HD74SSTV32852 24-bit to 48-bit Registered Buffer with SSTL_2 Inputs and Outputs REJ03D0833-0400 (Previous: ADE-205-687C) Rev.4.00 Apr 07, 2006 Description The HD74SSTV32852 is a 24-bit to 48-bit registered buffer designed for 2.3 V to 2.7 V Vcc operation and LVCMOS reset (RESET) input / SSTL_2 data (D) inputs and CLK input. Data flow from D to QA, QB is controlled by differential clock pins (CLK, CLK) and the RESET. Data is triggered on the positive edge of the positive clock (CLK), and the negative clock (CLK) must be used to maintain noise margins. When RESET is low, all registers are reset and all outputs are low. To ensure defined outputs from the register before a stable clock has been supplied, RESET must be held in the low state during power up. Features • • • • Supports LVCMOS reset (RESET)) input / SSTL_2 data (D) inputs and CLK input Differential SSTL_2 (Stub series terminated logic) CLK signal Pinout optimizes DIMM PCB layout Ordering Information Part Name HD74SSTV32852LBEL Package Type LFBGA-114pin Package Code (Previous code) PLBG0114GA-A (BP-114V) Package Abbreviation Taping Abbreviation (Quantity) LB EL (1,000 pcs / Reel) Function Table Inputs RESET *2 L H H CL CLK LK LK X or floating ↓ ↓ Outputs CLK X or floating ↑ ↑ D X or floating H L QA L H L H L or H H or L X Q0 H: High level L: Low level X: Immaterial ↑: Low to high transition ↓: High to low transition Notes: 1. Output level before the indicated steady state input conditions were established. 2. See under the figure. Rev.4.00 Apr 07, 2006 page 1 of 8 *1 QB L H L Q0 *1 HD74SSTV32852 Pin Arrangement 1 2 3 4 5 6 A Height 1.4 mm 0.8 mm pitch 0.5 mm 114-Ball B C D E F G 16 mm H J K L M N P R T U V W 5.5 mm (Top view) Terminal Assignment A B C D E F G H J K L M N P R T U V W 1 Q2A Q3A Q5A Q7A Q8A Q10A Q12A Q13A Q14A Q17A Q18A Q20A Q22A Q23A Q24A D2 D4 D5 D8 Rev.4.00 Apr 07, 2006 page 2 of 8 2 Q1A VDDQ Q4A Q6A GND Q9A Q11A VCC Q15A Q16A Q19A VDDQ Q21A VDDQ VCC D1 D3 D7 D9 3 CLK GND VDDQ GND VDDQ VDDQ GND VDDQ GND VDDQ GND GND VDDQ GND RESET D6 D10 D11 D12 4 CLK GND VDDQ GND VDDQ VDDQ GND VDDQ GND VDDQ GND GND VDDQ GND VREF D18 D22 D23 D24 5 Q1B VDDQ Q4B Q6B GND Q9B Q11B VCC Q15B Q16B Q19B VDDQ Q21B VDDQ VCC D13 D15 D19 D21 6 Q2B Q3B Q5B Q7B Q8B Q10B Q12B Q13B Q14B Q17B Q18B Q20B Q22B Q23B Q24B D14 D16 D17 D20 HD74SSTV32852 Absolute Maximum Ratings Item Supply voltage Input voltage *1 Output voltage *1 Input clamp current Output clamp current Continuous output current VCC, VDDQ or GND current / pin Package thermal impedance Storage temperature Notes: Symbol VCC or VDDQ VI VO IIK IOK IO ICC, IDDQ or IGND θJA Tstg Ratings –0.5 to 3.6 –0.5 to VDDQ+0.5 –0.5 to VDDQ+0.5 ±50 ±50 ±50 ±100 36 –65 to +150 Unit V V V mA mA mA mA °C/W °C Conditions VI < 0 or VI > VCC VO < 0 or VO > VDDQ VO = 0 to VDDQ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability. 1. