TI SN65LVDS94DGGRG4

SN65LVDS94
www.ti.com
SLLS298F – MAY 1998 – REVISED JANUARY 2006
LVDS SERDES RECEIVER
FEATURES
•
•
•
•
•
•
•
•
•
•
•
•
•
•
4:28 Data Channel Expansion at up to 1.904
Gigabits per Second Throughput
Suited for Point-to-Point Subsystem
Communication With Very Low EMI
4 Data Channels and Clock Low-Voltage
Differential Channels in and 28 Data and
Clock Out Low-Voltage TTL Channels Out
Operates From a Single 3.3-V Supply and
250 mW (Typ)
5-V Tolerant SHTDN Input
Rising Clock Edge Triggered Outputs
Bus Pins Tolerate 4-kV HBM ESD
Packaged in Thin Shrink Small-Outline
Package With 20 Mil Terminal Pitch
Consumes <1 mW When Disabled
Wide Phase-Lock Input Frequency Range
20 MHz to 68 MHz
No External Components Required for PLL
Meets or Exceeds the Requirements of ANSI
EIA/TIA-644 Standard
Industrial Temperature Qualified
TA = -40°C to 85°C
Replacement for the DS90CR286
DGG PACKAGE
(TOP VIEW)
D22
D23
D24
GND
D25
D26
D27
LVDSGND
A0M
A0P
A1M
A1P
LVDSVCC
LVDSGND
A2M
A2P
CLKINM
CLKINP
A3M
A3P
LVDSGND
PLLGND
PLLVCC
PLLGND
SHTDN
CLKOUT
D0
GND
1
56
2
55
3
54
4
53
5
52
6
51
7
50
8
49
9
48
10
47
11
46
12
45
13
44
14
43
15
42
16
41
17
40
18
39
19
38
20
37
21
36
22
35
23
34
24
33
25
32
26
31
27
30
28
29
VCC
D21
D20
D19
GND
D18
D17
D16
VCC
D15
D14
D13
GND
D12
D11
D10
VCC
D9
D8
D7
GND
D6
D5
D4
D3
VCC
D2
D1
DESCRIPTION
The SN65LVDS94 LVDS serdes (serializer/deserializer) receiver contains four serial-in 7-bit parallel-out shift
registers, a 7× clock synthesizer, and five low-voltage differential signaling (LVDS) line receivers in a single
integrated circuit. These functions allow receipt of synchronous data from a compatible transmitter, such as the
SN65LVDS93 and SN65LVDS95, over five balanced-pair conductors and expansion to 28 bits of single-ended
LVTTL synchronous data at a lower transfer rate.
When receiving, the high-speed LVDS data is received and loaded into registers at the rate seven times the
LVDS input clock (CLKIN). The data is then unloaded to a 28-bit wide LVTTL parallel bus at the CLKIN rate. A
phase-locked loop clock synthesizer circuit generates a 7× clock for internal clocking and an output clock for the
expanded data. The SN65LVDS94 presents valid data on the rising edge of the output clock (CLKOUT).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1998–2006, Texas Instruments Incorporated
SN65LVDS94
www.ti.com
SLLS298F – MAY 1998 – REVISED JANUARY 2006
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
DESCRIPTION (CONTINUED)
The SN65LVDS94 requires only five line termination resistors for the differential inputs and little or no control.
The data bus appears the same at the input to the transmitter and output of the receiver with the data
transmission transparent to the user(s). The only user intervention is the possible use of the shutdown/clear
(SHTDN) active-low input to inhibit the clock and shut off the LVDS receivers for lower power consumption. A low
level on this signal clears all internal registers to a low level.
The SN65LVDS94 is characterized for operation over ambient air temperatures of -40°C to 85°C.
