TXS0206-29 www.ti.com SCES690 – DECEMBER 2009 MMC, SD CARD, Memory Stick™ VOLTAGE-TRANSLATION TRANSCEIVER AND LDO VOLTAGE REGULATOR WITH ESD PROTECTION AND EMI FILTERING FEATURES 1 • Level Translator – VCCA Range of 1.1 V to 3.6 V – Fast Propagation Delay (4 ns Max When Translating Between 1.8 V and 2.9 V) Low-Dropout (LDO) Regulator – 200-mA LDO Regulator With Enable – 2.9-V Output Voltage – 3.05-V to 5.5-V Input Voltage Range – Very Low Dropout: 200 mV at 200 mA • • • ESD Protection Exceeds JESD 22 (A Port) – 2000-V Human-Body Model (A114-B) – 1000-V Charged-Device Model (C101) ±8-kV Contact Discharge IEC 61000-4-2 ESD (B Port) YFP PACKAGE (TOP VIEW) TERMINAL ASSIGNMENTS 1 1 2 3 4 A B C D E 2 3 4 A DAT2A VCCA WP/CD DAT2B B DAT3A VBATT VCCB O/P DAT3B C CMDA GND GND CMDB D DAT0A CLKA CLKB DAT0B E DAT1A CLK-f EN DAT1B DESCRIPTION/ORDERING INFORMATION The TXS0206-29 is a complete solution for interfacing microprocessors with MultiMediaCards (MMCs), secure digital (SD) cards, and Memory Stick™ cards. It is comprised of a high-speed level translator, a low-dropout (LDO) voltage regulator, IEC level ESD protection, and EMI filtering circuitry. The voltage-level translator has two supply voltage pins. VCCA can be operated over the full range of 1.1 V to 3.6 V. VCCB is set at 2.9 V and is supplied by an internal LDO. The integrated LDO accepts input voltages from 3.05V to as high as 5.5 V and outputs 2.9 V, 200 mA to the B-side circuitry and to the external memory card. The TXS0206-29 enables system designers to easily interface low-voltage microprocessors to memory cards operating at 2.9 V. Memory card standards recommend high-ESD protection for devices that connect directly to the external memory card. To meet this need, the TXS0206-29 incorporates ±8-kV Contact Discharge protection on the card side. Since memory cards are widely used in mobile phones, PDAs, digital cameras, personal media players, camcorders, set-top boxes, etc. Low static power consumption and small package size make the TXS0206-29 an ideal choice for these applications. The TXS0206-29 is offered in a 20-bump wafer chip scale package (WCSP). This package has dimensions of 1.96 mm × 1.56 mm, with a 0.4-mm ball pitch for effective board-space savings ORDERING INFORMATION (1) TA –40°C to 85°C (1) (2) (3) PACKAGE WCSP – YFP (Pb-free) (2) Tape and reel ORDERABLE PART NUMBER TXS0206-29YFPR TOP-SIDE MARKING (3) ___3V2 For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. Package drawings, thermal data, and symbolization are available at www.ti.com/packaging. The actual top-side marking has three preceding characters to denote year, month, and sequence code. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2009, Texas Instruments Incorporated TXS0206-29 SCES690 – DECEMBER 2009 www.ti.com REFERENCE DESIGN VCCA VCCB VCCB C3 0.1 μF U1A C4 0.1 μF C1 0.1 μF J1 U2 VDDA A2 VCCA DAT0 D1 DAT0A DAT1 E1 DAT1A DAT2 DAT3 CMD CLK CLKin GND WP/CD A1 VCCB O/P D4 DAT0B DAT0B DAT1B E4 DAT1B DAT2B A4 DAT2B DAT3B B4 DAT3B DAT2A B1 DAT3A C1 CMDA D2 CLKA E2 CLK-f C2 DAT2B DAT3B CMDB B3 CLKB DAT0B DAT1B C4 CMDB CMDB D3 CLKB CLKB CD GND C3 GND Processor SD/SDIO MMC WP/CD A3 WP 0 1 2 3 4 5 6 7 8 9 10 11 12 13 DAT2 DAT3 CMD VSS1 VDD CLK VSS2 DAT0 DAT1 WP/CD (Physical) CD (Physical) GND GND WP (Physical) 54794-0978 SD/SDIO CardConnector TXS0206-29 WP/CD Figure 1. Interfacing With SD/SDIO Card ESD – ±8-kV Contact Discharge ESD – 2 kV 1.8 V CPU A Side B Side 2.9 V CLK CLK Feedback CLK CMD CMD Data 0–3 Data 0–3 EN WP, CD Level-Shifter Integrated ASIP EMI Filter Antenna Pins 10, 11 MMC, SD Card, or MS Card WP, CD 1.8-V Pullup Integrated PSU 2.9 V, 200 mA WP, CD Integrated Pullup/Pulldown Resistors Figure 2. Typical Application Circuit 2 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated TXS0206-29 