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed. Recommended Operating Conditions Item Supply voltage Output supply voltage Reference voltage Termination voltage Input voltage AC high level input voltage AC low level input voltage DC high level input voltage DC low level input voltage High level input voltage Low level input voltage Differential (Common mode range) input voltage (Minimum peak to peak input) High level output current Low level output current Operating temperature Symbol VCC VDDQ VREF VTT VI VIH VIL VIH VIL VIH VIL VCMR VPP Min VDDQ 2.3 1.15 VREF–40 mV 0 VREF+310 mV — VREF+150 mV — 1.7 –0.3 0.97 360 Typ 2.5 2.5 1.25 VREF — — — — — — — — — Max 2.7 2.7 1.35 VREF+40 mV VCC — VREF–310 mV — VREF–150 mV VDDQ+0.3 0.7 1.53 — Unit V V V V V V V V V V V V mV IOH IOL Ta — — 0 — — — –20 20 70 mA mA °C Conditions VREF = 0.5 × VDDQ D D D D RESET RESET CLK, CLK CLK, CLK Note: The RESET input of the device must be held at VDDQ or GND to ensure proper device operation. The differential inputs must not be floating, unless RESET is low. Rev.4.00 Apr 07, 2006 page 3 of 8 HD74SSTV32852 Logic Diagram *1 RESET R3 CLK CLK A3 A4 T2 D1 A2 1D C1 A5 R R4 VREF Q1A Q1B To 23 other channels Note: 1. RESET input gate is connected to VDDQ. Electrical Characteristics Item Input diode voltage Symbol VIK Output voltage VOH VOL Input current (All inputs) Quiescent supply current IIN ICC Standby current Dynamic operating clock only *2 ICC (stdy) ICCD *2 VCC (V) 2.3 Min — 2.3 to 2.7 VCC–0.2 2.3 1.95 2.3 to 2.7 — 2.3 0 2.7 — 2.7 — 2.7 2.7 — — Typ — Max –1.2 Unit V — — — — — — — VDDQ 0.2 0.35 ±5 35 V — 80 10 — µA mA µA µA/ clock MHz Test Conditions IIN = –18 mA IOH = –100 µA IOH = –16 mA IOL = 100 µA IOL = 16 mA VIN = 2.7 V or 0 VIN = VIH(AC) or VIL(AC), IO = 0 RESET = GND RESET = VCC, VI = VIH(AC) or VIL(AC), CLK and CLK switching 50% duty cycle ICCD Dynamic operating per each data input *3 2.7 — 14 — µA/ clock MHz/ data input RESET = VCC, VI = VIH(AC) or VIL(AC), CLK and CLK switching 50% duty cycle. One data input switching at half clock frequency, 50% duty cycle. rOH rOL 2.3 to 2.7 2.3 to 2.7 7 7 — — 20 20 Ω Ω IOH = –20 mA IOL = 20 mA rO(∆) 2.5 2.5 *1 — 4.0 3.0 3.5 — — — — 4 5.0 4.0 5.0 Ω pF IO = 20 mA, Ta = 25°C VI = VREF±310 mV Output high *3 Output low *3 rOH – rOL each separate bit Data inputs Input capacitance CLK and CLK *2 RESET CIN Notes: 1. All typical values are at VCC = 2.5 V, Ta = 25°C. 2. Total ICC (max) = ICC + {ICCD (clock)×f(clock)} + {ICCD (Data)×1/2f(clock)×24} 3. This is effective in the case that it did terminate by resistance. Rev.4.00 Apr 07, 2006 page 4 of 8 VCMR = 1.25 V, VPP = 360 mV VI = VCC or GND HD74SSTV32852 Switching Characteristics Item Symbol VCC = 2.5 ± 0.2 V Min Max — 200 0.75 — 0.9 — 0.75 — 0.9 — 22 — Clock frequency *1 Setup time Fast slew rate *4, 6 Slow slew rate *5, 6 Hold time Fast slew rate *4, 6 Slow slew rate *5, 6 Differential inputs active time fclock tsu Differential inputs inactive time tinact 22 Pulse width Output slew *3 tw tSL 2.5 1 th tact Unit MHz ns Test Condition Data before CLK↑, CLK↓ ns Data after CLK↑, CLK↓ ns Data inputs must be low after RESET high. — ns — 4 ns volt/ns Data and clock inputs must be held at valid levels (not floating) after RESET low. CLK, CLK “H” or “L” (CL = 30 pF, RL = 50 Ω, VREF = VTT = VDDQ × 0.5) Item Symbol Maximum clock frequency 4. 