HITACHI 2SK2828

2SK2828
Silicon N Channel MOS FET
High Speed Power Switching
ADE-208-514 C (Z)
4th. Edition
Feb 1999
Features
•
•
•
•
•
•
Low on-resistance
High speed switching
Low drive current
No secondary breakdown
Suitable for switching regulator and DC–DC converter
Avalanche ratings
Outline
TO–3P
D
2
1
G
1
3
S
2
3
1. Gate
2. Drain
(Flange)
3. Source
2SK2828
Absolute Maximum Ratings (Ta = 25°C)
Item
Symbol
Ratings
Unit
Drain to source voltage
VDSS
700
V
Gate to source voltage
VGSS
±30
V
Drain current
ID
12
A
48
A
12
A
Drain peak current
I D(pulse)*
Body-drain diode reverse drain current
I DR
2
1
Channel dissipation
Pch*
175
W
Channel temperature
Tch
150
°C
Storage temperature
Tstg
–55 to +150
°C
Note:
2
1. PW ≤ 10µs, duty cycle ≤ 1 %
2. Value at Tc = 25°C
2SK2828
Electrical Characteristics (Ta = 25°C)
Item
Min
Typ
Max
Unit
Test Conditions
Drain to source breakdown voltage V(BR)DSS
700
—
—
V
I D = 10mA, VGS = 0
Gate to source breakdown voltage V(BR)GSS
±30
—
—
V
I G = ±100µA, VDS = 0
Gate to source leak current
I GSS
—
—
±10
µA
VGS = ±25V, VDS = 0
Zero gate voltege drain current
I DSS
—
—
100
µA
VDS = 560 V, VGS = 0
Gate to source cutoff voltage
VGS(off)
2.0
—
3.0
V
I D = 1mA, VDS = 10V*3
Static drain to source on state
resistance
RDS(on)
—
0.9
1.2
Ω
I D = 6A, VGS = 10V*3
Forward transfer admittance
|yfs|
5.5
9.0
—
S
I D = 6A, VDS = 10V*3
Input capacitance
Ciss
—
1850
—
pF
VDS = 10V
Output capacitance
Coss
—
400
—
pF
VGS = 0
Reverse transfer capacitance
Crss
—
45
—
pF
f = 1MHz
Total gate charge
Qg
—
35
—
nc
VDD = 400V
Gate to source charge
Qgs
—
8
—
nc
VGS = 10V
Gate to drain charge
Qgd
—
10
—
nc
I D = 12A
Turn-on delay time
t d(on)
—
25
—
ns
I D = 6A, RL = 5Ω
Rise time
tr
—
65
—
ns
VGS = 10V
Turn-off delay time
t d(off)
—
140
—
ns
Fall time
tf
—
55
—
ns
Body–drain diode forward voltage
VDF
—
0.95
—
V
I F = 12A, VGS = 0
Body–drain diode reverse
recovery time
t rr
—
2.5
—
µs
I F = 12A, VGS = 0
diF/ dt =100A/µs
Note:
Symbol
3. Pulse test
3
2SK2828
Main Characteristics
Power vs. Temperature Derating
Maximum Safe Operation Area
200
100
Drain Current I D (A)
Channel Dissipation
Pch (W)
50
150
100
50
0
50
100
Case Temperature
150
20
1s
n(
Tc
0.5
Operation in
this area is
limited by R DS(on)
0.2
0.1
Ta = 25 °C
1
s
s(
era
µs
s
1m
0m
Op
2
Tc (°C)
ho
=2
t)
5°
C)
10 20
50 100 200
500 1000
Drain to Source Voltage V DS(V)
Typical Transfer Characteristics
20
V DS = 10 V
Pulse Test
5V
I D (A)
8V
6V
12
8
4.5 V
4
VGS = 4 V
Drain Current
I D (A)
Drain Current
=1
tio
Typical Output Characteristics
16
DC
5
5
20
10 V
0µ
PW
10
200
10
10
16
–25°C
12
25°C
Tc = 75°C
8
4
Pulse Test
0
4
10
20
30
Drain to Source Voltage V
40
DS(V)
50
0
2
4
6
Gate to Source Voltage V
8
(V)
GS
10
2SK2828
Drain to Source Saturation Voltage
V DS(on) (V)
20
Pulse Test
16
12
I D = 10 A
8
5A
4
Drain to Source On State Resistance
R DS(on) ( W)
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
Static Drain to Source on State Resistance
vs. Drain Current
5
Pulse Test
2
1
0.5
VGS = 10, 15V
0.2
0.1
0.05
12
4
8
Gate to Source Voltage
16
20
V GS (V)
Static Drain to Source on State Resistance
vs. Temperature
4.0
Pulse Test
3.2
2.4
I D = 10 A
1.6
V GS = 10 V
5A
0.8
0
–40
0
40
80
120
160
Case Temperature Tc (°C)
1
2
5
10 20
50
Drain Current I D (A)
100
Forward Transfer Admittance vs.