FUNCTIONAL BLOCK DIAGRAM
Serial-In/Parallel-Out
Shift Register
A0P
Serial In
A,B, ...G
A0M
CLK
Serial-In/Parallel-Out
Shift Register
A1P
Serial In
A,B, ...G
A1M
CLK
Serial-In/Parallel-Out
Shift Register
A2P
Serial In
A,B, ...G
A2M
CLK
Serial-In/Parallel-Out
Shift Register
A3P
Serial In
A,B, ...G
A3M
CLK
Control Logic
SHTDN
D0
D1
D2
D3
D4
D6
D7
D8
D9
D12
D13
D14
D15
D18
D19
D20
D21
D22
D24
D25
D26
D27
D5
D10
D11
D16
D17
D23
7× Clock/PLL
CLK
CLKINP
Clock In
Clock Out
CLKINM
2
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CLKOUT
SN65LVDS94
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SLLS298F – MAY 1998 – REVISED JANUARY 2006
CLKIN
Previous Cycle
Current Cycle
A0
Next Cycle
D7
D6
D4
D3
D2
D1
D0
D7+1
D18
D15
D14
D13
D12
D9
D8
D18+1
D26
D25
D24
D22
D21
D20
D19
D26+1
D23
D17
D16
D11
D10
D5
D27
D23+1
D0-1
A1
D86-1
A2
D19-1
A3
D27-1
CLKOUT
Dn
Dn-1
Dn
Dn+1
Figure 1. SN65LVDS94 Load and Shift Sequences
EQUIVALENT INPUT AND OUTPUT SCHEMATIC DIAGRAMS
VCC
300 kΩ
VCC
300 kΩ
50 Ω
AnP
AnM
50 Ω
D Output
SHTDN
7V
7V
VCC
7V
7V
300 kΩ
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SN65LVDS94
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SLLS298F – MAY 1998 – REVISED JANUARY 2006
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature (unless otherwise noted)
(1)
UNIT
VCC (2)
Supply voltage range
-0.3 V to 4 V
Voltage range at any terminal (except SHTDN)
-0.5 V to VCC + 0.5 V
Voltage range at SHTDN terminal
-0.5 V to VCC + 3 V
Electrostatic discharge (3)
Bus pins (Class 3A)
4 KV
Bus pins (Class 2B)
200 V
All pins (Class 3A)
3 KV
All pins (Class 2B)
200 V
Continuous total power dissipation
(see Dissipation Rating Table)
TA
Operating free-air temperature range
-40°C to 85°C
Tstg
Storage temperature range
-65°C to 150°C
Lead temperature 1,6 mm (1/16 inch) from case for 10
seconds
(1)
(2)
(3)
260°C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values are with respect to the GND terminals unless otherwise noted.
This rating is measured using MIL-STD-883C Method, 3015.7.
DISSIPATION RATING TABLE
(1)
PACKAGE
TA≤ 25°C
POWER RATING
DERATING FACTOR (1)
ABOVE TA = 25°C
TA = 70°C
POWER RATING
TA = 85°C
POWER RATING
DGG
1377 mW
11 mW/°C
882 mW
717 mW
This is the inverse of the junction-to-ambient thermal resistance when board-mounted and with no air flow.
RECOMMENDED OPERATING CONDITIONS
MIN
NOM
MAX
VCC
Supply voltage
3
3.3
3.6
VIH
High-level input voltage (SHTDN)
2
VIL
Low-level input voltage (SHTDN)
|VID|
Magnitude of differential input voltage
VIC, see
Figure 2 and
Figure 3
Common-mode input voltage
TA
Operating free-air temperature
UNIT
0.8
0.1
V 0.6
V
V ID
2
2.4 ID
2
VCC-0.8
-40
85
°C
TIMING REQUIREMENTS
tc (1)
(1)
4
Input clock period
tc is defined as the mean duration of a minimum of 32,000 clock periods.
