AD ADG442

a
FEATURES
44 V Supply Maximum Ratings
VSS to VDD Analog Signal Range
Low On Resistance (< 70 Ω)
Low ∆RON (9 Ω max)
Low RON Match (3 Ω max)
Low Power Dissipation
Fast Switching Times
tON < 110 ns
tOFF < 60 ns
Low Leakage Currents ( 3 nA max)
Low Charge Injection (6 pC max)
Break-Before-Make Switching Action
Latch-Up Proof
Plug-In Upgrade for
DG201A/ADG201A, DG202A/ADG202A,
DG211/ADG211A
Plug in Replacement for DG441/DG442/DG444
APPLICATIONS
Audio and Video Switching
Automatic Test Equipment
Precision Data Acquisition
Battery Powered Systems
Sample Hold Systems
Communication Systems
LC2MOS Quad SPST Switches
ADG441/ADG442/ADG444
FUNCTIONAL BLOCK DIAGRAMS
S1
IN1
S1
IN1
D1
D1
S2
IN2
S2
IN2
ADG441
ADG444
D2
ADG442
S3
IN3
D2
S3
IN3
D3
D3
S4
IN4
S4
IN4
D4
D4
SWITCHES SHOWN FOR A LOGIC "1" INPUT
Each switch conducts equally well in both directions when ON
and has an input signal range that extends to the power supplies. In the OFF condition, signal levels up to the supplies are
blocked. All switches exhibit break-before-make switching action
for use in multiplexer applications. Inherent in the design is low
charge injection for minimum transients when switching the
digital inputs.
GENERAL DESCRIPTION
The ADG441, ADG442 and ADG444 are monolithic CMOS
devices comprising four independently selectable switches. They
are designed on an enhanced LC2MOS process that provides
low power dissipation yet gives high switching speed and low on
resistance.
PRODUCT HIGHLIGHTS
The on resistance profile is very flat over the full analog input
range ensuring good linearity and low distortion when switching
audio signals. High switching speed also makes the parts suitable for video signal switching. CMOS construction ensures
ultralow power dissipation making the parts ideally suited for
portable and battery powered instruments.
2. Low Power Dissipation
The ADG441, ADG442 and ADG444 contain four independent SPST switches. Each switch of the ADG441 and ADG444
turns on when a logic low is applied to the appropriate control
input. The ADG442 switches are turned on with a logic high on
the appropriate control input. The ADG441 and ADG444
switches differ in that the ADG444 requires a 5 V logic power
supply which is applied to the VL pin. The ADG441 and
ADG442 do not have a VL pin, the logic power supply being
generated internally by an on-chip voltage generator.
1. Extended Signal Range
The ADG441/ADG442/ADG444 are fabricated on an enhanced LC2MOS, trench-isolated process, giving an increased signal range that extends to the supply rails.
3. Low RON
4. Trench Isolation Guards Against Latch Up
A dielectric trench separates the P and N channel transistors
thereby preventing latch up even under severe overvoltage
conditions.
5. Break-Before-Make Switching
This prevents channel shorting when the switches are configured as a multiplexer.
6. Single Supply Operation
For applications where the analog signal is unipolar, the
ADG441/ADG442/ADG444 can be operated from a single
rail power supply. The parts are fully specified with a single
+12 V power supply.
REV. 0
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood. MA 02062-9106, U.S.A.
