ATMEL JTS81102G0-1V1A

Features
• Programmable DMUX Ratio:
•
•
•
•
•
•
•
•
•
•
•
•
•
•
– 1:4: Data Rate Max = 1 Gsps
– PD (8b/10b) < 4.3/4.7 W (ECL 50Ω output)
– 1:8: Data Rate Max = 2 Gsps
– PD (8b/10b) < 6/6.9 W (ECL 50Ω output)
– 1:16 with 1 TS8388B or 1 TS83102G0B and 2 DMUX
Parallel Output Mode
8-/10-bit
ECL Differential Input Data
DataReady or DataReady/2 Input Clock
Input Clock Sampling Delay Adjust
Single-ended Output Data:
– Adjustable Common Mode and Swing
– Logic Threshold Reference Output
– (ECL, PECL, TTL)
Asynchronous Reset
Synchronous Reset
ADC + DMUX Multi-channel Applications:
– Stand-alone Delay Adjust Cell for ADCs Sampling Instant Alignment
Differential Data Ready Output
Built-in Self Test (BIST)
Dual Power Supply VEE = -5V, VCC = +5V
Radiation Tolerance Oriented Design (More than 100 Krad (Si) Expected)
TBGA 240 (Cavity Down) Package
DMUX 8-/10-bit
2 GHz 1:4/8
TS81102G0
Description
The TS81102G0 is a monolithic 10-bit high-speed (up to 2 GHz) demultiplexor,
designed to run with all kinds of ADCs and more specifically with Atmel’s high-speed
ADC 8-bit 1 Gsps TS8388B and ADC 10-bit 2 Gsps TS83102G0B.
The TS81102G0 uses an innovative architecture, including a sampling delay adjust
and tunable output levels. It allows users to process the high-speed output data
stream down to processor speed and uses the very high-speed bipolar technology (25
GHz NPN cut-off frequency).
Rev. 2105C–BDC–11/03
1
Block Diagram
Figure 1. Block Diagram
FS/8
ADCDelAdjIn
ADCDelAdjCtrl
RatioSel
SyncReset
AsyncReset
ClkIn
(to be confirmed)
RatioSel
NbBit
ClkInType
DEMUXDelAdjCtrl
Clock Path
I[0..7/9]
BIST
SwiAdj
VplusDOut
VCC
GND
VEE
DIODE
Data Path
delay
delay
NAP
B2
mux
BIST
8/10
mux
Phase
control
8/10
RstGen
ClkPar
even
master
latch
odd
master
latch
odd
slave
latch
Counter
(8 stage
shift register)
8
Counter
Status
Latch Sel Even/Odd [1..8/10]
8
even
slave
latch
FS/8
Port Selection Clock
8
8
Data
Output
Clock
1
Even Ports
Odd Ports
DataReady
generation
DR/DR
ADCDelAdjOut
A[0..7/9]
RefA
C[0..7/9]
RefC
E[0..7/9]
RefE
G[0..7/9]
RefG
B[0..7/9]
RefB
D[0..7/9]
RefD
F[0..7/9]
RefF
H[0..7/9]
RefH
3
8/10
2
Reset
TS81102G0
2105C–BDC–11/03
TS81102G0
Internal Timing
Diagram
This diagram corresponds to an established operation of the DMUX with Synchronous Reset.
Figure 2. Internal Timing Diagram
500 ps min
Data In
N
N+1
N+2
N+3
N+4
N+5
N+6
N+7
N+8
N+9
N+10 N+11 N+12 N+13 N+14 N+15 N+16 N+17 N+18 N+19 N+20 N+21 N+22 N+23 N+24 N+25 N+26 N+27 N+28 N+29 N+30 N+31
DR In = Fs
DR/2 In = Fs/2 = ClkPar
Master Even Latch
Master Odd Latch
Slave Even Latch
Slave Odd Latch
N
N+2
N+4
N+3
N+1
N
N+5
N+2
N+1
N+6
N+7
N+4
N+3
N+8
N+9
N+6
N+5
N+10
N+11
N+8
N+7
N+12
N+13
N+10
N+9
N+14
N+15
N+12
N+11
N+16
N+17
N+14
N+13
N+18
N+19
N+16
N+15
N+20
N+21
N+18
N+17
N+22
N+23
N+20
N+19
N+24
N+25
N+22
N+21
N+26
N+27
N+24
N+23
N+28
N+29
N+26
N+25
N+30
N+31
N+28
N+27
N+30
N+29
Synchronous reset = Fs/8
Internal reset pulse
Port Select A
Port Select B
Port Select C
Port Select D
Port Select E
Port Select F
Port Select G
Port Select H
Latch Select A
Latch Select B
Latch Select C
Latch Select D
Latch Select E
Latch Select F
Latch Select G
Latch Select H
N
N+8
N+1
N+16
N+9
N+2
N+17
N+10
N+3
N+27
N+20
N+13
N+6
N+26
N+19
N+12
N+5
N+25
N+18
N+11
N+4
N+24
N+21
N+14
N+22
N+7
N+15
N+23
N to N+7
N+8 to N+15
N+16 to N+23
A to H Port Out
A to H LatchOut
DROut
3
2105C–BDC–11/03
Functional
Description
The TS81102G0 is a demultiplexer based on an advanced high-speed bipolar technology featuring a cutoff frequency of 25 GHz. Its role is to reduce the data rate so that the data can be
processed at the DMUX output.
The TS81102G0 provides 2 programmable ratios: 1:4 and 1:8. The maximum data rate is 1
Gsps for the 1:4 ratio and 2 Gsps for the 1:8 ratio.
The TS81102G0 is able to process 8 or 10-bit data flows.
The input clock can be an ECL differential signal or single-ended DC coupled signal. Moreover
it can be a DataReady or DataReady/2 clock.
The input digital data must be an ECL differential signal.
The output signals (Data Ready, digital data and reference voltage) are adjustable with
VplusD independent power supply. Typical output modes are ECL, PECL or TTL.
The Data Ready output is a differential signal. The digital output data and reference voltages
are single-ended signals.
The TS81102G0 is started by an Asynchronous Reset. A Synchronous Reset enables the
user to re-synchronize the output port selection and to minimize loss of data that could occur
within the DMUX.
A delay adjust cell is available to ensure a good phase between the DMUX’ input clock and
input data.
Another delay adjust cell is available to control the ADCss sampling instant alignment, in case
of the ADCs interleaving.
A 10-bit generator is implemented in the TS81102G0, the Built-In Self Test (BIST). This test
sequence is very useful for testing the DMUX at first use.
A fine tuning of the output swing is also available.
The TS81102G0 can be used with the following Atmel ADCs:
4
•
TS8388B(F/FS/GL), 8-bit 1 Gsps ADC
•
TS83102G0B, 10-bit 2 Gsps ADC
TS81102G0
2105C–BDC–11/03
TS81102G0
Main Function
Description
Programmable
DMUX Ratio
The conversion ratio is programmable: 1:4 or 1:8.
Figure 3. Programmable DMUX Ratio
Input Words:
Output Words:
1,2,3,4,5,6,7,8,...
PortA
PortB
1
5
2
6
PortC
3
7
8
1:4
PortD
4
PortE
not used
PortF
not used
PortG
not used
PortH
not used
Input Words:
Output Words:
1,2,3,4,5,6,7,8,...
PortA
PortB
1
2
9 ...
10
PortC
3
11
PortD
4
12
PortE
5
13
PortF
6
14
PortG
7
15
PortH
8
16
1:8
Parallel Output
Mode
...
Figure 4. Parallel Mode
ClkIn
DR
PortA
N
PortB
N+1
PortC
N+2
PortD
N+3
PortE
N+4
PortF
N+5
PortG
N+6
PortH
N+7
Input Clock Sampling Delay Adjust (DEMUXDELADJCTRL)
The input clock phase can be adjusted with an adjustable delay (from 250 to 750 ps). This is to
ensure a proper phase between the clock and input data of the DMUX.
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2105C–BDC–11/03
Asynchronous
Reset
(ASYNCRESET)
Figure 5. Asynchronous Reset
CLKIN
AsyncReset
Port A selected
Port B selected
Port C selected
Port D selected
Port E selected
Port F selected
Port G selected
Port H selected
The Asynchronous Reset is a master reset of the port selection, which works on TTL levels. It
is active on the high level. During an asynchronous reset, the clock must be in a known state.
It is used to start the DMUX.
When it is active, it paralyzes the outputs (the output clock and output data remain at the same
level as before the asynchronous reset). When it comes back to its low level, the DMUX starts:
the outputs are active and the first processed data is on port A.
