SECOS SSD30N06-39D

SSD30N06-39D
N-Ch Enhancement Mode Power MOSFET
30A, 60V, RDS(ON) 38 mΩ
Elektronische Bauelemente
RoHS Compliant Product
A suffix of “-C” specifies halogen free
TO-252(D-Pack)
DESCRIPTION
These miniature surface mount MOSFETs utilize a high cell density
trench process to provide low RDS(on) and to ensure minimal power loss and
heat dissipation. Typical applications are DC-DC converters and power
management in portable and battery-powered products such as computers,
printers, PCMCIA cards, cellular and cordless telephones.
FEATURES




Low RDS(on) provides higher efficiency and extends battery life
Low thermal impedance copper leadframce DPAK saves
board space
Fast switching speed
High performance trench technology
A
B
GE
PRODUCT SUMMARY
VDS(V)
60
PRODUCT SUMMARY
RDS(on) m(
38 @VGS= 10V
50 @VGS= 4.5V
C
D
K
ID(A)
M

30
26
HF
N
O
P
J
Drain

Gate
REF.
A
B
C
D
E
F
G
H

Source
Millimeter
Min.
Max.
6.4
6.8
5.20
5.50
2.20
2.40
0.45
0.58
6.8
7.3
2.40
3.0
5.40
6.2
0.8
1.20
REF.
J
K
M
N
O
P
Millimeter
Min.
Max.
2.30 REF.
0.70
0.90
0.50
1.1
0.9
1.6
0
0.15
0.43
0.58
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise specified)
PARAMETER
SYMBOL
RATINGS
UNIT
VDS
60
V
VGS
±20
V
ID @TC=25℃
19
A
IDM
40
A
IS
30
A
PD @TC=25℃
50
W
TJ, TSTG
-55 ~ 175
°C
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current
Pulsed Drain Current
a
b
Continuous Source Current (Diode Conduction)
Power Dissipation
a
a
Operating Junction and Storage Temperature Range
THERMAL RESISTANCE RATINGS
Maximum Thermal Resistance Junction-Ambient a
RθJA
50
°C / W
Maximum Thermal Resistance Junction-Case
RθJC
3.0
°C / W
Notes
a. Surface Mounted on 1” x 1” FR4 Board.
b. Pulse width limited by maximum junction temperature.
http://www.SeCoSGmbH.com/
30-Aug-2010 Rev. A
Any changes of specification will not be informed individually.
Page 1 of 4
SSD30N06-39D
N-Ch Enhancement Mode Power MOSFET
30A, 60V, RDS(ON) 38 mΩ
Elektronische Bauelemente
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise specified)
PARAMETER
SYMBOL
MIN.
TYP.
MAX. UNIT TEST CONDITIONS
Static
Gate-Source Threshold Voltage
Gate-Body Leakage
VGS(th)
1.0
-
-
IGSS
-
-
±100
-
-
1
-
-
25
34
-
-
-
-
38
-
-
50
Zero Gate Voltage Drain Current
IDSS
On-State Drain Current a
ID(ON)
Drain-Source On-Resistance a
RDS(ON)
V
VDS = VGS, ID = 250μA
nA VDS= 0V, VGS= 20V
VDS= 48V, VGS= 0V
μA
A
mΩ
VDS= 48V, VGS= 0V,
TJ= 55°C
VDS= 5V, VGS= 10V
VGS= 10V, ID= 30A
VGS= 4.5V, ID= 26A
Forward Transconductance a
gfs
-
22
-
S
VDS= 15V, ID= 30A
Diode Forward Voltage
VSD
-
1.1
-
V
IS= 24A, VGS = 0V
Dynamic b
Total Gate Charge
Qg
-
12.5
-
Gate-Source Charge
Qgs
-
2.4
-
Gate-Drain Change
Qgd
-
2.6
-
Turn-on Delay Time
Td(on)
-
11
-
Tr
-
8
-
Td(off)
-
19
-
Tf
-
6
-
Rise Time
Turn-off Delay Time
Fall Time
ID= 30 A
nC VDS= 15 V
VGS= 4.5 V
VDD= 25 V
I = 30 A
nS RD = 25 
L
VGEN= 10 V
Notes
a. Pulse test: PW ≦ 300 us duty cycle ≦ 2%.
b. Guaranteed by design, not subject to production testing.
http://www.SeCoSGmbH.com/
30-Aug-2010 Rev. A
Any changes of specification will not be informed individually.
Page 2 of 4
SSD30N06-39D
Elektronische Bauelemente
N-Ch Enhancement Mode Power MOSFET
30A, 60V, RDS(ON) 38 mΩ
CHARACTERISTICS CURVES
http://www.SeCoSGmbH.com/
30-Aug-2010 Rev. A
Any changes of specification will not be informed individually.
Page 3 of 4
SSD30N06-39D
Elektronische Bauelemente
N-Ch Enhancement Mode Power MOSFET
30A, 60V, RDS(ON) 38 mΩ
CHARACTERISTICS CURVES
http://www.SeCoSGmbH.com/
30-Aug-2010 Rev. A
Any changes of specification will not be informed individually.
Page 4 of 4