Tel: 617/329-4700
Fax: 617/326-8703
ADG441/ADG442/ADG444–SPECIFICATIONS1
Dual Supply (V
DD =
+15 V ± 10%, VSS = –15 V ± 10%, VL = +5 V ± 10% (ADG444), GND = 0 V, unless otherwise noted)
Parameter
ANALOG SWITCH
Analog Signal Range
RON
∆RON
B Version
–40°C to
+25°C
+85°C
VSS to VDD
40
70
RON Match
LEAKAGE CURRENTS
Source OFF Leakage IS (OFF)
Drain OFF Leakage ID (OFF)
Channel ON Leakage ID, IS (ON)
± 0.01
± 0.5
± 0.01
± 0.5
± 0.08
± 0.5
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current
IINL or IINH
DYNAMIC CHARACTERISTICS2
tON
tOFF
tOPEN
Charge Injection
T Version
–55°C to
+25°C
+125°C
85
110
45
60
30
1
6
VSS to VDD
40
70
85
4
9
1
3
± 0.01
± 0.5
± 0.01
± 0.5
± 0.08
± 0.5
85
4
9
1
3
Units
V
Ω typ
Ω max
Ω typ
Ω max
Ω typ
Ω max
2.4
0.8
V min
V max
± 0.00001
± 0.5
± 0.00001
± 0.5
µA typ
µA max
VIN = VINL or VINH
ns typ
ns max
ns typ
ns max
ns typ
pC typ
pC max
RL = 1 kΩ, CL = 35 pF;
VS = ± 10 V; Test Circuit 4
RL = 1 kΩ, CL = 35 pF;
VS = ± 10 V; Test Circuit 4
RL = 1 kΩ, CL = 35 pF;
VS = 0 V, RS = 0 Ω, CL= 1 nF;
VDD = +15 V, VSS = –15 V;
Test Circuit 5
RL = 50 Ω, CL = 5 pF;
f = 1 MHz; Test Circuit 6
RL = 50 Ω, CL = 5 pF;
f = 1 MHz; Test Circuit 7
f = 1 MHz
f = 1 MHz
f = 1 MHz
±3
85
110
45
60
30
1
6
170
80
± 20
170
80
dB typ
Channel-to-Channel Crosstalk
100
100
dB typ
CS (OFF)
CD (OFF)
CD, CS (ON)
4
4
16
4
4
16
pF typ
pF typ
pF typ
IL (ADG444 Only)
80
1
VDD = +16.5 V, VSS = –16.5 V
VD = ± 15.5 V, VS = 715.5 V;
Test Circuit 2
VD = ± 15.5 V, VS = 715.5 V;
Test Circuit 2
VS = VD = ± 15.5 V;
Test Circuit 3
2.4
0.8
±3
± 20
60
ISS
VD = 0 V, IS = –10 mA
± 40
±3
60
0.001
1
0.0001
1
0.001
VD = ± 8.5 V, IS = –10 mA
VDD = +13.5 V, VSS = –13.5 V
–8.5 V ≤ VD ≤ +8.5 V
nA typ
nA max
nA typ
nA max
nA typ
nA max
OFF Isolation
POWER REQUIREMENTS
IDD
ADG441/ADG442
ADG444
Test Conditions/Comments
80
0.001
1
0.0001
1
0.001
2.5
2.5
2.5
1
2.5
2.5
2.5
µA max
µA typ
µA max
µA typ
µA max
µA typ
µA max
VDD = +16.5 V, VSS = –16.5 V
Digital Inputs = 0 V or 5 V
VL = +5.5 V
NOTES
1
Temperature ranges are as follows: B Versions: –40°C to +85°C; T Versions: –55°C to +125°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
–2–
REV. 0
ADG441/ADG442/ADG444
Single Supply (V
DD =
+12 V ± 10%, VSS = 0 V, VL = +5 V ± 10% (ADG444), GND = 0 V, unless otherwise noted)
B Version
–40°C to
+25°C
+85°C
Parameter
ANALOG SWITCH
