IRF IRG4PF50WD

PD- 91788
IRG4PF50WD
INSULATED GATE BIPOLAR TRANSISTOR WITH
ULTRAFAST SOFT RECOVERY DIODE
C
Features
• Optimized for use in Welding and Switch-Mode
Power Supply applications
• Industry benchmark switching losses improve
efficiency of all power supply topologies
• 50% reduction of Eoff parameter
• Low IGBT conduction losses
• Latest technology IGBT design offers tighter
parameter distribution coupled with
exceptional reliability
• IGBT co-packaged with HEXFREDTM ultrafast,
ultra-soft-recovery anti-parallel diodes for use in
bridge configurations
• Industry standard TO-247AC package
VCES = 900V
VCE(on) typ. = 2.25V
G
@VGE = 15V, IC = 28A
E
n-cha n ne l
Benefits
• Lower switching losses allow more cost-effective
operation and hence efficient replacement of larger-die
MOSFETs up to 100kHz
• HEXFREDTM diodes optimized for performance with IGBTs.
Minimized recovery characteristics reduce noise, EMI and
switching losses
TO-247AC
Absolute Maximum Ratings
Parameter
VCES
IC @ TC = 25°C
IC @ TC = 100°C
ICM
ILM
IF @ TC = 100°C
IFM
VGE
PD @ TC = 25°C
PD @ TC = 100°C
TJ
TSTG
Collector-to-Emitter Breakdown Voltage
Continuous Collector Current
Continuous Collector Current
Pulsed Collector Current 
Clamped Inductive Load Current ‚
Diode Continuous Forward Current
Diode Maximum Forward Current
Gate-to-Emitter Voltage
Maximum Power Dissipation
Maximum Power Dissipation
Operating Junction and
Storage Temperature Range
Soldering Temperature, for 10 seconds
Mounting torque, 6-32 or M3 screw.
Max.
Units
900
51
28
204
204
16
204
± 20
200
78
-55 to + 150
V
A
V
W
°C
300 (0.063 in. (1.6mm) from case )
10 lbf•in (1.1N•m)
Thermal Resistance
Parameter
RθJC
RθJC
RθCS
RθJA
Wt
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Junction-to-Case - IGBT
Junction-to-Case - Diode
Case-to-Sink, flat, greased surface
Junction-to-Ambient, typical socket mount
Weight
Min.
Typ.
Max.
–––
–––
–––
–––
–––
–––
–––
0.24
–––
6 (0.21)
0.64
0.83
–––
40
–––
Units
°C/W
g (oz)
1
IRG4PF50WD
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
VCE(on)
Parameter
Collector-to-Emitter Breakdown Voltageƒ
Temperature Coeff. of Breakdown Voltage
Collector-to-Emitter Saturation Voltage
VGE(th)
∆VGE(th)/∆TJ
gfe
ICES
Gate Threshold Voltage
Temperature Coeff. of Threshold Voltage
Forward Transconductance „
Zero Gate Voltage Collector Current
VFM
Diode Forward Voltage Drop
IGES
Gate-to-Emitter Leakage Current
V(BR)CES
∆V(BR)CES/∆TJ
Min.
900
—
—
—
—
3.0
—
26
—
—
—
—
—
—
Typ.
—
0.295
2.25
2.74
2.12
—
-13
39
—
—
—
2.5
2.1
—
Max. Units
Conditions
—
V
VGE = 0V, IC = 250µA
— V/°C VGE = 0V, IC = 3.5mA
2.7
IC = 28A
VGE = 15V
—
V
IC = 60A
See Fig. 2, 5
—
IC = 28A, TJ = 150°C
6.0
VCE = VGE, IC = 250µA
— mV/°C VCE = VGE, IC = 250µA
—
S
VCE = 50V, IC = 28A
500
µA
VGE = 0V, VCE = 900V
2.0
VGE = 0V, VCE = 10V, TJ = 25°C
6.5
mA
VGE = 0V, VCE = 900V, TJ = 150°C
3.5
V
IC = 16A
See Fig. 13
3.0
IC = 16A, TJ = 150°C
±100 nA
VGE = ±20V
Switching Characteristics @ TJ = 25°C (unless otherwise specified)
Qg
Qge
Qgc
td(on)
tr
td(off)
tf
Eon
Eoff
Ets
td(on)
tr
td(off)
tf
Ets
LE
Cies
Coes
Cres
trr
Parameter
Total Gate Charge (turn-on)
Gate - Emitter Charge (turn-on)
Gate - Collector Charge (turn-on)
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Turn-On Switching Loss
Turn-Off Switching Loss
Total Switching Loss
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Switching Loss
Internal Emitter Inductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Diode Reverse Recovery Time
Irr
Diode Peak Reverse Recovery Current
Qrr
Diode Reverse Recovery Charge
di(rec)M/dt
Diode Peak Rate of Fall of Recovery
During tb
2
Min.
