TI CSD17507Q5A

CSD17507Q5A
www.ti.com
SLPS243A – JULY 2010 – REVISED AUGUST 2010
30V, N-Channel NexFET™ Power MOSFETs
Check for Samples: CSD17507Q5A
PRODUCT SUMMARY
FEATURES
1
•
•
•
•
•
•
•
2
Ultralow Qg and Qgd
Low Thermal Resistance
Avalanche Rated
Pb Free Terminal Plating
RoHS Compliant
Halogen Free
SON 5-mm × 6-mm Plastic Package
VDS
Drain to Source Voltage
30
V
Qg
Gate Charge Total (4.5V)
2.8
nC
Qgd
Gate Charge Gate to Drain
RDS(on)
Drain to Source On Resistance
VGS(th)
Threshold Voltage
•
Point-of-Load Synchronous Buck in
Networking, Telecom and Computing Systems
Optimized for Control FET Applications
DESCRIPTION
VGS = 10V
9
mΩ
1.6
Device
Package
Media
CSD17507Q5A
SON 5-mm × 6-mm
Plastic Package
13-Inch
Reel
8
1
V
D
Qty
Ship
2500
Tape and
Reel
Text Added For Spacing
ABSOLUTE MAXIMUM RATINGS
VALUE
UNIT
VDS
Drain to Source Voltage
30
V
VGS
Gate to Source Voltage
20 / –12
V
Continuous Drain Current, TC = 25°C
65
A
Continuous Drain Current(1)
13
A
IDM
Pulsed Drain Current, TA = 25°C(2)
85
A
PD
Power Dissipation(1)
3
W
ID
Top View
S
2
7
D
TJ,
TSTG
Operating Junction and Storage
Temperature Range
–55 to 150
°C
S
3
6
D
EAS
Avalanche Energy, single pulse
ID = 30A, L = 0.1mH, RG = 25Ω
145
mJ
G
4
5
D
(1) Typical RqJA = 44°C/W on 1-inch2 (6.45-cm2), 2-oz.
(0.071-mm thick) Cu pad on a 0.06-inch (1.52-mm) thick FR4
PCB.
(2) Pulse duration ≤300ms, duty cycle ≤2%
D
P0093-01
Text 4 Spacing
RDS(on) vs VGS
Text 4 Spacing
GATE CHARGE
30
20
ID = 11A
VGS - Gate-to-Source Voltage - V
RDS(on) - On-State Resistance - mΩ
mΩ
TA = 25°C unless otherwise stated
The NexFET™ power MOSFET has been designed
to minimize losses in power conversion applications.
S
nC
11.8
Text Added For Spacing
ORDERING INFORMATION
APPLICATIONS
•
0.7
VGS = 4.5V
25
20
T C = 125°C
15
10
5
T C = 25°C
ID = 11A
VDS = 15V
18
16
14
12
10
8
6
4
2
0
0
0
2
4
6
8
10
12
14
16
VGS - Gate-to-Source Voltage - V
18
20
G006
0
2
4
6
8
Qg - Gate Charge - nC
10
12
G003
1
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NexFET is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2010, Texas Instruments Incorporated
CSD17507Q5A
SLPS243A – JULY 2010 – REVISED AUGUST 2010
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ELECTRICAL CHARACTERISTICS
(TA = 25°C unless otherwise stated)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Static Characteristics
BVDSS
Drain to Source Voltage
VGS = 0V, IDS = 250mA
IDSS
Drain to Source Leakage Current
VGS = 0V, VDS = 24V
IGSS
Gate to Source Leakage Current
VDS = 0V, VGS = 20/-12V
VGS(th)
Gate to Source Threshold Voltage
VDS = VGS, IDS = 250mA
RDS(on)
Drain to Source On Resistance
gfs
Transconductance
30
1.1
V
1
mA
100
nA
1.6
2.1
V
VGS = 4.5V, IDS = 11A
11.8
16.1
mΩ
VGS = 10V, IDS = 11A
9
10.8
mΩ
VDS = 15V, IDS = 11A
16
S
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
RG
Series Gate Resistance
Qg
Gate Charge Total (4.5V)
2.8
Qgd
Gate Charge Gate to Drain
Qgs
Gate Charge Gate to Source
Qg(th)
Gate Charge at Vth
Qoss
Output Charge
td(on)
Turn On Delay Time
tr
Rise Time
td(off)
Turn Off Delay Time
tf
Fall Time
VGS = 0V, VDS = 15V,
f = 1MHz
VDS = 15V, IDS = 11A
VDS = 13V, VGS = 0V
VDS = 15V, VGS = 4.5V,
IDS = 11A,RG = 2Ω
410
530
pF
270
350
pF
23
30
pF
0.7
1.4
Ω
3.6
nC
0.7
nC
1.3
nC
0.7
nC
7.2
nC
4.7
ns
5.2
ns
5.7
ns
2.3
ns
Diode Characteristics
VSD
Diode Forward Voltage
Qrr
Reverse Recovery Charge
trr
Reverse Recovery Time
ISD = 11A, VGS = 0V
0.85
VDS= 13V, IF = 11A, di/dt = 300A/ms
1
V
11
nC
16
ns
THERMAL CHARACTERISTICS
(TA = 25°C unless otherwise stated)
PARAMETER
RqJC
Thermal Resistance Junction to Case
RqJA
Thermal Resistance Junction to Ambient (1) (2)
(1)
(2)
2
MIN
(1)
2
TYP
MAX
UNIT
1.9
°C/W
51
°C/W
2
RqJC is determined with the device mounted on a 1-inch (6.45-cm ), 2-oz. (0.071-mm thick) Cu pad on a 1.5-inch × 1.5-inch (3.81-cm ×
3.81-cm), 0.06-inch (1.52-mm) thick FR4 PCB. RqJC is specified by design, whereas RqJA is determined by the user’s board design.
