PALLV22V10 PALLV22V10Z COM'L: -7/10/15 IND: -15 IND: -25 PALLV22V10 and PALLV22V10Z Families Low-Voltage (Zero Power) 24-Pin EE CMOS Versatile PAL Device DISTINCTIVE CHARACTERISTICS ◆ Low-voltage operation, 3.3 V JEDEC compatible ◆ ◆ ◆ ◆ ◆ R G N AL EW D E D V ES IC IG ES N F S O ◆ ◆ ◆ ◆ — VCC = + 3.0 V to 3.6 V Commercial and industrial operating temperature range 7.5-ns tPD Electrically-erasable technology provides reconfigurable logic and full testability 10 macrocells programmable as registered or combinatorial, and active high or active low to match application needs Varied product term distribution allows up to 16 product terms per output for complex functions Global asynchronous reset and synchronous preset for initialization Power-up reset for initialization and register preload for testability Extensive third-party software and programmer support 24-pin SKINNY DIP and 28-pin PLCC packages save space GENERAL DESCRIPTION The PALLV22V10 is an advanced PAL® device built with low-voltage, high-speed, electricallyerasable CMOS technology. The PALLV22V10Z provides low voltage and zero standby power. At 30 µA maximum standby current, the PALLV22V10Z allows battery powered operation for an extended period. U SE The PALLV22V10 device implements the familiar Boolean logic transfer function, the sum of products. The PAL device is a programmable AND array driving a fixed OR array. The AND array is programmed to create custom product terms, while the OR array sums selected terms at the outputs. The product terms are connected to the fixed OR array with a varied distribution from 8 to 16 across the outputs (see Block Diagram). The OR sum of the products feeds the output macrocell. Each macrocell can be programmed as registered or combinatorial, and active high or active low. The output configuration is determined by two bits controlling two multiplexers in each macrocell. Publication# 18956 Amendment/0 Rev: F Issue Date: September 2000 BLOCK DIAGRAM I1 - I11 CLK/I0 1 11 PROGRAMMABLE AND ARRAY (44 x 132) 12 14 16 16 14 OUTPUT LOGIC MACRO CELL OUTPUT LOGIC MACRO CELL OUTPUT LOGIC MACRO CELL OUTPUT LOGIC MACRO CELL OUTPUT LOGIC MACRO CELL OUTPUT LOGIC MACRO CELL OUTPUT LOGIC MACRO CELL I/O0 I/O1 12 R 10 OUTPUT LOGIC MACRO CELL G N AL EW D E D V ES IC IG ES N F S O RESET 8 I/O2 I/O3 I/O4 I/O5 I/O6 I/O7 10 OUTPUT LOGIC MACRO CELL 8 OUTPUT LOGIC MACRO CELL PRESET I/O8 I/O9 18956D-001 FUNCTIONAL DESCRIPTION The PALLV22V10 is the low-voltage version of the PALCE22V10. It has all the architectural features of the PALCE22V10. U SE The PALLV2210Z is the low-voltage, zero-power version of the PALCE22V10. It has all the architectural features of the PALCE22V10. In addition, the PALLV22V10Z has zero standby power and an unused product term disable feature. The PALLV22V10 allows the systems engineer to implement a design on-chip by programming EE cells to configure AND and OR gates within the device, according to the desired logic function. Complex interconnections between gates, which previously required time-consuming layout, are lifted from the PC board and placed on silicon, where they can be easily modified during prototyping or production. Product terms with all connections opened assume the logical HIGH state; product terms connected to both true and complement of any single input assume the logical LOW state. The PALLV22V10 has 12 inputs and 10 I/O macrocells. The macrocell (Figure 1) allows one of four potential output configurations; registered output or combinatorial I/O, active high or active low (see Figure 2). The configuration choice is made according to the