NTLUD3A50PZ Power MOSFET −20 V, −5.6 A, mCoolt Dual P−Channel, 2.0x2.0x0.55 mm UDFN Package Features • UDFN Package with Exposed Drain Pads for Excellent Thermal • • • Conduction Low RDS(on) Low Profile UDFN 2.0x2.0x0.55 mm for Board Space Saving These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS Compliant http://onsemi.com MOSFET RDS(on) MAX V(BR)DSS 50 mW @ −4.5 V 70 mW @ −2.5 V −20 V 175 mW @ −1.5 V High Side Load Switch Reverse Current Protection Battery Switch Optimized for Power Management Applications for Portable Products, such as Cell Phones, PMP, DSC, GPS, and others D1 G1 MAXIMUM RATINGS (TJ = 25°C unless otherwise stated) Parameter Drain-to-Source Voltage Gate-to-Source Voltage Continuous Drain Current (Note 1) Power Dissipation (Note 1) Continuous Drain Current (Note 2) Symbol Value Units VDSS −20 V VGS ±8.0 V ID −4.4 A Steady State TA = 25°C TA = 85°C −3.2 t≤5s TA = 25°C −5.6 Steady State TA = 25°C t≤5s TA = 25°C Steady State TA = 25°C PD ID TA = 85°C A −2.8 −2.0 S2 MARKING DIAGRAM 1 UDFN6 CASE 517BF mCOOLt 1 AA MG G AA = Specific Device Code M = Date Code G = Pb−Free Package (Note: Microdot may be in either location) Power Dissipation (Note 2) TA = 25°C PD Pulsed Drain Current tp = 10 ms IDM −13 A TJ, TSTG -55 to 150 °C Source Current (Body Diode) (Note 2) IS −1.0 A Lead Temperature for Soldering Purposes (1/8″ from case for 10 s) TL 260 °C Operating Junction and Storage Temperature S1 P−Channel MOSFET W 2.2 D2 G2 6 1.4 −5.6 A 115 mW @ −1.8 V Applications • • • • ID MAX 0.5 W Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. Surface Mounted on FR4 Board using 1 in sq pad size (Cu area = 1.127 in sq [1 oz] including traces) based on both FETs on. 2. Surface-mounted on FR4 board using the minimum recommended pad size of 30 mm2, 1 oz. Cu based on both FETs on. (Top View) ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 5 of this data sheet. © Semiconductor Components Industries, LLC, 2012 August, 2012 − Rev. 1 1 Publication Order Number: NTLUD3A50PZ/D NTLUD3A50PZ THERMAL RESISTANCE RATINGS Symbol Max Units Junction-to-Ambient – Steady State (Note 3) RθJA 91 °C/W Junction-to-Ambient – t ≤ 5 s (Note 3) RθJA 57 Junction-to-Ambient – Steady State min Pad (Note 4) RθJA 228 Parameter ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified) Parameter Symbol Test Condition Min −20 Typ Max Units OFF CHARACTERISTICS Drain-to-Source Breakdown Voltage V(BR)DSS VGS = 0 V, ID = −250 mA Drain-to-Source Breakdown Voltage Temperature Coefficient V(BR)DSS/TJ ID = −250 mA, ref to 25°C Zero Gate Voltage Drain Current IDSS VGS = 0 V, VDS = −20 V Gate-to-Source Leakage Current IGSS VDS = 0 V, VGS = ±5.0 V VGS(TH) VGS = VDS, ID = −250 mA V −13 TJ = 25°C mV/°C −1.0 mA ±5.0 mA ON CHARACTERISTICS (Note 5) Gate Threshold Voltage Negative Threshold Temp. Coefficient Drain-to-Source On Resistance Forward Transconductance