STMICROELECTRONICS M48T12

M48T02
M48T12
5.0V, 16 Kbit (2Kb x 8) TIMEKEEPER® SRAM
Features
■
Integrated, ultra low power SRAM, real time
clock, and power-fail control circuit
■
BYTEWIDE™ RAM-like clock access
■
BCD coded year, month, day, date, hours,
minutes, and seconds
■
Typical clock accuracy of ±1 minute a month, at
25°C
■
Software controlled clock calibration for high
accuracy applications
■
Automatic power-fail chip deselect and WRITE
protection
■
WRITE protect voltages
(VPFD = Power-fail deselect voltage):
– M48T02: VCC = 4.75 to 5.5V
4.5V ≤ VPFD ≤ 4.75V
– M48T12: VCC = 4.5 to 5.5V
4.2V ≤ VPFD ≤ 4.5V
■
Self-contained battery and crystal in the
CAPHAT™ DIP package
■
Pin and function compatible with JEDEC
standard 2K x8 SRAMs
■
RoHS compliant
– Lead-free second level interconnect
September 2007
24
1
PCDIP24 (PC)
battery/crystal
CAPHAT™
Rev 6
1/24
www.st.com
1
Contents
M48T02, M48T12
Contents
1
Summary description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
2
Operation modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
3
2.1
Read mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2.2
Write mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.3
Data retention mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Clock operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.1
Reading the clock . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.2
Setting the clock . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.3
Stopping and starting the oscillator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
3.4
Calibrating the clock . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
3.5
VCC noise and negative going transients . . . . . . . . . . . . . . . . . . . . . . . . . 15
4
Maximum rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
5
DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
6
Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
7
Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
8
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
2/24
M48T02, M48T12
List of tables
List of tables
Table 1.
Table 2.
Table 3.
Table 4.
Table 5.
Table 6.
Table 7.
Table 8.
Table 9.
Table 10.
Table 11.
Table 12.
Table 13.
Table 14.
Signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Operating modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Read mode AC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Write mode AC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Register map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Operating and AC measurement conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
DC characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Power down/up AC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Power down/up trip points DC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
PCDIP24 – 24-pin plastic DIP, battery CAPHAT, package mechanical data . . . . . . . . . . . 21
Ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
3/24
List of figures
M48T02, M48T12
List of figures
Figure 1.
Figure 2.
Figure 3.
Figure 4.
Figure 5.
Figure 6.
Figure 7.
Figure 8.
Figure 9.
Figure 10.
Figure 11.
Figure 12.
Figure 13.
4/24
Logic diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
DIP connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Read mode AC waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Write enable controlled, write AC waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Chip enable controlled, write AC waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Checking the BOK flag status . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Crystal accuracy across temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Clock calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Supply voltage protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
AC testing load circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Power down/up mode AC waveforms. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
PCDIP24 – 24-pin plastic DIP, battery CAPHAT, package outline . . . . . . . . . . . . . . . . . . . 21
M48T02, M48T12
1
Summary description
Summary description
The M48T02/12 TIMEKEEPER® RAM is a 2Kb x 8 non-volatile static RAM and real time
clock which is pin and functional compatible with the DS1642.
A special 24-pin, 600mil DIP CAPHAT™ package houses the M48T02/12 silicon with a
quartz crystal and a long life lithium button cell to form a highly integrated battery backed-up
memory and real time clock solution.
The M48T02/12 button cell has sufficient capacity and storage life to maintain data and
clock functionality for an accumulated time period of at least 10 years in the absence of
power over the operating temperature range.
The M48T02/12 is a non-volatile pin and function equivalent to any JEDEC standard 2Kb x 8
SRAM. It also easily fits into many ROM, EPROM, and EEPROM sockets, providing the
non-volatility of PROMs without any requirement for special WRITE timing or limitations on
the number of WRITEs that can be performed.
Figure 1.
Logic diagram
VCC
11
8
A0-A10
W
DQ0-DQ7
M48T02
M48T12
E
G
VSS
AI01027
Table 1.