user’s design specification and corresponding programming of the configuration bits S0 - S1. Multiplexer controls are connected to ground (0) through a programmable bit, selecting the “0” path through the multiplexer. Erasing the bit disconnects the control line from GND and it floats to VCC (1), selecting the “1” path. The device is produced with a EE cell link at each input to the AND gate array, and connections may be selectively removed by applying appropriate voltages to the circuit. Utilizing an easilyimplemented programming algorithm, these products can be rapidly programmed to any customized pattern. 2 PALLV22V10 and PALLV22V10Z Families Variable Input/Output Pin Ratio The PALLV22V10 has twelve dedicated input lines, and each macrocell output can be an I/O pin. Buffers for device inputs have complementary outputs to provide user-programmable input signal polarity. Unused input pins should be tied to VCC or GND. Registered Output Configuration Each macrocell of the PALLV22V10 includes a D-type flip-flop for data storage and synchronization. The flip-flop is loaded on the LOW-to-HIGH transition of the clock input. In the registered configuration (S1 = 0), the array feedback is from Q of the flip-flop. R Combinatorial I/O Configuration AR D Q CLK Q SP 0 1 G N AL EW D E D V ES IC IG ES N F S O Any macrocell can be configured as combinatorial by selecting the multiplexer path that bypasses the flip-flop (S1 = 1). In the combinatorial configuration, the feedback is from the pin. 1 1 0 0 S1 0 1 0 1 S0 I/On S1 0 S0 0 Output Configuration 0 1 Registered/Active High 1 0 Combinatorial/Active Low 1 1 Combinatorial/Active High Registered/Active Low U SE 0 = Programmed EE bit 1 = Erased (charged) EE bit 18956C-004 Figure 1. Output Logic Macrocell Diagram PALLV22V10 and PALLV22V10Z Families 3 S0 = 0 S1 = 0 AR D S0 = 0 S1 = 1 Q CLK Q SP CLK Q Q SP G N AL EW D E D V ES IC IG ES N F S O S0 = 1 S1 = 0 AR D R b. Combinatorial/active low a. Registered/active low S0 = 1 S1 = 1 d. Combinatorial/active high c. Registered/active high 18956D-005 Figure 2. Macrocell Configuration Options Programmable Three-State Outputs U SE Each output has a three-state output buffer with three-state control. A product term controls the buffer, allowing enable and disable to be a function of any product of device inputs or output feedback. The combinatorial output provides a bi-directional I/O pin, and may be configured as a dedicated input if the buffer is always disabled. Programmable Output Polarity The polarity of each macrocell output can be active high or active low, either to match output signal needs or to reduce product terms. Programmable polarity allows Boolean expressions to be written in their most compact form (true or inverted), and the output can still be of the desired polarity. It can also save “DeMorganizing” efforts. Selection is controlled by programmable bit S0 in the output macrocell, and affects both registered and combinatorial outputs. Selection is automatic, based on the design specification and pin definitions. If the pin definition and output equation have the same polarity, the output is programmed to be active high (S0 = 1). Preset/Reset For initialization, the PALLV22V10 has additional preset and reset product terms. These terms are connected to all registered outputs. When the synchronous preset (SP) product term is asserted high, the output registers will be loaded with a HIGH on the next LOW-to-HIGH clock transition. When the asynchronous reset (AR) product term is asserted high, the output registers will be immediately loaded with a LOW independent of the clock. 