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
Typ.
160
19
53
71
50
150
110
2.63
1.34
3.97
69
52
270
190
6.0
13
3300
200
45
90
164
5.8
8.3
260
680
120
76
Max. Units
Conditions
240
IC = 28A
29
nC VCC = 400V
See Fig. 8
80
VGE = 15V
—
TJ = 25°C
—
ns
IC = 28A, VCC = 720V
220
VGE = 15V, RG = 5.0Ω
170
Energy losses include "tail" and
—
diode reverse recovery.
—
mJ See Fig. 9, 10, 18
5.3
—
TJ = 150°C, See Fig. 11, 18
—
ns
IC = 28A, VCC = 720V
—
VGE = 15V, RG = 5.0Ω
—
Energy losses include "tail" and
—
mJ diode reverse recovery.
—
nH Measured 5mm from package
—
VGE = 0V
—
pF
VCC = 30V
See Fig. 7
—
ƒ = 1.0MHz
135
ns
TJ = 25°C See Fig.
245
TJ = 125°C
14
IF = 16A
10
A
TJ = 25°C See Fig.
15
TJ = 125°C
15
VR = 200V
675
nC TJ = 25°C See Fig.
1838
TJ = 125°C
16
di/dt = 200A/µs
—
A/µs TJ = 25°C See Fig.
—
TJ = 125°C
17
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IRG4PF50WD
40
F or b oth:
D uty c y c le : 50%
T J = 12 5° C
T sink = 90 °C
G a te d riv e a s s pe c ified
LOAD CURRENT (A)
30
P ow er D is s ipation = 40 W
S q u a re w a v e :
60% of rated
voltage
20
I
10
Id e a l d io d es
0
0.1
1
10
100
f, Frequency (KHz)
Fig. 1 - Typical Load Current vs. Frequency
(Load Current = IRMS of fundamental)
I C , Collector-to-Emitter Current (A)
TJ = 25 ° C
I C , Collector-to-Emitter Current (A)
1000
1000
100
100
TJ = 150 ° C
10
V GE = 15V
20µs PULSE WIDTH
1
1
10
TJ = 150 °C
TJ = 25 °C
10
V CC = 50V
5µs PULSE WIDTH
1
5
6
7
8
9
VCE , Collector-to-Emitter Voltage (V)
VGE , Gate-to-Emitter Voltage (V)
Fig. 2 - Typical Output Characteristics
Fig. 3 - Typical Transfer Characteristics
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10
3
IRG4PF50WD
3.0
VCE , Collector-to-Emitter Voltage(V)
Maximum DC Collector Current(A)
60
50
40
30
20
10
0
25
50
75
100
125
150
VGE = 15V
80 us PULSE WIDTH
IC = 56 A
2.5
IC = 28 A
2.0
IC = 14 A
1.5
-60 -40 -20
TC , Case Temperature ( ° C)
0
20
40
60
80 100 120 140 160
TJ , Junction Temperature °( C)
Fig. 4 - Maximum Collector Current vs. Case
Temperature
Fig. 5 - Collector-to-Emitter Voltage vs.
