PHILIPS BH16899DL

INTEGRATED CIRCUITS
74ABT16899
74ABTH16899
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
Product specification
Supersedes data of 1997 Mar 28
IC23 Data Handbook
1998 Feb 25
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
74ABT16899
74ABTH16899
Parity error checking of the A and B bus latches is continuously
provided with ERRA and ERRB, even with both buses in 3-State.
FEATURES
• Symmetrical (A and B bus functions are identical)
• Selectable generate parity or ”feed-through” parity for A-to-B and
The 74ABT/H16899 features independent latch enables for the A
and B bus latches, a select pin for ODD/EVEN parity, and separate
error signal output pins for checking parity.
B-to-A directions
• Independent transparent latches for A-to-B and B-to-A directions
• Selectable ODD/EVEN parity
• Continuously checks parity of both A bus and B bus latches as
FUNCTIONAL DESCRIPTION
The 74ABT/H16899 has three principal modes of operation which
are outlined below. All modes apply to both the A-to-B and B-to-A
directions.
ERRA and ERRB
• Open-collector ERR output
• Ability to simultaneously generate and check parity
• Can simultaneously read/latch A and B bus data
• Output capability: +64 mA/–32mA
• Latch-up protection exceeds 500mA per Jedec Std 17
• ESD protection exceeds 2000 V per MIL STD 883 Method 3015
Transparent latch, Generate parity, Check A and B bus parity:
Bus A (B) communicates to Bus B (A), parity is generated and
passed on to the B (A) Bus as BPAR (APAR). If LEA and LEB are
High and the Mode Select (SEL) is Low, the parity generated from
A0-A7 and B0-B7 can be checked and monitored by ERRA and
ERRB. (Fault detection on both input and output buses.)
Transparent latch, Feed-through parity, Check A and B bus
parity:
Bus A (B) communicates to Bus B (A) in a feed-through mode if SEL
is High. Parity is still generated and checked as ERRA and ERRB
and can be used as an interrupt to signal a data/parity bit error to the
CPU.
and 200 V per Machine Model
• Power up 3-State
• Power-up reset
• Live insertion/extraction permitted
• Bus-hold data inputs eliminate the need for external pull-up
Latched input, Generate/Feed-through parity, Check A (and B)
bus parity:
Independent latch enables (LEA and LEB) allow other permutations
of:
resistors to hold unused inputs
DESCRIPTION
• Transparent latch / 1 bus latched / both buses latched
• Feed-through parity / generate parity
• Check in bus parity / check out bus parity / check in and out bus
The 74ABT/H16899 is a 16-bit to 16-bit parity transceiver with
separate transparent latches for the A bus and B bus. Either bus
can generate or check parity. The parity bit can be fed-through with
no change or the generated parity can be substituted with the SEL
input.
parity
QUICK REFERENCE DATA
SYMBOL
CONDITIONS
Tamb = 25°C; GND = 0V
PARAMETER
TYPICAL
UNIT
tPLH
tPHL
Propagation delay
An to Bn or Bn to An
CL = 50pF; VCC = 5V
2.7
ns
tPLH
tPHL
Propagation delay
An to ERRA
CL = 50pF; VCC = 5V
5.0
ns
CIN
Input capacitance
VI = 0V or VCC
4
pF
CI/O
Output capacitance
Outputs disabled; VO = 0V or VCC
7
pF
Outputs disabled; VCC =5.5V
500
µA
Output Low; VCC = 5.5V
10.5
mA
ICCZ
Quiescent supply current
ICCL
ORDERING INFORMATION
PACKAGES
TEMPERATURE RANGE
OUTSIDE NORTH AMERICA
NORTH AMERICA
DWG NUMBER
56-Pin Plastic SSOP Type III
–40°C to +85°C
74ABT16899 DL
BT16899 DL
SOT371-1
56-Pin Plastic TSSOP Type II
–40°C to +85°C
74ABT16899 DGG