www.ti.com SCES690 – DECEMBER 2009 Table 1. LOGIC TABLE EN LDO TRANSLATOR I/Os L Disabled Disabled, pulled to VCCA, VCCB O/P through R1 and R2 at 70kΩ pullup resistors respectively H Active Active TERMINAL FUNCTIONS TERMINAL TYPE DESCRIPTION NO. NAME A1 DAT2A I/O A2 VCCA Power A-port supply voltage. VCCA powers all A-port I/Os and control inputs. A3 WP/CD Output Connected to write protect on the mechanical connector. The WP pin has an internal 100-kΩ pullup resistor to VCCA. A4 DAT2B I/O Data bit 2 connected to memory card. Referenced to VCCBO/P. Includes R2 pullup resistor to VCCBO/P (see Note A). B1 DAT3A I/O Data bit 3 connected to host. Referenced to VCCA . Includes R1 pullup resistor to VCCA (see Note A). B2 VBATT Input B3 VCCB O/P Output B4 DAT3B I/O Data bit 3 connected to memory card. Referenced to VCCBO/P. Includes R2 pullup resistor to VCCBO/P (see Note A). C1 CMDA I/O Command bit connected to host. Referenced to VCCA . Includes R1 pullup resistor to VCCA (see Note A). C2, C3 GND C4 CMDB D1 D2 Data bit 2 connected to host. Referenced to VCCA. Includes R1 pullup resistor to VCCA (see Note A). LDO input voltage from Battery-Supply LDO output voltage and B-port supply voltage. VCCBO/P powers all B-port I/Os. Ground I/O Command bit connected to memory card. Referenced to VCCBO/P. Includes R2 pullup resistor to VCCBO/P (see Note A). DAT0A I/O Data bit 0 connected to host. Referenced to VCCA . Includes R1 pullup resistor to VCCA (see Note A). CLKA Input D3 CLKB Output D4 DAT0B I/O Data bit 0 connected to memory card. Referenced to VCCBO/P. Includes R2 pullup resistor to VCCBO/P (see Note A). E1 DAT1A I/O Data bit 1 connected to host. Referenced to VCCA . Includes R1 pullup resistor to VCCA (see Note A). E2 CLK-f Output E3 EN Input Enable/disable control. Pull EN low to place all outputs in Hi-Z state and to disable the LDO. Referenced to VCCA. E4 DAT1B I/O Data bit 1 connected to memory card. Referenced to VCCBO/P. Includes R2 pullup resistor to VCCBO/P (see Note A). Clock signal connected to host. Referenced to VCCA. Clock signal connected to memory card. Referenced to VCCBO/P. Clock feedback to host for resynchronizing data to a processor. Leave unconnected if not used. Copyright © 2009, Texas Instruments Incorporated Submit Documentation Feedback 3 TXS0206-29 SCES690 – DECEMBER 2009 www.ti.com VCCA VCCB EN (see Note B) CLKA CLKB CLK-f VCCA VCCB One-Shot R1 (see Note A) R2 (see Note A) Translator One-Shot CMDA CMDB Gate Control One-Shot Translator One-Shot VCCA VCCB One-Shot R1 (see Note A) R2 (see Note A) Translator One-Shot DAT0A DAT0B Gate Control One-Shot Translator One-Shot VCCA VCCB One-Shot R1 (see Note A) R2 (see Note A) Translator One-Shot DAT1A DAT1B Gate Control One-Shot Translator One-Shot VCCA VCCB R2 (see Note A) One-Shot R1 (see Note A) Translator One-Shot DAT2A DAT2B Gate Control One-Shot Translator One-Shot VCCA VCCB One-Shot R1 (see Note A) R2 (see Note A) Translator One-Shot DAT3A DAT3B Gate Control One-Shot Translator One-Shot VCCA 100 kW WP/CD A. R1 and R2 resistor values are determined based upon the logic level applied to the A port or B port as follows: R1 and R2 = 40 kΩ when a logic level low is applied to the A port or B port. R1 and R2 = 4 kΩ when a logic level high is applied to the A port or B port. R1 and R2 = 70 kΩ when the port is deselected (or in High-Z or 3-state). B. EN controls all output buffers. When EN = low, all outputs are Hi-Z. Figure 3. Logic Diagram 4 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated TXS0206-29 www.ti.com SCES690 – DECEMBER 2009 VCCB R7 R8 R9 R10 R11 HOST CARD R1 CLKB CLK R2 CMD CMDB R3 Data0 DAT0B R4 DAT1B Data1 R5 DAT2B Data2 R6 Data3 DAT3B GND GND RESISTORS BIDIRECTIONAL ZENER DIODES R1, R2, R3, R4, R5, R6 40 Ω Vbr min 14 V at 1 mA Tolerance ±20% Line capacitance <20 pF R7, R8, R9, R10, R11 40 kΩ Tolerance ±30% Figure 4. ASIP Block Diagram VCCA RWP/CD WP/CD RESISTORS RWP/CD 100 kΩ Tolerance ±30% Figure 5. WP/CD Pullup Resistor Copyright © 2009, Texas Instruments Incorporated Submit Documentation Feedback 5 TXS0206-29 SCES690 – DECEMBER 2009 www.ti.com ABSOLUTE MAXIMUM RATINGS (1) Level Translator over operating free-air temperature range (unless otherwise noted) VCCA VI Supply voltage range Input voltage range MIN MAX –0.5 4.6 I/O ports (A port) –0.5 4.6 I/O ports (B port) –0.5 4.6 Control inputs –0.5 4.6 A port –0.5 4.6 B port –0.5 4.6 A port –0.5 4.6 B port –0.5 4.6 UNIT V V VO Voltage range applied to any output in the high-impedance or power-off state VO Voltage range applied to any output in the high or low state IIK Input clamp current VI < 0 –50 mA IOK Output clamp current VO < 0 –50 mA IO Continuous output current Continuous current through VCCA or GND Tstg (1) Storage temperature range –65 V V ±50 mA ±100 mA 150 °C Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. THERMAL IMPEDANCE RATINGS Package thermal impedance (1) θJA (1) TYP UNIT 117 °C/W The package thermal impedance is calculated in accordance with JESD 51-7. ABSOLUTE MAXIMUM RATINGS (1) LDO over operating free-air temperature range (unless otherwise noted) VIN Input voltage range VOUT Output voltage range MIN MAX 2.3 6.5 V –0.3 4.6 V Peak output current Continuous total power dissipation UNIT 220 mA TBD mW TJ Junction temperature range –55 150 °C Tstg Storage temperature range –55 150 °C (1) 6 Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated TXS0206-29 www.ti.com SCES690 – DECEMBER 2009 RECOMMENDED OPERATING CONDITIONS (1) Level Translator VCCA VCCA VIH High-level input voltage VIL Low-level input voltage VO VCCB Supply voltage Output voltage A-Port CMD and DATA I/Os 1.1 V to 1.95 V B-Port and DATA I/Os 1.1 V to 1.95 V OE and CLKA 1.1 V to 3.6 V A-Port CMD and DATA I/Os 1.1 V to 1.95 V B-Port CMD and DATA I/Os 1.1 V to 1.95 V OE and CLKA 1.1 V to 3.6 V 1.95 V to 3.6 V 1.95 V to 3.6 V 1.95 V to 3.6 V 1.95 V to 3.6 V 2.9 V 2.9 V 2.9 V 2.9 V Active state 3-state MIN MAX 1.1 3.6 VCCI – 0.2 VCCI VCCI – 0.4 VCCI VCCI – 0.2 VCCI VCCI – 0.4 VCCI VCCI × 0.65 VCCI 0 0.15 0 0.15 0 0.15 0 0.15 0 VCCI × 0.35 0 VCCO 1.1 V to 1.3 V High-level output current (CLK-f output) 1.65 V to 1.95 V –2 –8 1.1 V to 1.3 V 0.5 1.65 V to 1.95 V V V mA –4 3 V to 3.6 V 1.4 V to 1.6 V Low-level output current (CLK-f output) V –1 2.9 V 2.3 V to 2.7 V IOL V –0.5 1.4 V to 1.6 V IOH UNIT 1 2.9 V 2 2.3 V to 2.7 V mA 4 3 V to 3.6 V 8 IOH High-level output current (CLK output) 2.9 V –8 IOL Low-level output current (CLK output) 2.9 V 8 mA Δt/Δv Input transition rise or fall rate 5 ns/V TA Operating free-air temperature 85 °C (1) –40 mA All unused data inputs of the device must be held at VCCI or GND to ensure proper device operation. See the TI application report, Implications of Slow or Floating CMOS Inputs, literature number SCBA004. RECOMMENDED OPERATING CONDITIONS LDO MIN IOUT(PK) Peak output current COUT Output capacitance TJ Operating junction temperature Copyright © 2009, Texas Instruments Incorporated MAX 200 UNIT mA 1 100 μF –40 125 °C Submit Documentation Feedback 7 TXS0206-29 SCES690 – DECEMBER 2009 www.ti.com ELECTRICAL CHARACTERISTICS Level Translator over recommended operating free-air temperature range (unless otherwise noted) PARAMETER A port (CLK-f output) VOH A port (DAT and CMD outputs) A port (CLK-f output) VOL A port (DAT and CMD outputs) TEST CONDITIONS VCCA VCCBO/P MIN IOH = –100 μA 1.1 V to 3.6 V IOH = –0.5 mA 1.1 V 0.8 IOH = –1 mA 1.4 V 1.05 IOH = –2 mA 1.65 V IOH = –4 mA 2.3 V IOH = –8 mA 3V IOH = –20 μA 1.1 V to 3.6 V IOL = 100 μA 1.1 V to 3.6 V IOL = 0.5 mA 1.1 V TYP (1) 1.2 2.9 V V 1.75 2.3 VCCA × 0.8 VCCA × 0.8 0.35 IOL = 1 mA 1.4 