RLAT 200K Report_RH1498MW_Fab Lot W10737593 W20.pdf

RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Radiation Lot Acceptance Testing (RLAT) of the RH1498MW Dual Rail-toRail Input and Output Precision C-Load Op Amp for Linear Technology
Customer: Linear Technology, PO# 58876L
RAD Job Number: 11-009
Part Type Tested: RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp.
Traceability Information: Fab Lot Number: #W10737593, Wafer Number: 20, Assembly Lot Number:
572207.1, Date Code: 1020A. See photograph of unit under test in Appendix A.
Quantity of Units: 12 units received, 5 units for biased irradiation, 5 units for unbiased irradiation and 1
unit for control. Serial numbers 1058, 1059, 1060, 1062 and 1063 were biased during irradiation, serial
numbers 1064-1068 were unbiased during irradiation and serial numbers 1069 and 1070 were used as
controls. See Appendix B for the radiation bias connection table.
Radiation and Electrical Test Increments: 50rad(Si)/s ionizing radiation with electrical test
increments: pre-irradiation, 20krad(Si), 50krad(Si), 100krad(Si) and 200krad(Si).
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD.
Overtest and Post-Irradiation Anneal: No overtest. No anneal.
Radiation Test Standard: MIL-STD 883 and/or MIL-STD-750 TM1019 (latest revision), Condition A.
Test Hardware and Software: LTS2020 Automated Tester, Entity ID TS03, Calibration Date: 04-2810, Calibration Due 04-28-11. LTS2101 Family Board, Entity ID FB02. LTS0600 Test Fixture, Entity
ID TF03. RH1498 DUT Board. Test Program: RH1498X.SRC
Facility and Radiation Source: Radiation Assured Devices' Longmire Laboratories, Colorado Springs,
CO. Gamma rays provided by JLSA 81-24 Co60 source. Dosimetry performed by Air Ionization
Chamber (AIC) traceable to NIST. RAD's dosimetry has been audited by DSCC and RAD has been
awarded Laboratory Suitability for MIL-STD-750 and MIL-STD-883 TM 1019.
Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883 and
MIL-STD-750.
RLAT Result: PASSED the total ionizing dose test to the maximum tested
dose level of 200krad(Si) with all parameters remaining within their
datasheet specifications.
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RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is
frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage
will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to
ensure a worst-case test condition MIL-STD-883 TM1019.8 calls out a dose rate of 50 to 300rad(Si)/s as
Condition A and further specifies that the time from the end of an incremental radiation exposure and
electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to
the beginning of the next incremental radiation step should be 2-hours or less. The work described in
this report was performed to meet MIL-STD-883 TM1019.8 Condition A.
2.0. Radiation Test Apparatus
The total ionizing dose testing described in this final report was performed using the facilities at
Radiation Assured Devices' Longmire Laboratories in Colorado Springs, CO. The high dose rate total
ionizing dose (TID) source is a JLSA 81-24 irradiator modified to provide a panoramic exposure. The
Co-60 rods are held in the base of the irradiator heavily shielded by lead. During the radiation exposures
the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for
this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately
120rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias boards
are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to
provide the required dose rate. The irradiator calibration is maintained by Radiation Assured Devices
Longmire Laboratories using air ionization chamber (AIC) equipment calibrated with traceability to the
National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA
81-24 Co-60 irradiator at RAD's Longmire Laboratory facility.
RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory Suitability
under MIL STD 750 and MIL-STD-883. Additional details regarding Radiation Assured Devices
dosimetry for TM1019 Condition A testing are available in RAD's report to DSCC entitled: "Dose Rate
Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured
Devices".
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RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 2.1. Radiation Assured Devices' high dose rate Co-60 irradiator. The dose rate is obtained by positioning
the device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from
approximately 120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet.
