IXYS DE375-102N10A_09

DE375-102N10A
RF Power MOSFET
N-Channel Enhancement Mode
Low Qg and Rg
High dv/dt
Nanosecond Switching
Ideal for Class C, D, & E Applications
Symbol
Test Conditions
Maximum Ratings
VDSS
TJ = 25°C to 150°C
1000
V
VDGR
TJ = 25°C to 150°C; RGS = 1 MΩ
1000
V
VGS
Continuous
±20
V
VGSM
Transient
±30
V
ID25
Tc = 25°C
10
A
IDM
Tc = 25°C, pulse width limited by TJM
60
A
IAR
Tc = 25°C
10
A
EAR
Tc = 25°C
30
mJ
IS ≤ IDM, di/dt ≤ 100A/µs, VDD ≤ VDSS,
Tj ≤ 150°C, RG = 0.2Ω
5
V/ns
dv/dt
>200
V/ns
940
W
425
W
4.5
W
RthJC
0.16
C/W
RthJHS
0.23
C/W
IS = 0
PDC
PDHS
Tc = 25°C
Derate 4.4W/°C above 25°C
PDAMB
Tc = 25°C
VDSS
=
1000 V
ID25
=
10 A
RDS(on)
≤
1.2 Ω
PDC
=
940 W
DRAIN
GATE
SG1
SG2
SD1
SD2
Features
Symbol
Test Conditions
Characteristic Values
TJ = 25°C unless otherwise specified
min.
VDSS
VGS = 0 V, ID = 3 ma
VGS(th)
VDS = VGS, ID = 250µA
IGSS
VGS = ±20 VDC, VDS = 0
IDSS
VDS = 0.8 VDSS TJ = 25°C
VGS = 0
TJ = 125°C
RDS(on)
VGS = 15 V, ID = 0.5ID25
Pulse test, t ≤ 300µS, duty cycle d ≤ 2%
gfs
VDS = 20 V, ID = 0.5ID25, pulse test
typ.
1000
2.5
3.1
4
Advantages
±100
nA
6
+150
-55
1.6mm (0.063 in) from case for 10 s
S
V
150
Tstg
Ω
5.5
1.2
+150
cycling capability
IXYS advanced low Qg process
•
•
−
−
•
•
•
50 µA
1 mA
TJM
Weight
V
-55
TJ
TL
max.
• Isolated Substrate
− high isolation voltage (>2500V)
− excellent thermal transfer
− Increased temperature and power
Low gate charge and capacitances
easier to drive
faster switching
Low RDS(on)
Very low insertion inductance (<2nH)
No beryllium oxide (BeO) or other
hazardous materials
°C
• Optimized for RF and high speed
°C
• Easy to mount—no insulators needed
• High power density
°C
300
°C
3
g
switching at frequencies to 50MHz
DE375-102N10A
RF Power MOSFET
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C unless otherwise specified)
min.
typ.
0.3
Ω
2750
pF
110
pF
20
pF
33
pF
5
ns
3
ns
5
ns
8
ns
81
nC
16
nC
42
nC
RG
Ciss
Coss
VGS = 0 V, VDS = 0.8 VDSS(max),
f = 1 MHz
Crss
Cstray
max.
Back Metal to any Pin
Td(on)
Ton
Td(off)
VGS = 15 V, VDS = 0.8 VDSS
ID = 0.5 IDM
RG = 0.2 Ω (External)
Toff
Qg(on)
Qgs
VGS = 10 V, VDS = 0.5 VDSS
ID = 0.5 ID25
Qgd
Source-Drain Diode
Characteristic Values
(TJ = 25°C unless otherwise specified)
Symbol
Test Conditions
min.
IS
VGS = 0 V
10
A
ISM
Repetitive; pulse width limited by TJM
80
A
VSD
IF = IS, VGS = 0 V,
Pulse test, t ≤ 300 µs, duty cycle ≤ 2%
1.5
V
Trr
QRM
IF = IS, -di/dt = 100A/µs,
VR = 100V
typ.
max.