Synchronous
Reset
(SYNCRESET)
Figure 6. Synchronous Reset
FS
DR/2
SyncReset = FS/8
Internal reset
pulse
Port A selected
Port B selected
Port C selected
Port D selected
Port E selected
Port F selected
Port G selected
Port H selected
The DMUX can be synchronously reset to a programmable state depending on the conversion
ratio. The clock must not be stopped during reset. The synchronization signal is a clock
(SyncRest) whose frequency is FS/8*n where n is an integer (n = 1,2,3,…) in 1:8 mode and
FS/4*n in 1:4 mode. The front edge of this clock is synchronized with Clkln inside the DMUX,
and generates a 200 ps reset pulse. This reset pulse occurs during a fixed level of Clkln.
If the DMUX was synchronized with Syncreset previous to a possible loss of synchronization,
then the output data is immediately correct, no modification can be seen at the output of the
DMUX, and no data is lost (“Internal Timing Diagram” on page 3).
If the DMUX was not synchronized with SyncReset previous to a possible loss of synchronization, then the output data and data ready of the DMUX are changed. The output data is correct
after a number of input clocks corresponding to the pipeline delay (“Timing Diagrams with Synchronous Reset” on page 19).
6
TS81102G0
2105C–BDC–11/03
TS81102G0
Counter
Programmable
State
When the counter is reset, its initial states depends on the conversion ratio:
Pipeline Delay
The maximum pipeline delay depends on the conversion ratio:
•
1:8: counting on 8 bits,
•
1:4: counting on 4 bits.
•
1:8: pipeline delay = 7
•
1:4: pipeline delay = 3
8-/10-bit, with NAP
Mode for the 2
Unused Bit
The DMUX is a 10-bit parallel device. The last two bits (bits 8 and 9) may not be used, and the
corresponding functions are set to nap mode to reduce power consumption.
ECL Differential
Input Data
Input data are ECL compatible (Voh = -0.8V, Vol = -1.8V).
The minimum swing required is 100 mV differential.
All inputs have a 100Ω differential termination resistor. The middle point of these resistors is
connected to ground through a 10 pF capacitor.
Figure 7. ECL Differential Input Data
Gnd
ClkIn
ClkInb
50Ω
50Ω
10 pF
50Ω Differential
Output Data
The output clock for the ADC is generated through a 50Ω loaded long tailed. The 50Ω resistor
is connected to the ground pad via a diode. The levels are (on the 100Ω differential termination resistor): Vol = -1.4V, Voh = -1.0V.
Figure 8. 50Ω Differential Output Data
ADCDelAdjOut
50Ω
50Ω
Gnd
ADCDelAdjOutb
7
2105C–BDC–11/03
Single-ended
Output Data
To reduce the pin number and power consumption of the DMUX, the eight output ports are
single-ended.
To reach the high frequency output (up to 250 MHz) with a reasonable power consumption,
the swing must be limited to a maximum of ±500 mV. The common mode is adjustable from
-1.3V to +2V, with Vplus DOut pins. To ensure better noise immunity, a reference level (common mode) is available (one level by output port).
The output buffers are of ECL type (open emitters – not resistive adapted impedances). They
are designed for a 15 mA average output current, and may be used with a 50Ω termination
impedance.
Figure 9. Single-ended Output Data
VPlusDOut
PadOut
Vee
Following are three application examples for these buffers: ECL/PECL/TTL. Please note that it
is possible to have any other odd output format as far as current (36 mA max) and voltage
(Vplus Dout – VEE ≤ 8.3V) limits are not overridden. The maximum frequency in TTL output
mode depends on the load to be driven.
Table 1. Examples of Application of Buffers
Parameter
ECL
PECL
TTL
Unit
VplusDout
0
3.3
3.3
V
Vtt
-2
1.3
0
V
Swing
±0.5
±0.5
±1
V
Reference
-1.3
2
1.5
V
Voh
-0.8
2.5
2.5
V
Vol
-1.8
1.5
0.5
V
Load
50
50
≥75
Ω
Average Output Current
14
14
15
mA
Output Data rate max.
250
250
250
Msps
This corresponds to the “Adjustable Logic Single” in the pinout description.
The “Adjustable Single” buffers for reference voltage are the same buffers, but the information
available at the output of these buffers is more like analog than logic.
Note:
8
The Max Output Data Rate is given for a typical 50Ω/2 pF load.
TS81102G0
2105C–BDC–11/03
TS81102G0
Differential Data
Ready Output
The front edge of the DataReady output occurs when data is available on the corresponding
port. The frequency of this clock depends on the conversion ratio (1:8 or 1:4), with a duty cycle
of 50%.
The definition is the same as for single-ended output data, but the buffers are differential.
This corresponds to the “Adjustable Logic Differential” in the pinout description.
Built-in Self Test
(BIST)
A pseudo-random 10-bit generator is implemented in the DMUX. It generates a 10-bit signal in
the output of the DMUX, with a period of 512 input clocks. The probability of occurrence of
codes is uniformly spread over the 1024 possible codes: 0 or 1/1024.
Note that the 256 codes of bits 1 to 8 occur at least once. They start with a BIST command, in
phase with the FS/8 clock on Port A. The logic output obtained on the A to H ports depends on
the conversion ratio. The driving clock of BIST is Clkln. The ClklnType must be set to ‘1’
(DataReady ADC clock) to have a different 10-bit code on each output.
The complete BIST sequence is available on request.
Specifications
Absolute
Maximum Ratings
Table 2. Absolute Maximum Ratings
Parameter
Symbol
Positive supply voltage
Comments
Value
Unit
VCC
GND to 6
V
Positive output buffer supply voltage
VPLUSD
GND to 4
V
Negative supply voltage
VEE
GND to -6
V
Analog input voltages
ADCDelAdjCtrl,
ADCDelAdjCtrlb or
DMUXDelAdjCtrl,
DMUXDelAdjCtrlb or
SwiAdj
Voltage range for each
pad
-1 to +1
V
Differential voltage
range
-1 to +1
ECL 50Ω input voltage
Clkln or Clklnb or
I[0…9] or I[0…9]b or
SyncReset or
SyncResetb or
ADCDelAdjln or
ADCDelAdjlnb
Voltage range for each
pad
Maximum difference between ECL 50Ω
input voltages
Clkln – Clklnb or
I[0…9] - I[0…9]b or
SyncReset –
Syncresetb or
ADCDelAdjln ADCDelAdjlnb
-2.2 to +0.6
V
Minimum differential
swing
0.1
V
Maximum differential
swing
2
9
2105C–BDC–11/03
Table 2. Absolute Maximum Ratings (Continued)
Parameter
Symbol
Comments
Value
Unit
Data output current
A[0…9] to H[0…9] or
RefA to RefH or
DR or DRb
Maximum current
36
mA
TTL input voltage
Clkln Type
RatioSel
NbBit
AsyncReset
BIST
GND to VCC
V
Maximum input voltage on diode for
temperature measurement
DIODE
700
mV
Maximum input current on diode
DIODE
8
mA
Maximum junction temperature
Tj
135
°C
Storage temperature
Tstg
-65 to 150
°C
Note:
Absolute maximum ratings are limiting values, to be applied individually, while other parameters are within specified operating
conditions. Long exposure to maximum rating may affect device reliability. The use of a thermal heat sink is mandatory. See
“Thermal and Moisture Characteristics” on page 26.
Recommended
Operating
Conditions
Table 3. Recommended Operating Conditions
Recommended Value
Parameter
Symbol
Positive supply voltage
VCC
Positive output buffer supply
voltage
VPLUSD
Positive output buffer supply
voltage
Min
Typ
Max
Unit
4.45
5
5.25
V
ECL output compatibility
–
0
–
V
VPLUSD
PECL output compatibility
–
3.3
–
V
Positive output buffer supply
voltage
VPLUSD
TTL output compatibility
–
3.3
–
V
Negative supply voltage
VEE
-5.25
-5
-4.75
V
Operating temperature range
TJ
10
Comments
Commercial grade: “C”
Industrial grade: “V”
0 < Tc; Tj < 90
-40 < Tc; Tj < 110
°C
TS81102G0
2105C–BDC–11/03
TS81102G0
Electrical
Operating
Characteristics
Tj (typical) = 70°C. Full Temperature Range: -40°C < Tc; Tj < 110°C.