An ISO 9001:2008 and DSCC Certified Company
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RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
3.0. Radiation Test Conditions
The RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp described in this final
report were irradiated using a split 15V supply and with all pins tied to ground, that is biased and
unbiased. See the TID Bias Table in Appendix B for the full bias circuits. In our opinion, this bias circuit
satisfies the requirements of MIL-STD-883H TM1019.8 Section 3.9.3 Bias and Loading Conditions
which states "The bias applied to the test devices shall be selected to produce the greatest radiation
induced damage or the worst-case damage for the intended application, if known. While maximum
voltage is often worst case some bipolar linear device parameters (e.g. input bias current or maximum
output load current) exhibit more degradation with 0 V bias."
The devices were irradiated to a maximum total ionizing dose level of 200krad(Si) with incremental
readings at 20krad(Si), 50krad(Si) and 100krad(Si). Electrical testing occurred within one hour
following the end of each irradiation segment. For intermediate irradiations, the parts were tested and
returned to total dose exposure within two hours from the end of the previous radiation increment.
The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s
and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MILSTD-883H TM1019.8 Section 3.4 that reads as follows: "Lead/Aluminum (Pb/Al) container. Test
specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm
Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and
for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1)
initially, (2) when the source is changed, or (3) when the orientation or configuration of the source,
container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g.,
a TLD) in the device-irradiation container at the approximate test-device position. If it can be
demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors
due to dose enhancement, the Pb/Al container may be omitted."
The final dose rate within the high dose rate lead-aluminum enclosure was determined using calibration
calculations based on air ionization chamber (AIC) dosimetry performed just prior to beginning the total
dose irradiations. The final dose rate for this work was 50rad(Si)/s with a precision of ±5%.
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RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
4.0. Tested Parameters
During the total ionizing dose characterization testing the following electrical parameters were measured
pre- and post-irradiation:
Measured parameters and test conditions for VS=±15V:
1. +ICC (A) @ +/-15V
2. -IEE (A) @ +/-15V
3. V OFFSET (V) @ +/-15V VCM=0V (Op Amp A-B)
4. I OFFSET (A) @ +/-15V VCM=0V (Op Amp A-B)
5. I BIAS + (A) @ +/-15V VCM=0V (Op Amp A-B)
6. I BIAS - (A) @ +/-15V VCM=0V (Op Amp A-B)
7. V OFFSET (V) @ +/-15V VCM=15V (Op Amp A-B)
8. I OFFSET (A) @ +/-15V VCM=15V (Op Amp A-B)
9. I BIAS + (A) @ +/-15V VCM=15V (Op Amp A-B)
10. I BIAS - (A) @ +/-15V VCM=15V (Op Amp A-B)
11. V OFFSET (V) @ +/-15V VCM=-15V (Op Amp A-B)
12. I OFFSET (A) @ +/-15V VCM=-15V (Op Amp A-B)
13. I BIAS + (A) @ +/-15V VCM=-15V (Op Amp A-B)
14. I BIAS - (A) @ +/-15V VCM=-15V (Op Amp A-B)
15. +VOUT (V) IL=0MA @ +/-15V (Op Amp A-B)
16. +VOUT (V) IL=1MA @ +/-15V (Op Amp A-B)
17. +VOUT (V) IL=10MA @ +/-15V (Op Amp A-B)
18. -VOUT (V) IL=0MA @ +/-15V (Op Amp A-B)
19. -VOUT (V) IL=1MA @ +/-15V (Op Amp A-B)
20. -VOUT (V) IL=10MA @ +/-15V (Op Amp A-B)
21. AVOL (V/mV) RL=10K VO=+/-14.5V (Op Amp A-B)