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MIN
NOM
MAX
14.7
tc
50
UNIT
ns
SN65LVDS94
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SLLS298F – MAY 1998 – REVISED JANUARY 2006
ELECTRICAL CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP (1)
MAX
UNIT
VIT+
Positive-going differential input voltage threshold
VIT-
Negative-going differential input voltage
threshold (2)
VOH
High-level output voltage
IOH = -4 mA
VOL
Low-level output voltage
IOL = 4 mA
0.4
V
Disabled, all inputs open
280
µA
84
mA
ICC
Quiescent current (average)
100
mV
-100
2.4
V
Enabled, AnP at 1 V and AnM at 1.4
V,
tc = 15.38 ns
62
Enabled, CL = 8 pF (5 places),
Worst-case pattern, see Figure 4,
tc = 15.38 ns
107
mA
IIH
High-level input current (SHTDN)
VIH = VCC
±20
µA
IIL
Low-level input current (SHTDN)
VIL = 0 V
±20
µA
IIN
Input current (A and CLKIN inputs)
0 V ≤ VI≤ 2.4 V
±20
µA
IOZ
High-impedance output current
VO = 0 V or VCC
±10
µA
(1)
(2)
All typical values are VCC = 3.3 V, TA = 25°C.
The algebraic convention, in which the less-positive (more-negative) limit is designated minimum, is used in this data sheet for the
negative-going input voltage threshold only.
SWITCHING CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
PARAMETER
Data setup time, D0 through D27 to
CLKOUT
tsu
MIN TYP (1) MAX
TEST CONDITIONS
CL = 8 pF
4
6
4
6
TA = 0°C to 85°C
490
800
TA = -40°C to 0°C
390
See Figure 5
th
Data hold time, CLKOUT to D0 through
D27
tRSKM
Receiver input skew margin (1), see
Figure 6
tc = 15.38 ns (±0.2%),
|Input clock jitter| <50 ps (2)
td
Delay time, input clock to output clock, see
Figure 6
tc = 15.38 ns (±0.2%)
∆tC(O)
tc = 15.38 + 0.75 sin (2π500E3t)±0.05 ns,
Change in output clock period from cycle to See Figure 7
cycle (3)
tc = 15.38 + 0.75 sin (2≠3E6t) ±0.05 ns,
See Figure 7
UNIT
ns
3.7
ps
ns
±80
ps
±300
ten
Enable time, SHTDN to phase lock
See Figure 8
1
ms
tdis
Disable time, SHTDN to Off state
See Figure 9
400
ns
tt
Output transition time (tr or tf)
CL = 8 pF
3
ns
tw
Output clock pulse duration
0.43 tc
ns
(1)
(2)
(3)
tc
–tsh.
tRSKM is the timing margin available to allocate to the transmitter and interconnection skews and clock jitter. It is defined by 14
|Input clock jitter| is the magnitude of the change in the input clock period.
∆tC(O) is the change in the output clock period from one cycle to the next cycle observed over 15,000 cycles.
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SN65LVDS94
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SLLS298F – MAY 1998 – REVISED JANUARY 2006
PARAMETER MEASUREMENT INFORMATION
AP
VID
(VIAP + VIAM)/2
AM
VIAP
VIC
VIAM
Figure 2. Voltage Definitions
COMMON-MODE INPUT VOLTAGE
vs
DIFFERENTIAL INPUT VOLTAGE AND VCC
2.5
VIC – Common-Mode Input Voltage – V
MAX at >3.15 V
MAX at 3 V
2
1.5
1
0.5
MIN
0
0
0.1
0.2
0.3
0.4
0.5
0.6
|VID|– Differential Input Voltage and VCC – V
Figure 3. Recommended VIC Versus VID and VCC
6
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SN65LVDS94
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SLLS298F – MAY 1998 – REVISED JANUARY 2006
PARAMETER MEASUREMENT INFORMATION (continued)
T
CLKIN/
CLKOUT
EVEN Dn
ODD Dn
Figure 4. Worst-Case Power Test Pattern
tsu
VOH
70%
D0–27
30%
VOL
th
VOH
70%
CLKOUT
30%
VOL
Figure 5. Setup and Hold Time Measurements
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SN65LVDS94
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SLLS298F – MAY 1998 – REVISED JANUARY 2006
PARAMETER MEASUREMENT INFORMATION (continued)
Tektronix
HFS9003/HFS9DG1
Stimulus System
(Repeating Patterns
1110111 and 0001000)
An
D0−D27
DUT
CLKIN
Tektronix Microwave
Logic Multi-BERT-100RX
Word Error Detector
CLKOUT
CLKIN is advanced or delayed with respect to data until errors are observed at the receiver outputs.