Device mounted on FR4 material with 1-inch2 (6.45-cm2), 2-oz. (0.071-mm thick) Cu.
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Product Folder Link(s): CSD17507Q5A
CSD17507Q5A
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SLPS243A – JULY 2010 – REVISED AUGUST 2010
GATE
GATE
Source
N-Chan 5x6 QFN TTA MIN Rev3
N-Chan 5x6 QFN TTA MAX Rev3
Max RqJA = 51°C/W
when mounted on
1 inch2 (6.45 cm2) of
2-oz. (0.071-mm thick)
Cu.
Source
Max RqJA = 131°C/W
when mounted on a
minimum pad area of
2-oz. (0.071-mm thick)
Cu.
DRAIN
DRAIN
M0137-02
M0137-01
TYPICAL MOSFET CHARACTERISTICS
(TA = 25°C unless otherwise stated)
ZqJA - Normalized Thermal Impedance
10
1
0.5
0.3
0.1
0.01
0.1
0.05
Duty Cycle = t1/t2
0.02
0.01
P
Single Pulse
t1
t2
0.001
0.0001
0.0001
Typical RqJA = 105°C/W (min Cu)
TJ = P ´ ZqJA ´ RqJA
0.001
0.01
0.1
1
tp - Pulse Duration - s
10
100
1k
G012
Figure 1. Transient Thermal Impedance
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3
CSD17507Q5A
SLPS243A – JULY 2010 – REVISED AUGUST 2010
www.ti.com
TYPICAL MOSFET CHARACTERISTICS (continued)
(TA = 25°C unless otherwise stated)
TEXT ADDED FOR SPACING
TEXT ADDED FOR SPACING
30
100
VDS = 5V
IDS - Drain-to-Source Current - A
IDS - Drain-to-Source Current - A
VGS = 8V
25
VGS = 4.5V
20
VGS = 3.5V
15
10
VGS = 3V
VGS = 2.5V
5
0
10
1
T C = -55°C
0.1
T C = 25°C
0.01
T C = 125°C
0.001
0
0.2
0.4
0.6
0.8
1
1.2
VDS - Drain-to-Source Voltage - V
1.4
1.6
0
1
G001
Figure 2. Saturation Characteristics
TEXT ADDED FOR SPACING
TEXT ADDED FOR SPACING
ID = 11A
VDS = 15V
18
Ciss = Cgd + Cgs
14
12
10
8
6
C - Capacitance - nF
16
C - Capacitance - nF
VGS - Gate-to-Source Voltage - V
G002
1
Coss = Cds + Cgd
0.1
Crss = Cgd
4
f = 1MHz
VGS = 0V
2
0
0.01
0
2
4
6
8
Qg - Gate Charge - nC
10
12
0
5
10
15
20
VDS - Drain-to-Source Voltage - V
G003
Figure 4. Gate Charge
TEXT ADDED FOR SPACING
30
G004
TEXT ADDED FOR SPACING
30
RDS(on) - On-State Resistance - mΩ
ID = 250µA
2
1.5
1
0.5
0
-75
25
Figure 5. Capacitance
2.5
VGS(th) - Threshold Voltage - V
5
Figure 3. Transfer Characteristics
20
ID = 11A
25
20
T C = 125°C
15
10
5
T C = 25°C
0
-25
25
75
T C - Case Temperature - °C
125
175
0
2
G005
Figure 6. Threshold Voltage vs. Temperature
4
2
3
4
VGS - Gate-to-Source Voltage - V
4
6
8
10
12
14
16
VGS - Gate-to-Source Voltage - V
18
20
G006
Figure 7. On-State Resistance vs. Gate-to-Source Voltage
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Product Folder Link(s): CSD17507Q5A
CSD17507Q5A
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SLPS243A – JULY 2010 – REVISED AUGUST 2010
TYPICAL MOSFET CHARACTERISTICS (continued)
(TA = 25°C unless otherwise stated)
TEXT ADDED FOR SPACING
TEXT ADDED FOR SPACING
100
ID = 11A
VGS = 10V
1.4
ISD - Source-to-Drain Current - A
Normalized On-State Resistance
1.6
1.2
1
0.8
0.6
0.4
0.2
-75
10
1
T C = 125°C
0.1
T C = 25°C
0.01
0.001
0.0001
-25
25
75
T C - Case Temperature - °C
125
0
175
0.2
Figure 8. Normalized On-State Resistance vs. Temperature
TEXT ADDED FOR SPACING
G008
TEXT ADDED FOR SPACING
I(AV) - Peak Avalanche Current - A