22. AVOL (V/mV) RL=2K VO=+/-10V (Op Amp A-B)
23. CMRR (dB) @ +/-15V VCM=+/-15V (Op Amp A-B)
24. CMRR (dB) MATCHING
25. PSRR (dB) @ +/-2V TO +/-16V (Op Amp A-B)
26. PSRR (dB) MATCHING
27. +ISC (A) VOUT=0V @ +/-15V (Op Amp A-B)
28. -ISC (A) VOUT=0V @ +/-15V (Op Amp A-B)
Measured parameters and test conditions for VS=5V
29. +ICC (A) @ +5V
30. -IEE (A) @ +5V
31. V OFFSET (V) @ +5V VCM=0V (Op Amp A-B)
32. I OFFSET (A) @ +5V VCM=0V (Op Amp A-B)
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RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
33. I BIAS + (A) @ +5V VCM=0V (Op Amp A-B)
34. I BIAS - (A) @ +5V VCM=0V (Op Amp A-B)
35. V OFFSET (V) @ +5V VCM=5V (Op Amp A-B)
36. I OFFSET (A) @ +5V VCM=5V (Op Amp A-B)
37. I BIAS + (A) @ +5V VCM=5V (Op Amp A-B)
38. I BIAS - (A) @ +5V VCM=5V (Op Amp A-B)
39. +VOUT (V) IL=0MA @ +5V (Op Amp A-B)
40. +VOUT (V) IL=1MA @ +5V (Op Amp A-B)
41. +VOUT (V) IL=2.5MA @ +5V (Op Amp A-B)
42. -VOUT (V) IL=0MA @ +5V (Op Amp A-B)
43. -VOUT (V) IL=1MA @ +5V (Op Amp A-B)
44. -VOUT (V) IL=2.5MA @ +5V (Op Amp A-B)
45. AVOL (V/mV) RL=10K VO=75MV TO 4.8V (Op Amp A-B)
46. CMRR (dB) @ +5V VCM=0 TO +5V (Op Amp A-B)
47. CMRR (dB) MATCHING
48. PSRR (dB) @ +4.5V TO +12V (Op Amp A-B)
49. PSRR (dB) MATCHING @ +4.5V TO +12V (Op Amp A-B)
50. +ISC (A) VOUT=1/2 SUPPLY @ +5V (Op Amp A-B)
51. -ISC (A) VOUT=1/2 SUPPLY @ +5V (Op Amp A-B)
Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the total ionizing dose test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could
be logged as a failure.
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RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
5.0. Total Ionizing Dose Test Results
Based on this criterion the RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp
(from the lot traceability information provided on the first page of this test report) PASSED the total
ionizing dose test to the maximum tested dose level of 200krad(Si) with all parameters remaining within
their datasheet specifications.
Figures 5.1 through 5.94 show plots of all the measured parameters versus total ionizing dose while
Tables 5.1 - 5.94 show the corresponding raw data for each of these parameters. In the data plots the
solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all
pins tied to ground. The black lines (solid or dashed) are the average of the data points after application
of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
The control units, as expected, show no significant changes to any of the parameters. Therefore we can
conclude that the electrical testing remained in control throughout the duration of the tests and the
observed degradation was due to the radiation exposure. Appendix D lists the figures used in this section
to facilitate the location of a particular parameter.
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RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
6.00E-03
+ICC (A) @ +/-15V
5.00E-03
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.1. Plot of +ICC (A) @ +/-15V versus total dose. The solid diamonds are the average of the measured
data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the
measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the samples irradiated under electrical
bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
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Radiation Assured Devices
5017 N. 30th Street
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(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.1. Raw data for +ICC (A) @ +/-15V versus total dose, including the statistical analysis, specification and
the status of the testing (pass/fail).
