RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Radiation Lot Acceptance Testing (RLAT) of the RH1498MW Dual Rail-toRail Input and Output Precision C-Load Op Amp for Linear Technology Customer: Linear Technology, PO# 58876L RAD Job Number: 11-009 Part Type Tested: RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp. Traceability Information: Fab Lot Number: #W10737593, Wafer Number: 20, Assembly Lot Number: 572207.1, Date Code: 1020A. See photograph of unit under test in Appendix A. Quantity of Units: 12 units received, 5 units for biased irradiation, 5 units for unbiased irradiation and 1 unit for control. Serial numbers 1058, 1059, 1060, 1062 and 1063 were biased during irradiation, serial numbers 1064-1068 were unbiased during irradiation and serial numbers 1069 and 1070 were used as controls. See Appendix B for the radiation bias connection table. Radiation and Electrical Test Increments: 50rad(Si)/s ionizing radiation with electrical test increments: pre-irradiation, 20krad(Si), 50krad(Si), 100krad(Si) and 200krad(Si). Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD. Overtest and Post-Irradiation Anneal: No overtest. No anneal. Radiation Test Standard: MIL-STD 883 and/or MIL-STD-750 TM1019 (latest revision), Condition A. Test Hardware and Software: LTS2020 Automated Tester, Entity ID TS03, Calibration Date: 04-2810, Calibration Due 04-28-11. LTS2101 Family Board, Entity ID FB02. LTS0600 Test Fixture, Entity ID TF03. RH1498 DUT Board. Test Program: RH1498X.SRC Facility and Radiation Source: Radiation Assured Devices' Longmire Laboratories, Colorado Springs, CO. Gamma rays provided by JLSA 81-24 Co60 source. Dosimetry performed by Air Ionization Chamber (AIC) traceable to NIST. RAD's dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 and MIL-STD-883 TM 1019. Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883 and MIL-STD-750. RLAT Result: PASSED the total ionizing dose test to the maximum tested dose level of 200krad(Si) with all parameters remaining within their datasheet specifications. An ISO 9001:2008 and DSCC Certified Company 1 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 1.0. Overview and Background It is well known that total dose ionizing radiation can cause parametric degradation and ultimately functional failure in electronic devices. The damage occurs via electron-hole pair production, transport and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to ensure a worst-case test condition MIL-STD-883 TM1019.8 calls out a dose rate of 50 to 300rad(Si)/s as Condition A and further specifies that the time from the end of an incremental radiation exposure and electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to the beginning of the next incremental radiation step should be 2-hours or less. The work described in this report was performed to meet MIL-STD-883 TM1019.8 Condition A. 2.0. Radiation Test Apparatus The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices' Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 81-24 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead. During the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias boards are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to provide the required dose rate. The irradiator calibration is maintained by Radiation Assured Devices Longmire Laboratories using air ionization chamber (AIC) equipment calibrated with traceability to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60 irradiator at RAD's Longmire Laboratory facility. RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory Suitability under MIL STD 750 and MIL-STD-883. Additional details regarding Radiation Assured Devices dosimetry for TM1019 Condition A testing are available in RAD's report to DSCC entitled: "Dose Rate Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured Devices". An ISO 9001:2008 and DSCC Certified Company 2 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure 2.1. Radiation Assured Devices' high dose rate Co-60 irradiator. The dose rate is obtained by positioning the device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet. An ISO 9001:2008 and DSCC Certified Company 3 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 3.0. Radiation Test Conditions The RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp described in this final report were irradiated using a split 15V supply and with all pins tied to ground, that is biased and unbiased. See the TID Bias Table in Appendix B for the full bias circuits. In our opinion, this bias circuit satisfies the requirements of MIL-STD-883H TM1019.8 Section 3.9.3 Bias and Loading Conditions which states "The bias applied to the test devices shall be selected to produce the greatest radiation induced damage or the worst-case damage for the intended application, if known. While maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias current or maximum output load current) exhibit more degradation with 0 V bias." The devices were irradiated to a maximum total ionizing dose level of 200krad(Si) with incremental readings at 20krad(Si), 50krad(Si) and 100krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the parts were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MILSTD-883H TM1019.8 Section 3.4 that reads as follows: "Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the source, container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may be omitted." The final dose rate within the high dose rate lead-aluminum enclosure was determined using calibration calculations based on air ionization chamber (AIC) dosimetry performed just prior to beginning the total dose irradiations. The final dose rate for this work was 50rad(Si)/s with a precision of ±5%. An ISO 9001:2008 and DSCC Certified Company 4 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 4.0. Tested Parameters During the total ionizing dose characterization testing the following electrical parameters were measured pre- and post-irradiation: Measured parameters and test conditions for VS=±15V: 1. +ICC (A) @ +/-15V 2. -IEE (A) @ +/-15V 3. V OFFSET (V) @ +/-15V VCM=0V (Op Amp A-B) 4. I OFFSET (A) @ +/-15V VCM=0V (Op Amp A-B) 5. I BIAS + (A) @ +/-15V VCM=0V (Op Amp A-B) 6. I BIAS - (A) @ +/-15V VCM=0V (Op Amp A-B) 7. V OFFSET (V) @ +/-15V VCM=15V (Op Amp A-B) 8. I OFFSET (A) @ +/-15V VCM=15V (Op Amp A-B) 9. I BIAS + (A) @ +/-15V VCM=15V (Op Amp A-B) 10. I BIAS - (A) @ +/-15V VCM=15V (Op Amp A-B) 11. V OFFSET (V) @ +/-15V VCM=-15V (Op Amp A-B) 12. I OFFSET (A) @ +/-15V VCM=-15V (Op Amp A-B) 13. I BIAS + (A) @ +/-15V VCM=-15V (Op Amp A-B) 14. I BIAS - (A) @ +/-15V VCM=-15V (Op Amp A-B) 15. +VOUT (V) IL=0MA @ +/-15V (Op Amp A-B) 16. +VOUT (V) IL=1MA @ +/-15V (Op Amp A-B) 17. +VOUT (V) IL=10MA @ +/-15V (Op Amp A-B) 18. -VOUT (V) IL=0MA @ +/-15V (Op Amp A-B) 19. -VOUT (V) IL=1MA @ +/-15V (Op Amp A-B) 20. -VOUT (V) IL=10MA @ +/-15V (Op Amp A-B) 21. AVOL (V/mV) RL=10K VO=+/-14.5V (Op Amp A-B) 22. AVOL (V/mV) RL=2K VO=+/-10V (Op Amp A-B) 23. CMRR (dB) @ +/-15V VCM=+/-15V (Op Amp A-B) 24. CMRR (dB) MATCHING 25. PSRR (dB) @ +/-2V TO +/-16V (Op Amp A-B) 26. PSRR (dB) MATCHING 27. +ISC (A) VOUT=0V @ +/-15V (Op Amp A-B) 28. -ISC (A) VOUT=0V @ +/-15V (Op Amp A-B) Measured parameters and test conditions for VS=5V 29. +ICC (A) @ +5V 30. -IEE (A) @ +5V 31. V OFFSET (V) @ +5V VCM=0V (Op Amp A-B) 32. I OFFSET (A) @ +5V VCM=0V (Op Amp A-B) An ISO 9001:2008 and DSCC Certified Company 5 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 33. I BIAS + (A) @ +5V VCM=0V (Op Amp A-B) 34. I BIAS - (A) @ +5V VCM=0V (Op Amp A-B) 35. V OFFSET (V) @ +5V VCM=5V (Op Amp A-B) 36. I OFFSET (A) @ +5V VCM=5V (Op Amp A-B) 37. I BIAS + (A) @ +5V VCM=5V (Op Amp A-B) 38. I BIAS - (A) @ +5V VCM=5V (Op Amp A-B) 39. +VOUT (V) IL=0MA @ +5V (Op Amp A-B) 40. +VOUT (V) IL=1MA @ +5V (Op Amp A-B) 41. +VOUT (V) IL=2.5MA @ +5V (Op Amp A-B) 42. -VOUT (V) IL=0MA @ +5V (Op Amp A-B) 43. -VOUT (V) IL=1MA @ +5V (Op Amp A-B) 44. -VOUT (V) IL=2.5MA @ +5V (Op Amp A-B) 45. AVOL (V/mV) RL=10K VO=75MV TO 4.8V (Op Amp A-B) 46. CMRR (dB) @ +5V VCM=0 TO +5V (Op Amp A-B) 47. CMRR (dB) MATCHING 48. PSRR (dB) @ +4.5V TO +12V (Op Amp A-B) 49. PSRR (dB) MATCHING @ +4.5V TO +12V (Op Amp A-B) 50. +ISC (A) VOUT=1/2 SUPPLY @ +5V (Op Amp A-B) 51. -ISC (A) VOUT=1/2 SUPPLY @ +5V (Op Amp A-B) Appendix C details the measured parameters, test conditions, pre-irradiation specification and measurement resolution for each of the measurements. The parametric data was obtained as "read and record" and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used in this work is 2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The 90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be met for a device to pass the total ionizing dose test: following the radiation exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units irradiated without electrical bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure. An ISO 9001:2008 and DSCC Certified Company 6 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 5.0. Total Ionizing Dose Test Results Based on this criterion the RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp (from the lot traceability information provided on the first page of this test report) PASSED the total ionizing dose test to the maximum tested dose level of 200krad(Si) with all parameters remaining within their datasheet specifications. Figures 5.1 through 5.94 show plots of all the measured parameters versus total ionizing dose while Tables 5.1 - 5.94 show the corresponding raw data for each of these parameters. In the data plots the solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. The control units, as expected, show no significant changes to any of the parameters. Therefore we can conclude that the electrical testing remained in control throughout the duration of the tests and the observed degradation was due to the radiation exposure. Appendix D lists the figures used in this section to facilitate the location of a particular parameter. An ISO 9001:2008 and DSCC Certified Company 7 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 6.00E-03 +ICC (A) @ +/-15V 5.00E-03 4.00E-03 3.00E-03 2.00E-03 1.00E-03 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.1. Plot of +ICC (A) @ +/-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 8 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.1. Raw data for +ICC (A) @ +/-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +ICC (A) @ +/-15V Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 3.68E-03 3.64E-03 3.62E-03 3.66E-03 3.64E-03 3.65E-03 3.68E-03 3.64E-03 3.77E-03 3.58E-03 3.69E-03 3.70E-03 Total 20 3.58E-03 3.56E-03 3.53E-03 3.57E-03 3.55E-03 3.58E-03 3.60E-03 3.56E-03 3.68E-03 3.50E-03 3.64E-03 3.65E-03 Dose (krad(Si)) 50 100 3.54E-03 3.50E-03 3.52E-03 3.50E-03 3.49E-03 3.46E-03 3.53E-03 3.50E-03 3.51E-03 3.48E-03 3.56E-03 3.52E-03 3.58E-03 3.54E-03 3.53E-03 3.49E-03 3.66E-03 3.62E-03 3.48E-03 3.44E-03 3.66E-03 3.66E-03 3.66E-03 3.67E-03 200 3.55E-03 3.49E-03 3.48E-03 3.49E-03 3.49E-03 3.43E-03 3.46E-03 3.40E-03 3.53E-03 3.35E-03 3.65E-03 3.66E-03 3.65E-03 2.28E-05 3.71E-03 3.59E-03 3.56E-03 1.92E-05 3.61E-03 3.51E-03 3.52E-03 1.92E-05 3.57E-03 3.47E-03 3.49E-03 1.79E-05 3.54E-03 3.44E-03 3.50E-03 2.83E-05 3.58E-03 3.42E-03 3.66E-03 6.95E-05 3.85E-03 3.47E-03 5.00E-03 PASS 3.58E-03 6.54E-05 3.76E-03 3.40E-03 5.00E-03 PASS 3.56E-03 6.65E-05 3.74E-03 3.38E-03 5.00E-03 PASS 3.52E-03 6.65E-05 3.70E-03 3.34E-03 5.00E-03 PASS 3.43E-03 6.73E-05 3.62E-03 3.25E-03 5.00E-03 PASS An ISO 9001:2008 and DSCC Certified Company 9 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 0.00E+00 -IEE (A) @ +/-15V -1.00E-03 -2.00E-03 -3.00E-03 -4.00E-03 -5.00E-03 -6.00E-03 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.2. Plot of -IEE (A) @ +/-15V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 10 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.2. Raw data for -IEE (A) @ +/-15V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -IEE (A) @ +/-15V Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -3.68E-03 -3.65E-03 -3.63E-03 -3.66E-03 -3.65E-03 -3.65E-03 -3.69E-03 -3.65E-03 -3.78E-03 -3.59E-03 -3.70E-03 -3.71E-03 Total 20 -3.59E-03 -3.57E-03 -3.54E-03 -3.57E-03 -3.55E-03 -3.59E-03 -3.61E-03 -3.57E-03 -3.69E-03 -3.51E-03 -3.65E-03 -3.66E-03 Dose (krad(Si)) 50 100 -3.55E-03 -3.52E-03 -3.53E-03 -3.50E-03 -3.49E-03 -3.47E-03 -3.54E-03 -3.50E-03 -3.52E-03 -3.49E-03 -3.56E-03 -3.52E-03 -3.59E-03 -3.55E-03 -3.54E-03 -3.50E-03 -3.67E-03 -3.63E-03 -3.49E-03 -3.44E-03 -3.67E-03 -3.67E-03 -3.67E-03 -3.68E-03 200 -3.55E-03 -3.50E-03 -3.49E-03 -3.49E-03 -3.50E-03 -3.44E-03 -3.47E-03 -3.41E-03 -3.54E-03 -3.36E-03 -3.66E-03 -3.67E-03 -3.65E-03 1.82E-05 -3.60E-03 -3.70E-03 -3.56E-03 1.95E-05 -3.51E-03 -3.62E-03 -3.53E-03 2.30E-05 -3.46E-03 -3.59E-03 -3.50E-03 1.82E-05 -3.45E-03 -3.55E-03 -3.51E-03 2.51E-05 -3.44E-03 -3.57E-03 -3.67E-03 7.01E-05 -3.48E-03 -3.86E-03 -5.00E-03 PASS -3.59E-03 6.54E-05 -3.41E-03 -3.77E-03 -5.00E-03 PASS -3.57E-03 6.67E-05 -3.39E-03 -3.75E-03 -5.00E-03 PASS -3.53E-03 6.98E-05 -3.34E-03 -3.72E-03 -5.00E-03 PASS -3.44E-03 6.73E-05 -3.26E-03 -3.63E-03 -5.00E-03 PASS An ISO 9001:2008 and DSCC Certified Company 11 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX V OFFSET (V) @ +/-15V VCM=0V A 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.3. Plot of V OFFSET (V) @ +/-15V VCM=0V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 12 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.3. Raw data for V OFFSET (V) @ +/-15V VCM=0V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). V OFFSET (V) @ +/-15V VCM=0V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -1.81E-04 -1.78E-04 3.11E-04 -2.91E-04 -1.31E-04 1.36E-04 1.19E-04 2.68E-04 1.36E-04 -7.24E-05 -1.31E-04 1.48E-04 Total 20 -1.97E-04 -1.88E-04 2.90E-04 -3.04E-04 -1.51E-04 1.05E-04 8.55E-05 2.38E-04 1.03E-04 -1.04E-04 -1.41E-04 1.44E-04 Dose (krad(Si)) 50 100 -1.93E-04 -1.89E-04 -1.83E-04 -1.81E-04 2.93E-04 3.01E-04 -2.90E-04 -2.79E-04 -1.55E-04 -1.57E-04 9.16E-05 8.75E-05 7.42E-05 6.74E-05 2.14E-04 2.09E-04 8.79E-05 8.14E-05 -1.16E-04 -1.25E-04 -1.37E-04 -1.37E-04 1.45E-04 1.45E-04 200 -1.83E-04 -1.83E-04 3.01E-04 -2.74E-04 -1.47E-04 7.78E-05 6.41E-05 2.11E-04 8.82E-05 -1.37E-04 -1.39E-04 1.44E-04 -9.41E-05 2.34E-04 5.48E-04 -7.36E-04 -1.10E-04 2.31E-04 5.23E-04 -7.43E-04 -1.06E-04 2.28E-04 5.20E-04 -7.31E-04 -1.01E-04 2.30E-04 5.29E-04 -7.30E-04 -9.72E-05 2.28E-04 5.27E-04 -7.22E-04 1.17E-04 1.22E-04 4.52E-04 -2.17E-04 -8.00E-04 PASS 8.00E-04 PASS 8.56E-05 1.23E-04 4.22E-04 -2.50E-04 -9.50E-04 PASS 9.50E-04 PASS 7.04E-05 1.19E-04 3.96E-04 -2.55E-04 -9.50E-04 PASS 9.50E-04 PASS 6.40E-05 1.20E-04 3.94E-04 -2.66E-04 -9.50E-04 PASS 9.50E-04 PASS 6.08E-05 1.25E-04 4.04E-04 -2.83E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 13 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX V OFFSET (V) @ +/-15V VCM=0V B 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.4. Plot of V OFFSET (V) @ +/-15V VCM=0V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 14 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.4. Raw data for V OFFSET (V) @ +/-15V VCM=0V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). V OFFSET (V) @ +/-15V VCM=0V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -7.24E-05 3.45E-04 9.14E-05 1.70E-04 -2.51E-04 -3.34E-04 -3.46E-05 -3.12E-04 -8.30E-05 2.31E-05 -2.07E-04 1.10E-04 Total 20 -9.08E-05 3.21E-04 6.29E-05 1.29E-04 -2.73E-04 -3.61E-04 -6.06E-05 -3.43E-04 -1.07E-04 -1.91E-05 -2.11E-04 1.05E-04 Dose (krad(Si)) 50 100 -8.96E-05 -8.85E-05 3.25E-04 3.30E-04 6.34E-05 6.07E-05 1.26E-04 1.22E-04 -2.68E-04 -2.69E-04 -3.78E-04 -3.93E-04 -6.60E-05 -6.95E-05 -3.54E-04 -3.70E-04 -1.13E-04 -1.21E-04 -4.72E-05 -6.31E-05 -2.11E-04 -2.08E-04 1.06E-04 1.08E-04 200 -9.42E-05 3.33E-04 6.38E-05 1.18E-04 -2.71E-04 -3.97E-04 -5.94E-05 -3.71E-04 -1.26E-04 -9.26E-05 -2.12E-04 1.06E-04 5.65E-05 2.28E-04 6.82E-04 -5.69E-04 2.99E-05 2.25E-04 6.46E-04 -5.86E-04 3.12E-05 2.24E-04 6.45E-04 -5.82E-04 3.09E-05 2.25E-04 6.48E-04 -5.86E-04 2.98E-05 2.27E-04 6.53E-04 -5.94E-04 -1.48E-04 1.64E-04 3.02E-04 -5.98E-04 -8.00E-04 PASS 8.00E-04 PASS -1.78E-04 1.62E-04 2.66E-04 -6.22E-04 -9.50E-04 PASS 9.50E-04 PASS -1.92E-04 1.61E-04 2.50E-04 -6.34E-04 -9.50E-04 PASS 9.50E-04 PASS -2.03E-04 1.64E-04 2.48E-04 -6.54E-04 -9.50E-04 PASS 9.50E-04 PASS -2.09E-04 1.61E-04 2.33E-04 -6.52E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 15 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I OFFSET (A) @ +/-15V VCM=0V A 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.5. Plot of I OFFSET (A) @ +/-15V VCM=0V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 16 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.5. Raw data for I OFFSET (A) @ +/-15V VCM=0V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I OFFSET (A) @ +/-15V VCM=0V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 3.06E-09 1.40E-09 3.31E-09 -4.32E-09 -1.53E-09 -1.28E-09 -2.44E-09 2.88E-09 2.23E-09 3.03E-09 -1.19E-09 1.43E-09 Total 20 2.98E-09 1.19E-09 2.48E-09 -4.99E-09 -1.89E-09 -1.44E-09 -3.04E-09 2.52E-09 2.29E-09 3.47E-09 -1.23E-09 1.43E-09 Dose (krad(Si)) 50 100 2.68E-09 3.79E-09 1.24E-09 1.18E-09 4.01E-09 4.20E-09 -5.67E-09 -5.70E-09 -1.92E-09 -1.92E-09 -1.69E-09 -2.72E-09 -2.54E-09 -3.66E-09 1.86E-09 7.70E-10 2.20E-09 2.05E-09 3.11E-09 2.48E-09 -1.23E-09 -1.20E-09 1.41E-09 1.39E-09 200 3.33E-09 1.88E-09 4.91E-09 -5.64E-09 -2.06E-09 -3.99E-09 -1.57E-09 1.61E-09 2.17E-09 8.66E-10 -1.25E-09 1.39E-09 3.82E-10 3.26E-09 9.32E-09 -8.56E-09 -4.72E-11 3.35E-09 9.13E-09 -9.23E-09 6.90E-11 3.89E-09 1.07E-08 -1.06E-08 3.09E-10 4.16E-09 1.17E-08 -1.11E-08 4.85E-10 4.29E-09 1.22E-08 -1.13E-08 8.82E-10 2.56E-09 7.89E-09 -6.13E-09 -7.00E-08 PASS 7.00E-08 PASS 7.59E-10 2.83E-09 8.52E-09 -7.00E-09 -1.00E-07 PASS 1.00E-07 PASS 5.89E-10 2.52E-09 7.51E-09 -6.33E-09 -1.00E-07 PASS 1.00E-07 PASS -2.16E-10 2.80E-09 7.47E-09 -7.91E-09 -1.00E-07 PASS 1.00E-07 PASS -1.83E-10 2.56E-09 6.84E-09 -7.20E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DSCC Certified Company 17 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I OFFSET (A) @ +/-15V VCM=0V B 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.6. Plot of I OFFSET (A) @ +/-15V VCM=0V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 18 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.6. Raw data for I OFFSET (A) @ +/-15V VCM=0V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I OFFSET (A) @ +/-15V VCM=0V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 2.45E-09 2.80E-09 1.87E-09 -1.23E-09 -2.80E-10 -3.37E-09 1.70E-10 -5.20E-09 -3.69E-09 -1.43E-09 -4.42E-09 3.80E-09 Total 20 2.58E-09 2.56E-09 1.09E-09 -2.11E-09 -6.11E-10 -2.97E-09 2.49E-10 -5.35E-09 -3.68E-09 -1.96E-09 -4.53E-09 3.85E-09 Dose (krad(Si)) 50 100 2.12E-09 1.43E-09 2.19E-09 1.37E-09 -3.09E-10 -4.79E-10 -1.18E-09 -1.22E-09 -6.03E-10 -8.27E-10 -3.38E-09 -2.88E-09 6.26E-10 1.33E-09 -5.49E-09 -3.88E-09 -4.00E-09 -4.56E-09 -2.28E-09 -2.22E-09 -4.54E-09 -4.50E-09 3.82E-09 3.81E-09 200 2.02E-09 5.52E-10 -2.07E-09 -1.11E-09 -1.44E-09 -2.29E-09 1.47E-09 -3.72E-09 -3.55E-09 -3.31E-09 -4.53E-09 3.84E-09 1.12E-09 1.78E-09 5.99E-09 -3.75E-09 7.00E-10 2.05E-09 6.31E-09 -4.91E-09 4.43E-10 1.59E-09 4.81E-09 -3.92E-09 5.32E-11 1.25E-09 3.49E-09 -3.38E-09 -4.10E-10 1.67E-09 4.16E-09 -4.98E-09 -2.71E-09 2.09E-09 3.03E-09 -8.44E-09 -7.00E-08 PASS 7.00E-08 PASS -2.74E-09 2.08E-09 2.96E-09 -8.44E-09 -1.00E-07 PASS 1.00E-07 PASS -2.91E-09 2.29E-09 3.37E-09 -9.18E-09 -1.00E-07 PASS 1.00E-07 PASS -2.44E-09 2.29E-09 3.84E-09 -8.72E-09 -1.00E-07 PASS 1.00E-07 PASS -2.28E-09 2.17E-09 3.66E-09 -8.22E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DSCC Certified Company 19 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I BIAS + (A) @ +/-15V VCM=0V A 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.7. Plot of I BIAS + (A) @ +/-15V VCM=0V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 20 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.7. Raw data for I BIAS + (A) @ +/-15V VCM=0V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS + (A) @ +/-15V VCM=0V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -2.43E-07 -2.62E-07 -2.49E-07 -2.72E-07 -2.54E-07 -2.55E-07 -2.59E-07 -2.50E-07 -2.82E-07 -2.48E-07 -2.81E-07 -2.63E-07 Total 20 -2.58E-07 -2.75E-07 -2.64E-07 -2.86E-07 -2.68E-07 -2.74E-07 -2.78E-07 -2.70E-07 -3.02E-07 -2.67E-07 -2.87E-07 -2.68E-07 Dose (krad(Si)) 50 100 -2.68E-07 -2.83E-07 -2.86E-07 -3.00E-07 -2.73E-07 -2.88E-07 -2.94E-07 -3.07E-07 -2.78E-07 -2.91E-07 -2.90E-07 -3.12E-07 -2.92E-07 -3.11E-07 -2.87E-07 -3.07E-07 -3.16E-07 -3.35E-07 -2.81E-07 -3.00E-07 -2.85E-07 -2.85E-07 -2.66E-07 -2.66E-07 200 -3.09E-07 -3.26E-07 -3.17E-07 -3.34E-07 -3.20E-07 -3.49E-07 -3.39E-07 -3.39E-07 -3.73E-07 -3.33E-07 -2.86E-07 -2.67E-07 -2.56E-07 1.14E-08 -2.25E-07 -2.87E-07 -2.70E-07 1.08E-08 -2.41E-07 -3.00E-07 -2.80E-07 1.04E-08 -2.51E-07 -3.09E-07 -2.94E-07 9.62E-09 -2.67E-07 -3.20E-07 -3.21E-07 9.46E-09 -2.95E-07 -3.47E-07 -2.59E-07 1.36E-08 -2.21E-07 -2.96E-07 -7.15E-07 PASS 7.15E-07 PASS -2.78E-07 1.41E-08 -2.40E-07 -3.17E-07 -8.15E-07 PASS 8.15E-07 PASS -2.93E-07 1.34E-08 -2.56E-07 -3.30E-07 -8.65E-07 PASS 8.65E-07 PASS -3.13E-07 1.32E-08 -2.77E-07 -3.49E-07 -9.15E-07 PASS 9.15E-07 PASS -3.47E-07 1.57E-08 -3.04E-07 -3.90E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DSCC Certified Company 21 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I BIAS + (A) @ +/-15V VCM=0V B 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.8. Plot of I BIAS + (A) @ +/-15V