Order this document by IRF530/D SEMICONDUCTOR TECHNICAL DATA N–Channel Enhancement–Mode Silicon Gate TMOS POWER FET 14 AMPERES 100 VOLTS RDS(on) = 0.140 W This advanced TMOS power FET is designed to withstand high energy in the avalanche and commutation modes. This new energy efficient design also offers a drain–to–source diode with a fast recovery time. Designed for low voltage, high speed switching applications in power supplies, converters, and PWM motor controls. These devices are particularly well suited for bridge circuits where diode speed and commutating safe operating area are critical and offer additional safety margin against unexpected voltage transients. • Avalanche Energy Specified • Source–to–Drain Diode Recovery Time Comparable to a Discrete Fast Recovery Diode • Diode is Characterized for Use in Bridge Circuits • IDSS and VDS(on) Specified at Elevated Temperature D G S CASE 221A–09 TO-220AB MAXIMUM RATINGS (TC = 25°C unless otherwise noted) Rating Symbol Value Unit Drain–to–Source Voltage VDSS 100 Vdc Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDGR 100 Vdc Gate–to–Source Voltage — Continuous Gate–to–Source Voltage — Single Pulse (tp ≤ 50 mS) VGS VGSM ± 20 ± 25 Vdc Vdc Drain Current — Continuous Drain Current — Continuous @ 100°C Drain Current — Single Pulse (tp ≤ 10 mS) ID ID IDM 14 10 49 Adc Total Power Dissipation @ TC = 25°C Derate above 25°C PD 78 0.63 Watts W/°C TJ, Tstg – 55 to 150 °C Operating and Storage Temperature Range Apk UNCLAMPED DRAIN–TO–SOURCE AVALANCHE CHARACTERISTICS (TJ < 150°C) Single Pulse Drain–to–Source Avalanche Energy — STARTING TJ = 25°C (VDD = 75 V, VGS = 10 V, PEAK IL = 14 A, L = 1.0 mH, RG = 25 W) EAS mJ 98 THERMAL CHARACTERISTICS Thermal Resistance — Junction–to–Case° Thermal Resistance — Junction–to–Ambient° Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 10 seconds RθJC RθJA 1.60 62.5 °C/W TL 275 °C This document contains information on a product under development. Motorola reserves the right to change or discontinue this product without notice. E–FET is a trademark of Motorola, Inc. TMOS is a registered trademark of Motorola, Inc. REV 1 TMOS Motorola Motorola, Inc. 1998 Power MOSFET Transistor Device Data 1 IRF530 ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) Characteristic Symbol Min Typ Max Unit 100 — — 112 — — — — — — 10 100 — — 100 2.0 — 2.9 6.2 4.0 — — 0.098 0.140 — — — — — — gFS 4.0 7.4 — Mhos Ciss — 700 800 pF Coss — 200 500 Crss — 65 150 td(on) — 9.0 30 tr — 47 75 td(off) — 33 40 tf — 34 45 QT — 26 40 Q1 — 5.0 — Q2 — 13 — Q3 — 11 — — — 0.92 0.80 1.5 — trr — 103 — ta — 78 — tb — 25 — QRR — 0.46 — — 3.5 — — 7.5 — OFF CHARACTERISTICS Drain–to–Source Breakdown Voltage (VGS = 0 Vdc, ID = 0.25 mAdc) Temperature Coefficient (Positive) V(BR)DSS Zero Gate Voltage Drain Current (VDS = 100 Vdc, VGS = 0 Vdc) (VDS = 100 Vdc, VGS = 0 Vdc, TJ = 125°C) IDSS Gate–Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) IGSS Vdc V/°C mAdc nAdc ON CHARACTERISTICS(1) Gate Threshold Voltage (VDS = VGS, ID = 0.25 mA) Threshold Temperature Coefficient (Negative) Cpk ≥ 2.0(3) Static Drain–to–Source