+ICC (A) @ +/-15V
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
3.68E-03
3.64E-03
3.62E-03
3.66E-03
3.64E-03
3.65E-03
3.68E-03
3.64E-03
3.77E-03
3.58E-03
3.69E-03
3.70E-03
Total
20
3.58E-03
3.56E-03
3.53E-03
3.57E-03
3.55E-03
3.58E-03
3.60E-03
3.56E-03
3.68E-03
3.50E-03
3.64E-03
3.65E-03
Dose (krad(Si))
50
100
3.54E-03 3.50E-03
3.52E-03 3.50E-03
3.49E-03 3.46E-03
3.53E-03 3.50E-03
3.51E-03 3.48E-03
3.56E-03 3.52E-03
3.58E-03 3.54E-03
3.53E-03 3.49E-03
3.66E-03 3.62E-03
3.48E-03 3.44E-03
3.66E-03 3.66E-03
3.66E-03 3.67E-03
200
3.55E-03
3.49E-03
3.48E-03
3.49E-03
3.49E-03
3.43E-03
3.46E-03
3.40E-03
3.53E-03
3.35E-03
3.65E-03
3.66E-03
3.65E-03
2.28E-05
3.71E-03
3.59E-03
3.56E-03
1.92E-05
3.61E-03
3.51E-03
3.52E-03
1.92E-05
3.57E-03
3.47E-03
3.49E-03
1.79E-05
3.54E-03
3.44E-03
3.50E-03
2.83E-05
3.58E-03
3.42E-03
3.66E-03
6.95E-05
3.85E-03
3.47E-03
5.00E-03
PASS
3.58E-03
6.54E-05
3.76E-03
3.40E-03
5.00E-03
PASS
3.56E-03
6.65E-05
3.74E-03
3.38E-03
5.00E-03
PASS
3.52E-03
6.65E-05
3.70E-03
3.34E-03
5.00E-03
PASS
3.43E-03
6.73E-05
3.62E-03
3.25E-03
5.00E-03
PASS
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RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
0.00E+00
-IEE (A) @ +/-15V
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
-6.00E-03
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.2. Plot of -IEE (A) @ +/-15V versus total dose. The solid diamonds are the average of the measured data
points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured
data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
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RLAT Report
11-009 110509 R1.1
Table 5.2. Raw data for -IEE (A) @ +/-15V versus total dose, including the statistical analysis, specification and
the status of the testing (pass/fail).
-IEE (A) @ +/-15V
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-3.68E-03
-3.65E-03
-3.63E-03
-3.66E-03
-3.65E-03
-3.65E-03
-3.69E-03
-3.65E-03
-3.78E-03
-3.59E-03
-3.70E-03
-3.71E-03
Total
20
-3.59E-03
-3.57E-03
-3.54E-03
-3.57E-03
-3.55E-03
-3.59E-03
-3.61E-03
-3.57E-03
-3.69E-03
-3.51E-03
-3.65E-03
-3.66E-03
Dose (krad(Si))
50
100
-3.55E-03 -3.52E-03
-3.53E-03 -3.50E-03
-3.49E-03 -3.47E-03
-3.54E-03 -3.50E-03
-3.52E-03 -3.49E-03
-3.56E-03 -3.52E-03
-3.59E-03 -3.55E-03
-3.54E-03 -3.50E-03
-3.67E-03 -3.63E-03
-3.49E-03 -3.44E-03
-3.67E-03 -3.67E-03
-3.67E-03 -3.68E-03
200
-3.55E-03
-3.50E-03
-3.49E-03
-3.49E-03
-3.50E-03
-3.44E-03
-3.47E-03
-3.41E-03
-3.54E-03
-3.36E-03
-3.66E-03
-3.67E-03
-3.65E-03
1.82E-05
-3.60E-03
-3.70E-03
-3.56E-03
1.95E-05
-3.51E-03
-3.62E-03
-3.53E-03
2.30E-05
-3.46E-03
-3.59E-03
-3.50E-03
1.82E-05
-3.45E-03
-3.55E-03
-3.51E-03
2.51E-05
-3.44E-03
-3.57E-03
-3.67E-03
7.01E-05
-3.48E-03
-3.86E-03
-5.00E-03
PASS
-3.59E-03
6.54E-05
-3.41E-03
-3.77E-03
-5.00E-03
PASS
-3.57E-03
6.67E-05
-3.39E-03
-3.75E-03
-5.00E-03
PASS
-3.53E-03
6.98E-05
-3.34E-03
-3.72E-03
-5.00E-03
PASS
-3.44E-03
6.73E-05
-3.26E-03
-3.63E-03
-5.00E-03
PASS