VCM=0V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 22 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.8. Raw data for I BIAS + (A) @ +/-15V VCM=0V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS + (A) @ +/-15V VCM=0V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -2.47E-07 -2.61E-07 -2.51E-07 -2.67E-07 -2.52E-07 -2.55E-07 -2.61E-07 -2.54E-07 -2.79E-07 -2.43E-07 -2.78E-07 -2.62E-07 Total 20 -2.61E-07 -2.72E-07 -2.65E-07 -2.81E-07 -2.66E-07 -2.73E-07 -2.78E-07 -2.73E-07 -2.99E-07 -2.61E-07 -2.83E-07 -2.67E-07 Dose (krad(Si)) 50 100 -2.71E-07 -2.88E-07 -2.82E-07 -2.94E-07 -2.76E-07 -2.91E-07 -2.88E-07 -3.01E-07 -2.77E-07 -2.90E-07 -2.88E-07 -3.09E-07 -2.92E-07 -3.08E-07 -2.89E-07 -3.08E-07 -3.11E-07 -3.29E-07 -2.76E-07 -2.94E-07 -2.82E-07 -2.81E-07 -2.65E-07 -2.65E-07 200 -3.12E-07 -3.22E-07 -3.21E-07 -3.27E-07 -3.19E-07 -3.41E-07 -3.36E-07 -3.39E-07 -3.63E-07 -3.25E-07 -2.82E-07 -2.66E-07 -2.55E-07 8.07E-09 -2.33E-07 -2.77E-07 -2.69E-07 7.53E-09 -2.48E-07 -2.90E-07 -2.79E-07 6.36E-09 -2.61E-07 -2.96E-07 -2.93E-07 5.22E-09 -2.78E-07 -3.07E-07 -3.20E-07 5.22E-09 -3.06E-07 -3.35E-07 -2.58E-07 1.32E-08 -2.22E-07 -2.95E-07 -7.15E-07 PASS 7.15E-07 PASS -2.77E-07 1.37E-08 -2.39E-07 -3.15E-07 -8.15E-07 PASS 8.15E-07 PASS -2.91E-07 1.29E-08 -2.56E-07 -3.26E-07 -8.65E-07 PASS 8.65E-07 PASS -3.10E-07 1.27E-08 -2.75E-07 -3.44E-07 -9.15E-07 PASS 9.15E-07 PASS -3.41E-07 1.39E-08 -3.03E-07 -3.79E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DSCC Certified Company 23 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I BIAS - (A) @ +/-15V VCM=0V A 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.9. Plot of I BIAS - (A) @ +/-15V VCM=0V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 24 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.9. Raw data for I BIAS - (A) @ +/-15V VCM=0V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS - (A) @ +/-15V VCM=0V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -2.46E-07 -2.64E-07 -2.52E-07 -2.67E-07 -2.52E-07 -2.54E-07 -2.57E-07 -2.53E-07 -2.84E-07 -2.51E-07 -2.80E-07 -2.64E-07 Total 20 -2.61E-07 -2.77E-07 -2.66E-07 -2.81E-07 -2.66E-07 -2.73E-07 -2.75E-07 -2.72E-07 -3.04E-07 -2.70E-07 -2.85E-07 -2.69E-07 Dose (krad(Si)) 50 100 -2.71E-07 -2.87E-07 -2.87E-07 -3.01E-07 -2.77E-07 -2.92E-07 -2.88E-07 -3.01E-07 -2.76E-07 -2.90E-07 -2.88E-07 -3.09E-07 -2.89E-07 -3.06E-07 -2.88E-07 -3.08E-07 -3.18E-07 -3.36E-07 -2.83E-07 -3.03E-07 -2.84E-07 -2.84E-07 -2.67E-07 -2.67E-07 200 -3.12E-07 -3.28E-07 -3.22E-07 -3.28E-07 -3.18E-07 -3.40E-07 -3.37E-07 -3.41E-07 -3.75E-07 -3.33E-07 -2.85E-07 -2.69E-07 -2.56E-07 9.02E-09 -2.32E-07 -2.81E-07 -2.70E-07 8.20E-09 -2.48E-07 -2.93E-07 -2.80E-07 7.62E-09 -2.59E-07 -3.01E-07 -2.94E-07 6.58E-09 -2.76E-07 -3.12E-07 -3.22E-07 6.80E-09 -3.03E-07 -3.40E-07 -2.60E-07 1.37E-08 -2.22E-07 -2.97E-07 -7.15E-07 PASS 7.15E-07 PASS -2.79E-07 1.42E-08 -2.40E-07 -3.18E-07 -8.15E-07 PASS 8.15E-07 PASS -2.93E-07 1.39E-08 -2.55E-07 -3.31E-07 -8.65E-07 PASS 8.65E-07 PASS -3.12E-07 1.36E-08 -2.75E-07 -3.50E-07 -9.15E-07 PASS 9.15E-07 PASS -3.45E-07 1.69E-08 -2.99E-07 -3.91E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DSCC Certified Company 25 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I BIAS - (A) @ +/-15V VCM=0V B 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.10. Plot of I BIAS - (A) @ +/-15V VCM=0V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 26 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.10. Raw data for I BIAS - (A) @ +/-15V VCM=0V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS - (A) @ +/-15V VCM=0V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -2.49E-07 -2.63E-07 -2.53E-07 -2.65E-07 -2.51E-07 -2.52E-07 -2.61E-07 -2.49E-07 -2.75E-07 -2.41E-07 -2.73E-07 -2.66E-07 Total 20 -2.64E-07 -2.75E-07 -2.66E-07 -2.78E-07 -2.66E-07 -2.70E-07 -2.78E-07 -2.68E-07 -2.95E-07 -2.59E-07 -2.78E-07 -2.70E-07 Dose (krad(Si)) 50 100 -2.73E-07 -2.89E-07 -2.84E-07 -2.96E-07 -2.76E-07 -2.90E-07 -2.87E-07 -3.00E-07 -2.76E-07 -2.89E-07 -2.84E-07 -3.06E-07 -2.92E-07 -3.09E-07 -2.83E-07 -3.04E-07 -3.07E-07 -3.24E-07 -2.73E-07 -2.92E-07 -2.77E-07 -2.77E-07 -2.69E-07 -2.69E-07 200 -3.14E-07 -3.22E-07 -3.18E-07 -3.26E-07 -3.18E-07 -3.37E-07 -3.38E-07 -3.34E-07 -3.62E-07 -3.21E-07 -2.78E-07 -2.70E-07 -2.56E-07 7.40E-09 -2.36E-07 -2.77E-07 -2.70E-07 6.28E-09 -2.53E-07 -2.87E-07 -2.79E-07 5.90E-09 -2.63E-07 -2.95E-07 -2.93E-07 4.68E-09 -2.80E-07 -3.06E-07 -3.20E-07 4.40E-09 -3.08E-07 -3.32E-07 -2.55E-07 1.30E-08 -2.20E-07 -2.91E-07 -7.15E-07 PASS 7.15E-07 PASS -2.74E-07 1.34E-08 -2.37E-07 -3.11E-07 -8.15E-07 PASS 8.15E-07 PASS -2.88E-07 1.26E-08 -2.53E-07 -3.23E-07 -8.65E-07 PASS 8.65E-07 PASS -3.07E-07 1.17E-08 -2.75E-07 -3.39E-07 -9.15E-07 PASS 9.15E-07 PASS -3.39E-07 1.48E-08 -2.98E-07 -3.79E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DSCC Certified Company 27 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX V OFFSET (V) @ +/-15V VCM=15V A 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.11. Plot of V OFFSET (V) @ +/-15V VCM=15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 28 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.11. Raw data for V OFFSET (V) @ +/-15V VCM=15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). V OFFSET (V) @ +/-15V VCM=15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 1.97E-04 7.02E-05 3.76E-04 -5.15E-05 -7.64E-05 1.89E-04 2.95E-04 3.74E-04 8.86E-05 1.80E-04 2.29E-04 2.78E-04 Total 20 1.73E-04 5.81E-05 3.57E-04 -5.69E-05 -9.74E-05 1.71E-04 2.68E-04 3.48E-04 6.37E-05 1.54E-04 2.18E-04 2.75E-04 Dose (krad(Si)) 50 100 1.78E-04 1.84E-04 6.49E-05 7.29E-05 3.64E-04 3.78E-04 -4.21E-05 -2.70E-05 -9.58E-05 -8.76E-05 1.70E-04 1.78E-04 2.64E-04 2.63E-04 3.36E-04 3.37E-04 5.32E-05 4.99E-05 1.47E-04 1.44E-04 2.21E-04 2.22E-04 2.76E-04 2.75E-04 200 2.03E-04 8.27E-05 3.93E-04 -1.53E-05 -6.97E-05 1.88E-04 2.66E-04 3.33E-04 5.19E-05 1.33E-04 2.20E-04 2.75E-04 1.03E-04 1.87E-04 6.16E-04 -4.11E-04 8.68E-05 1.84E-04 5.92E-04 -4.18E-04 9.37E-05 1.84E-04 5.98E-04 -4.11E-04 1.04E-04 1.85E-04 6.11E-04 -4.02E-04 1.19E-04 1.85E-04 6.26E-04 -3.89E-04 2.25E-04 1.11E-04 5.29E-04 -7.82E-05 -8.00E-04 PASS 8.00E-04 PASS 2.01E-04 1.10E-04 5.01E-04 -9.95E-05 -9.50E-04 PASS 9.50E-04 PASS 1.94E-04 1.09E-04 4.93E-04 -1.05E-04 -9.50E-04 PASS 9.50E-04 PASS 1.94E-04 1.10E-04 4.97E-04 -1.08E-04 -9.50E-04 PASS 9.50E-04 PASS 1.94E-04 1.10E-04 4.96E-04 -1.07E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 29 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX V OFFSET (V) @ +/-15V VCM=15V B 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.12. Plot of V OFFSET (V) @ +/-15V VCM=15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 30 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.12. Raw data for V OFFSET (V) @ +/-15V VCM=15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). V OFFSET (V) @ +/-15V VCM=15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 1.88E-04 4.34E-04 2.46E-04 -2.49E-05 1.31E-04 2.57E-05 7.89E-05 -6.28E-06 5.90E-05 2.53E-04 -1.93E-04 1.40E-04 Total 20 1.69E-04 4.13E-04 2.28E-04 -4.77E-05 1.11E-04 2.53E-06 6.35E-05 -3.16E-05 3.81E-05 2.24E-04 -1.95E-04 1.39E-04 Dose (krad(Si)) 50 100 1.75E-04 1.82E-04 4.21E-04 4.31E-04 2.36E-04 2.44E-04 -4.44E-05 -4.12E-05 1.20E-04 1.26E-04 -9.66E-06 -2.23E-05 6.24E-05 6.80E-05 -4.23E-05 -5.50E-05 3.79E-05 3.02E-05 2.10E-04 2.06E-04 -1.94E-04 -1.93E-04 1.39E-04 1.39E-04 200 1.95E-04 4.45E-04 2.62E-04 -2.73E-05 1.35E-04 -3.53E-05 8.26E-05 -5.72E-05 3.21E-05 1.95E-04 -1.96E-04 1.38E-04 1.95E-04 1.68E-04 6.54E-04 -2.65E-04 1.74E-04 1.68E-04 6.35E-04 -2.86E-04 1.81E-04 1.70E-04 6.46E-04 -2.84E-04 1.88E-04 1.72E-04 6.60E-04 -2.84E-04 2.02E-04 1.73E-04 6.77E-04 -2.72E-04 8.20E-05 1.01E-04 3.58E-04 -1.94E-04 -8.00E-04 PASS 8.00E-04 PASS 5.93E-05 9.88E-05 3.30E-04 -2.12E-04 -9.50E-04 PASS 9.50E-04 PASS 5.17E-05 9.76E-05 3.19E-04 -2.16E-04 -9.50E-04 PASS 9.50E-04 PASS 4.54E-05 1.02E-04 3.24E-04 -2.33E-04 -9.50E-04 PASS 9.50E-04 PASS 4.35E-05 1.01E-04 3.21E-04 -2.34E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 31 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I OFFSET (A) @ +/-15V VCM=15V A 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.13. Plot of I OFFSET (A) @ +/-15V VCM=15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 32 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.13. Raw data for I OFFSET (A) @ +/-15V VCM=15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I OFFSET (A) @ +/-15V VCM=15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 5.68E-09 2.18E-09 8.99E-09 1.78E-09 -1.33E-08 6.96E-09 -3.12E-09 1.98E-09 -1.20E-10 1.33E-08 -5.60E-10 2.01E-09 Total 20 5.19E-09 1.41E-09 8.89E-09 -4.99E-10 -1.40E-08 7.14E-09 -2.55E-09 9.01E-10 -1.20E-09 1.38E-08 -7.03E-10 1.93E-09 Dose (krad(Si)) 50 100 6.58E-09 7.55E-09 1.44E-09 1.77E-09 9.68E-09 1.17E-08 -1.27E-09 -1.59E-09 -1.29E-08 -9.23E-09 6.02E-09 6.94E-09 -2.22E-09 -1.83E-09 2.51E-09 2.32E-09 -2.82E-09 -5.33E-09 1.28E-08 1.35E-08 -7.31E-10 -7.82E-10 1.83E-09 1.83E-09 200 6.66E-09 3.23E-09 1.25E-08 -1.78E-09 -9.28E-09 9.60E-09 5.07E-10 1.95E-09 -8.24E-09 8.54E-09 -8.07E-10 1.82E-09 1.07E-09 8.53E-09 2.45E-08 -2.23E-08 1.92E-10 8.73E-09 2.41E-08 -2.37E-08 7.11E-10 8.71E-09 2.46E-08 -2.32E-08 2.05E-09 8.14E-09 2.44E-08 -2.03E-08 2.28E-09 8.30E-09 2.50E-08 -2.05E-08 3.81E-09 6.47E-09 2.16E-08 -1.39E-08 -7.00E-08 PASS 7.00E-08 PASS 3.61E-09 6.78E-09 2.22E-08 -1.50E-08 -1.00E-07 PASS 1.00E-07 PASS 3.25E-09 6.43E-09 2.09E-08 -1.44E-08 -1.00E-07 PASS 1.00E-07 PASS 3.11E-09 7.39E-09 2.34E-08 -1.71E-08 -1.00E-07 PASS 1.00E-07 PASS 2.47E-09 7.18E-09 2.22E-08 -1.72E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DSCC Certified Company 33 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I OFFSET (A) @ +/-15V VCM=15V B 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.14. Plot of I OFFSET (A) @ +/-15V VCM=15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 34 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.14. Raw data for I OFFSET (A) @ +/-15V VCM=15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I OFFSET (A) @ +/-15V VCM=15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 1.22E-09 6.50E-11 -2.45E-09 -1.65E-10 1.07E-08 1.43E-08 3.53E-10 1.16E-09 6.87E-09 1.62E-08 -3.66E-10 2.58E-08 Total 20 4.07E-09 -9.02E-10 -4.94E-09 -2.33E-09 1.10E-08 1.42E-08 4.22E-10 4.41E-10 4.41E-09 1.80E-08 -3.97E-10 2.82E-08 Dose (krad(Si)) 50 100 5.67E-09 8.41E-09 -1.00E-10 -4.39E-10 -5.36E-09 -4.54E-09 -2.35E-09 -5.04E-09 1.03E-08 9.33E-09 1.22E-08 1.33E-08 -4.21E-09 -3.24E-09 -2.45E-10 1.09E-09 5.73E-09 6.18E-09 1.73E-08 2.04E-08 -4.82E-10 -5.04E-10 2.72E-08 2.72E-08 200 1.10E-08 1.34E-10 -6.09E-09 -4.43E-10 1.26E-08 1.06E-08 -3.67E-09 1.88E-09 3.04E-09 1.78E-08 -5.41E-10 2.76E-08 1.88E-09 5.12E-09 1.59E-08 -1.22E-08 1.39E-09 6.31E-09 1.87E-08 -1.59E-08 1.64E-09 6.32E-09 1.90E-08 -1.57E-08 1.54E-09 6.93E-09 2.05E-08 -1.75E-08 3.43E-09 8.01E-09 2.54E-08 -1.85E-08 7.78E-09 7.31E-09 2.78E-08 -1.23E-08 -7.00E-08 PASS 7.00E-08 PASS 7.50E-09 8.15E-09 2.98E-08 -1.48E-08 -1.00E-07 PASS 1.00E-07 PASS 6.17E-09 8.81E-09 3.03E-08 -1.80E-08 -1.00E-07 PASS 1.00E-07 PASS 7.54E-09 9.46E-09 3.35E-08 -1.84E-08 -1.00E-07 PASS 1.00E-07 PASS 5.92E-09 8.35E-09 2.88E-08 -1.70E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DSCC Certified Company 35 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I BIAS + (A) @ +/-15V VCM=15V A 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.15. Plot of I BIAS + (A) @ +/-15V VCM=15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 36 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.15. Raw data for I BIAS + (A) @ +/-15V VCM=15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS + (A) @ +/-15V VCM=15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 3.88E-07 4.07E-07 4.05E-07 4.19E-07 3.94E-07 4.05E-07 4.09E-07 3.93E-07 4.39E-07 4.00E-07 4.13E-07 4.18E-07 Total 20 4.48E-07 4.64E-07 4.72E-07 4.80E-07 4.52E-07 4.80E-07 4.78E-07 4.72E-07 5.16E-07 4.74E-07 4.16E-07 4.19E-07 Dose (krad(Si)) 50 100 5.18E-07 5.97E-07 5.36E-07 6.12E-07 5.47E-07 6.31E-07 5.49E-07 6.26E-07 5.17E-07 5.90E-07 5.59E-07 6.44E-07 5.56E-07 6.29E-07 5.57E-07 6.32E-07 5.99E-07 6.77E-07 5.53E-07 6.26E-07 4.16E-07 4.16E-07 4.20E-07 4.20E-07 4.03E-07 1.20E-08 4.36E-07 3.70E-07 4.63E-07 1.32E-08 4.99E-07 4.27E-07 5.34E-07 1.51E-08 5.75E-07 4.92E-07 6.11E-07 1.77E-08 6.60E-07 5.63E-07 7.20E-07 2.11E-08 7.78E-07 6.62E-07 4.09E-07 1.79E-08 4.58E-07 3.60E-07 -7.15E-07 PASS 7.15E-07 PASS 4.84E-07 1.84E-08 5.34E-07 4.34E-07 -8.15E-07 PASS 8.15E-07 PASS 5.65E-07 1.92E-08 6.18E-07 5.12E-07 -8.65E-07 PASS 8.65E-07 PASS 6.42E-07 2.07E-08 6.98E-07 5.85E-07 -9.15E-07 PASS 9.15E-07 PASS 7.34E-07 2.11E-08 7.92E-07 6.76E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DSCC Certified Company 37 200 7.03E-07 7.17E-07 7.43E-07 7.40E-07 6.97E-07 7.34E-07 7.27E-07 7.22E-07 7.70E-07 7.17E-07 4.13E-07 4.19E-07 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I BIAS + (A) @ +/-15V VCM=15V B 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.16. Plot of I BIAS + (A) @ +/-15V VCM=15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 38 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.16. Raw data for I BIAS + (A) @ +/-15V VCM=15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS + (A) @ +/-15V VCM=15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 3.94E-07 3.90E-07 3.97E-07 4.19E-07 4.00E-07 4.03E-07 4.17E-07 4.04E-07 4.44E-07 3.99E-07 4.08E-07 4.46E-07 Total 20 4.53E-07 4.46E-07 4.58E-07 4.83E-07 4.58E-07 4.77E-07 4.86E-07 4.82E-07 5.16E-07 4.73E-07 4.10E-07 4.52E-07 Dose (krad(Si)) 50 100 5.23E-07 6.04E-07 5.17E-07 5.92E-07 5.36E-07 6.16E-07 5.55E-07 6.28E-07 5.25E-07 5.96E-07 5.56E-07 6.38E-07 5.64E-07 6.43E-07 5.65E-07 6.40E-07 5.98E-07 6.76E-07 5.53E-07 6.28E-07 4.12E-07 4.12E-07 4.51E-07 4.49E-07 4.00E-07 1.14E-08 4.31E-07 3.68E-07 4.59E-07 1.39E-08 4.98E-07 4.21E-07 5.31E-07 1.47E-08 5.71E-07 4.91E-07 6.07E-07 1.50E-08 6.48E-07 5.66E-07 7.17E-07 1.83E-08 7.67E-07 6.67E-07 4.13E-07 1.85E-08 4.64E-07 3.63E-07 -7.15E-07 PASS 7.15E-07 PASS 4.87E-07 1.72E-08 5.34E-07 4.39E-07 -8.15E-07 PASS 8.15E-07 PASS 5.67E-07 1.80E-08 6.17E-07 5.18E-07 -8.65E-07 PASS 8.65E-07 PASS 6.45E-07 1.84E-08 6.95E-07 5.94E-07 -9.15E-07 PASS 9.15E-07 PASS 7.37E-07 2.34E-08 8.01E-07 6.73E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DSCC Certified Company 39 200 7.13E-07 6.97E-07 7.31E-07 7.41E-07 7.04E-07 7.25E-07 7.33E-07 7.35E-07 7.77E-07 7.16E-07 4.09E-07 4.49E-07 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I BIAS - (A) @ +/-15V VCM=15V A 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.17. Plot of I BIAS - (A) @ +/-15V VCM=15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 40 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.17. Raw data for I BIAS - (A) @ +/-15V VCM=15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS - (A) @ +/-15V VCM=15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 3.81E-07 4.04E-07 3.95E-07 4.15E-07 4.05E-07 3.97E-07 4.08E-07 3.91E-07 4.37E-07 3.85E-07 4.12E-07 4.15E-07 Total 20 4.38E-07 4.61E-07 4.59E-07 4.77E-07 4.63E-07 4.70E-07 4.77E-07 4.70E-07 5.15E-07 4.60E-07 4.13E-07 4.17E-07 Dose (krad(Si)) 50 100 5.08E-07 5.88E-07 5.34E-07 6.08E-07 5.36E-07 6.17E-07 5.50E-07 6.27E-07 5.28E-07 5.96E-07 5.52E-07 6.32E-07 5.56E-07 6.34E-07 5.54E-07 6.27E-07 5.96E-07 6.80E-07 5.38E-07 6.13E-07 4.15E-07 4.14E-07 4.17E-07 4.16E-07 4.00E-07 1.29E-08 4.36E-07 3.65E-07 4.60E-07 1.40E-08 4.98E-07 4.21E-07 5.31E-07 1.51E-08 5.73E-07 4.90E-07 6.07E-07 1.55E-08 6.50E-07 5.64E-07 7.16E-07 1.83E-08 7.66E-07 6.66E-07 4.04E-07 2.04E-08 4.60E-07 3.48E-07 -7.15E-07 PASS 7.15E-07 PASS 4.78E-07 2.14E-08 5.37E-07 4.20E-07 -8.15E-07 PASS 8.15E-07 PASS 5.59E-07 2.20E-08 6.19E-07 4.99E-07 -8.65E-07 PASS 8.65E-07 PASS 6.37E-07 2.52E-08 7.06E-07 5.68E-07 -9.15E-07 PASS 9.15E-07 PASS 7.30E-07 2.78E-08 8.06E-07 6.53E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DSCC Certified Company 41 200 6.95E-07 7.13E-07 7.29E-07 7.40E-07 7.04E-07 7.25E-07 7.25E-07 7.18E-07 7.77E-07 7.03E-07 4.13E-07 4.15E-07 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I BIAS - (A) @ +/-15V VCM=15V B 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.18. Plot of I BIAS - (A) @ +/-15V VCM=15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 42 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.18. Raw data for I BIAS - (A) @ +/-15V VCM=15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS - (A) @ +/-15V VCM=15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 3.89E-07 3.88E-07 3.95E-07 4.20E-07 3.88E-07 3.88E-07 4.15E-07 4.01E-07 4.35E-07 3.82E-07 4.07E-07 4.19E-07 Total 20 4.45E-07 4.43E-07 4.60E-07 4.82E-07 4.44E-07 4.60E-07 4.85E-07 4.79E-07 5.09E-07 4.55E-07 4.08E-07 4.22E-07 Dose (krad(Si)) 50 100 5.14E-07 5.95E-07 5.15E-07 5.90E-07 5.40E-07 6.22E-07 5.55E-07 6.32E-07 5.12E-07 5.84E-07 5.43E-07 6.23E-07 5.68E-07 6.41E-07 5.62E-07 6.42E-07 5.89E-07 6.72E-07 5.35E-07 6.05E-07 4.09E-07 4.09E-07 4.22E-07 4.20E-07 3.96E-07 1.37E-08 4.33E-07 3.59E-07 4.55E-07 1.66E-08 5.01E-07 4.09E-07 5.27E-07 1.92E-08 5.80E-07 4.75E-07 6.05E-07 2.11E-08 6.62E-07 5.47E-07 7.13E-07 2.41E-08 7.79E-07 6.47E-07 4.04E-07 2.15E-08 4.63E-07 3.45E-07 -7.15E-07 PASS 7.15E-07 PASS 4.78E-07 2.18E-08 5.37E-07 4.18E-07 -8.15E-07 PASS 8.15E-07 PASS 5.59E-07 2.13E-08 6.18E-07 5.01E-07 -8.65E-07 PASS 8.65E-07 PASS 6.37E-07 2.48E-08 7.05E-07 5.68E-07 -9.15E-07 PASS 9.15E-07 PASS 7.29E-07 2.72E-08 8.04E-07 6.55E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DSCC Certified Company 43 200 7.02E-07 6.94E-07 7.36E-07 7.42E-07 6.92E-07 7.15E-07 7.32E-07 7.28E-07 7.71E-07 6.98E-07 4.09E-07 4.21E-07 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX V OFFSET (V) @ +/-15V VCM=-15V A 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.19. Plot of V OFFSET (V) @ +/-15V VCM=-15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 44 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.19. Raw data for V OFFSET (V) @ +/-15V VCM=-15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). V OFFSET (V) @ +/-15V VCM=-15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -2.79E-04 -1.70E-04 2.67E-04 -2.88E-04 -4.33E-05 2.63E-04 1.85E-04 2.30E-04 1.02E-04 -5.25E-05 -9.85E-05 1.54E-04 Total 20 -2.94E-04 -1.82E-04 2.45E-04 -3.00E-04 -6.41E-05 2.30E-04 1.51E-04 1.98E-04 6.99E-05 -8.12E-05 -1.08E-04 1.49E-04 Dose (krad(Si)) 50 100 -2.89E-04 -2.85E-04 -1.77E-04 -1.76E-04 2.47E-04 2.55E-04 -2.89E-04 -2.76E-04 -6.92E-05 -6.88E-05 2.18E-04 2.12E-04 1.38E-04 1.30E-04 1.77E-04 1.72E-04 5.55E-05 5.07E-05 -9.66E-05 -1.05E-04 -1.04E-04 -1.04E-04 1.50E-04 1.51E-04 200 -2.82E-04 -1.78E-04 2.53E-04 -2.71E-04 -6.27E-05 1.97E-04 1.24E-04 1.75E-04 5.33E-05 -1.13E-04 -1.07E-04 1.48E-04 -1.03E-04 2.29E-04 5.26E-04 -7.31E-04 -1.19E-04 2.25E-04 4.98E-04 -7.36E-04 -1.15E-04 2.22E-04 4.94E-04 -7.25E-04 -1.10E-04 2.22E-04 4.99E-04 -7.19E-04 -1.08E-04 2.20E-04 4.96E-04 -7.12E-04 1.46E-04 1.26E-04 4.92E-04 -2.00E-04 -8.00E-04 PASS 8.00E-04 PASS 1.13E-04 1.24E-04 4.54E-04 -2.27E-04 -9.50E-04 PASS 9.50E-04 PASS 9.83E-05 1.24E-04 4.39E-04 -2.43E-04 -9.50E-04 PASS 9.50E-04 PASS 9.19E-05 1.25E-04 4.35E-04 -2.51E-04 -9.50E-04 PASS 9.50E-04 PASS 8.73E-05 1.25E-04 4.30E-04 -2.55E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 45 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX V OFFSET (V) @ +/-15V VCM=-15V B 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.20. Plot of V OFFSET (V) @ +/-15V VCM=-15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 46 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.20. Raw data for V OFFSET (V) @ +/-15V VCM=-15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). V OFFSET (V) @ +/-15V VCM=-15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -1.05E-04 3.28E-04 1.65E-04 1.83E-04 -2.32E-04 -3.28E-04 2.84E-05 -3.29E-04 -5.96E-05 1.69E-04 -1.20E-04 1.24E-04 Total 20 -1.23E-04 3.04E-04 1.37E-04 1.41E-04 -2.56E-04 -3.54E-04 1.80E-06 -3.57E-04 -8.51E-05 1.23E-04 -1.27E-04 1.19E-04 Dose (krad(Si)) 50 100 -1.22E-04 -1.20E-04 3.07E-04 3.12E-04 1.35E-04 1.33E-04 1.38E-04 1.31E-04 -2.49E-04 -2.53E-04 -3.70E-04 -3.86E-04 -3.39E-06 -5.92E-06 -3.74E-04 -3.88E-04 -9.01E-05 -1.00E-04 9.81E-05 7.86E-05 -1.27E-04 -1.23E-04 1.21E-04 1.21E-04 200 -1.30E-04 3.12E-04 1.35E-04 1.28E-04 -2.56E-04 -3.94E-04 1.80E-06 -3.89E-04 -9.98E-05 4.69E-05 -1.28E-04 1.20E-04 6.78E-05 2.29E-04 6.96E-04 -5.61E-04 4.05E-05 2.25E-04 6.59E-04 -5.78E-04 4.19E-05 2.23E-04 6.54E-04 -5.71E-04 4.06E-05 2.25E-04 6.56E-04 -5.75E-04 3.77E-05 2.27E-04 6.61E-04 -5.86E-04 -1.04E-04 2.21E-04 5.02E-04 -7.09E-04 -8.00E-04 PASS 8.00E-04 PASS -1.34E-04 2.15E-04 4.55E-04 -7.23E-04 -9.50E-04 PASS 9.50E-04 PASS -1.48E-04 2.15E-04 4.42E-04 -7.38E-04 -9.50E-04 PASS 9.50E-04 PASS -1.60E-04 2.17E-04 4.33E-04 -7.54E-04 -9.50E-04 PASS 9.50E-04 PASS -1.67E-04 2.12E-04 4.14E-04 -7.48E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 47 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I OFFSET (A) @ +/-15V VCM=-15V A 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.21. Plot of I OFFSET (A) @ +/-15V VCM=-15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 48 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.21. Raw data for I OFFSET (A) @ +/-15V VCM=-15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I OFFSET (A) @ +/-15V VCM=-15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 2.78E-09 1.76E-09 3.47E-09 -4.90E-09 -7.71E-10 -4.10E-11 -2.14E-09 3.10E-09 2.38E-09 3.89E-09 -1.01E-09 1.75E-09 Total 20 2.52E-09 1.66E-09 2.52E-09 -5.75E-09 -1.09E-09 -7.05E-10 -2.93E-09 