BT16899 DGG
SOT364-1
56-Pin Plastic SSOP Type III
–40°C to +85°C
74ABTH16899 DL
BH16899 DL
SOT371-1
56-Pin Plastic TSSOP Type II
–40°C to +85°C
74ABTH16899 DGG
BH16899 DGG
SOT364-1
1998 Feb 25
2
853-1960 19018
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
74ABT16899
74ABTH16899
PIN CONFIGURATION
ODD/EVEN
1
56
SEL
OEA
2
55
LEA
1B0
1A0
3
54
GND
4
53
GND
1A1
5
52
1B1
1B2
1A2
6
51
1A3
7
50
1B3
1A4
8
49
1B4
VCC
9
48
VCC
1A5
10
47
1B5
1A6
11
46
1B6
1A7
12
45
1B7
1APAR
13
44
1BPAR
1ERRA
14
43
1ERRB
GND
15
42
GND
2ERRA
16
41
2ERRB
2APAR
17
40
2BPAR
2A7
18
39
2B7
2A6
19
38
2B6
2A5
20
37
2B5
VCC
21
36
VCC
2A4
22
35
2B4
2A3
23
34
2B3
2A2
24
33
2B2
2A1
25
32
2B1
GND
26
31
GND
2A0
27
30
2B0
LEB
28
29
OEB
SH00082
PIN DESCRIPTION
SYMBOL
PIN
NUMBER
1A0 - 1A7
2A0 - 2A7
3, 5, 6, 7, 8, 10, 11, 12
27, 25, 24, 23, 22, 20, 19, 18
Latched A bus 3-State inputs/outputs
1B0 - 1B7
2B0 - 2B7
54, 52, 51, 50, 49, 47, 46, 45
30, 32, 33, 34, 35, 37, 38, 39
Latched B bus 3-State inputs/outputs
1APAR
2APAR
13, 17
A bus parity 3-State input
1BPAR
2BPAR
44, 40
B bus parity 3-State input
ODD/EVEN
1
OEA, OEB
2, 29
SEL
56
NAME AND FUNCTION
Parity select input (Low for EVEN parity)
Output enable inputs (gate A to B,
B to A)
Mode select input (Low for generate)
LEA, LEB
55, 28
Latch enable inputs (transparent High)
1ERRA, 1ERRB
2ERRA, 2ERRB
14, 43,
16, 41
Error signal outputs (active-Low)
GND
4, 15, 26, 31, 42, 53
VCC
9, 21, 36, 48
1998 Feb 25
Ground (0V)
Positive supply voltage
3
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
74ABT16899
74ABTH16899
LOGIC SYMBOL
3
5
6
7
8
10
11
12
13
27
1A0 1A1 1A2 1A3 1A4 1A5 1A6 1A7 1APAR
25
24
23
22
20
19
18
17
2A0 2A1 2A2 2A3 2A4 2A5 2A6 2A7 2APAR
55
LEA
55
LEA
28
LEB
28
LEB
56
SEL
14
56
SEL
2ERRA
16
43
1
ODD/EVEN
2ERRB
41
1ERRA
1
ODD/EVEN
2
OEA
2
OEA
29
OEB
29
OEB
1ERRB
1B0 1B1 1B2 1B3 1B4 1B5 1B6 1B7 1BPAR
54
52
51
50
49
47
46
45
2B0 2B1 2B2 2B3 2B4 2B5 2B6 2B7 2BPAR
44
30
32
33
34
35
37
38
39
40
SH00083
PARITY AND ERROR FUNCTION TABLE
INPUTS
SEL
H
H
xPAR
(A or B)
Σ of High
Inputs
xPAR
(B or A)
ERRt
ERRr*
H
Even
Odd
H
H
H
L
H
L
L
L
L
H
L
H
H
H
L
Even
Odd
H
L
H
Even
Odd
H
H
L
H
L
H
L
L
H
L
H
L
H
L
L
Even
Odd
L
H
H
Even
Odd
H
L
H
L
H
H
H
L
L
H
H
H
L
H
L
Even
Odd
L
L
H
Even
Odd
L
H
L
H
H
H
L
Even
Odd
L
H
H
L
H
H
L
H
L
t
r
*
ODD/EVEN
OUTPUTS
L
= High voltage level
= Low voltage level
= Transmit–if the data path is from A→B then ERRt is ERRA
= Receive–if the data path is from A→B then ERRr is ERRB
Blocked if latch is not transparent
1998 Feb 25
4
PARITY MODES
Odd
Mode
Feed-through/check parity
Even
Mode
Odd
Mode
Even
Mode
Generate parity
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
74ABT16899
74ABTH16899
BLOCK DIAGRAM
OE
9–bit
Transparent
Latch
LEA
OEB
9–bit
Output
Buffer
LE
A0
A1
1
mux
Parity
Generator
B0
B1
0
A2
A3
B2
B3
B4
A4
A5
B5
B6
A6
A7
B7
BPAR
APAR
9–bit
Transparent
Latch
9–bit
Output
Buffer
OEA
OE
LE
1
mux
Parity
Generator
0
LEB
ERRA
SEL
ERRB
(1 of 2 parity blocks)
ODD/
EVEN
SH00084
FUNCTION TABLE
INPUTS
OPERATING MODE
OEB
OEA
SEL
LEA
LEB
H
H
X
X
X
3-State A bus and B bus (input A & B simultaneously)
H
L
L
L
H
B → A, transparent B latch, generate parity from B0 - B7, check B bus parity
H
L
L
H
H
B → A, transparent A & B latch, generate parity from B0 - B7, check A & B bus parity
H
L
L
X
L
B → A, B bus latched, generate parity from latched B0 - B7 data, check B bus parity
H
L
H
X
H
B → A, transparent B latch, parity feed-through, check B bus parity
H