(Guaranteed temperature range are depending on part number)
Table 4. Electrical Specifications
Parameter
Symbol
Test
Level
Value
Min
Typ
Max
Unit
5
–
0
3.3
3.3
5.25
–
0.25
3.465
3.465
V
–
V
V
V
-5
-4.75
V
Note
Power Requirements
Positive supply voltage
VCC
VPLUSDOUT
ECL
PECL
TTL
VCC
–
VPLUSD
VPLUSD
VPLUSD
1
4.75
–
-0.25
3.135
3.135
VEE
1
-5.25
Negative supply voltage
VEE
(1)
Supply Currents
ECL (50Ω) and PECL (50Ω)
VCC (for every configuration)
1:8, 8 bits
1:8, 10 bits
1:4, 8 bits
1:4, 10 bits
TTL (75Ω)
VCC (for every configuration)
1:8, 8 bits
1:8, 10 bits
1:4, 8 bits
1:4, 10 bits
ICC
IPLUSD
IEE
IPLUSD
IEE
IPLUSD
IEE
IPLUSD
IEE
ICC
IPLUSD
IEE
IPLUSD
IEE
IPLUSD
IEE
IPLUSD
IEE
1
–
540
–
640
–
270
–
320
–
31
1180
719
1140
790
590
592
720
634
–
1820
–
2240
–
910
–
1120
–
mA
mA
mA
mA
mA
mA
mA
mA
mA
1
–
760
–
900
–
380
–
450
–
31
1610
872
1770
980
810
670
880
729
–
2440
–
3010
–
1220
–
1510
–
mA
mA
mA
mA
mA
mA
mA
mA
mA
(1)
Nominal power dissipation
ECL (50Ω)
1:8, 8 bits
1:8, 10 bits
1:4, 8 bits
1:4, 10 bits
PD
PD
PD
PD
1
5.2
5.9
3.9
4.2
5.6
6.4
4.1
4.5
6
6.9
4.3
4.7
W
W
W
W
11
2105C–BDC–11/03
Table 4. Electrical Specifications (Continued)
Parameter
Symbol
PECL (50Ω)
1:8, 8 bits
1:8, 10 bits
1:4, 8 bits
1:4, 10 bits
PD
PD
PD
PD
TTL (75Ω)
1:8, 8 bits
1:8, 10 bits
1:4, 8 bits
1:4, 10 bits
PD
PD
PD
PD
Test
Level
Value
Min
Typ
Max
Unit
1
5.8
6.6
4.2
4.6
6.2
7.1
4.4
4.8
6.6
7.6
4.6
5.1
W
W
W
W
1
6.8
7.8
4.7
5.2
7.3
8.4
4.9
5.5
7.7
9
5.1
5.8
W
W
W
W
–
–
–
–
–
–
–
-0.5
0
0.5
–
–
–
–
–
–
V
V
V
mA
–
–
–
–
–
–
–
-0.5
0
0.5
–
–
–
–
–
–
V
V
V
mA
Note
Delay Adjust Control
DMUXDelAdjCtrl differential voltage
250 ps
500 ps
750 ps
Input current
ADCDelAdjCtrl differential voltage
250 ps
500 ps
750 ps
Input current
DDAC
IDDAC
ADAC
IADAC
Digital Outputs
ECL Output
(assuming VPLUSD = 0V, SWIADJ = 0V, 50Ω
termination resistor on board)
Logic “0” voltage
Logic “1” voltage
Reference voltage
VOL
VOH
VREF
1
–
–
–
-2.12
-1.16
-1.40
–
–
–
V
V
V
PECL Output
(assuming VPLUSD = 3.3V, SWIADJ = 0V, 50Ω
termination resistor on board)
Logic “0” voltage
Logic “1” voltage
Reference voltage
VOL
VOH
VREF
1
–
–
–
1.27
2.44
1.83
–
–
–
V
V
V
TTL Output
(assuming VPLUSD = 3.3V, SWIADJ = 0V, 75Ω
termination resistor on board)
Logic “0” voltage
Logic “1” voltage
Reference voltage
VOL
VOH
VREF
1
–
–
–
0.9
2.31
1.2
–
–
–
V
V
V
–
–
–
-1.3
–
mV/°C
Output level drift with temperature (data and DR
outputs)
12
TS81102G0
2105C–BDC–11/03
TS81102G0
Table 4. Electrical Specifications (Continued)
Parameter
Output level drift with temperature (reference
outputs)
Value
Symbol
Test
Level
Min
Typ
Max
Unit
–
1
–
-0.9
–
mV/°C
VIL
VIH
1
–
-1.1
–
–
-1.4
–
V
V
Note
Digital Inputs
ECL Input Voltages
Logic “0” voltage
Logic “1” voltage
TTL Input Voltages
–
–
0.8
Logic “0” voltage
VIL
1
VIH
2.0
–
–
Logic “1” voltage
Note:
1. The supply current IPLUSD and the power dissipation depend on the state of the output buffers:
- the minimum values correspond to all the output buffers at low level,
- the maximum values correspond to all the output buffers at high level,
- the typical values correspond to an equal sharing-out of the output buffers between high and low levels.
Switching
Performance and
Characteristics
V
V
50% clock duty cycle (CLKIN, CLKINB). Tj (typical) = 70°C.
Full temperature range: -40°C < Tc; Tj < 110°C.
(Guaranteed temperature ranges depend on the part number)
See Timing Diagrams Figure 10 on page 16 to Figure 19 on page 21.
Table 5. Switching Performances
Symbol
Test
Level
FMAX
Clock pulse width (high)
Clock pulse width (low)
Parameter
Value
Min
Typ
Max
Unit
–
2
1
–
–
2.2
1.1
GHz
TC1
–
100
–
–
ps
TC2
–
100
–
–
ps
TCPD
TCPD
–
–
–
981
1084
–
–
ps
ps
Note
Input Clock
Maximum clock frequency
1:8 ratio
1:4 ratio
Clock Path pipeline delay
DR input clock
DR/2 input clock
Clock rise/fall time
TRCKIN
TFCKIN
–
–
100
–
ps
Asynchronous Reset pulse width
PWAR
–
1000
–
–
ps
Setup time from Asynchronous to Clkln
TSAR
–
–
1500
–
ps
Rise/fall time for (10% – 90%)
TRAR
TFAR
–
1000
–
–
ps
(1)
(2)
Asynchronous Reset
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2105C–BDC–11/03
Table 5. Switching Performances (Continued)
Symbol
Test
Level
Setup time from SyncReset to Clkln
DR input clock
DR/2 input clock
TSSR
–
Hold time from Clkln to SyncReset
DR input clock
DR/2 input clock
THSR
Parameter
Value
Min
Typ
Max
Unit
Note
–
–
-580
-477
–
–
ps
ps
(3)
–
–
780
677
–
–
ps
ps
(5)
Synchronous Reset
Rise/fall for (10% – 90%)
–
(4)
(6)
TSRR/TFSR
–
100
–
–
ps
Setup time from I[0…9] to Clkln
DR input clock
DR/2 input clock
TSCKIN
–
–
–
-794
-691
–
–
ps
ps
(7)
Hold time from Clkln to I[0…9]
DR input clock
DR/2 input clock
THCKIN
–
–
994
891
–
–
ps
ps
(9)
Input Data
Rise/fall for (10% – 90%)
–
(8)
(10)
TRDI/TFDI
–
100
–
–
ps
Data output delay
DR input clock
DR/2 input clock
TOD
–
–
–
1820
1717
–
–
ps
ps
(11)
Data pipeline delay
DR input clock, 1:4 ratio
DR input clock, 1:8 ratio
DR/2 input clock, 1:4 ratio
DR/2 input clock, 1:8 ratio
TPD
–
–
–
–
–
3
7
3/2
7/2
–
–
–
–
Number
of input
clock
(13)
TROD/tfod
–
–
497/484
–
ps
(14)
Data ready Falling edge
DR input clock
DR/2 input clock
TDRF
–
–
–
1856
1753
–
–
ps
ps
(15)
Data ready Rising edge
DR input clock
DR/2 input clock
TDRR
–
–
1828
1725
–
–
ps
ps
(17)
Asynchr; Reset to DataReady delay
TARDR
–
–
1918
–
ps
(19)
Synchr. Reset to DataReady delay
TSRDR
–
–
1037
–
ps
(20)
Rise/fall for (10% – 90%)
TRDR/TFDR
–
–
450
–
ps
(21)
Rising edge uncertainty
JITTER
–
–
62
–
ps
THBIST
–
–
–
–
ps
Output Data
Rise/fall for (10% – 90%)
(12)
Data Ready
–
(16)
(18)
Built-In Self Test
Hold time from Clkln to BIST
14
(22)
TS81102G0
2105C–BDC–11/03
TS81102G0
Table 5. Switching Performances (Continued)
Value
Parameter
Symbol
Test
Level
Setup time from Bist to Clkln
TSBIST
–
–
1000
–
ps
Rise/fall time for (10% – 90%)
TRBIST/
TFBIST
–
1000
–
–
ps
Input frequency
FMADA
–
2
–
2.2
GHz
Input pulse width (high)
TC1ADA
–
90
–
–
ps
Input pulse width (low)
TC2ADA
–
90
–
–
ps
Input rise/fall time
TRIADA/
TFIADA
–
100
100
150
150
–
–
ps
Output rise/fall time
TROADA/
TFOADA
–
–
–
145
104
–
–
ps
TADA
–
–
–
784
896
–
–
ps
TADAT
–
–
2.5
–
ps/°C
Min
Typ
Max
Unit
Note
ADC Delay Adjust
Data output delay (typical delay adjust setting)
Output delay drift with temperature
(23)
(24)
(25)
Output delay uncertainly
JITADA
–
–
30
–
ps
Notes: 1. TCPD is tuned with DMUXDelAdjCtrl: TCPD = 981 ± 250 ps.