4 PALLV22V10 and PALLV22V10Z Families Note that preset and reset control the flip-flop, not the output pin. The output level is determined by the output polarity selected. Benefits of Lower Operating Voltage The PALLV22V10 has an operating voltage range of 3.0 V to 3.6 V. Low voltage allows for lower operating power consumption, longer battery life, and/or smaller batteries for notebook applications. R Because power is proportional to the square of the voltage, reduction of the supply voltage from 5.0 V to 3.3 V significantly reduces power consumption. This directly translates to longer battery life for portable applications. Lower power consumption can also be used to reduce the size and weight of the battery. Thus, 3.3 V designs facilitate a reduction in the form factor. G N AL EW D E D V ES IC IG ES N F S O A lower operating voltage results in a reduction of I/O voltage swings. This reduces noise generation and provides a less hostile environment for board design. A lower operating voltage also reduces electromagnetic radiation noise and makes obtaining FCC approval easier. 3.3-V (CMOS) and 5-V (CMOS and TTL) Compatible Inputs and I/O Input voltages can be at TTL levels. Additionally, the PALLV22V10 can be driven with true 5-V CMOS levels due to special input and I/O buffer circuitry. Power-Up Reset All flip-flops power up to a logic LOW for predictable system initialization. Outputs of the PALLV22V10 will depend on the programmed output polarity. The VCC rise must be monotonic, and the reset delay time is 1000ns maximum. Register Preload Security Bit U SE The registers on the PALLV22V10 can be preloaded from the output pins to facilitate functional testing of complex state machine designs. This feature allows direct loading of arbitrary states, making it unnecessary to cycle through long test vector sequences to reach a desired state. In addition, transitions from illegal states can be verified by loading illegal states and observing proper recovery. After programming and verification, a PALLV22V10 design can be secured by programming the security EE bit. Once programmed, this bit defeats readback of the internal programmed pattern by a device programmer, securing proprietary designs from competitors. When the security bit is programmed, the array will read as if every bit is erased, and preload will be disabled. The bit can only be erased in conjunction with erasure of the entire pattern. Programming and Erasing The PALLV22V10 can be programmed on standard logic programmers. It also may be erased to reset a previously configured device back to its unprogrammed state. Erasure is automatically performed by the programming hardware. No special erase operation is required. PALLV22V10 and PALLV22V10Z Families 5 Quality and Testability The PALLV22V10 offers a very high level of built-in quality. The erasability of the CMOS PALLV22V10 allows direct testing of the device array to guarantee 100% programming and functional yields. Technology The high-speed PALLV22V10 is fabricated with Vantis’ advanced electrically-erasable (EE) CMOS process. The array connections are formed with proven EE cells. Inputs and outputs are designed to be 3.3-V and 5-V device compatible. This technology provides strong input-clamp diodes, output slew-rate control, and a grounded substrate for clean switching. R Zero-Standby Power Mode G N AL EW D E D V ES IC IG ES N F S O The PALLV22V10Z features a zero-standby power mode. When none of the inputs switch for an extended period (typically 30 ns), the PALLV22V10Z will go into standby mode, shutting down most of its internal