L
H
H
H
B → A, transparent A & B latch, parity feed-through, check A & B bus parity
L
H
L
H
X
A → B, transparent A latch, generate parity from A0 - A7, check A bus parity
L
H
L
H
H
A → B, transparent A & B latch, generate parity from A0 - A7, check A & B bus parity
L
H
L
L
X
A → B, A bus latched, generate parity from latched A0 - A7 data, check A bus parity
L
H
H
H
L
A → B, transparent A latch, parity feed-through, check A bus parity
L
H
H
H
H
A → B, transparent A & B latch, parity feed-through, check A & B bus parity
L
L
X
X
X
Output to A bus and B bus (NOT ALLOWED)
H = High voltage level
L = Low voltage level
X = Don’t care
1998 Feb 25
5
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
74ABT16899
74ABTH16899
ABSOLUTE MAXIMUM RATINGS1, 2
PARAMETER
SYMBOL
VCC
IIK
CONDITIONS
RATING
UNIT
–0.5 to +7.0
V
–18
mA
–1.2 to +7.0
V
VO < 0
–50
mA
output in Off or High state
–0.5 to +5.5
V
output in Low state
128
output in High state
–64
DC supply voltage
DC input diode current
VI < 0
voltage3
VI
DC input
IOK
DC output diode current
voltage3
VOUT
DC output
IOUT
O
DC output current
Tstg
Storage temperature range
mA
–65 to 150
°C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 1505C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
RECOMMENDED OPERATING CONDITIONS
SYMBOL
VCC
PARAMETER
LIMITS
DC supply voltage
UNIT
Min
Max
4.5
5.5
V
0
VCC
V
VI
Input voltage
VIH
High-level input voltage
VIL
Low-level Input voltage
0.8
V
IOH
High-level output current
–32
mA
IOL
Low-level output current
64
mA
0
5
ns/V
–40
+85
°C
∆t/∆v
Input transition rise or fall rate
Tamb
Operating free-air temperature range
1998 Feb 25
2.0
6
V
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
74ABT16899
74ABTH16899
DC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
Min
VIK
VOH
Input clamp voltage
High-level output voltage
Tamb = –40°C
to +85°C
Tamb = +25°C
VCC = 4.5V; IIK = –18mA
Typ
Max
–0.7
–1.2
Min
UNIT
Max
–1.2
V
VCC = 4.5V; IOH = –3mA; VI = VIL or VIH
2.5
3.1
2.5
V
VCC = 5.0V; IOH = –3mA; VI = VIL or VIH
3.0
3.6
3.0
V
VCC = 4.5V; IOH = –32mA; VI = VIL or VIH
2.0
2.7
2.0
V
VOL
Low-level output voltage
VCC = 4.5V; IOL = 64mA; VI = VIL or VIH
0.36
0.55
0.55
V
VRST
Power-up output low
voltage3
VCC = 5.5V; IO = 1mA; VI = GND or VCC
0.13
0.55
0.55
V
Input leakage
Control pins
VCC = 5.5V; VI = GND or 5.5V
±0.2
±1.0
±1.0
µA
current
Data pins
VCC = 5.5V; VI = GND or 5.5V
±1.0
±100
±100
µA
II
IHOLD
Bushold current A or B
inputs5
74ABTH16899
VCC = 4.5V; VI = 0.8V
75
75
VCC = 4.5V; VI = 2.0V
–75
–75
VCC = 5.5V; VI = 0 to 5.5V
±500
µA
Power-off leakage current
VCC = 0.0V; VO or VI ≤ 4.5V
±2.0
±100
±100
µA
Power-up/down 3-State
output current4
VCC = 2.1V; VO = 0.5V; VI = GND or VCC
±5.0
±50
±50
µA
IIH + IOZH
3-State output High current
VCC = 5.5V; VO = 2.7V; VI = VIL or VIH
2.0
50
50
µA
IIL + IOZL
3-State output Low current
VCC = 5.5V; VO = 0.5V; VI = VIL or VIH
–2.0
–50
–50
µA
Output High leakage current
VCC = 5.5V; VO = 5.5V; VI = GND or VCC
2.0
50
50
µA
–100
–180
–180
mA
VCC = 5.5V; Outputs High, VI = GND or VCC
0.5
1
1
mA
VCC = 5.5V; Outputs Low, VI = GND or VCC
10.5
19
19
mA
VCC = 5.5V; Outputs 3-State;
VI = GND or VCC
0.5
1
1
mA
VCC = 5.5V; one input at 3.4V,
other inputs at VCC or GND
0.2
1.5
1.5
mA
IOFF
IPU/IPD
ICEX
IO
Output
current1
ICCH
ICCL
Quiescent supply current
ICCZ
∆ICC
Additional supply current per
input pin2
VCC = 5.5V; VO = 2.5V
–50
–50
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.
