HAT2142H Silicon N Channel Power MOS FET Power Switching REJ03G1194-0700 (Previous: ADE-208-1583E) Rev.7.00 Sep 07, 2005 Features • • • • Capable of 7 V gate drive Low drive current High density mounting Low on-resistance RDS (on) = 35 mΩ typ. (at VGS = 10 V) Outline RENESAS Package code: PTZZ0005DA-A (Package name: LFPAK) 5 D 5 4 G 12 1, 2, 3 4 5 34 S S S 1 2 3 Rev.7.00 Sep 07, 2005 page 1 of 7 Source Gate Drain HAT2142H Absolute Maximum Ratings (Ta = 25°C) Item Drain to source voltage Gate to source voltage Drain current Drain peak current Body-drain diode reverse drain current Symbol VDSS Value 100 Unit V VGSS ID ±20 10 V A 40 10 A A 10 10 A mJ 15 150 W °C –55 to +150 °C ID (pulse) IDR Note 1 Note 3 Avalanche current Avalanche energy IAP Note 3 EAR Channel dissipation Channel temperature Pch Tch Note 2 Storage temperature Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1% 2. Tc = 25 °C 3. Value at Tch = 25°C, Rg ≥ 50 Ω Tstg Electrical Characteristics (Ta = 25°C) Item Symbol Min Typ Max Unit V (BR) DSS V (BR) GSS 100 ±20 — — — — V V ID = 10 mA, VGS = 0 IG = ±100 µA, VDS = 0 IGSS IDSS — — — — ±10 1 µA µA VGS = ±16 V, VDS = 0 VDS = 100 V, VGS = 0 Gate to source cutoff voltage Static drain to source on state resistance VGS (off) RDS (on) 2.0 — — 35 3.5 44 V mΩ VDS = 10 V, ID = 1 mA Note 4 ID = 5 A, VGS = 10 V Forward transfer admittance RDS (on) |yfs| — 9 38 15 51 — mΩ S ID = 5 A, VGS = 7 V Note 4 ID = 5 A, VDS = 10 V Input capacitance Output capacitance Ciss Coss — — 2000 175 — — pF pF Reverse transfer capacitance Total gate charge Crss Qg — — 90 32 — — pF nC VDS = 10 V VGS = 0 f = 1 MHz Gate to source charge Gate to drain charge Qgs Qgd — — 8.0 7.5 — — nC nC Turn-on delay time Rise time td (on) tr — — 18 11 — — ns ns Turn-off delay time Fall time td (off) tf — — 60 9 — — ns ns Body-drain diode forward voltage Body-drain diode reverse recovery time VDF trr — — 0.82 50 1.07 — V ns Drain to source breakdown voltage Gate to source breakdown voltage Gate to source leak current Zero gate voltage drain current Note: 4. Pulse test Rev.7.00 Sep 07, 2005 page 2 of 7 Test Conditions Note 4 VDD = 50 V VGS = 10 V ID = 10 A VGS = 10 V, ID = 5 A VDD ≅ 30 V RL = 6 Ω Rg = 4.7 Ω IF = 10 A, VGS = 0 IF = 10 A, VGS = 0 diF/dt = 100 A/µs Note 4 HAT2142H Main Characteristics Power vs. Temperature Derating Maximum Safe Operation Area 500 ID (A) 30 Drain Current Channel Dissipation Pch (W) 40 20 10 100 10 DC 0 50 100 150 Case Temperature 0.01 0.1 0.3 200 µs 3 10 30 100 300 1000 VDS (V) Typical Transfer Characteristics 10 VDS = 10 V Pulse Test ID (A) 4.5 V 8 1 Drain to Source Voltage Pulse Test 10 V ID (A) s = 1 pe 0 m s ra tio n µs Operation in this area is limited by RDS (on) 0.1 Tc (°C) 10 4.0 V 8 6 3.8 V 4 2 VGS = 3.5 V Drain Current 6 Drain Current m 10 0 O 1 Typical Output Characteristics 4 25°C 0 0 2 4 6 Drain to Source Voltage 10 8 VDS (V) Pulse Test 300 ID = 5 A 100 2A 1A 0 0 4 8 12 Gate to Source Voltage Rev.7.00 Sep 07, 2005 page 3 of 7 16 20 VGS (V) 1 2 3 4 5 VGS (V) Static Drain to Source on State Resistance vs. Drain Current Drain to Source on State Resistance RDS (on) (mΩ) 400 0 Gate to Source Voltage Drain to Source Saturation Voltage vs. Gate to Source Voltage 200 Tc = 75°C 2 –25°C 0 VDS (on) (mV) 10 Tc = 25°C 1 shot Pulse 0 Drain to Source Voltage PW 1 100 Pulse Test 50 VGS = 7 V 10 V 20 10 0.1 0.3 1 3 Drain Current 10 30 ID (A) 100 Forward Transfer Admittance vs. Drain Current Static Drain to Source on State Resistance vs. Temperature Forward Transfer