DIM100WHS17-A000 DIM100WHS17-A000 Half Bridge IGBT Module PDS5715-1.1 Febuary 2004 FEATURES ■ 10µs Short Circuit Withstand ■ Non Punch Through Silicon ■ Isolated Copper Base Plate KEY PARAMETERS VCES (typ) VCE(sat) * (max) IC (max) IC(PK) 1700V 2.7V 100A 200A *(measured at the power busbars and not the auxiliary terminals) APPLICATIONS ■ Inverters ■ Motor Controllers 7(E2) The Powerline range of high power modules includes half bridge, chopper, dual, single and bi-directional switch configurations covering voltages from 600V to 3300V and currents up to 3600A. 6(G2) 1(E1C2) 2(E2) 4(G1) 5(E1) The DIM100WHS17-A000 is a half bridge 1700V, n channel enhancement mode, insulated gate bipolar transistor (IGBT) module. The IGBT has a wide reverse bias safe operating area (RBSOA) plus full 10µs short circuit withstand. The module incorporates an electrically isolated base plate and low inductance construction enabling circuit designers to optimise circuit layouts and utilise grounded heat sinks for safety. 3(C1) Fig. 1 Half bridge circuit diagram ORDERING INFORMATION Order As: DIM100WHS17-A000 Note: When ordering, please use the whole part number. Outline type code: W (See package details for further information) Fig. 2 Module outline Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures. www.dynexsemi.com 1/8 DIM100WHS17-A000 ABSOLUTE MAXIMUM RATINGS - PER ARM Stresses above those listed under 'Absolute Maximum Ratings' may cause permanent damage to the device. In extreme conditions, as with all semiconductors, this may include potentially hazardous rupture of the package. Appropriate safety precautions should always be followed. Exposure to Absolute Maximum Ratings may affect device reliability. Tcase = 25˚C unless stated otherwise Symbol Test Conditions Parameter VCES Collector-emitter voltage VGES Gate-emitter voltage VGE = 0V - Max. Units 1700 V ±20 V Continuous collector current Tcase = 65˚C 100 A IC(PK) Peak collector current 1ms, Tcase = 110˚C 200 A Pmax Max. transistor power dissipation Tcase = 25˚C, Tj = 150˚C 694 W Diode I2t value VR = 0, tp = 10ms, Tvj = 125˚C 1.87 kA2s Visol Isolation voltage - per module Commoned terminals to base plate. AC RMS, 1 min, 50Hz 4000 V QPD Partial discharge - per module IEC1287. V1 = 1800V, V2 = 1300V, 50Hz RMS 10 PC IC I2t THERMAL AND MECHANICAL RATINGS Internal insulation: Al2O3 Baseplate material: Cu Creepage distance: 24mm Test Conditions Parameter Symbol Rth(j-c) Clearance: 13mm CTI (Critical Tracking Index): 175 Thermal resistance - transistor (per arm) Continuous dissipation - Min. Typ. Max. Units - - 0.18 ˚C/W - - 0.4 ˚C/W - - 0.015 ˚C/W junction to case Rth(j-c) Thermal resistance - diode (per arm) Continuous dissipation junction to case Rth(c-h) Tj Tstg - Thermal resistance - case to heatsink Mounting torque 5Nm (per module) (with mounting grease) Junction temperature Transistor - - 150 ˚C Diode - - 125 ˚C –40 - 125 ˚C 3 - 5 Nm 2.5 - 5 Nm Storage temperature range Screw torque Mounting - M6 Electrical connections - M6 2/8 Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures. www.dynexsemi.com DIM100WHS17-A000 ELECTRICAL CHARACTERISTICS Tcase = 25˚C unless stated otherwise. Min. Typ. Max. Units VGE = 0V, VCE = VCES - - 0.5 mA VGE = 0V, VCE = VCES, Tcase = 125˚C - - 3 mA Gate leakage current VGE = ±20V, VCE = 0V - - 1 µA VGE(TH) Gate threshold voltage IC = 5mA, VGE = VCE 4.5 5.5 6.5 V VCE(sat)† Collector-emitter saturation voltage VGE = 15V, IC = 100A - 2.7 3.4 V VGE = 15V, IC = 100A, , Tcase = 125˚C - 3.4 4.0 V Parameter Symbol ICES IGES Collector cut-off current Test Conditions IF Diode forward current DC - - 100 A IFM Diode maximum forward current tp = 1ms - - 200 A VF† Diode forward voltage IF = 100A - 2.2 2.5 V IF = 100A, Tcase = 125˚C - 2.3 2.6 V VCE = 25V, VGE = 0V, f = 1MHz - 8 - nF