STMICROELECTRONICS BUL1203EFP

BUL1203EFP
®
HIGH VOLTAGE FAST-SWITCHING
NPN POWER TRANSISTOR
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HIGH VOLTAGE CAPABILITY
LOW SPREAD OF DYNAMIC PARAMETERS
MINIMUM LOT-TO-LOT SPREAD FOR
RELIABLE OPERATION
VERY HIGH SWITCHING SPEED
FULLY INSULATED PACKAGE (U.L.
COMPLIANT) FOR EASY MOUNTING
APPLICATIONS
ELECTRONIC BALLASTS FOR
FLUORESCENT LIGHTING (277 V HALF
BRIDGE AND 120 V PUSH-PULL
TOPOLOGIES)
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DESCRIPTION
The BUL1203EFP is a new device manufactured
using Diffused Collector technology to enhance
switching speeds and tight h FE range while
maintaining a wide RBSOA.
Thanks to his structure it has an intrinsic
ruggedness which enables the transistor to
withstand a high collector current level during
Breakdown condition, without using the transil
protection usually necessary in typical converters
for lamp ballast.
1
2
TO-220FP
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol
V CBO
V CES
V CEO
V EBO
IC
I CM
IB
I BM
P tot
V isol
T stg
Tj
Parameter
Collector-BaseVoltage (I E = 0)
Collector-Emitter Voltage (V BE = 0)
Collector-Emitter Voltage (I B = 0)
Emitter-Base Voltage (I C = 0)
Collector Current
Collector Peak Current (t p < 5 ms)
Base Current
Base Peak Current (t p < 5 ms)
Total Dissipation at T c = 25 o C
Insulation Withstand Voltage (RMS) from All
Three Leads to Exernal Heatsink
Storage Temperature
Max. Operating Junction Temperature
November 2003
Value
1200
1200
550
9
5
8
2
4
36
1500
-65 to 150
150
Unit
V
V
V
V
A
A
A
A
W
V
o
o
C
C
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BUL1203EFP
THERMAL DATA
R thj-case
R thj-amb
Thermal Resistance Junction-case
Thermal Resistance Junction-ambient
Max
Max
o
3.47
62.5
o
C/W
C/W
ELECTRICAL CHARACTERISTICS (Tcase = 25 oC unless otherwise specified)
Symbol
Max.
Unit
I CES
Collector Cut-off
Current (V BE = 0)
Parameter
V CE = 1200 V
100
µA
I CEO
Collector Cut-off
Current (I B = 0)
V CE = 550 V
100
µA
V CEO(sus) ∗ Collector-Emitter
Sustaining Voltage
(I B = 0)
Test Conditions
I C = 100 mA
L = 25 mH
Min.
Typ.
550
V
9
V
Emitter-Base Voltage
(I C = 0)
I E = 10 mA
V CE(sat) ∗
Collector-Emitter
Saturation Voltage
IC = 1 A
IC = 2 A
IC = 3 A
I B = 0.2 A
I B = 0.4 A
IB = 1 A
0.5
0.7
1.5
V
V
V
V BE(sat) ∗
Base-Emitter
Saturation Voltage
IC = 2 A
IC = 3 A
I B = 0.4 A
IB = 1 A
1.5
1.5
V
V
DC Current Gain
IC
IC
IC
IC
V CE = 5 V
V CE = 5 V
V CE = 3 V
V CE = 5 V
V EBO
h FE ∗
t on
ts
tf
E ar
=
=
=
=
1 mA
10 mA
0.8 A
2A
RESISTIVE LOAD
Turn-on Time
Storage Time
Fall Time
IC = 2 A
I B2 = -0.8 A
V CC = 150 V
I B1 = 0.4 A
tp = 30 µs
(see figure 2)
Repetitive Avalanche
Energy
L = 2 mH
V CC = 50 V
(see figure 3)
C = 1.8 nF
V BE = -5 V
∗ Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
Safe Operating Area
2/7
Derating Curve
10
10
14
9
32
28
2.5
0.2
6
0.5
3.0
0.3
µs
µs
µs
mJ
BUL1203EFP
DC Current Gain
DC Current Gain
Collector-Emitter Saturation Voltage
Base-Emitter Saturation Voltage
Inductive Load Storage Time
Inductive Load Fall Time
3/7
BUL1203EFP
Reverse Biased Safe Operating Area
Figure 1: Inductive Load Switching Test Circuit
Figure 2: Resistive Load Switching Test Circuit
4/7
BUL1203EFP
Figure 3: Energy Rating Test Circuit
5/7
BUL1203EFP
TO-220FP MECHANICAL DATA
mm
DIM.
MIN.
A
4.4
inch
TYP.
MAX.
MIN.
TYP.
MAX.
4.6
0.173
0.181
B
2.5
2.7
0.098
0.106
D
2.5
2.75
0.098
0.108
E
0.45
0.7
0.017
0.027
F
0.75
1
0.030
0.039
F1
1.15
1.7
0.045
0.067
F2
1.15
1.7
0.045
0.067
G
4.95
5.2
0.195
0.204
G1
2.4
2.7
0.094
0.106
H
10
10.4
0.393
0.409
L2
16
0.630
28.6
30.6
1.126
1.204
L4
9.8
10.6
0.385
0.417
L6
15.9
16.4
0.626
0.645
L7
9
9.3
0.354
0.366
Ø
3
3.2
0.118
0.126
B
D
A
E
L3
L3
L6
F2
H
G
G1
¯
F
F1
L7
1 2 3
L2
6/7
L4
BUL1203EFP
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of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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