NT256D64S8HA0G 256MB : 32M x 64 PC2100 / PC1600 Unbuffered DIMM 184pin Two Bank Unbuffered DDR SDRAM MODULE Based on DDR266/200 16Mx8 SDRAM Features • 184-Pin Unbuffered 8-Byte Dual In-Line Memory Module • DRAM DLL aligns DQ and DQS transitions with clock transitions. • 32Mx64 Double Data Rate (DDR) SDRAM DIMM Also aligns QFC transitions with clock during Read cycles • Performance : • Address and control signals are fully synchronous to positive PC1600 Speed Sort DIMM CAS Latency f CK Clock Frequency - 8B clock edge PC2100 - 75B - 7K 2 2.5 2 100 133 133 • Programmable Operation: Unit - DIMM CAS Latency: 2, 2.5 - Burst Type: Sequential or Interleave MHz t CK Clock Cycle 10 7.5 7.5 ns f DQ DQ Burst Frequency 200 266 266 MHz - Burst Length: 2, 4, 8 - Operation: Burst Read and Write • Intended for 100 MHz and 133 MHz applications • Auto Refresh (CBR) and Self Refresh Modes • Inputs and outputs are SSTL-2 compatible • Automatic and controlled precharge commands • VDD = 2.5Volt ± 0.2, VDDQ = 2.5Volt ± 0.2 • 12/10/2 Addressing (row/column/bank) • Single Pulsed RAS interface • SDRAMs have 4 internal banks for concurrent operation • 15.6 µs Max. Average Periodic Refresh Interval • Module has two physical banks • Gold contacts • Differential clock inputs • SDRAMs in 66-pin TSOP Type II Package • Serial Presence Detect • Data is read or written on both clock edges Description NT256D64S8HA0G is an unbuffered 184-Pin Double Data Rate (DDR) Synchronous DRAM Dual In-Line Memory Module (DIMM), organized as a dual-bank high-speed memory array. The 32Mx64 module is a two-bank DIMM that uses sixteen 16Mx8 DDR SDRAMs in 400 mil TSOP packages. The DIMM achieves high-speed data transfer rates of up to 266MHz. The DIMM is intended for use in applications operating from 100 MHz to 133 MHz clock speeds with data rates of 200 to 266 MHz. Clock enable CKE0 and / or CKE1 controls all devices on the DIMM. Prior to any access operation, the device CAS latency and burst type/ length/operation type must be programmed into the DIMM by address inputs A0-A11 and I/O inputs BA0 and BA1 using the mode register set cycle. These DIMMs are manufactured using raw cards developed for broad industry use as reference designs. The use of these common design files minimizes electrical variation between suppliers. The DIMM uses serial presence detects implemented via a serial EEPROM using the two-pin IIC protocol. The first 128 bytes of serial PD data are programmed and locked during module assembly. The last 128 bytes are available to the customer. All NANYA 184 DDR SDRAM DIMMs provide a high-performance, flexible 8-byte interface in a 5.25” long space-saving footprint. Ordering Information Part Number Speed Organization Leads Power 32Mx64 Gold 2.5V 143MHz (7ns @ CL = 2.5 ) NT256D64S8HA0G-7K PC2100 133MHz (7.5ns @ CL= 2 ) 133MHz (7.5ns @ CL= 2.5 ) NT256D64S8HA0G -75B PC2100 100MHz (10ns @ CL = 2 ) 125MHz (8ns @ CL = 2.5 ) NT256D64S8HA0G -8B PC1600 100MHz (10ns @ CL = 2 ) Preliminary 1 © NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S8HA0G 256MB : 32M x 64 PC2100 / PC1600 Unbuffered DIMM Pin Description CK0, CK1, CK2 Differential Clock Inputs CK0 , CK1 , CK2 DQ0-DQ63 Data input/output CKE0, CKE1 Clock Enable DQS0-DQS7, RAS Row Address Strobe DQS9-DQS16 CAS Column Address Strobe VDD Power (2.5V) WE Write Enable VDDQ Supply voltage for DQs(2.5V) S0 , S1 Chip Selects VSS Ground A0-A9, A11 Address Inputs NC No Connect Bidirectional data strobes A10/AP Address Input/Autoprecharge SCL Serial Presence Detect Clock Input BA0, BA1 SDRAM Bank Address Inputs SDA Serial Presence Detect Data input/output VREF Ref. Voltage for SSTL_2 inputs SA0-2 Serial Presence Detect Address Inputs