2. TCPD is tuned with DMUXDelAdjCtrl: TCPD = 1084 ± 250 ps.
3. TSSR depends on DMUXDelAdjCtrl: TSSR = -580 ± 250 ps. TSSR < 0 because of Clock Path internal delay.
4. TSSR depends on DMUXDelAdjCtrl: TSSR = -477 ± 250 ps. TSSR < 0 because of Clock Path internal delay.
5. THSR depends on DMUXDelAdjCtrl: THSR = 780 ± 250 ps.
6. THSR depends on DMUXDelAdjCtrl: THSR = 677 ± 250 ps.
7. TSCKIN depends on DMUXDelAdjCtrl: TSCKIN = -794 ± 250 ps. TSCKIN < 0 because of Clock Path internal delay.
8. TSCKIN depends on DMUXDelAdjCtrl: TSCKIN = -691 ± 250 ps. TSCKIN < 0 because of Clock Path internal delay.
9. THCKIN depends on DMUXDelAdjCtrl: THCKIN = 994 ± 250 ps.
10. THCKIN depends on DMUXDelAdjCtrl: THCKIN = 891 ± 250 ps.
11. TOD depends on DMUXDelAdjCtrl: TOD = 1820 ± 250 ps. TOD is given for ECL 50Ω/2 pFoutput load.
12. TOD depends on DMUXDelAdjCtrl: TOD = 1717 ± 250 ps. TOD is given for ECL 50Ω/2 pFoutput load.
13. TPD is the number of Clkln clock cycle from selection of Port A to selection of Port H in 1:8 conversion mode, and from
selection of Port A to selection of Port D in 1:4 conversion mode. It is the maximum number of Clkln clock cycle, or pipeline
delay, that a data has to stay in the DMUX before being sorted out. This maximum delay occurs for the data sent to Port A.
For instance, the data sent to Port H goes directly from the input to the Port H, and its pipeline is 0. But even for this data,
there is an additional delay due to physical propagation time in the DMUX.
14. TROD and TFOD are given for ECL 50Ω/2 pF output load. In TTL mode, the TROD and TFOD are twice the ones for ECL.
(For other termination topology, apply proper derating value 50 ps/pF in ECL, 100 ps/pF in TTL mode.)
15. TDRF depends on DMUXDelAdjCtrl: TDRF = 1856 ± 250 ps. It is given for ECL 50Ω/2 pF output load.
16. TDRF depends on DMUXDelAdjCtrl: TDRF = 1753 ± 250 ps. It is given for ECL 50Ω/2 pF output load.
17. TDRR depends on DMUXDelAdjCtrl: TDRR = 1858 ± 250 ps. It is given for ECL 50Ω/2 pF output load.
18. TDRR depends on DMUXDelAdjCtrl: TDRR = 1725 ± 250 ps. It is given for ECL 50Ω/2 pF output load.
19. TARDR is given for ECL 50Ω/2 pF output load.
20. TSRDR is given for ECL 50Ω/2 pF output load. It is minimum value since RstSync clock is synchronized with Clkln clock.
21. TRDR and TFDR are given for ECL 50Ω/2 pF output load.
22. THBIST depends on the configuration of the DMUX. There must be enough Clkln clock cycles to have all the 512 codes,
(see different Timing Diagrams).
23. With transmission line (ZO = 50Ω) and output load R = 50Ω; C = 2 pF.
24. Without output load.
25. With transmission line (ZO = 50Ω) and output load R = 50Ω; C = 2 pF.
15
2105C–BDC–11/03
Input Clock Timings
Figure 10. Input Clock
TC2
TC2
TFCKIN
TFCKIN
TC1
TC1
TRCKIN
TRCKIN
Clkln
TSCKIN
Data [0..9]
d1
d2
TSCKIN
THCKIN
d3
d4
d5
d1
Clkln Type = 1
DataReady Mode (DR)
d2
THCKIN
d3
d4
d5
Clkln Type = 0
DataReady/2 Mode (DR/2)
ADC Delay Adjust
Timing Diagram
Figure 11. ADC Delay Adjust Timing Diagram
TC2ADA
TFIADA
TC1ADA
TRIADA
ADCDelAdjIn
TADA
TFOADA
TROADA
ADCDelAdjOut
16
TS81102G0
2105C–BDC–11/03
TS81102G0
Timing Diagrams with
Asynchronous Reset
With a nominal tuning of DMUXDelAdj at a frequency of 2 GHz, d1 and d2 data is lost because
of the internal clock’s path propagation delay TCPD. TCPD is tuned with DMUXDelAdjCtrl pins
to obtain good setup and hold times between Clkln and the data.
Figure 12. Start with Asynchronous Rest, 1:8 Ratio, DR Mode
TRAR
TFAR
PWAR
ASyncReset
TPD
Clkn
TCPD
Internal Port Selection
(not available out of the DEMUX)
A
I[0..9]
B
d1
d2
d3
C
d4
D
d5
E
d6
F
d7
G
d8
H
d9
A
d10
B
C
D
d11
d12
d13
E
d14
F
d15
TOD
G
d16
H
d17
TOD
d10
A[0..9]
B[0..9]
d3
d11
C[0..9]
d4
d12
D[0..9]
d5
d13
E[0..9]
d6
d14
F[0..9]
d7
d15
G[0..9]
d8
d16
TROD/TFOD
H[0..9]
d9
TARDR
d17
TRDR
TDRF
TDRR
TFDR
DR
With a nominal tuning of DMUXDelAdj at 2 GHz, d1 and d2 data is lost because of the internal
clock’s path propagation delay TCPD. TCPD is tuned with DMUXDelAdjCtrl pins to obtain
good setup and hold times between Clkln and the input data. This timing diagram does not
change with the opposite phase of Clkln.
Figure 13. Start with Asynchronous Rest, 1:8 Ratio, DR/2 Mode
TRAR
TFAR
PWAR
ASyncReset
TPD
Clkn
TCPD
Internal Port Selection
(not available out of the DEMUX)
A
I[0..9]
TCPD
B
d1
d2
d3
C
d4
D
d5
E
d6
F
d7
G
d8
H
d9
A
d10
B
C
D
d11
d12
d13
TOD
E
d14
F
d15
G
d16
H
d17
TOD
d10
A[0..9]
B[0..9]
d3
d11
C[0..9]
d4
d12
D[0..9]
d5
d13
E[0..9]
d6
d14
F[0..9]
d7
d15
G[0..9]
d8
d16
TROD/TFOD
H[0..9]
d9
TARDR
TDRR
TDRF
TRDR
d17
TFDR
DR
17
2105C–BDC–11/03
With a nominal tuning of DMUXDelAdj, at 1 GHz (1:4 mode) d1 data is lost because of the
internal clock’s path propagation delay TCPD. TCPD is tuned with DMUXDelAdjCtrl pins and
is used to obtain good setup and hold times between Clkln and the input data.
Figure 14. Start with Asynchronous Reset, 1:4 Ratio, DR Mode
TRAR
TFAR
PWAR
ASyncReset
TPD
Clkn
TCPD
Internal Port Selection
(not available out of the DEMUX)
A
I[0..9]
d1
B
d2
C
D
d3
A
d4
B
d5
C
d6
D
d7
d8
TOD
TOD
d5
A[0..9]
B[0..9]
d2
d6
C[0..9]
d3
d7
d4
d8
D[0..9]
TARDR
TDRF
TDRR
TDRR
TROD/TFOD
DR
TRDR
TFDR
With a nominal tuning of DMUXDelAdj, at 1 GHz (1:4 mode) d1 data is lost because of the
internal clock’s path propagation delay TCPD. TCPD is tuned with DMUXDelAdjCtrl pins and
is used to obtain good setup and hold times between Clkln and the input data. This timing diagram does not change with the opposite phase of Clkln.