Signal names
A0-A10
Address Inputs
DQ0-DQ7
Data Inputs / Outputs
E
Chip Enable
G
Output Enable
W
WRITE Enable
VCC
Supply Voltage
VSS
Ground
5/24
Summary description
Figure 2.
M48T02, M48T12
DIP connections
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
DQ1
DQ2
VSS
1
24
2
23
3
22
4
21
5
20
M48T02 19
6
M48T12 18
7
8
17
9
16
10
15
14
11
13
12
VCC
A8
A9
W
G
A10
E
DQ7
DQ6
DQ5
DQ4
DQ3
AI01028
Figure 3.
Block diagram
OSCILLATOR AND
CLOCK CHAIN
8 x 8 BiPORT
SRAM ARRAY
32,768 Hz
CRYSTAL
A0-A10
POWER
2040 x 8
SRAM ARRAY
LITHIUM
CELL
VCC
6/24
E
VPFD
VOLTAGE SENSE
AND
SWITCHING
CIRCUITRY
DQ0-DQ7
W
BOK
G
VSS
AI01329
M48T02, M48T12
2
Operation modes
Operation modes
As Figure 3 on page 6 shows, the static memory array and the quartz controlled clock
oscillator of the M48T02/12 are integrated on one silicon chip. The two circuits are
interconnected at the upper eight memory locations to provide user accessible
BYTEWIDE™ clock information in the bytes with addresses 7F8h-7FFh. The clock locations
contain the year, month, date, day, hour, minute, and second in 24 hour BCD format.
Corrections for 28, 29 (leap year - valid until 2100), 30, and 31 day months are made
automatically.
Byte 7F8h is the clock control register. This byte controls user access to the clock
information and also stores the clock calibration setting.
The eight clock bytes are not the actual clock counters themselves; they are memory
locations consisting of BiPORT™ READ/WRITE memory cells. The M48T02/12 includes a
clock control circuit which updates the clock bytes with current information once per second.
The information can be accessed by the user in the same manner as any other location in
the static memory array.
The M48T02/12 also has its own Power-fail Detect circuit. The control circuitry constantly
monitors the single 5V supply for an out of tolerance condition. When VCC is out of
tolerance, the circuit write protects the SRAM, providing a high degree of data security in the
midst of unpredictable system operation brought on by low VCC. As VCC falls below
approximately 3V, the control circuitry connects the battery which maintains data and clock
operation until valid power returns.
Table 2.
Operating modes
Mode
VCC
Deselect
WRITE
READ
4.75 to 5.5V
or
4.5 to 5.5V
E
G
W
DQ0-DQ7
Power
VIH
X
X
High Z
Standby
VIL
X
VIL
DIN
Active
VIL
VIL
VIH
DOUT
Active
VIL
VIH
VIH
High Z
Active
Deselect
VSO to
VPFD(min)(1)
X
X
X
High Z
CMOS Standby
Deselect
≤ VSO(1)
X
X
X
High Z
Battery Back-up Mode
READ
1. See Table 11 on page 20 for details.
Note:
X = VIH or VIL; VSO = Battery Back-up Switchover Voltage.
2.1
Read mode
The M48T02/12 is in the READ Mode whenever W (WRITE Enable) is high and E (Chip
Enable) is low. The device architecture allows ripple-through access of data from eight of
16,384 locations in the static storage array. Thus, the unique address specified by the 11
Address Inputs defines which one of the 2,048 bytes of data is to be accessed. Valid data
will be available at the Data I/O pins within Address Access time (tAVQV) after the last
address input signal is stable, providing that the E and G access times are also satisfied. If
the E and G access times are not met, valid data will be available after the latter of the Chip
Enable Access time (tELQV) or Output Enable Access time (tGLQV).
7/24
Operation modes
M48T02, M48T12
The state of the eight three-state Data I/O signals is controlled by E and G. If the outputs are
activated before tAVQV, the data lines will be driven to an indeterminate state until tAVQV. If
the Address Inputs are changed while E and G remain active, output data will remain valid
for Output Data Hold time (tAXQX) but will go indeterminate until the next Address Access.