V IOL = 2 mA 1.65 V IOL = 4 mA 2.3 V 0.55 IOL = 8 mA 0.35 3V 0.7 2.9 V 0.45 IOL = 135 μA 0.4 IOL = 180 μA 0.4 IOL = 220 μA 1.1 V to 3.6 V VOH B port (DAT output) CLKB output port VOL B port (DAT and CMD outputs) II Control inputs UNIT VCCA × 0.8 2.9 V 0.4 IOL = 300 μA V V 0.4 IOL = 400 μA B port (CLK output) MAX 0.55 IOH = –100 μA 2.9 V IOH = –8 mA 1.1 V to 3.6 V IOH = –20 μA 2.3 2.9 V IOL = 100 μA 1.1 V to 3.6 V VCCBO/P × 0.8 V VCCBO/P × 0.8 VCCBO/P × 0.8 2.9 V IOL = 8 mA 0.7 IOL = 135 μA 0.4 IOL = 180 μA V 0.4 IOL = 220 μA 1.1 V to 3.6 V 2.9 V 0.4 IOL = 300 μA 0.4 IOL = 400 μA 0.55 VI = VCCA or GND V 1.1 V to 3.6 V 2.9 V ±1 μA ICCA VI = VCCI or GND, IO = 0 1.1 V to 3.6 V 2.9 V 6 μA ICCB VI = VCCI or GND, IO = 0 1.1 V to 3.6 V 2.9 V 5 μA Cio Ci (1) 8 A port 5.5 6.5 B port 15 17.5 3.5 4.5 3 4 Control inputs Clock input VI = VCCA or GND pF pF All typical values are at TA = 25°C. Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated TXS0206-29 www.ti.com SCES690 – DECEMBER 2009 ELECTRICAL CHARACTERISTICS LDO over operating free-air temperature range (unless otherwise noted) PARAMETER VBATT TEST CONDITIONS TYP (1) MIN Input voltage MAX VOUT + VDO 5.5 Nominal TA = 25°C VOUT Output voltage ΔVOUT Output voltage tolerance Nominal TA = 25°C VDO Dropout voltage IOUT = 200 mA 2.75 IOUT(SC) Short-circuit current ±3 % 200 250 mV 40 IOUT < 100 mA μA 200 100 mA ≤ IOUT ≤ 200 mA 400 RL = 0 Ω 300 f = 1 kHz 50 f = 10 kHz 40 PSRR Power-supply rejection ratio VIN = 3.05 V, VOUT = 2.9 V, CNR = 0.01 μF, IOUT = 200 mA tSTR Start-up time VOUT = 2.9 V, IOUT = 200 mA, COUT = 2.2 μF (1) V 3.05 IOUT = 0 Ground-pin current V 2.9 All conditions IGND UNIT mA dB μs 200 All typical values are at TA = 25°C. TIMING REQUIREMENTS over recommended operating free-air temperature range, VCCB = 2.9 V ± 5% (unless otherwise noted) VCCA = 1.2 V ± 0.1 V MIN Command Data rate Clock Data Command tW Pulse duration Clock Data Push-pull driving Open-drain driving Push-pull driving Push-pull driving Open-drain driving Push-pull driving Copyright © 2009, Texas Instruments Incorporated VCCA = 1.5 V ± 0.1 V MAX MIN MAX VCCA = 1.8 V ± 0.15 V MIN VCCA = 2.5 V ± 0.2 V MAX MIN MAX VCCA = 3.3 V ± 0.3 V MIN UNIT MAX 40 60 60 60 60 1 1 1 1 1 60 60 60 60 60 MHz 40 60 60 60 60 Mbps Mbps 25 17 17 17 17 ns 1 1 1 1 1 μs 8.3 8.3 8.3 8.3 8.3 ns 25 17 17 17 17 ns Submit Documentation Feedback 9 TXS0206-29 SCES690 – DECEMBER 2009 www.ti.com SWITCHING CHARACTERISTICS over recommended operating free-air temperature range, VCCB = 2.9 V ± 5% (unless otherwise noted) PARAMETER FROM (INPUT) TO (OUTPUT) TEST CONDITIONS VCCA = 1.2 V ± 0.1 V MIN Push-pull driving CMDA CMDB ten tdis CMDB CMDA CLKA CLKB DATxA DATxB DATxB DATxA CLKA CLK-f EN 10.8 MIN 3.7 UNIT MAX 3.8 3.2 10.6 2.7 6.6 2.4 5.5 2.1 4.4 2 4.1 Open-drain driving (L-to-H) 71 175 83 180 89 201 98 249 101 233 12 6.8 5.2 4.1 3.4 Open-drain driving (H-to-L) 2.9 9.4 2.1 7.3 2 6.4 2 5.7 2.2 4.6 Open-drain driving (L-to-H) 77 243 87 214 93 215 99 261 105 248 3.7 3.5 3.7 3.7 11.5 6.2 5 3.9 6.2 Push-pull driving 24.7 13 8.9 6.8 4.8 B-port Push-pull driving 1 1 1 1 1 EN A-port Push-pull driving 1 1 1 1 1 EN B-port Push-pull driving 40 39 35 38 34 EN A-port Push-pull driving 40 38 38 38 36 CLK-f rise time CLKB rise time CLK-f fall time CMDB fall time CLKB fall time DATxB fall time Channel-to-channel skew Command Clock Data 10 4.6 MAX 4.7 DATxA fall time Max data rate MIN 4.7 CMDA fall time tSK(O) 6.1 MAX 6.2 DATxB rise time tfB MIN 6.2 CMDB rise time tfA MAX VCCA = 3.3 V ± 0.3 V 11.1 DATxA rise time trB MIN VCCA = 2.5 V ± 0.2 V 11.7 CMDA rise time trA MAX VCCA = 1.8 V ± 0.15 V Open-drain driving (H-to-L) Push-pull driving tpd VCCA = 1.5 V ± 0.1 V Push-pull driving Push-pull driving Push-pull driving 1.6 12.2 0.4 8.3 1.1 5.9 1.9 3.3 0.8 4.2 Open-drain driving 32 120 