MURATA GCJ55

Medium Voltage for Automotive Soft Termination Type GCJ Series Specifications and Test Methods
No.
AEC-Q200
Test Item
1
Pre- and Post-Stress
Electrical Test
Specifications
AEC-Q200 Test Method
–
High Temperature The measured and observed characteristics should satisfy the
Exposure (Storage) specifications in the following table.
Appearance No marking defects
2
Capacitance
Within ±10%
Change
D.F.
0.05 max.
I.R.
More than 10,000MΩ or 100MΩ · µF
(Whichever is smaller)
Temperature
Cycle
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance No marking defects
3
4
Capacitance
Within ±10%
Change
Set the capacitor for 1000±12 hours at 150±3°C. Let sit for
24±2 hours at room temperature, then measure.
Fix the capacitor to the supporting jig in the same manner and
under the same conditions as (19). Perform the 1000 cycles
according to the 4 heat treatments listed in the following table.
Let sit for 24±2 hours at room temperature, then measure.
Step
1
2
3
4
Temp. (°C) -55+0/-3 Room Temp. 125+3/-0 Room Temp.
Time (min.) 15±3
1
1
15±3
D.F.
0.025 max.
I.R.
More than 10,000MΩ or 100MΩ · µF
(Whichever is smaller)
•Pretreatment
Perform the heat treatment at 150+0/-10°C for 60±5 minutes
and then let sit for 24±2 hours at room temperature.
Destructive
Physical Analysis
No defects or abnormalities
Per EIA-469
Moisture
Resistance
The measured and observed characteristics should satisfy the
specifications in the following table.
Apply the 24-hour heat (25 to 65°C) and humidity (80 to 98%)
treatment shown below, 10 consecutive times.
Let sit for 24±2 hours at room temperature, then measure.
Appearance No marking defects
Capacitance
Within ±12.5%
Change
0.05 max.
Humidity
90-98%
Temperature
D.F.
°C
70
65
60
55
50
45
40
35
30
25
20
15
10
5
0
-5
-10
5
I.R.
More than 10,000MΩ or 100MΩ · µF
(Whichever is smaller)
Humidity Humidity Humidity
80-98% 90-98% 80-98%
Humidity
90-98%
+10
-2 °C
Initial measurement
One cycle = 24 hours
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
Hours
Biased Humidity
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance No marking defects
6
Capacitance
Within ±12.5%
Change
D.F.
0.05 max.
I.R.
More than 1,000MΩ or 10MΩ · µF
(Whichever is smaller)
Operational Life
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance No marking defects
7
Capacitance
Within ±12.5%
Change
Apply the rated voltage and DC1.3+0.2/-0V (add 6.8kΩ
resistor) at 85±3°C and 80 to 85% humidity for 1000±12 hours.
Remove and let sit for 24±2 hours at room temperature, then
measure.
The charge/discharge current is less than 50mA.
•Pretreatment
Perform the heat treatment at 150+0/-10°C for 60±5 minutes
and then let sit for 24±2 hours at room temperature.
Apply voltage as in the Table for 1000±12 hours at 125±3°C.
Let sit for 24±2 hours at room temperature, then measure.
The charge/discharge current is less than 50mA.
Rated Voltage
DC250V
DC630V
Applied Voltage
150% of the rated voltage
120% of the rated voltage
D.F.
0.05 max.
I.R.
More than 1,000MΩ or 10MΩ · µF
(Whichever is smaller)
•Pretreatment
Apply test voltage for 60±5 minutes at test temperature.
Remove and let sit for 24±2 hours at room temperature.
8
External Visual
No defects or abnormalities
Visual inspection
9
Physical Dimension
Within the specified dimensions
Using calipers and micrometers
Continued on the following page.
Medium Voltage for Automotive Soft Termination Type GCJ Series Specifications and Test Methods
Continued from the preceding page.
No.
AEC-Q200
Test Item
Specifications
Appearance No marking defects
10
Resistance
to Solvents
Capacitance
Within the specified tolerance
Change
D.F.
0.025 max.
I.R.