circuitry. The current will go to almost zero (ICC <30 µA). The outputs will maintain the states held before the device went into the standby mode. If a macrocell is used in registered mode, switching pin CLK/I0 will not affect standby mode status for that macrocell. If a macrocell is used in combinatorial mode, switching pin CLK/I0 will affect standby mode status for that macrocell. This feature reduces dynamic ICC proportionally to the number of registered macrocells used. If all macrocells are used as registers and only CLK/I0 is switching, the device will not be in standby mode, but dynamic ICC will typically be <2 mA. This is because only the CLK/I0 buffer will draw current. The use of combinatorial macrocells will add on average 5 mA per macrocell (at 25 MHz) under these same conditions. U SE When any input switches, the internal circuitry is fully enabled, and power consumption returns to normal. This feature results in considerable power savings for operation at low to medium frequencies. Product-Term Disable On a programmed PALLV22V10Z, any product terms that are not used are disabled. Power is cut off from these product terms so that they do not draw current. Product-term disabling results in considerable power savings. This saving is greater at the higher frequencies. Further hints on minimizing power consumption can be found in a separate document entitled, Minimizing Power Consumption with Zero-Power PLDs. 6 PALLV22V10 and PALLV22V10Z Families LOGIC DIAGRAM CLK/I 0 1 (2) 0 3 4 7 8 11 12 15 16 19 20 23 24 27 28 31 32 35 36 39 40 24 (28) VCC 43 AR 0 1 1 D AR 9 Q Q 1 0 1 0 0 0 1 1 1 0 1 0 0 0 1 1 1 0 1 0 0 0 1 1 1 0 1 0 0 0 1 1 1 0 1 0 0 0 1 1 1 0 1 0 0 0 1 1 1 0 1 0 0 0 1 1 1 0 1 0 0 0 1 1 1 0 1 0 0 0 1 1 1 0 1 0 0 0 1 23 I/O 9 (27) SP 0 1 10 D AR Q 20 Q 22 I/O 8 (26) I1 R SP 2 (3) G N AL EW D E D V ES IC IG ES N F S O 21 33 I2 3 (4) 34 48 I3 4 (5) 49 65 I4 5 (6) 66 82 6 (7) 83 97 I6 7 (9) 98 D AR Q Q 0 1 D AR Q Q 0 1 D AR Q Q 0 1 D AR Q Q 0 1 D AR Q Q 17 I/O 3 (20) SP 0 1 16 I/O 2 (19) SP 0 1 111 D AR Q Q 121 9 (11) 18 I/O 4 (21) SP 110 I8 19 I/O 5 (23) SP Q 8 (10) 20 I/O 6 (24) SP D AR Q I7 21 I/O 7 (25) SP U SE I5 0 1 15 I/O 1 (18) SP 0 1 122 D AR 130 Q Q 14 I/O 0 (17) SP I9 I 10 10 (12) 0 1 SP 131 13 11 (13) GND I11 (16) 0 3 4 7 8 11 12 15 16 19 20 23 24 27 28 31 32 35 36 39 40 43 12 (14) 18956D-006 PALLV22V10 and PALLV22V10Z Families 7 ABSOLUTE MAXIMUM RATINGS OPERATING RANGES Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C Commercial (C) Devices Ambient Temperature with Power Applied . . . . . . . . . . . . . . . . . .-55°C to +125°C Ambient Temperature (TA) . . . . . . . . . . . 0°C to +75°C Supply Voltage with Respect to Ground . . . . . . . . . . . . . . . -0.5 V to +7.0 V Supply Voltage (VCC) with Respect to Ground. . . . . . . . . . . . . . . +3.0 V to +3.6 V DC Input Voltage . . . . . . . . . . . . . . . -0.5 V to +5.25 V Industrial (I) Devices DC Output or I/O Pin Voltage . . . . . . -0.5 V to +5.25 V Ambient Temperature (TA) . . . . . . . . . . -40°C to +85°C Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V Supply Voltage (VCC) with Respect to Ground. . . . . . . . . . . . . . . +3.0 V to +3.6 V Operating ranges define those limits between which the functionality of the device is guaranteed. G N AL EW D E D V ES IC IG ES N F S O Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. Programming conditions may differ. R Latchup Current (TA = 0°C to +75°C) . . . . . . . . 