On–Resistance (VGS = 10 Vdc, ID = 8.0 Adc) Cpk ≥ 2.0(3) Drain–to–Source On–Voltage (VGS = 10 Vdc, ID = 14 Adc) (VGS = 10 Vdc, ID = 8.0 Adc, TJ = 125°C) VGS(th) Vdc RDS(on) Ohms VDS(on) Forward Transconductance (VDS = 15 Vdc, ID = 8.0 Adc) mV/°C Vdc DYNAMIC CHARACTERISTICS Input Capacitance (VDS = 25 Vdc, Vdc VGS = 0 Vdc, Vdc f = 1.0 MHz) Output Capacitance Transfer Capacitance SWITCHING CHARACTERISTICS(2) Turn–On Delay Time Rise Time ((VDS = 36 Vdc, Vd , ID = 8.0 8 0 Adc, Ad , VGS = 10 Vdc, RG = 15 Ω) Turn–Off Delay Time Fall Time Gate Charge ((VDS = 80 Vdc, Vd , ID = 14 Adc, Ad , VGS = 10 Vdc) ns nC SOURCE–DRAIN DIODE CHARACTERISTICS Forward On–Voltage (IS = 14 Adc, VGS = 0 Vdc) (IS = 14 Adc, VGS = 0 Vdc, TJ = 125°C) VSD Reverse Recovery Time ((IS = 14 Adc, Ad , dIS/dt = 100 A/µS) Reverse Recovery Stored Charge Vdc nS mC INTERNAL PACKAGE INDUCTANCE Internal Drain Inductance (Measured from the drain lead 0.25″ from package to center of die) Ld Internal Source Inductance (Measured from screw on tab to source bond pad) Ls Ť nH Ť (1) Pulse Test: Pulse Width ≤ 300 µS, Duty Cycle ≤ 2%. (2) Switching characteristics are independent of operating junction temperature. Max limit – Typ (3) Reflects typical values. Cpk 3 sigma + 2 Motorola TMOS Power MOSFET Transistor Device Data IRF530 TYPICAL ELECTRICAL CHARACTERISTICS 9V VGS = 10 V I D , DRAIN CURRENT (AMPS) 25 30 TJ = 25°C 8V I D , DRAIN CURRENT (AMPS) 30 7V 20 15 6V 10 5V 5 VDS ≥ 10 V 15 10 0 1 0 3 5 7 4 6 8 VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) 9 2 10 2 2.5 3 0.20 VGS = 10 V 0.18 TJ = 100°C 0.16 0.14 0.12 25°C 0.10 0.08 0.06 – 55°C 0.04 0.02 0.00 0 2.5 5 7.5 10 12.5 15 17.5 20 22.5 25 27.5 30 ID, DRAIN CURRENT (AMPS) 9 TJ = 25°C 0.13 0.12 0.11 VGS = 10 V 0.10 15 V 0.09 0.08 0.07 0.06 0 2.5 5 10 12.5 15 17.5 20 22.5 25 27.5 30 7.5 ID, DRAIN CURRENT (AMPS) Figure 4. On–Resistance versus Drain Current and Gate Voltage 1000 2.0 1.6 8.5 0.14 Figure 3. On–Resistance versus Drain Current and Temperature 1.8 3.5 4 4.5 5 5.5 6 6.5 7 7.5 8 VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) Figure 2. Transfer Characteristics RDS(on) , DRAIN–TO–SOURCE RESISTANCE (OHMS) Figure 1. On–Region Characteristics RDS(on) , DRAIN–TO–SOURCE RESISTANCE (OHMS) 100°C 25°C 20 5 0 VGS = 10 V ID = 8 A VGS = 0 V TJ = 125°C 1.4 I DSS , LEAKAGE (nA) RDS(on) , DRAIN–TO–SOURCE RESISTANCE (NORMALIZED) TJ = –55°C 25 1.2 1.0 0.8 0.6 100 100°C 10 0.4 0.2 0 –50 1 –25 0 25 50 75 100 TJ, JUNCTION TEMPERATURE (°C) 125 150 Figure 5. On–Resistance Variation with Temperature Motorola TMOS Power MOSFET Transistor Device Data 0 10 20 30 40 50 60 70 80 90 100 110 VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) Figure 6. Drain–To–Source Leakage Current versus Voltage 3 IRF530 POWER MOSFET SWITCHING Switching behavior is most easily modeled and predicted by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals (∆t) are determined by how fast the FET input capacitance can be charged by current from the generator. The capacitance (Ciss) is read from the capacitance curve at a voltage corresponding to the off–state