COMSET TIC126B

SEMICONDUCTORS
TIC126A, TIC126B, TIC126C, TIC126D, TIC126E, TIC126M,
TIC126N, TIC126S
P-N-P-N SILICON REVERSE-BLOCKING TRIODE THYRISTORS
•
•
•
•
•
•
12 A Continuous On-State Current
100 A Surge-Current
Glass Passivated Wafer
100 V to 800 V Off-State Voltage
Max IGT of 20 mA
Compliance to ROHS
ABSOLUTE MAXIMUM RATINGS
Symbol
Value
Ratings
A
B
C
D
E
Unit
M
S
N
Repetitive peak off-state voltage
100 200 300 400 500 600 700 800
(see Note1)
Repetitive peak reverse voltage
100 200 300 400 500 600 700 800
Continuous on-state current at (or below)
12
70°C case temperature (see note2)
Average on-state current (180° conduction
7.5
angle) at(or below) 70°C case temperature
(see Note3)
Surge on-state current (see Note4)
100
Peak positive gate current (pulse width
3
≤300 µs)
Peak power dissipation (pulse width ≤300
5
µs)
Average gate power dissipation (see
1
Note5)
Operating case temperature range
-40 to +110
Storage temperature range
-40 to +125
Lead temperature 1.6 mm from case for 10
230
seconds
VDRM
VRRM
IT(RMS)
IT(AV)
ITM
IGM
PGM
PG(AV)
TC
Tstg
TL
Notes:
1.
2.
3.
4.
5.
These values apply when the gate-cathode resistance RGK = 1kΩ
These values apply for continuous dc operation with resistive load. Above 70°C derate linearly to
zero at 110°C.
This value may be applied continuously under single phase 50 Hz half-sine-wave operation with
resistive load. Above 70°C derate linearly to zero at 110°C.
This value applies for one 50 Hz half-sine-wave when the device is operating at (or below) the rated
value of peak reverse voltage and on-state current. Surge may be repeated after the device has
returned to original thermal equilibrium.
This value applies for a maximum averaging time of 20 ms.
Page 1 of 3
V
V
A
A
A
A
W
W
°C
°C
°C
SEMICONDUCTORS
TIC126A, TIC126B, TIC126C, TIC126D, TIC126E, TIC126M,
TIC126N, TIC126S
THERMAL CHARACTERISTICS
Symbol
tgt
tq
Ratings
Gate-controlled
Turn-on time
Circuit-communicated
Turn-off time
Value
VAA = 30 V, RL = 6 Ω,
RGK(eff) = 100 Ω, Vin = 20 V
0.8
VAA = 30 V, RL = 6 Ω, IRM ≈ 10 A
11
Unit
µs
≤ 2.4
≤ 62.5
R∂JC
R∂JA
°C/W
ELECTRICAL CHARACTERISTICS
TC=25°C unless otherwise noted
Symbol
Ratings
Test Condition(s)
IDRM
Repetitive peak off-state current
IRRM
Repetitive peak reverse current
IGT
Gate trigger current
VGT
IH
Gate trigger voltage
Holding current
VD = Rated VDRM, RGK = 1 kΩ,
TC = 110°C
VR = Rated VRRM, IG = 0,
TC = 110°C
VAA = 6 V, RL = 100 Ω,
tp(g) ≥ 20µs
VAA = 6 V, RL = 100 Ω,
RGK = 1 kΩ, tp(g) ≥ 20µs,
TC = -40°C
VAA = 6 V, RL = 100 Ω,
RGK = 1 kΩ, tp(g) ≥ 20µs,
VAA = 6 V, RL = 100 Ω,
RGK = 1 kΩ, tp(g) ≥ 20µs,
TC = 110°C
VAA = 6 V, RGK = 1 kΩ,
initiating IT = 100 mA
VTM
Peak on-state voltage
VAA = 6 V, RGK = 1 kΩ,
initiating IT = 100 mA,
TC = -40°C
ITM = 8A (see Note6)
dv/dt
Critical rate of rise of off-state
voltage
VD = Rated VD,
TC = 110°C
Min Typ Mx Unit
-
-
2
mA
-
-
2
mA
-
5
20
mA
-
-
2.5
-
0.8
1.5
0.2
-
-
-
-
40
mA
-
-
70
-
-
1.4
V
-
100
-
V/µs
Note 6:
This parameters must be measured using pulse techniques, tW = 300µs, duty cycle ≤ 2 %, voltage-sensing
contacts, separate from the courrent-carrying contacts, are located within 3.2mm (1/8 inch) from de device body.
Page 2 of 3
V
SEMICONDUCTORS
TIC126A, TIC126B, TIC126C, TIC126D, TIC126E, TIC126M,
TIC126N, TIC126S
MECHANICAL DATA CASE TO-220
Pin 1 :
Pin 2 :
Pin 3 :
Page 3 of 3
kathode
Anode
Gate