIMENSIONS
h X 45 _
A
E2
1
14 x e
16
D
e/2
D1
8
9
E1
8X
bbb
M
B
BOTTOM VIEW
E
C B
S
ÉÉ
ÇÇÇ
ÇÇÇ
ÉÉ
b1
Y
c
A A2
c1
b
DATUM
PLANE
SEATING
PLANE
H
M
ccc C
q
W
GAUGE
PLANE
W
L
C A
SECT W - W
L1
C
aaa
A1
1.000
0.039
S
NOTES:
1. CONTROLLING DIMENSION: MILLIMETER.
2. DIMENSIONS AND TOLERANCES PER ASME
Y14.5M, 1994.
3. DATUM PLANE −H− IS LOCATED AT BOTTOM OF
LEAD AND IS COINCIDENT WITH THE LEAD
WHERE THE LEAD EXITS THE PLASTIC BODY AT
THE BOTTOM OF THE PARTING LINE.
4. DIMENSIONS D AND E1 DO NOT INCLUDE MOLD
PROTRUSION. ALLOWABLE PROTRUSION IS
0.250 PER SIDE. DIMENSIONS D AND E1 DO
INCLUDE MOLD MISMATCH AND ARE
DETERMINED AT DATUM PLANE −H−.
5. DIMENSION b DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION IS 0.127 TOTAL IN EXCESS OF THE
b DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. DATUMS −A− AND −B− TO BE DETERMINED AT
DATUM PLANE −H−.
DIM
A
A1
A2
D
D1
E
E1
E2
L
L1
b
b1
c
c1
e
h
q
aaa
bbb
ccc
MILLIMETERS
MIN
MAX
2.000
2.300
0.025
0.100
1.950
2.100
6.950
7.100
4.372
5.180
8.850
9.150
6.950
7.100
4.372
5.180
0.466
0.720
0.250 BSC
0.300
0.432
0.300
0.375
0.180
0.279
0.180
0.230
0.800 BSC
−−−
0.600
0_
7_
0.200
0.200
0.100
DETAIL Y
CASE 978 - 03
ISSUE C
PFP - 16
MHVIC2115NR2
RF Device Data
Freescale Semiconductor
11
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and electrical characteristics of their non-RoHS-compliant and/or non-Pb- free
counterparts. For further information, see http://www.freescale.com or contact your
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© Freescale Semiconductor, Inc. 2006. All rights reserved.
RoHS- compliant and/or Pb - free versions of Freescale products have the functionality and electrical
characteristics of their non - RoHS- compliant and/or non - Pb- free counterparts. For further
information, see http://www.freescale.com or contact your Freescale sales representative.
For information on Freescale’s Environmental Products program, go to http://www.freescale.com/epp.
MHVIC2115NR2
Document Number: MHVIC2115NR2
Rev. 5, 5/2006
12
RF Device Data
Freescale Semiconductor