IDS - Drain-to-Source Current - A
1.2
100
100
11110
100µs
10
1ms
1
10ms
100ms
11110
Area Limited
by RDS(on)
0.01
0.01
1
Figure 9. Typical Diode Forward Voltage
1k
0.1
0.4
0.6
0.8
VSD - Source-to-Drain Voltage - V
G007
1s
Single Pulse
Typical R θJA = 105°C/W (min Cu)
DC
0.1
1
10
VDS - Drain-to-Source Voltage - V
100
T C = 25°C
10
T C = 125°C
1
0.01
0.1
1
t(AV) - Time in Avalanche - ms
G009
Figure 10. Maximum Safe Operating Area
10
G010
Figure 11. Single Pulse Unclamped Inductive Switching
TEXT ADDED FOR SPACING
TEXT ADDED FOR SPACING
IDS - Drain-to-Source Current - A
100
90
80
70
60
50
40
30
20
10
0
-50
-25
0
25
50
75
100 125
T C - Case Temperature - °C
150
175
G011
Figure 12. Maximum Drain Current vs. Temperature
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CSD17507Q5A
SLPS243A – JULY 2010 – REVISED AUGUST 2010
www.ti.com
MECHANICAL DATA
Q5A Package Dimensions
L
E2
H
K
7
D2
3
4
b
4
5
5
6
3
6
e
D1
7
2
2
8
8
1
1
q
L1
Top View
Bottom View
Side View
c
A
q
E1
E
Front View
M0135-01
DIM
6
MILLIMETERS
MIN
NOM
MAX
A
0.90
1.00
1.10
b
0.33
0.41
0.51
c
0.20
0.25
0.34
D1
4.80
4.90
5.00
D2
3.61
3.81
4.02
E
5.90
6.00
6.10
E1
5.70
5.75
5.80
E2
3.38
3.58
3.78
e
1.17
1.27
1.37
H
0.41
0.56
0.71
K
1.10
L
0.51
0.61
0.71
L1
0.06
0.13
0.20
q
0°
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12°
Copyright © 2010, Texas Instruments Incorporated
Product Folder Link(s): CSD17507Q5A
CSD17507Q5A
www.ti.com
SLPS243A – JULY 2010 – REVISED AUGUST 2010
Recommended PCB Pattern
F1
F7
DIM
F3
8
1
F2
F11
F5
F9
5
4
F6
F8
F4
F10
M0139-01
MILLIMETERS
INCHES
MIN
MAX
MIN
MAX
F1
6.205
6.305
0.244
0.248
F2
4.46
4.56
0.176
0.18
F3
4.46
4.56
0.176
0.18
F4
0.65
0.7
0.026
0.028
F5
0.62
0.67
0.024
0.026
F6
0.63
0.68
0.025
0.027
F7
0.7
0.8
0.028
0.031
F8
0.65
0.7
0.026
0.028
F9
0.62
0.67
0.024
0.026
F10
4.9
5
0.193
0.197
F11
4.46
4.56
0.176
0.18
For recommended circuit layout for PCB designs, see application note SLPA005 – Reducing Ringing Through
PCB Layout Techniques.
K0
4.00 ±0.10 (See Note 1)
0.30 ±0.05
2.00 ±0.05
+0.10
–0.00
12.00 ±0.30
Ø 1.50
1.75 ±0.10
TEXT ADDED FOR SPACING
TEXT ADDED FOR SPACING
Q5A Tape and Reel Information
5.50 ±0.05
B0
R 0.30 MAX
A0
8.00 ±0.10
Ø 1.50 MIN
A0 = 6.50 ±0.10
B0 = 5.30 ±0.10
K0 = 1.40 ±0.10
R 0.30 TYP
M0138-01
NOTES: 1. 10-sprocket hole-pitch cumulative tolerance ±0.2
2. Camber not to exceed 1mm in 100mm, noncumulative over 250mm
3. Material: black static-dissipative polystyrene
4. All dimensions are in mm (unless otherwise specified)
5. A0 and B0 measured on a plane 0.3mm above the bottom of the pocket
spacer
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CSD17507Q5A
SLPS243A – JULY 2010 – REVISED AUGUST 2010
www.ti.com
REVISION HISTORY
Changes from Original (July 2010) to Revision A
•
8
Page
Changed the Y axis scale for Figure 5 ................................................................................................................................. 4
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Product Folder Link(s): CSD17507Q5A
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