VDDID VDD Identification flag. VDDSPD Serial EEPROM positive power supply(2.5V) Pinout Pin Front Pin Back Pin Front Pin Back Pin Front Pin 1 VREF 93 VSS 32 A5 124 VSS 62 VDDQ 154 Back RAS 2 DQ0 94 DQ4 33 DQ24 125 A6 63 WE 155 DQ45 3 VSS 95 DQ5 34 VSS 126 DQ28 64 DQ41 156 VDDQ 4 DQ1 96 VDDQ 35 DQ25 127 DQ29 65 CAS 157 S0 5 DQS0 97 DQS9 36 DQS3 128 VDDQ 66 VSS 158 S1 6 DQ2 98 DQ6 37 A4 129 DQS12 67 DQS5 159 DQS14 7 VDD 99 DQ7 38 VDD 130 A3 68 DQ42 160 VSS 8 DQ3 100 VSS 39 DQ26 131 DQ30 69 DQ43 161 DQ46 9 NC 101 NC 40 DQ27 132 VSS 70 VDD 162 DQ47 10 NC 102 NC 41 A2 133 DQ31 71 NC 163 NC 11 VSS 103 NC 42 VSS 134 NC 72 DQ48 164 VDDQ 12 DQ8 104 VDDQ 43 A1 135 NC 73 DQ49 165 DQ52 13 DQ9 105 DQ12 44 NC 136 VDDQ 74 VSS 166 DQ53 14 DQS1 106 DQ13 45 NC 137 CK0 75 CK2 167 NC 15 VDDQ 107 DQS10 46 VDD 138 CK0 76 CK2 168 VDD 16 CK1 108 VDD 47 NC 139 VSS 77 VDDQ 169 DQS15 17 CK1 109 DQ14 48 A0 140 NC 78 DQS6 170 DQ54 18 VSS 110 DQ15 49 NC 141 A10 79 DQ50 171 DQ55 19 DQ10 111 CKE1 50 VSS 142 NC 80 DQ51 172 VDDQ 20 DQ11 112 VDDQ 51 NC 143 VDDQ 81 VSS 173 NC 21 CKE0 113 NC 52 BA1 144 NC 82 VDDID 174 DQ60 22 VDDQ 114 DQ20 83 DQ56 175 DQ61 23 DQ16 115 NC 53 DQ32 145 VSS 84 DQ57 176 VSS 24 DQ17 116 VSS 54 VDDQ 146 DQ36 85 VDD 177 DQS16 25 DQS2 117 DQ21 55 DQ33 147 DQ37 86 DQS7 178 DQ62 26 VSS 118 A11 56 DQS4 148 VDD 87 DQ58 179 DQ63 KEY KEY 27 A9 119 DQS11 57 DQ34 149 DQS13 88 DQ59 180 VDDQ 28 DQ18 120 VDD 58 VSS 150 DQ38 89 VSS 181 SA0 29 A7 121 DQ22 59 BA0 151 DQ39 90 NC 182 SA1 30 VDDQ 122 A8 60 DQ35 152 VSS 91 SDA 183 SA2 31 DQ19 123 DQ23 61 DQ40 153 DQ44 92 SCL 184 VDDSPD Note: All pin assignments are consistent for all 8-byte unbuffered versions. Preliminary 2 © NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S8HA0G 256MB : 32M x 64 PC2100 / PC1600 Unbuffered DIMM Input/Output Functional Description Symbol Type CK0 , CK1, CK2 (SSTL) CK0 , CK1 , CK2 (SSTL) CKE0, CKE1 (SSTL) Function Polarity Positive Edge The positive line of the differential pair of system clock inputs which drives the input to the on-DIMM PLL. All the DDR SDRAM address and control inputs are sampled on the rising edge of their associated clocks. Negative The negative line of the differential pair of system clock inputs which drives the input to the Edge Active High on-DIMM PLL. Activates the SDRAM CK signal when high and deactivates the CK signal when low. By deactivating the clocks, CKE low initiates the Power Down mode, or the Self Refresh mode. (SSTL) Active Low RAS , CAS , WE (SSTL) Active Low VREF Supply VDDQ Supply BA0, BA1 (SSTL) S0 , S1 Enables the associated SDRAM command decoder when low and disables the command decoder when high. When the command decoder is disabled, new commands are ignored but previous operations continue. When sampled at the positive rising edge of the clock, RAS , CAS , WE define the operation to be executed by the SDRAM. Reference voltage for SSTL-2 inputs Isolated power supply for the DDR SDRAM output buffers to provide improved noise immunity - Selects which SDRAM bank is to be active. During a Bank Activate command cycle, A0-A11 defines the row address (RA0-RA11) when sampled at the rising clock edge. During a Read or Write command cycle, A0-A9 defines the column address (CA0-CA9) when sampled at the rising clock edge. In addition to the column address, AP is used to A0 - A9 A10/AP A11 (SSTL) - invoke Autoprecharge operation at the end of the Burst Read or Write cycle. If AP is high, autoprecharge is selected and BA0/BA1 define the bank to be precharged. If AP is low, autoprecharge is disabled. During a Precharge command cycle, AP is used in conjunction with BA0/BA1 to control which bank(s) to precharge. If AP is high all 4 banks