2.71E-09 2.16E-09 4.67E-09 -1.09E-09 1.80E-09 Dose (krad(Si)) 50 100 2.36E-09 3.27E-09 1.50E-09 1.40E-09 3.92E-09 4.31E-09 -6.45E-09 -6.87E-09 -1.35E-09 -1.27E-09 -3.61E-10 -1.64E-09 -2.42E-09 -3.35E-09 1.84E-09 8.60E-11 1.97E-09 1.74E-09 3.79E-09 3.63E-09 -1.08E-09 -1.08E-09 1.75E-09 1.73E-09 200 2.28E-09 1.82E-09 4.45E-09 -7.19E-09 -1.80E-09 -3.96E-09 -1.05E-09 1.82E-09 1.80E-09 1.42E-09 -1.08E-09 1.81E-09 4.68E-10 3.41E-09 9.81E-09 -8.87E-09 -2.86E-11 3.53E-09 9.64E-09 -9.70E-09 -6.40E-12 4.08E-09 1.12E-08 -1.12E-08 1.69E-10 4.47E-09 1.24E-08 -1.21E-08 -8.58E-11 4.56E-09 1.24E-08 -1.26E-08 1.44E-09 2.48E-09 8.24E-09 -5.36E-09 -7.00E-08 PASS 7.00E-08 PASS 1.18E-09 3.00E-09 9.40E-09 -7.04E-09 -1.00E-07 PASS 1.00E-07 PASS 9.63E-10 2.40E-09 7.53E-09 -5.61E-09 -1.00E-07 PASS 1.00E-07 PASS 9.18E-11 2.74E-09 7.60E-09 -7.42E-09 -1.00E-07 PASS 1.00E-07 PASS 8.00E-12 2.52E-09 6.91E-09 -6.89E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DSCC Certified Company 49 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I OFFSET (A) @ +/-15V VCM=-15V B 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.22. Plot of I OFFSET (A) @ +/-15V VCM=-15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 50 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.22. Raw data for I OFFSET (A) @ +/-15V VCM=-15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I OFFSET (A) @ +/-15V VCM=-15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 2.68E-09 3.17E-09 3.08E-09 -1.20E-09 -9.50E-11 -3.86E-09 9.42E-10 -6.33E-09 -4.04E-09 -1.18E-10 -4.17E-09 4.77E-09 Total 20 2.94E-09 2.72E-09 2.22E-09 -2.16E-09 -4.37E-10 -3.80E-09 1.19E-09 -6.59E-09 -4.06E-09 -7.71E-10 -4.30E-09 4.84E-09 Dose (krad(Si)) 50 100 2.39E-09 1.73E-09 2.39E-09 1.23E-09 6.01E-10 6.49E-10 -1.26E-09 -1.47E-09 -6.33E-10 -9.63E-10 -3.61E-09 -3.26E-09 1.71E-09 2.01E-09 -6.37E-09 -4.96E-09 -4.20E-09 -5.54E-09 -7.50E-10 -8.72E-10 -4.29E-09 -4.29E-09 4.80E-09 4.81E-09 200 2.10E-09 3.04E-10 -1.50E-09 -1.57E-09 -1.47E-09 -3.12E-09 2.52E-09 -4.90E-09 -5.42E-09 -1.83E-09 -4.35E-09 4.86E-09 1.53E-09 2.03E-09 7.09E-09 -4.04E-09 1.06E-09 2.25E-09 7.22E-09 -5.11E-09 6.97E-10 1.68E-09 5.31E-09 -3.92E-09 2.36E-10 1.39E-09 4.05E-09 -3.57E-09 -4.26E-10 1.62E-09 4.01E-09 -4.86E-09 -2.68E-09 3.01E-09 5.58E-09 -1.09E-08 -7.00E-08 PASS 7.00E-08 PASS -2.81E-09 3.04E-09 5.53E-09 -1.11E-08 -1.00E-07 PASS 1.00E-07 PASS -2.64E-09 3.15E-09 6.01E-09 -1.13E-08 -1.00E-07 PASS 1.00E-07 PASS -2.53E-09 3.12E-09 6.02E-09 -1.11E-08 -1.00E-07 PASS 1.00E-07 PASS -2.55E-09 3.17E-09 6.15E-09 -1.13E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2008 and DSCC Certified Company 51 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I BIAS + (A) @ +/-15V VCM=-15V A 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.23. Plot of I BIAS + (A) @ +/-15V VCM=-15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 52 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.23. Raw data for I BIAS + (A) @ +/-15V VCM=-15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS + (A) @ +/-15V VCM=-15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -2.96E-07 -3.16E-07 -3.03E-07 -3.28E-07 -3.08E-07 -3.08E-07 -3.17E-07 -3.03E-07 -3.40E-07 -3.00E-07 -3.37E-07 -3.20E-07 Total 20 -3.14E-07 -3.32E-07 -3.19E-07 -3.48E-07 -3.26E-07 -3.30E-07 -3.39E-07 -3.26E-07 -3.68E-07 -3.22E-07 -3.48E-07 -3.26E-07 Dose (krad(Si)) 50 100 -3.26E-07 -3.47E-07 -3.48E-07 -3.64E-07 -3.31E-07 -3.52E-07 -3.58E-07 -3.74E-07 -3.37E-07 -3.58E-07 -3.51E-07 -3.76E-07 -3.58E-07 -3.83E-07 -3.47E-07 -3.76E-07 -3.83E-07 -4.07E-07 -3.38E-07 -3.64E-07 -3.45E-07 -3.41E-07 -3.24E-07 -3.24E-07 200 -3.79E-07 -3.97E-07 -3.89E-07 -4.06E-07 -3.93E-07 -4.18E-07 -4.16E-07 -4.13E-07 -4.42E-07 -4.05E-07 -3.48E-07 -3.25E-07 -3.10E-07 1.24E-08 -2.76E-07 -3.44E-07 -3.28E-07 1.33E-08 -2.91E-07 -3.64E-07 -3.40E-07 1.31E-08 -3.04E-07 -3.76E-07 -3.59E-07 1.06E-08 -3.30E-07 -3.88E-07 -3.93E-07 9.78E-09 -3.66E-07 -4.20E-07 -3.14E-07 1.61E-08 -2.70E-07 -3.58E-07 -7.15E-07 PASS 7.15E-07 PASS -3.37E-07 1.86E-08 -2.86E-07 -3.88E-07 -8.15E-07 PASS 8.15E-07 PASS -3.56E-07 1.68E-08 -3.10E-07 -4.02E-07 -8.65E-07 PASS 8.65E-07 PASS -3.81E-07 1.57E-08 -3.38E-07 -4.24E-07 -9.15E-07 PASS 9.15E-07 PASS -4.19E-07 1.37E-08 -3.81E-07 -4.56E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DSCC Certified Company 53 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I BIAS + (A) @ +/-15V VCM=-15V B 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.24. Plot of I BIAS + (A) @ +/-15V VCM=-15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 54 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.24. Raw data for I BIAS + (A) @ +/-15V VCM=-15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS + (A) @ +/-15V VCM=-15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -3.01E-07 -3.15E-07 -3.04E-07 -3.22E-07 -3.07E-07 -3.09E-07 -3.18E-07 -3.08E-07 -3.37E-07 -2.95E-07 -3.33E-07 -3.19E-07 Total 20 -3.18E-07 -3.29E-07 -3.21E-07 -3.38E-07 -3.24E-07 -3.30E-07 -3.38E-07 -3.30E-07 -3.65E-07 -3.16E-07 -3.39E-07 -3.25E-07 Dose (krad(Si)) 50 100 -3.30E-07 -3.52E-07 -3.40E-07 -3.60E-07 -3.33E-07 -3.56E-07 -3.51E-07 -3.66E-07 -3.36E-07 -3.58E-07 -3.50E-07 -3.77E-07 -3.57E-07 -3.78E-07 -3.51E-07 -3.74E-07 -3.78E-07 -3.99E-07 -3.33E-07 -3.58E-07 -3.37E-07 -3.37E-07 -3.23E-07 -3.23E-07 200 -3.81E-07 -3.92E-07 -3.92E-07 -3.98E-07 -3.91E-07 -4.12E-07 -4.13E-07 -4.13E-07 -4.37E-07 -3.95E-07 -3.38E-07 -3.24E-07 -3.10E-07 8.71E-09 -2.86E-07 -3.34E-07 -3.26E-07 8.09E-09 -3.04E-07 -3.48E-07 -3.38E-07 8.10E-09 -3.16E-07 -3.60E-07 -3.58E-07 5.13E-09 -3.44E-07 -3.72E-07 -3.91E-07 6.04E-09 -3.74E-07 -4.08E-07 -3.13E-07 1.57E-08 -2.70E-07 -3.57E-07 -7.15E-07 PASS 7.15E-07 PASS -3.36E-07 1.80E-08 -2.87E-07 -3.85E-07 -8.15E-07 PASS 8.15E-07 PASS -3.54E-07 1.66E-08 -3.08E-07 -3.99E-07 -8.65E-07 PASS 8.65E-07 PASS -3.77E-07 1.49E-08 -3.36E-07 -4.18E-07 -9.15E-07 PASS 9.15E-07 PASS -4.14E-07 1.50E-08 -3.73E-07 -4.55E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DSCC Certified Company 55 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I BIAS - (A) @ +/-15V VCM=-15V A 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.25. Plot of I BIAS - (A) @ +/-15V VCM=-15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 56 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.25. Raw data for I BIAS - (A) @ +/-15V VCM=-15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS - (A) @ +/-15V VCM=-15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -2.99E-07 -3.18E-07 -3.06E-07 -3.23E-07 -3.07E-07 -3.08E-07 -3.15E-07 -3.06E-07 -3.48E-07 -3.04E-07 -3.35E-07 -3.22E-07 Total 20 -3.17E-07 -3.33E-07 -3.22E-07 -3.39E-07 -3.25E-07 -3.29E-07 -3.36E-07 -3.29E-07 -3.72E-07 -3.26E-07 -3.50E-07 -3.28E-07 Dose (krad(Si)) 50 100 -3.28E-07 -3.50E-07 -3.50E-07 -3.65E-07 -3.35E-07 -3.59E-07 -3.51E-07 -3.70E-07 -3.36E-07 -3.58E-07 -3.49E-07 -3.79E-07 -3.58E-07 -3.80E-07 -3.52E-07 -3.72E-07 -3.84E-07 -4.09E-07 -3.47E-07 -3.69E-07 -3.40E-07 -3.39E-07 -3.26E-07 -3.25E-07 200 -3.83E-07 -3.99E-07 -3.96E-07 -3.98E-07 -3.94E-07 -4.10E-07 -4.16E-07 -4.14E-07 -4.46E-07 -4.06E-07 -3.41E-07 -3.27E-07 -3.11E-07 9.77E-09 -2.84E-07 -3.37E-07 -3.27E-07 8.94E-09 -3.03E-07 -3.52E-07 -3.40E-07 9.90E-09 -3.13E-07 -3.67E-07 -3.60E-07 7.47E-09 -3.40E-07 -3.81E-07 -3.94E-07 6.22E-09 -3.77E-07 -4.11E-07 -3.16E-07 1.81E-08 -2.67E-07 -3.66E-07 -7.15E-07 PASS 7.15E-07 PASS -3.38E-07 1.91E-08 -2.86E-07 -3.91E-07 -8.15E-07 PASS 8.15E-07 PASS -3.58E-07 1.51E-08 -3.16E-07 -3.99E-07 -8.65E-07 PASS 8.65E-07 PASS -3.82E-07 1.57E-08 -3.39E-07 -4.25E-07 -9.15E-07 PASS 9.15E-07 PASS -4.18E-07 1.57E-08 -3.75E-07 -4.62E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DSCC Certified Company 57 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I BIAS - (A) @ +/-15V VCM=-15V B 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.26. Plot of I BIAS - (A) @ +/-15V VCM=-15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 58 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.26. Raw data for I BIAS - (A) @ +/-15V VCM=-15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS - (A) @ +/-15V VCM=-15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -3.03E-07 -3.18E-07 -3.07E-07 -3.21E-07 -3.07E-07 -3.05E-07 -3.19E-07 -3.02E-07 -3.33E-07 -2.95E-07 -3.29E-07 -3.24E-07 Total 20 -3.21E-07 -3.32E-07 -3.23E-07 -3.36E-07 -3.24E-07 -3.26E-07 -3.39E-07 -3.24E-07 -3.62E-07 -3.15E-07 -3.34E-07 -3.29E-07 Dose (krad(Si)) 50 100 -3.32E-07 -3.54E-07 -3.47E-07 -3.62E-07 -3.34E-07 -3.56E-07 -3.51E-07 -3.69E-07 -3.36E-07 -3.55E-07 -3.47E-07 -3.73E-07 -3.60E-07 -3.80E-07 -3.47E-07 -3.72E-07 -3.72E-07 -3.96E-07 -3.31E-07 -3.56E-07 -3.32E-07 -3.32E-07 -3.27E-07 -3.27E-07 200 -3.88E-07 -3.94E-07 -3.91E-07 -4.00E-07 -3.92E-07 -4.09E-07 -4.16E-07 -4.06E-07 -4.33E-07 -3.92E-07 -3.34E-07 -3.29E-07 -3.11E-07 7.72E-09 -2.90E-07 -3.32E-07 -3.27E-07 6.58E-09 -3.09E-07 -3.45E-07 -3.40E-07 8.29E-09 -3.17E-07 -3.63E-07 -3.59E-07 6.45E-09 -3.42E-07 -3.77E-07 -3.93E-07 4.69E-09 -3.80E-07 -4.06E-07 -3.11E-07 1.53E-08 -2.69E-07 -3.53E-07 -7.15E-07 PASS 7.15E-07 PASS -3.33E-07 1.83E-08 -2.83E-07 -3.84E-07 -8.15E-07 PASS 8.15E-07 PASS -3.52E-07 1.55E-08 -3.09E-07 -3.94E-07 -8.65E-07 PASS 8.65E-07 PASS -3.75E-07 1.46E-08 -3.35E-07 -4.15E-07 -9.15E-07 PASS 9.15E-07 PASS -4.11E-07 1.51E-08 -3.70E-07 -4.53E-07 -9.65E-07 PASS 9.65E-07 PASS An ISO 9001:2008 and DSCC Certified Company 59 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased +VOUT (V) IL=0MA @ +/-15V A 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.27. Plot of +VOUT (V) IL=0MA @ +/-15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 60 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.27. Raw data for +VOUT (V) IL=0MA @ +/-15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +VOUT (V) IL=0MA @ +/-15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 3.49E-03 3.30E-03 3.27E-03 3.09E-03 3.22E-03 3.37E-03 3.10E-03 3.37E-03 3.15E-03 3.37E-03 3.29E-03 3.22E-03 Total 20 3.74E-03 3.49E-03 3.41E-03 3.44E-03 3.32E-03 3.47E-03 3.26E-03 3.51E-03 3.39E-03 3.52E-03 3.46E-03 3.19E-03 Dose (krad(Si)) 50 100 4.11E-03 4.27E-03 3.59E-03 3.81E-03 3.71E-03 3.80E-03 3.52E-03 3.69E-03 3.56E-03 3.64E-03 3.64E-03 3.80E-03 3.49E-03 3.85E-03 3.71E-03 3.96E-03 3.47E-03 3.86E-03 3.66E-03 3.96E-03 3.26E-03 3.27E-03 3.22E-03 3.12E-03 200 4.44E-03 3.89E-03 3.95E-03 4.00E-03 3.83E-03 4.31E-03 4.09E-03 4.41E-03 4.07E-03 4.32E-03 3.19E-03 3.19E-03 3.27E-03 1.45E-04 3.67E-03 2.88E-03 3.48E-03 1.58E-04 3.91E-03 3.05E-03 3.70E-03 2.41E-04 4.36E-03 3.04E-03 3.84E-03 2.50E-04 4.53E-03 3.16E-03 4.02E-03 2.42E-04 4.69E-03 3.36E-03 3.27E-03 1.35E-04 3.64E-03 2.90E-03 1.00E-02 PASS 3.43E-03 1.08E-04 3.73E-03 3.13E-03 2.00E-02 PASS 3.59E-03 1.07E-04 3.89E-03 3.30E-03 2.00E-02 PASS 3.89E-03 7.13E-05 4.08E-03 3.69E-03 2.00E-02 PASS 4.24E-03 1.51E-04 4.65E-03 3.83E-03 2.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 61 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased +VOUT (V) IL=0MA @ +/-15V B 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.28. Plot of +VOUT (V) IL=0MA @ +/-15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 62 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.28. Raw data for +VOUT (V) IL=0MA @ +/-15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +VOUT (V) IL=0MA @ +/-15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 3.32E-03 3.29E-03 3.34E-03 3.37E-03 3.19E-03 3.41E-03 3.12E-03 3.27E-03 3.27E-03 3.34E-03 3.42E-03 3.24E-03 Total 20 3.52E-03 3.44E-03 3.46E-03 3.39E-03 3.32E-03 3.49E-03 3.42E-03 3.42E-03 3.41E-03 3.52E-03 3.34E-03 3.24E-03 Dose (krad(Si)) 50 100 3.68E-03 3.76E-03 3.78E-03 3.90E-03 3.63E-03 3.86E-03 3.56E-03 3.81E-03 3.51E-03 3.76E-03 3.64E-03 4.13E-03 3.44E-03 3.76E-03 3.61E-03 3.96E-03 3.52E-03 3.80E-03 3.68E-03 4.03E-03 3.41E-03 3.42E-03 3.19E-03 3.22E-03 200 3.93E-03 4.12E-03 4.04E-03 4.09E-03 3.97E-03 4.41E-03 4.07E-03 4.49E-03 4.27E-03 4.56E-03 3.25E-03 3.19E-03 3.30E-03 6.91E-05 3.49E-03 3.11E-03 3.43E-03 7.54E-05 3.63E-03 3.22E-03 3.63E-03 1.05E-04 3.92E-03 3.34E-03 3.82E-03 6.18E-05 3.99E-03 3.65E-03 4.03E-03 7.97E-05 4.25E-03 3.81E-03 3.28E-03 1.08E-04 3.58E-03 2.99E-03 1.00E-02 PASS 3.45E-03 4.97E-05 3.59E-03 3.32E-03 2.00E-02 PASS 3.58E-03 9.71E-05 3.84E-03 3.31E-03 2.00E-02 PASS 3.94E-03 1.55E-04 4.36E-03 3.51E-03 2.00E-02 PASS 4.36E-03 1.95E-04 4.89E-03 3.83E-03 2.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 63 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 1.60E-01 +VOUT (V) IL=1MA @ +/-15V A 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.29. Plot of +VOUT (V) IL=1MA @ +/-15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 64 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.29. Raw data for +VOUT (V) IL=1MA @ +/-15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +VOUT (V) IL=1MA @ +/-15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 7.09E-02 6.99E-02 7.05E-02 6.93E-02 6.92E-02 7.07E-02 6.78E-02 7.09E-02 6.87E-02 7.09E-02 7.01E-02 6.82E-02 Total 20 7.22E-02 7.14E-02 7.20E-02 7.07E-02 7.07E-02 7.10E-02 6.80E-02 7.13E-02 6.86E-02 7.09E-02 6.94E-02 6.78E-02 Dose (krad(Si)) 50 100 7.34E-02 7.41E-02 7.27E-02 7.33E-02 7.33E-02 7.40E-02 7.16E-02 7.26E-02 7.17E-02 7.27E-02 7.21E-02 7.29E-02 6.89E-02 7.04E-02 7.24E-02 7.36E-02 6.96E-02 7.09E-02 7.20E-02 7.34E-02 6.94E-02 6.97E-02 6.78E-02 6.76E-02 200 7.41E-02 7.32E-02 7.38E-02 7.29E-02 7.26E-02 7.42E-02 7.15E-02 7.47E-02 7.19E-02 7.46E-02 6.94E-02 6.74E-02 7.00E-02 7.41E-04 7.20E-02 6.79E-02 7.14E-02 6.85E-04 7.33E-02 6.95E-02 7.26E-02 8.52E-04 7.49E-02 7.02E-02 7.33E-02 6.95E-04 7.52E-02 7.14E-02 7.33E-02 6.47E-04 7.51E-02 7.16E-02 6.98E-02 1.44E-03 7.37E-02 6.59E-02 1.50E-01 PASS 7.00E-02 1.53E-03 7.41E-02 6.58E-02 1.50E-01 PASS 7.10E-02 1.60E-03 7.54E-02 6.66E-02 1.50E-01 PASS 7.22E-02 1.48E-03 7.63E-02 6.82E-02 1.50E-01 PASS 7.34E-02 1.55E-03 7.76E-02 6.91E-02 1.50E-01 PASS An ISO 9001:2008 and DSCC Certified Company 65 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 1.60E-01 +VOUT (V) IL=1MA @ +/-15V B 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.30. Plot of +VOUT (V) IL=1MA @ +/-15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 66 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.30. Raw data for +VOUT (V) IL=1MA @ +/-15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +VOUT (V) IL=1MA @ +/-15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 7.03E-02 7.02E-02 7.07E-02 6.96E-02 6.96E-02 7.06E-02 6.83E-02 7.09E-02 6.87E-02 7.08E-02 7.02E-02 6.83E-02 Total 20 7.16E-02 7.14E-02 7.22E-02 7.11E-02 7.07E-02 7.10E-02 6.80E-02 7.13E-02 6.85E-02 7.10E-02 6.94E-02 6.73E-02 Dose (krad(Si)) 50 100 7.29E-02 7.35E-02 7.29E-02 7.34E-02 7.33E-02 7.44E-02 7.23E-02 7.31E-02 7.19E-02 7.28E-02 7.19E-02 7.31E-02 6.92E-02 7.00E-02 7.26E-02 7.35E-02 6.96E-02 7.08E-02 7.22E-02 7.30E-02 6.94E-02 6.96E-02 6.79E-02 6.76E-02 200 7.35E-02 7.32E-02 7.44E-02 7.31E-02 7.28E-02 7.44E-02 7.16E-02 7.47E-02 7.18E-02 7.49E-02 6.94E-02 6.75E-02 7.01E-02 4.96E-04 7.15E-02 6.87E-02 7.14E-02 5.55E-04 7.29E-02 6.99E-02 7.27E-02 5.70E-04 7.42E-02 7.11E-02 7.34E-02 5.91E-04 7.50E-02 7.18E-02 7.34E-02 5.97E-04 7.50E-02 7.18E-02 6.99E-02 1.26E-03 7.33E-02 6.64E-02 1.50E-01 PASS 7.00E-02 1.57E-03 7.43E-02 6.57E-02 1.50E-01 PASS 7.11E-02 1.57E-03 7.54E-02 6.68E-02 1.50E-01 PASS 7.21E-02 1.56E-03 7.64E-02 6.78E-02 1.50E-01 PASS 7.35E-02 1.63E-03 7.79E-02 6.90E-02 1.50E-01 PASS An ISO 9001:2008 and DSCC Certified Company 67 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 9.00E-01 +VOUT (V) IL=10MA @ +/-15V A 8.00E-01 7.00E-01 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.31. Plot of +VOUT (V) IL=10MA @ +/-15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 68 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.31. Raw data for +VOUT (V) IL=10MA @ +/-15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +VOUT (V) IL=10MA @ +/-15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 3.64E-01 3.60E-01 3.63E-01 3.57E-01 3.56E-01 3.63E-01 3.49E-01 3.65E-01 3.53E-01 3.64E-01 3.59E-01 3.52E-01 Total 20 3.69E-01 3.66E-01 3.69E-01 3.62E-01 3.60E-01 3.65E-01 3.50E-01 3.67E-01 3.54E-01 3.65E-01 3.56E-01 3.49E-01 Dose (krad(Si)) 50 100 3.75E-01 3.80E-01 3.72E-01 3.78E-01 3.76E-01 3.82E-01 3.68E-01 3.74E-01 3.66E-01 3.71E-01 3.71E-01 3.79E-01 3.56E-01 3.62E-01 3.75E-01 3.83E-01 3.59E-01 3.65E-01 3.73E-01 3.81E-01 3.57E-01 3.57E-01 3.50E-01 3.50E-01 200 3.82E-01 3.79E-01 3.83E-01 3.77E-01 3.72E-01 3.92E-01 3.72E-01 3.97E-01 3.75E-01 3.96E-01 3.56E-01 3.49E-01 3.60E-01 3.71E-03 3.70E-01 3.50E-01 3.65E-01 3.97E-03 3.76E-01 3.54E-01 3.71E-01 4.37E-03 3.83E-01 3.59E-01 3.77E-01 4.57E-03 3.90E-01 3.64E-01 3.79E-01 4.32E-03 3.91E-01 3.67E-01 3.59E-01 7.26E-03 3.79E-01 3.39E-01 8.00E-01 PASS 3.60E-01 7.74E-03 3.82E-01 3.39E-01 8.00E-01 PASS 3.67E-01 8.59E-03 3.90E-01 3.43E-01 8.00E-01 PASS 3.74E-01 9.68E-03 4.01E-01 3.48E-01 8.00E-01 PASS 3.86E-01 1.19E-02 4.19E-01 3.54E-01 8.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 69 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 9.00E-01 +VOUT (V) IL=10MA @ +/-15V B 8.00E-01 7.00E-01 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.32. Plot of +VOUT (V) IL=10MA @ +/-15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 70 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.32. Raw data for +VOUT (V) IL=10MA @ +/-15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +VOUT (V) IL=10MA @ +/-15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 3.63E-01 3.61E-01 3.64E-01 3.58E-01 3.56E-01 3.63E-01 3.50E-01 3.65E-01 3.53E-01 3.64E-01 3.59E-01 3.51E-01 Total 20 3.66E-01 3.67E-01 3.70E-01 3.64E-01 3.60E-01 3.65E-01 3.51E-01 3.67E-01 3.53E-01 3.66E-01 3.56E-01 3.49E-01 Dose (krad(Si)) 50 100 3.72E-01 3.77E-01 3.73E-01 3.79E-01 3.77E-01 3.83E-01 3.70E-01 3.75E-01 3.66E-01 3.71E-01 3.71E-01 3.79E-01 3.56E-01 3.63E-01 3.74E-01 3.82E-01 3.58E-01 3.65E-01 3.73E-01 3.82E-01 3.57E-01 3.57E-01 3.49E-01 3.50E-01 200 3.79E-01 3.81E-01 3.84E-01 3.78E-01 3.73E-01 3.92E-01 3.73E-01 3.96E-01 3.75E-01 3.96E-01 3.57E-01 3.49E-01 3.60E-01 3.26E-03 3.69E-01 3.51E-01 3.65E-01 3.68E-03 3.75E-01 3.55E-01 3.72E-01 4.01E-03 3.83E-01 3.61E-01 3.77E-01 4.31E-03 3.89E-01 3.65E-01 3.79E-01 3.97E-03 3.90E-01 3.68E-01 3.59E-01 6.80E-03 3.78E-01 3.41E-01 8.00E-01 PASS 3.60E-01 7.66E-03 3.81E-01 3.39E-01 8.00E-01 PASS 3.67E-01 8.45E-03 3.90E-01 3.43E-01 8.00E-01 PASS 3.74E-01 9.44E-03 4.00E-01 3.48E-01 8.00E-01 PASS 3.86E-01 1.14E-02 4.17E-01 3.55E-01 8.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 71 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 7.00E-02 -VOUT (V) IL=0MA @ +/-15V A 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.33. Plot of -VOUT (V) IL=0MA @ +/-15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 72 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.33. Raw data for -VOUT (V) IL=0MA @ +/-15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -VOUT (V) IL=0MA @ +/-15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 1.89E-02 1.83E-02 1.85E-02 1.81E-02 1.90E-02 1.85E-02 1.90E-02 1.88E-02 1.82E-02 1.89E-02 1.81E-02 1.86E-02 Total 20 1.89E-02 1.86E-02 1.88E-02 1.83E-02 1.92E-02 1.85E-02 1.90E-02 1.88E-02 1.82E-02 1.87E-02 1.77E-02 1.84E-02 Dose (krad(Si)) 50 100 1.94E-02 1.98E-02 1.90E-02 1.95E-02 1.89E-02 1.94E-02 1.86E-02 1.92E-02 1.96E-02 2.00E-02 1.89E-02 1.95E-02 1.95E-02 2.00E-02 1.94E-02 1.98E-02 1.86E-02 1.92E-02 1.94E-02 1.98E-02 1.79E-02 1.80E-02 1.85E-02 1.84E-02 200 2.04E-02 2.00E-02 1.99E-02 1.96E-02 2.06E-02 2.01E-02 2.07E-02 2.04E-02 1.98E-02 2.06E-02 1.79E-02 1.84E-02 1.85E-02 3.71E-04 1.96E-02 1.75E-02 1.88E-02 3.52E-04 1.97E-02 1.78E-02 1.91E-02 3.82E-04 2.01E-02 1.80E-02 1.96E-02 3.29E-04 2.05E-02 1.87E-02 2.01E-02 4.03E-04 2.12E-02 1.90E-02 1.87E-02 3.34E-04 1.96E-02 1.78E-02 3.00E-02 PASS 1.86E-02 3.15E-04 1.95E-02 1.78E-02 6.00E-02 PASS 1.92E-02 4.03E-04 2.03E-02 1.80E-02 6.00E-02 PASS 1.96E-02 3.21E-04 2.05E-02 1.88E-02 6.00E-02 PASS 2.03E-02 3.67E-04 2.13E-02 1.93E-02 6.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 73 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 7.00E-02 -VOUT (V) IL=0MA @ +/-15V B 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.34. Plot of -VOUT (V) IL=0MA @ +/-15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 74 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.34. Raw data for -VOUT (V) IL=0MA @ +/-15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -VOUT (V) IL=0MA @ +/-15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 1.91E-02 1.91E-02 1.87E-02 1.87E-02 1.94E-02 1.88E-02 1.98E-02 1.87E-02 1.87E-02 1.93E-02 1.86E-02 1.92E-02 Total 20 1.92E-02 1.93E-02 1.90E-02 1.89E-02 1.96E-02 1.87E-02 1.95E-02 1.87E-02 1.86E-02 1.91E-02 1.82E-02 1.89E-02 Dose (krad(Si)) 50 100 1.96E-02 2.01E-02 1.98E-02 2.02E-02 1.95E-02 1.98E-02 1.95E-02 1.98E-02 1.99E-02 2.03E-02 1.93E-02 1.98E-02 1.99E-02 2.08E-02 1.93E-02 1.99E-02 1.89E-02 1.94E-02 1.96E-02 2.02E-02 1.84E-02 1.86E-02 1.88E-02 1.90E-02 200 2.05E-02 2.07E-02 2.03E-02 2.04E-02 2.05E-02 2.06E-02 2.10E-02 2.05E-02 2.02E-02 2.09E-02 1.86E-02 1.87E-02 1.90E-02 2.85E-04 1.98E-02 1.82E-02 1.92E-02 2.40E-04 1.99E-02 1.85E-02 1.96E-02 1.91E-04 2.02E-02 1.91E-02 2.00E-02 2.17E-04 2.06E-02 1.94E-02 2.05E-02 1.51E-04 2.09E-02 2.01E-02 1.91E-02 4.38E-04 2.03E-02 1.79E-02 3.00E-02 PASS 1.89E-02 3.75E-04 2.00E-02 1.79E-02 6.00E-02 PASS 1.94E-02 3.98E-04 2.05E-02 1.83E-02 6.00E-02 PASS 2.00E-02 5.09E-04 2.14E-02 1.86E-02 6.00E-02 PASS 2.06E-02 3.54E-04 2.16E-02 1.97E-02 6.