Figure 15. Start with Asynchronous Reset, 1:4 Ratio, DR/2 Mode
TRAR
TFAR
PWAR
ASyncReset
TPD
Clkn
TCPD
Internal Port Selection
(not available out of the DEMUX)
TCPD
A
d1
I[0..9]
C
B
d2
D
d3
d4
A
B
d5
d6
C
d7
d8
TOD
TOD
d5
A[0..9]
B[0..9]
d2
d6
C[0..9]
d3
d7
d4
d8
D[0..9]
TARDR
TDRR
TDRF
TROD/TFOD
DR
TRDR
18
TFDR
TS81102G0
2105C–BDC–11/03
TS81102G0
Timing Diagrams with
Synchronous Reset
Following is an example of the Synchronous Reset’s utility in case of de-synchronization of the
DMUX output port selection. The de-synchronization event happens after the selection of Port
D.
DMUXDelAdjCtrl value is nominal. TSSR < 0 because of Clkln’s internal propagation delay
TCPD. After selection of Port C, instead of selecting Port D, the de-synchronization makes the
port selection to restart on Port A. Since Port H was not selected, the data is not output to the
ports but the last data (d1 to d8) is latched until the next selection of Port H. d9 to d16 are lost.
The synchronous Reset ensures a re-synchronization of the port selection.
Figure 16. Synchronous Reset, 1:8 Ratio, DR Mode
THSR
THSR
THSR
SyncReset
TSSR
TSSR
TSSR
Clkn
I[0..9] d0 d1
Internal Port Selection A
(not available out of the DEMUX)
A[0..9]
B
d2
d3
d4
d5
d6 d7
TCPD
d8
C
D
E
F
G
H
TOD
A
d9 d10 d11 d12 d13 d14 d15 d16 d17 d18 d19 d20 d21 d22 d23 d24 d25 d26 d27
TCPD
B
C
A
B
C
D
E
A
B
C
D
E
F
G
H
TOD
A
B
C
d1
d17
B[0..9]
d2
d18
C[0..9]
d3
d19
d4
d20
d5
d21
d6
d22
d7
d23
D[0..9]
E[0..9]
F[0..9]
G[0..9]
H[0..9]
TDRR
TDRF
d8
TSRDR
D
d24
TDRR
TDRF
DR
Period of uncertainty due to desynchronization
Example of the Synchronous Reset’s utility in case of de-synchronization of the DMUX output
port selection. The de-synchronization event happens after the selection of Port D.
DMUXDelAdjCtrl value is nominal. TSSR < 0 because of Clkln’s internal propagation delay
TCPD. After selection of Port C, instead of selecting Port D, the de-synchronization makes the
port selection to restart on Port A. Since Port H was not selected, the data is not output to the
ports but the last data (d1 to d4) is latched until the next selection of Port H. d5 to d8 are lost.
The synchronous Reset ensures a re-synchronization of the port selection.
19
2105C–BDC–11/03
Figure 17. Synchronous Reset, 1:4 Ratio, DR Mode
THSR
SyncReset
TSSR
Clkn
TCPD
I[0..9]
d1
d2
Internal Port Selection
(not available out of the DEMUX)
d3
B
C
d4
d5
D
A
d6
d7
B
C
d8
d9
D
d10
A
B
d11
d12
C
D
d13
d14
A
B
d16
d15
C
D
TOD
A[0..9]
d1
d9
B[0..9]
d2
d10
C[0..9]
d3
d11
D[0..9]
d4
d12
TDRF
TDRR
DR
Period of uncertainty due to desynchronization
Example of Synchronous Reset’s utility in case of de-synchronization of the DMUX output port
selection. The de-synchronization event happens after the selection of Port D.
DMUXDelAdjCtrl value is nominal. TSSR < 0 because of Clkln’s internal propagation delay
TCPD. After selection of Port C, instead of selecting Port D, the de-synchronization makes the
port selection to restart on Port A. Since Port H was not selected, the data is not output to the
ports but the last data (d1 to d8) is latched until the next selection of Port H. d9 to d16 are lost.
The synchronous Reset ensures a re-synchronization of the port selection.
Figure 18. Synchronous Reset, 1:8 ratio, DR/2 Mode
THSR
THSR
THSR
SyncReset
I[0..9]
TSRR
TSSR
Clkn
d0
Internal Port Selection
(not available out of the DEMUX) A
d1
B
d2
C
d3
D
d4
d5
E
TOD
F
d6
d7
TCPD
G
H
d8
A
d9
B
d10 d11 d12 d13
C
A
B
C
TSRR
d14 d15 d16 d17 d18 d19 d20 d21 d22 d23 d24 d25 d26 d27
TCPD
D
E
A
B
C
D
E
F
G
H
A
B
C
D
TOD
A[0..9]
d1
d17
B[0..9]
d2
d18
C[0..9]
d3
d19
D[0..9]
d4
d20
E[0..9]
d5
d21
F[0..9]
d6
d22
G[0..9]
d7
d23
H[0..9]
TDRF
d8
TSDRR
d24
TDRR
TDRF
DR
Period of uncertainty due to desynchronization
Example of Synchronous Reset’s utility in case of de-synchronization of the DMUX output port
selection. The de-synchronization event happens after the selection of Port D.
DMUXDelAdjCtrl value is nominal. TSSR < 0 because of Clkln’s internal propagation delay
TCPD. After selection of Port C, instead of selecting Port D, the de-synchronization makes the
port selection to restart on Port A. Since Port H was not selected, the data is not output to the
ports but the last data (d1 to d4) is latched until the next selection of Port H. d5 to d8 are lost.
The synchronous Reset ensures a re-synchronization of the port selection.
20
TS81102G0
2105C–BDC–11/03
TS81102G0
Figure 19. Synchronous Reset, 1:4 ratio, DR/2 Mode
THSR
SyncReset
TSSR
Clkn
I[0..9]
d1
d2
d3
d4
d5
d6
d7
d8
d9
d10
d12
d11
d13
d14
d15
d16
TCPD
Internal Port Selection
(not available out of the DEMUX)
B
C
D
A
B
C
A
A
B
C
D
A
B
C
D
TOD
A[0..9]
d1
B[0..9]
d2
C[0..9]
d3
D[0..9]
d4
d9
d10
d11
d12
TDRF
TDRR
DR
Period of uncertainty due to desynchronization
Note:
In case of low clock frequency and start with asynchronous reset, only the first data is lost and the first data to be processed is
the second one. This data is output from the DMUX through port B.
21
2105C–BDC–11/03
Explanation of
Test Levels
Table 6. Explanation of Test Levels
Num
1
100% production tested at +25°C.(1)
2
100% production tested at +25°C, and sample tested at specified temperatures.(1)
3
Sample tested only at specified temperatures.
4
Parameter is guaranteed by design and characterization testing (thermal steady-state
conditions at specified temperature).
5
Parameter is a typical value only.
Notes:
22
Characteristics
1. The level 1 and 2 tests are performed at 50 MHz.
2. Only MIN and MAX values are guaranteed (typical values are issuing from characterization
results).
TS81102G0
2105C–BDC–11/03
TS81102G0
Package Description
Pin Description
Table 7. TS81102G0 Pin Description
Type
Name
Levels
Comments
Digital Inputs
I[0…9]
Differential ECL
Data input.
On-chip 100Ω differential termination resistor.
Clkln
Differential ECL
Clock input (Data Ready ADC).
On-chip 100Ω differential termination resistor.
A[0…9] → H[0…9]
Adjustable Logic
Single
Data ready for port A to H.
Common mode is adjusted with VplusDOut. Swing is adjusted with
SwiAdj. 50Ω termination possible.
DR
Adjustable Logic
Differential
Data ready for channel A to H.
Common mode is adjusted with VplusDOut. Swing is adjusted with
SwiAdj. 50Ω termination possible.
RefA → RefH
Adjustable Single
Reference voltage for output channels A to H.
Common mode is adjustable with VplusDOut. 50Ω termination
possible.
ClklnType
TTL
DataReady or Dataready/2: logic 1: Data Ready.
RatioSel
TTL
DMUX ratio; logic 1: 1:4
Bist
TTL
Reset and Switch of built-in Self Test (BIST): logic 0: BIST active.
SwiAdj
0V ± 0.5V
Swing fine adjustment of output buffers.