Figure 4.
Read mode AC waveforms
tAVAV
VALID
A0-A10
tAVQV
tAXQX
tELQV
tEHQZ
E
tELQX
tGLQV
tGHQZ
G
tGLQX
DQ0-DQ7
VALID
AI01330
Note:
WRITE Enable (W) = High.
Table 3.
Read mode AC characteristics
M48T02/M48T12
Symbol
Parameter(1)
–70
Min
–150
Max
70
Min
Max
Min
Max
tAVAV
READ Cycle Time
Address Valid to Output Valid
70
150
200
ns
tELQV
Chip Enable Low to Output Valid
70
150
200
ns
tGLQV
Output Enable Low to Output Valid
35
75
80
ns
tELQX
Chip Enable Low to Output Transition
5
10
10
ns
tGLQX
Output Enable Low to Output Transition
5
5
5
ns
tEHQZ
Chip Enable High to Output Hi-Z
25
35
40
ns
tGHQZ
Output Enable High to Output Hi-Z
25
35
40
ns
tAXQX
Address Transition to Output Transition
5
200
ns
5
1. Valid for Ambient Operating Temperature: TA = 0 to 70°C; VCC = 4.75 to 5.5V or 4.5 to 5.5V (except where noted).
8/24
Unit
tAVQV
10
150
–200
ns
M48T02, M48T12
2.2
Operation modes
Write mode
The M48T02/12 is in the WRITE Mode whenever W and E are active. The start of a WRITE
is referenced from the latter occurring falling edge of W or E. A WRITE is terminated by the
earlier rising edge of W or E. The addresses must be held valid throughout the cycle. E or W
must return high for a minimum of tEHAX from Chip Enable or tWHAX from WRITE Enable
prior to the initiation of another READ or WRITE cycle. Data-in must be valid tDVWH prior to
the end of WRITE and remain valid for tWHDX afterward. G should be kept high during
WRITE cycles to avoid bus contention; although, if the output bus has been activated by a
low on E and G, a low on W will disable the outputs tWLQZ after W falls.
Figure 5.
Write enable controlled, write AC waveform
tAVAV
A0-A10
VALID
tAVWH
tWHAX
tAVEL
E
tWLWH
tAVWL
W
tWHQX
tWLQZ
tWHDX
DQ0-DQ7
DATA INPUT
tDVWH
AI01331
Figure 6.
Chip enable controlled, write AC waveforms
tAVAV
VALID
A0-A10
tAVEH
tAVEL
tELEH
tEHAX
E
tAVWL
W
tEHDX
DQ0-DQ7
DATA INPUT
tDVEH
AI01332B
9/24
Operation modes
Table 4.
M48T02, M48T12
Write mode AC characteristics
M48T02/M48T12
Symbol
Parameter(1)
–70
–150
–200
Unit
Min Max Min Max Min Max
tAVAV
WRITE Cycle Time
70
150
200
ns
tAVWL
Address Valid to WRITE Enable Low
0
0
0
ns
tAVEL
Address Valid to Chip Enable Low
0
0
0
ns
tWLWH
WRITE Enable Pulse Width
50
90
120
ns
tELEH
Chip Enable Low to Chip Enable High
55
90
120
ns
tWHAX
WRITE Enable High to Address
Transition
0
10
10
ns
tEHAX
Chip Enable High to Address Transition
0
10
10
ns
tDVWH
Input Valid to WRITE Enable High
30
40
60
ns
tDVEH
Input Valid to Chip Enable High
30
40
60
ns
tWHDX
WRITE Enable High to Input Transition
5
5
5
ns
tEHDX
Chip Enable High to Input Transition
5
5
5
ns
tWLQZ
WRITE Enable Low to Output Hi-Z
tAVWH
Address Valid to WRITE Enable High
60
25
120
50
140
60
ns
ns
tAVEH
Address Valid to Chip Enable High
60
120
140
ns
tWHQX
WRITE Enable High to Output Transition
5
10
10
ns
1. Valid for Ambient Operating Temperature: TA = 0 to 70°C; VCC = 4.75 to 5.5V or 4.5 to 5.5V (except where
noted).