will be precharged regardless of the state of BA0/BA1. If AP is low, then BA0/BA1 are used to define which bank to pre-charge. DQ0 - DQ63, (SSTL) - DQS0 - DQS7 DQS9 - DQS16 (SSTL) Active High VDD , VSS Supply - SDA - SCL - Preliminary Supply DRAMs. Data strobes: Output with read data, input with write data. Edge aligned with read data, centered on write data. Used to capture write data. Power and ground for the DDR SDRAM input buffers and core logic SA0 – SA2 VDDSPD Data and Check Bit input/output pins operate in the same manner as on conventional Address inputs. Connected to either VDD or VSS on the system board to configure the Serial Presence Detect EEPROM address. This bidirectional pin is used to transfer data into or out of the SPD EEPROM. A resistor must be connected from the SDA bus line to V DD to act as a pullup. This signal is used to clock data into and out of the SPD EEPROM. A resistor may be connected from the SCL bus time to V DD to act as a pullup. Serial EEPROM positive power supply. 3 © NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S8HA0G 256MB : 32M x 64 PC2100 / PC1600 Unbuffered DIMM Functional Block Diagram ( 2 Bank, 16Mx8 DDR SDRAMs ) S1 S0 DQS0 DQS9 DQS4 DQS13 DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7 CS DQS D0 DM I/O 0 I/O 1 I/O 6 I/O 7 I/O 2 I/O 3 I/O 4 I/O 5 CS DQS DQ32 DQ33 DQ34 DQ35 DQ36 DQ37 DQ38 DQ39 D8 DQS1 DQS10 CS DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 CS DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 CS DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 CS DQS D4 DM I/O 0 I/O 1 I/O 6 I/O 7 I/O 2 I/O 3 I/O 4 I/O 5 CS DM I/O 0 I/O 1 I/O 6 I/O 7 I/O 2 I/O 3 I/O 4 I/O 5 CS DM I/O 0 I/O 1 I/O 6 I/O 7 I/O 2 I/O 3 I/O 4 I/O 5 CS DM I/O 0 I/O 1 I/O 6 I/O 7 I/O 2 I/O 3 I/O 4 I/O 5 CS DQS D12 DQS5 DQS14 DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 DQ8 DQ9 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15 CS DQS D1 DM I/O 0 I/O 1 I/O 6 I/O 7 I/O 2 I/O 3 I/O 4 I/O 5 CS DQS DQ40 DQ41 DQ42 DQ43 DQ44 DQ45 DQ46 DQ47 D9 DQS2 DQS11 DQS D5 DQS D13 DQS6 DQS15 DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 DQ16 DQ17 DQ18 DQ19 DQ20 DQ21 DQ22 DQ23 CS DQS D2 DM I/O 0 I/O 1 I/O 6 I/O 7 I/O 2 I/O 3 I/O 4 I/O 5 CS DQS DQ48 DQ49 DQ50 DQ51 DQ52 DQ53 DQ54 DQ55 D10 DQS3 DQS12 DQS D6 DQS D14 DQS7 DQS16 DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 DQ24 DQ25 DQ26 DQ27 DQ28 DQ29 DQ30 DQ31 BA0-BA1 CS D3 DQS DM I/O 0 I/O 1 I/O 6 I/O 7 I/O 2 I/O 3 I/O 4 I/O 5 CS A0 - A11 : SDRAMs D0 -D15 RAS RAS : SDRAMs D0 -D15 CAS CAS : SDRAMs D0 -D15 CKE0 CKE0 : SDRAMs D0 -D7 CKE1 WE : SDRAMs D8 -D15 WE WE : SDRAMs D0 -D15 DQS DQ56 DQ57 DQ58 DQ59 DQ60 DQ61 DQ62 DQ63 D11 BA0 - BA1 : SDRAMs D0 -D15 A0-A11 Notes : 1. 2. 3. 4. DM I/O 7 I/O 6 I/O 1 I/O 0 I/O 5 I/O 4 I/O 3 I/O 2 VDDQ VDD VREF VSS VDDID D0 - D15 D0 - D15 D0 - D15 D0 - D15 DQS D7 DQS D15 CK0 120 ohm SDRAM x 4 120 ohm SDRAM x 6 120 ohm SDRAM x 6 CK0 CK1 Strap: see Note 4 CK1 Serial PD SCL WP CK2 A0 A1 A2 SA0 SA1 SA2 SDA CK2 DQ-to-I/O wring may be changed within a byte. DQ/DQS/DM/CKE/S relationships are maintained as shown. DQ/DQS/DM/DQS resistors are 22 Ohms. VDDID strap connections (for memory device VDD, VDDQ): STRAP OUT (OPEN): VDD = VDDQ STRAP IN (VSS): VDD is not equal to VDDQ. Preliminary 4 © NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S8HA0G 256MB : 32M x 64 PC2100 / PC1600 Unbuffered DIMM Absolute Maximum Ratings Symbol VIN, VOUT Parameter Voltage on I/O pins relative to Vss Rating Units -0.5 to VDDQ+0.5 V VIN Voltage on Input relative to Vss -0.5 to +3.6 V VDD Voltage on VDD supply relative to Vss -0.5 to +3.6 V Voltage on VDDQ supply relative to Vss -0.5 to +3.6 V 0 to+70 °C VDDQ TA TSTG