The magnitude of the advance or delay is tRSKM.
tc
4/7 tc ± tRSKM
3/7 tc ± tRSKM
ts
th
AnP
and AnM
CLKIN
7×CLK
(Internal)
td
CLKOUT
tr < 1 ns
≅ 300 mV
90%
CLKIN or An
0V
10%
≅ −300 mV
VOH
CLKOUT
1.4 V
VOL
Figure 6. Receiver Input Skew Margin and td Definitions
8
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SLLS298F – MAY 1998 – REVISED JANUARY 2006
PARAMETER MEASUREMENT INFORMATION (continued)
Reference
+
Σ
Device
Under
Test
VCO
+
Modulation
v(t) = A sin(2πfmodt)
HP8656B Signal
Generator,
0.1 MHz–990 MHz
RF Output
HP8665A Synthesized
Signal Generator,
0.1 MHz–4200 MHz
Modulation Input
Device Under
Test
Output
CLKIN
CLKOUT
DTS2070C
Digital Time
Scope
Input
Figure 7. Output Clock Jitter Test Setup
CLKIN
An
ten
SHTDN
Dn
Invalid
Valid
Figure 8. Enable Time Waveforms
CLKIN
tdis
SHTDN
CLKOUT
Figure 9. Disable Time Waveforms
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SN65LVDS94
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SLLS298F – MAY 1998 – REVISED JANUARY 2006
TYPICAL CHARACTERISTICS
WORST-CASE SUPPLY CURRENT
vs
FREQUENCY
140
I CC − Supply Current − mA
120
100
VCC = 3.6 V
80
VCC = 3 V
VCC = 3.3 V
60
40
20
0
30
40
50
60
f − Frequency − MHz
Figure 10.
10
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SN65LVDS94
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SLLS298F – MAY 1998 – REVISED JANUARY 2006
APPLICATION INFORMATION
16-BIT BUS EXTENSION
In a 16-bit bus application (Figure 11), TTL data and clock coming from bus transceivers that interface the
backplane bus arrive at the Tx parallel inputs of the LVDS serdes transmitter. The clock associated with the bus
is also connected to the device. The on-chip PLL synchronizes this clock with the parallel data at the input. The
data is then multiplexed into three different line drivers which perform the TTL to LVDS conversion. The clock is
also converted to LVDS and presented to a separate driver. This synchronized LVDS data and clock at the
receiver, which recovers the LVDS data and clock, performs a conversion back to TTL. Data is then
demultiplexed into a parallel format. An on-chip PLL synchronizes the received clock with the parallel data, and
then all are presented to the parallel output port of the receiver.
16-Bit
BTL Bus
Interface
SN74FB2032
SN74FB2032
CLK
TTL
Interface
LVDS
Interface
0 To 10 Meters
(Media Dependent)
SN75L0DS93
SN75LV0S94
TTL
Interface
D0–D7 8
8
D8–D15 8
8 D8–D15
D0–D7
16-Bit
BTL Bus
Interface
SN74FB2032
SN74FB2032
XMIT Clock
RCV Clock
CLK
Backplane
Bus
Backplane
Bus
Figure 11. 16-Bit Bus Extension
16-BIT BUS EXTENSION WITH PARITY
In the previous application we did not have a checking bit that would provide assurance that the data crosses the
link. If we add a parity bit to the previous example, we would have a diagram similar to the one in Figure 12. The
device following the SN74FB2032 is a low cost parity generator. Each transmit-side transceiver/parity generator
takes the LVTTL data from the corresponding transceiver, performs a parity calculation over the byte, and then
passes the bits with its calculated parity value on the parallel input of the LVDS serdes transmitter. Again, the
on-chip PLL synchronizes this transmit clock with the eighteen parallel bits (16 data + 2 parity) at the input. The
synchronized LVDS data/parity and clock arrive at the receiver.