2.3
Data retention mode
With valid VCC applied, the M48T02/12 operates as a conventional BYTEWIDE™ static
RAM. Should the supply voltage decay, the RAM will automatically power-fail deselect, write
protecting itself when VCC falls within the VPFD (max), VPFD (min) window. All outputs
become high impedance, and all inputs are treated as “don't care.”
Note:
A power failure during a WRITE cycle may corrupt data at the currently addressed location,
but does not jeopardize the rest of the RAM's content. At voltages below VPFD (min), the
user can be assured the memory will be in a write protected state, provided the VCC fall time
is not less than tF. The M48T02/12 may respond to transient noise spikes on VCC that reach
into the deselect window during the time the device is sampling VCC. Therefore, decoupling
of the power supply lines is recommended.
The power switching circuit connects external VCC to the RAM and disconnects the battery
when VCC rises above VSO. As VCC rises, the battery voltage is checked. If the voltage is too
low, an internal Battery Not OK (BOK) flag will be set. The BOK flag can be checked after
power up. If the BOK flag is set, the first WRITE attempted will be blocked. The flag is
automatically cleared after the first WRITE, and normal RAM operation resumes. Figure 7
on page 11 illustrates how a BOK check routine could be structured.
For more information on a Battery Storage Life refer to the Application Note AN1012.
10/24
M48T02, M48T12
Figure 7.
Operation modes
Checking the BOK flag status
POWER-UP
READ DATA
AT ANY ADDRESS
WRITE DATA
COMPLEMENT BACK
TO SAME ADDRESS
READ DATA
AT SAME
ADDRESS AGAIN
IS DATA
COMPLEMENT
OF FIRST
READ?
(BATTERY OK)
YES
NO (BATTERY LOW)
NOTIFY SYSTEM
OF LOW BATTERY
(DATA MAY BE
CORRUPTED)
WRITE ORIGINAL
DATA BACK TO
SAME ADDRESS
CONTINUE
AI00607
11/24
Clock operations
3
Clock operations
3.1
Reading the clock
M48T02, M48T12
Updates to the TIMEKEEPER® registers should be halted before clock data is read to
prevent reading data in transition. The BiPORT™ TIMEKEEPER cells in the RAM array are
only data registers and not the actual clock counters, so updating the registers can be halted
without disturbing the clock itself.
Updating is halted when a '1' is written to the READ Bit, the seventh bit in the control
register. As long as a '1' remains in that position, updating is halted. After a halt is issued,
the registers reflect the count; that is, the day, date, and the time that were current at the
moment the halt command was issued.
All of the TIMEKEEPER registers are updated simultaneously. A halt will not interrupt an
update in progress. Updating is within a second after the bit is reset to a '0.'
3.2
Setting the clock
The eighth bit of the control register is the WRITE Bit. Setting the WRITE Bit to a '1,' like the
READ Bit, halts updates to the TIMEKEEPER registers. The user can then load them with
the correct day, date, and time data in 24 hour BCD format (on Table 5 on page 13).
Resetting the WRITE Bit to a '0' then transfers the values of all time registers (7F9-7FF) to
the actual TIMEKEEPER counters and allows normal operation to resume. The FT Bit and
the bits marked as '0' in Table 5 on page 13 must be written to '0' to allow for normal
TIMEKEEPER and RAM operation.
See the Application Note AN923, “TIMEKEEPER® Rolling Into the 21st Century” for
information on Century Rollover.
12/24
M48T02, M48T12
Table 5.