PD IOUT Operating Temperature (Ambient) -55 to +150 °C Power Dissipation Storage Temperature (Plastic) 16 W Short Circuit Output Current 50 mA Note: Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. Capacitance Symbol Max. Units Notes Input Capacitance: CK0, CK0 , CK1, CK1 , CK2, CK2 CI1 24 pF 1 Input Capacitance: A0-A11, BA0, BA1, WE , RAS , CAS CI2 60 pF 1 Input Capacitance: CKE0, CKE1, S0 , S1 CI3 30 pF 1 Parameter CIO1 14 pF 1,2 Input/Output Capacitance DQ0-63; DQS0-7, 9-16 1. VDDQ = VDD = 2.5V ± 0.2V, f = 100 MHz, T A = 25 °C, V OUT (DC) = VDDQ/2 , VOUT (Peak to Peak) = 0.2V. 2. DQS inputs are grouped with I/O pins reflecting the fact that they are matched in loading to DQ and DQS to facilitate trace matching at the board level. Preliminary 5 © NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S8HA0G 256MB : 32M x 64 PC2100 / PC1600 Unbuffered DIMM DC Electrical Characteristics and Operating Conditions ( TA = 0 °C ~ 70 °C ; VDDQ = 2.5V ± 0.2V; VDD = 2.5V ± 0.2V, See AC Characteristics) Symbol Min Max Units Notes Supply Voltage 2.3 2.7 V 1 I/O Supply Voltage 2.3 2.7 V 1 0 0 V /O Reference Voltage 0.49 x VDDQ 0.51 x VDDQ V 1,2 I/O Termination Voltage (System) VREF – 0.04 VREF + 0.04 V 1,3 VIH(DC) Input High (Logic1) Voltage VREF + 0.15 VDDQ + 0.3 V 1 VIL(DC) Input Low (Logic0) Voltage -0.3 VREF - 0.15 V 1 VIN(DC) Input Voltage Level, CK and CK Inputs -0.3 VDDQ + 0.3 V 1 VID(DC) Input Differential Voltage, CK and CK Inputs 0.30 V DDQ + 0.6 V 1,4 -5 5 µA 1 -5 5 µA 1 -16.8 - mA 1 16.8 - mA 1 VDD VDDQ VSS , VSSQ VREF VTT Parameter Supply Voltage, I/O Supply Voltage Input Leakage Current II Any input 0V ≤ VIN ≤ VDD; (All other pins not under test = 0V) Output Leakage Current IOZ (DQs are disabled; 0V ≤ Vout ≤ VDDQ Output High Current IOH (VOUT = VDDQ -0.373V, min VREF , min VTT ) Output Low Current IOL (VOUT = 0.373, max VREF , max VTT ) 1. Inputs are not recognized as valid until VREF stabilizes. 2. VREF is expected to be equal to 0.5 V DDQ of the transmitting device, and to track variations in the DC level of the same. Peak-to-peak noise on VREF may not exceed 2% of the DC value. 3. VTT is not applied directly to the DIMM. VTT is a system supply for signal termination resistors, is expected to be set equal to VREF , and must track variations in the DC level of VREF . 4. VID is the magnitude of the difference between the input level on CK and the input level on CK . Preliminary 6 © NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S8HA0G 256MB : 32M x 64 PC2100 / PC1600 Unbuffered DIMM AC Characteristics (Notes 1-5 apply to the following Tables; Electrical Characteristics and DC Operating Conditions, AC Operating Conditions, Operating, Standby, and Refresh Currents, and Electrical Characteristics and AC Timing.) 1. All voltages referenced to VSS . 2. Tests for AC timing, IDD , and electrical, AC and DC characteristics, may be conducted at nominal reference/supply voltage levels, but the related specifications and device operation are guaranteed for the full voltage range specified. 3. Outputs measured with equivalent load. Refer to the AC Output Load Circuit below. 4. AC timing and IDD tests may use a VIL to VIH swing of up to 1.5V in the test environment, but input timing is still referenced to VREF (or to the crossing point for CK, CK), and parameter specifications are guaranteed for the specified AC input levels under normal use conditions. The minimum slew rate for the input signals is 1V/ns in the range between VIL(AC) and VIH(AC) unless otherwise specified. 