Diode
Analog
Diode for chip temperature measurement.
NbBit
TTL
Number of bit 8 or 10: logic 1: 10-bit.
AsyncReset
TTL
Asynchronous reset: logic 1: reset on.
SyncReset
Differential ECL
Synchronous reset: active on rising edge.
DMUXDelAdjCtrl
Differential analog
input of ±0.5V
around 0V
common mode
Control of the delay line of DataReady input:
differential input = -0.5V: delay = 250 ps
differential input = 0V: delay = 500 ps
differential input = 0.5V: delay = 750 ps
ADCDelAdjCtrl
Differential analog
input of ±0.5V
around 0V
common mode
Control of the delay line for ADC:
differential input = - 0.5V: delay = 250 ps
differential input = 0V: delay = 500 ps
differential input = 0.5V: delay = 750 ps
ADCDelAdjln
Differential ECL
Stand-alone delay adjust input for ADC.
Differential termination of 100Ω inside the buffer.
ADCDelAdjOut
50Ω differential
output
Stand-alone delay adjust output for ADC.
GND
Ground 0V
Common ground.
VEE
Power -5V
Digital negative power supply.
VPlusDOut
Adjustable power
from 0V to +3.3V
Common mode adjustment of output buffers.
VCC
Power +5V
Digital positive power supply.
Outputs
Control Signals
Synchronization
Power Supplies
23
2105C–BDC–11/03
TBGA 240 Package – Pinout
Row
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
A
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
D
D
D
24
Col
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
1
2
3
Name
NC
E3
E5
E7
E9
C0
C2
C4
C6
C8
REFA
A1
A3
A5
A7
A9
DEMUXDELADJCTRL
RSTSYNCB
NC
E1
E2
E4
E6
E8
REFC
C1
C3
C5
C7
C9
A0
A2
A4
A6
A8
ASYNCRESET
DEMUXDELADJCTRLB
RSTSYNC
REFE
E0
VEE
VPLUSDOUT
VPLUSDOUT
VPLUSDOUT
VPLUSDOUT
VEE
VPLUSDOUT
VEE
VPLUSDOUT
VEE
VPLUSDOUT
VPLUSDOUT
VPLUSDOUT
GND
GND
GND
DIODE
G8
G9
VEE
Row
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
E
E
E
E
E
E
E
E
F
F
F
F
F
F
F
F
G
G
G
G
G
G
G
G
H
H
H
H
H
H
H
H
J
J
J
J
J
J
J
J
K
K
K
K
Col
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
1
2
3
4
16
17
18
19
1
2
3
4
16
17
18
19
1
2
3
4
16
17
18
19
1
2
3
4
16
17
18
19
1
2
3
4
16
17
18
19
1
2
3
4
Name
VEE
VEE
VPLUSDOUT
VPLUSDOUT
VEE
VPLUSDOUT
VEE
VPLUSDOUT
VEE
VPLUSDOUT
GND
VCC
VCC
GND
I0B
I0
G6
G7
VPLUSDOUT
VEE
VEE
VEE
I1B
I1
G4
G5
GND
GND
GND
GND
I2B
I2
G2
G3
VEE
VEE
VEE
VEE
I3B
I3
G0
G1
GND
GND
GND
GND
CLKINB
CLKIN
DR
REFG
VPLUSDOUT
VCC
VEE
VEE
I4B
I4
SWIADJ
DRB
VEE
VEE
Row
K
K
K
K
L
L
L
L
L
L
L
L
M
M
M
M
M
M
M
M
N
N
N
N
N
N
N
N
P
P
P
P
P
P
P
P
R
R
R
R
R
R
R
R
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
Col
16
17
18
19
1
2
3
4
16
17
18
19
1
2
3
4
16
17
18
19
1
2
3
4
16
17
18
19
1
2
3
4
16
17
18
19
1
2
3
4
16
17
18
19
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Name
VEE
GND
I5B
I5
H9
RATIOSEL
VPLUSDOUT
VPLUSDOUT
VEE
VEE
I6B
I6
H7
H8
GND
GND
GND
GND
I7B
I7
H5
H6
VPLUSDOUT
VPLUSDOUT
VEE
VEE
I8B
I8
H3
H4
GND
GND
GND
GND
I9B
I9
H1
H2
VPLUSDOUT
VPLUSDOUT
VEE
GND
ADCDELADJOUT
ADCDELADJOUTB
REFH
H0
VEE
VEE
VEE
VPLUSDOUT
VPLUSDOUT
VEE
VPLUSDOUT
VEE
VPLUSDOUT
VEE
VPLUSDOUT
VPLUSDOUT
GND
VEE
Row
T
T
T
U
U
U
U
U
U
U
U
U
U
U
U
U
U
U
U
U
U
U
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
W
W
W
W
W
W
W
W
W
W
W
W
W
W
W
W
W
W
W
Col
17
18
19
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
Name
VEE
ADCDELADJIN
ADCDELADJINB
F8
F9
VEE
VPLUSDOUT
VPLUSDOUT
VPLUSDOUT
VPLUSDOUT
VEE
VPLUSDOUT
VEE
VPLUSDOUT
VEE
VPLUSDOUT
VPLUSDOUT
VPLUSDOUT
GND
GND
GND
GND
F7
F6
F4
F2
F0
D9
D7
D5
D3
D1
REFD
B8
B6
B4
B2
B0
BIST
CLKINTYPE
ADCDELADJCTRL
NC
F5
F3
F1
REFF
D8
D6
D4
D2
D0
B9
B7
B5
B3
B1
REFB
NBBIT
ADCDELADJCTRLB
NC
TS81102G0
2105C–BDC–11/03
TS81102G0
Figure 20. TBGA 240 Package: Bottom View
19
RstSync
18
17
16
15
14
13
12
11
10
9
8
7
6
5
4
3
2
RstSyncb
Demuxdeladjctrcl
A9
A7
A5
A3
A1
REFA
C8
C6
C4
C2
C0
E9
E7
E5
E3
A8
A6
A4
A2
A0
C9
C7
C5
C3
C1
REFC
E8
E6
E4
E2
E1
B
Demuxdeladjctrclb Asyncreset
1
A
DIODE
GND
GND
GND
VPLUSD
VPLUSD
VPLUSD
VEE
VPLUSD
VEE
VPLUSD
VEE
VPLUSD
VPLUSD
VPLUSD
VPLUSD
VEE
E0
REFE
C
I0
I0b
GND
VCC
VCC
GND
VPLUSD
VEE
VPLUSD
VEE
VPLUSD
VEE
VPLUSD
VPLUSD
VEE
VEE
VEE
G9
G8
D
I1
I1b
VEE
VEE
VEE
VPLUSD
G7
G6
E
I2
I2b
GND
GND
GND
GND
G5
G4
F
I3
I3b
VEE
VEE
VEE
VEE
G3
G2
G
CLK
CLKb
GND
GND
GND
GND
G1
G0
H
I4
I4b
VEE
VEE
VCC
VPLUSD
REFG
DR
J
I5
I5b
GND
VEE
VEE
VEE
DRb
SWIadj
K
I6
I6b
VEE
VEE
VPLUSD
VPLUSD
RATIOSEL
H9
L
I7
I7b
GND
GND
GND
GND
H8
H7
M
I8
I8b
VEE
VEE
VPLUSD
VPLUSD
H6
H5
N
I9
I9b
GND
GND
GND
GND
H4
H3
P
ADCdelayadjoutB ADCdelayadjout
GND
VEE
VPLUSD
VPLUSD
H2
H1
R
ADCdelayadjinB ADCdelayadjin
VEE
VEE
GND
VPLUSD
VPLUSD
VEE
VPLUSD
VEE
VPLUSD
VEE
VPLUSD
VPLUSD
VEE
VEE
VEE
H0
REFH
T
GND
GND
VPLUSD
VPLUSD
VPLUSD
VEE
VPLUSD
VEE
VPLUSD
VEE
VPLUSD
VPLUSD
VPLUSD
VPLUSD
VEE
F9
F8
U
BIST
B0
B2
B4
B6
B8
REFD
D1
D3
D5
D7
D9
F0
F2
F4
F6
F7
V
NbBIT
REFB
B1
B3
B5
B7
B9
D0
D2
D4
D6
D8
REFF
F1
F3
F5
GND
GND
ADCDELADJCTRL CLKINTYPE
ADCDELADJCTRLb
W
25
2105C–BDC–11/03
Outline
Dimensions
Figure 21. Package Dimension – 240 Tape Ball Grid Array
11
0.10
D
10
-A-
Corner
19 17 15 13 11 9 7 5 3 1
-B-
Ref.