4. This parameter is valid for any VCC between 0V and 2.1V, with a transition time of up to 10msec. From VCC = 2.1V to VCC = 5V ± 10%, a
transition time of up to 100µsec is permitted.
5. This is the bus hold overdrive current required to force the input to the opposite logic state.
1998 Feb 25
7
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
74ABT16899
74ABTH16899
AC CHARACTERISTICS
GND = 0V; tR = tF = 2.5ns; CL = 50pF, RL = 500Ω
LIMITS
SYMBOL
PARAMETER
Tamb = +25oC
VCC = +5.0V
CL = 50pF
RL = 500Ω
WAVEFORM
Tamb = –40 to +85oC
VCC = +5.0V ±10%
CL = 50pF
RL = 500Ω
Min
Typ
Max
Min
Max
UNIT
tPLH
tPHL
Propagation delay
An to Bn or Bn to An
1
1.0
1.0
2.7
2.2
4.5
3.5
1.0
1.0
5.5
6.9
ns
tPLH
tPHL
Propagation delay
An to BPAR or Bn to APAR
2
2.5
2.5
4.9
5.0
7.2
7.4
2.5
2.5
8.8
8.7
ns
tPLH
tPHL
Propagation delay
An to ERRA or Bn to ERRB
3
2.8
2.8
5.0
4.9
9.3
8.0
2.8
2.8
11.0
10.2
ns
tPLH
tPHL
Propagation delay
APAR to BPAR or BPAR to APAR
1
1.5
1.5
3.1
2.5
3.9
3.1
1.5
1.5
4.8
3.9
ns
tPLH
tPHL
Propagation delay
APAR to ERRA or BPAR to ERRB
6
1.0
1.0
2.5
2.5
3.3
3.3
1.0
1.0
4.3
3.9
ns
tPLH
tPHL
Propagation delay
ODD/EVEN to APAR or BPAR
5
2.5
2.5
4.1
3.9
5.1
5.0
2.5
2.5
6.1
5.7
ns
tPLH
tPHL
Propagation delay
ODD/EVEN to ERRA or ERRB
4
2.5
2.5
4.1
4.0
6.1
5.5
2.5
2.5
7.1
6.6
ns
tPLH
tPHL
Propagation delay
SEL to APAR or BPAR
8
1.5
1.5
3.1
2.6
4.0
3.4
1.5
1.5
5.0
4.2
ns
tPLH
tPHL
Propagation delay
SEL to ERRA or ERRB
8
2.5
2.5
5.0
4.4
7.5
5.9
2.5
2.5
8.3
7.1
ns
tPLH
tPHL
Propagation delay
LEA to Bn or LEB to An
9
1.0
1.0
3.1
2.8
4.2
4.3
1.0
1.0
5.2
4.7
ns
tPLH
tPHL
Propagation delay
LEA to BPAR or LEB to APAR
9
2.8
2.8
5.5
5.1
8.0
7.7
2.8
2.8
9.7
9.1
ns
tPLH
tPHL
Propagation delay
LEA to ERRA or LEB to ERRB
7
1.1
1.2
5.4
5.8
8.0
8.0
1.1
1.2
9.2
9.6
ns
tPZH
tPZL
Output enable time
OEA to An, APAR or OEB to Bn, BPAR
11, 12
1.0
1.0
2.6
2.3
3.6
3.2
1.0
1.0
5.1
4.5
ns
tPHZ
tPLZ
Output disable time
OEA to An, APAR or OEB to Bn, BPAR
11, 12
2.5
1.5
3.9
2.8
5.6
4.1
2.5
1.5
6.0
4.4
ns
AC SETUP REQUIREMENTS
GND = 0V; tR = tF = 2.5ns; CL = 50pF, RL = 500Ω
LIMITS
+25oC
SYMBOL
PARAMETER
Tamb = –40 to +85oC
VCC = +5.0V ±10%
CL = 50pF
RL = 500Ω
UNIT
Min
Typ
Min
10
1.5
1.0
0.3
–0.1
1.5
1.0
ns
Hold time, High or Low
An, APAR to LEA or Bn, BPAR to LEB
10
1.5
1.0
0.1
–0.2
1.5
1.0
ns
Pulse width, High
LEA or LEB
10
3.0
1.0
3.0
ns
ts(H)
ts(L)
Setup time, High or Low
An, APAR to LEA or Bn, BPAR to LEB
th(H)
th(L)
tw(H)
1998 Feb 25
WAVEFORM
Tamb =
VCC = +5.0V
CL = 50pF
RL = 500Ω
8
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
74ABT16899
74ABTH16899
AC WAVEFORMS
VM = 1.5V, VIN = GND to 3.0V
1
SEL
An, APAR
(Bn, BPAR)
INPUT
VM
VM
tPLH
tPHL
Bn, BPAR
(An, APAR)
VM
OUTPUT
VM
SA00293
Waveform 1. Propagation Delay, An to Bn, Bn to An, APAR to BPAR, BPAR to APAR
SEL
0
ODD/EVEN