5. The AC and DC input level specifications are as defined in the SSTL_2 Standard (i.e. the receiver effectively switches as a result of the signal crossing the AC input level, and remains in that state as long as the signal does not ring back above (below) the DC input LOW (HIGH) level. AC Output Load Circuits VTT 50 ohms Output Timing Reference Point VOUT 30 pF AC Operating Conditions ( TA = 0 °C ~ 70 °C ; VDDQ = 2.5V ± 0.2V; VDD = 2.5V ± 0.2V, See AC Characteristics) Symbol Parameter/Condition Min Max Unit Notes VIH(AC) Input High (Logic 1) Voltage. VREF + 0.31 - V 1, 2 VIL(AC) Input Low (Logic 0) Voltage. - VREF ? - 0.31 V 1, 2 VID(AC) Input Differential Voltage, CK and CK Inputs 0.62 VDDQ + 0.6 V 1, 2, 3 VIX(AC) Input Differential Pair Cross Point Voltage, CK and CK Inputs (0.5*VDDQ ) - 0.2 (0.5*VDDQ ) +?0.2 V 1, 2, 4 1. Input skew rate = 1V/ ns . 2. Inputs are not recognized as valid until VREF stabilizes. 3. VID is the magnitude of the difference between the input level on CK and the input level on CK. 4. The value of VIX is expected to equal 0.5* VDDQ of the transmitting device and must track variations in the DC level of the same. Preliminary 7 © NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S8HA0G 256MB : 32M x 64 PC2100 / PC1600 Unbuffered DIMM Operating, Standby, and Refresh Currents ( TA = 0 °C ~ 70 °C ; VDDQ = 2.5V ± 0.2V; VDD = 2.5V ± 0.2V, See AC Characteristics) Symbol Parameter/Condition PC1600 PC2100 Unit Notes 1000 1160 mA 1,2 1120 1360 mA 1,2 240 240 mA 1,2 480 560 mA 1,2 240 240 mA 1,2 800 960 mA 1,2 1640 1800 mA 1,2 1320 1680 mA 1,2 t RC = t RFC (MIN) 1840 2400 mA 1,2 t RC = 15.625 µs 252 252 mA 1,2,4 32 32 mA 1,2,3 Operating Current : one bank; active / precharge; tRC = tRC (MIN) ; I DD0 tCK = tCK (MIN) ; DQ, DM, and DQS inputs changing twice per clock cycle; address and control inputs changing once per clock cycle Operating Current : one bank; active / read / precharge; Burst = 2; I DD1 tRC = tRC (MIN) ; CL=2.5; tCK = tCK (MIN) ; IOUT = 0mA; address and control inputs changing once per clock cycle I DD2P I DD2N I DD3P Precharge Power-Down Standby Current : all banks idle; power-down mode; CKE ≤ VIL (MAX) ; tCK = tCK (MIN) Idle Standby Current : CS ≥ VIH (MIN) ; all banks idle; CKE >= VIH(MIN) ; tCK = tCK (MIN) ; address and control inputs changing once per clock cycle Active Power-Down Standby Current : one bank active; power-down mode; CKE ≤ VIL (MAX) ; tCK = tCK (MIN) Active Standby Current : one bank; active / precharge; CS ≥ VIH (MIN) ; I DD3N CKE ≥ VIH (MIN) ; tRC = tRAS (MAX) ; tCK = tCK (MIN) ; DQ, DM, and DQS inputs changing twice per clock cycle; address and control inputs changing once per clock cycle Operating Current : one bank; Burst = 2; reads; continuous burst; I DD4R address and control inputs changing once per clock cycle; DQ and DQS outputs changing twice per clock cycle; CL = 2.5; tCK = tCK (MIN) ; IOUT = 0mA Operating Current : one bank; Burst = 2; writes; continuous burst; I DD4W address and control inputs changing once per clock cycle; DQ and DQS inputs changing twice per clock cycle; CL=2.5; tCK = tCK (MIN) I DD5 Auto-Refresh Current : I DD6 Self-Refresh Current : CKE ≤ ? 0.2V 1. I DD specifications are tested after the device is properly initialized. 2. Input slew rate = 1V/ ns . 3. Enables on-chip refresh and address counters. 