The receiver performs the conversion from LVDS to LVTTL and the transceiver/parity generator performs the
parity calculations. These devices compare their corresponding input bytes with the value received on the parity
bit. The transceiver/parity generator will assert its parity error output if a mismatch is detected.
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SLLS298F – MAY 1998 – REVISED JANUARY 2006
APPLICATION INFORMATION (continued)
16-Bit
BTL Bus
Interface
LVDS
Interface
0 To 10 Meters
(Media Dependent)
TTL
Interface
W/Parity
TTL
Interface
SN75LVDS93
SN74FB2032
9 Bit Latchable
Transceiver/ With
Parity Generator
8
Parity
Parity
8
D8–D15
SN74FB2032
9 Bit Latchable
Transceiver/ With
Parity Generator
TTL
Interface
16-Bit
BTL Bus
Interface
SN75LVDS94
8
D0–D7
TTL
Interface
W/Parity
9 Bit Latchable
Transceiver/ With
Parity Generator
8
Parity
Parity
D0–D7
SN74FB2032
D8–D15
9 Bit Latchable
Transceiver/ With
Parity Generator
SN74FB2032
Parity
Error
CLK
XMIT Clock
CLK
RCV Clock
Backplane
Bus
Backplane
Bus
Figure 12. 16-Bit Bus Extension With Parity
LOW COST VIRTUAL BACKPLANE TRANSCEIVER
Figure 13 represents LVDS serdes in an application as a virtual backplane transceiver (VBT). The concept of a
VBT can be achieved by implementing individual LVDS serdes chipsets in both directions of subsystem
serialized links.
Depending on the application, the designer will face varying choices when implementing a VBT. In addition to the
devices shown in Figure 13, functions such as parity and delay lines for control signals could be included. Using
additional circuitry, half-duplex or full-duplex operation can be achieved by configuring the clock and control lines
properly.
The designer may choose to implement an independent clock oscillator at each end of the link and then use a
PLL to synchronize LVDS serdes's parallel I/O to the backplane bus. Resynchronizing FIFOs may also be
required.
Bus
Transceivers
LVDS Serdes
Transmitter
TTL
Inputs
Up To
21 or 28
Bits
Backplane
Bus
Bus
Transceivers
LVDS Serdes
Receiver
TTL
Outputs
Up To
21 or 28
Bits
LVDS
Serial Links
4 or 5
Pairs
LVDS Serdes
Transmitter
Bus
Transceivers
LVDS Serdes
Receiver
Figure 13. Virtual Backplane Transceiver
12
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Backplane
Bus
Bus
Transceivers
PACKAGE OPTION ADDENDUM
www.ti.com
6-Dec-2006
PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
SN65LVDS94DGG
ACTIVE
TSSOP
DGG
56
35
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
SN65LVDS94DGGG4
ACTIVE
TSSOP
DGG
56
35
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
SN65LVDS94DGGR
ACTIVE
TSSOP
DGG
56
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
SN65LVDS94DGGRG4
ACTIVE
TSSOP
DGG
56
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
Lead/Ball Finish
MSL Peak Temp (3)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
14-Jul-2012
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
SN65LVDS94DGGR
Package Package Pins
Type Drawing
TSSOP
DGG
56
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
2000
330.0
24.4
Pack Materials-Page 1
8.6
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
15.6
1.8
12.0
24.0
Q1
PACKAGE MATERIALS INFORMATION
www.ti.com
14-Jul-2012
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
SN65LVDS94DGGR
TSSOP
DGG
56
2000
367.0
367.0
45.0
Pack Materials-Page 2
MECHANICAL DATA
MTSS003D – JANUARY 1995 – REVISED JANUARY 1998
DGG (R-PDSO-G**)
PLASTIC SMALL-OUTLINE PACKAGE
48 PINS SHOWN
0,27
0,17
0,50
48
0,08 M
25
6,20
6,00
8,30
7,90
0,15 NOM
Gage Plane
1
0,25
24
0°– 8°
A
0,75
0,50
Seating Plane
0,15
0,05
1,20 MAX
PINS **
0,10
48
56
64
A MAX
12,60
14,10
17,10
A MIN
12,40
13,90
16,90
DIM
4040078 / F 12/97
NOTES: A.