Addres
s
Clock operations
Register map
Data
D7
D6
7FF
D5
D4
Function/Range
D3
10 Years
7FE
0
0
0
10 M
7FD
0
0
10 Date
7FC
0
FT
7FB
0
0
7FA
0
7F9
ST
7F8
W
0
0
10 Hours
10 Minutes
10 Seconds
R
S
D2
D1
BCD Format
D0
Year
Year
00-99
Month
Month
01-12
Date
Date
01-31
Day
01-07
Hours
Hours
00-23
Minutes
Minutes
00-59
Seconds
Seconds
00-59
0
Day
Calibration
Control
Keys:
S = SIGN Bit
FT = FREQUENCY TEST Bit (Set to '0' for normal clock operation)
R = READ Bit
W = WRITE Bit
ST = STOP Bit
0 = Must be set to '0'
3.3
Stopping and starting the oscillator
The oscillator may be stopped at any time. If the device is going to spend a significant
amount of time on the shelf, the oscillator can be turned off to minimize current drain on the
battery. The STOP Bit is the MSB of the seconds register. Setting it to a '1' stops the
oscillator. The M48T02/12 is shipped from STMicroelectronics with the STOP Bit set to a '1.'
When reset to a '0,' the M48T02/12 oscillator starts within one second.
3.4
Calibrating the clock
The M48T02/12 is driven by a quartz-controlled oscillator with a nominal frequency of
32,768 Hz. A typical M48T02/12 is accurate within 1 minute per month at 25°C without
calibration. The devices are tested not to exceed ± 35 ppm (parts per million) oscillator
frequency error at 25°C, which equates to about ±1.53 minutes per month.
The oscillation rate of any crystal changes with temperature. Figure 8 on page 15 shows the
frequency error that can be expected at various temperatures. Most clock chips compensate
for crystal frequency and temperature shift error with cumbersome “trim” capacitors. The
M48T02/12 design, however, employs periodic counter correction. The calibration circuit
adds or subtracts counts from the oscillator divider circuit at the divide by 256 stage, as
shown in Figure 9 on page 15. The number of times pulses are blanked (subtracted,
negative calibration) or split (added, positive calibration) depends upon the value loaded into
the five-bit Calibration Byte found in the Control Register. Adding counts speeds the clock
up, subtracting counts slows the clock down.
The Calibration Byte occupies the five lower order bits in the Control register. This byte can
be set to represent any value between 0 and 31 in binary form. The sixth bit is the Sign Bit;
13/24
Clock operations
M48T02, M48T12
'1' indicates positive calibration, '0' indicates negative calibration. Calibration occurs within a
64 minute cycle. The first 62 minutes in the cycle may, once per minute, have one second
either shortened by 128 or lengthened by 256 oscillator cycles. If a binary '1' is loaded into
the register, only the first 2 minutes in the 64 minute cycle will be modified; if a binary 6 is
loaded, the first 12 will be affected, and so on.
Therefore, each calibration step has the effect of adding 512 or subtracting 256 oscillator
cycles for every 125,829,120 actual oscillator cycles; that is +4.068 or –2.034 ppm of
adjustment per calibration step in the calibration register. Assuming that the oscillator is in
fact running at exactly 32,768Hz, each of the 31 increments in the Calibration Byte would
represent +10.7 or –5.35 seconds per month which corresponds to a total range of +5.5 or –
2.75 minutes per month.
Two methods are available for ascertaining how much calibration a given M48T02/12 may
require. The first involves simply setting the clock, letting it run for a month and comparing it
to a known accurate reference (like WWV broadcasts). While that may seem crude, it allows
the designer to give the end user the ability to calibrate his clock as his environment may
require, even after the final product is packaged in a non-user serviceable enclosure. All the
designer has to do is provide a simple utility that accesses the Calibration Byte.
The second approach is better suited to a manufacturing environment, and involves the use
of some test equipment. When the Frequency Test (FT) Bit, the seventh-most significant bit
in the Day Register, is set to a '1,' and the oscillator is running at 32,768 Hz, the LSB (DQ0)
of the Seconds Register will toggle at 512 Hz. Any deviation from 512 Hz indicates the
degree and direction of oscillator frequency shift at the test temperature. For example, a
reading of 512.01024 Hz would indicate a +20 ppm oscillator frequency error, requiring a –
10 (WR001010) to be loaded into the Calibration Byte for correction.