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 75 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased -VOUT (V) IL=1MA @ +/-15V A 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.35. Plot of -VOUT (V) IL=1MA @ +/-15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 76 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.35. Raw data for -VOUT (V) IL=1MA @ +/-15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -VOUT (V) IL=1MA @ +/-15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 5.34E-02 5.26E-02 5.26E-02 5.25E-02 5.34E-02 5.28E-02 5.28E-02 5.31E-02 5.21E-02 5.34E-02 5.21E-02 5.29E-02 Total 20 5.35E-02 5.28E-02 5.29E-02 5.27E-02 5.35E-02 5.24E-02 5.25E-02 5.27E-02 5.17E-02 5.30E-02 5.13E-02 5.22E-02 Dose (krad(Si)) 50 100 5.40E-02 5.44E-02 5.35E-02 5.38E-02 5.33E-02 5.38E-02 5.32E-02 5.39E-02 5.40E-02 5.45E-02 5.34E-02 5.38E-02 5.31E-02 5.38E-02 5.35E-02 5.41E-02 5.23E-02 5.28E-02 5.35E-02 5.42E-02 5.16E-02 5.16E-02 5.25E-02 5.23E-02 200 5.53E-02 5.42E-02 5.44E-02 5.41E-02 5.48E-02 5.43E-02 5.42E-02 5.49E-02 5.35E-02 5.47E-02 5.15E-02 5.24E-02 5.29E-02 4.73E-04 5.42E-02 5.16E-02 5.31E-02 3.96E-04 5.42E-02 5.20E-02 5.36E-02 3.70E-04 5.46E-02 5.26E-02 5.41E-02 3.25E-04 5.50E-02 5.32E-02 5.45E-02 4.91E-04 5.59E-02 5.32E-02 5.29E-02 4.73E-04 5.41E-02 5.16E-02 1.00E-01 PASS 5.25E-02 4.95E-04 5.38E-02 5.11E-02 1.00E-01 PASS 5.31E-02 5.06E-04 5.45E-02 5.18E-02 1.00E-01 PASS 5.37E-02 5.36E-04 5.52E-02 5.23E-02 1.00E-01 PASS 5.43E-02 5.69E-04 5.59E-02 5.28E-02 1.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 77 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased -VOUT (V) IL=1MA @ +/-15V B 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.36. Plot of -VOUT (V) IL=1MA @ +/-15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 78 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.36. Raw data for -VOUT (V) IL=1MA @ +/-15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -VOUT (V) IL=1MA @ +/-15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 5.37E-02 5.36E-02 5.33E-02 5.33E-02 5.38E-02 5.35E-02 5.38E-02 5.36E-02 5.27E-02 5.42E-02 5.30E-02 5.36E-02 Total 20 5.38E-02 5.38E-02 5.35E-02 5.33E-02 5.39E-02 5.34E-02 5.34E-02 5.33E-02 5.23E-02 5.38E-02 5.25E-02 5.29E-02 Dose (krad(Si)) 50 100 5.45E-02 5.48E-02 5.42E-02 5.50E-02 5.40E-02 5.45E-02 5.39E-02 5.44E-02 5.43E-02 5.48E-02 5.37E-02 5.45E-02 5.38E-02 5.46E-02 5.37E-02 5.44E-02 5.28E-02 5.35E-02 5.43E-02 5.48E-02 5.26E-02 5.27E-02 5.32E-02 5.31E-02 200 5.54E-02 5.55E-02 5.50E-02 5.49E-02 5.49E-02 5.49E-02 5.51E-02 5.51E-02 5.38E-02 5.57E-02 5.24E-02 5.30E-02 5.35E-02 2.23E-04 5.41E-02 5.29E-02 5.37E-02 2.49E-04 5.43E-02 5.30E-02 5.42E-02 2.68E-04 5.49E-02 5.34E-02 5.47E-02 2.39E-04 5.54E-02 5.40E-02 5.52E-02 2.92E-04 5.60E-02 5.44E-02 5.35E-02 5.46E-04 5.50E-02 5.20E-02 1.00E-01 PASS 5.32E-02 5.71E-04 5.48E-02 5.17E-02 1.00E-01 PASS 5.36E-02 5.30E-04 5.51E-02 5.22E-02 1.00E-01 PASS 5.44E-02 5.14E-04 5.58E-02 5.30E-02 1.00E-01 PASS 5.49E-02 7.07E-04 5.68E-02 5.30E-02 1.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 79 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased -VOUT (V) IL=10MA @ +/-15V A 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.37. Plot of -VOUT (V) IL=10MA @ +/-15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 80 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.37. Raw data for -VOUT (V) IL=10MA @ +/-15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -VOUT (V) IL=10MA @ +/-15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 2.18E-01 2.15E-01 2.15E-01 2.16E-01 2.17E-01 2.17E-01 2.14E-01 2.17E-01 2.15E-01 2.16E-01 2.13E-01 2.16E-01 Total 20 2.17E-01 2.14E-01 2.15E-01 2.15E-01 2.16E-01 2.15E-01 2.12E-01 2.14E-01 2.13E-01 2.14E-01 2.11E-01 2.13E-01 Dose (krad(Si)) 50 100 2.18E-01 2.18E-01 2.15E-01 2.16E-01 2.15E-01 2.16E-01 2.16E-01 2.17E-01 2.16E-01 2.17E-01 2.16E-01 2.17E-01 2.13E-01 2.14E-01 2.16E-01 2.17E-01 2.14E-01 2.14E-01 2.15E-01 2.16E-01 2.12E-01 2.12E-01 2.14E-01 2.14E-01 200 2.19E-01 2.16E-01 2.16E-01 2.16E-01 2.18E-01 2.17E-01 2.14E-01 2.17E-01 2.14E-01 2.16E-01 2.11E-01 2.14E-01 2.16E-01 1.38E-03 2.20E-01 2.12E-01 2.15E-01 1.05E-03 2.18E-01 2.12E-01 2.16E-01 1.14E-03 2.19E-01 2.13E-01 2.17E-01 9.11E-04 2.19E-01 2.14E-01 2.17E-01 1.48E-03 2.21E-01 2.13E-01 2.16E-01 1.07E-03 2.19E-01 2.13E-01 5.00E-01 PASS 2.13E-01 1.17E-03 2.17E-01 2.10E-01 5.00E-01 PASS 2.15E-01 1.55E-03 2.19E-01 2.11E-01 5.00E-01 PASS 2.15E-01 1.39E-03 2.19E-01 2.12E-01 5.00E-01 PASS 2.15E-01 1.48E-03 2.20E-01 2.11E-01 5.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 81 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased -VOUT (V) IL=10MA @ +/-15V B 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.38. Plot of -VOUT (V) IL=10MA @ +/-15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 82 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.38. Raw data for -VOUT (V) IL=10MA @ +/-15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -VOUT (V) IL=10MA @ +/-15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 2.21E-01 2.19E-01 2.18E-01 2.18E-01 2.19E-01 2.19E-01 2.17E-01 2.19E-01 2.17E-01 2.19E-01 2.17E-01 2.18E-01 Total 20 2.19E-01 2.18E-01 2.17E-01 2.17E-01 2.18E-01 2.18E-01 2.15E-01 2.17E-01 2.14E-01 2.17E-01 2.15E-01 2.16E-01 Dose (krad(Si)) 50 100 2.21E-01 2.21E-01 2.18E-01 2.20E-01 2.18E-01 2.19E-01 2.18E-01 2.18E-01 2.19E-01 2.20E-01 2.19E-01 2.19E-01 2.16E-01 2.17E-01 2.19E-01 2.19E-01 2.16E-01 2.17E-01 2.18E-01 2.19E-01 2.15E-01 2.15E-01 2.17E-01 2.17E-01 200 2.21E-01 2.19E-01 2.19E-01 2.19E-01 2.19E-01 2.19E-01 2.17E-01 2.20E-01 2.17E-01 2.19E-01 2.14E-01 2.16E-01 2.19E-01 1.17E-03 2.22E-01 2.16E-01 2.18E-01 9.55E-04 2.20E-01 2.15E-01 2.19E-01 1.10E-03 2.22E-01 2.16E-01 2.20E-01 9.83E-04 2.22E-01 2.17E-01 2.20E-01 1.06E-03 2.23E-01 2.17E-01 2.18E-01 1.07E-03 2.21E-01 2.16E-01 5.00E-01 PASS 2.16E-01 1.51E-03 2.20E-01 2.12E-01 5.00E-01 PASS 2.18E-01 1.27E-03 2.21E-01 2.14E-01 5.00E-01 PASS 2.18E-01 1.28E-03 2.22E-01 2.15E-01 5.00E-01 PASS 2.18E-01 1.28E-03 2.22E-01 2.15E-01 5.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 83 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased AVOL (V/mV) RL=10K VO=+/-14.5V A 6.00E+03 5.00E+03 4.00E+03 3.00E+03 2.00E+03 1.00E+03 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.39. Plot of AVOL (V/mV) RL=10K VO=+/-14.5V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 84 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.39. Raw data for AVOL (V/mV) RL=10K VO=+/-14.5V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). AVOL (V/mV) RL=10K VO=+/-14.5V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 5.49E+03 5.02E+03 6.32E+03 4.50E+03 5.88E+03 5.50E+03 4.97E+03 5.45E+03 5.81E+03 5.03E+03 6.34E+03 4.93E+03 Total 20 4.89E+03 4.65E+03 6.09E+03 4.52E+03 5.57E+03 6.12E+03 5.10E+03 4.71E+03 4.77E+03 5.21E+03 6.02E+03 5.15E+03 Dose (krad(Si)) 50 100 4.39E+03 4.26E+03 4.72E+03 4.61E+03 5.60E+03 4.93E+03 4.01E+03 4.12E+03 5.02E+03 4.59E+03 5.42E+03 4.60E+03 4.87E+03 3.93E+03 4.63E+03 4.85E+03 4.61E+03 4.86E+03 5.41E+03 4.06E+03 6.36E+03 6.07E+03 4.91E+03 4.92E+03 200 4.18E+03 3.81E+03 5.14E+03 3.94E+03 4.82E+03 4.60E+03 3.62E+03 4.53E+03 4.54E+03 4.73E+03 6.96E+03 4.94E+03 5.44E+03 7.10E+02 7.39E+03 3.49E+03 5.15E+03 6.65E+02 6.97E+03 3.32E+03 4.75E+03 6.06E+02 6.41E+03 3.08E+03 4.50E+03 3.18E+02 5.37E+03 3.63E+03 4.38E+03 5.77E+02 5.96E+03 2.79E+03 5.35E+03 3.50E+02 6.31E+03 4.39E+03 1.00E+03 PASS 5.18E+03 5.65E+02 6.73E+03 3.63E+03 5.00E+02 PASS 4.99E+03 4.02E+02 6.09E+03 3.89E+03 5.00E+02 PASS 4.46E+03 4.38E+02 5.66E+03 3.26E+03 5.00E+02 PASS 4.40E+03 4.45E+02 5.62E+03 3.18E+03 5.00E+02 PASS An ISO 9001:2008 and DSCC Certified Company 85 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased AVOL (V/mV) RL=10K VO=+/-14.5V B 7.00E+03 6.00E+03 5.00E+03 4.00E+03 3.00E+03 2.00E+03 1.00E+03 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.40. Plot of AVOL (V/mV) RL=10K VO=+/-14.5V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 86 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.40. Raw data for AVOL (V/mV) RL=10K VO=+/-14.5V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). AVOL (V/mV) RL=10K VO=+/-14.5V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 5.69E+03 6.45E+03 6.03E+03 8.90E+03 5.90E+03 5.98E+03 4.98E+03 5.86E+03 5.88E+03 6.11E+03 6.29E+03 5.66E+03 Total 20 5.89E+03 5.98E+03 5.85E+03 5.64E+03 5.73E+03 5.57E+03 5.16E+03 4.99E+03 5.42E+03 5.75E+03 6.49E+03 5.71E+03 Dose (krad(Si)) 50 100 4.92E+03 5.41E+03 5.30E+03 5.15E+03 5.53E+03 5.05E+03 6.07E+03 7.21E+03 5.71E+03 5.40E+03 5.89E+03 5.26E+03 4.93E+03 4.27E+03 5.34E+03 5.31E+03 5.28E+03 5.53E+03 5.69E+03 5.63E+03 6.45E+03 6.20E+03 5.71E+03 5.97E+03 200 4.73E+03 4.95E+03 4.37E+03 4.75E+03 4.88E+03 4.97E+03 4.15E+03 5.31E+03 4.64E+03 4.93E+03 9.11E+03 5.78E+03 6.59E+03 1.32E+03 1.02E+04 2.97E+03 5.82E+03 1.33E+02 6.18E+03 5.45E+03 5.51E+03 4.30E+02 6.69E+03 4.33E+03 5.64E+03 8.91E+02 8.09E+03 3.20E+03 4.74E+03 2.27E+02 5.36E+03 4.11E+03 5.76E+03 4.50E+02 6.99E+03 4.53E+03 1.00E+03 PASS 5.38E+03 3.08E+02 6.22E+03 4.53E+03 5.00E+02 PASS 5.43E+03 3.73E+02 6.45E+03 4.40E+03 5.00E+02 PASS 5.20E+03 5.43E+02 6.69E+03 3.71E+03 5.00E+02 PASS 4.80E+03 4.36E+02 6.00E+03 3.60E+03 5.00E+02 PASS An ISO 9001:2008 and DSCC Certified Company 87 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased AVOL (V/mV) RL=2K VO=+/-10V A 2.50E+03 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.41. Plot of AVOL (V/mV) RL=2K VO=+/-10V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 88 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.41. Raw data for AVOL (V/mV) RL=2K VO=+/-10V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). AVOL (V/mV) RL=2K VO=+/-10V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 2.18E+03 2.06E+03 2.30E+03 2.03E+03 2.42E+03 2.36E+03 2.06E+03 2.36E+03 2.21E+03 2.23E+03 2.60E+03 2.05E+03 Total 20 2.05E+03 2.01E+03 2.10E+03 1.92E+03 2.24E+03 2.16E+03 1.99E+03 2.22E+03 2.32E+03 2.41E+03 2.46E+03 2.07E+03 Dose (krad(Si)) 50 100 1.89E+03 1.75E+03 1.93E+03 1.87E+03 2.00E+03 2.00E+03 1.89E+03 1.76E+03 2.20E+03 2.02E+03 2.09E+03 2.01E+03 1.95E+03 1.78E+03 1.98E+03 1.95E+03 2.22E+03 1.89E+03 1.95E+03 1.93E+03 2.66E+03 2.51E+03 2.05E+03 2.08E+03 200 1.69E+03 1.77E+03 1.75E+03 1.64E+03 1.86E+03 1.85E+03 1.62E+03 1.60E+03 1.74E+03 1.54E+03 2.54E+03 2.08E+03 2.20E+03 1.67E+02 2.65E+03 1.74E+03 2.06E+03 1.19E+02 2.39E+03 1.74E+03 1.98E+03 1.30E+02 2.34E+03 1.62E+03 1.88E+03 1.28E+02 2.23E+03 1.53E+03 1.74E+03 8.30E+01 1.97E+03 1.51E+03 2.24E+03 1.28E+02 2.59E+03 1.89E+03 5.00E+02 PASS 2.22E+03 1.63E+02 2.67E+03 1.77E+03 2.50E+02 PASS 2.04E+03 1.18E+02 2.36E+03 1.71E+03 2.50E+02 PASS 1.91E+03 8.29E+01 2.14E+03 1.68E+03 2.50E+02 PASS 1.67E+03 1.25E+02 2.01E+03 1.32E+03 2.50E+02 PASS An ISO 9001:2008 and DSCC Certified Company 89 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased AVOL (V/mV) RL=2K VO=+/-10V B 2.50E+03 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.42. Plot of AVOL (V/mV) RL=2K VO=+/-10V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 90 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.42. Raw data for AVOL (V/mV) RL=2K VO=+/-10V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). AVOL (V/mV) RL=2K VO=+/-10V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 2.12E+03 2.19E+03 2.22E+03 2.26E+03 2.30E+03 2.37E+03 1.90E+03 2.18E+03 2.22E+03 2.36E+03 2.38E+03 2.09E+03 Total 20 2.04E+03 2.08E+03 2.08E+03 2.25E+03 2.17E+03 2.10E+03 1.91E+03 2.18E+03 2.13E+03 2.21E+03 2.48E+03 2.13E+03 Dose (krad(Si)) 50 100 1.91E+03 1.84E+03 2.17E+03 1.85E+03 1.96E+03 1.88E+03 1.99E+03 2.03E+03 1.97E+03 2.00E+03 1.96E+03 1.97E+03 1.75E+03 1.65E+03 1.91E+03 1.94E+03 2.10E+03 2.00E+03 2.11E+03 1.97E+03 2.39E+03 2.43E+03 2.12E+03 2.09E+03 200 1.77E+03 1.72E+03 1.82E+03 1.71E+03 1.82E+03 1.82E+03 1.42E+03 1.61E+03 1.76E+03 1.68E+03 2.40E+03 2.10E+03 2.22E+03 6.86E+01 2.40E+03 2.03E+03 2.12E+03 8.53E+01 2.36E+03 1.89E+03 2.00E+03 1.00E+02 2.27E+03 1.73E+03 1.92E+03 8.91E+01 2.17E+03 1.68E+03 1.77E+03 5.14E+01 1.91E+03 1.62E+03 2.21E+03 1.90E+02 2.73E+03 1.69E+03 5.00E+02 PASS 2.11E+03 1.18E+02 2.43E+03 1.78E+03 2.50E+02 PASS 1.96E+03 1.50E+02 2.38E+03 1.55E+03 2.50E+02 PASS 1.91E+03 1.44E+02 2.30E+03 1.51E+03 2.50E+02 PASS 1.66E+03 1.53E+02 2.08E+03 1.24E+03 2.50E+02 PASS An ISO 9001:2008 and DSCC Certified Company 91 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased CMRR (dB) @ +/-15V VCM=+/-15V A 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.43. Plot of CMRR (dB) @ +/-15V VCM=+/-15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 92 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.43. Raw data for CMRR (dB) @ +/-15V VCM=+/-15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). CMRR (dB) @ +/-15V VCM=+/-15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 9.62E+01 1.02E+02 1.09E+02 1.02E+02 1.20E+02 1.12E+02 1.09E+02 1.06E+02 1.24E+02 1.02E+02 9.92E+01 1.08E+02 Total 20 9.63E+01 1.02E+02 1.09E+02 1.02E+02 1.20E+02 1.14E+02 1.08E+02 1.06E+02 1.29E+02 1.02E+02 9.92E+01 1.08E+02 Dose (krad(Si)) 50 100 9.62E+01 9.62E+01 1.02E+02 1.02E+02 1.08E+02 1.08E+02 1.02E+02 1.02E+02 1.21E+02 1.23E+02 1.16E+02 1.18E+02 1.08E+02 1.07E+02 1.06E+02 1.05E+02 1.38E+02 1.37E+02 1.02E+02 1.02E+02 9.93E+01 9.92E+01 1.08E+02 1.08E+02 200 9.60E+01 1.01E+02 1.07E+02 1.02E+02 1.33E+02 1.26E+02 1.07E+02 1.06E+02 1.48E+02 1.02E+02 9.92E+01 1.08E+02 1.06E+02 8.99E+00 1.30E+02 8.12E+01 1.06E+02 8.91E+00 1.30E+02 8.12E+01 1.06E+02 9.57E+00 1.32E+02 7.96E+01 1.06E+02 1.05E+01 1.35E+02 7.74E+01 1.08E+02 1.46E+01 1.48E+02 6.76E+01 1.11E+02 8.09E+00 1.33E+02 8.85E+01 9.00E+01 PASS 1.12E+02 1.05E+01 1.41E+02 8.31E+01 8.60E+01 PASS 1.14E+02 1.46E+01 1.54E+02 7.38E+01 8.60E+01 PASS 1.14E+02 1.45E+01 1.54E+02 7.43E+01 8.60E+01 PASS 1.18E+02 1.94E+01 1.71E+02 6.44E+01 8.60E+01 PASS An ISO 9001:2008 and DSCC Certified Company 93 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased CMRR (dB) @ +/-15V VCM=+/-15V B 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.44. Plot of CMRR (dB) @ +/-15V VCM=+/-15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 94 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.44. Raw data for CMRR (dB) @ +/-15V VCM=+/-15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). CMRR (dB) @ +/-15V VCM=+/-15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.00E+02 1.09E+02 1.11E+02 1.03E+02 9.83E+01 9.86E+01 1.15E+02 9.93E+01 1.08E+02 1.11E+02 1.13E+02 1.25E+02 Total 20 1.00E+02 1.08E+02 1.10E+02 1.04E+02 9.81E+01 9.85E+01 1.13E+02 9.92E+01 1.08E+02 1.09E+02 1.13E+02 1.24E+02 Dose (krad(Si)) 50 100 1.00E+02 9.99E+01 1.08E+02 1.07E+02 1.09E+02 1.08E+02 1.04E+02 1.05E+02 9.80E+01 9.79E+01 9.84E+01 9.83E+01 1.13E+02 1.12E+02 9.91E+01 9.91E+01 1.07E+02 1.07E+02 1.08E+02 1.07E+02 1.13E+02 1.13E+02 1.24E+02 1.24E+02 200 9.94E+01 1.07E+02 1.07E+02 1.06E+02 9.77E+01 9.84E+01 1.11E+02 9.91E+01 1.07E+02 1.06E+02 1.13E+02 1.23E+02 1.04E+02 5.43E+00 1.19E+02 8.94E+01 1.04E+02 5.01E+00 1.18E+02 9.04E+01 1.04E+02 4.78E+00 1.17E+02 9.07E+01 1.04E+02 4.63E+00 1.16E+02 9.10E+01 1.03E+02 4.47E+00 1.16E+02 9.11E+01 1.06E+02 7.24E+00 1.26E+02 8.65E+01 9.00E+01 PASS 1.06E+02 6.50E+00 1.23E+02 8.77E+01 8.60E+01 PASS 1.05E+02 6.15E+00 1.22E+02 8.82E+01 8.60E+01 PASS 1.05E+02 5.79E+00 1.21E+02 8.88E+01 8.60E+01 PASS 1.04E+02 5.36E+00 1.19E+02 8.96E+01 8.60E+01 PASS An ISO 9001:2008 and DSCC Certified Company 95 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 1.20E+02 CMRR (dB) MATCHING 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.45. Plot of CMRR (dB) MATCHING versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 96 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.45. Raw data for CMRR (dB) MATCHING versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). CMRR (dB) MATCHING Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.05E+02 1.07E+02 1.23E+02 9.67E+01 9.75E+01 9.69E+01 1.14E+02 1.04E+02 1.07E+02 1.06E+02 9.76E+01 1.09E+02 Total 20 1.05E+02 1.08E+02 1.26E+02 9.69E+01 9.74E+01 9.72E+01 1.15E+02 1.04E+02 1.07E+02 1.07E+02 9.76E+01 1.09E+02 Dose (krad(Si)) 50 100 1.05E+02 1.05E+02 1.08E+02 1.08E+02 1.30E+02 1.32E+02 9.70E+01 9.72E+01 9.75E+01 9.75E+01 9.73E+01 9.75E+01 1.15E+02 1.15E+02 1.05E+02 1.05E+02 1.07E+02 1.07E+02 1.08E+02 1.08E+02 9.77E+01 9.77E+01 1.09E+02 1.09E+02 200 1.06E+02 1.08E+02 1.37E+02 9.74E+01 9.75E+01 9.81E+01 1.15E+02 1.05E+02 1.07E+02 1.10E+02 9.77E+01 1.09E+02 1.06E+02 1.06E+01 1.35E+02 7.68E+01 1.07E+02 1.16E+01 1.38E+02 7.46E+01 1.07E+02 1.33E+01 1.44E+02 7.09E+01 1.08E+02 1.44E+01 1.48E+02 6.85E+01 1.09E+02 1.62E+01 1.53E+02 6.47E+01 1.06E+02 6.16E+00 1.23E+02 8.88E+01 8.40E+01 PASS 1.06E+02 6.35E+00 1.24E+02 8.88E+01 8.30E+01 PASS 1.06E+02 6.32E+00 1.24E+02 8.90E+01 8.30E+01 PASS 1.06E+02 6.28E+00 1.24E+02 8.92E+01 8.30E+01 PASS 1.07E+02 6.12E+00 1.24E+02 9.00E+01 8.30E+01 PASS An ISO 9001:2008 and DSCC Certified Company 97 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 1.40E+02 PSRR (dB) @ +/-2V TO +/-16V A 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.46. Plot of PSRR (dB) @ +/-2V TO +/-16V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 98 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.46. Raw data for PSRR (dB) @ +/-2V TO +/-16V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). PSRR (dB) @ +/-2V TO +/-16V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.26E+02 1.19E+02 1.17E+02 1.13E+02 1.03E+02 1.11E+02 1.08E+02 1.32E+02 1.18E+02 1.12E+02 1.07E+02 1.40E+02 Total 20 1.25E+02 1.19E+02 1.18E+02 1.13E+02 1.03E+02 1.11E+02 1.08E+02 1.36E+02 1.18E+02 1.12E+02 1.07E+02 1.43E+02 Dose (krad(Si)) 50 100 1.25E+02 1.28E+02 1.20E+02 1.18E+02 1.18E+02 1.17E+02 1.13E+02 1.14E+02 1.03E+02 1.03E+02 1.12E+02 1.12E+02 1.08E+02 1.08E+02 1.36E+02 1.37E+02 1.18E+02 1.18E+02 1.12E+02 1.12E+02 1.07E+02 1.07E+02 1.42E+02 1.42E+02 200 1.26E+02 1.18E+02 1.20E+02 1.15E+02 1.04E+02 1.12E+02 1.08E+02 1.41E+02 1.18E+02 1.12E+02 1.07E+02 1.42E+02 1.16E+02 8.51E+00 1.39E+02 9.22E+01 1.16E+02 8.26E+00 1.38E+02 9.31E+01 1.16E+02 8.31E+00 1.39E+02 9.31E+01 1.16E+02 8.88E+00 1.40E+02 9.17E+01 1.17E+02 8.14E+00 1.39E+02 9.43E+01 1.16E+02 9.69E+00 1.43E+02 8.96E+01 9.00E+01 PASS 1.17E+02 1.10E+01 1.47E+02 8.69E+01 9.00E+01 PASS 1.17E+02 1.11E+01 1.48E+02 8.66E+01 9.00E+01 PASS 1.17E+02 1.14E+01 1.49E+02 8.61E+01 9.00E+01 PASS 1.18E+02 1.32E+01 1.55E+02 8.21E+01 9.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 99 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased PSRR (dB) @ +/-2V TO +/-16V B 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.47. Plot of PSRR (dB) @ +/-2V TO +/-16V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 100 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.47. Raw data for PSRR (dB) @ +/-2V TO +/-16V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). PSRR (dB) @ +/-2V TO +/-16V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.17E+02 1.13E+02 1.04E+02 1.06E+02 1.23E+02 1.10E+02 1.25E+02 1.12E+02 1.18E+02 1.02E+02 1.08E+02 1.16E+02 Total 20 1.17E+02 1.13E+02 1.04E+02 1.06E+02 1.23E+02 1.11E+02 1.25E+02 1.13E+02 1.18E+02 1.03E+02 1.08E+02 1.16E+02 Dose (krad(Si)) 50 100 1.18E+02 1.17E+02 1.13E+02 1.13E+02 1.04E+02 1.04E+02 1.06E+02 1.06E+02 1.24E+02 1.23E+02 1.10E+02 1.11E+02 1.25E+02 1.25E+02 1.12E+02 1.12E+02 1.19E+02 1.18E+02 1.03E+02 1.03E+02 1.08E+02 1.08E+02 1.16E+02 1.16E+02 200 1.18E+02 1.14E+02 1.05E+02 1.07E+02 1.23E+02 1.11E+02 1.23E+02 1.12E+02 1.19E+02 1.03E+02 1.08E+02 1.16E+02 1.12E+02 7.76E+00 1.34E+02 9.11E+01 1.13E+02 7.89E+00 1.34E+02 9.11E+01 1.13E+02 8.07E+00 1.35E+02 9.09E+01 1.12E+02 7.60E+00 1.33E+02 9.17E+01 1.13E+02 7.35E+00 1.34E+02 9.33E+01 1.14E+02 8.64E+00 1.37E+02 9.01E+01 9.00E+01 PASS 1.14E+02 8.43E+00 1.37E+02 9.08E+01 9.00E+01 PASS 1.14E+02 8.42E+00 1.37E+02 9.08E+01 9.00E+01 PASS 1.14E+02 8.22E+00 1.36E+02 9.12E+01 9.00E+01 PASS 1.14E+02 7.78E+00 1.35E+02 9.24E+01 9.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 101 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 1.40E+02 PSRR (dB) MATCHING 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.48. Plot of PSRR (dB) MATCHING versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 102 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.48. Raw data for PSRR (dB) MATCHING versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). PSRR (dB) MATCHING Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.14E+02 1.18E+02 1.06E+02 1.03E+02 1.04E+02 1.32E+02 1.09E+02 1.13E+02 1.12E+02 1.06E+02 1.28E+02 1.17E+02 Total 20 1.14E+02 1.19E+02 1.06E+02 1.03E+02 1.04E+02 1.30E+02 1.09E+02 1.13E+02 1.12E+02 1.06E+02 1.28E+02 1.17E+02 Dose (krad(Si)) 50 100 1.15E+02 1.14E+02 1.19E+02 1.20E+02 1.06E+02 1.06E+02 1.03E+02 1.03E+02 1.04E+02 1.04E+02 1.29E+02 1.28E+02 1.09E+02 1.09E+02 1.13E+02 1.13E+02 1.12E+02 1.12E+02 1.06E+02 1.07E+02 1.28E+02 1.27E+02 1.17E+02 1.17E+02 200 1.15E+02 1.23E+02 1.07E+02 1.04E+02 1.05E+02 1.26E+02 1.10E+02 1.12E+02 1.12E+02 1.07E+02 1.28E+02 1.17E+02 1.09E+02 6.97E+00 1.28E+02 8.98E+01 1.09E+02 7.05E+00 1.29E+02 8.99E+01 1.09E+02 7.12E+00 1.29E+02 8.99E+01 1.10E+02 7.21E+00 1.29E+02 8.97E+01 1.11E+02 8.05E+00 1.33E+02 8.87E+01 1.14E+02 1.00E+01 1.42E+02 8.71E+01 8.30E+01 PASS 1.14E+02 9.40E+00 1.40E+02 8.86E+01 8.30E+01 PASS 1.14E+02 8.98E+00 1.39E+02 8.95E+01 8.30E+01 PASS 1.14E+02 8.13E+00 1.36E+02 9.14E+01 8.30E+01 PASS 1.13E+02 7.19E+00 1.33E+02 9.37E+01 8.30E+01 PASS An ISO 9001:2008 and DSCC Certified Company 103 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 0.00E+00 +ISC (A) VOUT=0V @ +/-15V A -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 -3.50E-02 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.49. Plot of +ISC (A) VOUT=0V @ +/-15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 104 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.49. Raw data for +ISC (A) VOUT=0V @ +/-15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +ISC (A) VOUT=0V @ +/-15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -3.36E-02 -3.27E-02 -3.31E-02 -3.27E-02 -3.34E-02 -3.36E-02 -3.26E-02 -3.35E-02 -3.37E-02 -3.21E-02 -3.24E-02 -3.32E-02 Total 20 -3.12E-02 -3.04E-02 -3.06E-02 -3.03E-02 -3.09E-02 -3.16E-02 -3.07E-02 -3.14E-02 -3.16E-02 -3.01E-02 -3.13E-02 -3.21E-02 Dose (krad(Si)) 50 100 -3.04E-02 -2.96E-02 -2.96E-02 -2.88E-02 -2.97E-02 -2.89E-02 -2.95E-02 -2.86E-02 -3.01E-02 -2.94E-02 -3.09E-02 -2.97E-02 -3.01E-02 -2.89E-02 -3.07E-02 -2.94E-02 -3.11E-02 -2.99E-02 -2.95E-02 -2.83E-02 -3.18E-02 -3.18E-02 -3.25E-02 -3.26E-02 200 -2.91E-02 -2.79E-02 -2.83E-02 -2.76E-02 -2.86E-02 -2.74E-02 -2.68E-02 -2.70E-02 -2.76E-02 -2.60E-02 -3.14E-02 -3.21E-02 -3.31E-02 4.20E-04 -3.19E-02 -3.43E-02 -3.07E-02 3.83E-04 -2.96E-02 -3.17E-02 -2.98E-02 3.70E-04 -2.88E-02 -3.09E-02 -2.91E-02 3.86E-04 -2.80E-02 -3.01E-02 -2.83E-02 5.64E-04 -2.67E-02 -2.98E-02 -3.31E-02 6.83E-04 -3.12E-02 -3.50E-02 -1.50E-02 PASS -3.11E-02 6.57E-04 -2.93E-02 -3.29E-02 -1.00E-02 PASS -3.05E-02 6.69E-04 -2.86E-02 -3.23E-02 -1.00E-02 PASS -2.92E-02 6.38E-04 -2.75E-02 -3.10E-02 -1.00E-02 PASS -2.69E-02 6.24E-04 -2.52E-02 -2.87E-02 -1.