E8400B 100-500MHz Dual Channel, Digitally Programmed Pin Electronics Solution TEST AND MEASUREMENT PRODUCTS Description PRELIMINARY Features • • • • • • • • • • • • The E8400B has a Driver and Window Comparator receiver for each channel with performance settings to save power or maximize bandwidth. Also present is a PMU per channel that also doubles as a resistive load function to the DUT. Each PMU has a 16-bit ADC for analog parametric measurement. All level’s DACs for the Driver, Receiver and PMU are on-chip and are programmed via a high speed serial bus. Each of the level’s DACs have offset and gain registers for on-chip calibrations. The Driver circuit is capable of forcing two levels to the DUT (DVH and DVL) as well as a third voltage for a termination level (DVT) to terminate high-speed DUT signals to the Comparator receivers into a high quality 50Ω load. The Driver can also be configured to a high impedance (HiZ) state for an open termination of DUT signals. Waveform clamps are also available to clip the input signals from a DUT when not using the Driver as a termination. The clamps prevent reflections from returning to the DUT transmission line which can create timing errors and false triggering. Two Fully Integrated Pin Channels including: - 16-bit DACs for each level - Tri-level Driver - Window Receiver - Parametric Measurement Unit - Thevinen Load - Waveform Clamps - 16-bit ADC for PMU measurements Driver, Comparator and PMU maximum 8V span over -2 to +7V range Configurable Output Protection 4 PMU current ranges; 24mA, 2.4mA, 240μA, 24μA On-Chip ADC for each PMU 50MHz Serial Bus Programming - SPI™/QSPI™/ MICROWIRE™ - Daisy-chainable Power Dissipation ~0.8W/Channel (quiescent, low performance, I/O Mode) ~0.9W/Channel (quiescent, high performance, I/O Mode) Pin and Software Compatible with E8410, E8405, E8415 Digitally Programmable Performance/Power Differential Drive and Receive Functionality Optimal Small Swing Performance Small 11mm x 11mm Package Functional Block Diagram All of the on-chip DAC levels and configuration registers for each channel may be programmed via SET commands. This PinCast method of programming allows all channels in a system to be programmed concurrently with a simple set command whereby any pin channel that had been assigned to that set will respond. SERIAL IO C O N T R O L CLH VFRC IFRC CLL PMU PMU IVMON0 TESTH PMUF TESTL PMUS DVH The two driver circuits may be placed into a differential drive mode. This reduces driver-to-driver skews to levels difficult to achieve by external deskewing. The two window comparators may also be placed into a differential receive mode. These features enable higher quality testing of differential signals to/from the DUT. DVT DEN DHI VCH DVL VCL CVA QA A QB B CH 0 DUTIO[0] CVB CVB B QA A CVA VCH Logic Testers Mixed-Signal Test Equipment Memory Testers Flash Memory Testers ASIC Verifiers DVL VCL DHI DEN A/D IVMON_HI IVMON0 IVMON1 IVMON_LO SPI and QSPI and trademarks of Motorola, Inc. MICROWIRE is a trademark of National Semiconductor Corp. Revision 5, October 30, 2007 CH 1 DUTIO[1] Applications • • • • • QB A/D DVH TESTH IFRC VFRC GND_SNS DVT TESTL PMUS PMU PMU IVMON1 PMUF CLL CLH www.semtech.com