CSD16322Q5C www.ti.com SLPS241A – DECEMBER 2009 – REVISED JANUARY 2010 DualCool™ N-Channel NexFET™ Power MOSFETs Check for Samples: CSD16322Q5C FEATURES 1 • • • • • • • • 2 PRODUCT SUMMARY DualCool™ Package SON 5×6mm Optimized for Two Sided Cooling Optimized for 5V Gate Drive Ultralow Qg and Qgd Low Thermal Resistance Avalanche Rated Pb Free Terminal Plating RoHS Compliant and Halogen Free VDS Drain to Source Voltage 25 V Qg Gate Charge Total (4.5V) 6.8 nC Qgd Gate Charge Gate to Drain RDS(on) VGS(th) • Drain to Source On Resistance nC 5.4 mΩ VGS = 4.5V 4.6 mΩ VGS = 8V 3.9 mΩ Threshold Voltage 1.1 V spacer ORDERING INFORMATION APPLICATIONS • 1.3 VGS = 3V Point-of-Load Synchronous Buck in Networking, Telecom and Computing Systems Optimized for Synchronous or Control FET Applications Device Package Media CSD16322Q5C SON 5x6-mm Plastic Package 13-Inch Reel Qty Ship 2500 Tape and Reel spacer ABSOLUTE MAXIMUM RATINGS DESCRIPTION TA = 25°C unless otherwise stated VALUE UNIT The NexFET™ power MOSFET has been designed to minimize losses in power conversion applications and optimized for 5V gate drive applications. VDS Drain to Source Voltage 25 V VGS Gate to Source Voltage Drain Gate Source Top View D D D D D Bottom View D D D +10 / –8 V Continuous Drain Current, TC = 25°C 97 A Continuous Drain Current (1) 21 A IDM Pulsed Drain Current, TA = 25°C (2) 136 A PD Power Dissipation (1) 3.1 W TJ, TSTG Operating Junction and Storage Temperature Range –55 to 150 °C EAS Avalanche Energy, single pulse ID = 50A, L = 0.1mH, RG = 25Ω 125 mJ ID S (1) S S S G G S S (2) S RqJA = 39°C/W on 1-inch2 Cu, (2-oz.) on a 0.06" thick FR4 PCB. Pulse duration ≤300ms, duty cycle ≤2% RDS(on) vs VGS Gate Charge 10 11 ID = 20A VDS = 12.5V 9 ID = 20A 10 9 8 VG − Gate Voltage − V RDS(on) − On-State Resistance − mW 12 TC = 125°C 7 6 5 4 3 TC = 25°C 8 7 6 5 4 3 2 2 1 0 1 0 0 1 2 3 4 5 6 7 8 VGS − Gate to Source Voltage − V 9 10 G006 0 2 4 6 8 10 Qg − Gate Charge − nC 12 14 G003 1 2 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. DualCool, NexFET are trademarks of Texas Instruments. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2009–2010, Texas Instruments Incorporated CSD16322Q5C SLPS241A – DECEMBER 2009 – REVISED JANUARY 2010 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise stated) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Static Characteristics BVDSS Drain to Source Voltage VGS = 0V, IDS = 250mA IDSS Drain to Source Leakage VGS = 0V, VDS = 20V IGSS Gate to Source Leakage VDS = 0V, VGS = +10/–8V VGS(th) Gate to Source Threshold Voltage VDS = VGS, ID = 250mA RDS(on) Drain to Source On Resistance gfs Transconductance 25 0.9 V 1 mA 100 nA 1.1 1.4 VGS = 3V, IDS = 20A 5.4 7 mΩ V VGS = 4.5V, IDS = 20A 4.6 5.8 mΩ VGS = 8V, IDS = 20A 3.9 5 mΩ VDS = 15V, IDS = 20A 106 S Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance Crss 1050 1365 VGS = 0V, VDS = 12.5V, f = 1MHz pF 740 950 pF Reverse Transfer Capacitance 55 70 pF RG Series Gate Resistance 1.1 2.2 Ω Qg Gate Charge Total (4.5V) 6.8 9.7 nC Qgd Gate Charge – Gate to Drain 1.3 nC Qgs Gate Charge – Gate to Source 2.4 nC Qg(th) Gate Charge at Vth 1.3 nC Qoss Output Charge 17 nC td(on) Turn On Delay Time 6.1 ns tr Rise Time 10.7 ns td(off) Turn Off Delay Time 12.3 ns tf Fall Time 3.7 ns VDS = 12.5V, IDS = 20A VDS = 13V, VGS = 0V VDS = 12.5V, VGS = 4.5V, IDS = 20A, RG =2Ω Diode Characteristics VSD Diode Forward Voltage Qrr Reverse Recovery Charge trr Reverse Recovery Time IDS = 20A, VGS = 0V 0.8 VDD = 13V, IF = 20A, di/dt = 300A/ms 1 V 19 nC 21 ns THERMAL CHARACTERISTICS (TA = 25°C unless otherwise stated) MAX UNIT RqJC Thermal Resistance Junction to Case (Top Source) (1) PARAMETER 3.5 °C/W RqJC Thermal Resistance Junction to Case (Bottom drain) (1) 2.4 °C/W RqJA Thermal Resistance Junction to Ambient (1) (2) 50 °C/W (1) (2) 2 MIN TYP 2 RqJC is determined with the device mounted on a 1-inch 2-oz. Cu pad on a 1.5 × 1.5-inch 0.06-inch thick FR4 board. RqJC is specified by design, whereas RqCA is determined by the user’s board design. Device mounted on FR4 material with 1-inch2 of 2-oz. Cu. Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): CSD16322Q5C CSD16322Q5C www.ti.com SLPS241A – DECEMBER 2009 – REVISED JANUARY 2010 GATE GATE Source N-Chan 5x6 QFN TTA MIN Rev3 N-Chan 5x6 QFN TTA MAX Rev3 Max RqJA = 50°C/W when mounted on 1 inch2 of 2-oz. Cu. Source Max RqJA = 123°C/W when mounted on minimum pad area of 2-oz.Cu. DRAIN DRAIN M0137-02 M0137-01 Text and Text and Text and Text and br Added for Spacing br br br Added Added Added for for for Spacing Spacing Spacing TYPICAL MOSFET CHARACTERISTICS (TA = 25°C unless otherwise stated) ZqJA – NormalizedThermal Impedance 10 0.5 0.3 0.1 0.1 Duty Cycle = t1/t2 0.05 0.01 P 0.02 0.01 t1 t2 o Typical R qJA = 98 C/W (min Cu) TJ = P x ZqJA x R qJA Single Pulse 0.001 0.001 0.01 0.1 1 10 100 1k tP – Pulse Duration–s G012 Figure 1. Transient Thermal Impedance Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): CSD16322Q5C 3 CSD16322Q5C SLPS241A – DECEMBER 2009 – REVISED JANUARY 2010 www.ti.com TYPICAL MOSFET CHARACTERISTICS (continued) (TA = 25°C unless otherwise stated) TEXT ADDED FOR SPACING TEXT ADDED FOR SPACING 50 50 45 VGS = 8V 40 35 ID − Drain Current − A ID − Drain Current − A 45 VGS = 4.5V 30 VGS = 3V 25 VGS = 2.5V 20 15 10 VGS = 2V 5 VDS = 5V 40 35 30 TC = 25°C 25 20 TC = 125°C 15 TC = −55°C 10 5 0 0 0.0 0.5 1 1.5 1 2 VDS − Drain to Source Voltage − V 1.25 1.75 2 2.5 2.25 2.75 VGS − Gate to Source Voltage − V G001 Figure 2. Saturation Characteristics 3 G002 Figure 3. Transfer Characteristics TEXT ADDED FOR SPACING TEXT ADDED FOR SPACING 10 3.0 ID = 20A VDS = 12.5V 9 8 f = 1MHz VGS = 0V 2.5 C − Capacitance − nF VG − Gate Voltage − V 1.5 7 6 5 4 3 2 Coss = Cds + Cgd 2.0 Ciss = Cgd + Cgs 1.5 1.0 Crss = Cgd 0.5 1 0 0.0 0 2 4 6 8 10 12 Qg − Gate Charge − nC 14 0 5 20 25 G004 Figure 5. Capacitance TEXT ADDED FOR SPACING TEXT ADDED FOR SPACING 12 1.3 RDS(on) − On-State Resistance − mW 1.4 VGS(th) − Threshold Voltage − V 15 VDS − Drain to Source Voltage − V G003 Figure 4. Gate Charge ID = 250mA 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 −75 −25 25 75 125 TC − Case Temperature − °C 175 11 ID = 20A 10 9 8 TC = 125°C 7 6 5 4 3 TC = 25°C 2 1 0 0 1 2 3 4 5 6 7 8 VGS − Gate to Source Voltage − V G005 Figure 6. Threshold Voltage vs. Temperature 4 10 9 10 G006 Figure 7. On Resistance vs. Gate Voltage Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): CSD16322Q5C CSD16322Q5C www.ti.com SLPS241A – DECEMBER 2009 – REVISED JANUARY 2010 TYPICAL MOSFET CHARACTERISTICS (continued) (TA = 25°C unless otherwise stated) TEXT ADDED FOR SPACING TEXT ADDED FOR SPACING 100 ID = 20A VGS = 4.5V 1.2 ISD − Source to Drain Current − A Normalized On-State Resistance 1.4 1.0 0.8 0.6 0.4 0.2 0.0 −75 10 0.1 TC = 25°C 0.01 0.001 0.0001 −25 25 75 125 175 TC − Case Temperature − °C 0.0 0.4 0.6 0.8 1.0 G007 Figure 8. On Resistance vs. Temperature Figure 9. Typical Diode Forward Voltage TEXT ADDED FOR SPACING TEXT ADDED FOR SPACING 1.2 G008 100 I(AV) − Peak Avalanche Current − A ID − Drain Current − A 0.2 VSD − Source to Drain Voltage − V 1k 100 1ms 10 10ms 100ms 1 Area Limited by RDS(on) 1s 0.1 0.01 0.01 TC = 125°C 1 Single Pulse Typical RqJA = 98°C/W (min Cu) 0.1 DC 1 10 TC = 125°C 10 1 0.01 100 VD − Drain Voltage − V TC = 25°C 0.1 1 10 t(AV) − Time in Avalanche − ms G009 