44 127 52 150 62 201 74 194 0.6 12.7 0.5 7.2 0.4 4.5 0.7 1.5 0.7 1.4 3.3 Push-pull driving 1.6 11.6 0.6 8.4 1 6.3 1.8 4.2 1.1 Push-pull driving 1.7 6.7 0.5 5.6 1 5.2 1.5 5.2 1.9 5 Open-drain driving 66 214 71 196 73 184 76 214 79 185 1.7 4.8 1.5 4.9 1.5 4.9 1.6 5 1.6 5.1 Push-pull driving 0.4 6.8 0.6 5 0.2 5.2 0.9 5.3 1 14 Push-pull driving 0.8 4 0.8 2.3 0.2 3.1 0.3 1.5 1 2.3 Open-drain driving 1.6 3.9 1.6 3.7 1.6 3.7 1.6 3.7 1.6 3.9 1 4 0.4 6.8 0.1 1.5 0.3 2.8 0.6 1.3 Push-pull driving Push-pull driving Open-drain driving Push-pull driving 1 3.9 0.1 3.8 0.2 2.7 0.3 2.9 0.4 1.8 1.5 4.5 1.4 5.4 1.6 5 1.6 5.6 0.8 6.3 1 4.3 1 2.3 0.8 1.9 0.8 1.6 0.9 1.3 1.6 4 1.6 4.1 1.7 4.2 1.7 4.5 0.9 5.1 1 4.8 2.3 4.3 0.8 4.9 0.2 4.9 0.8 6.9 ns μs ns ns ns ns ns Push-pull driving 1 1 1 1 1 Push-pull driving 40 60 60 60 60 1 1 1 1 1 60 60 60 60 60 MHz 40 60 60 60 60 Mbps Open-drain driving Push-pull driving Submit Documentation Feedback ns Mbps Copyright © 2009, Texas Instruments Incorporated TXS0206-29 www.ti.com SCES690 – DECEMBER 2009 OPERATING CHARACTERISTICS TA = 25°C, VCCB = 2.9 V PARAMETER TEST CONDITIONS 1.5 V 1.8 V 2.5 V 3V 3.3 V 15 15 15 15.7 17.1 17.1 6.3 6.4 6.5 6.5 6.5 6.5 12.5 12.3 12.3 12.5 14 14 0.2 0.2 0.2 0.3 0.3 0.3 1.2 1.2 1.2 1.2 1.2 1.2 B-port input, DATA A-port Disabled output 0.2 0.2 0.2 0.3 0.3 0.3 A-port input, DATA B-port Enabled output 31.2 30.6 30.3 29.5 28.5 28.5 28.1 27.2 27 26.9 27 27 12.9 12.8 12.9 13.2 13.2 13.2 CLK A-port input, Enabled B-port DATA output Enabled CpdA CpdB (1) B-port input, DATA A-port Enabled output CLK A-port input, Disabled B-port DATA output Disabled (1) CLK B-port input, Enabled A-port DATA output Enabled A-port input, DATA B-port Disabled output CL = 0, f = 10 MHz, tr = tf = 1 ns CL = 0, f = 10 MHz, tr = tf = 1 ns CLK B-port input, Disabled A-port DATA output Disabled (1) VCCA TYP 1.2 V UNIT pF pF 0.6 0.5 0.5 0.5 0.5 0.6 0.6 0.5 0.5 0.5 0.5 0.6 1.2 1.2 1.2 1 1 1 Power dissipation capacitance per transceiver Copyright © 2009, Texas Instruments Incorporated Submit Documentation Feedback 11 TXS0206-29 www.ti.com Attenuation (dB) SCES690 – DECEMBER 2009 Frequency (Hz) Output Current, IOUT (mA) Figure 6. Typical ASIP EMI Filter Frequency Response 200 150 100 50 –40 –20 0 20 40 60 80 100 Junction Temperature, TJ (°C) Figure 7. LDO Output Current Derating 12 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated TXS0206-29 www.ti.com SCES690 – DECEMBER 2009 TYPICAL CHARACTERISTICS LOAD REGULATION, LIGHT LOADS 200 100 160 80 120 60 80 40 40 20 0 ?VOUT(mV) D ?VOUT(mV) D LOAD REGULATION TA = -40°C -40 -80 0 -20 TA = -40°C -40 TA = 25°C TA = 85°C -120 -60 -160 -80 -200 -100 0 TA = 25°C 50 100 150 TA = 85°C 0 200 1 2 3 4 5 IOUT (m A) IOUT (m A) LINE REGULATION (IOUT = 5 mA) LINE REGULATION (IOUT = 150 mA) 0 1 -0.2 -0.4 0 TA = -40°C -0.6 TA = -40°C -1 TA = 25°C -1 ?VOUT(%) D ?VOUT(%) D -0.8 -1.2 -1.4 -2 TA = 25°C -3 TA = 85°C -1.6 TA = 85°C -4 -1.8 -2 -5 -2.2 -2.4 3 3.25 3.5 3.75 4 4.25 4.5 4.75 V IN (V) Copyright © 2009, Texas Instruments Incorporated 5 5.25 5.5 -6 3 3.25 3.5 3.75 4 4.25 4.5 4.75 V IN (V) 5 5.25 5.5 Submit Documentation Feedback 13 TXS0206-29 SCES690 – DECEMBER 2009 www.ti.com TYPICAL CHARACTERISTICS (continued) OUTPUT VOLTAGE vs TEMPERATURE DROPOUT VOLTAGE vs OUTPUT CURRENT 2 250 1 200 TA = 85°C 0 TA = 25°C 150 VDO (mV) ?VOUT(%) D IOUT = 50 m A IOUT = 5 m A -1 TA = -40°C 100 -2 IOUT = 150 m A 50 -3 -4 -40 0 -15 10 35 60 0 85 50 100 150 200 150 200 IOUT (m A) TJ (°C) DROPOUT VOLTAGE vs TEMPERATURE GROUND PIN CURRENT vs OUTPUT CURRENT 300 200 175 250 150 IOUT = 150 m A 200 100 IGND(µA) VDO (mV) 125 IOUT = 100 m A 75 150 100 50 50 25 IOUT = 5 m A 0 -40 14 0 -15 10 TJ (°C) Submit Documentation Feedback 35 60 85 0 50 100 IOUT (m A) Copyright © 2009, Texas Instruments Incorporated TXS0206-29 www.ti.com