SHENZHENFREESCALE AO4442

AO4442
75V N-Channel MOSFET
General Description
The AO4442 uses advanced trench technology to provide excellent RDS(ON) , low gate charge and
operation with gate voltages from 4.5V to 25V. This device is suitable for use as a load switch or in PWM
applications.
Features
VDS
75V
ID (at VGS=10V)
3.1A
RDS(ON) (at VGS=10V)
< 130mΩ
RDS(ON) (at VGS = 4.5V)
< 165mΩ
D
G
S
Absolute Maximum Ratings TA=25°C unless otherwise noted
Symbol
Parameter
VDS
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain
Current
VGS
TA=25°C
Pulsed Drain Current C
Junction and Storage Temperature Range
Thermal Characteristics
Parameter
Maximum Junction-to-Ambient A
Maximum Junction-to-Ambient A D
Maximum Junction-to-Lead
1/5
Steady-State
Steady-State
A
3.1
W
2
TJ, TSTG
Symbol
t ≤ 10s
V
20
PD
TA=70°C
±25
2.5
IDM
TA=25°C
Power Dissipation B
Units
V
3.1
ID
TA=70°C
Maximum
75
RθJA
RθJL
-55 to 150
Typ
31
59
16
°C
Max
40
75
24
Units
°C/W
°C/W
°C/W
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AO4442
75V N-Channel MOSFET
Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
IDSS
Zero Gate Voltage Drain Current
IGSS
Gate-Body leakage current
Conditions
Min
ID=10mA, VGS=0V
Typ
75
1
TJ=55°C
5
VDS=0V, VGS= ±25V
VGS(th)
Gate Threshold Voltage
VDS=VGS, ID=250µA
1
On state drain current
VGS=10V, VDS=5V
20
VGS=10V, ID=3.1A
nA
2.4
3
V
100
130
180
220
165
mΩ
1
V
3.5
A
350
pF
A
Static Drain-Source On-Resistance
VGS=4.5V, ID=2A
120
gFS
Forward Transconductance
VDS=5V, ID=3.1A
8.2
VSD
Diode Forward Voltage
IS=1A,VGS=0V
0.79
IS
Maximum Body-Diode Continuous Current
DYNAMIC PARAMETERS
Ciss
Input Capacitance
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
303
VGS=0V, VDS=37.5V, f=1MHz
37
2.2
mΩ
S
pF
17
VGS=0V, VDS=0V, f=1MHz
µA
100
RDS(ON)
TJ=125°C
Units
V
VDS=60V, VGS=0V
ID(ON)
Coss
Max
pF
3
Ω
SWITCHING PARAMETERS
Qg(10V) Total Gate Charge
5.2
6.5
nC
Qg(4.5V) Total Gate Charge
2.46
3.5
nC
Qgs
Gate Source Charge
VGS=10V, VDS=37.5V, ID=3.1A
1
nC
Qgd
Gate Drain Charge
1.34
nC
tD(on)
Turn-On DelayTime
4.5
ns
tr
Turn-On Rise Time
2.3
ns
tD(off)
Turn-Off DelayTime
15.6
ns
tf
Turn-Off Fall Time
1.9
ns
VGS=10V, VDS=37.5V, RL=12Ω,
RGEN=3Ω
trr
Body Diode Reverse Recovery Time
IF=3.1A, dI/dt=100A/µs
22
Qrr
Body Diode Reverse Recovery Charge IF=3.1A, dI/dt=100A/µs
22
30
ns
nC
A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The
value in any given application depends on the user's specific board design.
B. The power dissipation PD is based on TJ(MAX)=150°C, using ≤ 10s junction-to-ambient thermal resistance.
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and duty cycles to keep
initialTJ=25°C.
D. The RθJA is the sum of the thermal impedance from junction to lead RθJL and lead to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-ambient thermal impedance which is measured with the device mounted on 1in2 FR-4 board with
2oz. Copper, assuming a maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse ratin g.
2/5
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AO4442
75V N-Channel MOSFET
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
15
15
5V
10V
VDS=5V
4.5V
12
12
6V
9
ID(A)
ID (A)
9
4V
6
6
125°C
3
3
25°C
VGS=3.5V
0
0
0
1
2
3
4
0
5
1
2.2
200
2
Normalized On-Resistance
220
RDS(ON) (mΩ )
180
VGS=4.5V
140
120
100
VGS=10V
80
0
2
4
4
5
6
VGS=10V
ID=3.1A
1.8
17
5
2
VGS=4.5V10
1.6
1.4
1.2
ID=2A
1
0.8
6
8
0
10
ID (A)
Figure 3: On-Resistance vs. Drain Current and Gate
Voltage (Note E)
25
50
75
100
125
150
175
0
Temperature (°C)
Figure 4: On-Resistance vs. Junction Temperature
18
(Note E)
240
1.0E+01
ID=3.1A
220
1.0E+00
40
200
1.0E-01
180
IS (A)
RDS(ON) (mΩ )
3
VGS(Volts)
Figure 2: Transfer Characteristics (Note E)
VDS (Volts)
Fig 1: On-Region Characteristics (Note E)
160
2
125°C
160
140
125°C
1.0E-02
1.0E-03
120
25°C
25°C
1.0E-04
100
1.0E-05
80
2
4
6
8
10
VGS (Volts)
Figure 5: On-Resistance vs. Gate-Source Voltage
(Note E)
3/5
0.0
0.2
0.4
0.6
0.8
1.0
1.2
VSD (Volts)
Figure 6: Body-Diode Characteristics (Note E)
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AO4442
75V N-Channel MOSFET
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
500
10
VDS=37.5V
ID=3.1A
400
Capacitance (pF)
VGS (Volts)
8
6
4
2
Ciss
300
200
Coss
100
0
Crss
0
0
1
2
3
4
5
Qg (nC)
Figure 7: Gate-Charge Characteristics
6
0
10
20
30
40
50
VDS (Volts)
Figure 8: Capacitance Characteristics
60
10000
100.0
TA=25°C
10µs
1000
100µs
1.0
RDS(ON)
limited
0.1
Power (W)
ID (Amps)
10.0
1ms
10ms
TJ(Max)=150°C
TA=25°C
100
10
10s
DC
0.0
1
0.01
0.1
1
10
VDS (Volts)
100
1000
0.00001
0.001
0.1
10
1000
Pulse Width (s)
Figure 10: Single Pulse Power Rating Junction-toAmbient (Note F)
Figure 9: Maximum Forward Biased Safe
Operating Area (Note F)
Zθ JA Normalized Transient
Thermal Resistance
10
D=Ton/T
TJ,PK=TA+PDM.ZθJA.RθJA
1
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
RθJA=75°C/W
0.1
PD
0.01
Single Pulse
Ton
T
0.001
0.00001
0.0001
0.001
0.01
0.1
1
10
100
1000
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
4/5
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AO4442
75V N-Channel MOSFET
Gate Charge Test Circuit & Waveform
Vgs
Qg
10V
+
+ Vds
VDC
-
Qgs
Qgd
VDC
DUT
-
Vgs
Ig
Charge
R es istiv e S w itch ing T e st C ircu it & W a ve fo rm s
RL
V ds
Vds
DUT
Vgs
90 %
+
Vdd
VDC
-
Rg
1 0%
Vgs
V gs
t d (o n )
tr
t d (o ff)
to n
tf
t o ff
D iode R ecovery T est C ircuit & W aveform s
Q rr = -
V ds +
Idt
DUT
V gs
V ds -
Isd
V gs
Ig
5/5
Isd
L
+
VD C
-
IF
t rr
dI/dt
I RM
V dd
V dd
V ds
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