Note:
Setting or changing the Calibration Byte does not affect the Frequency Test output
frequency. The device must be selected and addresses must be stable at Address 7F9
when reading the 512 Hz on DQ0.
The FT Bit must be set using the same method used to set the clock: using the WRITE Bit.
The LSB of the Seconds Register is monitored by holding the M48T02/12 in an extended
READ of the Seconds Register, but without having the READ Bit set. The FT Bit MUST be
reset to '0' for normal clock operations to resume.
Note:
It is not necessary to set the WRITE Bit when setting or resetting the Frequency Test Bit
(FT) or the Stop Bit (ST).
For more information on calibration, see the Application Note AN924, “TIMEKEEPER®
Calibration.”
14/24
M48T02, M48T12
Figure 8.
Clock operations
Crystal accuracy across temperature
ppm
20
0
-20
-40
ΔF = -0.038 ppm (T - T )2 ± 10%
0
F
C2
-60
T0 = 25 °C
-80
-100
0
5
10
15
20
25
30
35
40
45
50
55
60
65
70
°C
AI02124
Figure 9.
Clock calibration
NORMAL
POSITIVE
CALIBRATION
NEGATIVE
CALIBRATION
AI00594B
3.5
VCC noise and negative going transients
ICC transients, including those produced by output switching, can produce voltage
fluctuations, resulting in spikes on the VCC bus. These transients can be reduced if
capacitors are used to store energy which stabilizes the VCC bus. The energy stored in the
bypass capacitors will be released as low going spikes are generated or energy will be
absorbed when overshoots occur. A ceramic bypass capacitor value of 0.1µF (as shown in
Figure 10 on page 16) is recommended in order to provide the needed filtering.
In addition to transients that are caused by normal SRAM operation, power cycling can
generate negative voltage spikes on VCC that drive it to values below VSS by as much as
one volt. These negative spikes can cause data corruption in the SRAM while in battery
backup mode. To protect from these voltage spikes, it is recommended to connect a
15/24
Clock operations
M48T02, M48T12
schottky diode from VCC to VSS (cathode connected to VCC, anode to VSS). Schottky diode
1N5817 is recommended for through hole and MBRS120T3 is recommended for surface
mount.
Figure 10. Supply voltage protection
VCC
VCC
0.1μF
DEVICE
VSS
AI02169
16/24
M48T02, M48T12
4
Maximum rating
Maximum rating
Stressing the device above the rating listed in the “Absolute Maximum Ratings” table may
cause permanent damage to the device. These are stress ratings only and operation of the
device at these or any other conditions above those indicated in the Operating sections of
this specification is not implied. Exposure to Absolute Maximum Rating conditions for
extended periods may affect device reliability. Refer also to the STMicroelectronics SURE
Program and other relevant quality documents.
Table 6.
Absolute maximum ratings
Symbol
Ambient Operating Temperature
TA
TSTG
TSLD
Parameter
(1)
Storage Temperature (VCC Off, Oscillator Off)
Lead Solder Temperature for 10 seconds
Value
Unit
0 to 70
°C
–40 to 85
°C
260
°C
VIO
Input or Output Voltages
–0.3 to 7
V
VCC
Supply Voltage
–0.3 to 7
V
IO
Output Current
20
mA
PD
Power Dissipation
1
W
1. Soldering temperature not to exceed 260°C for 10 seconds (total thermal budget not to exceed 150°C for
longer than 30 seconds).
Caution:
Negative undershoots below –0.3V are not allowed on any pin while in the Battery Back-up
mode.
17/24
DC and AC parameters
5
M48T02, M48T12
DC and AC parameters
This section summarizes the operating and measurement conditions, as well as the DC and
AC characteristics of the device. The parameters in the following DC and AC Characteristic
tables are derived from tests performed under the Measurement Conditions listed in the
relevant tables. Designers should check that the operating conditions in their projects match
the measurement conditions when using the quoted parameters.