SCES690 – DECEMBER 2009 TYPICAL CHARACTERISTICS (continued) GROUND PIN CURRENT vs TEMPERATURE (ENABLE) CURRENT LIMIT vs INPUT VOLTAGE 0.40 300 IGND(µA) 200 IOUT = 150 m A 0.38 IOUT = 100 m A 0.36 TA = -40°C IOUT(A) 250 150 TA = 25°C 0.34 100 TA = 85°C 50 0.32 IOUT = 2 m A 0 -40 0.30 -15 10 35 60 3 85 3.5 POWER SUPPLY RIPPLE REJECTION vs FREQUENCY (VIN - VOUT = 1 V) 4.5 5 5.5 OUTPUT SPECTRAL NOISE DENSITY (COUT = 1 µF) 10 -10 9 Output Noise Density (µV/ ?Hz) -20 -30 -40 PSRR (dB) 4 V IN (V) TJ (°C) -50 -60 -70 8 7 6 5 4 3 2 -80 1 10 1.E+02 10k 100k 1.E+03 1.E+04 1.E+05 1k Frequency (Hz) Copyright © 2009, Texas Instruments Incorporated 0 1.E+06 1M 10M 1.E+07 10 00 00 50 m A 10 00 0 0 mA 10 m A 10 00 -100 1.E+01 1 200 m A 10 0 -90 100 m A Frequency (Hz) Submit Documentation Feedback 15 TXS0206-29 SCES690 – DECEMBER 2009 www.ti.com TYPICAL CHARACTERISTICS (continued) LINE TRANSIENT RESPONSE (COUT = 1 µF) LOAD TRANSIENT RESPONSE (COUT = 1 µF, VIN = 3.3 V, IOUT = 0 to 100 mA) 2.94 V IN 2.92 0.18 5.25 2.95 0.16 5 2.90 0.12 4.5 2.80 0.10 2.75 0.08 4 2.70 0.06 3.75 2.65 0.04 3.5 2.60 3.25 2.55 4.25 2.89 V OUT 2.88 2.87 2.86 -0.5 -0.4 -0.3 -0.2 tim e (m s) -0.1 0 0.00 2.50 -0.35 3 0.1 0.02 IOUT -0.25 -0.15 -0.05 0.05 -0.02 0.15 tim e (m s) POWER-UP/POWER-DOWN (COUT = 1 µF, IOUT = 150 mA) TURN-ON RESPONSE 4 3.5 3.5 3 3 2.5 2.5 2 VIN, VOUT(V) V IN VIN, VOUT(V) IOUT(A) 2.85 VOUT(V) 4.75 2.9 2.85 -0.6 0.14 V OUT 2.91 VOUT(V) 3.00 VIN (V) 2.93 5.5 2 V OUT (COUT = 1 µF) 1.5 1.5 V IN 1 1 0.5 V OUT (COUT = 3 µF) 0.5 V OUT 0 0 -0.5 -0.1 -0.5 -0.001 -0.05 0 0.05 0.1 0.15 tim e (m s) 16 Submit Documentation Feedback 0.2 0.25 0.3 0 0.001 0.002 0.003 0.004 0.005 0.006 tim e (s) Copyright © 2009, Texas Instruments Incorporated TXS0206-29 www.ti.com SCES690 – DECEMBER 2009 PARAMETER MEASUREMENT INFORMATION VCCI VCCO VCCI VCCO DUT IN DUT IN OUT 15 pF OUT 1 MW 1 MW 15 pF DATA RATE, PULSE DURATION, PROPAGATION DELAY, OUTPUT RISE AND FALL TIME MEASUREMENT USING AN OPEN-DRAIN DRIVER DATA RATE, PULSE DURATION, PROPAGATION DELAY, OUTPUT RISE AND FALL TIME MEASUREMENT USING A PUSH-PULL DRIVER 2 × VCCO 50 kW From Output Under Test 15 pF S1 Open 50 kW LOAD CIRCUIT FOR ENABLE/DISABLE TIME MEASUREMENT TEST S1 tPZL/tPLZ tPHZ/tPZH 2 × VCCO Open tw VCCI VCCI/2 Input VCCI/2 0V VOLTAGE WAVEFORMS PULSE DURATION VCCA Output Control (low-level enabling) VCCA/2 0V tPLZ tPZL VCCI Input VCCI/2 VCCI/2 0V tPLH Output tPHL VCCO/2 0.9 y VCCO 0.1 y VCCO VOH VCCO/2 VOL Output Waveform 1 S1 at 2 × VCCO (see Note B) Output Waveform 2 S1 at GND (see Note B) VCCA/2 VCCO VCCO/2 0.1 y VCCO VOL tPHZ tPZH VOH 0.9 y VCCO VCCO/2 0V tf tr VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES VOLTAGE WAVEFORMS ENABLE AND DISABLE TIMES A. CL includes probe and jig capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRRv10 MHz, ZO = 50 Ω, dv/dt ≥ 1 V/ns. D. The outputs are measured one at a time, with one transition per measurement. E. tPLZ and tPHZ are the same as tdis. F. tPZL and tPZH are the same as ten. G. tPLH and tPHL are the same as tpd. H. VCCI is the VCC associated with the input port. I. VCCO is the VCC associated with the output port. J. All parameters and waveforms are not applicable to all devices. Figure 8. Load Circuit and Voltage WaveformsN Copyright © 2009, Texas Instruments Incorporated Submit Documentation Feedback 17 TXS0206-29 SCES690 – DECEMBER 2009 www.ti.com PRINCIPLES OF OPERATION Applications The TXS0206-29 device is a complete application-specific voltage-translator designed to bridge the digital-switching compatibility gap and interface logic threshold levels between a micrprocessor with MMC, SD, and Memory Stick™ cards. It is intended to be used in a point-to-point topology when interfacing these devices that may or may not be operating at different interface