A
A1
D
D1
E
E1
b
c
M
N
aaa
ccc
e
g
P
18 16 14 12 10 8 6 4 2
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
U
V
W
e
E
E1
e
45 degree
0.5 mm chamfer
(4 PLCS)
Detail B
D1
Top View
Bottom View
Dimensional References
Min.
Nom.
1.30
1.50
0.50
0.60
24.80
25.00
22.86 (BSC.)
24.80
25.00
22.86 (BSC.)
0.60
0.75
0.90
0.80
19.00
240.00
1.27 TYP.
0.35
0.15
Max.
1.70
0.70
25.20
25.20
0.90
1.00
0.15
0.25
-
Notes: 1. All dimensions are in millimeters.
2. "e" represents the basic solder ball grid pitch.
3. "M" represents the basic solder ball matrix size,
and symbol "N" is the maximum allowable number
of balls after depopulating.
g
Detail A
4 "b" is measured at the maximum solder ball diameter
parallel to primary datum - C 5 Dimension "aaa" is measured parallel to primary
datum - C -
g
Side View
0.30 M C A M B M
0.30 M C
b
4
Detail B
6 Primary datum - C - and seatin plane are defined by
the spherical crowns of the solder balls.
7. Package surface shall be black oxide.
8. Cavity depth various with die thickness.
9. Substrate material base is copper.
10 Bilateral tolerance zone is applied to each side of
package body.
11 45 deg. 0.5 mm chamfer corner and white dot for
pin 1 identification.
A1
C
A
P
ccc C
-C-
6
Detail A
aaa C
5
Thermal and Moisture
Characteristics
Thermal Resistance
from Junction to
Case: RTHJC
26
The Rth from junction to case for the TBGA package is estimated at 1.05°C/W that can be broken down as follows:
•
Silicon: 0.1°C/W
•
Die attach epoxy: 0.5°C/W (thickness # 50 µm)
•
Copper block (back side of the package): 0.1°C/W
•
Black Ink: 0.251°C/W.
TS81102G0
2105C–BDC–11/03
TS81102G0
Thermal Resistance
from Junction to
Ambient: RTHJA
A pin-fin type heat sink of a size 40 mm x 40 mm x 8 mm can be used to reduce thermal resistance. This heat sink should not be glued to the top of the package as Atmel cannot guarantee
the attachment to the board in such a configuration. The heat sink could be clipped or screwed
on the board.
With such a heat sink, the Rthj-a is about 6°C/W (if we take 10°C/W for Rth from the junction
to air through the package and heat sink in parallel with 15°C/W from the junction to the board
through the package body, through balls and through board copper).
Without the heat sink, the Rth junction to air for a package reported on-board can be estimated
at 13 to 20°C/W (depending on the board used).
The worst value 20°C/W is given for a 1-layer board (13°C for a 4-layer board).
Thermal Resistance
from Junction to
Bottom of Balls
The thermal resistance from the junction to the bottom of the balls of the package corresponds
to the total thermal resistance to be considered from the silicon’s die junction to the interface
with a board. This thermal resistance is estimated to be 4.8°C/W max.
The following diagram points out how the previous thermal resistances were calculated for this
packaged device.
Figure 22. Thermal Resistance from Junction to Bottom of Balls
DEMUX − Axpproximative Model for 240 TBGA
Assumptions:
Square die 7.0 x 7.0 = 49 mm², 75 µm thick Epoxy/Ag glue, 0.40 mm copper thickness under die,
Sn60Pb40 columns diameter 0.76 mm, 23 x 23 mm TBGA
Typical values
(values are in °C/Watt)
Case were all Bottom of Balls are connected to infinite heatsink
(values are in °C/Watt)
Silicon Junction
Silicon Junction
Silicon Die
49 mm²
0.10
0.10
0.60
0.60
λ = 0.95Watt/°C
Epoxy/Ag glue
λ = 0.025Watt/°C
Copper base
(Top half of thickness)
λ = 25Watt/°C
Copper base
0.05
1.70
0.05
0.05
1.70
0.25
1.87
Reduction
0.25
Reduction
Silicon
Junction
1.43 Tape + glue
over balls
2.45
λ = 0.02Watt/°C
Black ink
0.25
0.40
0.31 Balls
PbSn
Silicon
Junction
3.55
2.47
1.74
2.47 1.99
λ = 0.40Watt/°C
Top of
package
2 internal 2 external
rows
rows
(104 balls) (136 balls)
Thermal Resistance Junction to case typical =
0.10 + 0.60 + 0.05 + 0.05 + 0.25 = 1.05°C/W
Infinite heatsink
at bottom of balls
Infinite heatsink Infinite heatsink
at bottom of balls at bottom of balls
Thermal Resistance Junction to bottom of balls = 4.8°C/W Max
Thermal Resistance Junction to case Max = 1.40°C/W
27
2105C–BDC–11/03
Temperature Diode
Characteristic
The theoretical characteristic of the diode according to the temperature when I = 3 mA is
depicted below.
Figure 23. Temperature Diode Characteristic
Vdiode
DiodeT
1.0
I = 3 mA
dV/dT = 1.32 mV/°C
(V)
900m
800m
700m
-70.0
-20.0
30.0
80.0
130.0
Temperature (°C)
Moisture
Characteristic
This device is sensitive to moisture (MSL3 according to the JEDEC standard).
The shelf life in a sealed bag is 12 months at < 40°C and < 90% relative humidity (RH).
After this bag is opened, devices that might be subjected to infrared reflow, vapor-phase
reflow, or equivalent processing (peak package body temperature 220°C) must be:
•
mounted within 168 hours at factory conditions of ≤ 30°C/60% RH, or
•
stored at ≤ 20% RH.
The devices require baking before mounting, if the humidity indicator is > 20% when read at
23°C ±5°C.
If baking is required, the devices may be baked for:
28
•
192 hours at 40°C + 5°C/-0°C and < 5% RH for low temperature device containers, or
•
24 hours at 125°C ± 5°C for high-temperature device containers.
TS81102G0
2105C–BDC–11/03
TS81102G0
Detailled Cross
Section
The following diagram depicts a detailed cross section of the DMUX TBGA package.
Figure 24. TBGA 240: 1/2 Cross Section
Copper Heatspreader
Block overcoat
Adhesive
Die Attach Epoxy/Ag
Solder Mask
Metal 2 side
Polyimide Tape
Silicon Die
Block Epoxy resin
encapsulant
Gold
wires
Copper traces
and
Solder Balls Pads
on metal 1 side
Sn/Pb/Ag
62/36/2 Eutectic
Solder Balls
Solder Mask
Metal 1 side
In the DMUX package shown above, the die’s rear side is attached to the copper heat
spreader, so the copper heat spreader is at -5V.
It is necessary to use a heat sink tied to the copper heat speader.
Moreover, there is only a little layer of painting over the copper heat spreader which does not
isolate it.
It is therefore recommended to either isolate the heat sink from the other components of the
board or to electrically isolate the copper heat spreader from the heat sink. In the latter case,
one should use adequate low Rth electrical isolation.
29
2105C–BDC–11/03
Applying the
TS81102G0
DMUX
The TSEV81102G0 DMUX evaluation board is designed to be connected with the
TSEV8388G and TSEV83102G0 ADC evaluation boards.
Figure 25. TSEV81102G0 DMUX Evaluation Boards
VplusD = 0V → 3.3V
CLOCK
BUFFER
s-e or diff.
(2 GHz)
Vee = -5V
FS
Vcc = +5V
(125 MHz)
8x8b/10b single
A[0..9] → H[0..9]
DEMUX
Analog
Input
ADC
(1 GHz)
8b/10b diff.
Data
Bus
RefA → RefH
(250 MHz)
1b diff.
I[0..9]
(1 - 2 GHz)
1b diff.
ASIC
(DC)
8 ref
Clkln
DR
Clkln
Data
Ready
delay
ECL + ref
8bits 1 GHz TS8388B
10bits 2 GHz TS83102G0
VplusD = ground
Rload = 50Ω
Vtt = -2V
Voh = -0.8V
Vol = -1.8V
ECL
Rload = 50Ω
Vih = -1.0V
Vil = -1.4V
Delay
adjust
control
Number
of bits
(8/10)
Synchronous or
Asynchronous
Reset
TS81102G0
TTL + ref
VplusD = 3.3V
Rload ≥ 75Ω
Vtt = ground
Voh = 2.5V
Vol = 0.5V
PECL + ref
VplusD = 3.3V
Rload = 50Ω
Vtt = 1.3V
Voh = 2.5V
Vol = 1.5V
Please refer to the "ADC and DMUX Application Note" for more information.