Analog Signal Range
RON
T Version
–55°C to
+25°C
+125°C
0 to VDD
0 to VDD
70
110
∆RON
RON Match
LEAKAGE CURRENT
Source OFF Leakage IS (OFF)
Drain OFF Leakage ID (OFF)
Channel ON Leakage ID, IS (ON)
± 0.01
± 0.5
± 0.01
± 0.5
± 0.08
± 0.5
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current
IINL or IINH
DYNAMIC CHARACTERISTICS2
tON
tOFF
tOPEN
Charge Injection
105
150
40
60
50
2
6
130
4
9
1
3
70
110
± 0.01
± 0.5
± 0.01
± 0.5
± 0.08
± 0.5
130
4
9
1
3
Units
V
Ω typ
Ω max
Ω typ
Ω max
Ω typ
Ω max
VDD = +13.2 V
VD = 12.2 V/1 V, VS = 1 V/12.2 V;
Test Circuit 2
VD = 12.2 V/1 V, VS = 1 V/12.2 V;
Test Circuit 2
VS = VD = 12.2 V/1 V;
Test Circuit 3
2.4
0.8
2.4
0.8
V min
V max
± 0.00001
± 0.5
± 0.00001
± 0.5
µA typ
µA max
VIN = VINL or VINH
ns typ
ns max
ns typ
ns max
ns typ
pC typ
pC max
RL = 1 kΩ, CL = 35 pF;
VS = +8 V; Test Circuit 4
RL = 1 kΩ, CL = 35 pF;
VS = +8 V; Test Circuit 4
RL = 1 kΩ, CL = 35 pF;
VS = 6 V, RS = 0 Ω, CL = 1 nF;
VDD = +12 V, VSS = 0 V;
Test Circuit 5
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 6
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 7
f = 1 MHz
f = 1 MHz
f = 1 MHz
±3
±3
220
100
105
150
40
60
50
2
6
± 20
± 20
220
100
60
dB typ
Channel-to-Channel Crosstalk
100
100
dB typ
CS (OFF)
CD (OFF)
CD, CS (ON)
7
10
16
7
10
16
pF typ
pF typ
pF typ
80
IL (ADG444 Only)
VD = 6 V, IS = –10 mA
± 40
±3
60
0.001
1
0.001
1
VD = +3 V, +8 V, IS = –10 mA;
VDD = +10.8 V
+3 V ≤ VD ≤ +8 V
nA typ
nA max
nA typ
nA max
nA typ
nA max
OFF Isolation
POWER REQUIREMENTS
IDD
ADG441/ADG442
ADG444
Test Conditions/Comments
2.5
2.5
80
0.001
1
0.001
1
2.5
2.5
NOTES
1
Temperature ranges are as follows: B Versions: –40°C to +85°C; T Versions: –55°C to +125°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
Table I. Truth Table
µA max
µA typ
µA max
µA typ
µA max
VDD = +13.2 V
Digital Inputs = 0 V or 5 V
VL = +5.5 V
ORDERING GUIDE
Model1
Temperature Range
Package Option2
ADG441/ADG444
IN
ADG442
IN
Switch
Condition
ADG441BN
ADG441BR
ADG441TQ
–40°C to +85°C
–40°C to +85°C
–55°C to +125°C
N-16
R-16A
Q-16
0
1
1
0
ON
OFF
ADG442BN
ADG442BR
–40°C to +85°C
–40°C to +85°C
N-16
R-16A
ADG444BN
ADG444BR
–40°C to +85°C
–40°C to +85°C
N-16
R-16A
NOTES
1
To order MIL-STD-883, Class B processed parts, add /883B to T grade part
numbers.
2
N = Plastic DIP, R = 0.15" Small Outline IC (SOIC), Q = Cerdip.