200
ns
0.6
µC
7
A
IRM
For detailed device mounting and installation instructions, see the “Device Installation & Mounting Instructions” technical
note on the IXYSRF web site at;
http://www.ixysrf.com/pdf/switch_mode/appnotes/7de_series_mosfet_installation_instructions.pdf
IXYS RF reserves the right to change limits, test conditions and dimensions.
IXYS RF MOSFETS are covered by one or more of the following U.S. patents:
4,835,592
4,860,072
4,881,106
4,891,686
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,486,715
5,381,025
5,640,045
DE375-102N10A
RF Power MOSFET
Fig. 1
Fig. 2
Typical Transfer Characteristics
V DS = 60V, PW = 4uS
35
20
Typical Output Characteristics
Top
ID, Drain Current (A)
ID, Drain Current (A)
30
25
20
15
10
15
Bottom
7.5-10V
7V
6.5V
6V
5.5V
5V
10
5
5
0
0
5
6
7
8
9
0
10
10
50
60
50
60
Extended Typical Output Characteristics
35
14
Top
30
12
ID, Drain Currnet (A)
Gate-to-Source Voltage (V)
40
Fig. 4
Gate Charge vs. Gate-to-Source Voltage
V DS = 500V, ID = 5A
16
10
8
6
4
25
Bottom
8-10V
7.5V
7V
6.5V
6V
5.5V
5V
20
15
10
5
2
0
0
20
40
60
80
100
120
0
140
0
Gate Charge (nC)
Fig. 5
VD S vs. Capacitance
Ciss
1000
Coss
100
Crss
10
1
0
100
200
300
400
VDS Voltage
10
20
30
40
VDS, Drain-to-Source Voltage (V)
10000
Capacitance (pF)
30
VDS, Drain-to-Source Voltage (V)
VGS, Gate-to Source Voltage (V)
Fig. 3
20
500
600
700
800
DE375-102N10A
RF Power MOSFET
Fig. 6 Package Drawing
Source
Source
Gate
Drain
Source
Source
DE375-102N10A
RF Power MOSFET
DE375-0001 DE-SERIES SPICE Model
The DE-SERIES SPICE Model is illustrated in Figure 7. The model is an expansion of the SPICE level 3 MOSFET model. It includes the stray inductive terms
LG, LS and LD. Rd is the RDS(ON) of the device, Rds is the resistive leakage term.
The output capacitance, COSS, and reverse transfer capacitance, CRSS are modeled with reversed biased diodes. This provides a varactor type response necessary for a high power device model. The turn on delay and the turn off delay
are adjusted via Ron and Roff.
Figure 7 DE-SERIES SPICE Model
This SPICE model may be downloaded as a text file from the IXYSRF web site
at www.ixysrf.com/spice.htm
Net List:
.SUBCKT 102N10A 10 20 30
* TERMINALS: D G S
* 1000 Volt 10 Amp 1.2 ohm N-Channel Power MOSFET
* REV.A 05-23-00
M1 1 2 3 3 DMOS L=1U W=1U
RON 5 6 0.5
DON 6 2 D1
ROF 5 7 .1
DOF 2 7 D1
D1CRS 2 8 D2
D2CRS 1 8 D2
CGS 2 3 3.0N
RD 4 1 1.5
DCOS 3 1 D3
RDS 1 3 5.0MEG
LS 3 30 .5N
LD 10 4 1N
LG 20 5 1N
.MODEL DMOS NMOS (LEVEL=3 VTO=3.0 KP=3.8)
.MODEL D1 D (IS=.5F CJO=1P BV=100 M=.5 VJ=.6 TT=1N)
.MODEL D2 D (IS=.5F CJO=400P BV=1000 M=.4 VJ=.6 TT=400N RS=10M)
.MODEL D3 D (IS=.5F CJO=900P BV=1000 M=.3 VJ=.4 TT=400N RS=10M)
.ENDS
Doc #9200-0223-0001 Rev 2
© 2009 IXYS RF
An
IXYS Company
2401 Research Blvd., Suite 108
Fort Collins, CO USA 80526
970-493-1901 Fax: 970-493-1903
Email: [email protected]
Web: http://www.ixyscolorado.com