voltages. Architecture The CLKA, CLKB, and CLK-f subsystem interfaces consist of a fully-buffered voltage translator design that has its output transistors to source and sink current optimized for drive strength. The SDIO lines comprise a semi-buffered auto-direction-sensing based translator architecture (see Figure 9) that does not require a direction-control signal to control the direction of data flow of the A to B ports (or from B to A ports). VCCA VCCB O/P R1 One-Shot T1 One-Shot T2 R2 Translator SDIO-DATAx(A) SDIO-DATAx(B) Bias N1 T3 One-Shot Translator T4 One-Shot Figure 9. Architecture of an SDIO Switch-Type Cell Each of these bidirectional SDIO channels independently determines the direction of data flow without a direction-control signal. Each I/O pin can be automatically reconfigured as either an input or an output, which is how this auto-direction feature is realized. The following two key circuits are employed to facilitate the "switch-type" voltage translation function: 1. Integrated pullup resistors to provide dc-bias and drive capabilities 2. An N-channel pass-gate transistor topology (with a high RON of ~300 Ω) that ties the A-port to the B-port 3. Output one-shot (O.S.) edge-rate accelerator circuitry to detect and accelerate rising edges on the A or B ports 18 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated TXS0206-29 www.ti.com SCES690 – DECEMBER 2009 For bidirectional voltage translation, pullup resistors are included on the device for dc current sourcing capability. The VGATE gate bias of the N-channel pass transistor is set at a level that optimizes the switch characteristics for maximum data rate as well as minimal static supply leakage. Data can flow in either direction without guidance from a control signal. The edge-rate acceleration circuitry speeds up the output slew rate by monitoring the input edge for transitions, helping maintain the data rate through the device. During a low-to-high signal rising-edge, the O.S. circuits turn on the PMOS transistors (T1, T3) and its associated driver output resistance of the driver is decreased to approximately 50 Ω to 70 Ω during this acceleration phase to increase the current drive capability of the driver for approximately 30 ns or 95% of the input edge, whichever occurs first. This edge-rate acceleration provides high ac drive by bypassing the internal pullup resistors during the low-to-high transition to speed up the rising-edge signal. During a high-to-low signal falling-edge, the O.S. circuits turn on the NMOS transistors (T2, T4) and its associated driver output resistance of the driver is decreased to approximately 50 Ω to 70 Ω during this acceleration phase to increase the current drive capability of the driver for approximately 30 ns or 95% of the input edge, whichever occurs first. To minimize dynamic ICC and the possibility of signal contention, the user should wait for the O.S. circuit to turn-off before applying a signal in the opposite direction. The worst-case duration is equal to the minimum pulse-width number provided in the Timing Requirements section of this data sheet. Once the O.S. is triggered and switched off, both the A and B ports must go to the same state (i.e. both High or both Low) for the one-shot to trigger again. In a DC state, the output drivers maintain a Low state through the pass transistor. The output drivers maintain a High through the "smart pullup resistors" that dynamically change value based on whether a Low or a High is being passed through the SDIO lines, as follows: • RPU1 and RPU2 values are a nominal 40 kΩ when the output is driving a low • RPU1 and RPU2 values are a nominal 4 kΩ when the output is driving a high • RPU1 and RPU2 values are a nominal 70 kΩ when the device is disabled via the EN pin or by pulling the either