Table 7.
Operating and AC measurement conditions
Parameter
M48T02
M48T12
Unit
4.75 to 5.5
4.5 to 5.5
V
0 to 70
0 to 70
°C
Load Capacitance (CL)
100
100
pF
Input Rise and Fall Times
≤5
≤5
ns
0 to 3
0 to 3
V
1.5
1.5
V
Supply Voltage (VCC)
Ambient Operating Temperature (TA)
Input Pulse Voltages
Input and Output Timing Ref. Voltages
Note:
Output Hi-Z is defined as the point where data is no longer driven.
Figure 11. AC testing load circuit
5V
1.8kΩ
DEVICE
UNDER
TEST
OUT
1kΩ
CL includes JIG capacitance
Table 8.
CIO
(3)
AI01019
Capacitance
Parameter(1)(2)
Symbol
CIN
CL = 100pF
Min
Max
Unit
Input Capacitance
10
pF
Input / Output Capacitance
10
pF
1. Effective capacitance measured with power supply at 5V. Sampled only, not 100% tested.
2. At 25°C, f = 1MHz.
3. Outputs deselected.
18/24
M48T02, M48T12
Table 9.
DC and AC parameters
DC characteristics
Symbol
ILI
Test condition(1)
Parameter
Input Leakage Current
ILO(2)
Output Leakage Current
ICC
Supply Current
ICC1
(3)
Supply Current (Standby) TTL
ICC2
(3)
Supply Current (Standby) CMOS
Min
Max
Unit
0V ≤ VIN ≤ VCC
±1
µA
0V ≤ VOUT ≤ VCC
±1
µA
Outputs open
80
mA
E = VIH
3
mA
E = VCC – 0.2V
3
mA
VIL
Input Low Voltage
–0.3
0.8
V
VIH
Input High Voltage
2.2
VCC + 0.3
V
VOL
Output Low Voltage
IOL = 2.1mA
VOH
Output High Voltage
IOH = –1mA
0.4
V
2.4
V
1. Valid for Ambient Operating Temperature: TA = 0 to 70°C; VCC = 4.75 to 5.5V or 4.5 to 5.5V (except where noted).
2. Outputs deselected.
3. Measured with Control Bits set as follows: R = '1'; W, ST, FT = '0.'
Figure 12. Power down/up mode AC waveforms
VCC
VPFD (max)
VPFD (min)
VSO
tF
tPD
INPUTS
tDR
tR
tFB
RECOGNIZED
tRB
DON'T CARE
trec
NOTE
RECOGNIZED
HIGH-Z
OUTPUTS
VALID
(PER CONTROL INPUT)
VALID
(PER CONTROL INPUT)
AI00606
Note:
Inputs may or may not be recognized at this time. Caution should be taken to keep E high as
VCC rises past VPFD (min). Some systems may perform inadvertent WRITE cycles after VCC
rises above VPFD (min) but before normal system operations begin. Even though a power on
reset is being applied to the processor, a reset condition may not occur until after the system
clock is running.
19/24
DC and AC parameters
Table 10.
M48T02, M48T12
Power down/up AC characteristics
Parameter(1)
Symbol
Min
Unit
0
µs
VPFD (max) to VPFD (min) VCC Fall Time
300
µs
VPFD (min) to VSS VCC Fall Time
10
µs
tR
VPFD (min) to VPFD (max) VCC Rise Time
0
µs
tRB
VSS to VPFD (min) VCC Rise Time
1
µs
trec
E or W at VIH before Power Up
2
ms
tPD
tF(2)
tFB(3)
E or W at VIH before Power Down
Max
1. Valid for Ambient Operating Temperature: TA = 0 to 70°C; VCC = 4.75 to 5.5V or 4.5 to 5.5V (except where
noted).
2. VPFD (max) to VPFD (min) fall time of less than tF may result in deselection/write protection not occurring
until 200µs after VCC passes VPFD (min).
3. VPFD (min) to VSS fall time of less than tFB may cause corruption of RAM data.
Table 11.