100 mA DC CHARACTERISTICS OVER COMMERCIAL AND INDUSTRIAL OPERATING RANGES Parameter Symbol Parameter Description VOH Output HIGH Voltage VOL Output LOW Voltage Input HIGH Voltage VIL Input LOW Voltage IIH IIL Input HIGH Leakage Current U SE VIH Test Conditions VIN = VIH or VIL VCC = Min Min 2.4 V IOH = -100 µA VCC -0.2 V Guaranteed Input Logical HIGH Voltage for all Inputs (Notes 1, 2) 2.0 Guaranteed Input Logical LOW Voltage for all Inputs (Notes 1, 2) Input LOW Leakage Current VIN = VCC, VCC = Max (Note 2) VIN = 0 V, VCC = Max (Note 2) IOZH Off-State Output Leakage Current HIGH VOUT = VCC, VCC = Max VIN = VIH or VIL (Note 2) IOZL Off-State Output Leakage Current LOW ISC Output Short-Circuit Current VOUT = 0 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0.5 V, VCC = Max (Note 3) ICC (Static) Supply Current -5 0.5 V 0.2 V 5.25 V 0.8 V 10 µA -100 µA 10 µA -100 µA -75 mA -10/15 Commercial 60 mA -7 75 mA -15 Industrial 75 mA Outputs f = 0 MHz, Open (IOUT = 0 mA) Notes: 1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included. 2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH). 3. Not more than one output should be shorted at a time and duration of the short-circuit should not exceed one second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation. 8 Unit IOH = -2 mA IOL = 16 mA IOL = 100 µ A VIN = VIH or VIL Max PALLV22V10 - 7/10/15 (Com’l), -15 (Ind’l) CAPACITANCE 1 Parameter Symbol Parameter Description Test Condition CIN Input Capacitance VIN = 2.0 V COUT Output Capacitance VOUT = 2.0 V Typ VCC = 3.3 V TA = 25°C f = 1 MHz Unit 5 pF 8 Note: 1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where capacitance may be affected. G N AL EW D E D V ES IC IG ES N F S O R SWITCHING CHARACTERISTICS OVER COMMERCIAL AND INDUSTRIAL OPERATING RANGES 1 -7 Parameter Symbol Parameter Description Min Max -10 Min Max Min Unit 15 ns Input or Feedback to Combinatorial Output Setup Time from Input, Feedback or SP to Clock 4.5 5.5 10 ns tS2 tH Setup Time from SP to Clock 5.5 7 10 ns 0 0 0 ns tCO tAR Clock to Output tARW tARR Asynchronous Reset Width 6 8 10 ns Asynchronous Reset Recovery Time 6 8 10 ns tSPR tWL Synchronous Preset Recovery Time 6 8 10 ns LOW 3.5 4 6 ns HIGH 3.5 4 6 ns 100 83.3 50 MHz Internal Feedback (fCNT) 1/(tS + tCO) 1/(tS + tCF) (Note 3) 133 110 58.8 MHz No Feedback 1/(tWH + tWL) 143 tWH 5.5 Asynchronous Reset to Registered Output Clock Width External Feedback tEA tER U SE fMAX Maximum Frequency (Note 2) 10 Max tPD tS1 Hold Time 7.5 -15 6.5 11 10 13 125 20 83.3 ns ns MHz Input to Output Enable Using Product Term Control 9 11 15 ns Input to Output Disable Using Product Term Control 10 11 15 ns Notes: 1. See “Switching Test Circuit” for test conditions. 2. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where frequency may be affected. 3. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation: tCF = 1/fMAX (internal feedback) - tS. PALLV22V10 - 7/10/15 (Com’l), -15 (Ind’l) 9 ABSOLUTE MAXIMUM RATINGS OPERATING RANGES Storage Temperature . . . . . . . . . . . . . .-65°C to +150°C Industrial (I) Devices Ambient Temperature with Power Applied . . . . . . . . . . . . . . . . . .-55°C to +125°C Ambient Temperature (TA) . . . . . . . . . . -40°C to +85°C Supply Voltage with Respect to Ground . . . . . . . . . . . . . . . -0.5 V to +7.0 V DC Input Voltage . . . . . . . . . . . . . . . . -0.5 V to +5.5 V Supply Voltage (VCC) with Respect to Ground. . . . . . . . . . . . . . . +3.0 V to +3.6 V Operating ranges define those limits between which the functionality of the device is guaranteed. DC Output or I/O Pin Voltage . . . . . . . -0.5 V to +5.5 V Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V Latchup Current (TA = -40°C to 85°C). . . . . . . . 