INTEGRATED CIRCUITS DATA SHEET 74AHC1G00; 74AHCT1G00 2-input NAND gate Product specification Supersedes data of 1998 Nov 25 File under Integrated Circuits, IC06 1999 Jan 27 Philips Semiconductors Product specification 2-input NAND gate FEATURES • Symmetrical output impedance • High noise immunity 74AHC1G00; 74AHCT1G00 QUICK REFERENCE DATA GND = 0 V; Tamb = 25 °C; tr = tf ≤ 3.0 ns. TYPICAL SYMBOL PARAMETER • ESD protection: HBM EIA/JESD22-A114-A exceeds 2000 V MM EIA/JESD22-A115-A exceeds 200 V tPHL/tPLH propagation delay inA, inB to outY CI • Low power dissipation CPD CONDITIONS UNIT AHC1G • Balanced propagation delays 3.5 3.6 ns input capacitance 1.5 1.5 pF power dissipation capacitance notes 1 and 2; 17 CL = 50 pF; f = 1 MHz 18 pF • Very small 5-pin package • Output capability: standard. CL = 15 pF VCC = 5 V AHCT1G Notes 1. CPD is used to determine the dynamic power dissipation (PD in µW). PD = CPD × VCC2 × fi + (CL × VCC2 × fo) where: DESCRIPTION fi = input frequency in MHz; The 74AHC1G/AHCT1G00 is a high-speed Si-gate CMOS device. fo = output frequency in MHz; CL = output load capacitance in pF; The 74AHC1G/AHCT1G00 provides the 2-input NAND function. VCC = supply voltage in V. 2. The condition is VI = GND to VCC. FUNCTION TABLE See note 1. INPUTS PINNING OUTPUT PIN SYMBOL DESCRIPTION inA inB outY 1 inB data input L L H 2 inA data input GND ground (0 V) L H H 3 H L H 4 outY data output H H L 5 VCC DC supply voltage Note 1. H = HIGH voltage level. L = LOW voltage level. ORDERING AND PACKAGE INFORMATION PACKAGES TYPE NUMBER 74AHC1G00GW 74AHCT1G00GW 1999 Jan 27 TEMPERATURE RANGE −40 to +85 °C PINS PACKAGE MATERIAL CODE MARKING 5 SC-88A plastic SOT353 AA 5 SC-88A plastic SOT353 CA 2 Philips Semiconductors Product specification 2-input NAND gate 74AHC1G00; 74AHCT1G00 handbook, halfpage inB 1 inA 2 GND 5 VCC handbook, halfpage 00 3 4 outY 1 inB 2 inA outY 4 MNA097 MNA096 Fig.1 Pin configuration. handbook, halfpage 1 Fig.2 Logic symbol. handbook, halfpage inB & 4 outY 2 inA MNA098 MNA099 Fig.3 IEC logic symbol. 1999 Jan 27 Fig.4 Logic diagram. 3 Philips Semiconductors Product specification 2-input NAND gate 74AHC1G00; 74AHCT1G00 RECOMMENDED OPERATING CONDITIONS 74AHC1G SYMBOL PARAMETER 74AHCT1G CONDITIONS UNIT MIN. TYP. MAX. MIN. TYP. MAX. VCC DC supply voltage 2.0 5.0 5.5 4.5 5.0 5.5 V VI input voltage 0 − 5.5 0 − 5.5 V VO output voltage 0 − VCC 0 − VCC V Tamb operating ambient temperature range see DC and AC characteristics per device −40 +25 +85 −40 +25 +85 °C tr,tf (∆t/∆f) input rise and fall times except for Schmitt-trigger inputs VCC = 3.3 V ±0.3 V − − 100 − − − ns/V VCC = 5 V ±0.5 V − − 20 − − 20 LIMITING VALUES In accordance with the Absolute Maximum Rating System (IEC 134); voltages are referenced to GND (ground = 0 V). SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT VCC DC supply voltage −0.5 +7.0 V VI input voltage range −0.5 +7.0 V IIK DC input diode current VI < −0.5 − −20 mA IOK DC output diode current VO < −0.5 or VO > VCC + 0.5 V; note 1 − ±20 mA IO DC output source or sink current −0.5 V < VO < VCC + 0.5 V − ±25 mA ICC DC VCC or GND current − ±75 mA Tstg storage temperature range −65 +150 °C PD power dissipation per package − 200 mW temperature range: −40 to +85 °C; note 2 Notes 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed. 