HITACHI 6AM14

6AM14
Silicon N-Channel/P-Channel Power MOS FET Array
Application
High speed power switching
Features
•
•
•
•
Low on-resistance
Low drive current
High speed switching
High density mounting
Outline
6AM14
Absolute Maximum Ratings (Ta = 25°C)
Ratings
Item
Symbol
Nch
Pch
Unit
Drain to source voltage
VDSS
60
–60
V
Gate to source voltage
VGSS
±20
±20
V
Drain current
ID
7
–7
A
Drain peak current
ID(pulse)*1
28
–28
A
Reverse drain current
IDR
7
–7
A
Channel dissipation
Pch*2
42
W
Channel dissipation
Pch*2
4.8
W
Channel temperature
Tch
150
°C
Storage temperature
Tstg
–55 to +150
°C
Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1%
2. Value at 6 Drive operation
2
6AM14
Electrical Characteristics N Channel (Ta = 25°C)
Item
Symbol
Drain to source breakdown
voltage
Min
Typ
Max
Unit
Test conditions
V(BR)DS 60
S
—
—
V
ID = 10 mA, VGS = 0
Gate to source breakdown
voltage
V(BR)GS ±20
S
—
—
V
IG = ±100 µA, VDS = 0
Gate to source leak current
IGSS
—
—
±10
µA
VGS = ±16 V, VDS = 0
Zero gate voltage drain current IDSS
—
—
250
µA
VDS = 50 V, VGS = 0
Gate to source cutoff voltage
VGS(off) 0.5
—
1.5
V
VDS = 10 V, ID = 1 mA
Static drain to source on state
resistance
RDS(on) —
0.14
0.2
Ω
ID = 4 A
VGS = 4 V*1
—
0.22
0.5
Ω
ID = 2 A
VGS = 2.5 V*1
Forward transfer admittance
|yfs|
4.0
6.5
—
S
ID = 4 A
VDS = 10 V*1
Input capacitance
Ciss
—
500
—
pF
VDS = 10 V
Output capacitance
Coss
—
240
—
pF
VGS = 0
Reverse transfer capacitance
Crss
—
30
—
pF
f = 1 MHz
Turn-on delay time
td(on)
—
15
—
ns
VGS = 10 V, ID = 4 A
Rise time
tr
—
90
—
ns
RL = 7.5 Ω
Turn-off delay time
td(off)
—
110
—
ns
Fall time
tf
—
250
—
ns
Body to drain diode forward
voltage
VDF
—
1.0
—
V
IF = 7 A, VGS = 0
Body to drain diode reverse
recovery time
trr
—
170
—
ns
IF = 7 A, VGS = 0
diF/dt = 50 A/µs
Note:
1. Pulse Test
3
6AM14
Electrical Characteristics P Channel (Ta = 25°C)
Item
Symbol
Drain to source breakdown
voltage
Min
Typ
Max
Unit
Test conditions
V(BR)DS –60
S
—
—
V
ID = –10 mA, VGS = 0
Gate to source breakdown
voltage
V(BR)GS ±20
S
—
—
V
IG = ±100 µA, VDS = 0
Gate to source leak current
IGSS
—
—
±10
µA
VGS = ±16 V, VDS = 0
Zero gate voltage drain current IDSS
—
—
–250
µA
VDS = –50 V, VGS = 0
Gate to source cutoff voltage
VGS(off) –0.5
—
–1.5
V
VDS = –10 V, ID = –1 mA
Static drain to source on state
resistance
RDS(on) —
0.12
0.16
Ω
ID = –4 A
VGS = –4 V*1
—
0.16
0.3
Ω
ID = –2 A
VGS = –2.5 V*1
Forward transfer admittance
|yfs|
5.0
8.0
—
S
ID = –4 A
VDS = –10 V*1
Input capacitance
Ciss
—
1450
—
pF
VDS = –10 V
Output capacitance
Coss
—
590
—
pF
VGS = 0
Reverse transfer capacitance
Crss
—
120
—
pF
f = 1 MHz
Turn-on delay time
td(on)
—
15
—
ns
VGS = –10 V, ID = –4 A
Rise time
tr
—
75
—
ns
RL = 7.5 Ω
Turn-off delay time
td(off)
—
240
—
ns
Fall time
tf
—
180
—
ns
Body to drain diode forward
voltage
VDF
—
–1.0
—
V
IF = –7 A, VGS = 0
Body to drain diode reverse
recovery time
trr
—
210
—
ns
IF = –7 A, VGS = 0
diF/dt = 50 A/µs
Note:
4
1. Pulse Test
6AM14
5
6AM14
6
6AM14
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part of this document without Hitachi’s permission.
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any other reasons during operation of the user’s unit according to this document.
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performance of Hitachi’s semiconductor products. Hitachi assumes no responsibility for any
intellectual property claims or other problems that may result from applications based on the
examples described herein.
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party or Hitachi, Ltd.
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APPLICATIONS without the written consent of the appropriate officer of Hitachi’s sales company.
Such use includes, but is not limited to, use in life support systems. Buyers of Hitachi’s products
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MEDICAL APPLICATIONS.
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