100 mA G N AL EW D E D V ES IC IG ES N F S O R Stresses above those listed under Absolute Maximum Ratings may cause permanent device failure. Functionality at or above these limits is not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device reliability. Programming conditions may differ. DC CHARACTERISTICS OVER INDUSTRIAL OPERATING RANGES Parameter Symbol Parameter Description Output HIGH Voltage VOL Output LOW Voltage VIH Input HIGH Voltage VIL Input LOW Voltage IIH IIL Input HIGH Leakage Current U SE VOH Input LOW Leakage Current IOZH Off-State Output Leakage Current HIGH IOZL Off-State Output Leakage Current LOW ISC Output Short-Circuit Current ICC Supply Current Test Conditions VIN = VIH or VIL VCC = Min VIN = VIH or VIL VCC = Min IOH = -2 mA IOH = -100 µA IOL = 2 mA Min 2.4 V V 2.0 Guaranteed Input Logical LOW Voltage for all Inputs (Note 1) VIN = VCC, VCC = Max VIN = 0 V, VCC = Max VOUT = VCC, VCC = Max VIN = VIH or VIL (Note 2) 0.4 V 0.2 V 5.5 V 0.8 V 10 µA -10 µA 10 µA -10 µA -75 mA f = 0 MHz 30 µA f = 15 MHz 55 mA VOUT = 0 V, VCC = Max VIN = VIH or VIL (Note 2) VOUT = 0.5 V, VCC = Max (Note 3) Outputs Open (IOUT = 0 mA) VCC = Max (Note 4) Unit VCC -0.3 IOL = 100 µA Guaranteed Input Logical HIGH Voltage for all Inputs (Note 1) Max -5 Notes: 1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included. 2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH). 3. Not more than one output should be shorted at a time, and the duration of the short-circuit should not exceed one second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation. 4. This parameter is guaranteed under worst case test conditions. Refer to the ICC vs. Frequency graph in this datasheet for typical ICC characteristics. 10 PALLV22V10Z-25 CAPACITANCE 1 Parameter Symbol Parameter Description Test Condition CIN Input Capacitance VIN = 2.0 V COUT Output Capacitance VOUT = 2.0 V Typ Unit 5 VCC = 3.3 V TA = 25°C f = 1 MHz pF 8 Note: 1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where capacitance may be affected. Parameter Symbol G N AL EW D E D V ES IC IG ES N F S O R SWITCHING CHARACTERISTICS OVER INDUSTRIAL OPERATING RANGES 1 Parameter Description -25 Min Max Unit 25 ns tPD Input or Feedback to Combinatorial Output (Note 2) tS tH Setup Time from Input, Feedback or SP to Clock 15 ns Hold Time 0 ns tCO tAR Clock to Output tARW tARR Asynchronous Reset Width 25 ns Asynchronous Reset Recovery Time 25 ns tSPR tWL Synchronous Preset Recovery Time 25 ns 10 ns tWH Asynchronous Reset to Registered Output Clock Width HIGH Internal Feedback (fCNT) 1/(tS + tCO) 1/(tS + tCF) (Note 4) No Feedback 1/(tWH + tWL) ns 10 ns 33.3 MHz 35.7 MHz 50 MHz U SE tEA tER Maximum Frequency (Note 3) 25 LOW External Feedback fMAX 15 Input to Output Enable Using Product Term Control 25 ns Input to Output Disable Using Product Term Control 25 ns Notes: 1. See “Switching Test Circuit” for test conditions. 2. This parameter is tested in Standby Mode. When the device is not in Standby Mode, the tPD may be slightly faster. 3. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where frequency may be affected. 4. tCF is a calculated value and is not guaranteed. tCF can be found using the following equation: tCF = 1/fMAX (internal feedback) - tS. PALLV22V10Z-25 11 SWITCHING WAVEFORMS Input or Feedback Input or Feedback VT tS VT tH Clock tPD Combinatorial Output VT tCO VT 18956D-007 Registered Output VT R 18956D-008 b. Registered output G N AL EW D E D V ES IC IG ES N F S O a. Combinatorial output VT Input tWH Clock tER VT tEA VOH - 0.5V VOL + 0.5V Output tWL 18956D-009 c. Clock width tARW tAR Registered Output VT VT tS tH tSPR VT Clock tARR Clock 18956D-010 d. Input to output disable/enable Input Asserting Synchronous Preset VT U SE Input Asserting Asynchronous Reset VT VT tCO Registered Output VT 18956D-012 18956D-011 e. Asynchronous reset Notes: 1. VT = 1.5 V for inputs signals and VCC/2 for outputs signals. 