More than 10,000MΩ or 100MΩ · µF
(Whichever is smaller)
Appearance No marking defects
Mechanical
11
Shock
Capacitance
Within the specified tolerance
Change
D.F.
0.025 max.
Appearance No defects or abnormalities
Capacitance
Within the specified tolerance
Change
12 Vibration
D.F.
Resistance to
Soldering Heat
0.025 max.
Capacitance
Within ±10%
Change
D.F.
0.025 max.
I.R.
More than 10,000MΩ or 100MΩ · µF
(Whichever is smaller)
Thermal Shock
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance No marking defects
14
Per MIL-STD-202 Method 215
Solvent 1: 1 part (by volume) of isopropyl alcohol
3 parts (by volume) of mineral spirits
Solvent 2: Terpene defluxer
Solvent 3: 42 parts (by volume) of water
1 part (by volume) of propylene glycol
monomethyl ether
1 part (by volume) of monoethanolamine
Three shocks in each direction should be applied along 3
mutually perpendicular axes of the test specimen (18 shocks).
The specified test pulse should be Half-sine and should have a
duration: 0.5ms, peak value: 1500g and velocity change: 4.7m/s.
Solder the capacitor to the test jig (glass epoxy board) in the
same manner and under the same conditions as (19). The
capacitor should be subjected to a simple harmonic motion
having a total amplitude of 1.5mm, the frequency being varied
uniformly between the approximate limits of 10 and 2000Hz. The
frequency range, from 10 to 2000Hz and return to 10Hz, should
be traversed in approximately 20 minutes. This motion should be
applied for 12 items in each 3 mutually perpendicular directions
(total of 36 times).
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance No marking defects
13
AEC-Q200 Test Method
Capacitance
Within ±10%
Change
D.F.
0.025 max.
I.R.
More than 10,000MΩ or 100MΩ · µF
(Whichever is smaller)
Immerse the capacitor in a eutectic solder solution at 260±5°C for
10±1 seconds. Let sit at room temperature for 24±2 hours, then
measure.
•Pretreatment
Perform the heat treatment at 150+0/-10°C for 60±5 minutes
and then let sit for 24±2 hours at room temperature.
Fix the capacitor to the supporting jig in the same manner and
under the same conditions as (19). Perform the 300 cycles
according to the two heat treatments listed in the following table
(maximum transfer time is 20 seconds). Let sit for 24±2 hours at
room temperature, then measure.
Step
Temp. (°C)
Time (min.)
1
-55+0/-3
15±3
2
125+3/-0
15±3
•Pretreatment
Perform the heat treatment at 150+0/-10°C for 60±5 minutes
and then let sit for 24±2 hours at room temperature.
Appearance No marking defects
Capacitance
Within the specified tolerance
Change
Per AEC-Q200-002
15 ESD
D.F.
0.025 max.
I.R.
More than 10,000MΩ or 100MΩ · µF
(Whichever is smaller)
(a) Preheat at 155°C for 4 hours. After preheating, immerse the
capacitor in a solution of ethanol (JIS-K-8101) and rosin (JISK-5902) (25% rosin in weight proportion). Immerse in eutectic
solder solution for 5+0/-0.5 seconds at 235±5°C.
16 Solderability
95% of the terminations are to be soldered evenly and
continuously.
(b) Should be placed into steam aging for 8 hours±15 minutes.
After preheating, immerse the capacitor in a solution of
ethanol (JIS-K-8101) and rosin (JIS-K-5902) (25% rosin in
weight proportion). Immerse in eutectic solder solution for
5+0/-0.5 seconds at 235±5°C.
(c) Should be placed into steam aging for 8 hours±15 minutes.
After preheating, immerse the capacitor in a solution of
ethanol (JIS-K-8101) and rosin (JIS-K-5902) (25% rosin in
weight proportion). Immerse in eutectic solder solution for 120
±5 seconds at 260±5°C.
Continued on the following page.
Medium Voltage for Automotive Soft Termination Type GCJ Series Specifications and Test Methods
Continued from the preceding page.
No.