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 105 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 0.00E+00 +ISC (A) VOUT=0V @ +/-15V B -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 -3.50E-02 -4.00E-02 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.50. Plot of +ISC (A) VOUT=0V @ +/-15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 106 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.50. Raw data for +ISC (A) VOUT=0V @ +/-15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +ISC (A) VOUT=0V @ +/-15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -3.49E-02 -3.32E-02 -3.37E-02 -3.31E-02 -3.41E-02 -3.45E-02 -3.33E-02 -3.43E-02 -3.46E-02 -3.28E-02 -3.30E-02 -3.41E-02 Total 20 -3.25E-02 -3.09E-02 -3.11E-02 -3.06E-02 -3.15E-02 -3.25E-02 -3.14E-02 -3.22E-02 -3.24E-02 -3.08E-02 -3.19E-02 -3.30E-02 Dose (krad(Si)) 50 100 -3.16E-02 -3.07E-02 -3.01E-02 -2.93E-02 -3.03E-02 -2.95E-02 -2.98E-02 -2.90E-02 -3.07E-02 -2.99E-02 -3.18E-02 -3.04E-02 -3.07E-02 -2.96E-02 -3.15E-02 -3.01E-02 -3.19E-02 -3.06E-02 -3.01E-02 -2.89E-02 -3.24E-02 -3.24E-02 -3.34E-02 -3.35E-02 200 -3.02E-02 -2.84E-02 -2.88E-02 -2.80E-02 -2.91E-02 -2.81E-02 -2.73E-02 -2.77E-02 -2.83E-02 -2.65E-02 -3.20E-02 -3.30E-02 -3.38E-02 7.32E-04 -3.18E-02 -3.58E-02 -3.13E-02 7.10E-04 -2.94E-02 -3.33E-02 -3.05E-02 6.90E-04 -2.86E-02 -3.24E-02 -2.97E-02 6.85E-04 -2.78E-02 -3.16E-02 -2.89E-02 8.30E-04 -2.66E-02 -3.12E-02 -3.39E-02 7.71E-04 -3.18E-02 -3.60E-02 -1.50E-02 PASS -3.19E-02 7.39E-04 -2.98E-02 -3.39E-02 -1.00E-02 PASS -3.12E-02 7.48E-04 -2.91E-02 -3.32E-02 -1.00E-02 PASS -2.99E-02 7.16E-04 -2.79E-02 -3.19E-02 -1.00E-02 PASS -2.76E-02 6.92E-04 -2.57E-02 -2.95E-02 -1.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 107 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 6.00E-02 -ISC (A) VOUT=0V @ +/-15V A 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.51. Plot of -ISC (A) VOUT=0V @ +/-15V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 108 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.51. Raw data for -ISC (A) VOUT=0V @ +/-15V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -ISC (A) VOUT=0V @ +/-15V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 5.29E-02 5.40E-02 5.39E-02 5.28E-02 5.26E-02 5.33E-02 5.24E-02 5.35E-02 5.25E-02 5.32E-02 5.39E-02 5.23E-02 Total 20 5.38E-02 5.48E-02 5.48E-02 5.36E-02 5.36E-02 5.44E-02 5.36E-02 5.47E-02 5.38E-02 5.44E-02 5.54E-02 5.37E-02 Dose (krad(Si)) 50 100 5.31E-02 5.28E-02 5.41E-02 5.37E-02 5.41E-02 5.37E-02 5.29E-02 5.25E-02 5.30E-02 5.26E-02 5.37E-02 5.33E-02 5.29E-02 5.24E-02 5.38E-02 5.34E-02 5.30E-02 5.26E-02 5.35E-02 5.32E-02 5.48E-02 5.47E-02 5.32E-02 5.31E-02 200 5.32E-02 5.42E-02 5.41E-02 5.28E-02 5.31E-02 5.34E-02 5.26E-02 5.35E-02 5.27E-02 5.33E-02 5.53E-02 5.37E-02 5.33E-02 6.62E-04 5.51E-02 5.14E-02 5.41E-02 6.23E-04 5.58E-02 5.24E-02 5.34E-02 6.19E-04 5.51E-02 5.17E-02 5.31E-02 5.93E-04 5.47E-02 5.14E-02 5.35E-02 6.24E-04 5.52E-02 5.18E-02 5.30E-02 4.96E-04 5.43E-02 5.16E-02 1.50E-02 PASS 5.42E-02 4.39E-04 5.54E-02 5.30E-02 1.00E-02 PASS 5.34E-02 4.20E-04 5.45E-02 5.22E-02 1.00E-02 PASS 5.30E-02 4.37E-04 5.42E-02 5.18E-02 1.00E-02 PASS 5.31E-02 4.35E-04 5.43E-02 5.19E-02 1.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 109 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 6.00E-02 -ISC (A) VOUT=0V @ +/-15V B 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.52. Plot of -ISC (A) VOUT=0V @ +/-15V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 110 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.52. Raw data for -ISC (A) VOUT=0V @ +/-15V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -ISC (A) VOUT=0V @ +/-15V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 5.12E-02 5.22E-02 5.21E-02 5.07E-02 5.08E-02 5.16E-02 5.05E-02 5.17E-02 5.06E-02 5.11E-02 5.18E-02 5.05E-02 Total 20 5.21E-02 5.29E-02 5.29E-02 5.15E-02 5.17E-02 5.27E-02 5.16E-02 5.27E-02 5.18E-02 5.24E-02 5.32E-02 5.18E-02 Dose (krad(Si)) 50 100 5.14E-02 5.11E-02 5.23E-02 5.19E-02 5.22E-02 5.18E-02 5.08E-02 5.05E-02 5.11E-02 5.07E-02 5.19E-02 5.16E-02 5.08E-02 5.05E-02 5.19E-02 5.15E-02 5.10E-02 5.06E-02 5.15E-02 5.12E-02 5.27E-02 5.25E-02 5.13E-02 5.12E-02 200 5.14E-02 5.24E-02 5.22E-02 5.08E-02 5.12E-02 5.17E-02 5.06E-02 5.16E-02 5.07E-02 5.13E-02 5.31E-02 5.18E-02 5.14E-02 6.95E-04 5.33E-02 4.95E-02 5.22E-02 6.62E-04 5.40E-02 5.04E-02 5.16E-02 6.54E-04 5.33E-02 4.98E-02 5.12E-02 6.34E-04 5.29E-02 4.95E-02 5.16E-02 6.80E-04 5.35E-02 4.97E-02 5.11E-02 5.54E-04 5.26E-02 4.96E-02 1.50E-02 PASS 5.22E-02 5.09E-04 5.36E-02 5.09E-02 1.00E-02 PASS 5.14E-02 4.96E-04 5.28E-02 5.01E-02 1.00E-02 PASS 5.11E-02 5.03E-04 5.25E-02 4.97E-02 1.00E-02 PASS 5.12E-02 5.08E-04 5.26E-02 4.98E-02 1.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 111 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 5.00E-03 4.50E-03 4.00E-03 +ICC (A) @ +5V 3.50E-03 3.00E-03 2.50E-03 2.00E-03 1.50E-03 1.00E-03 5.00E-04 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.53. Plot of +ICC (A) @ +5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 112 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.53. Raw data for +ICC (A) @ +5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +ICC (A) @ +5V Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 3.57E-03 3.57E-03 3.55E-03 3.59E-03 3.55E-03 3.56E-03 3.60E-03 3.59E-03 3.68E-03 3.51E-03 3.61E-03 3.61E-03 Total 20 3.47E-03 3.48E-03 3.45E-03 3.49E-03 3.45E-03 3.49E-03 3.52E-03 3.50E-03 3.60E-03 3.43E-03 3.56E-03 3.57E-03 Dose (krad(Si)) 50 100 3.42E-03 3.38E-03 3.43E-03 3.40E-03 3.40E-03 3.37E-03 3.44E-03 3.40E-03 3.41E-03 3.37E-03 3.46E-03 3.41E-03 3.49E-03 3.45E-03 3.48E-03 3.42E-03 3.57E-03 3.52E-03 3.40E-03 3.35E-03 3.57E-03 3.58E-03 3.58E-03 3.59E-03 200 3.37E-03 3.35E-03 3.34E-03 3.35E-03 3.34E-03 3.31E-03 3.35E-03 3.32E-03 3.42E-03 3.25E-03 3.56E-03 3.57E-03 3.57E-03 1.67E-05 3.61E-03 3.52E-03 3.47E-03 1.79E-05 3.52E-03 3.42E-03 3.42E-03 1.58E-05 3.46E-03 3.38E-03 3.38E-03 1.52E-05 3.43E-03 3.34E-03 3.35E-03 1.22E-05 3.38E-03 3.32E-03 3.59E-03 6.22E-05 3.76E-03 3.42E-03 4.40E-03 PASS 3.51E-03 6.14E-05 3.68E-03 3.34E-03 4.40E-03 PASS 3.48E-03 6.12E-05 3.65E-03 3.31E-03 4.40E-03 PASS 3.43E-03 6.20E-05 3.60E-03 3.26E-03 4.40E-03 PASS 3.33E-03 6.20E-05 3.50E-03 3.16E-03 4.40E-03 PASS An ISO 9001:2008 and DSCC Certified Company 113 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 0.00E+00 -5.00E-04 -1.00E-03 -IEE (A) @ +5V -1.50E-03 -2.00E-03 -2.50E-03 -3.00E-03 -3.50E-03 -4.00E-03 -4.50E-03 -5.00E-03 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.54. Plot of -IEE (A) @ +5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 114 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.54. Raw data for -IEE (A) @ +5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -IEE (A) @ +5V Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -3.57E-03 -3.57E-03 -3.56E-03 -3.59E-03 -3.55E-03 -3.57E-03 -3.60E-03 -3.58E-03 -3.68E-03 -3.51E-03 -3.60E-03 -3.62E-03 Total 20 -3.47E-03 -3.48E-03 -3.45E-03 -3.49E-03 -3.44E-03 -3.49E-03 -3.52E-03 -3.51E-03 -3.60E-03 -3.43E-03 -3.56E-03 -3.57E-03 Dose (krad(Si)) 50 100 -3.42E-03 -3.38E-03 -3.43E-03 -3.40E-03 -3.40E-03 -3.37E-03 -3.45E-03 -3.40E-03 -3.40E-03 -3.37E-03 -3.46E-03 -3.41E-03 -3.49E-03 -3.44E-03 -3.48E-03 -3.42E-03 -3.57E-03 -3.52E-03 -3.40E-03 -3.35E-03 -3.57E-03 -3.58E-03 -3.58E-03 -3.59E-03 200 -3.37E-03 -3.35E-03 -3.34E-03 -3.35E-03 -3.34E-03 -3.31E-03 -3.35E-03 -3.32E-03 -3.42E-03 -3.25E-03 -3.56E-03 -3.57E-03 -3.57E-03 1.48E-05 -3.53E-03 -3.61E-03 -3.47E-03 2.07E-05 -3.41E-03 -3.52E-03 -3.42E-03 2.12E-05 -3.36E-03 -3.48E-03 -3.38E-03 1.52E-05 -3.34E-03 -3.43E-03 -3.35E-03 1.22E-05 -3.32E-03 -3.38E-03 -3.59E-03 6.14E-05 -3.42E-03 -3.76E-03 -4.40E-03 PASS -3.51E-03 6.12E-05 -3.34E-03 -3.68E-03 -4.40E-03 PASS -3.48E-03 6.12E-05 -3.31E-03 -3.65E-03 -4.40E-03 PASS -3.43E-03 6.14E-05 -3.26E-03 -3.60E-03 -4.40E-03 PASS -3.33E-03 6.20E-05 -3.16E-03 -3.50E-03 -4.40E-03 PASS An ISO 9001:2008 and DSCC Certified Company 115 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX V OFFSET (V) @ +5V VCM=0V A 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.55. Plot of V OFFSET (V) @ +5V VCM=0V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 116 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.55. Raw data for V OFFSET (V) @ +5V VCM=0V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). V OFFSET (V) @ +5V VCM=0V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -2.13E-04 -1.37E-04 3.53E-04 -3.48E-04 8.77E-05 2.52E-04 2.47E-04 2.85E-04 1.09E-04 8.81E-06 1.19E-05 1.62E-04 Total 20 -2.28E-04 -1.51E-04 3.26E-04 -3.60E-04 6.13E-05 2.16E-04 2.09E-04 2.51E-04 7.50E-05 -2.39E-05 -2.54E-06 1.57E-04 Dose (krad(Si)) 50 100 -2.25E-04 -2.22E-04 -1.45E-04 -1.45E-04 3.31E-04 3.37E-04 -3.47E-04 -3.33E-04 5.50E-05 5.38E-05 2.05E-04 1.96E-04 2.00E-04 1.89E-04 2.30E-04 2.22E-04 6.01E-05 5.48E-05 -3.94E-05 -5.12E-05 1.92E-06 2.89E-06 1.58E-04 1.59E-04 200 -2.17E-04 -1.46E-04 3.32E-04 -3.19E-04 5.14E-05 1.82E-04 1.83E-04 2.26E-04 5.71E-05 -5.98E-05 -1.00E-08 1.57E-04 -5.17E-05 2.76E-04 7.05E-04 -8.08E-04 -7.03E-05 2.69E-04 6.67E-04 -8.07E-04 -6.61E-05 2.66E-04 6.63E-04 -7.95E-04 -6.18E-05 2.64E-04 6.62E-04 -7.86E-04 -5.98E-05 2.58E-04 6.46E-04 -7.66E-04 1.80E-04 1.17E-04 5.02E-04 -1.42E-04 -8.00E-04 PASS 8.00E-04 PASS 1.45E-04 1.16E-04 4.63E-04 -1.72E-04 -9.50E-04 PASS 9.50E-04 PASS 1.31E-04 1.16E-04 4.50E-04 -1.88E-04 -9.50E-04 PASS 9.50E-04 PASS 1.22E-04 1.17E-04 4.43E-04 -1.98E-04 -9.50E-04 PASS 9.50E-04 PASS 1.18E-04 1.17E-04 4.40E-04 -2.05E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 117 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX V OFFSET (V) @ +5V VCM=0V B 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.56. Plot of V OFFSET (V) @ +5V VCM=0V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 118 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.56. Raw data for V OFFSET (V) @ +5V VCM=0V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). V OFFSET (V) @ +5V VCM=0V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -3.48E-05 4.18E-04 2.80E-04 3.12E-04 -2.15E-04 -2.51E-04 3.98E-06 -2.51E-04 -3.69E-05 2.59E-04 -6.77E-05 1.63E-04 Total 20 -5.73E-05 3.90E-04 2.49E-04 2.66E-04 -2.40E-04 -2.80E-04 -2.20E-05 -2.81E-04 -6.33E-05 2.08E-04 -7.88E-05 1.57E-04 Dose (krad(Si)) 50 100 -5.57E-05 -5.37E-05 3.95E-04 3.98E-04 2.44E-04 2.40E-04 2.64E-04 2.53E-04 -2.35E-04 -2.36E-04 -2.95E-04 -3.09E-04 -2.66E-05 -2.87E-05 -2.93E-04 -3.09E-04 -6.92E-05 -7.99E-05 1.87E-04 1.59E-04 -7.46E-05 -7.28E-05 1.59E-04 1.60E-04 200 -6.18E-05 3.94E-04 2.31E-04 2.45E-04 -2.39E-04 -3.17E-04 -1.80E-05 -3.08E-04 -8.38E-05 1.20E-04 -7.85E-05 1.58E-04 1.52E-04 2.66E-04 8.81E-04 -5.76E-04 1.22E-04 2.61E-04 8.37E-04 -5.94E-04 1.22E-04 2.59E-04 8.32E-04 -5.88E-04 1.20E-04 2.58E-04 8.28E-04 -5.87E-04 1.14E-04 2.57E-04 8.19E-04 -5.91E-04 -5.50E-05 2.12E-04 5.25E-04 -6.35E-04 -8.00E-04 PASS 8.00E-04 PASS -8.77E-05 2.04E-04 4.73E-04 -6.48E-04 -9.50E-04 PASS 9.50E-04 PASS -9.94E-05 2.02E-04 4.56E-04 -6.54E-04 -9.50E-04 PASS 9.50E-04 PASS -1.13E-04 1.99E-04 4.34E-04 -6.60E-04 -9.50E-04 PASS 9.50E-04 PASS -1.21E-04 1.89E-04 3.98E-04 -6.41E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 119 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I OFFSET (A) @ +5V VCM=0V A 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.57. Plot of I OFFSET (A) @ +5V VCM=0V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 120 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.57. Raw data for I OFFSET (A) @ +5V VCM=0V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I OFFSET (A) @ +5V VCM=0V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 3.18E-09 1.92E-09 4.12E-09 -5.44E-09 1.01E-10 -2.05E-10 -1.79E-09 3.49E-09 2.34E-09 4.34E-09 -2.88E-10 1.82E-09 Total 20 2.98E-09 1.91E-09 3.36E-09 -5.98E-09 -2.24E-10 -8.14E-10 -2.60E-09 3.28E-09 2.16E-09 4.81E-09 -3.13E-10 1.80E-09 Dose (krad(Si)) 50 100 2.95E-09 3.88E-09 1.69E-09 1.90E-09 4.60E-09 5.03E-09 -6.78E-09 -7.09E-09 -3.66E-10 -7.50E-11 -9.20E-11 -1.28E-09 -1.83E-09 -2.91E-09 2.11E-09 1.42E-09 1.55E-09 2.39E-09 4.50E-09 3.65E-09 -2.70E-10 -2.85E-10 1.80E-09 1.81E-09 200 3.18E-09 2.60E-09 5.81E-09 -6.84E-09 -2.54E-10 -3.42E-09 -7.32E-10 2.87E-09 1.20E-09 2.52E-09 -2.90E-10 1.85E-09 7.76E-10 3.79E-09 1.12E-08 -9.61E-09 4.09E-10 3.83E-09 1.09E-08 -1.01E-08 4.19E-10 4.41E-09 1.25E-08 -1.17E-08 7.28E-10 4.79E-09 1.39E-08 -1.24E-08 8.98E-10 4.83E-09 1.42E-08 -1.24E-08 1.63E-09 2.57E-09 8.67E-09 -5.41E-09 -6.50E-08 PASS 6.50E-08 PASS 1.37E-09 3.03E-09 9.67E-09 -6.93E-09 -6.50E-08 PASS 6.50E-08 PASS 1.25E-09 2.38E-09 7.78E-09 -5.28E-09 -6.50E-08 PASS 6.50E-08 PASS 6.54E-10 2.69E-09 8.04E-09 -6.73E-09 -6.50E-08 PASS 6.50E-08 PASS 4.87E-10 2.60E-09 7.62E-09 -6.65E-09 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2008 and DSCC Certified Company 121 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I OFFSET (A) @ +5V VCM=0V B 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.58. Plot of I OFFSET (A) @ +5V VCM=0V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 122 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.58. Raw data for I OFFSET (A) @ +5V VCM=0V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I OFFSET (A) @ +5V VCM=0V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 3.15E-09 3.79E-09 3.88E-09 -2.81E-10 -6.40E-11 -3.35E-09 7.67E-10 -5.93E-09 -3.91E-09 4.95E-10 -3.80E-09 5.11E-09 Total 20 3.23E-09 3.42E-09 3.13E-09 -1.17E-09 -2.80E-10 -3.46E-09 1.17E-09 -5.96E-09 -3.86E-09 -4.46E-10 -4.00E-09 5.20E-09 Dose (krad(Si)) 50 100 2.78E-09 2.15E-09 2.92E-09 2.20E-09 1.24E-09 1.47E-09 -1.96E-10 -5.18E-10 -5.09E-10 -9.22E-10 -2.72E-09 -2.20E-09 1.46E-09 1.16E-09 -5.90E-09 -4.16E-09 -4.02E-09 -5.00E-09 1.47E-10 -5.96E-10 -3.96E-09 -4.00E-09 5.13E-09 5.14E-09 200 2.51E-09 1.19E-09 -7.24E-10 -7.30E-11 -1.26E-09 -2.17E-09 1.99E-09 -4.05E-09 -4.16E-09 -7.38E-10 -3.99E-09 5.18E-09 2.10E-09 2.09E-09 7.83E-09 -3.64E-09 1.67E-09 2.21E-09 7.72E-09 -4.38E-09 1.25E-09 1.61E-09 5.65E-09 -3.16E-09 8.75E-10 1.49E-09 4.96E-09 -3.21E-09 3.29E-10 1.53E-09 4.51E-09 -3.86E-09 -2.39E-09 2.92E-09 5.61E-09 -1.04E-08 -6.50E-08 PASS 6.50E-08 PASS -2.51E-09 2.85E-09 5.30E-09 -1.03E-08 -6.50E-08 PASS 6.50E-08 PASS -2.21E-09 3.01E-09 6.04E-09 -1.04E-08 -6.50E-08 PASS 6.50E-08 PASS -2.16E-09 2.52E-09 4.76E-09 -9.08E-09 -6.50E-08 PASS 6.50E-08 PASS -1.83E-09 2.56E-09 5.20E-09 -8.85E-09 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2008 and DSCC Certified Company 123 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 I BIAS + (A) @ +5V VCM=0V A 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.59. Plot of I BIAS + (A) @ +5V VCM=0V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 124 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.59. Raw data for I BIAS + (A) @ +5V VCM=0V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS + (A) @ +5V VCM=0V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -3.02E-07 -3.22E-07 -3.08E-07 -3.32E-07 -3.11E-07 -3.11E-07 -3.22E-07 -3.11E-07 -3.48E-07 -3.07E-07 -3.37E-07 -3.24E-07 Total 20 -3.18E-07 -3.36E-07 -3.24E-07 -3.49E-07 -3.27E-07 -3.31E-07 -3.48E-07 -3.32E-07 -3.68E-07 -3.27E-07 -3.49E-07 -3.29E-07 Dose (krad(Si)) 50 100 -3.28E-07 -3.46E-07 -3.49E-07 -3.65E-07 -3.34E-07 -3.54E-07 -3.58E-07 -3.71E-07 -3.37E-07 -3.56E-07 -3.51E-07 -3.75E-07 -3.60E-07 -3.83E-07 -3.52E-07 -3.77E-07 -3.81E-07 -4.01E-07 -3.47E-07 -3.70E-07 -3.45E-07 -3.41E-07 -3.28E-07 -3.27E-07 200 -3.75E-07 -3.92E-07 -3.84E-07 -4.01E-07 -3.86E-07 -4.09E-07 -4.13E-07 -4.11E-07 -4.33E-07 -4.03E-07 -3.49E-07 -3.29E-07 -3.15E-07 1.18E-08 -2.83E-07 -3.47E-07 -3.31E-07 1.22E-08 -2.97E-07 -3.64E-07 -3.41E-07 1.24E-08 -3.07E-07 -3.75E-07 -3.59E-07 1.00E-08 -3.31E-07 -3.86E-07 -3.88E-07 9.99E-09 -3.60E-07 -4.15E-07 -3.20E-07 1.65E-08 -2.75E-07 -3.65E-07 -6.50E-07 PASS 6.50E-07 PASS -3.41E-07 1.68E-08 -2.95E-07 -3.87E-07 -7.50E-07 PASS 7.50E-07 PASS -3.58E-07 1.35E-08 -3.21E-07 -3.95E-07 -8.00E-07 PASS 8.00E-07 PASS -3.81E-07 1.23E-08 -3.47E-07 -4.15E-07 -8.50E-07 PASS 8.50E-07 PASS -4.14E-07 1.12E-08 -3.83E-07 -4.44E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DSCC Certified Company 125 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 I BIAS + (A) @ +5V VCM=0V B 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.60. Plot of I BIAS + (A) @ +5V VCM=0V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 126 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.60. Raw data for I BIAS + (A) @ +5V VCM=0V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS + (A) @ +5V VCM=0V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -3.02E-07 -3.20E-07 -3.10E-07 -3.26E-07 -3.11E-07 -3.14E-07 -3.24E-07 -3.17E-07 -3.39E-07 -3.02E-07 -3.37E-07 -3.23E-07 Total 20 -3.17E-07 -3.33E-07 -3.25E-07 -3.41E-07 -3.27E-07 -3.34E-07 -3.50E-07 -3.37E-07 -3.65E-07 -3.22E-07 -3.48E-07 -3.29E-07 Dose (krad(Si)) 50 100 -3.27E-07 -3.47E-07 -3.47E-07 -3.61E-07 -3.37E-07 -3.57E-07 -3.53E-07 -3.67E-07 -3.37E-07 -3.57E-07 -3.52E-07 -3.74E-07 -3.61E-07 -3.79E-07 -3.56E-07 -3.78E-07 -3.75E-07 -3.96E-07 -3.37E-07 -3.61E-07 -3.41E-07 -3.41E-07 -3.27E-07 -3.26E-07 200 -3.73E-07 -3.91E-07 -3.87E-07 -3.93E-07 -3.87E-07 -4.06E-07 -4.09E-07 -4.09E-07 -4.25E-07 -3.94E-07 -3.49E-07 -3.28E-07 -3.14E-07 9.45E-09 -2.88E-07 -3.40E-07 -3.29E-07 8.90E-09 -3.04E-07 -3.53E-07 -3.40E-07 1.02E-08 -3.12E-07 -3.68E-07 -3.58E-07 7.25E-09 -3.38E-07 -3.77E-07 -3.86E-07 7.78E-09 -3.64E-07 -4.07E-07 -3.19E-07 1.39E-08 -2.81E-07 -3.57E-07 -6.50E-07 PASS 6.50E-07 PASS -3.42E-07 1.66E-08 -2.96E-07 -3.87E-07 -7.50E-07 PASS 7.50E-07 PASS -3.56E-07 1.41E-08 -3.18E-07 -3.95E-07 -8.00E-07 PASS 8.00E-07 PASS -3.78E-07 1.23E-08 -3.44E-07 -4.11E-07 -8.50E-07 PASS 8.50E-07 PASS -4.09E-07 1.09E-08 -3.79E-07 -4.39E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DSCC Certified Company 127 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 I BIAS - (A) @ +5V VCM=0V A 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.61. Plot of I BIAS - (A) @ +5V VCM=0V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 128 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.61. Raw data for I BIAS - (A) @ +5V VCM=0V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS - (A) @ +5V VCM=0V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -3.06E-07 -3.24E-07 -3.13E-07 -3.27E-07 -3.12E-07 -3.11E-07 -3.21E-07 -3.15E-07 -3.51E-07 -3.12E-07 -3.38E-07 -3.26E-07 Total 20 -3.22E-07 -3.39E-07 -3.28E-07 -3.48E-07 -3.28E-07 -3.31E-07 -3.41E-07 -3.37E-07 -3.72E-07 -3.33E-07 -3.51E-07 -3.32E-07 Dose (krad(Si)) 50 100 -3.31E-07 -3.54E-07 -3.53E-07 -3.68E-07 -3.39E-07 -3.58E-07 -3.53E-07 -3.67E-07 -3.38E-07 -3.56E-07 -3.52E-07 -3.73E-07 -3.62E-07 -3.78E-07 -3.60E-07 -3.81E-07 -3.84E-07 -4.07E-07 -3.50E-07 -3.74E-07 -3.47E-07 -3.47E-07 -3.30E-07 -3.29E-07 200 -3.81E-07 -3.97E-07 -3.92E-07 -3.96E-07 -3.89E-07 -4.08E-07 -4.13E-07 -4.11E-07 -4.34E-07 -4.05E-07 -3.50E-07 -3.31E-07 -3.16E-07 9.05E-09 -2.92E-07 -3.41E-07 -3.33E-07 1.04E-08 -3.04E-07 -3.61E-07 -3.43E-07 9.68E-09 -3.16E-07 -3.69E-07 -3.60E-07 6.49E-09 -3.43E-07 -3.78E-07 -3.91E-07 6.48E-09 -3.73E-07 -4.09E-07 -3.22E-07 1.66E-08 -2.77E-07 -3.68E-07 -6.50E-07 PASS 6.50E-07 PASS -3.43E-07 1.70E-08 -2.96E-07 -3.89E-07 -7.50E-07 PASS 7.50E-07 PASS -3.62E-07 1.36E-08 -3.24E-07 -3.99E-07 -8.00E-07 PASS 8.00E-07 PASS -3.82E-07 1.39E-08 -3.44E-07 -4.21E-07 -8.50E-07 PASS 8.50E-07 PASS -4.14E-07 1.17E-08 -3.82E-07 -4.46E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DSCC Certified Company 129 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 I BIAS - (A) @ +5V VCM=0V B 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.62. Plot of I BIAS - (A) @ +5V VCM=0V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 130 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.62. Raw data for I BIAS - (A) @ +5V VCM=0V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS - (A) @ +5V VCM=0V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -3.06E-07 -3.25E-07 -3.14E-07 -3.26E-07 -3.11E-07 -3.11E-07 -3.26E-07 -3.11E-07 -3.36E-07 -3.03E-07 -3.34E-07 -3.29E-07 Total 20 -3.21E-07 -3.37E-07 -3.29E-07 -3.40E-07 -3.27E-07 -3.31E-07 -3.52E-07 -3.32E-07 -3.65E-07 -3.22E-07 -3.39E-07 -3.34E-07 Dose (krad(Si)) 50 100 -3.31E-07 -3.50E-07 -3.50E-07 -3.64E-07 -3.38E-07 -3.59E-07 -3.54E-07 -3.67E-07 -3.37E-07 -3.56E-07 -3.49E-07 -3.73E-07 -3.64E-07 -3.81E-07 -3.53E-07 -3.76E-07 -3.72E-07 -3.92E-07 -3.37E-07 -3.61E-07 -3.38E-07 -3.37E-07 -3.32E-07 -3.32E-07 200 -3.78E-07 -3.92E-07 -3.88E-07 -3.96E-07 -3.87E-07 -4.09E-07 -4.12E-07 -4.07E-07 -4.23E-07 -3.93E-07 -3.39E-07 -3.34E-07 -3.16E-07 8.88E-09 -2.92E-07 -3.41E-07 -3.31E-07 7.89E-09 -3.09E-07 -3.53E-07 -3.42E-07 9.57E-09 -3.16E-07 -3.68E-07 -3.59E-07 6.93E-09 -3.40E-07 -3.78E-07 -3.88E-07 6.86E-09 -3.69E-07 -4.07E-07 -3.18E-07 1.34E-08 -2.81E-07 -3.54E-07 -6.50E-07 PASS 6.50E-07 PASS -3.40E-07 1.75E-08 -2.92E-07 -3.88E-07 -7.50E-07 PASS 7.50E-07 PASS -3.55E-07 1.35E-08 -3.18E-07 -3.92E-07 -8.00E-07 PASS 8.00E-07 PASS -3.77E-07 1.14E-08 -3.45E-07 -4.08E-07 -8.50E-07 PASS 8.50E-07 PASS -4.09E-07 1.08E-08 -3.79E-07 -4.38E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DSCC Certified Company 131 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX V OFFSET (V) @ +5V VCM=5V A 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.63. Plot of V OFFSET (V) @ +5V VCM=5V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 132 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.63. Raw data for V OFFSET (V) @ +5V VCM=5V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). V OFFSET (V) @ +5V VCM=5V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 2.46E-04 7.81E-05 4.39E-04 -1.41E-04 3.15E-05 1.36E-04 3.22E-04 4.04E-04 6.30E-05 2.14E-04 3.16E-04 2.54E-04 Total 20 2.22E-04 6.60E-05 4.18E-04 -1.42E-04 4.34E-06 1.19E-04 2.93E-04 3.77E-04 3.97E-05 1.86E-04 3.04E-04 2.50E-04 Dose (krad(Si)) 50 100 2.27E-04 2.32E-04 7.31E-05 7.98E-05 4.27E-04 4.40E-04 -1.30E-04 -1.17E-04 6.99E-06 1.45E-05 1.20E-04 1.27E-04 2.92E-04 2.91E-04 3.63E-04 3.64E-04 3.23E-05 2.80E-05 1.82E-04 1.74E-04 3.08E-04 3.08E-04 2.50E-04 2.52E-04 200 2.40E-04 8.79E-05 4.46E-04 -9.98E-05 2.04E-05 1.38E-04 2.94E-04 3.66E-04 3.46E-05 1.68E-04 3.05E-04 2.50E-04 1.31E-04 2.21E-04 7.36E-04 -4.75E-04 1.14E-04 2.14E-04 7.02E-04 -4.74E-04 1.21E-04 2.14E-04 7.07E-04 -4.65E-04 1.30E-04 2.14E-04 7.17E-04 -4.57E-04 1.39E-04 2.11E-04 7.18E-04 -4.40E-04 2.28E-04 1.37E-04 6.05E-04 -1.49E-04 -8.00E-04 PASS 8.00E-04 PASS 2.03E-04 1.35E-04 5.72E-04 -1.66E-04 -9.50E-04 PASS 9.50E-04 PASS 1.98E-04 1.32E-04 5.60E-04 -1.64E-04 -9.50E-04 PASS 9.50E-04 PASS 1.97E-04 1.33E-04 5.61E-04 -1.68E-04 -9.50E-04 PASS 9.50E-04 PASS 2.00E-04 1.31E-04 5.59E-04 -1.59E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 133 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX V OFFSET (V) @ +5V VCM=5V B 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.64. Plot of V OFFSET (V) @ +5V VCM=5V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 134 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.64. Raw data for V OFFSET (V) @ +5V VCM=5V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). V OFFSET (V) @ +5V VCM=5V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 2.28E-04 4.99E-04 3.23E-04 7.24E-05 1.20E-04 7.87E-05 1.45E-05 5.07E-05 5.08E-05 2.96E-04 -1.76E-04 1.42E-04 Total 20 2.08E-04 4.75E-04 3.05E-04 4.88E-05 1.00E-04 5.44E-05 2.05E-06 2.56E-05 2.99E-05 2.67E-04 -1.81E-04 1.42E-04 Dose (krad(Si)) 50 100 2.13E-04 2.20E-04 4.83E-04 4.92E-04 3.12E-04 3.18E-04 5.38E-05 5.42E-05 1.11E-04 1.15E-04 4.53E-05 3.40E-05 1.08E-06 9.29E-06 1.68E-05 5.67E-06 3.03E-05 2.23E-05 2.59E-04 2.54E-04 -1.79E-04 -1.78E-04 1.42E-04 1.43E-04 200 2.26E-04 5.00E-04 3.26E-04 6.29E-05 1.23E-04 2.44E-05 3.04E-05 4.82E-06 2.40E-05 2.37E-04 -1.81E-04 1.41E-04 2.48E-04 1.70E-04 7.15E-04 -2.18E-04 2.27E-04 1.70E-04 6.93E-04 -2.39E-04 2.35E-04 1.70E-04 7.02E-04 -2.33E-04 2.40E-04 1.73E-04 7.15E-04 -2.36E-04 2.48E-04 1.73E-04 7.22E-04 -2.27E-04 9.81E-05 1.13E-04 4.08E-04 -2.11E-04 -8.00E-04 PASS 8.00E-04 PASS 7.57E-05 1.08E-04 3.73E-04 -2.21E-04 -9.50E-04 PASS 9.50E-04 PASS 7.05E-05 1.07E-04 3.63E-04 -2.22E-04 -9.50E-04 PASS 9.50E-04 PASS 6.51E-05 1.06E-04 3.56E-04 -2.26E-04 -9.50E-04 PASS 9.50E-04 PASS 6.41E-05 9.70E-05 3.30E-04 -2.02E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2008 and DSCC Certified Company 135 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I OFFSET (A) @ +5V VCM=5V A 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.65. Plot of I OFFSET (A) @ +5V VCM=5V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 136 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.65. Raw data for I OFFSET (A) @ +5V VCM=5V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I OFFSET (A) @ +5V VCM=5V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 6.61E-09 2.26E-09 9.94E-09 1.06E-09 -1.13E-08 6.73E-09 -2.75E-09 2.57E-09 -2.40E-11 1.37E-08 4.04E-10 1.98E-09 Total 20 6.59E-09 1.26E-09 9.45E-09 -9.34E-10 -1.41E-08 6.77E-09 -2.26E-09 1.56E-09 -6.84E-10 1.53E-08 2.45E-10 1.88E-09 Dose (krad(Si)) 50 100 8.17E-09 8.58E-09 1.04E-09 2.95E-09 1.16E-08 1.23E-08 -1.11E-09 -3.45E-09 -1.11E-08 -7.18E-09 7.42E-09 5.99E-09 -1.05E-09 -1.28E-09 9.33E-10 2.48E-09 -1.19E-09 -4.83E-09 1.49E-08 1.38E-08 2.94E-10 2.79E-10 1.88E-09 1.75E-09 200 7.64E-09 3.92E-09 1.42E-08 -1.29E-09 -7.58E-09 9.36E-09 1.10E-09 1.08E-09 -8.28E-09 9.99E-09 1.62E-10 1.85E-09 1.72E-09 8.07E-09 2.39E-08 -2.04E-08 4.47E-10 9.14E-09 2.55E-08 -2.46E-08 1.72E-09 8.81E-09 2.59E-08 -2.24E-08 2.65E-09 8.11E-09 2.49E-08 -1.96E-08 3.38E-09 8.32E-09 2.62E-08 -1.94E-08 4.03E-09 6.41E-09 2.16E-08 -1.35E-08 -6.50E-08 PASS 6.50E-08 PASS 4.14E-09 7.11E-09 2.36E-08 -1.54E-08 -6.50E-08 PASS 6.50E-08 PASS 4.20E-09 6.92E-09 2.32E-08 -1.48E-08 -6.50E-08 PASS 6.50E-08 PASS 3.24E-09 7.17E-09 2.29E-08 -1.64E-08 -6.50E-08 PASS 6.50E-08 PASS 2.65E-09 7.47E-09 2.31E-08 -1.78E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2008 and DSCC Certified Company 137 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX I OFFSET (A) @ +5V VCM=5V B 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.66. Plot of I OFFSET (A) @ +5V VCM=5V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 138 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.66. Raw data for I OFFSET (A) @ +5V VCM=5V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I OFFSET (A) @ +5V VCM=5V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 1.72E-09 8.16E-10 -1.53E-09 8.56E-10 1.13E-08 1.54E-08 1.55E-10 2.23E-09 7.10E-09 1.74E-08 -6.40E-11 2.67E-08 Total 20 4.99E-09 6.53E-10 -2.84E-09 -1.28E-10 1.13E-08 1.49E-08 -8.40E-11 1.85E-09 5.14E-09 1.94E-08 -1.10E-10 2.95E-08 Dose (krad(Si)) 50 100 6.93E-09 8.65E-09 -1.10E-11 8.41E-10 -3.11E-09 -4.27E-09 -9.43E-10 -2.05E-09 1.13E-08 8.42E-09 1.38E-08 1.50E-08 -5.80E-09 -2.47E-09 3.84E-10 1.64E-09 5.74E-09 5.00E-09 1.92E-08 2.04E-08 -7.70E-11 -1.55E-10 2.82E-08 2.80E-08 200 1.33E-08 7.42E-10 -4.79E-09 1.61E-09 1.23E-08 1.16E-08 -3.36E-09 3.27E-09 4.90E-09 2.11E-08 -1.00E-10 2.86E-08 2.63E-09 4.99E-09 1.63E-08 -1.10E-08 2.79E-09 5.52E-09 1.79E-08 -1.23E-08 2.83E-09 6.04E-09 1.94E-08 -1.37E-08 2.32E-09 5.96E-09 1.87E-08 -1.40E-08 4.62E-09 7.84E-09 2.61E-08 -1.69E-08 8.47E-09 7.73E-09 2.97E-08 -1.27E-08 -6.50E-08 PASS 6.50E-08 PASS 8.24E-09 8.49E-09 3.15E-08 -1.50E-08 -6.50E-08 PASS 6.50E-08 PASS 6.67E-09 1.01E-08 3.42E-08 -2.09E-08 -6.50E-08 PASS 6.50E-08 PASS 7.91E-09 9.51E-09 3.40E-08 -1.82E-08 -6.50E-08 PASS 6.50E-08 PASS 7.50E-09 9.28E-09 3.29E-08 -1.79E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2008 and DSCC Certified Company 139 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 I BIAS + (A) @ +5V VCM=5V A 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.67. Plot of I BIAS + (A) @ +5V VCM=5V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 140 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.67. Raw data for I BIAS + (A) @ +5V VCM=5V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS + (A) @ +5V VCM=5V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 4.08E-07 4.28E-07 4.24E-07 4.36E-07 4.11E-07 4.19E-07 4.28E-07 4.15E-07 4.56E-07 4.20E-07 4.25E-07 4.34E-07 Total 20 4.66E-07 4.82E-07 4.91E-07 4.96E-07 4.67E-07 4.92E-07 4.98E-07 4.95E-07 5.27E-07 4.96E-07 4.26E-07 4.37E-07 Dose (krad(Si)) 50 100 5.34E-07 6.13E-07 5.54E-07 6.28E-07 5.67E-07 6.50E-07 5.63E-07 6.43E-07 5.33E-07 6.02E-07 5.73E-07 6.50E-07 5.77E-07 6.50E-07 5.79E-07 6.55E-07 6.06E-07 6.84E-07 5.79E-07 6.45E-07 4.27E-07 4.29E-07 4.38E-07 4.34E-07 4.21E-07 1.18E-08 4.54E-07 3.89E-07 4.80E-07 1.34E-08 5.17E-07 4.44E-07 5.50E-07 1.61E-08 5.94E-07 5.06E-07 6.27E-07 1.98E-08 6.82E-07 5.73E-07 7.27E-07 2.18E-08 7.86E-07 6.67E-07 4.28E-07 1.66E-08 4.73E-07 3.82E-07 -6.50E-07 PASS 6.50E-07 PASS 5.02E-07 1.46E-08 5.42E-07 4.62E-07 -7.50E-07 PASS 7.50E-07 PASS 5.83E-07 1.31E-08 6.19E-07 5.47E-07 -8.00E-07 PASS 8.00E-07 PASS 6.57E-07 1.58E-08 7.00E-07 6.13E-07 -8.50E-07 PASS 8.50E-07 PASS 7.45E-07 1.70E-08 7.91E-07 6.98E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DSCC Certified Company 141 200 7.07E-07 7.26E-07 7.52E-07 7.45E-07 7.03E-07 7.40E-07 7.39E-07 7.37E-07 7.75E-07 7.32E-07 4.27E-07 4.36E-07 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 I BIAS + (A) @ +5V VCM=5V B 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.68. Plot of I BIAS + (A) @ +5V VCM=5V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 142 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.68. Raw data for I BIAS + (A) @ +5V VCM=5V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS + (A) @ +5V VCM=5V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 4.05E-07 4.08E-07 4.15E-07 4.40E-07 4.17E-07 4.24E-07 4.35E-07 4.27E-07 4.59E-07 4.23E-07 4.25E-07 4.65E-07 Total 20 4.66E-07 4.64E-07 4.77E-07 5.01E-07 4.75E-07 4.95E-07 5.08E-07 5.04E-07 5.31E-07 4.97E-07 4.27E-07 4.69E-07 Dose (krad(Si)) 50 100 5.32E-07 6.12E-07 5.37E-07 6.06E-07 5.56E-07 6.35E-07 5.70E-07 6.45E-07 5.38E-07 6.10E-07 5.76E-07 6.52E-07 5.83E-07 6.59E-07 5.87E-07 6.65E-07 6.10E-07 6.86E-07 5.77E-07 6.48E-07 4.27E-07 4.24E-07 4.70E-07 4.68E-07 4.17E-07 1.35E-08 4.54E-07 3.80E-07 4.77E-07 1.47E-08 5.17E-07 4.36E-07 5.46E-07 1.58E-08 5.90E-07 5.03E-07 6.22E-07 1.72E-08 6.69E-07 5.74E-07 7.22E-07 2.00E-08 7.77E-07 6.67E-07 4.34E-07 1.49E-08 4.74E-07 3.93E-07 -6.50E-07 PASS 6.50E-07 PASS 5.07E-07 1.45E-08 5.47E-07 4.67E-07 -7.50E-07 PASS 7.50E-07 PASS 5.87E-07 1.40E-08 6.25E-07 5.48E-07 -8.00E-07 PASS 8.00E-07 PASS 6.62E-07 1.50E-08 7.03E-07 6.21E-07 -8.50E-07 PASS 8.50E-07 PASS 7.49E-07 1.94E-08 8.02E-07 6.96E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DSCC Certified Company 143 200 7.09E-07 7.05E-07 7.39E-07 7.48E-07 7.08E-07 7.38E-07 7.43E-07 7.51E-07 7.82E-07 7.33E-07 4.26E-07 4.70E-07 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 I BIAS - (A) @ +5V VCM=5V A 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.69. Plot of I BIAS - (A) @ +5V VCM=5V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 144 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.69. Raw data for I BIAS - (A) @ +5V VCM=5V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS - (A) @ +5V VCM=5V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 4.01E-07 4.24E-07 4.16E-07 4.34E-07 4.21E-07 4.11E-07 4.30E-07 4.14E-07 4.54E-07 4.07E-07 4.24E-07 4.31E-07 Total 20 4.56E-07 4.81E-07 4.80E-07 4.93E-07 4.80E-07 4.84E-07 4.97E-07 4.92E-07 5.27E-07 4.78E-07 4.26E-07 4.35E-07 Dose (krad(Si)) 50 100 5.26E-07 6.04E-07 5.51E-07 6.25E-07 5.55E-07 6.36E-07 5.64E-07 6.43E-07 5.44E-07 6.10E-07 5.66E-07 6.45E-07 5.77E-07 6.50E-07 5.75E-07 6.49E-07 6.07E-07 6.88E-07 5.63E-07 6.32E-07 4.28E-07 4.26E-07 4.35E-07 4.34E-07 4.19E-07 1.18E-08 4.51E-07 3.87E-07 4.78E-07 1.33E-08 5.14E-07 4.41E-07 5.48E-07 1.43E-08 5.87E-07 5.09E-07 6.24E-07 1.63E-08 6.68E-07 5.79E-07 7.22E-07 1.89E-08 7.74E-07 6.71E-07 4.23E-07 1.91E-08 4.76E-07 3.71E-07 -6.50E-07 PASS 6.50E-07 PASS 4.96E-07 1.93E-08 5.48E-07 4.43E-07 -7.50E-07 PASS 7.50E-07 PASS 5.78E-07 1.73E-08 6.25E-07 5.30E-07 -8.00E-07 PASS 8.00E-07 PASS 6.53E-07 2.10E-08 7.11E-07 5.95E-07 -8.50E-07 PASS 8.50E-07 PASS 7.41E-07 2.18E-08 8.00E-07 6.81E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DSCC Certified Company 145 200 7.01E-07 7.21E-07 7.37E-07 7.46E-07 7.08E-07 7.29E-07 7.37E-07 7.37E-07 7.78E-07 7.22E-07 4.27E-07 4.35E-07 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 I BIAS - (A) @ +5V VCM=5V B 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.70. Plot of I BIAS - (A) @ +5V VCM=5V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 146 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.70. Raw data for I BIAS - (A) @ +5V VCM=5V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). I BIAS - (A) @ +5V VCM=5V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 4.03E-07 4.08E-07 4.16E-07 4.36E-07 4.05E-07 4.07E-07 4.39E-07 4.24E-07 4.51E-07 4.05E-07 4.23E-07 4.38E-07 Total 20 4.58E-07 4.62E-07 4.81E-07 5.01E-07 4.62E-07 4.79E-07 5.05E-07 5.03E-07 5.24E-07 4.76E-07 4.27E-07 4.39E-07 Dose (krad(Si)) 50 100 5.25E-07 6.02E-07 5.34E-07 6.07E-07 5.58E-07 6.39E-07 5.70E-07 6.44E-07 5.28E-07 5.96E-07 5.59E-07 6.36E-07 5.87E-07 6.59E-07 5.85E-07 6.62E-07 6.03E-07 6.80E-07 5.57E-07 6.27E-07 4.27E-07 4.25E-07 4.40E-07 4.40E-07 4.14E-07 1.34E-08 4.50E-07 3.77E-07 4.73E-07 1.80E-08 5.22E-07 4.23E-07 5.43E-07 1.98E-08 5.97E-07 4.89E-07 6.18E-07 2.22E-08 6.79E-07 5.57E-07 7.14E-07 2.61E-08 7.86E-07 6.43E-07 4.25E-07 1.99E-08 4.80E-07 3.71E-07 -6.50E-07 PASS 6.50E-07 PASS 4.98E-07 2.00E-08 5.52E-07 4.43E-07 -7.50E-07 PASS 7.50E-07 PASS 5.78E-07 1.99E-08 6.33E-07 5.24E-07 -8.00E-07 PASS 8.00E-07 PASS 6.53E-07 2.16E-08 7.12E-07 5.94E-07 -8.50E-07 PASS 8.50E-07 PASS 7.40E-07 2.32E-08 8.04E-07 6.77E-07 -9.00E-07 PASS 9.00E-07 PASS An ISO 9001:2008 and DSCC Certified Company 147 200 6.94E-07 7.02E-07 7.41E-07 7.44E-07 6.91E-07 7.22E-07 7.45E-07 7.48E-07 7.73E-07 7.14E-07 4.27E-07 4.39E-07 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased +VOUT (V) IL=0MA @ +5V A 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.71. Plot of +VOUT (V) IL=0MA @ +5V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 148 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.71. Raw data for +VOUT (V) IL=0MA @ +5V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +VOUT (V) IL=0MA @ +5V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 1.87E-03 1.79E-03 1.99E-03 2.07E-03 1.92E-03 2.01E-03 1.82E-03 1.89E-03 2.02E-03 2.04E-03 1.89E-03 2.06E-03 Total 20 2.04E-03 2.03E-03 1.99E-03 2.21E-03 1.82E-03 2.11E-03 2.08E-03 2.08E-03 1.98E-03 2.03E-03 1.94E-03 1.93E-03 Dose (krad(Si)) 50 100 2.11E-03 2.36E-03 2.08E-03 2.41E-03 2.11E-03 2.36E-03 2.03E-03 2.30E-03 1.91E-03 2.33E-03 2.26E-03 2.57E-03 2.25E-03 2.40E-03 2.09E-03 2.52E-03 2.04E-03 2.58E-03 2.26E-03 2.50E-03 1.91E-03 2.04E-03 2.06E-03 2.13E-03 200 2.43E-03 2.52E-03 2.45E-03 2.64E-03 2.44E-03 2.81E-03 2.69E-03 2.71E-03 2.84E-03 2.91E-03 1.97E-03 1.92E-03 1.93E-03 1.08E-04 2.22E-03 1.63E-03 2.02E-03 1.39E-04 2.40E-03 1.64E-03 2.05E-03 8.38E-05 2.28E-03 1.82E-03 2.35E-03 4.09E-05 2.46E-03 2.24E-03 2.50E-03 8.79E-05 2.74E-03 2.25E-03 1.96E-03 9.61E-05 2.22E-03 1.69E-03 1.00E-02 PASS 2.06E-03 5.13E-05 2.20E-03 1.92E-03 2.00E-02 PASS 2.18E-03 1.07E-04 2.47E-03 1.89E-03 2.00E-02 PASS 2.51E-03 7.20E-05 2.71E-03 2.32E-03 2.00E-02 PASS 2.79E-03 9.18E-05 3.04E-03 2.54E-03 2.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 149 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased +VOUT (V) IL=0MA @ +5V B 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.72. Plot of +VOUT (V) IL=0MA @ +5V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 150 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.72. Raw data for +VOUT (V) IL=0MA @ +5V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +VOUT (V) IL=0MA @ +5V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 2.01E-03 1.99E-03 2.04E-03 1.99E-03 2.02E-03 2.19E-03 2.06E-03 1.91E-03 1.89E-03 1.96E-03 2.01E-03 1.94E-03 Total 20 2.01E-03 1.93E-03 2.03E-03 2.18E-03 2.01E-03 2.08E-03 1.86E-03 2.08E-03 1.96E-03 2.04E-03 1.93E-03 1.93E-03 Dose (krad(Si)) 50 100 2.03E-03 2.36E-03 2.06E-03 2.25E-03 2.14E-03 2.41E-03 2.21E-03 2.33E-03 2.08E-03 2.40E-03 2.25E-03 2.57E-03 2.16E-03 2.45E-03 2.18E-03 2.43E-03 2.35E-03 2.55E-03 2.21E-03 2.58E-03 1.93E-03 2.09E-03 2.01E-03 2.15E-03 200 2.58E-03 2.34E-03 2.56E-03 2.64E-03 2.35E-03 2.84E-03 2.71E-03 2.86E-03 3.04E-03 2.93E-03 1.95E-03 1.93E-03 2.01E-03 2.12E-05 2.07E-03 1.95E-03 2.03E-03 9.12E-05 2.28E-03 1.78E-03 2.10E-03 7.16E-05 2.30E-03 1.91E-03 2.35E-03 6.44E-05 2.53E-03 2.17E-03 2.49E-03 1.39E-04 2.88E-03 2.11E-03 2.00E-03 1.24E-04 2.34E-03 1.66E-03 1.00E-02 PASS 2.00E-03 9.42E-05 2.26E-03 1.75E-03 2.00E-02 PASS 2.23E-03 7.52E-05 2.44E-03 2.02E-03 2.00E-02 PASS 2.52E-03 7.06E-05 2.71E-03 2.32E-03 2.00E-02 PASS 2.88E-03 1.21E-04 3.21E-03 2.54E-03 2.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 151 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 1.60E-01 +VOUT (V) IL=1MA @ +5V A 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.73. Plot of +VOUT (V) IL=1MA @ +5V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 152 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.73. Raw data for +VOUT (V) IL=1MA @ +5V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +VOUT (V) IL=1MA @ +5V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 6.89E-02 6.83E-02 6.88E-02 6.75E-02 6.78E-02 6.92E-02 6.65E-02 6.90E-02 6.71E-02 6.89E-02 6.88E-02 6.67E-02 Total 20 7.07E-02 6.95E-02 7.04E-02 6.91E-02 6.92E-02 6.96E-02 6.63E-02 6.93E-02 6.74E-02 6.92E-02 6.80E-02 6.61E-02 Dose (krad(Si)) 50 100 7.18E-02 7.28E-02 7.09E-02 7.24E-02 7.19E-02 7.30E-02 7.07E-02 7.16E-02 7.06E-02 7.15E-02 7.08E-02 7.20E-02 6.77E-02 6.87E-02 7.09E-02 7.18E-02 6.82E-02 6.95E-02 7.01E-02 7.15E-02 6.82E-02 6.85E-02 6.64E-02 6.63E-02 200 7.33E-02 7.24E-02 7.31E-02 7.21E-02 7.17E-02 7.33E-02 7.04E-02 7.34E-02 7.11E-02 7.33E-02 6.78E-02 6.63E-02 6.82E-02 6.03E-04 6.99E-02 6.66E-02 6.98E-02 7.15E-04 7.17E-02 6.78E-02 7.12E-02 6.24E-04 7.29E-02 6.95E-02 7.22E-02 6.69E-04 7.41E-02 7.04E-02 7.25E-02 6.66E-04 7.43E-02 7.07E-02 6.81E-02 1.23E-03 7.15E-02 6.47E-02 1.50E-01 PASS 6.83E-02 1.44E-03 7.23E-02 6.44E-02 1.50E-01 PASS 6.95E-02 1.49E-03 7.36E-02 6.55E-02 1.50E-01 PASS 7.07E-02 1.51E-03 7.48E-02 6.66E-02 1.50E-01 PASS 7.23E-02 1.41E-03 7.61E-02 6.84E-02 1.50E-01 PASS An ISO 9001:2008 and DSCC Certified Company 153 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 1.60E-01 +VOUT (V) IL=1MA @ +5V B 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.74. Plot of +VOUT (V) IL=1MA @ +5V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 154 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.74. Raw data for +VOUT (V) IL=1MA @ +5V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +VOUT (V) IL=1MA @ +5V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 6.87E-02 6.85E-02 6.86E-02 6.80E-02 6.79E-02 6.87E-02 6.63E-02 6.90E-02 6.70E-02 6.89E-02 6.85E-02 6.67E-02 Total 20 7.05E-02 6.99E-02 7.06E-02 6.95E-02 6.91E-02 6.90E-02 6.66E-02 6.94E-02 6.70E-02 6.91E-02 6.78E-02 6.58E-02 Dose (krad(Si)) 50 100 7.18E-02 7.28E-02 7.11E-02 7.24E-02 7.21E-02 7.33E-02 7.11E-02 7.22E-02 7.06E-02 7.18E-02 7.01E-02 7.16E-02 6.76E-02 6.89E-02 7.07E-02 7.17E-02 6.83E-02 6.95E-02 7.05E-02 7.16E-02 6.79E-02 6.80E-02 6.61E-02 6.61E-02 200 7.33E-02 7.26E-02 7.34E-02 7.27E-02 7.20E-02 7.31E-02 7.02E-02 7.33E-02 7.11E-02 7.32E-02 6.80E-02 6.60E-02 6.83E-02 3.69E-04 6.94E-02 6.73E-02 6.99E-02 6.68E-04 7.17E-02 6.81E-02 7.14E-02 5.96E-04 7.30E-02 6.97E-02 7.25E-02 5.64E-04 7.40E-02 7.09E-02 7.28E-02 5.76E-04 7.44E-02 7.12E-02 6.80E-02 1.28E-03 7.15E-02 6.45E-02 1.50E-01 PASS 6.82E-02 1.33E-03 7.19E-02 6.46E-02 1.50E-01 PASS 6.94E-02 1.38E-03 7.32E-02 6.56E-02 1.50E-01 PASS 7.07E-02 1.33E-03 7.43E-02 6.70E-02 1.50E-01 PASS 7.22E-02 1.43E-03 7.61E-02 6.82E-02 1.50E-01 PASS An ISO 9001:2008 and DSCC Certified Company 155 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased +VOUT (V) IL=2.5MA @ +5V A 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.75. Plot of +VOUT (V) IL=2.5MA @ +5V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 156 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.75. Raw data for +VOUT (V) IL=2.5MA @ +5V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +VOUT (V) IL=2.5MA @ +5V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 1.25E-01 1.23E-01 1.24E-01 1.23E-01 1.23E-01 1.25E-01 1.20E-01 1.25E-01 1.22E-01 1.24E-01 1.24E-01 1.21E-01 Total 20 1.26E-01 1.24E-01 1.26E-01 1.24E-01 1.24E-01 1.24E-01 1.20E-01 1.25E-01 1.21E-01 1.24E-01 1.22E-01 1.20E-01 Dose (krad(Si)) 50 100 1.28E-01 1.29E-01 1.26E-01 1.28E-01 1.27E-01 1.29E-01 1.25E-01 1.27E-01 1.25E-01 1.27E-01 1.26E-01 1.28E-01 1.21E-01 1.23E-01 1.26E-01 1.28E-01 1.23E-01 1.24E-01 1.26E-01 1.27E-01 1.23E-01 1.23E-01 1.20E-01 1.20E-01 200 1.29E-01 1.28E-01 1.29E-01 1.28E-01 1.27E-01 1.29E-01 1.25E-01 1.29E-01 1.26E-01 1.29E-01 1.22E-01 1.20E-01 1.23E-01 9.56E-04 1.26E-01 1.21E-01 1.25E-01 9.89E-04 1.27E-01 1.22E-01 1.26E-01 1.11E-03 1.29E-01 1.23E-01 1.28E-01 1.05E-03 1.31E-01 1.25E-01 1.28E-01 1.03E-03 1.31E-01 1.25E-01 1.23E-01 1.96E-03 1.29E-01 1.18E-01 2.50E-01 PASS 1.23E-01 2.05E-03 1.28E-01 1.17E-01 2.50E-01 PASS 1.24E-01 2.19E-03 1.30E-01 1.18E-01 2.50E-01 PASS 1.26E-01 2.14E-03 1.32E-01 1.20E-01 2.50E-01 PASS 1.28E-01 2.17E-03 1.34E-01 1.22E-01 2.50E-01 PASS An ISO 9001:2008 and DSCC Certified Company 157 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased +VOUT (V) IL=2.5MA @ +5V B 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.76. Plot of +VOUT (V) IL=2.5MA @ +5V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 158 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.76. Raw data for +VOUT (V) IL=2.5MA @ +5V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +VOUT (V) IL=2.5MA @ +5V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 1.25E-01 1.23E-01 1.24E-01 1.23E-01 1.23E-01 1.25E-01 1.21E-01 1.25E-01 1.22E-01 1.24E-01 1.24E-01 1.21E-01 Total 20 1.26E-01 1.25E-01 1.26E-01 1.24E-01 1.23E-01 1.24E-01 1.20E-01 1.24E-01 1.21E-01 1.24E-01 1.22E-01 1.20E-01 Dose (krad(Si)) 50 100 1.27E-01 1.29E-01 1.26E-01 1.28E-01 1.27E-01 1.29E-01 1.26E-01 1.27E-01 1.25E-01 1.27E-01 1.26E-01 1.28E-01 1.22E-01 1.23E-01 1.26E-01 1.27E-01 1.23E-01 1.24E-01 1.26E-01 1.27E-01 1.22E-01 1.22E-01 1.20E-01 1.20E-01 200 1.29E-01 1.28E-01 1.29E-01 1.28E-01 1.27E-01 1.29E-01 1.25E-01 1.29E-01 1.26E-01 1.29E-01 1.22E-01 1.20E-01 1.24E-01 8.58E-04 1.26E-01 1.21E-01 1.25E-01 9.89E-04 1.27E-01 1.22E-01 1.26E-01 8.93E-04 1.29E-01 1.24E-01 1.28E-01 9.34E-04 1.31E-01 1.25E-01 1.28E-01 9.37E-04 1.31E-01 1.26E-01 1.23E-01 1.83E-03 1.28E-01 1.18E-01 2.50E-01 PASS 1.23E-01 1.93E-03 1.28E-01 1.17E-01 2.50E-01 PASS 1.24E-01 2.03E-03 1.30E-01 1.19E-01 2.50E-01 PASS 1.26E-01 2.01E-03 1.31E-01 1.20E-01 2.50E-01 PASS 1.28E-01 2.09E-03 1.33E-01 1.22E-01 2.50E-01 PASS An ISO 9001:2008 and DSCC Certified Company 159 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 7.00E-02 -VOUT (V) IL=0MA @ +5V A 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.77. Plot of -VOUT (V) IL=0MA @ +5V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 160 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.77. Raw data for -VOUT (V) IL=0MA @ +5V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -VOUT (V) IL=0MA @ +5V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 1.51E-02 1.48E-02 1.48E-02 1.50E-02 1.53E-02 1.49E-02 1.51E-02 1.50E-02 1.50E-02 1.52E-02 1.49E-02 1.50E-02 Total 20 1.53E-02 1.50E-02 1.49E-02 1.50E-02 1.53E-02 1.48E-02 1.52E-02 1.50E-02 1.49E-02 1.50E-02 1.47E-02 1.47E-02 Dose (krad(Si)) 50 100 1.56E-02 1.53E-02 1.54E-02 1.53E-02 1.51E-02 1.53E-02 1.55E-02 1.55E-02 1.56E-02 1.56E-02 1.54E-02 1.59E-02 1.55E-02 1.61E-02 1.56E-02 1.61E-02 1.54E-02 1.59E-02 1.56E-02 1.60E-02 1.46E-02 1.46E-02 1.48E-02 1.50E-02 200 1.65E-02 1.60E-02 1.62E-02 1.63E-02 1.63E-02 1.64E-02 1.67E-02 1.67E-02 1.63E-02 1.68E-02 1.45E-02 1.49E-02 1.50E-02 2.18E-04 1.56E-02 1.44E-02 1.51E-02 1.79E-04 1.56E-02 1.46E-02 1.54E-02 1.86E-04 1.59E-02 1.49E-02 1.54E-02 1.32E-04 1.57E-02 1.50E-02 1.63E-02 1.85E-04 1.68E-02 1.58E-02 1.50E-02 1.07E-04 1.53E-02 1.47E-02 3.00E-02 PASS 1.50E-02 1.30E-04 1.53E-02 1.46E-02 6.00E-02 PASS 1.55E-02 9.31E-05 1.57E-02 1.52E-02 6.00E-02 PASS 1.60E-02 1.04E-04 1.63E-02 1.57E-02 6.00E-02 PASS 1.66E-02 2.01E-04 1.71E-02 1.60E-02 6.