30
TS81102G0
2105C–BDC–11/03
TS81102G0
ADC to DMUX
Connections
The DMUX inputs configuration has been optimized to be connected to the TS8388B ADC.
The die in the TBGA package is up. For the ADC, different types of packages can be used
such as CBGA with die up or the CQFP68 down. The DMUX device being completely symmetrical, both ADC packages can be connected to the TBGA package of the DMUX crisscrossing the lines (see Table 8).
Table 8. ADC to DMUX Connections
ADC Digital Outputs
CQFP68 Package
DMUX Data Inputs
TBGA Package
ADC Digital Outputs
CBGA Package
DMUX Data Inputs
TBGA Package
D0
I7
D0
I0
D1
I6
D1
I1
D2
I5
D2
I2
D3
I4
D3
I3
D4
I3
D4
I4
D5
I2
D5
I5
D6
I1
D6
I6
D7
I0
D7
I7
–
18 not connected
–
18 not connected
–
19 not connected
–
19 not connected
Note:
The connection between the ADC evaluation board and the DMUX evaluation board requires a
4-pin shift to make the D0 pin match either the I7 or I0 pin of the DMUX evaluation board.
31
2105C–BDC–11/03
TSEV81102G0TP: Device Evaluation Board
General
Description
The TSEV81102G0TP DMUX Evaluation Board (EB) is designed to simplify the characterization and the evaluation of the TS81102G0 device (2 Gsps DMUX). The DMUX EB enables
testing of all the DMUX functions: Synchronous and Asynchronous reset functions, selection
of the DMUX ratio (1:4 or 1:8), selection of the number of bits (8 or 10), output data common
mode and swing adjustment, die junction temperature measurements over military temperature range, etc.
The DMUX EB has been designed to enable easy connection to Atme’s ADC Evaluation
Boards (such as TSEV8388BGL or TSEV83102G0BGL) for an extended functionality evaluation (ADC and DMUX multi-channel applications).
The DMUX EB comes fully assembled and tested, with a TS81102G0 device implemented on
the board and a heat sink assembled on the device.
32
TS81102G0
2105C–BDC–11/03
TS81102G0
Ordering
Information
Table 9. Ordering Information
Part Number
Package
JTS81102G0-1V1A
Die
TS81102G0CTP
TBGA 240
"C" grade
0°C < Tc; Tj < 90°C
Standard
TS81102G0VTP
TBGA 240
"V" grade
-40°C < Tc; Tj < 110°C
Standard
TSEV81102G0TPZR3
TBGA 240
Ambient
Prototype
Datasheet
Status
Description
Temperature Range
Ambient
Screening
Comments
Visual inspection
Evaluation board (delivered
with heatsink)
Table 10. Datasheet Status
Datasheet Status
Validity
Objective specification
This datasheet contains target and
goal specifications for discussion with
customer and application validation.
Before design phase
Target specification
This datasheet contains target or
goal specifications for product
development.
Valid during the design phase
Preliminary specification
α-site
This datasheet contains preliminary
data. Additional data may be
published later; could include
simulation results.
Valid before characterization
phase
Preliminary specification
β-site
This datasheet contains also
characterization results.
Valid before the
industrialization phase
Product specification
This datasheet contains final product
specification.
Valid for production purposes
Limiting Values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress
above one or more of the limiting values may cause permanent damage to the device. These are
stress ratings only and operation of the device at these or at any other conditions above those given in
the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may affect device reliability.
Application Information
Where application information is given, it is advisory and does not form part of the specification.
Life Support
Applications
These products are not designed for use in life-support appliances, devices or systems where
malfunction of these products can reasonably be expected to result in personal injury. Atmel
customers using or selling these products for use in such applications do so at their own risk
and agree to fully indemnify Atmel for any damages resulting from such improper use or sale.
33
2105C–BDC–11/03
Addendum
This section has been added to the description of the device for better understanding of the
synchronous reset operation. It puts particular stress on the setup and hold times defined in
the switching characteristics table (Table 5), linked with the device performances when used
at full speed (2 Gsps).
Synchronous
Reset Operation
It first describes the operation of the synchronous reset in case the DMUX is used in DR mode
and then when used in the DR/2 mode.
As a reminder, the synchronous reset has to be a signal frequency of Fs/8N in 1:8 ratio or
Fs/4N in 1:4 ratio, where N is an integer.
The effect of the synchronous reset is to ensure that at each new port selection cycle, the first
port to be selected is port A. The synchronous reset ensures the internal cyclic synchronization of the device during operation. It is also highly recommended in the case of multichannel
applications using 2 synchronized DMUXs.
SETUP and HOLD
Timings
The setup and hold times for the reset are defined as follows:
•
SETUP from SynchReset to Clkin:
Required delay between the rising edge of the reset and the rising edge of the clock to ensure
that the reset will be taken into account at the next clock edge. If the reset rising edge occurs
at less than this setup time, it will be taken into account only at the second next rising edge of
the clock.
A margin of ± 100ps has to be added to this setup time to compensate for the delays from the
drivers and lines.
•
HOLD from Clkin and SynchReset:
Minimum duration of the reset signal at a high level to be taken into account by the DMUX.
This means that the reset signal has to satisfy 2 requirements: a frequency of Fs/8N or Fs/4N
(N is an integer) depending on the ratio and a duty cycle such that it is high during at least the
hold time.
Operation in DR Mode
In DR mode, the DMUX input clock can run at up to 2 GHz in 1:8 ratio or 1 GHz in 1:4 ratio.
Both cases are described in the following timing diagrams.
Figure 26. Synchronous Reset Operation in DR Mode, 1:4 ratio, 1GHz (Full Speed) – Principle of Operation
Fs
Sync_RESET
34
TS81102G0
2105C–BDC–11/03
TS81102G0
Figure 27. Synchronous Reset Operation in DR Mode, 1:4 ratio, 1GHz (Full Speed) – TIMINGS
Fs
Time Zones
Allowed for
the reset
Sync_RESET
Note:
The clock edge to which the reset applies is the one identified by the arrow.
If the reset rising edge had occurred in the second allowed window, the reset would have been effective on the third clock rising edge (not
represented, on the right of the edge represented with the arrow).
Figure 28. Synchronous Reset Operation in DR Mode, 1:8 ratio, 2 GHz (Full-speed) – Principle of Operation
Fs
Sync_RESET
Figure 29. Synchronous Reset Operation in DR Mode, 1:8 ratio, 2 GHz (Full-speed) – Timings
Fs
Times Zones
Allowed for
the reset
Sync_RESET
Note:
The clock edge to which the reset applies is the one identified by the arrow.
If the reset rising edge had occurred in the second allowed window, the reset would have been effective on the fourth clock
rising edge (last clock rising edge, on the right of the edge represented with the arrow).
This case is the most critical one with only a 300 ps window for the reset.
35
2105C–BDC–11/03
Operation in DR/2
Mode
In DR/2 mode, the DMUX input clock can run at up to 1 GHz in 1:8 ratio or 500 MHz in 1:4
ratio, since the DR/2 clock from the ADC is half the sampling frequency.
Both cases are described in the following timing diagrams.
Figure 30. Synchronous Reset Operation in DR/2 Mode, 1:4 ratio, 500MHz (Full Speed) – Principle of Operation
Fs/2
Sync_RESET
Figure 31. Synchronous Reset Operation in DR/2 Mode, 1:4 ratio, 500 MHz (Full-speed) – Timings
Fs/2
Times Zones
Allowed for the
reset
Sync_RESET
Note:
The clock edge to which the reset applies is the one identified by the arrow.
If the reset rising edge had occurred in the first allowed window (on the left), the reset would have been effective on the first
represented clock rising edge (first clock rising edge of the schematic, on the left of the edge represented with the arrow).
Figure 32. Synchronous Reset Operation in DR/2 Mode, 1:8 ratio, 1GHz (Full Speed) – Principle of Operation
Fs/2
Sync_RESET
36
TS81102G0
2105C–BDC–11/03
TS81102G0
Figure 33. Synchronous Reset Operation in DR/2 Mode, 1:8 ratio, 1GHz (Full-speed) – Timings
Fs/2
Times Zones
Allowed for the
reset
Sync_RESET
Note:
The clock edge to which the reset applies is the one identified by the arrow.
If the reset rising edge had occurred in the second allowed window, the reset would have been effective on the fourth clock rising edge
(not represented, on the right of the edge represented with the arrow).
37
2105C–BDC–11/03
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