Gunter Semiconductor GmbH GFCG30 N Channel High Voltage, power MOSFET with low RDS(on) Chip Specification General Description: * Advanced Process Technology * Dynamic dV/dt Rating * 150℃ ℃ Operating Temperature * Fast Switching * Fully Avalanche Rated * Low RDS(on) Mechanical Data: D17 4.42mm x 5.23mm Dimension 480 µm Thickness: Metallization: Al Top : : CrNiAg / Au Backside : Suggested Bonding Conditions: Die Mounting: Solder Perform 95/5 PbSn or 92.5./2.5/5 PbAgIn Source Bonding Wire: 10 mil Al Absolute Maximum Rating Characteristics @Ta=25℃ ℃ Symbol Limit Unit Test Conditions Drain-to-Source Breakdown Voltage V(BR)DSS 1000 V VGS=0V, ID=250µΑ Static Drain-to - Source On-resistance RDS(ON) 5.6 Ω VGS=10V, ID=1.9Α Continuous Drain current ( in target package) ID@25℃ 3.1 A VGS=10V Continuous Drain current ( in target package) ID@100℃ 2 A VGS=10V Tj -55~150 ℃ TSTR -55~150 ℃ PD 125 W Operation Junction Storage Temperature Target Device: IRFBG30 TO-220AB @Tc=25℃