Cies Input capacitance LM Module inductance - per arm - - 20 - nH Internal transistor resistance - per arm - - 0.23 - mΩ RINT SCData Short circuit. ISC Tj = 125˚C, VCC = 1000V, I1 - 450 - A tp ≤ 10µs, VCE(max) = VCES – L*. di/dt I2 - 400 - A IEC 60747-9 Note: † Measured at the power busbars and not the auxiliary terminals. * L is the circuit inductance + LM Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures. www.dynexsemi.com 3/8 DIM100WHS17-A000 ELECTRICAL CHARACTERISTICS Tcase = 25˚C unless stated otherwise Min. Typ. Max. Units IC = 100A - 590 - ns Fall time VGE = ±15V - 300 - ns EOFF Turn-off energy loss VCE = 900V - 20 - mJ td(on) Turn-on delay time RG(ON) = RG(OFF) = 10Ω - 320 - ns L ~ 100nH - 90 - ns Parameter Symbol td(off) tf tr Turn-off delay time Rise time Test Conditions EON Turn-on energy loss - 25 - mJ Qg Gate charge - 1 - µC Qrr Diode reverse recovery charge IF = 100A, VR = 900V, - 33 - µC Irr Diode reverse current dIF/dt = 1500A/µs - 100 - A - 21 - mJ Min. Typ. Max. Units IC = 100A - 880 - ns Fall time VGE = ±15V - 410 - ns EOFF Turn-off energy loss VCE = 900V - 30 - mJ td(on) Turn-on delay time RG(ON) = RG(OFF) = 10Ω - 450 - ns L ~ 100nH - 110 - ns - 40 - mJ IF = 100A, VR = 900V, - 50 - µC dIF/dt = 1250A/µs - 100 - A - 32 - mJ EREC Diode reverse recovery energy Tcase = 125˚C unless stated otherwise Parameter Symbol td(off) tf tr Turn-off delay time Rise time EON Turn-on energy loss Qrr Diode reverse recovery charge Irr Diode reverse current EREC 4/8 Diode reverse recovery energy Test Conditions Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures. www.dynexsemi.com DIM100WHS17-A000 TYPICAL CHARACTERISTICS 200 200 Common emitter. Tcase = 125˚C Common emitter. Tcase = 25˚C 175 Vce is measured at power busbars 175 Vce is measured at power busbars and not the auxiliary terminals and not the auxiliary terminals 150 Collector current, IC - (A) Collector current, IC - (A) 150 125 100 75 100 75 50 50 VGE = 20V 15V 12V 10V 25 0 0 125 0.5 1 1.5 2 2.5 3 3.5 4 VGE = 20V 15V 12V 10V 25 4.5 0 0 5 0.5 1 Collector-emitter voltage, Vce - (V) Fig. 3 Typical output characteristics 1.5 2 2.5 3 3.5 4 4.5 5 Collector-emitter voltage, Vce - (V) 5.5 6 Fig. 4 Typical output characteristics 70 Conditions: Tc = 125˚C, IC = 100A, 60 Vcc = 900V 40 Conditions: Tc = 125˚C, 35 Rg = 10 ohms, Vcc = 900V 50 Switching energy, Esw - (mJ) Switching energy, Esw - (mJ) 30 25 20 15 10 Eon Eoff Erec 5 0 0 10 20 30 40 50 60 70 Collector current, IC - (A) 80 90 100 Fig. 5 Typical switching energy vs collector current 40 30 20 10 0 8 Eon Eoff Erec 10 12 14 16 Gate resistance, Rg - (Ohms) 20 Fig. 6 Typical switching energy vs gate resistance Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures. www.dynexsemi.com 18 5/8 DIM100WHS17-A000 200 225 VF is measured at power busbars and not the auxiliary terminals 200 175 Tj = 25˚C 175 Chip Collector current, IC - (A) Foward current, IF - (A) 150 150 125 Tj = 125˚C Module 125 100 100 75 75 50 50 25 25 0 0 2.0 1.0 1.5 2.5 Foward voltage, VF - (V) 0.5 3.0 Conditions: Tcase = 125˚C Vge = 15V Rg(off) = 10 ohms 0 0 3.5 200 400 600 800 1000 1200 1400 1600 1800 Collector emitter voltage, Vce - (V) Fig. 7 Diode typical forward characteristics Fig. 8 Reverse bias safe operating area 1000 200 Diode Transient thermal impedance, Zth (j-c) - (°C/kW ) Reverse recovery current, Irr - (A) 175 150 125 100 75 50 25 Transistor 100 10 IGBT Tj = 125˚C 0 0 400 1200 800 Reverse voltage, VR - (V) 1600 Fig. 9 Diode reverse bias safe operating area 6/8 Diode 2000 1 0.001 Ri (˚C/KW) τi (ms) Ri (˚C/KW) τi (ms) 0.01 1 4.20 0.11 9.98 0.01 2 3 23.12 84.7 3.14 45.60 50.56 148.48 3.21 38.58 0.1 Pulse width, tp - (s) 1 4 59.06 143.02 180.18 113.97 10 Fig. 10 Transient thermal impedance Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures. www.dynexsemi.com DIM100WHS17-A000 PACKAGE DETAILS For further package information, please visit our website or contact Customer Services. All dimensions in mm, unless stated otherwise. DO NOT SCALE. 