AEC-Q200
Test Item
AEC-Q200 Test Method
Appearance No defects or abnormalities
Visual inspection.
Capacitance
Within the specified tolerance
Change
The capacitance/Q should be measured at 25°C at the frequency
and voltage shown in the table.
D.F.
Electrical
17 Characterization
Specifications
Capacitance
CF1000pF
CU1000pF
0.025 max.
25°C
More than 10,000MΩ or 100MΩ · µF
(Whichever is smaller)
Max. Operating Temperature···125°C
More than 1,000MΩ or 10MΩ · µF
(Whichever is smaller)
No failure should be observed when voltage as in the Table is
applied between the terminations for 1 to 5 seconds, provided
the charge/discharge current is less than 50mA.
No failure
Rated Voltage
DC250V
DC630V
Appearance No marking defects
Board
Flex
Test Voltage
200% of the rated voltage
150% of the rated voltage
Solder the capacitor on the test jig (glass epoxy board) as
shown in Fig. 1 using a eutectic solder. Then apply a force in the
direction shown in Fig. 2 for 5±1 seconds. The soldering should
be done by the reflow method and should be conducted with
care so that the soldering is uniform and free of defects such as
heat shock.
Capacitance
Within ±12.5%
Change
18
Voltage
AC0.5 to 5V(r.m.s.)
AC1±0.2V(r.m.s.)
The insulation resistance should be measured with DC500±50V
(DC250±25V in case of rated voltage: DC250V) at 25°C and
125°C and within 2 minutes of charging.
I.R.
Dielectric
Strength
Frequency
1±0.2MHz
1±0.2kHz
Type
GCJ21
GCJ31
GCJ32
GCJ43
GCJ55
b
a
0.8
2.0
2.0
3.0
4.2
b
3.0
4.4
4.4
6.0
7.2
c
1.3
1.7
2.6
3.3
5.1
40
C
20
(in mm)
50
Pressurizing
speed: 1.0mm/s
Pressurize
a
100
R4
t: 1.6mm
Fig. 1
Capacitance meter
45
45
Flexure: V3 (V2: GCJ21)
Fig. 2
Appearance No marking defects
Capacitance
Within the specified tolerance
Change
D.F.
Type
GCJ21
GCJ31
GCJ32
GCJ43
GCJ55
Terminal
Strength
a
1.2
2.2
2.2
3.5
4.5
b
4.0
5.0
5.0
7.0
8.0
c
1.65
2.0
2.9
3.7
5.6
(in mm)
c
a
I.R.
More than 10,000MΩ or 100MΩ · µF
(Whichever is smaller)
b
19
0.025 max.
Solder the capacitor to the test jig (glass epoxy board) as
shown in Fig. 3 using a eutectic solder. Then apply 18N force in
parallel with the test jig for 60 seconds.
The soldering should be done by the reflow method and should
be conducted with care so that the soldering is uniform and free
of defects such as heat shock.
t: 1.6mm
Solder resist
Baked electrode or
copper foil
Fig. 3
Continued on the following page.
Medium Voltage for Automotive Soft Termination Type GCJ Series Specifications and Test Methods
Continued from the preceding page.
No.
AEC-Q200
Test Item
Specifications
AEC-Q200 Test Method
Place the capacitor in the beam load fixture as in Fig. 4.
Apply force.
20 Beam Load Test
L
The chip should endure the following force.
Chip thickness F 1.25mm rank: 15N
Chip thickness U 1.25mm rank: 54.5N
0.6 L
Fig. 4
Speed at which to supply the Stress Load: 2.5mm / s
The capacitance change should be measured after 5 minutes
at each specified temperature stage.
21
Capacitance
Temperature
Characteristics
Capacitance
Within ±15%
Change
Step
1
2
3
4
5
Temperature (°C)
25±2
-55±3
25±2
125±3
25±2
The ranges of capacitance change compared with the above
25°C value over the temperature ranges shown in the table
should be within the specified ranges.
•Pretreatment
Perform the heat treatment at 150+0/-10°C for 60±5 minutes
and then let sit for 24±2 hours at room temperature.
Perform the initial measurement.