4. Current at 15.625 µs is time averaged value of IDD5 at tRFC (MIN) and IDD2P over 15.625 µs. Preliminary 8 © NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S8HA0G 256MB : 32M x 64 PC2100 / PC1600 Unbuffered DIMM AC Timing Specifications for DDR SDRAM Devices Used on Module ( TA = 0 °C ~ 70 °C ; VDDQ = 2.5V ± 0.2V; VDD = 2.5V ± 0.2V, See AC Characteristics) (Part 1 of 2) Symbol -7K Parameter -75B -8B Unit Notes +0.8 ns 1,2,3,4 +0.8 ns 1,2,3,4 0.45 0.55 tCK 1,2,3,4 Min. Max. Min. Max. Min. Max. DQ output access time from CK/ CK -0.75 +0.75 -0.75 +0.75 -0.8 DQS output access time from CK/ CK -0.75 +0.75 -0.75 +0.75 -0.8 tCH CK high-level width 0.45 0.55 0.45 0.55 tCL CK low-level width tAC tDQSCK tCK tCK Clock cycle time 0.45 0.55 0.45 0.55 0.45 0.55 tCK 1,2,3,4 CL=2.5 7 12 7.5 12 8 12 ns 1,2,3,4 CL=2 7.5 12 10 12 10 12 ns 1,2,3,4 tDH DQ and DM input hold time 0.5 0.5 0.6 ns tDS DQ and DM input setup time 0.5 0.5 0.6 ns DQ and DM input pulse width (each input) 1.75 1.75 2 ns tDIPW tHZ tLZ tDQSQ tDQSQA Data-out high-impedance time from CK/ CK Data-out low-impedance time from CK/ CK tHP tQH tDQSS tDQSL,H tDSS tDSH tMRD tWPRES +0.8 ns -0.75 +0.75 -0.75 +0.75 -0.8 +0.8 ns 0.6 ns 1,2,3,4 0.6 ns 1,2,3,4 tCK 1,2,3,4 tCK 1,2,3,4 tCK 1,2,3,4 0.5 0.5 0.5 tCH 0.5 tCH or or or tCL tCL tCL tHP - tHP - tHP - 0.75ns 0.75ns 1.0ns 0.75 1.25 0.75 1.25 0.75 1.25 4, 5 0.35 0.35 tCK 1,2,3,4 0.2 0.2 0.2 tCK 1,2,3,4 0.2 0.2 0.2 tCK 1,2,3,4 Mode register set command cycle time 14 15 16 ns 1,2,3,4 Write preamble setup time 0 0 0 ns DQS falling edge to CK setup time (write cycle) DQS falling edge hold time from CK (write cycle) 0.40 tWPRE Write preamble 0.25 0.25 0.25 tCK 0.9 1.1 1.1 ns tIH 1, 2, 3, 0.35 (write cycle) Write postamble tIS 4, 5 tCH tWPST tIH 1, 2, 3, -0.8 cycle; defined by clk high(tCH ) DQS input low (high) pulse width 1,2,3,4 +0.75 or clk low (tCL ) time transition ,15,16 -0.75 DQS-DQ skew (DQS & all DQ signals) Write command to 1st DQS latching 1,2,3,4 +0.75 signals) Data output hold time from DQS ,15,16 -0.75 DQS-DQ skew (DQS & associated DQ Minimum half clk period for any given 1,2,3,4 Address and control input hold time (fast slew rate) Address and control input setup time (fast slew rate) Address and control input hold time (slow slew rate) Preliminary 0.60 0.40 0.60 0.40 0.60 tCK 1, 2, 3, 4, 7 1, 2, 3, 4, 6 1,2,3,4 2, 3, 4, 9, 11, 12 2, 3, 4, 0.9 1.1 1.1 ns 9, 11, 12 2, 3, 4, 1.0 1.1 1.1 ns 10, 11, 12, 14 9 © NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S8HA0G 256MB : 32M x 64 PC2100 / PC1600 Unbuffered DIMM AC Timing Specifications for DDR SDRAM Devices Used on Module ( TA = 0 °C ~ 70 °C ; VDDQ = 2.5V ± 0.2V; VDD = 2.5V ± 0.2V, See AC Characteristics) (Part 2 of 2) Symbol Parameter -7K Min. -75B Max. Min. -8B Max. Min. Max. Unit - ns 2, 3, 4, 10, 11, 12, 14 2, 3, 4, 12 0.9 1.1 tCK 1,2,3,4 0.60 0.40 0.60 tCK 1,2,3,4 120,000 50 120,000 ns 1,2,3,4 Address and control input setup time tIS 1.0 1.0 2.2 1.1 ns (slow slewrate) tIPW Input pulse width 2.2 tRPRE Read preamble 0.9 1.1 0.9 1.1 tRPST Read postamble 0.40 0.60 0.40 tRAS Active to Precharge command 45 120,000 45 Active to Active/Auto-refresh tRC Notes 65 65 70 ns 1,2,3,4 75 75 80 ns 1,2,3,4 20 20 20 ns 1,2,3,4 20 20 20 ns 1,2,3,4 20 20 20 ns 1,2,3,4 15 15 15 ns 1,2,3,4 15 (tWR/ tCK ) + 15 (tWR/ tCK ) + 15 (tWR/ tCK ) + ns 1,2,3,4 command period Auto-refresh to Active/Auto-refresh tRFC command period tRCD Active to Read or Write delay Active to Read Command with tRAP Autoprecharge tRP Precharge command period Active bank A to Active bank B tRRD command tWR Write recovery time Auto precharge write recovery + tDAL precharge time tWTR Internal write to read command delay 1, 2, 3, tCK 4, 13 (tRP/ (tRP / (tRP / tCK ) tCK ) tCK ) 1 1 1 tCK 1,2,3,4 75 75 80 ns 1,2,3,4 200 200 200 tCK 1,2,3,4 1, 2, 3, Exit self-refresh to non-read tXSNR command tXSRD Exit self-refresh to read command tREFI Average Periodic Refresh Interval Preliminary 15.6 15.6 15.6 µs 4, 8 10 © NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S8HA0G 256MB : 32M x 64 PC2100 / PC1600 Unbuffered DIMM AC Timing Specification Notes 1. Input slew rate = 1V/ns. 2. The CK/ CK input reference level (for timing reference to CK/ CK ) is the point at which CK and CK cross: the input reference level for signals other than CK/ CK , is VREF. 3. Inputs are not recognized as valid until VREF stabilizes. 