7(E2) 6(G2) 1(E1C2) 2(E2) 3(C1) 4(G1) 5(E1) Nominal weight: 420g Module outline type code: W Fig. 11 Package details Caution: This device is sensitive to electrostatic discharge. Users should follow ESD handling procedures. www.dynexsemi.com 7/8 POWER ASSEMBLY CAPABILITY The Power Assembly group was set up to provide a support service for those customers requiring more than the basic semiconductor, and has developed a flexible range of heatsink and clamping systems in line with advances in device voltages and current capability of our semiconductors. We offer an extensive range of air and liquid cooled assemblies covering the full range of circuit designs in general use today. The Assembly group offers high quality engineering support dedicated to designing new units to satisfy the growing needs of our customers. Using the latest CAD methods our team of design and applications engineers aim to provide the Power Assembly Complete Solution (PACs). HEATSINKS The Power Assembly group has its own proprietary range of extruded aluminium heatsinks which have been designed to optimise the performance of Dynex semiconductors. Data with respect to air natural, forced air and liquid cooling (with flow rates) is available on request. For further information on device clamps, heatsinks and assemblies, please contact your nearest sales representative or Customer Services. http://www.dynexsemi.com e-mail: [email protected] HEADQUARTERS OPERATIONS DYNEX SEMICONDUCTOR LTD Doddington Road, Lincoln. Lincolnshire. LN6 3LF. United Kingdom. Tel: +44-(0)1522-500500 Fax: +44-(0)1522-500550 CUSTOMER SERVICE Tel: +44 (0)1522 502753 / 502901. Fax: +44 (0)1522 500020 SALES OFFICES Benelux, Italy & Switzerland: Tel: +33 (0)1 64 66 42 17. Fax: +33 (0)1 64 66 42 19. France: Tel: +33 (0)2 47 55 75 53. Fax: +33 (0)2 47 55 75 59. Germany, Northern Europe, Spain & Rest Of World: Tel: +44 (0)1522 502753 / 502901. Fax: +44 (0)1522 500020 North America: Tel: (440) 259-2060. Fax: (440) 259-2059. Tel: (949) 733-3005. Fax: (949) 733-2986. These offices are supported by Representatives and Distributors in many countries world-wide. © Dynex Semiconductor 2003 TECHNICAL DOCUMENTATION – NOT FOR RESALE. PRODUCED IN UNITED KINGDOM This publication is issued to provide information only which (unless agreed by the Company in writing) may not be used, applied or reproduced for any purpose nor form part of any order or contract nor to be regarded as a representation relating to the products or services concerned. No warranty or guarantee express or implied is made regarding the capability, performance or suitability of any product or service. The Company reserves the right to alter without prior notice the specification, design or price of any product or service. Information concerning possible methods of use is provided as a guide only and does not constitute any guarantee that such methods of use will be satisfactory in a specific piece of equipment. It is the user's responsibility to fully determine the performance and suitability of any equipment using such information and to ensure that any publication or data used is up to date and has not been superseded. These products are not suitable for use in any medical products whose failure to perform may result in significant injury or death to the user. All products and materials are sold and services provided subject to the Company's conditions of sale, which are available on request. All brand names and product names used in this publication are trademarks, registered trademarks or trade names of their respective owners. www.dynexsemi.com