2. Input pulse amplitude 0 V to 3.0 V. 3. Input rise and fall times 2 ns to 5 ns typical. 12 PALLV22V10 and PALLV22V10Z Families f. Synchronous preset KEY TO SWITCHING WAVEFORMS OUTPUTS Must be Steady Will be Steady May Change from H to L Will be Changing from H to L May Change from L to H Will be Changing from L to H R INPUTS G N AL EW D E D V ES IC IG ES N F S O WAVEFORM Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is HighImpedance “Off” State 18956D-013 SWITCHING TEST CIRCUIT VCC U SE S1 R1 Output Test Point R2 CL S2 18956D-014 Specification S1 S2 tPD, tCO Closed Closed tEA Z → H: Open Z →L: Closed Z → H: Closed Z →L: Open tER H →Z: Closed L →Z: Closed H → Z: Closed L →Z: Open CL R1 R2 Measured Output Value VCC/2 30 pF 1.6K Ω 5 pF PALLV22V10 and PALLV22V10Z Families 1.6K Ω VCC/2 H → Z: VOH - 0.5 V L →Z: VOL + 0.5 V 13 TYPICAL ICC CHARACTERISTICS VCC = 3.3 V, TA = 25°C 150 140 130 R 120 G N AL EW D E D V ES IC IG ES N F S O 110 100 90 80 ICC (mA) 70 60 50 PALLV22V10-10/15 U SE 40 PALLV22V10-7 30 20 10 0 0 5 10 15 20 25 30 35 40 45 50 Frequency (MHz) ICC vs. Frequency 18956D-015 The selected “typical” pattern utilized 50% of the device resources. Half of the macrocells were programmed as registered, and the other half were programmed as combinatorial. Half of the available product terms were used for each macrocell. On any vector, half of the outputs were switching. By utilizing 50% of the device, a midpoint is defined for ICC. From this midpoint, a designer may scale the ICC graphs up or down to estimate the ICC requirements for a particular design. 14 PALLV22V10 and PALLV22V10Z Families ENDURANCE CHARACTERISTICS The PALLV22V10 is manufactured using Vantis’ advanced electrically-erasable (EE) CMOS process. This technology uses an EE cell to replace the fuse link used in bipolar parts. As a result, the device can be erased and reprogrammed—a feature which allows 100% testing at the factory. Symbol Parameter tDR Min Pattern Data Retention Time N Min Reprogramming Cycles Test Conditions Value Unit Max Storage Temperature 10 Years Max Operating Temperature 20 Years Normal Programming Conditions 100 Cycles R ROBUSTNESS FEATURES G N AL EW D E D V ES IC IG ES N F S O The PALLV22V10 has some unique features that make it extremely robust, especially when operating in high speed design environments. Input clamping circuitry limits negative overshoot, eliminating the possibility of false clocking caused by subsequent ringing. A special noise filter makes the programming circuitry completely insensitive to any positive overshoot that has a pulse width of less than about 100 ns. INPUT/OUTPUT EQUIVALENT SCHEMATICS VCC VCC U SE > 50 KΩ ESD Protection and Clamping Programming Pins only Programming Voltage Detection Positive Overshoot Filter Programming Circuitry Typical Input VCC 5-V Protection Provides ESD Protection and Clamping Preload Circuitry Feedback Input Typical Output PALLV22V10 and PALLV22V10Z Families 18956D-017 15 POWER-UP RESET The power-up reset feature ensures that all flip-flops will be reset to LOW after the device has been powered up. The output state will depend on the programmed pattern. This feature is valuable in simplifying state machine initialization. A timing diagram and parameter table are shown below. Due to the synchronous operation of the power-up