condition when calculating td(on) and is read at a voltage corresponding to the on–state when calculating td(off). The published capacitance data is difficult to use for calculating rise and fall because drain–gate capacitance varies greatly with applied voltage. Accordingly, gate charge data is used. In most cases, a satisfactory estimate of average input current (IG(AV)) can be made from a rudimentary analysis of the drive circuit so that At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to measure and, consequently, is not specified. The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements. If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components. Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces switching losses. t = Q/IG(AV) During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as the plateau voltage, VSGP. Therefore, rise and fall times may be approximated by the following: tr = Q2 x RG/(VGG – VGSP) tf = Q2 x RG/VGSP where VGG = the gate drive voltage, which varies from zero to VGG RG = the gate drive resistance and Q2 and VGSP are read from the gate charge curve. During the turn–on and turn–off delay times, gate current is not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for voltage change in an RC network. The equations are: td(on) = RG Ciss In [VGG/(VGG – VGSP)] td(off) = RG Ciss In (VGG/VGSP) 2200 2000 Ciss VDS = 0 V TJ = 25°C VGS = 0 V C, CAPACITANCE (pF) 1800 1600 1400 1200 Crss 1000 Ciss 800 600 400 200 0 10 Coss Crss 0 5 VGS 5 10 15 20 25 VDS GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE (VOLTS) Figure 7. Capacitance Variation 4 Motorola TMOS Power MOSFET Transistor Device Data 80 QT 9 72 8 64 VGS Q1 7 Q2 56 6 48 5 40 4 32 24 3 2 1 0 Q3 0 2.5 5 TJ = 25°C ID = 14 A VDS 7.5 10 12.5 15 17.5 20 QG, TOTAL GATE CHARGE (nC) 22.5 16 8 0 25 27.5 100 t, TIME (ns) 10 VDS , DRAIN–TO–SOURCE VOLTAGE (VOLTS) VGS, GATE–TO–SOURCE VOLTAGE (VOLTS) IRF530 TJ = 25°C ID = 8 A VDD = 36 V VGS = 10 V tf td(on) 10 1 tr td(off) 1 10 100 RG, GATE RESISTANCE (OHMS) Figure 8. Gate–To–Source and Drain–To–Source Voltage versus Total Charge Figure 9. Resistive Switching Time Variation versus Gate Resistance DRAIN–TO–SOURCE DIODE CHARACTERISTICS 14 VGS = 0 V TJ = 25°C I S , SOURCE CURRENT (AMPS) 12 10 8 6 4 2 0 0.6 0.8 0.65 0.75 0.85 0.7 0.9 VSD, SOURCE–TO–DRAIN VOLTAGE (VOLTS) 0.95 Figure 10. Diode Forward Voltage versus Current SAFE OPERATING AREA The Forward Biased Safe Operating Area curves define the maximum simultaneous drain–to–source voltage and drain current that a transistor can handle safely when it is forward biased. Curves are based upon maximum peak junction temperature and a case temperature (TC) of 25°C. Peak repetitive pulsed power limits are determined by using the thermal response data in conjunction with the procedures discussed in AN569, “Transient Thermal Resistance–General Data and Its Use.” Switching between the off–state and the on–state may traverse any load line provided neither rated peak current (IDM) nor rated voltage (VDSS) is exceeded and the transition time (tr,tf) do not exceed 10 µs. In