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 161 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 7.00E-02 -VOUT (V) IL=0MA @ +5V B 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.78. Plot of -VOUT (V) IL=0MA @ +5V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 162 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.78. Raw data for -VOUT (V) IL=0MA @ +5V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -VOUT (V) IL=0MA @ +5V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 1.54E-02 1.55E-02 1.51E-02 1.53E-02 1.57E-02 1.52E-02 1.57E-02 1.50E-02 1.54E-02 1.53E-02 1.55E-02 1.55E-02 Total 20 1.56E-02 1.56E-02 1.53E-02 1.54E-02 1.57E-02 1.52E-02 1.56E-02 1.52E-02 1.52E-02 1.54E-02 1.50E-02 1.50E-02 Dose (krad(Si)) 50 100 1.60E-02 1.56E-02 1.59E-02 1.57E-02 1.57E-02 1.55E-02 1.58E-02 1.58E-02 1.60E-02 1.59E-02 1.56E-02 1.60E-02 1.61E-02 1.66E-02 1.55E-02 1.62E-02 1.56E-02 1.63E-02 1.59E-02 1.63E-02 1.50E-02 1.51E-02 1.52E-02 1.53E-02 200 1.67E-02 1.67E-02 1.65E-02 1.67E-02 1.66E-02 1.68E-02 1.72E-02 1.68E-02 1.69E-02 1.71E-02 1.50E-02 1.52E-02 1.54E-02 2.42E-04 1.61E-02 1.47E-02 1.55E-02 1.80E-04 1.60E-02 1.50E-02 1.58E-02 1.29E-04 1.62E-02 1.55E-02 1.57E-02 1.68E-04 1.62E-02 1.52E-02 1.66E-02 1.01E-04 1.69E-02 1.63E-02 1.53E-02 2.70E-04 1.61E-02 1.46E-02 3.00E-02 PASS 1.53E-02 1.73E-04 1.58E-02 1.48E-02 6.00E-02 PASS 1.57E-02 2.54E-04 1.64E-02 1.50E-02 6.00E-02 PASS 1.63E-02 2.14E-04 1.69E-02 1.57E-02 6.00E-02 PASS 1.70E-02 1.75E-04 1.74E-02 1.65E-02 6.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 163 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 1.20E-01 -VOUT (V) IL=1MA @ +5V A 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.79. Plot of -VOUT (V) IL=1MA @ +5V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 164 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.79. Raw data for -VOUT (V) IL=1MA @ +5V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -VOUT (V) IL=1MA @ +5V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 3.47E-02 3.43E-02 3.42E-02 3.44E-02 3.50E-02 3.46E-02 3.46E-02 3.45E-02 3.42E-02 3.47E-02 3.43E-02 3.44E-02 Total 20 3.50E-02 3.45E-02 3.44E-02 3.47E-02 3.51E-02 3.44E-02 3.44E-02 3.45E-02 3.41E-02 3.46E-02 3.38E-02 3.41E-02 Dose (krad(Si)) 50 100 3.55E-02 3.55E-02 3.50E-02 3.53E-02 3.51E-02 3.52E-02 3.52E-02 3.53E-02 3.55E-02 3.57E-02 3.49E-02 3.55E-02 3.49E-02 3.56E-02 3.52E-02 3.56E-02 3.47E-02 3.51E-02 3.50E-02 3.57E-02 3.39E-02 3.38E-02 3.43E-02 3.42E-02 200 3.68E-02 3.60E-02 3.63E-02 3.62E-02 3.65E-02 3.62E-02 3.63E-02 3.63E-02 3.59E-02 3.66E-02 3.38E-02 3.41E-02 3.45E-02 3.31E-04 3.54E-02 3.36E-02 3.47E-02 2.93E-04 3.55E-02 3.39E-02 3.52E-02 2.34E-04 3.59E-02 3.46E-02 3.54E-02 2.06E-04 3.60E-02 3.48E-02 3.64E-02 2.95E-04 3.72E-02 3.56E-02 3.45E-02 1.78E-04 3.50E-02 3.40E-02 1.00E-01 PASS 3.44E-02 1.98E-04 3.50E-02 3.39E-02 1.00E-01 PASS 3.50E-02 1.81E-04 3.55E-02 3.45E-02 1.00E-01 PASS 3.55E-02 2.35E-04 3.61E-02 3.49E-02 1.00E-01 PASS 3.63E-02 2.78E-04 3.70E-02 3.55E-02 1.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 165 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 1.20E-01 -VOUT (V) IL=1MA @ +5V B 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.80. Plot of -VOUT (V) IL=1MA @ +5V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 166 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.80. Raw data for -VOUT (V) IL=1MA @ +5V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -VOUT (V) IL=1MA @ +5V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 3.53E-02 3.50E-02 3.48E-02 3.49E-02 3.51E-02 3.49E-02 3.51E-02 3.48E-02 3.45E-02 3.52E-02 3.48E-02 3.49E-02 Total 20 3.54E-02 3.51E-02 3.51E-02 3.49E-02 3.52E-02 3.47E-02 3.50E-02 3.47E-02 3.43E-02 3.51E-02 3.43E-02 3.46E-02 Dose (krad(Si)) 50 100 3.58E-02 3.59E-02 3.58E-02 3.58E-02 3.54E-02 3.55E-02 3.55E-02 3.59E-02 3.58E-02 3.59E-02 3.54E-02 3.60E-02 3.55E-02 3.63E-02 3.52E-02 3.60E-02 3.49E-02 3.56E-02 3.57E-02 3.63E-02 3.46E-02 3.45E-02 3.48E-02 3.49E-02 200 3.69E-02 3.70E-02 3.69E-02 3.67E-02 3.68E-02 3.67E-02 3.68E-02 3.67E-02 3.63E-02 3.71E-02 3.44E-02 3.44E-02 3.50E-02 1.90E-04 3.55E-02 3.45E-02 3.51E-02 1.66E-04 3.56E-02 3.47E-02 3.57E-02 2.02E-04 3.62E-02 3.51E-02 3.58E-02 1.70E-04 3.63E-02 3.53E-02 3.69E-02 1.07E-04 3.71E-02 3.66E-02 3.49E-02 2.90E-04 3.57E-02 3.41E-02 1.00E-01 PASS 3.48E-02 2.95E-04 3.56E-02 3.40E-02 1.00E-01 PASS 3.53E-02 3.05E-04 3.62E-02 3.45E-02 1.00E-01 PASS 3.60E-02 3.08E-04 3.69E-02 3.52E-02 1.00E-01 PASS 3.67E-02 2.97E-04 3.75E-02 3.59E-02 1.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 167 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased -VOUT (V) IL=2.5MA @ +5V A 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.81. Plot of -VOUT (V) IL=2.5MA @ +5V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 168 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.81. Raw data for -VOUT (V) IL=2.5MA @ +5V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -VOUT (V) IL=2.5MA @ +5V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 7.52E-02 7.46E-02 7.44E-02 7.47E-02 7.55E-02 7.48E-02 7.45E-02 7.47E-02 7.43E-02 7.50E-02 7.41E-02 7.48E-02 Total 20 7.51E-02 7.46E-02 7.43E-02 7.47E-02 7.51E-02 7.43E-02 7.39E-02 7.44E-02 7.36E-02 7.44E-02 7.33E-02 7.39E-02 Dose (krad(Si)) 50 100 7.58E-02 7.62E-02 7.50E-02 7.56E-02 7.51E-02 7.57E-02 7.56E-02 7.58E-02 7.60E-02 7.64E-02 7.51E-02 7.58E-02 7.46E-02 7.55E-02 7.50E-02 7.58E-02 7.43E-02 7.49E-02 7.52E-02 7.59E-02 7.35E-02 7.35E-02 7.41E-02 7.42E-02 200 7.75E-02 7.63E-02 7.66E-02 7.66E-02 7.72E-02 7.65E-02 7.59E-02 7.66E-02 7.58E-02 7.67E-02 7.32E-02 7.38E-02 7.49E-02 4.48E-04 7.61E-02 7.37E-02 7.48E-02 3.39E-04 7.57E-02 7.38E-02 7.55E-02 4.19E-04 7.67E-02 7.43E-02 7.59E-02 3.53E-04 7.69E-02 7.50E-02 7.69E-02 5.07E-04 7.82E-02 7.55E-02 7.47E-02 2.81E-04 7.54E-02 7.39E-02 2.00E-01 PASS 7.41E-02 3.61E-04 7.51E-02 7.31E-02 2.00E-01 PASS 7.48E-02 3.60E-04 7.58E-02 7.38E-02 2.00E-01 PASS 7.56E-02 3.96E-04 7.67E-02 7.45E-02 2.00E-01 PASS 7.63E-02 4.29E-04 7.75E-02 7.51E-02 2.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 169 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased -VOUT (V) IL=2.5MA @ +5V B 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.82. Plot of -VOUT (V) IL=2.5MA @ +5V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 170 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.82. Raw data for -VOUT (V) IL=2.5MA @ +5V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -VOUT (V) IL=2.5MA @ +5V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 7.61E-02 7.55E-02 7.53E-02 7.54E-02 7.59E-02 7.56E-02 7.54E-02 7.53E-02 7.47E-02 7.58E-02 7.52E-02 7.55E-02 Total 20 7.59E-02 7.56E-02 7.52E-02 7.53E-02 7.57E-02 7.51E-02 7.49E-02 7.50E-02 7.40E-02 7.54E-02 7.41E-02 7.46E-02 Dose (krad(Si)) 50 100 7.67E-02 7.69E-02 7.62E-02 7.66E-02 7.60E-02 7.65E-02 7.61E-02 7.64E-02 7.64E-02 7.66E-02 7.60E-02 7.65E-02 7.56E-02 7.64E-02 7.57E-02 7.65E-02 7.50E-02 7.54E-02 7.60E-02 7.68E-02 7.45E-02 7.45E-02 7.51E-02 7.49E-02 200 7.81E-02 7.77E-02 7.76E-02 7.77E-02 7.74E-02 7.72E-02 7.68E-02 7.70E-02 7.63E-02 7.76E-02 7.43E-02 7.45E-02 7.57E-02 3.56E-04 7.66E-02 7.47E-02 7.55E-02 2.73E-04 7.63E-02 7.48E-02 7.63E-02 2.77E-04 7.70E-02 7.55E-02 7.66E-02 1.73E-04 7.71E-02 7.61E-02 7.77E-02 2.69E-04 7.84E-02 7.70E-02 7.54E-02 4.27E-04 7.65E-02 7.42E-02 2.00E-01 PASS 7.49E-02 5.20E-04 7.63E-02 7.35E-02 2.00E-01 PASS 7.57E-02 3.97E-04 7.68E-02 7.46E-02 2.00E-01 PASS 7.63E-02 5.42E-04 7.78E-02 7.49E-02 2.00E-01 PASS 7.70E-02 4.98E-04 7.83E-02 7.56E-02 2.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 171 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased AVOL (V/mV) RL=10K VO=75MV TO 4.8V A 6.00E+04 4.00E+04 2.00E+04 0.00E+00 -2.00E+04 -4.00E+04 -6.00E+04 -8.00E+04 -1.00E+05 -1.20E+05 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.83. Plot of AVOL (V/mV) RL=10K VO=75MV TO 4.8V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 172 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.83. Raw data for AVOL (V/mV) RL=10K VO=75MV TO 4.8V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). AVOL (V/mV) RL=10K VO=75MV TO 4.8V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 2.87E+03 2.42E+03 2.21E+04 2.00E+03 7.62E+03 2.20E+04 4.72E+03 5.23E+03 4.76E+03 7.63E+03 4.89E+03 3.00E+03 Total 20 2.71E+03 4.77E+03 1.31E+04 2.70E+03 1.88E+04 1.26E+04 3.91E+03 5.45E+04 7.49E+03 1.28E+05 2.76E+04 3.43E+03 Dose (krad(Si)) 50 100 2.37E+03 3.82E+03 5.23E+03 4.82E+03 2.22E+04 7.09E+03 2.12E+03 4.73E+03 1.12E+04 1.34E+04 3.92E+04 6.60E+03 3.38E+03 5.75E+03 4.17E+04 1.06E+04 4.08E+03 2.51E+03 3.70E+04 3.21E+04 1.31E+04 1.06E+04 3.33E+03 3.33E+03 200 3.48E+03 5.22E+03 9.59E+03 2.57E+03 1.05E+04 1.45E+04 2.23E+03 3.08E+03 5.66E+03 5.67E+03 1.06E+04 3.41E+03 7.40E+03 8.52E+03 3.08E+04 -1.60E+04 8.41E+03 7.22E+03 2.82E+04 -1.14E+04 8.62E+03 8.44E+03 3.18E+04 -1.45E+04 6.77E+03 3.88E+03 1.74E+04 -3.88E+03 6.28E+03 3.59E+03 1.61E+04 -3.58E+03 8.87E+03 7.44E+03 2.93E+04 -1.15E+04 6.00E+02 PASS 4.13E+04 5.25E+04 1.85E+05 -1.03E+05 3.00E+02 PASS 2.51E+04 1.96E+04 7.87E+04 -2.86E+04 3.00E+02 PASS 1.15E+04 1.18E+04 4.40E+04 -2.10E+04 3.00E+02 PASS 6.22E+03 4.85E+03 1.95E+04 -7.09E+03 3.00E+02 PASS An ISO 9001:2008 and DSCC Certified Company 173 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased AVOL (V/mV) RL=10K VO=75MV TO 4.8V B 1.00E+04 8.00E+03 6.00E+03 4.00E+03 2.00E+03 0.00E+00 -2.00E+03 -4.00E+03 -6.00E+03 -8.00E+03 -1.00E+04 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.84. Plot of AVOL (V/mV) RL=10K VO=75MV TO 4.8V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 174 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.84. Raw data for AVOL (V/mV) RL=10K VO=75MV TO 4.8V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). AVOL (V/mV) RL=10K VO=75MV TO 4.8V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 4.40E+03 2.97E+03 3.61E+03 1.10E+04 3.95E+03 5.13E+03 4.01E+03 4.27E+03 4.36E+03 4.12E+03 3.71E+03 3.59E+03 Total 20 3.47E+03 3.09E+03 4.54E+03 1.08E+04 2.73E+03 2.98E+03 2.69E+03 4.11E+03 4.12E+03 3.61E+03 1.99E+03 4.21E+03 Dose (krad(Si)) 50 100 4.57E+03 2.90E+03 1.81E+03 2.55E+03 3.97E+03 3.16E+03 2.16E+03 5.07E+03 3.10E+03 4.41E+03 8.16E+03 3.49E+03 3.75E+03 1.77E+04 3.43E+03 6.37E+03 2.31E+03 4.00E+03 3.61E+03 8.72E+03 3.38E+03 1.60E+05 3.54E+03 3.83E+03 200 3.38E+03 2.27E+03 2.68E+03 2.74E+03 3.35E+03 2.98E+03 1.60E+03 1.56E+03 3.26E+03 3.15E+03 3.66E+03 3.38E+03 5.18E+03 3.29E+03 1.42E+04 -3.83E+03 4.93E+03 3.36E+03 1.41E+04 -4.28E+03 3.12E+03 1.17E+03 6.33E+03 -8.82E+01 3.61E+03 1.07E+03 6.56E+03 6.73E+02 2.88E+03 4.75E+02 4.18E+03 1.58E+03 4.38E+03 4.44E+02 5.59E+03 3.16E+03 6.00E+02 PASS 3.50E+03 6.49E+02 5.28E+03 1.72E+03 3.00E+02 PASS 4.25E+03 2.26E+03 1.04E+04 -1.94E+03 3.00E+02 PASS 8.05E+03 5.77E+03 2.39E+04 -7.77E+03 3.00E+02 PASS 2.51E+03 8.56E+02 4.86E+03 1.61E+02 3.00E+02 PASS An ISO 9001:2008 and DSCC Certified Company 175 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased CMRR (dB) @ +5V VCM=0 TO +5V A 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.85. Plot of CMRR (dB) @ +5V VCM=0 TO +5V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 176 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.85. Raw data for CMRR (dB) @ +5V VCM=0 TO +5V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). CMRR (dB) @ +5V VCM=0 TO +5V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 8.06E+01 8.70E+01 9.43E+01 8.75E+01 1.00E+02 9.30E+01 9.54E+01 9.19E+01 1.02E+02 8.74E+01 8.41E+01 9.42E+01 Total 20 8.08E+01 8.70E+01 9.37E+01 8.72E+01 1.01E+02 9.46E+01 9.45E+01 9.13E+01 1.04E+02 8.72E+01 8.40E+01 9.39E+01 Dose (krad(Si)) 50 100 8.08E+01 8.07E+01 8.69E+01 8.67E+01 9.33E+01 9.28E+01 8.71E+01 8.72E+01 1.02E+02 1.04E+02 9.61E+01 9.75E+01 9.39E+01 9.32E+01 9.08E+01 9.05E+01 1.06E+02 1.06E+02 8.69E+01 8.67E+01 8.40E+01 8.40E+01 9.40E+01 9.41E+01 200 8.07E+01 8.64E+01 9.19E+01 8.71E+01 1.07E+02 1.02E+02 9.25E+01 9.06E+01 1.07E+02 8.65E+01 8.40E+01 9.39E+01 8.99E+01 7.49E+00 1.10E+02 6.94E+01 8.98E+01 7.54E+00 1.11E+02 6.92E+01 9.00E+01 8.04E+00 1.12E+02 6.80E+01 9.03E+01 8.78E+00 1.14E+02 6.62E+01 9.07E+01 1.01E+01 1.18E+02 6.29E+01 9.39E+01 5.31E+00 1.09E+02 7.94E+01 7.60E+01 PASS 9.43E+01 6.22E+00 1.11E+02 7.73E+01 7.00E+01 PASS 9.48E+01 7.26E+00 1.15E+02 7.49E+01 7.00E+01 PASS 9.49E+01 7.57E+00 1.16E+02 7.41E+01 7.00E+01 PASS 9.57E+01 8.51E+00 1.19E+02 7.24E+01 7.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 177 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 1.00E+02 CMRR (dB) @ +5V VCM=0 TO +5V B 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 2.00E+01 1.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.86. Plot of CMRR (dB) @ +5V VCM=0 TO +5V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 178 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.86. Raw data for CMRR (dB) @ +5V VCM=0 TO +5V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). CMRR (dB) @ +5V VCM=0 TO +5V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 8.54E+01 9.51E+01 1.00E+02 8.66E+01 8.34E+01 8.35E+01 1.12E+02 8.44E+01 9.48E+01 1.02E+02 9.35E+01 1.09E+02 Total 20 8.54E+01 9.46E+01 9.80E+01 8.75E+01 8.33E+01 8.34E+01 1.06E+02 8.42E+01 9.42E+01 9.82E+01 9.39E+01 1.12E+02 Dose (krad(Si)) 50 100 8.52E+01 8.51E+01 9.42E+01 9.36E+01 9.65E+01 9.57E+01 8.79E+01 8.83E+01 8.31E+01 8.30E+01 8.33E+01 8.32E+01 1.03E+02 1.01E+02 8.41E+01 8.40E+01 9.39E+01 9.36E+01 9.63E+01 9.47E+01 9.38E+01 9.38E+01 1.12E+02 1.11E+02 200 8.47E+01 9.28E+01 9.38E+01 8.92E+01 8.27E+01 8.33E+01 9.97E+01 8.40E+01 9.33E+01 9.26E+01 9.39E+01 1.13E+02 9.02E+01 7.26E+00 1.10E+02 7.03E+01 8.98E+01 6.28E+00 1.07E+02 7.25E+01 8.94E+01 5.76E+00 1.05E+02 7.36E+01 8.91E+01 5.42E+00 1.04E+02 7.43E+01 8.86E+01 4.84E+00 1.02E+02 7.54E+01 9.52E+01 1.19E+01 1.28E+02 6.26E+01 7.60E+01 PASS 9.31E+01 9.44E+00 1.19E+02 6.73E+01 7.00E+01 PASS 9.22E+01 8.56E+00 1.16E+02 6.87E+01 7.00E+01 PASS 9.14E+01 7.74E+00 1.13E+02 7.02E+01 7.00E+01 PASS 9.06E+01 6.90E+00 1.09E+02 7.17E+01 7.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 179 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 1.00E+02 9.00E+01 CMRR (dB) MATCHING 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 2.00E+01 1.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.87. Plot of CMRR (dB) MATCHING versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 180 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.87. Raw data for CMRR (dB) MATCHING versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). CMRR (dB) MATCHING Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 8.81E+01 9.14E+01 1.00E+02 8.11E+01 8.22E+01 8.10E+01 9.69E+01 8.91E+01 9.16E+01 8.93E+01 8.15E+01 9.28E+01 Total 20 8.85E+01 9.17E+01 1.02E+02 8.13E+01 8.22E+01 8.13E+01 9.73E+01 8.93E+01 9.18E+01 9.00E+01 8.16E+01 9.30E+01 Dose (krad(Si)) 50 100 8.87E+01 8.88E+01 9.17E+01 9.19E+01 1.03E+02 1.04E+02 8.15E+01 8.17E+01 8.22E+01 8.22E+01 8.15E+01 8.16E+01 9.74E+01 9.74E+01 8.94E+01 8.96E+01 9.20E+01 9.18E+01 9.04E+01 9.11E+01 8.16E+01 8.16E+01 9.29E+01 9.29E+01 200 8.92E+01 9.20E+01 1.06E+02 8.21E+01 8.22E+01 8.23E+01 9.76E+01 8.95E+01 9.17E+01 9.24E+01 8.16E+01 9.29E+01 8.86E+01 7.73E+00 1.10E+02 6.74E+01 8.91E+01 8.28E+00 1.12E+02 6.63E+01 8.95E+01 8.92E+00 1.14E+02 6.50E+01 8.97E+01 8.99E+00 1.14E+02 6.50E+01 9.04E+01 9.97E+00 1.18E+02 6.31E+01 8.96E+01 5.73E+00 1.05E+02 7.39E+01 7.50E+01 PASS 8.99E+01 5.76E+00 1.06E+02 7.41E+01 7.00E+01 PASS 9.02E+01 5.74E+00 1.06E+02 7.44E+01 7.00E+01 PASS 9.03E+01 5.68E+00 1.06E+02 7.48E+01 7.00E+01 PASS 9.07E+01 5.54E+00 1.06E+02 7.55E+01 7.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 181 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 1.40E+02 PSRR (dB) @ +4.5V TO +12V A 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.88. Plot of PSRR (dB) @ +4.5V TO +12V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 182 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.88. Raw data for PSRR (dB) @ +4.5V TO +12V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). PSRR (dB) @ +4.5V TO +12V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.14E+02 1.22E+02 1.12E+02 1.12E+02 1.08E+02 1.23E+02 1.15E+02 1.16E+02 1.43E+02 1.16E+02 1.09E+02 1.41E+02 Total 20 1.15E+02 1.23E+02 1.12E+02 1.13E+02 1.08E+02 1.23E+02 1.15E+02 1.16E+02 1.37E+02 1.16E+02 1.09E+02 1.44E+02 Dose (krad(Si)) 50 100 1.14E+02 1.14E+02 1.23E+02 1.20E+02 1.13E+02 1.11E+02 1.13E+02 1.13E+02 1.08E+02 1.08E+02 1.23E+02 1.21E+02 1.16E+02 1.15E+02 1.17E+02 1.18E+02 1.39E+02 1.48E+02 1.16E+02 1.16E+02 1.09E+02 1.09E+02 1.46E+02 1.42E+02 200 1.14E+02 1.22E+02 1.13E+02 1.13E+02 1.09E+02 1.21E+02 1.16E+02 1.17E+02 1.35E+02 1.17E+02 1.09E+02 1.39E+02 1.14E+02 5.07E+00 1.27E+02 9.97E+01 1.14E+02 5.52E+00 1.29E+02 9.91E+01 1.14E+02 5.36E+00 1.29E+02 9.95E+01 1.13E+02 4.45E+00 1.26E+02 1.01E+02 1.14E+02 4.99E+00 1.28E+02 1.00E+02 1.23E+02 1.18E+01 1.55E+02 9.02E+01 8.80E+01 PASS 1.22E+02 9.18E+00 1.47E+02 9.63E+01 8.80E+01 PASS 1.22E+02 9.95E+00 1.49E+02 9.49E+01 8.80E+01 PASS 1.24E+02 1.37E+01 1.61E+02 8.60E+01 8.80E+01 PASS 1.21E+02 7.68E+00 1.42E+02 1.00E+02 8.80E+01 PASS An ISO 9001:2008 and DSCC Certified Company 183 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 1.40E+02 PSRR (dB) @ +4.5V TO +12V B 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.89. Plot of PSRR (dB) @ +4.5V TO +12V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 184 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.89. Raw data for PSRR (dB) @ +4.5V TO +12V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). PSRR (dB) @ +4.5V TO +12V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.14E+02 1.11E+02 1.09E+02 1.08E+02 1.32E+02 1.13E+02 1.20E+02 1.13E+02 1.23E+02 1.11E+02 1.17E+02 1.19E+02 Total 20 1.14E+02 1.12E+02 1.09E+02 1.08E+02 1.33E+02 1.13E+02 1.21E+02 1.13E+02 1.25E+02 1.12E+02 1.17E+02 1.19E+02 Dose (krad(Si)) 50 100 1.14E+02 1.13E+02 1.12E+02 1.11E+02 1.10E+02 1.09E+02 1.09E+02 1.08E+02 1.33E+02 1.32E+02 1.13E+02 1.13E+02 1.21E+02 1.22E+02 1.13E+02 1.13E+02 1.25E+02 1.25E+02 1.12E+02 1.13E+02 1.17E+02 1.17E+02 1.19E+02 1.19E+02 200 1.15E+02 1.12E+02 1.10E+02 1.09E+02 1.34E+02 1.13E+02 1.21E+02 1.13E+02 1.24E+02 1.14E+02 1.17E+02 1.19E+02 1.15E+02 9.98E+00 1.42E+02 8.75E+01 1.15E+02 1.00E+01 1.43E+02 8.78E+01 1.15E+02 9.98E+00 1.43E+02 8.80E+01 1.15E+02 9.71E+00 1.41E+02 8.81E+01 1.16E+02 1.05E+01 1.45E+02 8.70E+01 1.16E+02 5.39E+00 1.31E+02 1.01E+02 8.80E+01 PASS 1.17E+02 5.80E+00 1.33E+02 1.01E+02 8.80E+01 PASS 1.17E+02 5.68E+00 1.32E+02 1.01E+02 8.80E+01 PASS 1.17E+02 5.88E+00 1.33E+02 1.01E+02 8.80E+01 PASS 1.17E+02 5.28E+00 1.32E+02 1.03E+02 8.80E+01 PASS An ISO 9001:2008 and DSCC Certified Company 185 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased PSRR (dB) MATCHING @ +4.5V TO +12V 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.90. Plot of PSRR (dB) MATCHING @ +4.5V TO +12V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 186 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.90. Raw data for PSRR (dB) MATCHING @ +4.5V TO +12V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). PSRR (dB) MATCHING @ +4.5V TO +12V Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.55E+02 1.14E+02 1.20E+02 1.04E+02 1.08E+02 1.10E+02 1.12E+02 1.24E+02 1.23E+02 1.19E+02 1.14E+02 1.20E+02 Total 20 1.40E+02 1.14E+02 1.20E+02 1.04E+02 1.09E+02 1.10E+02 1.12E+02 1.24E+02 1.23E+02 1.20E+02 1.14E+02 1.20E+02 Dose (krad(Si)) 50 100 1.45E+02 1.39E+02 1.15E+02 1.15E+02 1.20E+02 1.22E+02 1.04E+02 1.04E+02 1.09E+02 1.09E+02 1.11E+02 1.10E+02 1.12E+02 1.12E+02 1.23E+02 1.20E+02 1.23E+02 1.24E+02 1.20E+02 1.22E+02 1.14E+02 1.14E+02 1.20E+02 1.20E+02 200 1.30E+02 1.15E+02 1.22E+02 1.05E+02 1.09E+02 1.10E+02 1.12E+02 1.22E+02 1.22E+02 1.23E+02 1.14E+02 1.20E+02 1.20E+02 2.01E+01 1.75E+02 6.51E+01 1.18E+02 1.41E+01 1.56E+02 7.91E+01 1.19E+02 1.60E+01 1.63E+02 7.47E+01 1.18E+02 1.35E+01 1.55E+02 8.07E+01 1.16E+02 1.02E+01 1.44E+02 8.80E+01 1.18E+02 6.20E+00 1.35E+02 1.00E+02 8.20E+01 PASS 1.18E+02 6.33E+00 1.35E+02 1.00E+02 8.20E+01 PASS 1.18E+02 6.10E+00 1.34E+02 1.01E+02 8.20E+01 PASS 1.18E+02 6.47E+00 1.35E+02 9.99E+01 8.20E+01 PASS 1.18E+02 6.26E+00 1.35E+02 1.01E+02 8.