REV. 0
–3–
ADG441/ADG442/ADG444
ABSOLUTE MAXIMUM RATINGS 1
TERMINOLOGY
(TA = +25°C unless otherwise noted)
VDD
VSS
VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+44 V
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +25 V
VSS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –25 V
VL to GND . . . . . . . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V
Analog, Digital Inputs2 . . . . . . . . . . . . VSS – 2 V to VDD + 2 V
or 30 mA, Whichever Occurs First
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . 30 mA
Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA
(Pulsed at 1 ms, 10% Duty Cycle Max)
Operating Temperature Range
Industrial (B Version) . . . . . . . . . . . . . . . . . . –40°C to +85°C
Extended (T Version) . . . . . . . . . . . . . . . . –55°C to +125°C
Storage Temperature Range . . . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . +150°C
Cerdip Package, Power Dissipation . . . . . . . . . . . . . . . 900 mW
θJA, Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . . 76°C/W
Lead Temperature, Soldering (10 sec) . . . . . . . . . . . . . +300°C
Plastic Package, Power Dissipation . . . . . . . . . . . . . . . 470 mW
θJA, Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . 177°C/W
Lead Temperature, Soldering (10 sec) . . . . . . . . . . . . . +260°C
SOIC Package, Power Dissipation . . . . . . . . . . . . . . . . 600 mW
θJA, Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . . 77°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . . +215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . . +220°C
VL
GND
S
D
IN
RON
RON Match
IS (OFF)
ID (OFF)
ID, IS (ON)
VD (VS)
CS (OFF)
CD (OFF)
CD, CS (ON)
tON
tOFF
tOPEN
NOTES
Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those listed in the
operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability. Only
one absolute maximum rating may be applied at any one time.
2
Overvoltages at IN, S or D will be clamped by internal diodes. Current should be
limited to the maximum ratings given.
1
Crosstalk
Off Isolation
Charge
Injection
Most Positive Power Supply Potential.
Most Negative Power Supply Potential in dual
supplies. In single supply applications, it may be
connected to ground.
Logic Power Supply (+5 V).
Ground (0 V) Reference.
Source Terminal. May be an input or output.
Drain Terminal. May be an input or output.
Logic Control Input.
Ohmic resistance between D and S.
Difference between the RON of any two channels.
Source leakage current with the switch “OFF.”
Drain leakage current with the switch “OFF.”
Channel leakage current with the switch “ON.”
Analog voltage on terminals D, S.
“OFF” Switch Source Capacitance.
“OFF” Switch Drain Capacitance.
“ON” Switch Capacitance.
Delay between applying the digital control
input and the output switching on.
Delay between applying the digital control
input and the output switching off.
Break-Before-Make Delay when switches are
configured as a multiplexer.
A measure of unwanted signal which is coupled
through from one channel to another as a result
of parasitic capacitance.
A measure of unwanted signal coupling through
an “OFF” switch.
A measure of the glitch impulse transferred from
the digital input to the analog output during
switching.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although these devices feature proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
ADG441/ADG442 PIN CONFIGURATION (DIP/SOIC)
WARNING!
ESD SENSITIVE DEVICE
ADG444 PIN CONFIGURATION (DIP/SOIC)
IN1
1
16 IN2
IN1
1
16 IN2
D1
2
15 D2
D1
2
15 D2
S1
3
14 S2
S1
3
VSS
4
VSS
4
GND
5
GND
5
ADG441
ADG442
13 VDD
14 S2
ADG444
13 VDD
S4
6
TOP VIEW
12 NC
(Not to Scale)
11 S3
S4
6
TOP VIEW
12 VL
(Not to Scale)
11 S3
D4
7
10 D3
D4
7
10 D3
IN4
8
9
IN4
8
9
IN3
IN3
NC = NO CONNECT
–4–
REV. 0
ADG441/ADG442/ADG444
TRENCH ISOLATION
In the ADG441, ADG442 and ADG444, an insulating oxide
layer (trench) is placed between the NMOS and the PMOS
transistors of each CMOS switch. Parasitic junctions, which occur between the transistors in junction isolated switches, are
eliminated, the result being a completely latch-up proof switch.
NMOS
PMOS
P-WELL
N-WELL
LOCOS
In junction isolation, the N and P wells of the PMOS and
NMOS transistors form a diode that is reverse-biased under
normal operation. However, during overvoltage conditions, this
diode becomes forward biased. A silicon-controlled rectifier
(SCR) type circuit is formed by the two transistors causing a significant amplification of the current which, in turn, leads to
latch up. With trench isolation, this diode is removed, the result
being a latch-up proof switch.