addition the total power averaged over a complete switching cycle must not exceed (TJ(MAX) – TC)/(RθJC). A Power MOSFET designated E–FET can be safely used in switching circuits with unclamped inductive loads. For reli- Motorola TMOS Power MOSFET Transistor Device Data able operation, the stored energy from circuit inductance dissipated in the transistor while in avalanche must be less than the rated limit and adjusted for operating conditions differing from those specified. Although industry practice is to rate in terms of energy, avalanche energy capability is not a constant. The energy rating decreases non–linearly with an increase of peak current in avalanche and peak junction temperature. Although many E–FETs can withstand the stress of drain– to–source avalanche at currents up to rated pulsed current (IDM), the energy rating is specified at rated continuous current (ID), in accordance with industry custom. The energy rating must be derated for temperature as shown in the accompanying graph (Figure 12). Maximum energy at currents below rated continuous ID can safely be assumed to equal the values indicated. 5 IRF530 SAFE OPERATING AREA 110 VGS = 20 V SINGLE PULSE TC = 25°C 10 EAS, SINGLE PULSE DRAIN–TO–SOURCE AVALANCHE ENERGY (mJ) I D , DRAIN CURRENT (AMPS) 100 10 µs 100 µs 1 ms 10 ms 1.0 0.1 dc RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT 0.1 1.0 100 10 VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS) ID = 14 A 100 90 80 70 60 50 40 30 20 10 0 25 1000 Figure 11. Maximum Rated Forward Biased Safe Operating Area 50 75 100 125 TJ, STARTING JUNCTION TEMPERATURE (°C) 150 Figure 12. Maximum Avalanche Energy versus Starting Junction Temperature r(t), NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE 1.0 D = 0.5 0.2 0.1 0.1 P(pk) 0.05 0.02 t1 0.01 t2 DUTY CYCLE, D = t1/t2 SINGLE PULSE 0.01 1.0E–05 1.0E–04 1.0E–03 1.0E–02 RθJC(t) = r(t) RθJC D CURVES APPLY FOR POWER PULSE TRAIN SHOWN READ TIME AT t1 TJ(pk) – TC = P(pk) RθJC(t) 1.0E–01 1.0E+00 t, TIME (s) Figure 13. Thermal Response di/dt IS trr ta tb TIME 0.25 IS tp IS Figure 14. Diode Reverse Recovery Waveform 6 Motorola TMOS Power MOSFET Transistor Device Data IRF530 PACKAGE DIMENSIONS –T– SEATING PLANE C T S 4 DIM A B C D F G H J K L N Q R S T U V Z A Q 1 2 3 U H K Z L R V NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. 3. DIMENSION Z DEFINES A ZONE WHERE ALL BODY AND LEAD IRREGULARITIES ARE ALLOWED. J G D N INCHES MIN MAX 0.570 0.620 0.380 0.405 0.160 0.190 0.025 0.035 0.142 0.147 0.095 0.105 0.110 0.155 0.018 0.025 0.500 0.562 0.045 0.060 0.190 0.210 0.100 0.120 0.080 0.110 0.045 0.055 0.235 0.255 0.000 0.050 0.045 ––– ––– 0.080 MILLIMETERS MIN MAX 14.48 15.75 9.66 10.28 4.07 4.82 0.64 0.88 3.61 3.73 2.42 2.66 2.80 3.93 0.46 0.64 12.70 14.27 1.15 1.52 4.83 5.33 2.54 3.04 2.04 2.79 1.15 1.39 5.97 6.47 0.00 1.27 1.15 ––– ––– 2.04 CASE 221A–09 (TO–220AB) ISSUE Z Motorola TMOS Power MOSFET Transistor Device Data 7 IRF530 Motorola reserves the right to make changes without further notice to any products herein. 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