SSM9922(G)EO DUAL N-CHANNEL ENHANCEMENT-MODE POWER MOSFETS Low on-resistance Capable of 2.5V gate drive G2 S2 Ideal for DC/DC battery applications D2 BV DSS 20V RDS(ON) 15mΩ 6.8A ID S2 TSSOP-8 S1 G1 S1 D1 Description D1 Power MOSFETs from Silicon Standard provide the designer with the best combination of fast switching, ruggedized device design, ultra low on-resistance and cost-effectiveness. G1 D2 G2 S1 S2 This device is available with Pb-free lead finish (second-level interconnect) as SSM9922GEO. Absolute Maximum Ratings Parameter Symbol Rating Units VDS Drain-Source Voltage 20 V VGS Gate-Source Voltage ±12 V 3 ID @ TA=25°C Drain Current , VG S @ 4.5V 6.8 A ID @ TA=70°C 3 5.4 A Drain Current , VGS @ 4.5V 1 IDM Pulsed Drain Current 25 A PD @ TA=25°C Total Power Dissipation 1 W Linear Derating Factor 0.008 W/°C TSTG Storage Temperature Range -55 to 150 °C TJ Operating Junction Temperature Range -55 to 150 °C Thermal Data Symbol Rthj-a Rev.2.01 12/06/2004 Parameter Thermal Resistance Junction-ambient 3 www.SiliconStandard.com Max. Value Unit 125 °C/W 1 of 5 SSM9922(G)EO Electrical Characteristics @ Tj=25oC (unless otherwise specified) Symbol Parameter Test Conditions Typ. Max. Units 20 - - V BVDSS Drain-Source Breakdown Voltage ∆ BV DSS/ ∆ Tj Breakdown Voltage Temperature Coefficient Reference to 25°C, ID=1mA - 0.05 - V/°C RDS(ON) Static Drain-Source On-Resistance 2 VGS=4.5V, ID=6A - - 15 mΩ VGS=2.5V, ID=4A - - 20 mΩ VDS=VGS, ID=1mA 0.5 - 1.2 V VGS(th) Gate Threshold Voltage gfs Forward Transconductance IDSS VDS=4.5V, ID=6A - 22 - S o VDS=20V, VGS=0V - - 25 uA o Drain-Source Leakage Current (Tj=70 C) VDS=16V ,VGS=0V - - 100 uA Gate-Source Leakage VGS=±12V - - ±10 uA ID=6A - 25 40 nC Drain-Source Leakage Current (Tj=25 C) IGSS VGS=0V, ID=250uA Min. 2 Qg Total Gate Charge Qgs Gate-Source Charge VDS=16V - 3 - nC Qgd Gate-Drain ("Miller") Charge VGS=4.5V - 9 - nC 2 td(on) Turn-on Delay Time VDS=15V - 11 - ns tr Rise Time ID=1A - 12 - ns td(off) Turn-off Delay Time RG=3.3Ω , VGS=4.5V - 47 - ns tf Fall Time RD=15Ω - 23 - ns Ciss Input Capacitance VGS=0V - 1730 2770 pF Coss Output Capacitance VDS=20V - 280 - pF Crss Reverse Transfer Capacitance f=1.0MHz - 240 - pF Rg Gate Resistance f=1.0MHz - 2.2 - Ω Min. Typ. IS=0.84A,VGS=0V - - 1.2 V Source-Drain Diode Symbol VSD Parameter Forward On Voltage 2 2 Test Conditions Max. Units trr Reverse Recovery Time IS=6A, VGS=0V, - 24 - ns Qrr Reverse Recovery Charge dI/dt=100A/µs - 18 - nC Notes: 1.Pulse width limited by max. junction temperature. 2.Pulse width <300us , duty cycle <2%. 2 3.Surface mounted on 1 in copper pad of FR4 board ; 208°C/W when mounted on min. copper pad. Rev.2.01 12/06/2004 www.SiliconStandard.com 2 of 5 SSM9922(G)EO 50 50 5.0V 4.5V 3.5V 2.5V T A =25 C ID , Drain Current (A) 40 40 30 V G =1.8V 20 30 V G =1.8V 20 10 10 0 0 0 1 1 2 2 0 3 V DS , Drain-to-Source Voltage (V) 1 1 2 2 3 V DS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 35 1.6 ID=4A T A =25°C ID=6A V G = 4.5 V 1.4 Normalized R DS(ON) 30 RDS(ON) (mΩ ) 5.0V 4.5V 3.5V 2.5V o T A = 150 C ID , Drain Current (A) o 25 20 1.2 1.0 0.8 15 0.6 10 0 2 4 6 8 10 -50 12 0 50 100 150 T j , Junction Temperature ( o C) V GS , Gate-to-Source Voltage (V) Fig 3. On-Resistance vs. Gate Voltage Fig 4. Normalized On-Resistance vs. Junction Temperature 2.0 6 5 Normalized VGS(th) (V) 1.5 IS(A) 4 3 T j =150 o C 2 T j =25 o C 1.0 0.5 1 0 0.0 0 0.2 0.4 0.6 0.8 1 -50 0 Fig 5. Forward Characteristic of Reverse Diode Rev.2.01 12/06/2004 50 100 150 T j , Junction Temperature ( o C) V SD , Source-to-Drain Voltage (V) Fig 6. Gate Threshold Voltage vs. Junction Temperature www.SiliconStandard.com 3 of 5 SSM9922(G)EO f=1.0MHz 10000 12 VGS , Gate to Source Voltage (V) ID=6A V DS = 10 V V DS = 12 V V DS = 16 V C iss C (pF) 9 1000 6 3 C oss C rss 100 0 0 10 20 30 40 50 1 60 5 Q G , Total Gate Charge (nC) 9 13 17 21 25 V DS , Drain-to-Source Voltage (V) Fig 7. Gate Charge Characteristics Fig 8. Typical Capacitance Characteristics 1 100 Normalized Thermal Response (Rthja) Duty factor=0.5 100us 1ms 10 ID (A) 10ms 1 100ms 1s 0.1 T A =25 o C Single Pulse DC 0.2 0.1 0.1 0.05 0.02 0.01 PDM t 0.01 T Single Pulse Duty factor = t/T Peak Tj = PDM x Rthja + Ta Rthja=208°C/W 0.001 0.0001 0.01 0.1 1 10 0.0010 0.0100 100 Fig 9. Maximum Safe Operating Area 0.1000 1.0000 10.0000 100.0000 t , Pulse Width (s) V DS , Drain-to-Source Voltage (V) Fig 10. Effective Transient Thermal Impedance VG VDS 90% QG 4.5V QGS QGD 10% VGS td(on) tr td(off) tf Fig 11. Switching Time Waveform Rev.2.01 12/06/2004 Charge Q Fig 12. Gate Charge Waveform www.SiliconStandard.com 4 of 5 SSM9922(G)EO Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no guarantee or warranty, express or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of Silicon Standard Corporation or any third parties. Rev.2.01 12/06/2004 www.SiliconStandard.com 5 of 5