VGS(TH)/TJ −0.4 −1.0 3.0 RDS(on) gFS V mV/°C mW VGS = −4.5 V, ID = −4.0 A 37 50 VGS = −2.5 V, ID = −3.0 A 46 70 VGS = −1.8 V, ID = −2.0 A 63 115 VGS = −1.5 V, ID = −1.0 A 86 175 VDS = −5.0 V, ID = −3.0 A 16 S 920 pF CHARGES AND CAPACITANCES Input Capacitance Output Capacitance Reverse Transfer Capacitance CISS VGS = 0 V, f = 1 MHz, VDS = −15 V COSS CRSS Total Gate Charge QG(TOT) Threshold Gate Charge QG(TH) Gate-to-Source Charge QGS Gate-to-Drain Charge QGD 85 80 nC 10.4 VGS = −4.5 V, VDS = −15 V; ID = −3.0 A 0.5 1.2 3.0 SWITCHING CHARACTERISTICS, VGS = 4.5 V (Note 6) Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time td(ON) tr td(OFF) ns 7.0 VGS = −4.5 V, VDD = −15 V, ID = −3.0 A, RG = 1 W tf 12 39 30 DRAIN-SOURCE DIODE CHARACTERISTICS Forward Diode Voltage Reverse Recovery Time VSD ta Discharge Time tb 3. 4. 5. 6. TJ = 25°C −0.67 TJ = 125°C −0.56 tRR Charge Time Reverse Recovery Charge VGS = 0 V, IS = −1.0 A −1.0 12.1 VGS = 0 V, dis/dt = 100 A/ms, IS = −1.0 A QRR 5.7 Surface-mounted on FR4 board using 1 in sq pad size (Cu area = 1.127 in sq [1 oz] including traces) based on both FETs on. Surface-mounted on FR4 board using the minimum recommended pad size of 30 mm2, 1 oz. Cu based on both FETs on. Pulse Test: pulse width ≤ 300 ms, duty cycle ≤ 2%. Switching characteristics are independent of operating junction temperatures. 2 ns 6.4 4.0 http://onsemi.com V nC NTLUD3A50PZ TYPICAL CHARACTERISTICS 20 −ID, DRAIN CURRENT (A) VGS = −2.5 V 14 −2 V 12 −1.8 V 10 8 6 −1.5 V 4 2 1.0 1.5 2.0 2.5 3.0 3.5 4.0 14 12 10 TJ = 25°C 8 6 TJ = 125°C 4 0 4.5 TJ = −55°C 1 1.5 2 2.5 −VGS, GATE−TO−SOURCE VOLTAGE (V) Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics TJ = 25°C 0.18 ID = −4.0 A 0.16 0.14 0.12 0.10 0.08 0.06 0.04 0.02 1.0 0.5 −VDS, DRAIN−TO−SOURCE VOLTAGE (V) RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) 0.5 0.20 1.5 2.0 2.5 3.0 3.5 4.0 4.5 0.20 −1.5 V 0.18 TJ = 25°C 0.16 0.14 −1.8 V 0.12 0.10 0.08 −2.5 V 0.06 0.04 0.02 VGS = −4.5 V 0 2 4 6 8 10 12 14 16 18 20 −VGS, GATE VOLTAGE (V) −ID, DRAIN CURRENT (A) Figure 3. On−Resistance vs. Gate−to−Source Voltage Figure 4. On−Resistance vs. Drain Current and Gate Voltage 1.5 RDS(on), NORMALIZED DRAIN−TO− SOURCE RESISTANCE (W) 16 2 0 0.0 1.4 VDS = −5 V 18 −3.0 V 16 −ID, DRAIN CURRENT (A) 20 −4.5 to −3.5 V 18 100000 VGS = −4.5 V ID = −4.0 A −IDSS, LEAKAGE (nA) 1.3 1.2 1.1 1.0 0.9 TJ = 125°C 10000 TJ = 85°C 1000 0.8 0.7 −50 −25 0 25 50 75 100 125 150 100 2 4 6 8 10 12 14 16 18 TJ, JUNCTION TEMPERATURE (°C) −VDS, DRAIN−TO−SOURCE VOLTAGE (V) Figure 5. On−Resistance Variation with Temperature Figure 6. Drain−to−Source Leakage Current vs. Voltage http://onsemi.com 3 20 NTLUD3A50PZ VGS = 0 V TJ = 25°C f = 1 MHz C, CAPACITANCE (pF) 1600 1400 1200 Ciss 1000 800 600 400 Coss 200 0 Crss 0 2 4 6 8 10 12 14 16 18 20 5 15 4 VDS 9 2 QGD QGS 0 VDS = −15 V ID = −3.0 A TJ = 25°C 0 2 8 10 0 