2. Above +55 °C the value of PD derates linearly with 2.5 mW/K. 1999 Jan 27 4 Philips Semiconductors Product specification 2-input NAND gate 74AHC1G00; 74AHCT1G00 DC CHARACTERISTICS Family 74AHC1G Over recommended operating conditions; voltage are referenced to GND (ground = 0 V). TEST CONDITIONS SYMBOL PARAMETER VIL VOH VOH VOL VOL −40 to +85 +25 OTHER VIH Tamb (°C) HIGH-level input voltage LOW-level input voltage VCC (V) MIN. TYP. MAX. MIN. MAX. 2.0 1.5 − − 1.5 − 3.0 2.1 − − 2.1 − 5.5 3.85 − − 3.85 − 2.0 − − 0.5 − 0.5 3.0 − − 0.9 − 0.9 5.5 − − 1.65 − 1.65 2.0 1.9 2.0 − 1.9 − 3.0 2.9 3.0 − 2.9 − HIGH-level output voltage; all outputs VI = VIH or VIL; IO = −50 µA 4.5 4.4 4.5 − 4.4 − HIGH-level output voltage VI = VIH or VIL; IO = −4.0 mA 3.0 2.58 − − 2.48 − VI = VIH or VIL; IO = −8.0 mA 4.5 3.94 − − 3.8 − VI = VIH or VIL; IO = 50 µA 2.0 − 0 0.1 − 0.1 3.0 − 0 0.1 − 0.1 4.5 − 0 0.1 − 0.1 VI = VIH or VIL; IO = 4 mA 3.0 − − 0.36 − 0.44 VI = VIH or VIL; IO = 8 mA 4.5 − − 0.36 − 0.44 LOW-level output voltage; all outputs LOW-level output voltage UNIT V V V V V V II input leakage current VI = VCC or GND 5.5 − − 0.1 − 1.0 µA ICC quiescent supply current VI = VCC or GND; 5.5 IO = 0 − − 1.0 − 10 µA CI input capacitance − 1.5 10 − 10 pF 1999 Jan 27 5 Philips Semiconductors Product specification 2-input NAND gate 74AHC1G00; 74AHCT1G00 Family 74AHCT1G Over recommended operating conditions; voltage are referenced to GND (ground = 0 V). TEST CONDITIONS SYMBOL Tamb (°C) PARAMETER −40 to +85 +25 OTHER VCC (V) MIN. TYP. MAX. MIN. MAX. UNIT VIH HIGH-level input voltage 4.5 to 5.5 2.0 − − 2.0 − V VIL LOW-level input voltage 4.5 to 5.5 − − 0.8 − 0.8 V VOH HIGH-level output voltage; all outputs VI = VIH or VIL; IO = −50 µA 4.5 4.4 4.5 − 4.4 − V VOH HIGH-level output voltage VI = VIH or VIL; IO = −8.0 mA 4.5 3.94 − − 3.8 − V VOL LOW-level output voltage; all outputs VI = VIH or VIL; IO = 50 µA 4.5 − 0 0.1 − 0.1 V VOL LOW-level output voltage VI = VIH or VIL; IO = 8 mA 4.5 − − 0.36 − 0.44 V II input leakage current VI = VIH or VIL 5.5 − − 0.1 − 1.0 µA ICC quiescent supply current VI = VCC or GND; IO = 0 5.5 − − 1.0 − 10 µA ∆ICC additional quiescent supply current per input pin VI = 3.4 V other inputs at VCC or GND; IO = 0 5.5 − − 1.35 − 1.5 mA CI input capacitance − 1.5 10 − 10 pF 1999 Jan 27 6 Philips Semiconductors Product specification 2-input NAND gate 74AHC1G00; 74AHCT1G00 AC CHARACTERISTICS Type 74AHC1G00 GND = 0 V; tr = tf ≤ 3.0 ns. TEST CONDITIONS SYMBOL Tamb (°C) PARAMETER −40 to +85 +25 WAVEFORMS CL VCC (V) MIN. TYP. MAX. MIN. MAX. UNIT tPHL/tPLH propagation delay inA, inB to outY see Figs 5 and 6 15 pF 3.0 to 3.6 − 4.5(1) 7.9 1.0 9.5 ns tPHL/tPLH propagation delay inA, inB to outY see Figs 5 and 6 50 pF 3.0 to 3.6 − 6.5(1) 11.4 1.0 13.0 ns tPHL/tPLH propagation delay inA, inB to outY see Figs 5 and 6 15 pF 4.5 to 5.5 − 3.5(2) 5.5 1.0 6.5 ns tPHL/tPLH propagation delay inA, inB to outY see Figs 5 and 6 50 pF 4.5 to 5.5 − 4.9(2) 7.5 1.0 8.5 ns Notes 1. Typical values at VCC = 3.3 V. 2. Typical values at VCC = 5.0 V. Type 74AHCT1G00 GND = 0 V; tr = tf ≤ 3.0 ns. Tamb (°C) TEST CONDITIONS SYMBOL −40 to +85 +25 PARAMETER WAVEFORMS CL VCC (V) MIN. TYP. MAX. MIN. UNIT MAX. tPHL/tPLH propagation delay inA, inB to outY see Figs 5 and 6 15 pF 4.5 to 5.5 − 3.6(1) 6.9 1.0 8.0 ns