SECOS STT3470N

STT3470N
2.2 A, 100 V, RDS(ON) 280 m
N-Channel Enhancement Mode Mos.FET
Elektronische Bauelemente
RoHS Compliant Product
A suffix of “-C” specifies halogen and lead-free
DESCRIPTION
TSOP-6
These miniature surface mount MOSFETs utilize
a High Cell Density trench process to provide Low RDS(on)
and to ensure minimal power loss and heat dissipation.
Typical applications are DC-DC converters and power
management in portable and battery-powered products
such as computers, printers, PCMCIA cards, cellular
and cordless telephones.
A
E


1
2
3
C
Low RDS(on) provides higher efficiency and extend
battery life
Low thermal impedance copper leadframe TSOP-6
saves board space
Fast switching speed
High performance trench technology
H
J
K
DG
FEATURES

L
4
B
F

5
6
REF.
A
B
C
D
E
F
Millimeter
Min.
Max.
2.70
3.10
2.60
3.00
1.40
1.80
1.10 MAX.
1.90 REF.
0.30
0.50
REF.
G
H
J
K
L
Millimeter
Min.
Max.
0
0.10
0.60 REF.
0.12 REF.
0°
10°
0.95 REF.
PACKAGE INFORMATION
Package
MPQ
LeaderSize
TSOP-6
3K
7’ inch
D
D
D
D
G
S
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise specified)
Parameter
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current 1
Pulsed Drain Current 2
Continuous Source Current (Diode Conduction) 1
Power Dissipation 1
Operating Junction and Storage Temperature Range
TA= 25°C
TA= 25°C
Symbol
Ratings
Unit
VDS
VGS
ID
IDM
IS
PD
Tj, Tstg
100
±20
2.2
±10
1.1
2
-55 ~ 150
V
V
A
A
A
W
°C
Thermal Resistance Ratings
Parameter
Maximum Junction to Ambient 1
t ≦ 10 sec
Steady State
Symbol
Typ.
Max.
Unit
RJA
93
130
110
150
°C / W
Notes
1.
Surface Mounted on 1” x 1” FR4 Board.
2.
Pulse width limited by maximum junction temperature.
http://www.SeCoSGmbH.com/
30-Dec-2010 Rev. A
Any changes of specification will not be informed individually.
Page 1 of 2
STT3470N
2.2 A, 100 V, RDS(ON) 280 m
N-Channel Enhancement Mode Mos.FET
Elektronische Bauelemente
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise specified)
Parameter
Gate-Threshold Voltage
Symbol Min.
Typ. Max.
Unit
Test Conditions
VGS(th)
1
-
-
V
VDS=VGS, ID= 250uA
Gate-Body Leakage
IGSS
-
-
±100
nA
VDS= 0V, VGS= ±8V
-
-
1
Zero Gate Voltage Drain Current
IDSS
-
-
10
10
-
-
-
-
280
On-State Drain Current 1
Drain-Source On-Resistance 1
ID(on)
RDS(ON)
A
A
-
355
VDS= 80V, VGS= 0V, TJ= 55°C
VDS = 5V, VGS= 10V
mΩ
-
VDS= 80V, VGS= 0V
VGS= 10V, ID= 2.2A
VGS= 5.5V, ID= 2A
Forward Transconductance 1
gfs
-
11.3
-
S
VDS= 10V, ID= 2.2A
Diode Forward Voltage
VSD
-
0.75
-
V
IS= 1.6A, VGS= 0V
Dynamic 2
Total Gate Charge
Qg
-
7.0
-
Gate-Source Charge
Qgs
-
1.1
-
Gate-Drain Charge
Qgd
-
20
-
Turn-on Delay Time
Td(on)
-
8
-
Tr
-
24
-
Td(off)
-
35
-
Tf
-
10
-
Rise Time
Turn-off Delay Time
Fall Time
nC
VDS= 10V, VGS= 5.5V,
ID= 2.2A
nS
VDD= 10V, VGEN= 4.5V,
RL= 15, ID= 1A
Notes:
1.
Pulse test:PW ≦ 300 us duty cycle ≦ 2%.
2.
Guaranteed by design, not subject to production testing.
http://www.SeCoSGmbH.com/
30-Dec-2010 Rev. A
Any changes of specification will not be informed individually.
Page 2 of 2