Power down/up trip points DC characteristics
Parameter(1)(2)
Symbol
Min
Typ
Max
Unit
M48T02
4.5
4.6
4.75
V
M48T12
4.2
4.3
4.5
V
VPFD
Power-fail Deselect Voltage
VSO
Battery Back-up Switchover Voltage
tDR(3)
Expected Data Retention Time
3.0
10
V
YEARS
1. All voltages referenced to VSS.
2. Valid for Ambient Operating Temperature: TA = 0 to 70°C; VCC = 4.75 to 5.5V or 4.5 to 5.5V (except where
noted).
3. At 25°C; VCC = 0V.
20/24
M48T02, M48T12
6
Package mechanical data
Package mechanical data
In order to meet environmental requirements, ST offers these devices in ECOPACK®
packages. These packages have a Lead-free second level interconnect. The category of
second Level Interconnect is marked on the package and on the inner box label, in
compliance with JEDEC Standard JESD97. The maximum ratings related to soldering
conditions are also marked on the inner box label. ECOPACK is an ST trademark.
ECOPACK specifications are available at: www.st.com.
Figure 13. PCDIP24 – 24-pin plastic DIP, battery CAPHAT, package outline
A2
A1
B1
B
A
L
C
e1
eA
e3
D
N
E
1
Note:
PCDIP
Drawing is not to scale.
Table 12.
PCDIP24 – 24-pin plastic DIP, battery CAPHAT, package mechanical data
mm
inches
Symb
Typ
Min
Max
A
8.89
A1
Typ
Min
Max
9.65
0.350
0.380
0.38
0.76
0.015
0.030
A2
8.38
8.89
0.330
0.350
B
0.38
0.53
0.015
0.021
B1
1.14
1.78
0.045
0.070
C
0.20
0.31
0.008
0.012
D
34.29
34.80
1.350
1.370
E
17.83
18.34
0.702
0.722
e1
2.29
2.79
0.090
0.110
e3
25.15
30.73
0.990
1.210
eA
15.24
16.00
0.600
0.630
L
3.05
3.81
0.120
0.150
N
24
24
21/24
Part numbering
7
M48T02, M48T12
Part numbering
Table 13.
Ordering information scheme
Example:
M48T
02
–70
PC
1
Device type
M48T
Supply voltage and write protect voltage
02 = VCC = 4.75 to 5.5V; VPFD = 4.5 to 4.75V
12 = VCC = 4.5 to 5.5V; VPFD = 4.2 to 4.5V
Speed
–70 = 100ns (M48T02/12)
–150 = 150ns (M48T02/12)
–200 = 200ns (M48T02/12)
Package
PC = PCDIP24
Temperature range
1 = 0 to 70°C
Shipping method
blank = ECOPACK package, tubes
For other options, or for more information on any aspect of this device, please contact the
ST sales office nearest you.
22/24
M48T02, M48T12
8
Revision history
Revision history
Table 14.
Document revision history
Date
Revision
Changes
Jul-2000
1.0
First issue
13-Jul-2000
1.1
trec change (Table 10)
07-May-2001
2.0
Reformatted; temp. / voltage info. added to tables (Table 8, 9, 3, 4, 10, 11)
14-May-01
2.1
Note added to Clock Calibration section; table footnote correction
(Table 2)
16-Jul-2001
2.2
Basic formatting / content changes (cover page, Table 8, 9)
20-May-2002
2.3
Add countries to disclaimer
26-Jun-2002
2.4
Add footnote to table (Table 11)
28-Mar-2003
3.0
v2.2 template applied; test conditions updated (Table 10)
31-Mar-2004
4.0
Reformatted; Lead-free (Pb-free) package information update (Table 6,
13)
12-Dec-2005
5.0
Updated template, Lead-free text, removed footnote (Table 9, 13)
21-Sep-2007
6
Added lead-free second level interconnect information to cover page and
Section 6: Package mechanical data.
23/24
M48T02, M48T12
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24/24