tPHL/tPLH propagation delay inA, inB to outY see Figs 5 and 6 50 pF 4.5 to 5.5 − 5.0(1) 7.9 1.0 9.0 ns Note 1. Typical values at VCC = 5.0 V. 1999 Jan 27 7 Philips Semiconductors Product specification 2-input NAND gate 74AHC1G00; 74AHCT1G00 AC WAVEFORMS handbook, halfpage inA, inB INPUT VM(1) tPHL outY OUTPUT VCC handbook, halfpage PULSE GENERATOR tPLH VI VO D.U.T. RT VM(1) CL MNA101 MNA100 FAMILY VI INPUT REQUIREMENTS VM INPUT VM OUTPUT AHC1G GND to VCC 50% VCC 50% VCC AHCT1G GND to 3.0 V 1.5 V Fig.5 Definitions for test circuit: CL = Load capacitance including jig and probe capacitance (see Chapter “AC characteristics”). RT = Termination resistance should be equal to the output impedance Z0 of the pulse generator. 50% VCC The input (inA, inB) to output (outY) propagation delays. 1999 Jan 27 Fig.6 Load circuitry for switching times. 8 Philips Semiconductors Product specification 2-input NAND gate 74AHC1G00; 74AHCT1G00 PACKAGE OUTLINE Plastic surface mounted package; 5 leads SOT353 D E B y X A HE 5 v M A 4 Q A A1 1 2 e1 3 bp c Lp w M B e detail X 0 1 2 mm scale DIMENSIONS (mm are the original dimensions) UNIT A A1 max bp c D E (2) e e1 HE Lp Q v w y mm 1.1 0.8 0.1 0.30 0.20 0.25 0.10 2.2 1.8 1.35 1.15 1.3 0.65 2.2 2.0 0.45 0.15 0.25 0.15 0.2 0.2 0.1 OUTLINE VERSION SOT353 1999 Jan 27 REFERENCES IEC JEDEC EIAJ SC-88A 9 EUROPEAN PROJECTION ISSUE DATE 97-02-28 Philips Semiconductors Product specification 2-input NAND gate 74AHC1G00; 74AHCT1G00 • Use a double-wave soldering method comprising a turbulent wave with high upward pressure followed by a smooth laminar wave. SOLDERING Introduction to soldering surface mount packages • For packages with leads on two sides and a pitch (e): This text gives a very brief insight to a complex technology. A more in-depth account of soldering ICs can be found in our “Data Handbook IC26; Integrated Circuit Packages” (document order number 9398 652 90011). – larger than or equal to 1.27 mm, the footprint longitudinal axis is preferred to be parallel to the transport direction of the printed-circuit board; There is no soldering method that is ideal for all surface mount IC packages. Wave soldering is not always suitable for surface mount ICs, or for printed-circuit boards with high population densities. In these situations reflow soldering is often used. – smaller than 1.27 mm, the footprint longitudinal axis must be parallel to the transport direction of the printed-circuit board. The footprint must incorporate solder thieves at the downstream end. • For packages with leads on four sides, the footprint must be placed at a 45° angle to the transport direction of the printed-circuit board. The footprint must incorporate solder thieves downstream and at the side corners. Reflow soldering Reflow soldering requires solder paste (a suspension of fine solder particles, flux and binding agent) to be applied to the printed-circuit board by screen printing, stencilling or pressure-syringe dispensing before package placement. During placement and before soldering, the package must be fixed with a droplet of adhesive. The adhesive can be applied by screen printing, pin transfer or syringe dispensing. The package can be soldered after the adhesive is cured. Several methods exist for reflowing; for example, infrared/convection heating in a