TRENCH
Trench isolation also leads to lower leakage currents. The
ADG441, ADG442 and ADG444 have a leakage current
of 0.5 nA as compared with a leakage current of several
nanoamperes in non-trench isolated switches. Leakage current is
an important parameter in sample-and-hold circuits, this current
being responsible for the discharge of the holding capacitor with
time causing droop. The ADG441/ADG442/ADG444’s low
leakage current, along with its fast switching speeds, make it
suitable for fast and accurate sample-and-hold circuits.
BURIED OXIDE LAYER
SUBSTRATE (BACK GATE)
Figure 1. Trench Isolation
Typical Performance Characteristics
170
100
VDD = +5V
VSS = –5V
TA = +25°C
V DD = +12V
V SS = 0V
110
VDD = +12V
VSS = –12V
RON – Ω
RON – Ω
TA = +25°C
130
80
60
V DD = +5V
V SS = 0V
150
VDD = +10V
VSS = –10V
V DD = +10V
V SS = 0V
90
70
50
40
20
–15
10
–10
–5
0
5
10
0
15
VD (V S) – Volts
Figure 2. RON as a Function of VD (VS): Dual Supply
REV. 0
VDD = +15V
VSS = 0V
30
VDD = +15V
VSS = –15V
3
6
9
VD (V S) – Volts
12
15
Figure 3. RON as a Function of VD (VS): Single Supply
–5–
ADG441/ADG442/ADG444
100
120
VDD = +12V
VSS = 0V
VDD = +15V
VSS = –15V
100
80
R ON – Ω
R ON – Ω
+125°C
+125°C
60
80
+85°C
60
+25°C
+85°C
40
40
+25°C
20
–15
20
–10
–5
0
VD (V S) – Volts
5
10
15
0
Figure 4. RON as a Function of VD (VS) for Different
Temperatures
V DD = +15V
V SS = –15V
T A = +25° C
V DD = +12V
V SS = 0V
T A = +25°C
ID (OFF)
ID (ON)
IS (OFF)
–0.01
–0.02
–15
6
VD (V S) – Volts
8
10
12
0.010
LEAKAGE CURRENT – nA
LEAKAGE CURRENT – nA
0.00
4
Figure 7. RON as a Function of VD (VS) for Different
Temperatures
0.02
0.01
2
0.005
ID (ON)
IS (OFF)
0.000
ID (OFF)
–0.005
–0.010
–10
–5
0
5
10
0
15
2
4
VS , V D – Volts
6
8
10
12
VS, VD – Volts
Figure 5. Leakage Currents as a Function of VS (VD)
Figure 8. Leakage Currents as a Function of VS (VD)
20
120
V DD = +15V
V SS = –15V
110
CL = 1nF
10
100
CROSSTALK
dB
Q – pC
90
0
OFF ISOLATION
70
V DD = +12V
V SS = 0V
VDD = +15V
VSS = –15V
80
–10
60
50
1k
10k
100k
FREQUENCY – Hz
1M
–20
–15
10M
Figure 6. Crosstalk and Off Isolation vs. Frequency
–12
–9
–6
–3
0
3
VS – Volts
6
9
12
15
Figure 9. Charge Injection vs. Source Voltage
–6–
REV. 0
ADG441/ADG442/ADG444
120
160
V IN = +8V
VIN = +8V
140
100
120
tON
t – ns
t – ns
tON
80
100
80
60
60
tOFF
40
tOFF
40
±10
±12
±16
±14
SUPPLY VOLTAGE – Volts
20
±20
±18
8
Figure 10. Switching Time vs. Bipolar Supply
10
12
14
16
SUPPLY VOLTAGE – Volts
18
20
Figure 11. Switching Time vs. Single Supply
Test Circuits
IDS
V1
S
IS (OFF)
D
S
ID (OFF)
D
A
VS
+15V
VD
+5V
0.1µF
VIN
VL
S
VS
Test Circuit 3. On Leakage
50%
50%
50%
50%
ADG441/ADG444
D
VOUT
RL
1kΩ
IN
CL
35pF
3V
VIN
ADG442
VSS
GND
90%
VOUT
90%
0.1µF
tON
–15V
Test Circuit 4. Switching Times
REV. 0
–7–
ID (ON)
VD
3V
0.1µF
VDD
VS
Test Circuit 2. Off Leakage
Test Circuit 1. On Resistance
D
A
VS
RON = V 1 /I DS
S
A
tOFF
ADG441/ADG442/ADG444
+15V
OUTLINE DIMENSIONS
+5V
Dimensions shown in inches and (mm).
