STGW30NB60HD N-CHANNEL 30A - 600V TO-247 PowerMESH IGBT T YPE V CES V CE(sat) IC STGW 30NB60HD 600 V < 2.8 V 30 A ■ ■ ■ ■ ■ ■ ■ HIGH INPUT IMPEDANCE (VOLTAGE DRIVEN) LOW ON-VOLTAGE DROP (VCESAT) LOW GATE CHARGE HIGH CURRENT CAPABILITY VERY HIGH FREQUENCY OPERATION OFF LOSSES INCLUDE TAIL CURRENT CO-PACKAGE WITH TURBOSWITCH ANTIPARALLEL DIODE 1 2 3 TO-247 DESCRIPTION Using the latest high voltage technology based on a patented strip layout, STMicroelectronics has designed an advanced family of IGBTs, the PowerMESH IGBTs, with outstanding perfomances. The suffix ”H” identifies a family optimized to achieve very low switching times for high frequency applications (<120kHz). INTERNAL SCHEMATIC DIAGRAM APPLICATIONS ■ HIGH FREQUENCY MOTOR CONTROLS ■ WELDING EQUIPMENTS ■ SMPS AND PFC IN BOTH HARD SWITCH AND RESONANT TOPOLOGIES ABSOLUTE MAXIMUM RATINGS Symbol Value Unit V CES Collector-Emitter Voltage (VGS = 0) Parameter 600 V V ECR Emitter-Collector Voltage 20 V V GE G ate-Emitter Voltage ± 20 V o IC Collector Current (continuous) at Tc = 25 C 60 A IC Collector Current (continuous) at Tc = 100 C o 30 A Collector Current (pulsed) 240 A T otal Dissipation at Tc = 25 C 190 W Derating Factor 1.52 W /o C I CM (•) P tot T s tg Tj o Storage T emperature Max. Operating Junction Temperature -65 to 150 o C 150 o C (•) Pulse width limited by safe operating area July 1999 1/8 STGW30NB60HD THERMAL DATA R thj -case R thj -amb R thc-h Thermal Resistance Junction-case Thermal Resistance Junction-ambient Thermal Resistance Case-heatsink Max Max Typ o 0.66 30 0.1 C/W oC/W o C/W ELECTRICAL CHARACTERISTICS (Tj = 25 oC unless otherwise specified) OFF Symbol Parameter Test Conditions Collector-Emitt er Breakdown Voltage I C = 250 µA I CES Collector cut-off (V GE = 0) V CE = Max Rating V CE = Max Rating IGES Gate-Emitter Leakage Current (VCE = 0) V GE = ± 20 V V BR(CES) Min. V GE = 0 Typ. Max. 600 Unit V 250 2000 µA µA ± 100 nA Max. Unit 5 V 2.2 1.8 2.8 V V Typ. Max. Unit T j = 25 oC T j = 125 o C V CE = 0 ON (∗) Symbol V GE(th) V CE(SAT ) Parameter Test Conditions Gate Threshold Voltage V CE = V GE IC = 250 µA Collector-Emitt er Saturation Voltage V GE = 15 V V GE = 15 V IC = 30 A IC = 30 A Min. Typ. 3 Tj = 125 oC DYNAMIC Symbol gf s Parameter Test Conditions Forward Transconductance V CE =25 V C i es C o es C res Input Capacitance Output Capacitance Reverse Transfer Capacitance V CE = 25 V QG Q GE Q GC Total G ate Charge Gate-Emitter Charge Gate-Collector Charge V CE = 480 V Latching Current V clamp = 480 V T j = 150 o C I CL Min. I C = 30 A f = 1 MHz IC = 30 A 20 S V GE = 0 2300 250 60 pF pF pF VGE = 15 V 150 15 72 nC nC nC R G =10 Ω 120 A SWITCHING ON Symbol t d(on) tr (di/dt) on Eo n 2/8 Parameter Test Conditions Min. Typ. Max. Unit Delay Time Rise Time V CC = 480 V V GE = 15 V I C = 30 A R G = 10Ω 15 35 ns ns Turn-on Current Slope V CC = 480 V R G = 10 Ω T j = 125 o C I C = 30 A V GE = 15 V 1000 A/µs 1000 µJ Turn-on Switching Losses STGW30NB60HD ELECTRICAL CHARACTERISTICS (continued) SWITCHING OFF Symbol Parameter Test Conditions Min. Typ. Max. Unit tc t r (v off ) td (o ff ) tf E o ff(**) E ts( ❍ ) Cross-O ver Time V CC = 480 V Off Voltage Rise Time R GE = 10 Ω Delay Time Fall T ime Turn-off Switching Loss Total Switching Loss I C = 30 A V GE = 15 V 150 40 210 90 1.10 2.0 ns ns ns ns mJ mJ tc t r (v off ) td (o ff ) tf E o ff(**) E ts( ❍ ) Cross-O ver Time V CC = 480 V Off Voltage Rise Time R GE = 10 Ω Delay Time T j = 125 o C Fall T ime Turn-off Switching Loss Total Switching Loss I C = 30 A V GE = 15 V 250 70 250 160 1.6 2.65 ns ns ns ns mJ mJ COLLECTOR-EMITTER DIODE Symbol Parameter If I fm Forward Current Forward Current pulsed Vf Forward On-Voltage t rr Q rr I rrm Reverse Recovery Time Reverse Recovery Charge Reverse Recovery Current T est Conditions If = 30 A If = 30 A If = 30 A dI/dt = 100 A/µS T j = 125 oC V R = 100 V o T j = 125 C Min. T yp. 1.7 1.55 116 406 7 Max. Unit 30 240 A A 2.0 V V nS nC A (•) Pulse width limited by max. junction temperature (❍) Include recovery losses on the STTA2006 freewheeling diode (∗) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 % (**)Losses Include Also The Tail (Jedec Standardization) Thermal Impedance 3/8 STGW30NB60HD Output Characteristics Transfer Characteristics Transconductance Collector-Emitter On Voltage vs Temperature Collector-Emitter On Voltage vs Collector Current Gate Threshold vs Temperature 4/8 STGW30NB60HD Normalized Breakdown Voltage vs Temperature Capacitance Variations Gate Charge vs Gate-Emitter Voltage Total Switching Losses vs Gate Resistance Total Switching Losses vs Temperature Total Switching Losses vs Collector Current 5/8 STGW30NB60HD Switching Off Safe Operating Area Diode Forward Voltage Fig. 1: Gate Charge test Circuit Fig. 2: Test Circuit For Inductive Load Switching Fig. 3: Switching Waveforms 6/8 STGW30NB60HD TO-247 MECHANICAL DATA mm DIM. MIN. TYP. inch MAX. MIN. TYP. MAX. A 4.7 5.3 0.185 0.209 D 2.2 2.6 0.087 0.102 E 0.4 0.8 0.016 0.031 F 1 1.4 0.039 0.055 F3 2 2.4 0.079 0.094 F4 3 3.4 0.118 0.134 G 10.9 0.429 H 15.3 15.9 0.602 0.626 L 19.7 20.3 0.776 0.779 L3 14.2 14.8 0.559 0.582 L4 34.6 1.362 L5 5.5 0.217 M 2 3 0.079 0.118 P025P 7/8 STGW30NB60HD Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibil ity for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specific ation mentioned in this publication are subjec t to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. 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