5. 6. Min 200 Typ — Max — Unit FROM (Input) TO (Output) MHz tPLH, tPHL 1.1 — 3.1 ns CLK, CLK QA, QB tPHL — — 5.0 RESET QA, QB Although the clock is differential, all timing is relative lative to CLK going high and CLK going low. This timing relationship is specified into test load (see waveforms – 3, 4) with all of the outputs switching. Assumes into an equivalent, distributed load to the address net structure def defined in the application information provided in this specification. For data signal input slew rate ≥ 1 V/ns. For data signal input slew rate ≥ 0.5 V/ns and < 1 V/ns. CLK, CLK signals input slew rates are ≥ 1 V/ns. Propagation delay time Notes: 1. 2. 3. fmax VCC = 2.5 ± 0.2 V *2 Rev.4.00 Apr 07, 2006 page 5 of 8 HD74SSTV32852 Test Circuit VTT *2 50 Ω Test point *1 C L = 30 pF Notes: 1. CL includes probe and jig capacitance. 2. VTT = VREF = VDDQ × 0.5 Waveforms – 1 LVCMOS RESET Input VCC VCC /2 VCC /2 0V tinact tact *1 I CC I CCH 90 % 10 % I CCL Waveforms – 2 tw VIH Input VREF VREF VIL Timing input VCMR tsu VPP th VIH Input VREF VREF VIL Rev.4.00 Apr 07, 2006 page 6 of 8 HD74SSTV32852 Waveforms – 3 Timing input VCMR VCMR tPLH VPP tPHL V OH Output VTT VTT VOL Waveforms – 4 LVCMOS RESET Input VIH VCC /2 VIL tPHL VOH Output VTT VOL Notes: 1. ICC tested with clock and data inputs held at VCC or GND, and IO = 0 mA. 2. All input pulses are supplied by generators having the following characteristics : PRR ≤ 10 MHz, Zo = 50 Ω,, input slew rate = 1 V/ns ±20% (unless otherwise specified). 3. The outputs are measured one at a time with one transition per measurement. 4. VTT = VREF = VDDQ/2 5. VIH = VREF+310 mV (AC voltage levels) for differential inputs. VIH = VCC for LVCMOS input. 6. VIL = VREF–310 mV (AC voltage levels) for differential inputs. VIL = GND for LVCMOS input. 7. tPLH and tPHL are the same as tpd Rev.4.00 Apr 07, 2006 page 7 of 8 HD74SSTV32852 Package Dimensions JEITA Package Code P-LFBGA114-5.5x16-0.80 RENESAS Code PLBG0114GA-A Previous Code BP-114/BP-114V D w S A MASS[Typ.] 0.22g w S B E Pin#1 Index ×4 v y1 S y A1 A S S A e ZD e W V U Reference Symbol T R P N B M L Dimension in Millimeters Min Nom D 5.50 E 16.00 v Max 0.15 K w 0.20 J A 1.40 H A1 G 0.35 F 0.40 0.45 0.80 e 0.40 0.50 0.60 E b D x 0.08 y 0.10 y1 0.2 ZE C B A SD INDEX MARK 1 2 3 4 6 SE φ b Rev.4.00 Apr 07, 2006 page 8 of 8 5 φ ×M S A B ZD 0.75 ZE 0.80 Sales Strategic Planning Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Keep safety first in your circuit designs! 1. Renesas Technology Corp. puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. 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