VDD
RS
VL
S
Plastic DIP (N-16)
VOUT
CL
1nF
IN
16
0.25 0.31
(6.35) (7.87)
PIN 1
VSS
GND
9
C1890–18–4/94
VS
D
1
8
0.87 (22.1) MAX
–15V
0.035
(0.89)
0.18
(4.57)
MAX
3V
0.125
(3.18)
MIN
0.18 (4.57)
VIN
0.011
(0.28)
0.3 (7.62)
0.018 (0.46)
VOUT
0.033 (0.84)
∆VOUT
SEATING
PLANE
0.1 (2.54)
BSC
Small Outline IC (R-16A)
QINJ = C L × ∆VOUT
Test Circuit 5. Charge Injection
16
+15V
0.1574 (4.00)
0.1497 (3.80)
PIN 1
+5V
0.1µF
0.1µF
VDD
1
8
VL
S
0.0196 (0.50)
× 45 °
0.0099 (0.25)
0.3937 (10.00)
0.3859 (9.80)
D
VOUT
IN
0.0098 (0.25)
0.0040 (0.10)
VSS
GND
0° – 8 °
0.0688 (1.75)
0.0532 (1.35)
RL
50Ω
VS
0.2440 (6.20)
0.2284 (5.80)
9
0.0500 (1.27)
BSC
0.0099 (0.25)
0.0075 (0.19)
0.0192 (0.49)
0.0138 (0.35)
0.0500 (1.27)
0.0160 (0.41)
SEATING
PLANE
VIN
0.1µF
Cerdip (Q-16)
–15V
9
16
0.310 (7.87)
0.220 (5.59)
PIN 1
+15V
+5V
0.1µF
1
0.1µF
8
0.840 (21.34) MAX
VDD
VL
S
0.200
(5.08)
MAX
50Ω
D
VIN1
0.022 (0.558)
0.014 (0.356)
VIN2
S
RL
50Ω
0.150
(3.81)
MIN
SEATING
PLANE
VS
VOUT
0.060 (1.52)
0.015 (0.38)
0.100 (2.54)
BSC
0.320 (8.13)
0.290 (7.37)
0.015 (0.381)
0.008 (0.204)
0.070 (1.78)
0.30 (0.76)
PRINTED IN U.S.A.
Test Circuit 6. Off Isolation
NC
VSS
GND
0.1µF
–15V
CHANNEL-TO-CHANNEL CROSSTALK = 20 × LOG VS /V OUT 
Test Circuit 7. Channel-to-Channel Crosstalk
–8–
REV. 0
ADG441/ADG442/ADG444
FOR CATALOG
ORDERING GUIDE
Model1
Temperature Range
Package Option2
ADG441BN
ADG441BR
ADG441TQ
ADG442BN
ADG442BR
ADG444BN
ADG444BR
–40°C to +85°C
–40°C to +85°C
–55°C to +125°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
N-16
R-16A
Q-16
N-16
R-16A
N-16
R-16A
NOTES
1
To order MIL-STD-883, Class B processed parts, add /883B to T grade part
numbers.
2
N = Plastic DIP, R = 0.15" Small Outline IC (SOIC), Q = Cerdip. For outline
information see Package Information section.
REV. 0
–9–