Figure 10. Maximum Safe Operating Area 100 G010 Figure 11. Single Pulse Unclamped Inductive Switching TEXT ADDED FOR SPACING 120 ID − Drain Current − A 100 80 60 40 20 0 −50 −25 0 25 50 75 100 125 150 175 TC − Case Temperature − °C G011 Figure 12. Maximum Drain Current vs. Temperature Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): CSD16322Q5C 5 CSD16322Q5C SLPS241A – DECEMBER 2009 – REVISED JANUARY 2010 www.ti.com MECHANICAL DATA Q5C Package Dimensions E1 K L E2 8 8 7 7 6 4 4 5 5 e 3 6 3 Pin 9 D2 D1 E 2 N 1 Exposed Heat Slug 1 c1 q 2 N1 L b M1 M Top View Bottom View Side View TM DualCool Pinout c E1 A q Pin# Label 1, 2, 3, 9 Source 4 Gate 5, 6, 7, 8 Drain Front View M0162-01 DIM MILLIMETERS MAX MIN MAX A 0.950 1.050 0.037 0.039 b 0.360 0.460 0.014 0.018 c 0.150 0.250 0.006 0.010 c1 0.150 0.250 0.006 0.010 D1 4.900 5.100 0.193 0.201 D2 4.320 4.520 0.170 0.178 E 4.900 5.100 0.193 0.201 E1 5.900 6.100 0.232 0.240 E2 3.920 4.12 0.154 e 6 INCHES MIN 1.27 TYP 0.162 0.050 L 0.510 0.710 0.020 0.028 q – – – – K 0.760 – 0.030 – M 3.260 3.460 0.128 0.136 M1 0.520 0.720 0.020 0.028 N 2.720 2.920 0.107 0.115 N1 1.227 1.427 0.048 0.056 Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): CSD16322Q5C CSD16322Q5C www.ti.com SLPS241A – DECEMBER 2009 – REVISED JANUARY 2010 Recommended PCB Pattern DIM F1 F7 F3 8 1 F2 F11 F5 F9 5 4 F6 MILLIMETERS INCHES MIN MAX MIN MAX F1 6.205 6.305 0.244 0.248 F2 4.46 4.56 0.176 0.18 F3 4.46 4.56 0.176 0.18 F4 0.65 0.7 0.026 0.028 F5 0.62 0.67 0.024 0.026 F6 0.63 0.68 0.025 0.027 F7 0.7 0.8 0.028 0.031 F8 0.65 0.7 0.026 0.028 F9 0.62 0.67 0.024 0.026 F10 4.9 5 0.193 0.197 F11 4.46 4.56 0.176 0.18 F8 F4 F10 M0139-01 For recommended circuit layout for PCB designs, see application note SLPA005 – Reducing Ringing Through PCB Layout Techniques. K0 4.00 ±0.10 (See Note 1) 0.30 ±0.05 2.00 ±0.05 +0.10 –0.00 12.00 ±0.30 Ø 1.50 1.75 ±0.10 Q5C Tape and Reel Information 5.50 ±0.05 B0 R 0.30 MAX A0 8.00 ±0.10 Ø 1.50 MIN A0 = 6.50 ±0.10 B0 = 5.30 ±0.10 K0 = 1.40 ±0.10 R 0.30 TYP M0138-01 Notes: 1. 10-sprocket hole-pitch cumulative tolerance ±0.2 2. Camber not to exceed 1mm in 100mm, noncumulative over 250mm 3. Material: black static-dissipative polystyrene 4. All dimensions are in mm, unless otherwise specified. 5. A0 and B0 measured on a plane 0.3mm above the bottom of the pocket 6. MSL1 260°C (IR and convection) PbF reflow compatible Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): CSD16322Q5C 7 CSD16322Q5C SLPS241A – DECEMBER 2009 – REVISED JANUARY 2010 www.ti.com Package Marking Information Location 8 1st Line CSD = Fixed Characters 5 5 8 4 4 1 C SDNNNNNC NNNNN = 5-digit Product Code C = DualCool Package 2nd Line (Date Code) Y = Last digit of the Year WW = 2-digit Work Week C = Country of Origin > Philippines = P YWWCLLLL > Taiwan = T > China = C 3rd Line LLLL 1 = Last 4 digits of the Wafer Lot Number Pin 1 Identifier M0163-01 SPACER REVISION HISTORY Changes from Original (December 2009) to Revision A Page • Changed the labels on the Bottom View pinout image ......................................................................................................... 1 • Changed the Mechanical Data dimensions table. Added dimensions for M, M1, N and N1 ................................................ 6 8 Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): CSD16322Q5C IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or service without notice. Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its hardware products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are used to the extent TI deems necessary to support this warranty. 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