VCCA or VCCBO/P to 0 V. The reason for using these "smart" pullup resistors is to allow the TXS0206-29 to realize a lower static power consumption (when the I/Os are low), support lower VOL values for the same size pass-gate transistor, and improved simultaneous switching performance. Input Driver Requirements The continuous dc-current "sinking" capability is determined by the external system-level driver interfaced to the SDIO pins. Since the high bandwidth of these bidirectional SDIO circuits necessitates the need for a port to quickly change from an input to an output (and vice-vera), they have a modest dc-current "sourcing" capability of hundreds of micro-Amps, as determined by the smart pullup resistor values. The fall time (tfA, tfB) of a signal depends on the edge rate and output impedance of the external device driving the SDIO I/Os, as well as the capacitive loading on these lines. Similarly, the tpd and max data rates also depend on the output impedance of the external driver. The values for tfA, tfB, tpd, and maximum data rates in the data sheet assume that the output impedance of the external driver is less than 50 Ω. Output Load Considerations TI recommends careful PCB layout practices with short PCB trace lengths to avoid excessive capacitive loading and to ensure that proper O.S. triggering takes place. PCB signal trace-lengths should be kept short enough such that the round trip delay of any reflection is less than the one-shot duration. This improves signal integrity by ensuring that any reflection sees a low impedance at the driver. The O.S. circuits have been designed to stay on for approximately 30 ns. The maximum capacitance of the lumped load that can be driven also depends directly on the one-shot duration. With very heavy capacitive loads, the one-shot can time-out before the signal is driven fully to the positive rail. The O.S. duration has been set to best optimize trade-offs between dynamic ICC, load driving capability, and maximum bit-rate considerations. Both PCB trace length and connectors add to the capacitance that the TXS0206-29 SDIO output sees, so it is recommended that this lumped-load capacitance be considered and kept below 50 pF to avoid O.S. retriggering, bus contention, output signal oscillations, or other adverse system-level affects. Copyright © 2009, Texas Instruments Incorporated Submit Documentation Feedback 19 TXS0206-29 SCES690 – DECEMBER 2009 www.ti.com When using the TXS0206-29 device with MMCs, SD, and Memory Stick™ to ensure that a valid receiver input voltage high (VIH) is achieved, the value of any pulldown resistors (external or internal to a memory card) must not be >10-kΩ value. The impact of adding too heavy a pulldown resistor (i.e. <10-kΩ value) to the data and command lines of the TXS0206-29 device and the resulting 4-kΩ pullup & 10-kΩ pulldown voltage divider network has a direct impact on the VIH of the signal being sent into the memory card and its associated logic. The resulting VIH voltage for the 10-kΩ pulldown resistor value would be: VCC × 10 kΩ / (10 kΩ+ 4 kΩ) = 0.714 × VCC This is marginally above a valid input high voltage for a 1.8-V signal (i.e., 0.65 × VCC). The resulting VIH voltage for 20-kΩ pulldown resistor value would be: VCC × 20 kΩ / (20 kΩ + 4 kΩ) = 0.833 × VCC Which is above the valid input high voltage for a 1.8-V signal of 0.65 × VCC. . 20 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated PACKAGE OPTION ADDENDUM www.ti.com 23-Dec-2009 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing TXS0206-29YFPR ACTIVE DSBGA YFP Pins Package Eco Plan (2) Qty 20 3000 Green (RoHS & no Sb/Br) Lead/Ball Finish SNAGCU MSL Peak Temp (3) Level-1-260C-UNLIM (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. 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