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 187 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased +ISC (A) VOUT=1/2 SUPPLY @ +5V A 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.91. Plot of +ISC (A) VOUT=1/2 SUPPLY @ +5V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 188 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.91. Raw data for +ISC (A) VOUT=1/2 SUPPLY @ +5V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +ISC (A) VOUT=1/2 SUPPLY @ +5V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -2.42E-02 -2.43E-02 -2.41E-02 -2.45E-02 -2.46E-02 -2.40E-02 -2.52E-02 -2.42E-02 -2.49E-02 -2.41E-02 -2.41E-02 -2.51E-02 Total 20 -2.34E-02 -2.35E-02 -2.33E-02 -2.36E-02 -2.37E-02 -2.34E-02 -2.44E-02 -2.36E-02 -2.42E-02 -2.34E-02 -2.39E-02 -2.48E-02 Dose (krad(Si)) 50 100 -2.29E-02 -2.20E-02 -2.29E-02 -2.21E-02 -2.27E-02 -2.18E-02 -2.31E-02 -2.22E-02 -2.32E-02 -2.23E-02 -2.30E-02 -2.24E-02 -2.39E-02 -2.32E-02 -2.31E-02 -2.25E-02 -2.39E-02 -2.32E-02 -2.29E-02 -2.23E-02 -2.40E-02 -2.40E-02 -2.49E-02 -2.49E-02 200 -2.17E-02 -2.16E-02 -2.15E-02 -2.16E-02 -2.19E-02 -2.12E-02 -2.18E-02 -2.13E-02 -2.19E-02 -2.10E-02 -2.39E-02 -2.48E-02 -2.43E-02 2.23E-04 -2.37E-02 -2.50E-02 -2.35E-02 1.71E-04 -2.30E-02 -2.39E-02 -2.29E-02 1.81E-04 -2.24E-02 -2.34E-02 -2.21E-02 1.86E-04 -2.16E-02 -2.26E-02 -2.17E-02 1.58E-04 -2.12E-02 -2.21E-02 -2.45E-02 5.49E-04 -2.30E-02 -2.60E-02 -1.25E-02 PASS -2.38E-02 4.70E-04 -2.25E-02 -2.51E-02 -8.00E-03 PASS -2.34E-02 4.75E-04 -2.21E-02 -2.47E-02 -8.00E-03 PASS -2.27E-02 4.61E-04 -2.14E-02 -2.40E-02 -8.00E-03 PASS -2.14E-02 3.87E-04 -2.04E-02 -2.25E-02 -8.00E-03 PASS An ISO 9001:2008 and DSCC Certified Company 189 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased +ISC (A) VOUT=1/2 SUPPLY @ +5V B 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.92. Plot of +ISC (A) VOUT=1/2 SUPPLY @ +5V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 190 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.92. Raw data for +ISC (A) VOUT=1/2 SUPPLY @ +5V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). +ISC (A) VOUT=1/2 SUPPLY @ +5V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -2.41E-02 -2.41E-02 -2.40E-02 -2.43E-02 -2.45E-02 -2.40E-02 -2.50E-02 -2.41E-02 -2.49E-02 -2.39E-02 -2.42E-02 -2.50E-02 Total 20 -2.33E-02 -2.32E-02 -2.31E-02 -2.32E-02 -2.35E-02 -2.34E-02 -2.42E-02 -2.35E-02 -2.42E-02 -2.32E-02 -2.39E-02 -2.47E-02 Dose (krad(Si)) 50 100 -2.27E-02 -2.19E-02 -2.27E-02 -2.18E-02 -2.25E-02 -2.16E-02 -2.27E-02 -2.18E-02 -2.30E-02 -2.21E-02 -2.30E-02 -2.24E-02 -2.37E-02 -2.30E-02 -2.31E-02 -2.24E-02 -2.37E-02 -2.31E-02 -2.28E-02 -2.21E-02 -2.40E-02 -2.40E-02 -2.48E-02 -2.48E-02 200 -2.16E-02 -2.13E-02 -2.13E-02 -2.12E-02 -2.17E-02 -2.12E-02 -2.15E-02 -2.12E-02 -2.17E-02 -2.08E-02 -2.39E-02 -2.47E-02 -2.42E-02 1.96E-04 -2.36E-02 -2.47E-02 -2.33E-02 1.49E-04 -2.29E-02 -2.37E-02 -2.27E-02 1.62E-04 -2.23E-02 -2.32E-02 -2.18E-02 1.84E-04 -2.13E-02 -2.23E-02 -2.14E-02 2.05E-04 -2.09E-02 -2.20E-02 -2.44E-02 5.13E-04 -2.30E-02 -2.58E-02 -1.25E-02 PASS -2.37E-02 4.32E-04 -2.25E-02 -2.49E-02 -8.00E-03 PASS -2.33E-02 4.34E-04 -2.21E-02 -2.45E-02 -8.00E-03 PASS -2.26E-02 4.26E-04 -2.14E-02 -2.37E-02 -8.00E-03 PASS -2.13E-02 3.62E-04 -2.03E-02 -2.23E-02 -8.00E-03 PASS An ISO 9001:2008 and DSCC Certified Company 191 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased -ISC (A) VOUT=1/2 SUPPLY @ +5V A 5.00E-02 4.50E-02 4.00E-02 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.93. Plot of -ISC (A) VOUT=1/2 SUPPLY @ +5V A versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 192 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.93. Raw data for -ISC (A) VOUT=1/2 SUPPLY @ +5V A versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -ISC (A) VOUT=1/2 SUPPLY @ +5V A Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 4.52E-02 4.56E-02 4.56E-02 4.53E-02 4.56E-02 4.52E-02 4.59E-02 4.55E-02 4.53E-02 4.55E-02 4.60E-02 4.55E-02 Total 20 4.58E-02 4.62E-02 4.62E-02 4.58E-02 4.63E-02 4.60E-02 4.68E-02 4.63E-02 4.63E-02 4.64E-02 4.71E-02 4.66E-02 Dose (krad(Si)) 50 100 4.53E-02 4.51E-02 4.56E-02 4.54E-02 4.56E-02 4.54E-02 4.53E-02 4.51E-02 4.58E-02 4.56E-02 4.54E-02 4.51E-02 4.62E-02 4.59E-02 4.56E-02 4.53E-02 4.56E-02 4.54E-02 4.57E-02 4.54E-02 4.66E-02 4.66E-02 4.61E-02 4.61E-02 200 4.52E-02 4.56E-02 4.55E-02 4.52E-02 4.58E-02 4.51E-02 4.59E-02 4.53E-02 4.54E-02 4.54E-02 4.70E-02 4.65E-02 4.54E-02 1.94E-04 4.60E-02 4.49E-02 4.61E-02 2.30E-04 4.67E-02 4.54E-02 4.55E-02 2.28E-04 4.62E-02 4.49E-02 4.53E-02 2.33E-04 4.60E-02 4.47E-02 4.55E-02 2.81E-04 4.62E-02 4.47E-02 4.55E-02 2.66E-04 4.62E-02 4.47E-02 1.25E-02 PASS 4.64E-02 2.94E-04 4.72E-02 4.56E-02 8.00E-03 PASS 4.57E-02 3.03E-04 4.65E-02 4.49E-02 8.00E-03 PASS 4.54E-02 2.79E-04 4.62E-02 4.46E-02 8.00E-03 PASS 4.54E-02 2.90E-04 4.62E-02 4.46E-02 8.00E-03 PASS An ISO 9001:2008 and DSCC Certified Company 193 RLAT Report 11-009 110509 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased -ISC (A) VOUT=1/2 SUPPLY @ +5V B 5.00E-02 4.50E-02 4.00E-02 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.94. Plot of -ISC (A) VOUT=1/2 SUPPLY @ +5V B versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 194 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 Table 5.94. Raw data for -ISC (A) VOUT=1/2 SUPPLY @ +5V B versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). -ISC (A) VOUT=1/2 SUPPLY @ +5V B Device 1058 1059 1060 1062 1063 1064 1065 1066 1067 1068 1069 1070 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 4.47E-02 4.51E-02 4.50E-02 4.45E-02 4.50E-02 4.49E-02 4.52E-02 4.49E-02 4.47E-02 4.48E-02 4.53E-02 4.49E-02 Total 20 4.53E-02 4.57E-02 4.56E-02 4.51E-02 4.57E-02 4.58E-02 4.61E-02 4.57E-02 4.57E-02 4.58E-02 4.64E-02 4.60E-02 Dose (krad(Si)) 50 100 4.48E-02 4.46E-02 4.52E-02 4.49E-02 4.51E-02 4.49E-02 4.46E-02 4.43E-02 4.52E-02 4.50E-02 4.51E-02 4.48E-02 4.55E-02 4.51E-02 4.50E-02 4.47E-02 4.50E-02 4.47E-02 4.51E-02 4.48E-02 4.59E-02 4.59E-02 4.56E-02 4.55E-02 200 4.47E-02 4.52E-02 4.50E-02 4.45E-02 4.52E-02 4.49E-02 4.52E-02 4.48E-02 4.48E-02 4.48E-02 4.63E-02 4.60E-02 4.49E-02 2.29E-04 4.55E-02 4.42E-02 4.55E-02 2.64E-04 4.62E-02 4.48E-02 4.50E-02 2.68E-04 4.57E-02 4.42E-02 4.47E-02 2.66E-04 4.55E-02 4.40E-02 4.49E-02 3.11E-04 4.58E-02 4.41E-02 4.49E-02 1.80E-04 4.54E-02 4.44E-02 1.25E-02 PASS 4.58E-02 1.81E-04 4.63E-02 4.53E-02 8.00E-03 PASS 4.51E-02 1.98E-04 4.57E-02 4.46E-02 8.00E-03 PASS 4.48E-02 1.73E-04 4.53E-02 4.44E-02 8.00E-03 PASS 4.49E-02 1.82E-04 4.54E-02 4.44E-02 8.00E-03 PASS An ISO 9001:2008 and DSCC Certified Company 195 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 6.0. Summary / Conclusions The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices' Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 81-24 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. The parametric data was obtained as "read and record" and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used in this work is 2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The 90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be met for a device to pass the total ionizing dose test: following the radiation exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units irradiated without electrical bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure. Based on this criterion the RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp (from the lot date code identified on the first page of this test report) PASSED the total ionizing dose test to the maximum tested dose level of 200krad(Si) with all parameters remaining within their datasheet specifications. An ISO 9001:2008 and DSCC Certified Company 196 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix A: Photograph of a Sample Unit-Under-Test to Show Part Traceability An ISO 9001:2008 and DSCC Certified Company 197 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix B: Radiation Bias Connections TID Radiation Biased Conditions: Extracted from Linear Technology RH1498M datasheet. Pin Function 1 OUT A 2 -IN A 3 +IN A 4 NC 5 V- 6 NC 7 +IN B 8 -IN B 9 OUT B 10 V+ Connection / Bias To Pin2 Via 5kΩ Resistor, To Pin2 Via 40pF Capacitor To Pin1 Via 5kΩ Resistor, To Pin1 Via 40pF Capacitor To 8V via 5kΩ Resistor NC To -15V, 0.1µF Decoupling Capacitor to GND NC To 8V via 5kΩ Resistor To Pin9 Via 5kΩ Resistor, To Pin9 Via 40pF Capacitor To Pin8 Via 5kΩ Resistor, To Pin8 Via 40pF Capacitor To +15V, 0.1µF Decoupling Capacitor to GND TID Radiation Unbiased Conditions: Pin Function Connection / Bias 1 OUT A GND 2 -IN A GND 3 +IN A GND 4 NC GND 5 V- GND 6 NC GND 7 +IN B GND 8 -IN B GND 9 OUT B GND 10 V+ GND An ISO 9001:2008 and DSCC Certified Company 198 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Absolute Maximum Rating: Parameter Max Rating Total Supply Voltage 36V Input Current ±10mA Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted from Linear Technology RH1498M Datasheet. Figure B.2. W package drawing (for reference only). This figure was extracted from the Linear Technology RH1498M Datasheet. An ISO 9001:2008 and DSCC Certified Company 199 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix C: Electrical Test Parameters and Conditions The expected ranges of values as well as the measurement conditions are taken from Linear Technology RH1498M datasheet Reivsion E. All electrical tests for this device are performed on one of Radiation Assured Device's LTS2020 Test Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal products including voltage regulators, voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and sensitivity through the use of software self-calibration and an internal relay matrix with separate family boards and custom personality adapter boards. The tester uses this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and establish the needed measurement loops for all the tests performed. The measured parameters and test conditions are shown in Table C.1 (VS=±15V) and Table C.2 (VS=5V). A listing of the measurement precision/resolution for each parameter is shown in Table C.3 (VS=±15V) and Table C.4 (VS=5V). The precision/resolution values were obtained from test data or from the DAC resolution of the LTS-2020 for the particular test shown, whichever is greater. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested repetitively (a total of 10times with re-insertion between tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the measured standard deviation to generate the final measurement range. This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is limited by the internal DACs, which results in a measured standard deviation of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Not all measured parameters are well suited to this approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. An ISO 9001:2008 and DSCC Certified Company 200 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.1. Measured parameters and test conditions at VS=±15V for the RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp. Parameter +ICC (A) @ +/-15V -IEE (A) @ +/-15V V OFFSET (V) @ +/-15V VCM=0V I OFFSET (A) @ +/-15V VCM=0V I BIAS + (A) @ +/-15V VCM=0V I BIAS - (A) @ +/-15V VCM=0V V OFFSET (V) @ +/-15V VCM=15V I OFFSET (A) @ +/-15V VCM=15V I BIAS + (A) @ +/-15V VCM=15V I BIAS - (A) @ +/-15V VCM=15V V OFFSET (V) @ +/-15V VCM=-15V I OFFSET (A) @ +/-15V VCM=-15V I BIAS + (A) @ +/-15V VCM=-15V I BIAS - (A) @ +/-15V VCM=-15V +VOUT (V) IL=0MA @ +/-15V +VOUT (V) IL=1MA @ +/-15V +VOUT (V) IL=10MA @ +/-15V -VOUT (V) IL=0MA @ +/-15V -VOUT (V) IL=1MA @ +/-15V -VOUT (V) IL=10MA @ +/-15V AVOL (V/mV) RL=10K VO=+/-14.5V AVOL (V/mV) RL=2K VO=+/-10V CMRR (dB) @ +/-15V VCM=+/-15V CMRR (dB) MATCHING PSRR (dB) @ +/-2V TO +/-16V PSRR (dB) MATCHING +ISC (A) VOUT=0V @ +/-15V -ISC (A) VOUT=0V @ +/-15V Test Conditions VS= +/-15V VS= +/-15V VS=+/-15V VCM=0V VS=+/-15V VCM=0V VS=+/-15V VCM=0V VS=+/-15V VCM=0V VS=+/-15V VCM=15V VS=+/-15V VCM=15V VS=+/-15V VCM=15V VS=+/-15V VCM=15V VS=+/-15V VCM=-15V VS=+/-15V VCM=-15V VS=+/-15V VCM=-15V VS=+/-15V VCM=-15V IL=0MA, VS=+/-15V IL=1MA, VS=+/-15V IL=10MA, VS=+/-15V IL=0MA, VS=+/-15V IL=1MA, VS=+/-15V IL=10MA, VS=+/-15V RL=10K VO=+/-14.5V RL=2K VO=+/-10V VS=+/-15V VCM=+/-15V VS=+/-15V VCM=+/-15V VS=+/-2V TO +/-16V VS=+/-2V TO +/-16V VOUT=0V, VS=+/-15V VOUT=0V, VS=+/-15V An ISO 9001:2008 and DSCC Certified Company 201 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.2. Measured parameters and test conditions at VS=5V for the RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp. Parameter +ICC (A) @ +5V -IEE (A) @ +5V V OFFSET (V) @ +5V VCM=0V I OFFSET (A) @ +5V VCM=0V I BIAS + (A) @ +5V VCM=0V I BIAS - (A) @ +5V VCM=0V V OFFSET (V) @ +5V VCM=5V I OFFSET (A) @ +5V VCM=5V I BIAS + (A) @ +5V VCM=5V I BIAS - (A) @ +5V VCM=5V +VOUT (V) IL=0MA @ +5V +VOUT (V) IL=1MA @ +5V +VOUT (V) IL=2.5MA @ +5V -VOUT (V) IL=0MA @ +5V -VOUT (V) IL=1MA @ +5V -VOUT (V) IL=2.5MA @ +5V AVOL (V/mV) RL=10K VO=75MV TO 4.8V CMRR (dB) @ +5V VCM=0 TO +5V CMRR (dB) MATCHING PSRR (dB) @ +4.5V TO +12V PSRR (dB) MATCHING @ +4.5V TO +12V +ISC (A) VOUT=1/2 SUPPLY @ +5V -ISC (A) VOUT=1/2 SUPPLY @ +5V Test Conditions VS=+5V VS=+5V VS=+5V VCM=0V VS=+5V VCM=0V VS=+5V VCM=0V VS=+5V VCM=0V VS=+5V VCM=5V VS=+5V VCM=5V VS=+5V VCM=5V VS=+5V VCM=5V IL=0MA, VS=+5V IL=1MA, VS=+5V IL=2.5MA, VS=+5V IL=0MA, VS=+5V IL=1MA, VS=+5V IL=2.5MA, VS=+5V RL=10K VO=75MV TO 4.8V VS=+5V VCM=0 TO +5V VS=+5V VCM=0 TO +5V VS=+4.5V TO +12V VS=+4.5V TO +12V VOUT=1/2 SUPPLY, VS=+5V VOUT=1/2 SUPPLY, VS=+5V An ISO 9001:2008 and DSCC Certified Company 202 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.3. Measured parameters, pre-irradiation specifications and measurement precision at VS=±15V for the RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp. Parameter +ICC (A) @ +/-15V -IEE (A) @ +/-15V V OFFSET (V) @ +/-15V VCM=0V I OFFSET (A) @ +/-15V VCM=0V I BIAS + (A) @ +/-15V VCM=0V I BIAS - (A) @ +/-15V VCM=0V V OFFSET (V) @ +/-15V VCM=15V I OFFSET (A) @ +/-15V VCM=15V I BIAS + (A) @ +/-15V VCM=15V I BIAS - (A) @ +/-15V VCM=15V V OFFSET (V) @ +/-15V VCM=-15V I OFFSET (A) @ +/-15V VCM=-15V I BIAS + (A) @ +/-15V VCM=-15V I BIAS - (A) @ +/-15V VCM=-15V +VOUT (V) IL=0MA @ +/-15V +VOUT (V) IL=1MA @ +/-15V +VOUT (V) IL=10MA @ +/-15V -VOUT (V) IL=0MA @ +/-15V -VOUT (V) IL=1MA @ +/-15V -VOUT (V) IL=10MA @ +/-15V AVOL (V/mV) RL=10K VO=+/-14.5V AVOL (V/mV) RL=2K VO=+/-10V CMRR (dB) @ +/-15V VCM=+/-15V CMRR (dB) MATCHING PSRR (dB) @ +/-2V TO +/-16V PSRR (dB) MATCHING +ISC (A) VOUT=0V @ +/-15V -ISC (A) VOUT=0V @ +/-15V Pre-Irradiation Specification MIN MAX 5.00E-03 -5.00E-03 -8.00E-04 8.00E-04 -7.00E-08 7.00E-08 -7.15E-07 7.15E-07 -7.15E-07 7.15E-07 -8.00E-04 8.00E-04 -7.00E-08 7.00E-08 -7.15E-07 7.15E-07 -7.15E-07 7.15E-07 -8.00E-04 8.00E-04 -7.00E-08 7.00E-08 -7.15E-07 7.15E-07 -7.15E-07 7.15E-07 1.00E-02 1.50E-01 8.00E-01 3.00E-02 1.00E-01 5.00E-01 1.00E+03 5.00E+02 9.00E+01 8.40E+01 9.00E+01 8.30E+01 -1.50E-02 1.50E-02 An ISO 9001:2008 and DSCC Certified Company 203 Measurement Precision/Resolution ±2.27E-05 ±1.99E-05 ±1.60E-06 ±6.64E-11 ±2.00E-09 ±1.93E-09 ±1.01E-06 ±4.99E-10 ±2.41E-09 ±1.77E-09 ±1.33E-06 ±7.39E-11 ±1.77E-09 ±1.73E-09 ±2.01E-04 ±3.89E-04 ±1.13E-03 ±1.65E-04 ±2.26E-04 ±9.49E-04 ±1.83E+02 ±4.70E+01 ±4.68E-01 ±1.37E-01 ±1.37E+00 ±1.16E-01 ±8.92E-05 ±9.48E-05 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.4. Measured parameters, pre-irradiation specifications and measurement precision at VS=5V for the RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp. Parameter +ICC (A) @ +5V -IEE (A) @ +5V V OFFSET (V) @ +5V VCM=0V I OFFSET (A) @ +5V VCM=0V I BIAS + (A) @ +5V VCM=0V I BIAS - (A) @ +5V VCM=0V V OFFSET (V) @ +5V VCM=5V I OFFSET (A) @ +5V VCM=5V I BIAS + (A) @ +5V VCM=5V I BIAS - (A) @ +5V VCM=5V +VOUT (V) IL=0MA @ +5V +VOUT (V) IL=1MA @ +5V +VOUT (V) IL=2.5MA @ +5V -VOUT (V) IL=0MA @ +5V -VOUT (V) IL=1MA @ +5V -VOUT (V) IL=2.5MA @ +5V AVOL (V/mV) RL=10K VO=75MV TO 4.8V CMRR (dB) @ +5V VCM=0 TO +5V CMRR (dB) MATCHING PSRR (dB) @ +4.5V TO +12V PSRR (dB) MATCHING @ +4.5V TO +12V +ISC (A) VOUT=1/2 SUPPLY @ +5V -ISC (A) VOUT=1/2 SUPPLY @ +5V Pre-Irradiation Specification MIN MAX 4.40E-03 -4.40E-03 -8.00E-04 8.00E-04 -6.50E-08 6.50E-08 -6.50E-07 6.50E-07 -6.50E-07 6.50E-07 -8.00E-04 8.00E-04 -6.50E-08 6.50E-08 -6.50E-07 6.50E-07 -6.50E-07 6.50E-07 1.00E-02 1.50E-01 2.50E-01 3.00E-02 1.00E-01 2.00E-01 6.00E+02 7.60E+01 7.50E+01 8.80E+01 8.20E+01 -1.25E-02 1.25E-02 An ISO 9001:2008 and DSCC Certified Company 204 Measurement Precision/Resolution ±6.53E-06 ±1.39E-05 ±1.73E-06 ±6.30E-11 ±1.30E-09 ±1.29E-09 ±1.34E-06 ±3.13E-10 ±1.98E-09 ±1.92E-09 ±1.44E-04 ±2.55E-04 ±3.81E-04 ±1.77E-04 ±2.03E-04 ±2.71E-04 ±6.50E+02 ±4.42E-01 ±3.88E-02 ±5.09E+00 ±5.01E-01 ±1.96E-05 ±8.14E-05 RLAT Report 11-009 110509 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix D: List of Figures Used in the Results Section (Section 5) 5.1. 5.2. 5.3. 5.4. 5.5. 5.6. 5.7. 5.8. 5.9. 5.10. 5.11. 5.12. 5.13. 5.14. 5.15. 5.16. 5.17. 5.18. 5.19. 5.20. 5.21. 5.22. 5.23. 5.24. 5.25. 5.26. 5.27. 5.28. 5.29. 5.30. 5.31. 5.32. 5.33. 5.34. 5.35. 5.36. 5.37. 5.38. +ICC (A) @ +/-15V -IEE (A) @ +/-15V V OFFSET (V) @ +/-15V VCM=0V A V OFFSET (V) @ +/-15V VCM=0V B I OFFSET (A) @ +/-15V VCM=0V A I OFFSET (A) @ +/-15V VCM=0V B I BIAS + (A) @ +/-15V VCM=0V A I BIAS + (A) @ +/-15V VCM=0V B I BIAS - (A) @ +/-15V VCM=0V A I BIAS - (A) @ +/-15V VCM=0V B V OFFSET (V) @ +/-15V VCM=15V A V OFFSET (V) @ +/-15V VCM=15V B I OFFSET (A) @ +/-15V VCM=15V A I OFFSET (A) @ +/-15V VCM=15V B I BIAS + (A) @ +/-15V VCM=15V A I BIAS + (A) @ +/-15V VCM=15V B I BIAS - (A) @ +/-15V VCM=15V A I BIAS - (A) @ +/-15V VCM=15V B V OFFSET (V) @ +/-15V VCM=-15V A V OFFSET (V) @ +/-15V VCM=-15V B I OFFSET (A) @ +/-15V VCM=-15V A I OFFSET (A) @ +/-15V VCM=-15V B I BIAS + (A) @ +/-15V VCM=-15V A I BIAS + (A) @ +/-15V VCM=-15V B I BIAS - (A) @ +/-15V VCM=-15V A I BIAS - (A) @ +/-15V VCM=-15V B +VOUT (V) IL=0MA @ +/-15V A +VOUT (V) IL=0MA @ +/-15V B +VOUT (V) IL=1MA @ +/-15V A +VOUT (V) IL=1MA @ +/-15V B +VOUT (V) IL=10MA @ +/-15V A +VOUT (V) IL=10MA @ +/-15V B -VOUT (V) IL=0MA @ +/-15V A -VOUT (V) IL=0MA @ +/-15V B -VOUT (V) IL=1MA @ +/-15V A -VOUT (V) IL=1MA @ +/-15V B -VOUT (V) IL=10MA @ +/-15V A -VOUT (V) IL=10MA @ +/-15V B An ISO 9001:2008 and DSCC Certified Company 205 RLAT Report 11-009 110509 R1.1 5.39. 5.40. 5.41. 5.42. 5.43. 5.44. 5.45. 5.46. 5.47. 5.48. 5.49. 5.50. 5.51. 5.52. 5.53. 5.54. 5.55. 5.56. 5.57. 5.58. 5.59. 5.60. 5.61. 5.62. 5.63. 5.64. 5.65. 5.66. 5.67. 5.68. 5.69. 5.70. 5.71. 5.72. 5.73. 5.74. 5.75. 5.76. 5.77. 5.78. 5.79. 5.80. AVOL (V/mV) RL=10K VO=+/-14.5V A AVOL (V/mV) RL=10K VO=+/-14.5V B AVOL (V/mV) RL=2K VO=+/-10V A AVOL (V/mV) RL=2K VO=+/-10V B CMRR (dB) @ +/-15V VCM=+/-15V A CMRR (dB) @ +/-15V VCM=+/-15V B CMRR (dB) MATCHING PSRR (dB) @ +/-2V TO +/-16V A PSRR (dB) @ +/-2V TO +/-16V B PSRR (dB) MATCHING +ISC (A) VOUT=0V @ +/-15V A +ISC (A) VOUT=0V @ +/-15V B -ISC (A) VOUT=0V @ +/-15V A -ISC (A) VOUT=0V @ +/-15V B +ICC (A) @ +5V -IEE (A) @ +5V V OFFSET (V) @ +5V VCM=0V A V OFFSET (V) @ +5V VCM=0V B I OFFSET (A) @ +5V VCM=0V A I OFFSET (A) @ +5V VCM=0V B I BIAS + (A) @ +5V VCM=0V A I BIAS + (A) @ +5V VCM=0V B I BIAS - (A) @ +5V VCM=0V A I BIAS - (A) @ +5V VCM=0V B V OFFSET (V) @ +5V VCM=5V A V OFFSET (V) @ +5V VCM=5V B I OFFSET (A) @ +5V VCM=5V A I OFFSET (A) @ +5V VCM=5V B I BIAS + (A) @ +5V VCM=5V A I BIAS + (A) @ +5V VCM=5V B I BIAS - (A) @ +5V VCM=5V A I BIAS - (A) @ +5V VCM=5V B +VOUT (V) IL=0MA @ +5V A +VOUT (V) IL=0MA @ +5V B +VOUT (V) IL=1MA @ +5V A +VOUT (V) IL=1MA @ +5V B +VOUT (V) IL=2.5MA @ +5V A +VOUT (V) IL=2.5MA @ +5V B -VOUT (V) IL=0MA @ +5V A -VOUT (V) IL=0MA @ +5V B -VOUT (V) IL=1MA @ +5V A -VOUT (V) IL=1MA @ +5V B An ISO 9001:2008 and DSCC Certified Company 206 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 11-009 110509 R1.1 5.81. 5.82. 5.83. 5.84. 5.85. 5.86. 5.87. 5.88. 5.89. 5.90. 5.91. 5.92. 5.93. 5.94. -VOUT (V) IL=2.5MA @ +5V A -VOUT (V) IL=2.5MA @ +5V B AVOL (V/mV) RL=10K VO=75MV TO 4.8V A AVOL (V/mV) RL=10K VO=75MV TO 4.8V B CMRR (dB) @ +5V VCM=0 TO +5V A CMRR (dB) @ +5V VCM=0 TO +5V B CMRR (dB) MATCHING PSRR (dB) @ +4.5V TO +12V A PSRR (dB) @ +4.5V TO +12V B PSRR (dB) MATCHING @ +4.5V TO +12V +ISC (A) VOUT=1/2 SUPPLY @ +5V A +ISC (A) VOUT=1/2 SUPPLY @ +5V B -ISC (A) VOUT=1/2 SUPPLY @ +5V A -ISC (A) VOUT=1/2 SUPPLY @ +5V B An ISO 9001:2008 and DSCC Certified Company 207 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800