Admittance |yfs| (S) Static Drain to Source on State Resistance RDS (on) (mΩ) HAT2142H 100 Pulse Test 5A 80 ID = 1 A, 2 A 60 VGS = 7 V 1 A, 2 A, 5 A 40 10 V 20 0 –25 0 25 50 75 100 125 150 Case Temperature Tc 100 Tc = –25°C 30 10 75°C 3 25°C 1 0.3 VDS = 10 V Pulse Test 0.1 0.1 0.3 30 100 10000 Capacitance C (pF) Reverse Recovery Time trr (ns) 10 Typical Capacitance vs. Drain to Source Voltage 100 50 20 di / dt = 100 A / µs VGS = 0, Ta = 25°C 10 0.1 0.3 1 3 10 Reverse Drain Current 30 3000 Ciss 1000 300 Coss 100 Crss 30 10 100 VGS = 0 f = 1 MHz 0 10 16 150 12 VDD = 100 V 50 V 25 V VDS 100 50 VGS 8 4 VDD = 100 V 50 V 25 V 0 0 8 16 Gate Charge Rev.7.00 Sep 07, 2005 page 4 of 7 24 32 Qg (nc) 40 50 0 40 500 VGS = 10 V, VDD = 30 V PW = 5 µs Switching Time t (ns) 200 VGS (V) 20 ID = 10 A 30 Switching Characteristics Gate to Source Voltage 250 20 Drain to Source Voltage VDS (V) IDR (A) Dynamic Input Characteristics VDS (V) 3 Drain Current ID (A) (°C) Body-Drain Diode Reverse Recovery Time Drain to Source Voltage 1 200 100 td(off) 50 tr td(on) 20 10 5 0.1 0.2 tf 0.5 1 2 5 10 20 Drain Current ID (A) 50 100 HAT2142H Reverse Drain Current vs. Source to Drain Voltage Repetitive Avalanche Energy EAR (mJ) Maximum Avalanche Energy vs. Channel Temperature Derating Reverse Drain Current IF (A) 10 8 10 V 5V 6 VGS = 0 4 2 Pulse Test 0 0 0.4 0.8 1.2 1.6 Source to Drain Voltage 2.0 5 IAP = 10 A VDD = 50 V duty < 0.1 % Rg ≥ 50 Ω 4 3 2 1 0 25 50 75 100 125 150 Channel Temperature Tch (°C) VSDF (V) Normalized Transient Thermal Impedance γ s (t) Normalized Transient Thermal Impedance vs. Pulse Width 3 Tc = 25°C 1 D=1 0.5 0.3 0.2 0.1 θch – c (t) = γ s (t) • θch – c θch – c = 8.33°C/W, Tc = 25°C 0.1 0.05 0.03 0.02 1 0.0 D= PDM 1s h p ot 0.01 10 µ uls e PW T PW T 100 µ 10 m 1m 100 m 1 10 Pulse Width PW (S) Avalanche Test Circuit VDS Monitor Avalanche Waveform L EAR = 1 • L • IAP2 • 2 VDSS VDSS – VDD IAP Monitor Rg V(BR)DSS IAP D.U.T VDD VDS ID Vin 15 V 50 Ω 0 Rev.7.00 Sep 07, 2005 page 5 of 7 VDD HAT2142H Switching Time Test Circuit Switching Time Waveform 90% Vout Monitor Vin Monitor D.U.T. Rg Vin Vout Vin 10 V VDS = 30 V 10% 10% 90% td(on) Rev.7.00 Sep 07, 2005 page 6 of 7 10% RL tr 90% td(off) tf HAT2142H Package Dimensions JEITA Package Code RENESAS Code SC-100 PTZZ0005DA-A Package Name MASS[Typ.] LFPAK Unit: mm 0.080g 4.9 5.3 Max 4.0 ± 0.2 +0.05 4.2 6.1 –0.3 +0.1 3.95 5 4 0° – 8° +0.25 +0.05 0.20 –0.03 0.6 –0.20 1.3 Max 1 1.1 Max +0.03 0.07 –0.04 3.3 1.0 0.25 –0.03 0.75 Max 0.10 1.27 0.40 ± 0.06 0.25 M (Ni/Pd/Au plating) Ordering Information Part Name Quantity Shipping Container HAT2142H-EL-E 2500 pcs Taping Note: For some grades, production may be terminated. Please contact the Renesas sales office to check the state of production before ordering the product. Rev.7.00 Sep 07, 2005 page 7 of 7 Sales Strategic Planning Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Keep safety first in your circuit designs! 1. Renesas Technology Corp. puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of nonflammable material or (iii) prevention against any malfunction or mishap. Notes regarding these materials 1. These materials are intended as a reference to assist our customers in the selection of the Renesas Technology Corp. product best suited to the customer's application; they do not convey any license under any intellectual property rights, or any other rights, belonging to Renesas Technology Corp. or a third party. 2. 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