54F/74F280 9-Bit Parity Generator/Checker General Description Features The ’F280 is a high-speed parity generator/checker that accepts nine bits of input data and detects whether an even or an odd number of these inputs is HIGH. If an even number of inputs is HIGH, the Sum Even output is HIGH. If an odd number is HIGH, the Sum Even output is LOW. The Sum Odd output is the complement of the Sum Even output. Y Commercial Guaranteed 4000V minimum ESD protection Package Number Military Package Description N14A 14-Lead (0.300× Wide) Molded Dual-In-Line J14A 14-Lead Ceramic Dual-In-Line 74F280SC (Note 1) M14A 14-Lead (0.150× Wide) Molded Small Outline, JEDEC 74F280SJ (Note 1) M14D 14-Lead (0.300× Wide) Molded Small Outline, EIAJ 54F280FM (Note 2) W14B 14-Lead Cerpack 54F280LM (Note 2) E20A 20-Lead Ceramic Leadless Chip Carrier, Type C 74F280PC 54F280DM (Note 2) Note 1: Devices also available in 13× reel. Use suffix e SCX and SJX. Note 2: Military grade device with environmental and burn-in processing. Use suffix e DMQB, FMQB and LMQB. Logic Symbols Connection Diagrams Pin Assignment for DIP, SOIC and Flatpak Pin Assignment for LCC TL/F/9512–3 IEEE/IEC TL/F/9512 – 1 TL/F/9512 – 2 TL/F/9512–5 TRI-STATEÉ is a registered trademark of National Semiconductor Corporation. C1995 National Semiconductor Corporation TL/F/9512 RRD-B30M115/Printed in U. S. A. 54F/74F280 9-Bit Parity Generator/Checker August 1995 Unit Loading/Fan Out 54F/74F Pin Names I0 – I 8 RO RE Description U.L. HIGH/LOW Input IIH/IIL Output IOH/IOL Data Inputs Odd Parity Output Even Parity Output 1.0/1.0 50/33.3 50/33.3 20 mA/b0.6 mA b 1 mA/20 mA b 1 mA/20 mA Truth Table Number of HIGH Inputs I0 – I8 Outputs R Even R Odd H L L H 0, 2, 4, 6, 8 1, 3, 5, 7, 9 H e HIGH Voltage Level L e LOW Voltage Level Logic Diagram TL/F/9512 – 4 Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. 2 Absolute Maximum Ratings (Note 1) Recommended Operating Conditions If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications. Storage Temperature b 65§ C to a 150§ C Ambient Temperature under Bias Junction Temperature under Bias Plastic b 55§ C to a 125§ C Free Air Ambient Temperature Military Commercial b 55§ C to a 125§ C 0§ C to a 70§ C Supply Voltage Military Commercial b 55§ C to a 175§ C b 55§ C to a 150§ C a 4.5V to a 5.5V a 4.5V to a 5.5V VCC Pin Potential to Ground Pin b 0.5V to a 7.0V b 0.5V to a 7.0V Input Voltage (Note 2) b 30 mA to a 5.0 mA Input Current (Note 2) Voltage Applied to Output in HIGH State (with VCC e 0V) b 0.5V to VCC Standard Output b 0.5V to a 5.5V TRI-STATEÉ Output Current Applied to Output in LOW State (Max) twice the rated IOL (mA) ESD Last Passing Voltage (Min) 4000V Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. DC Electrical Characteristics Symbol 54F/74F Parameter Min VIH Input HIGH Voltage VIL Input LOW Voltage VCD Input Clamp Diode Voltage VOH Output HIGH Voltage 54F 10% VCC 74F 10% VCC 74F 5% VCC VOL Output LOW Voltage 54F 10% VCC 74F 10% VCC IIH Input HIGH Current IBVI Typ Units VCC Conditions Max 2.0 V Recognized as a HIGH Signal 0.8 V b 1.2 V Min IIN e b18 mA V Min IOH e b1 mA IOH e b1 mA IOH e b1 mA 0.5 0.5 V Min IOL e 20 mA IOL e 20 mA 54F 74F 20.0 5.0 mA Max VIN e 2.7V Input HIGH Current Breakdown Test 54F 74F 100 7.0 mA Max VIN e 7.0V ICEX Output HIGH Leakage Current 54F 74F 250 50 mA Max VOUT e VCC VID Input Leakage Test V 0.0 IID e 1.9 mA All Other Pins Grounded IOD Output Leakage Circuit Current 3.75 mA 0.0 VIOD e 150 mV All Other Pins Grounded IIL Input LOW Current IOS Output Short-Circuit Current ICCH Power Supply Current 74F 2.5 2.5 2.7 4.75 74F b 60 25 3 Recognized as a LOW Signal b 0.6 mA Max VIN e 0.5V b 150 mA Max VOUT e 0V 38 mA Max VO e HIGH AC Electrical Characteristics Symbol Parameter 74F 54F 74F TA e a 25§ C VCC e a 5.0V CL e 50 pF TA, VCC e Mil CL e 50 pF TA, VCC e Com CL e 50 pF Units Min Typ Max Min Max Min Max tPLH tPHL Propagation Delay In to RE 6.5 6.5 10.0 11.0 15.0 16.0 6.5 6.5 20.0 21.0 6.5 6.5 16.0 17.0 ns tPLH tPHL Propagation Delay In to RO 6.0 6.5 10.0 11.0 15.0 16.0 5.0 6.5 20.0 21.0 6.0 6.5 16.0 17.0 ns Ordering Information The device number is used to form part of a simplified purchasing code where the package type and temperature range are defined as follows: 74F 280 S Temperature Range Family 74F e Commercial 54F e Military C X Special Variations QB e Military grade device with environmental and burn-in processing X e Devices shipped in 13× reel Device Type Package Code P e Plastic DIP D e Ceramic DIP F e Flatpak L e Leadless Chip Carrier (LCC) S e Small Outline SOIC JEDEC SJ e Small Outline SOIC EIAJ Temperature Range C e Commercial (0§ C to a 70§ C) M e Military (b55§ C to a 125§ C) 4 Physical Dimensions inches (millimeters) 20-Lead Ceramic Leadless Chip Carrier (L) NS Package Number E20A 5 Physical Dimensions inches (millimeters) (Continued) 14-Lead Ceramic Dual-In-Line Package (D) NS Package Number J14A 14-Lead (0.150× Wide) Molded Small Outline Package, JEDEC (S) NS Package Number M14A 6 Physical Dimensions inches (millimeters) (Continued) 14-Lead (0.300× Wide) Molded Small Outline Package, EIAJ (SJ) NS Package Number M14D 14-Lead (0.300× Wide) Molded Dual-In-Line Package (P) NS Package Number N14A 7 54F/74F280 9-Bit Parity Generator/Checker Physical Dimensions inches (millimeters) (Continued) 14-Lead Ceramic Flatpak (F) NS Package Number W14B LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. National Semiconductor Corporation 1111 West Bardin Road Arlington, TX 76017 Tel: 1(800) 272-9959 Fax: 1(800) 737-7018 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 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