reset and the wide range of ways VCC can rise to its steady state, two conditions are required to ensure a valid power-up reset. These conditions are: The VCC rise must be monotonic. ◆ Following reset, the clock input must not be driven from LOW to HIGH until all applicable input and feedback setup times are met. Parameter Symbol G N AL EW D E D V ES IC IG ES N F S O R ◆ Parameter Description tPR tS Power-Up Reset Time tWL Clock Width LOW Input or Feedback Setup Time Power Max Unit 1000 ns See Switching Characteristics VCC 2.7 V tPR Registered Active-Low Output tS U SE Clock 16 tWL 18956D-018 Figure 3. Power-Up Reset Waveform PALLV22V10 and PALLV22V10Z Families TYPICAL THERMAL CHARACTERISTICS PALLV22V10-10 Measured at 25°C ambient. These parameters are not tested. Typ SKINNY DIP PLCC Unit θjc Thermal impedance, junction to case 26 20 °C/W θja Thermal impedance, junction to ambient 86 69 °C/W 200 lfpm air 72 57 °C/W 400 lfpm air 65 52 °C/W 600 lfpm air R Parameter Symbol 60 47 °C/W 55 45 °C/W θjma Parameter Description Thermal impedance, junction to ambient with air flow G N AL EW D E D V ES IC IG ES N F S O 800 lfpm air U SE Plastic θjc Considerations The data listed for plastic θjc are for reference only and are not recommended for use in calculating junction temperatures. The heat-flow paths in plastic-encapsulated devices are complex, making the θjc measurement relative to a specific location on the package surface. Tests indicate this measurement reference point is directly below the die-attach area on the bottom center of the package. Furthermore, θjc tests on packages are performed in a constant-temperature bath, keeping the package surface at a constant temperature. Therefore, the measurements can only be used in a similar environment. PALLV22V10 and PALLV22V10Z Families 17 CONNECTION DIAGRAMS Top View SKINNY DIP I3 4 21 I/O7 I4 5 20 I/O6 I5 6 19 I/O5 I6 7 18 I/O4 I7 8 17 I/O3 I8 9 16 I/O2 I9 10 15 I/O1 I10 11 14 I/O0 GND 12 13 I11 4 3 2 1 28 27 26 I3 5 25 I/O7 I4 6 24 I/O6 I5 7 23 I/O5 NC 8 22 GND/NC I6 9 21 I/O4 I7 10 20 I/O3 I8 11 19 I/O2 PIN DESIGNATIONS 18 = = = = = = Clock Ground Input Input/Output No Connect Supply Voltage U SE CLK GND I I/O NC VCC PALLV22V10 and PALLV22V10Z Families GND I10 I9 12 13 14 15 16 17 18 18956D-002 Note: Pin 1 is marked for orientation. I/O8 I/O8 I/O1 22 I/O9 3 I/O0 I2 VCC I/O9 I11 23 NC 2 R I1 NC VCC CLK/I0 24 I1 1 G N AL EW D E D V ES IC IG ES N F S O CLK/I0 I2 PLCC 18956D-003 ORDERING INFORMATION Commercial and Industrial Products Lattice/Vantis programmable logic products for commercial and industrial applications are available with several ordering options. The order number (Valid Combination) is formed by a combination of these elements: PAL LV 22 V 10 -7 J C FAMILY TYPE PAL = Programmable Array Logic R PACKAGE TYPE P = 24-Pin 300 mil Plastic SKINNYDIP (PD3024) J = 28-Pin Plastic Leaded Chip NUMBER OF ARRAY INPUTS OUTPUT TYPE V = Versatile NUMBER OF OUTPUTS Z G N AL EW D E D V ES IC IG ES N F S O TECHNOLOGY LV = Low-Voltage OPERATING CONDITIONS C = Commercial (0°C to +75°C) I = Industrial (-40°C to +85°C) = Zero Power (30 µA ICC Standby) Valid Combinations JC PALLV22V10-10 PC, JC PALLV22V10-15 PC, JC, JI PALLV22V10Z-25 PI, JI U SE PALLV22V10-7 SPEED -7 -10 -15 -25 = = = = 7.5 ns tPD 10 ns tPD 15 ns tPD 25 ns tPD Valid Combinations The Valid Combinations list configurations planned to be supported in volume for this device. Consult the local Lattice/Vantis sales office to confirm availability of specific valid combinations and to check on newly released combinations. PALLV22V10 and PALLV22V10Z Families 19