SEME-LAB 2N5015X

2N5015X
2N5015SX
MECHANICAL DATA
HIGH VOLTAGE
SILICON EPITAXIAL
NPN TRANSISTOR
Dimensions in mm (inches)
8.51 (0.34)
9.40 (0.37)
7.75 (0.305)
8.51 (0.335)
6.10 (0.240)
6.60 (0.260)
0.89
max.
(0.035)
38.00
(1.5)
min.
FEATURES
0.41 (0.016)
0.53 (0.021)
dia.
•
•
•
•
•
5.08 (0.200)
typ.
2.54
(0.100)
2
1
SILICON PLANAR EPITAXIAL NPN TRANSISTOR
HIGH BREAKDOWN VOLTAGE
LOW SATURATION VOLTAGE
HERMETIC TO5 or TO39 (‘S’ Suffix) PACKAGE
HI-RELIABILITY SCREENING OPTIONS AVAILABLE
3
APPLICATIONS
0.74 (0.029)
1.14 (0.045)
For high reliability general purpose high voltage switching
and linear applications requiring small size and low weight
devices.
0.71 (0.028)
0.86 (0.034)
45°
TO5 (TO-205AA)
PIN 1 – Emitter
Underside View
PIN 2 – Base
PIN 3 – Collector
ABSOLUTE MAXIMUM RATINGS TCASE = 25°C unless otherwise stated
VCBO
VCER
VEBO
IC
Ptot
Tstg, TJ
Collector - Base Voltage
Collector - Emitter Voltage (RBE = 1.0KΩ)
Emitter – Base Voltage
Continuous Collector Current
Total Power Dissipation
Tcase = 50°C
De-rate Linearly
Tcase > 50°C
Operating and Storage Temperature Range
1000V
1000V
5V
0.5A
2W
20mW/°C
-55 to +150°C
Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be
both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab
encourages customers to verify that datasheets are current before placing orders.
Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: [email protected] Website: http://www.semelab.co.uk
DOC 7996 issue 1
2N5015X
2N5015SX
THERMAL CHARACTERISTICS
RθJC
Thermal Resistance Junction - Case
Max
50
°C/W
RθJA
Thermal Resistance Junction - Ambient
Max
175
°C/W
Min. Typ. Max.
Unit
ELECTRICAL CHARACTERISTICS (T
case
Parameter
V(BR)CBO*
Collector - Emitter Breakdown
Voltage
Collector - Base Breakdown Voltage
V(BR)EBO*
Emitter - Base Breakdown Voltage
V(BR)CER*
=25°C unless otherwise stated)
Test Conditions
IC = 100µA
RBE = 1.0KΩ
IC = 200µA
IC = 0
IE = 50µA
VCB = 760V
1000
-
-
1000
-
-
5.0
-
-
-
-
12
-
-
100
-
-
20
V
ICBO*
Collector - Base Cut-Off Current
IEBO*
Emitter - Base Cut-Off Current
VEB = 4V
VCE(sat)*
Collector - Emitter Saturation Voltage
IC = 20mA
IB = 5.0mA
-
-
1.8
VBE(sat)*
Base - Emitter Saturation Voltage
IC = 20mA
IB = 5.0mA
-
-
1.0
IC = 5mA
VCE = 10V
10
-
-
IC = 20mA
VCE = 10V
20
-
180
TCASE = -55°C
5
-
-
10
-
-
MHz
-
-
60
pF
hFE*
DC Current Gain
DYNAMIC CHARACTERISTICS (T
fT
COBO
Transition Frequency
Open Circuit Output Capacitance
TCASE = 100°C
case
µA
V
=25°C unless otherwise stated)
IC = 20mA
VCE = 10V
f = 10MHz
IE = 0
f = 1.0MHz
VCB = 10V
* Pulse test tp = 300µs, δ < 2%
Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be
both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab
encourages customers to verify that datasheets are current before placing orders.
Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: [email protected] Website: http://www.semelab.co.uk
DOC 7996 issue 1