SSM4800AGM N-Channel Enhancement Mode PPower Mosfet PRODUCT SUMMARY P Simple Drive Requirement Low On-resistance Fast Switching Characteristic RoHS Compliant D D D D G BVDSS RDS(ON) 30V 18mΩ ID 9.4A S SO-8 S S DESCRIPTION D The Advanced Power MOSFETs from Silicon Standard provide the designer with the best combination of fast switching, ruggedized device design, low on-resistance and cost-effectiveness. G S The SO-8 package is universally preferred for all commercial-industrial surface mount applications and suited for low voltage applications such as DC/DC converters. Pb-free; RoHS-compliant ABSOLUTE MAXIMUM RATINGS Parameter Symbol VDS Drain-Source Voltage VGS Gate-Source Voltage ID@TA=25℃ ID@TA=70℃ Rating Units 30 V ±25 V 3 9.4 A 3 7.5 A Continuous Drain Current Continuous Drain Current 1 IDM Pulsed Drain Current 40 A PD@TA=25℃ Total Power Dissipation 2.5 W Linear Derating Factor 0.02 W/℃ TSTG Storage Temperature Range -55 to 150 ℃ TJ Operating Junction Temperature Range -55 to 150 ℃ THERMAL Thermal DATA Data Symbol Rthj-a 02/09/2007 Rev.1.00 D Parameter Thermal Resistance Junction-ambient 3 Max. Value Unit 50 ℃/W www.SiliconStandard.com 1 2 SSM4800AGM ELECTRICAL CHARACTERISTICS o J Electrical Characteristics@Tj=25oC(unless otherwise specified) @T = 25 C ( unless otherwise specified ) Symbol Parameter Test Conditions Min. Typ. 30 - - V - 0.02 - V/℃ VGS=10V, ID=9A - 14 18 mΩ VGS=4.5V, ID=7A - 18 30 mΩ Gate Threshold Voltage VDS=VGS, ID=250uA 1 - 3 V gfs Forward Transconductance VDS=10V, ID=9A - 16 - S IDSS Drain-Source Leakage Current (Tj=25oC) VDS=30V, VGS=0V - - 1 uA Drain-Source Leakage Current (Tj=70oC) VDS=24V, VGS=0V - - 25 uA Gate-Source Leakage VGS=±25V - - ±100 nA ID=9A - 7 12 nC BVDSS Drain-Source Breakdown Voltage ΔBVDSS/ΔTj Breakdown Voltage Temperature Coefficient Reference to 25℃, ID=1mA RDS(ON) VGS(th) IGSS VGS=0V, ID=250uA Static Drain-Source On-Resistance 2 2 Max. Units Qg Total Gate Charge Qgs Gate-Source Charge VDS=20V - 1 - nC Qgd Gate-Drain ("Miller") Charge VGS=4.5V - 4.5 - nC VDS=15V - 7 - ns 2 td(on) Turn-on Delay Time tr Rise Time ID=1A - 8 - ns td(off) Turn-off Delay Time RG=3.3Ω,VGS=10V - 18 - ns tf Fall Time RD=15Ω - 8 - ns Ciss Input Capacitance VGS=0V - 420 670 pF Coss Output Capacitance VDS=25V - 210 - pF Crss Reverse Transfer Capacitance f=1.0MHz - 70 - pF Rg Gate Resistance f=1.0MHz - 3.5 5 Ω Min. Typ. SOURCE-DRAIN DIODE Source-Drain Diode Symbol Parameter Test Conditions 2 Max. Units VSD Forward On Voltage IS=1.9A, VGS=0V - - 1.3 V trr Reverse Recovery Time IS=9A, VGS=0V, - 25 - ns Qrr Reverse Recovery Charge dI/dt=100A/µs - 15 - nC Notes: 1.Pulse width limited by Max. junction temperature. 2.Pulse width <300us , duty cycle <2%. 3.Surface mounted on 1 in2 copper pad of FR4 board, t <10sec ; 125oC/W when mounted on Min. copper pad. 02/09/2007 Rev.1.00 www.SiliconStandard.com 2 SSM4800AGM 50 50 10V 7.0 V 5.0 V 4.5 V T A =25 C ID , Drain Current (A) 40 40 30 V G = 3.0 V 20 10 30 V G = 3.0 V 20 10 0 0 0 2 4 0 6 V DS , Drain-to-Source Voltage (V) 2 4 6 V DS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 1.8 37 ID=9A V G =10V ID=7A T A =25 ℃ Normalized RDS(ON) 32 RDS(ON) (mΩ) 10V 7.0 V 5.0 V 4.5 V o T A = 150 C ID , Drain Current (A) o 27 22 1.4 1.0 17 12 0.6 2 4 6 8 10 -50 V GS , Gate-to-Source Voltage (V) 0 50 100 150 T j , Junction Temperature ( o C) Fig 3. On-Resistance v.s. Gate Voltage Fig 4. Normalized On-Resistance v.s. Junction Temperature 10 1.4 8 Normalized VGS(th) (V) 1.2 IS(A) 6 T j =150 o C T j =25 o C 4 2 1.0 0.8 0.6 0 0 0.2 0.4 0.6 0.8 1 V SD , Source-to-Drain Voltage (V) Fig 5. Forward Characteristic of Reverse Diode 02/09/2007 Rev.1.00 1.2 -50 0 50 100 150 T j , Junction Temperature ( o C) Fig 6. Gate Threshold Voltage v.s. Junction Temperature www.SiliconStandard.com 3/4 3 SSM4800AGM AP4800AGM f=1.0MHz 1000 16 C iss V DS = 25 V V DS = 20 V V DS = 15 V 12 C oss C (pF) VGS , Gate to Source Voltage (V) ID=9A 8 100 C rss 4 0 10 0 5 10 15 1 5 Q G , Total Gate Charge (nC) 9 13 17 21 25 29 V DS , Drain-to-Source Voltage (V) Fig 7. Gate Charge Characteristics Fig 8. Typical Capacitance Characteristics 1 100 Normalized Thermal Response (Rthja) Duty factor=0.5 100us 10 ID (A) 1ms 10ms 1 100ms 1s 0.1 o T A =25 C Single Pulse DC 0.01 0.2 0.1 0.1 0.05 0.02 PDM 0.01 t 0.01 T Single Pulse Duty factor = t/T Peak Tj = PDM x Rthja + T a Rthia=125 ℃/W 0.001 0.1 1 10 100 0.0001 0.001 0.01 0.1 1 10 100 t , Pulse Width (s) V DS , Drain-to-Source Voltage (V) Fig 9. Maximum Safe Operating Area Fig 10. Effective Transient Thermal Impedance 60 VG V DS =5V ID , Drain Current (A) QG 40 o 4.5V o T j =25 C T j =125 C QGS QGD 20 Charge Q 0 0 2 4 6 V GS , Gate-to-Source Voltage (V) Fig 11. Transfer Characteristics 02/09/2007 Rev.1.00 Fig 12. Gate Charge Waveform www.SiliconStandard.com 4 4/4 SSM4800AGM Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no guarantee or warranty, expressed or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of Silicon Standard Corporation or any third parties. 02/09/2007 Rev.1.00 www.SiliconStandard.com 5