Drain Current
Forward Transfer Admittance |y fs | (S)
Static Drain to Source on State Resistance
R DS(on) ( W)
0
50
20
10
Tc = –25 °C
5
25 °C
2
1
0.5
0.2
75 °C
V DS = 10 V
Pulse Test
1
2
10
0.5
5
Drain Current I D (A)
20
5
2SK2828
Body–Drain Diode Reverse
Recovery Time
Typical Capacitance vs.
Drain to Source Voltage
Reverse Recovery Time trr (ns)
5
5000
Capacitance C (pF)
2
1
0.5
0.2
0.1
1000
500
100
20
5
0
400
200
0
VDS
12
8
V DD = 400 V
250 V
100 V
20
40
60
80
Gate Charge Qg (nc)
4
0
100
Switching Time t (ns)
V DD = 100 V
250 V
400 V
600
16
500
V GS (V)
ID = 12 A
10
20
30
40
50
Drain to Source Voltage V DS (V)
Gate to Source Voltage
V DS (V)
Drain to Source Voltage
20
VGS
Crss
10
Dynamic Input Characteristics
800
VGS = 0
f = 1 MHz
50
10 20 50
I DR (A)
1000
Coss
200
di / dt = 100 A / µs
V GS = 0, Ta = 25 °C
0.05
0.1 0.2 0.5 1 2
5
Reverse Drain Current
6
Ciss
2000
Switching Characteristics
t d(off)
200
100
tf
50
t d(on)
20
tr
10
5
0.1
V GS = 10 V, V DD = 30 V
PW = 5 µs, duty < 1 %
0.3
1
3
Drain Current
10
30
I D (A)
100
2SK2828
Reverse Drain Current vs.
Source to Drain Voltage
Reverse Drain Current I DR (A)
50
40
30
V GS = 0, –5 V
20
10
Pulse Test
0
0.4
0.8
1.2
1.6
Source to Drain Voltage
2.0
V SD (V)
Normalized Transient Thermal Impedance vs. Pulse Width
Normalized Transient Thermal Impedance
g s (t)
3
Tc = 25°C
1
D=1
0.5
0.3
0.1
0.03
0.01
10 µ
0.2
q ch – c(t) = g s (t) • q ch – c
q ch – c = 0.71 °C/W, Tc = 25 °C
0.1
0.05
PDM
0.02
1
lse
0.0 t pu
o
h
1s
100 µ
D=
PW
T
PW
T
1m
10 m
Pulse Width
100 m
1
10
PW (S)
7
2SK2828
Switching Time Test Circuit
Switching Time Waveform
Vout
Monitor
Vin Monitor
90%
D.U.T.
RL
Vin
Vin
10 V
50W
V DD
= 30 V
Vout
10%
10%
90%
td(on)
8
tr
10%
90%
td(off)
tf
2SK2828
Package Dimentions
Unit: mm
5.0 ± 0.3
5.0 max
0.3 typ
1.5 typ
20.1 max
2.0 typ
0.5 typ
16.0 max
14.9 ± 0.2
1.0 typ
f 3.2 ± 0.2
1.4 max
2.0 typ
1.0 ± 0.2
3.6 typ
5.45 ± 0.2
18.0 ± 0.5
1.6 typ
2.8 typ
0.6 ± 0.2
0.9 typ
1.0 typ
5.45 ± 0.2
Hitachi Code
EIAJ
JEDEC
TO–3P
SC–65
—
9
2SK2828
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright,
trademark, or other intellectual property rights for information contained in this document. Hitachi bears no
responsibility for problems that may arise with third party’s rights, including intellectual property rights, in
connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact
Hitachi’s sales office before using the product in an application that demands especially high quality and
reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury,
such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment
or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for
maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and
other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed
ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in
semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating
Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the
Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
Hitachi, Ltd.
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Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
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Copyright © Hitachi, Ltd., 1998. All rights reserved. Printed in Japan.
10