12 Figure 8. Gate−to−Source and Drain−to−Source Voltage vs. Total Charge −IS, SOURCE CURRENT (A) t, TIME (ns) 6 QG, TOTAL GATE CHARGE (nC) td(off) 100 tf tr td(on) 10 1 10 TJ = 125°C 1.0 TJ = 25°C 0.1 0.3 100 TJ = −55°C 0.4 0.5 0.6 0.7 0.8 0.9 1.0 RG, GATE RESISTANCE (W) −VSD, SOURCE−TO−DRAIN VOLTAGE (V) Figure 9. Resistive Switching Time Variation vs. Gate Resistance Figure 10. Diode Forward Voltage vs. Current 1.1 100 0.85 ID = −250 mA −ID, DRAIN CURRENT (A) 0.75 0.65 −VGS(th) (V) 4 3 10.0 VGS = −4.5 V VDD = −15 V ID = −3.0 A 0.55 0.45 0.35 0.25 0.15 50 6 1 Figure 7. Capacitance Variation 1.0 12 VGS 3 −VDS, DRAIN−TO−SOURCE VOLTAGE (V) 1000 18 QT −VDS, DRAIN−TO−SOURCE VOLTAGE (V) 1800 −VGS, GATE−TO−SOURCE VOLTAGE (V) TYPICAL CHARACTERISTICS 25 0 25 50 75 100 125 10 1 0.1 0.01 0.1 150 100 ms 1 ms 10 ms 0 ≤ VGS ≤ −8 V Single Pulse TC = 25°C dc RDS(on) Limit Thermal Limit Package Limit 1 10 TJ, JUNCTION TEMPERATURE (°C) −VDS, DRAIN−TO−SOURCE VOLTAGE (V) Figure 11. Threshold Voltage Figure 12. Maximum Rated Forward Biased Safe Operating Area http://onsemi.com 4 100 NTLUD3A50PZ R(t), EFFECTIVE TRANSIENT THERMAL RESPONSE (°C/W) TYPICAL CHARACTERISTICS 100 90 RqJA = 91°C/W Steady State 80 70 60 50 Duty Cycle = 0.5 40 30 20 10 0.2 0.05 0.02 0.01 0.1 0 1E−06 Single Pulse 1E−05 1E−04 1E−03 1E−02 1E−01 t, TIME (s) 1E+00 1E+01 1E+02 1E+03 Figure 13. FET Thermal Response DEVICE ORDERING INFORMATION Package Shipping† NTLUD3A50PZTAG UDFN6 (Pb−Free) 3000 / Tape & Reel NTLUD3A50PZTBG UDFN6 (Pb−Free) 3000 / Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. http://onsemi.com 5 NTLUD3A50PZ PACKAGE DIMENSIONS UDFN6 2x2, 0.65P CASE 517BF ISSUE B D ÍÍÍ ÍÍÍ ÍÍÍ PIN ONE REFERENCE 0.10 C 0.10 C ÉÉÉ ÇÇ ÉÉÉ ÇÇÇ ÇÇ ÉÉ A B EXPOSED Cu PLATING L TOP VIEW A A3 0.08 C L DETAIL A OPTIONAL CONSTRUCTIONS A1 C SIDE VIEW 0.10 C A SEATING PLANE MILLIMETERS MIN MAX 0.45 0.55 0.00 0.05 0.13 REF 0.25 0.35 2.00 BSC 0.57 0.77 2.00 BSC 0.90 1.10 0.65 BSC 0.15 BSC 0.25 REF 0.20 0.30 --0.10 RECOMMENDED MOUNTING FOOTPRINT B 1.74 D2 F D2 1 DIM A A1 A3 b D D2 E E2 e F K L L1 L1 0.10 C DETAIL A DETAIL B OPTIONAL CONSTRUCTIONS E DETAIL B NOTE 4 NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETERS. 3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS MEASURED BETWEEN 0.15 AND 0.30 mm FROM THE TERMINAL TIP. 4. COPLANARITY APPLIES TO THE EXPOSED PAD AS WELL AS THE TERMINALS. MOLD CMPD 2X 0.77 3 1.10 6X 0.47 L E2 6 K 4 6X 0.10 C A BOTTOM VIEW PACKAGE OUTLINE b 0.10 C A e 2.30 B 0.05 C 1 B 6X 0.35 NOTE 3 0.65 PITCH DIMENSIONS: MILLIMETERS mCool is a trademark of Semiconductor Components Industries, LLC (SCILLC). ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of SCILLC’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. SCILLC reserves the right to make changes without further notice to any products herein. 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