0
LEA
(LEB)
An
(Bn)
1
ODD PARITY
EVEN PARITY
VM
VM
tPHL
ODD PARITY
INPUT
tPLH
BPAR
(APAR)
VM
VM
OUTPUT
NOTE: Only even parity mode is shown, odd parity mode would be with ODD/EVEN = 1
SA00294
Waveform 2. Propagation Delay, An to BPAR or Bn to APAR
ODD/EVEN
0
APAR
(BPAR)
0
LEA
(LEB)
SEL
An
(Bn)
1
ODD PARITY
EVEN PARITY
VM
tPLH
VM
ODD PARITY
INPUT
tPHL
ERRA
(ERRB)
VM
VM
OUTPUT
NOTE: Only even parity mode is shown, odd parity mode would be with ODD/EVEN = 1
SA00295
Waveform 3. Propagation Delay, An to ERRA or Bn to ERRB
1998 Feb 25
9
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
74ABT16899
74ABTH16899
1
APAR
(BPAR)
An
(Bn)
EVEN PARITY
INPUT
INPUT
ODD/EVEN
VM
VM
tPLH
ERRA
(ERRB)
tPHL
VM
OUTPUT
VM
NOTE: Only even parity mode is shown, odd parity mode would cause inverted output
SA00296
Waveform 4. Propagation Delay, ODD/EVEN to ERRA or ODD/EVEN to ERRB
SEL
0
APAR
(BPAR)
0
An
(Bn)
ODD/EVEN
EVEN PARITY
VM
INPUT
VM
tPLH
BPAR
(APAR)
INPUT
tPHL
VM
VM
OUTPUT
NOTE: Only even parity mode is shown, odd parity mode would cause inverted output
SA00297
Waveform 5. Propagation Delay, ODD/EVEN to APAR or ODD/EVEN to BPAR
1998 Feb 25
10
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
74ABT16899
74ABTH16899
ODD/EVEN
0
An
(Bn)
EVEN PARITY
APAR
(BPAR)
VM
INPUT
VM
tPLH
ERRA
(ERRB)
INPUT
tPHL
VM
OUTPUT
VM
NOTE: Only even parity mode is shown with even parity. Odd parity mode would cause inverted output
and odd parity mode would be with ODD/EVEN = 1
SA00298
Waveform 6. Propagation Delay, APAR to ERRA or BPAR to ERRB
1
ODD/EVEN
APAR
(BPAR)
0
An
(Bn)
LEA
(LEB)
EVEN PARITY
ODD PARITY
VM
EVEN PARITY
INPUT
VM
tPHL
tPLH
ERRA
(ERRB)
INPUT
VM
VM
OUTPUT
NOTE: Only odd parity mode is shown. Even parity mode would be with ODD/EVEN = o
SA00299
Waveform 7. Propagation Delay, LEA to ERRA or LEB to ERRB
1998 Feb 25
11
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
74ABT16899
74ABTH16899
1
ODD/EVEN
APAR
(BPAR)
0
An
(Bn)
EVEN PARITY
SEL
VM
INPUT
INPUT
VM
tPHL
tPLH
BPAR
(APAR)
VM
OUTPUT
VM
NOTE: Only even parity mode is shown with even parity. Odd parity mode would cause inverted output
and odd parity mode would be with ODD/EVEN = 1
SA00300
Waveform 8. Propagation Delay, SEL to BPAR or SEL to APAR
1
SEL
APAR, An]
(BPAR, Bn)
INPUT
LEA
(LEB)
VM
INPUT
VM
tPHL
tPLH
Bn, BPAR
(An, APAR)
VM
OUTPUT
VM
SA00301
Waveform 9. Propagation Delay, LEA to BPAR or LEB to APAR, LEA to Bn or LEB to An
ÉÉÉ
ÉÉÉ
ÉÉÉ
APAR, BPAR,
An, Bn
VM
ÉÉÉÉÉÉÉÉÉÉÉÉ
ÉÉÉÉÉÉ
ÉÉÉÉÉÉÉÉÉÉÉÉ
ÉÉÉÉÉÉ
ÉÉÉÉÉÉÉÉÉÉÉÉ
ÉÉÉÉÉÉ
VM
ts(H)
VM
th(H)
VM
ts(L)
th(L)
LEA, LEB
VM
VM
tw(H)
VM
The shaded areas indicate when the input is permitted to change for predictable output performance.
SA00302
Waveform 10. Data Setup and Hold Times, Pulse Width High
1998 Feb 25
12
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
OEA,
OEB