4. The Output timing reference level, as measured at the timing reference point indicated in AC Characteristics (Note 3) is VTT . 5. tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referred to a specific voltage level, but specify when the device is no longer driving (HZ), or begins driving (LZ). 6. The maximum limit for this parameter is not a device limit. The device operates with a greater value for this parameter, but system performance (bus turnaround) degrades accordingly. 7. The specific requirement is that DQS be valid (high, low, or some point on a valid transition) on or before this CK edge. A valid transition is defined as monotonic and meeting the input slew rate specifications of the device. When no writes were previously in progress on the bus, DQS will be transitioning from Hi-Z to logic LOW. If a previous write was in progress, DQS could be HIGH, LOW, or transitioning from high to low at this time, depending on tDQSS . 8. A maximum of eight Auto refresh commands can be posted to any given DDR SDRAM device. 9. For command/address input slew rate >= 1.0 V/ns. Slew rate is measured between VOH (AC) and VOL (AC). 10. For command/address input slew rate >= 0.5 V/ns and < 1.0 V/ns. Slew rate is measured between VOH (AC) and VOL (AC). 11. CK/ CK slew rates are >= 1.0 V/ns. 12. These parameters guarantee device timing, but they are not necessarily tested on each device, and they may be guaranteed by design or tester characterization. 13. For each of the terms in parentheses, if not already an integer, round to the next highest integer. t CK is equal to the actual system clock cycle time. For example, for PC2100 at CL= 2.5, t DAL = (15ns/7.5ns) +(20ns/7.0ns) = 2 + 3 = 5. 14. An input setup and hold time derating table is used to increase t IS and t IH in the case where the input slew rate is below 0.5 V/ns. Input Slew Rate Delta ( tIS ) ? Delta ( tIH ) Unit Note 0.5 V/ns 0 0 ps 1,2 0.4 V/ns +50 0 ps 1,2 0.3 V/ns +100 0 ps 1. Input slew rate is based on the lesser of the slew rates determined by either V IH (AC) to V IL (AC) or V IH (DC) to V IL (DC) , similarly for rising transitions. 2. These derating parameters may be guaranteed by design or tester characterization and are not necessarily tested on each device. 1,2 15. An input setup and hold time derating table is used to increase t DS and t DH in the case where the I/O slew rate is below 0.5 V/ns. Input Slew Rate Delta ( tDS ) Delta ( tDH ) Unit Note 0.5 V/ns 0 0 ps 1,2 0.4 V/ns +75 +75 ps 1,2 0.3 V/ns +150 +150 ps 1,2 1. I/O slew rate is based on the lesser of the slew rates determined by either V IH (AC) to V IL (AC) or V IH (DC) to V IL (DC) , similarly for rising transitions. 2. These derating parameters may be guaranteed by design or tester characterization and are not necessarily tested on each device. 16. An I/O Delta Rise, Fall Derating table is used to increase t DS and t DH in the case where DQ, DM, and DQS slew rates differ. Delta Rise and Fall Rate Delta ( tDS ) Delta ( tDH ) Unit Note 0.0 ns/V 0 0 ps 1,2,3,4 0.25 ns/V +50 +50 ps 1,2,3,4 0.5 ns/V +100 +100 ps 1,2,3,4 1. Input slew rate is based on the lesser of the slew rates determined by either V IH (AC) to V IL (AC) or V IH (DC) to V IL (DC) , similarly for rising transitions. 