Junction Temperature
Thermal Response (Z thJC )
1
D = 0.50
0.20
0.1
0.01
0.001
0.00001
0.10
0.05
0.02
0.01
P DM
SINGLE PULSE
(THERMAL RESPONSE)
t1
t2
Notes:
1. Duty factor D = t 1 / t2
2. Peak TJ = PDM x Z thJC + TC
0.0001
0.001
0.01
0.1
1
t1 , Rectangular Pulse Duration (sec)
Fig. 6 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
4
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IRG4PF50WD
VGE = 0V,
f = 1MHz
Cies = Cge + Cgc , Cce SHORTED
Cres = Cgc
Coes = Cce + Cgc
C, Capacitance (pF)
5000
Cies
4000
3000
2000
C oes
1000
Cres
20
VGE , Gate-to-Emitter Voltage (V)
6000
16
12
8
4
0
0
1
10
0
100
Fig. 7 - Typical Capacitance vs.
Collector-to-Emitter Voltage
100
= 720V
= 15V
= 25 ° C
= 28A
5.0
4.5
4.0
3.5
0
10
20
30
40
RG , Gate Resistance( Ω )
Fig. 9 - Typical Switching Losses vs. Gate
Resistance
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80
120
160
Fig. 8 - Typical Gate Charge vs.
Gate-to-Emitter Voltage
Total Switching Losses (mJ)
Total Switching Losses (mJ)
V CC
V GE
TJ
5.5 I C
40
QG , Total Gate Charge (nC)
VCE , Collector-to-Emitter Voltage (V)
6.0
VCC = 400V
I C = 28A
50
RG = 5.0Ω
VGE = 15V
VCC = 720V
IC = 56 A
10
IC = 28 A
IC = 14 A
1
-60 -40 -20
0
20
40
60
80 100 120 140 160
TJ , Junction Temperature °( C )
Fig. 10 - Typical Switching Losses vs.
Junction Temperature
5
IRG4PF50WD
RG
TJ
VCC
VGE
1000
= 5.0Ω
= 150 ° C
= 720V
= 15V
I C , Collector Current (A)
Total Switching Losses (mJ)
16
12
VGE = 20V
T J = 125 oC
100
8
4
10
SAFE OPERATING AREA
0
10
20
30
40
50
1
60
1
I C , Collector Current (A)
10
100
1000
VCE , Collector-to-Emitter Voltage (V)
Fig. 11 - Typical Switching Losses vs.
Collector-to-Emitter Current
Fig. 12 - Turn-Off SOA
In sta n ta n e o u s F o rw a rd C u rre n t - I F (A )
100
T J = 150°C
10
T J = 125°C
T J = 25°C
1
0.0
1.0
2.0
3.0
4.0
5.0
6.0
F o rw a rd V o lta g e D ro p - V FM (V )
Fig. 13 - Typical Forward Voltage Drop vs. Instantaneous Forward Current
6
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IRG4PF50WD
300
40
VR = 2 00V
T J = 125 °C
T J = 25°C
VR = 20 0V
T J = 125°C
T J = 25°C
30
200
I R R M - (A )
trr - (n s)
I F = 32A
I F = 16A
I F = 8.0A
I F = 32A
20
I F = 16A
100
I F = 8.0A
10
0
100
di f /dt - (A /µ s)
0
100
1000
Fig. 14 - Typical Reverse Recovery vs. dif/dt
di f /d t - (A /µ s)
1000
Fig. 15 - Typical Recovery Current vs. dif/dt
1200
1000
VR = 200 V
T J = 125°C
T J = 25°C
VR = 20 0V
T J = 12 5°C
T J = 25 °C
900
600
di(rec )M /dt - (A /µ s )
Q R R - (nC )
I F = 32A
I F = 16A
I F = 8.0A
100
I F = 32 A
I F =1 6A
I F = 8 .0A
300
0
100
di f /d t - (A /µ s)
Fig. 16 - Typical Stored Charge vs. dif/dt
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1000
10
100
1000
di f /dt - (A /µ s)
Fig. 17 - Typical di(rec)M/dt vs. dif/dt
7
IRG4PF50WD
Same type
device as
D .U.T.
430µF
80%
of Vce
90%
D .U .T.
10%
Vge
VC
90%
t d(off)
10%
IC 5%
Fig. 18a - Test Circuit for Measurement of
tf
tr
ILM, Eon, Eoff(diode), trr, Qrr, Irr, td(on), tr, td(off), tf
t d(on)
t=5µs
E on
Eoff
E ts = (Eon +Eoff )
Fig. 18b - Test Waveforms for Circuit of Fig. 18a, Defining
Eoff, td(off), tf
G A T E V O LT A G E D .U .T .