74ABT16899
74ABTH16899
VM
VM
tPZH
tPHZ
An, APAR,
Bn, BPAR
VOH –0.3V
VM
0V
SA00303
Waveform 11. 3-State Output Enable Time to High Level and Output Disable Time from High Level
OEA,
OEB
VM
VM
tPZL
An, APAR,
Bn, BPAR
tPLZ
VM
VOL +0.3V
SA00304
Waveform 12. 3-State Output Enable Time to Low Level and Output Disable Time from Low Level
TEST CIRCUIT AND WAVEFORM
VCC
VX
VIN
RX
VOUT
PULSE
GENERATOR
NEGATIVE
PULSE
90%
VM
CL
AMP (V)
VM
10%
D.U.T.
RT
tW
90%
10%
tTHL (tf )
tTLH (tr )
tTLH (tr )
tTHL (tf )
0V
RL
AMP (V)
90%
90%
Test Circuit for Open Collector Outputs
POSITIVE
PULSE
VM
VM
10%
SWITCH POSITION
TEST
tPLZ
tPZL
All other
SWITCH
closed
closed
open
RT = Termination resistance should be equal to ZOUT of
pulse generators.
0V
Input Pulse Definition
DEFINITIONS:
RL = Load resistor; see AC CHARACTERISTICS for value.
CL = Load capacitance includes jig and probe capacitance;
see AC CHARACTERISTICS for value.
10%
tW
LOAD VALUES
OUTPUT
R X VX
ERROR
100 Ω VCC
All other
500 Ω 7.0V
INPUT PULSE REQUIREMENTS
FAMILY
74ABT/H16
Amplitude
Rep. Rate
tw
tR
tF
3.0V
1MHz
500ns
2.5ns
2.5ns
SH00009
1998 Feb 25
13
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
74ABT16899
74ABTH16899
SSOP56: plastic shrink small outline package; 56 leads; body width 7.5 mm
1998 Feb 25
14
SOT371-1
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
74ABT16899
74ABTH16899
TSSOP56: plastic thin shrink small outline package; 56 leads; body width 6.1mm
1998 Feb 25
15
SOT364-1
Philips Semiconductors
Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
74ABT16899
74ABTH16899
Data sheet status
Data sheet
status
Product
status
Definition [1]
Objective
specification
Development
This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.
Preliminary
specification
Qualification
This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make chages at any time without notice in order to
improve design and supply the best possible product.
Product
specification
Production
This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.
[1] Please consult the most recently issued datasheet before initiating or completing a design.
Definitions
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook.
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may affect device reliability.
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.
Disclaimers
Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can
reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.
 Copyright Philips Electronics North America Corporation 1998
All rights reserved. Printed in U.S.A.
Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 94088–3409
Telephone 800-234-7381
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Document order number:
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Date of release: 05-96
9397-750-03507