2. Input slew rate is based on the larger of AC to AC delta rise, fall rate and DC to DC delta rise, fall rate. 3. The delta rise, fall rate is calculated as: [1/(slew rate 1)] - [1/(slew rate 2)] For example: slew rate 1 = 0.5 V/ns; slew rate 2 = 0.4 V/ns. Delta rise, fall = (1/0.5) - (1/0.4) [ns/V] = -0.5 ns/V Using the table above, this would result in an increase in t DS and t DH of 100 ps. 4. These derating parameters may be guaranteed by design or tester characterization and are not necessarily tested on each device. Preliminary 11 © NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S8HA0G 256MB : 32M x 64 PC2100 / PC1600 Unbuffered DIMM Serial Presence Detect 32Mx64 SDRAM DIMM based on 16Mx8, 4Banks, 4K Refresh, 2.5V DDR SDRAMs with SPD Byte Serial PD Data Entry SPD Entry Value Description -7K (Hexadecimal) -75B -8B -7K -75 0 Number of Serial PD Bytes Written during Production 128 80 1 Total Number of Bytes in Serial PD device 256 08 2 Fundamental Memory Type SDRAM DDR 07 3 Number of Row Addresses on Assembly 12 0C 4 Number of Column Addresses on Assembly 10 0A 5 Number of DIMM Bank 2 02 6. Data Width of Assembly X64 40 7 Data Width of Assembly (cont’) X64 00 8 Voltage Interface Level of this Assembly 9 SDRAM Device Cycle Time at CL=2.5 10 SDRAM Device Access Time from Clock at CL=2.5 11 DIMM Configuration Type 12 Refresh Rate/Type 13 Primary SDRAM Width X8 08 14 Error Checking SDRAM Device Width N/A 00 1 Clock 01 2,4,8 0E 15 SSTL 2.5V Note -8B 04 7ns 7.5ns 8ns 70 75 80 0.75ns 0.75ns 0.8ns 75 75 80 SDRAM Device Attributes : Minimum Clock Delay, Random Column Access Non-Parity 00 15.6µs / SR 80 16 SDRAM Device Attributes: Burst Length Supported 17 SDRAM Device Attributes: Number of Device Banks 18 SDRAM Device Attributes: CAS Latency 19 SDRAM Device Attributes: CS Latency 20 SDRAM Device Attributes: WE Latency 21 SDRAM Module Attributes 22 SDRAM Device Attributes: General +/-0.2V Voltage Tolerance 23 Minimum Clock Cycle at CL=2 7.5ns 24 Maximum Data Access Time from Clock at CL=2 25 Minimum Clock Cycle Time at CL=1 26 Maximum Data Access Time from Clock at CL=1 27 Minimum Row Precharge Time (tRP) 20ns 20ns 20ns 50 50 50 28 Minimum Row Active to Row Active delay (tRRD) 15ns 15ns 15ns 3C 3C 3C 29 Minimum RAS to CAS delay (tRCD) 20ns 20ns 20ns 50 50 50 30 Minimum RAS Pulse Width (tRAS) 45ns 45ns 50ns 2D 2D 32 31 Module Bank Density 32 Address and Command Setup Time Before Clock 0.9ns 0.9ns 1.1ns 90 90 B0 33 Address and Command Hold Time After Clock 0.9ns 0.9ns 1.1ns 90 90 B0 34 Data Input Setup Time Before Clock 0.5ns 0.5ns 0.6ns 50 50 60 35 Data Input Hold Time After Clock 0.5ns 0.5ns 0.6ns 50 50 60 36-61 4 2, 2.5 SPD Revision 63 Checksum Data 2, 2.5 0C 01 1 02 Differential Clock 20 10ns 0C 00 10ns 75 ± 0.8ns 75 N/A A0 A0 75 80 00 N/A 00 128MB 20 Undefined 0 0C 0 ± 0.75ns ± 0.75ns Reserved 62 04 2, 2.5 00 0 0 00 00 00 6D 9D 23 64-71 Manufacturer’s JEDED ID Code 0B 7F7F7F0B00000000 72 Module Manufacturing Location N/A 00 73-90 Module Part number 91-92 Module Revision Code 93-94 Module Manufacturing Data 95-98 Module Serial Number N/A 99-255 Reserved 1. yy= Binary coded decimal year code, 0-99(Decimal), 00-63(Hex) 2. ww= Binary coded decimal year code, 01-52(Decimal), 01-34(Hex) Preliminary N/A N/A 00 00 N/A 00 Year / Week Code yy/ww Serial Number 00 Undefined 00 00 1,2 12 © NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice. NT256D64S8HA0G 256MB : 32M x 64 PC2100 / PC1600 Unbuffered DIMM Package Dimensions FRONT 133.35 5.25 17.80 0.700 31.75 1.250 10.0 0.394 (2x)4.00 0.157 128.95 5.077 0.098 Detail A 3.0 0.118 θ 2.50 Detail B Side BACK 3.99 0.157 max. 1.27+/- 0.10 0.050 +/- 0.004 Detail B 3.80 0.150 4.00 0.157 Detail A 1.00 Width 0.039 6.35 0.250 1.27 Pitch 0.05 1.80 0.071 Note : All dimensions are typical unless otherwise stated. Unit : Preliminary Millimeters Inches 13 © NANYA TECHNOLOGY CORP. NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.