10% + V g
trr
Q rr =
Ic
trr
id
Ic dtdt
tx
∫
+V g
tx
10% V c c
10% Irr
Vcc
D U T V O LT A G E
AND CURRENT
Vce
V pk
Irr
Vcc
10% Ic
Ipk
90% Ic
Ic
D IO D E R E C O V E R Y
W AVEFORMS
tr
td(on)
5% V c e
t1
∫
t2
c e ieIcdtdt
E on = VVce
t1
t2
E rec =
D IO D E R E V E R S E
RECOVERY ENERG Y
t3
Fig. 18c - Test Waveforms for Circuit of Fig. 18a,
Defining Eon, td(on), tr
8
∫
t4
VVd
d idIcdt dt
t3
t4
Fig. 18d - Test Waveforms for Circuit of Fig. 18a,
Defining Erec, trr, Qrr, Irr
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IRG4PF50WD
V g G A T E S IG N A L
D E V IC E U N D E R T E S T
C U R R E N T D .U .T .
V O LT A G E IN D .U .T .
C U R R E N T IN D 1
t0
t1
t2
Figure 18e. Macro Waveforms for Figure 18a's Test Circuit
D.U.T.
L
1000V
Vc*
R L=
720V
4 X IC @25°C
0 - 720V
50V
600 0µ F
100 V
Figure 19. Clamped Inductive Load Test Circuit
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Figure 20. Pulsed Collector Current
Test Circuit
9
IRG4PF50WD
Notes:
 Repetitive rating: VGE=20V; pulse width limited by maximum junction temperature (figure 20)
‚ VCC=80%(VCES), VGE=20V, L=10µH, RG= 5.0Ω (figure 19)
ƒ Pulse width ≤ 80µs; duty factor ≤ 0.1%.
„ Pulse width 5.0µs, single shot.
Case Outline and Dimensions — TO-247AC
3.6 5 (.14 3)
3.5 5 (.14 0)
0.2 5 (.0 1 0) M D B M
15 .90 (.62 6 )
15 .30 (.60 2 )
-B-
-A5.5 0 (.2 17)
2 0 .3 0 (.80 0)
1 9 .7 0 (.77 5)
2X
1
2
-D-
5.3 0 (.20 9)
4.7 0 (.18 5)
2.5 0 (.0 89)
1.5 0 (.0 59)
4
5.5 0 (.2 17)
4.5 0 (.1 77)
LEAD
1234-
3
-C-
*
1 4 .8 0 (.5 8 3)
1 4 .2 0 (.5 5 9)
2 .40 (.09 4 )
2 .00 (.07 9 )
2X
5.4 5 (.21 5)
2X
4.3 0 (.1 70)
3.7 0 (.1 45)
3X
1.4 0 (.0 56)
1.0 0 (.0 39)
0.2 5 (.0 10) M
3 .40 (.13 3)
3 .00 (.11 8)
N O TE S :
1 D IM E N S IO N S & T O LE R A N C IN G
P E R A N S I Y 1 4 .5 M , 1 982 .
2 C O N T R O L LIN G D IM E N S IO N : IN C H .
3 D IM E N S IO N S A R E S H O W N
M IL L IM E T E R S (IN C H E S ).
4 C O N F O R M S T O JE D E C O U T L IN E
T O -24 7A C .
*
0 .80 (.03 1 )
0 .40 (.01 6 )
2.6 0 (.10 2 )
2.2 0 (.08 7 )
A S S IG N M E N T S
GATE
CO LLECT O R
E M IT T E R
CO LLECT O R
L O N G E R L E A D E D (20m m )
V E R S IO N A V A ILA B LE (T O -24 7 A D )
T O O R D E R A D D "-E " S U F F IX
TO PART NUMBER
3X
C A S
CONFORM S TO JEDEC OUTLINE TO-247AC (TO-3P)
D im en sio ns in M illim e ters a n d (Inche s)
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
IR GREAT BRITAIN: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020
IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371
IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673, Taiwan Tel: 886-2-2377-9936
http://www.irf.com/
Data and specifications subject to change without notice.
7/98
10
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