B.
C.
D.
All linear dimensions are in millimeters.
This drawing is subject to change without notice.
Body dimensions do not include mold protrusion not to exceed 0,15.
Falls within JEDEC MO-153
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
IMPORTANT NOTICE
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other
changes to its semiconductor products and services per JESD46C and to discontinue any product or service per JESD48B. Buyers should
obtain the latest relevant information before placing orders and should verify that such information is current and complete. All
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of order acknowledgment.
TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary
to support this warranty. Except where mandated by applicable law, testing of all parameters of each component is not necessarily
performed.
TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and
applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide
adequate design and operating safeguards.
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other intellectual property right relating to any combination, machine, or process in which TI components or services are used. Information
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endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual property of the
third party, or a license from TI under the patents or other intellectual property of TI.
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and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered
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Resale of TI components or services with statements different from or beyond the parameters stated by TI for that component or service
voids all express and any implied warranties for the associated TI component or service and is an unfair and deceptive business practice.
TI is not responsible or liable for any such statements.
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concerning its products, and any use of TI components in its applications, notwithstanding any applications-related information or support
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anticipate dangerous consequences of failures, monitor failures and their consequences, lessen the likelihood of failures that might cause
harm and take appropriate remedial actions. Buyer will fully indemnify TI and its representatives against any damages arising out of the use
of any TI components in safety-critical applications.
In some cases, TI components may be promoted specifically to facilitate safety-related applications. With such components, TI’s goal is to
help enable customers to design and create their own end-product solutions that meet applicable functional safety standards and
requirements. Nonetheless, such components are subject to these terms.
No TI components are authorized for use in FDA Class III (or similar life-critical medical equipment) unless authorized officers of the parties
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regulatory requirements in connection with such use.
TI has specifically designated certain components which meet ISO/TS16949 requirements, mainly for automotive use. Components which
have not been so designated are neither designed nor intended for automotive use; and TI will not be responsible for any failure of such
components to meet such requirements.
Products
Applications
Audio
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Amplifiers
amplifier.ti.com
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Data Converters
dataconverter.ti.com
Computers and Peripherals
www.ti.com/computers
DLP® Products
www.dlp.com
Consumer Electronics
www.ti.com/consumer-apps
DSP
dsp.ti.com
Energy and Lighting
www.ti.com/energy
Clocks and Timers
www.ti.com/clocks
Industrial
www.ti.com/industrial
Interface
interface.ti.com
Medical
www.ti.com/medical
Logic
logic.ti.com
Security
www.ti.com/security
Power Mgmt
power.ti.com
Space, Avionics and Defense
www.ti.com/space-avionics-defense
Microcontrollers
microcontroller.ti.com
Video and Imaging
www.ti.com/video
RFID
www.ti-rfid.com
OMAP Mobile Processors
www.ti.com/omap
TI E2E Community
e2e.ti.com
Wireless Connectivity
www.ti.com/wirelessconnectivity
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