conveyor type oven. Throughput times (preheating, soldering and cooling) vary between 100 and 200 seconds depending on heating method. Typical dwell time is 4 seconds at 250 °C. A mildly-activated flux will eliminate the need for removal of corrosive residues in most applications. Typical reflow peak temperatures range from 215 to 250 °C. The top-surface temperature of the packages should preferable be kept below 230 °C. Manual soldering Fix the component by first soldering two diagonally-opposite end leads. Use a low voltage (24 V or less) soldering iron applied to the flat part of the lead. Contact time must be limited to 10 seconds at up to 300 °C. Wave soldering Conventional single wave soldering is not recommended for surface mount devices (SMDs) or printed-circuit boards with a high component density, as solder bridging and non-wetting can present major problems. When using a dedicated tool, all other leads can be soldered in one operation within 2 to 5 seconds between 270 and 320 °C. To overcome these problems the double-wave soldering method was specifically developed. If wave soldering is used the following conditions must be observed for optimal results: 1999 Jan 27 10 Philips Semiconductors Product specification 2-input NAND gate 74AHC1G00; 74AHCT1G00 Suitability of surface mount IC packages for wave and reflow soldering methods SOLDERING METHOD PACKAGE REFLOW(1) WAVE BGA, SQFP not suitable HLQFP, HSQFP, HSOP, SMS not PLCC(3), SO, SOJ suitable suitable(2) suitable suitable suitable LQFP, QFP, TQFP not recommended(3)(4) suitable SSOP, TSSOP, VSO not recommended(5) suitable Notes 1. All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum temperature (with respect to time) and body size of the package, there is a risk that internal or external package cracks may occur due to vaporization of the moisture in them (the so called popcorn effect). For details, refer to the Drypack information in the “Data Handbook IC26; Integrated Circuit Packages; Section: Packing Methods”. 2. These packages are not suitable for wave soldering as a solder joint between the printed-circuit board and heatsink (at bottom version) can not be achieved, and as solder may stick to the heatsink (on top version). 3. If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave direction. The package footprint must incorporate solder thieves downstream and at the side corners. 4. Wave soldering is only suitable for LQFP, TQFP and QFP packages with a pitch (e) equal to or larger than 0.8 mm; it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.65 mm. 5. Wave soldering is only suitable for SSOP and TSSOP packages with a pitch (e) equal to or larger than 0.65 mm; it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm. DEFINITIONS Data sheet status Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications. Limiting values Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Where application information is given, it is advisory and does not form part of the specification. LIFE SUPPORT APPLICATIONS These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. 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The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights. Printed in The Netherlands 245002/00/02/pp12 Date of release: 1999 Jan 27 Document order number: 9397 750 04941