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RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
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(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
V OFFSET (V) @ +/-15V VCM=0V A
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.3. Plot of V OFFSET (V) @ +/-15V VCM=0V A versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
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RLAT Report
11-009 110509 R1.1
Table 5.3. Raw data for V OFFSET (V) @ +/-15V VCM=0V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
V OFFSET (V) @ +/-15V VCM=0V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-1.81E-04
-1.78E-04
3.11E-04
-2.91E-04
-1.31E-04
1.36E-04
1.19E-04
2.68E-04
1.36E-04
-7.24E-05
-1.31E-04
1.48E-04
Total
20
-1.97E-04
-1.88E-04
2.90E-04
-3.04E-04
-1.51E-04
1.05E-04
8.55E-05
2.38E-04
1.03E-04
-1.04E-04
-1.41E-04
1.44E-04
Dose (krad(Si))
50
100
-1.93E-04 -1.89E-04
-1.83E-04 -1.81E-04
2.93E-04 3.01E-04
-2.90E-04 -2.79E-04
-1.55E-04 -1.57E-04
9.16E-05 8.75E-05
7.42E-05 6.74E-05
2.14E-04 2.09E-04
8.79E-05 8.14E-05
-1.16E-04 -1.25E-04
-1.37E-04 -1.37E-04
1.45E-04 1.45E-04
200
-1.83E-04
-1.83E-04
3.01E-04
-2.74E-04
-1.47E-04
7.78E-05
6.41E-05
2.11E-04
8.82E-05
-1.37E-04
-1.39E-04
1.44E-04
-9.41E-05
2.34E-04
5.48E-04
-7.36E-04
-1.10E-04
2.31E-04
5.23E-04
-7.43E-04
-1.06E-04
2.28E-04
5.20E-04
-7.31E-04
-1.01E-04
2.30E-04
5.29E-04
-7.30E-04
-9.72E-05
2.28E-04
5.27E-04
-7.22E-04
1.17E-04
1.22E-04
4.52E-04
-2.17E-04
-8.00E-04
PASS
8.00E-04
PASS
8.56E-05
1.23E-04
4.22E-04
-2.50E-04
-9.50E-04
PASS
9.50E-04
PASS
7.04E-05
1.19E-04
3.96E-04
-2.55E-04
-9.50E-04
PASS
9.50E-04
PASS
6.40E-05
1.20E-04
3.94E-04
-2.66E-04
-9.50E-04
PASS
9.50E-04
PASS
6.08E-05
1.25E-04
4.04E-04
-2.83E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
13
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
V OFFSET (V) @ +/-15V VCM=0V B
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.4. Plot of V OFFSET (V) @ +/-15V VCM=0V B versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
14
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.4. Raw data for V OFFSET (V) @ +/-15V VCM=0V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
V OFFSET (V) @ +/-15V VCM=0V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-7.24E-05
3.45E-04
9.14E-05
1.70E-04
-2.51E-04
-3.34E-04
-3.46E-05
-3.12E-04
-8.30E-05
2.31E-05
-2.07E-04
1.10E-04
Total
20
-9.08E-05
3.21E-04
6.29E-05
1.29E-04
-2.73E-04
-3.61E-04
-6.06E-05
-3.43E-04
-1.07E-04
-1.91E-05
-2.11E-04
1.05E-04
Dose (krad(Si))
50
100
-8.96E-05 -8.85E-05
3.25E-04 3.30E-04
6.34E-05 6.07E-05
1.26E-04 1.22E-04
-2.68E-04 -2.69E-04
-3.78E-04 -3.93E-04
-6.60E-05 -6.95E-05
-3.54E-04 -3.70E-04
-1.13E-04 -1.21E-04
-4.72E-05 -6.31E-05
-2.11E-04 -2.08E-04
1.06E-04 1.08E-04
200
-9.42E-05
3.33E-04
6.38E-05
1.18E-04
-2.71E-04
-3.97E-04
-5.94E-05
-3.71E-04
-1.26E-04
-9.26E-05
-2.12E-04
1.06E-04
5.65E-05
2.28E-04
6.82E-04
-5.69E-04
2.99E-05
2.25E-04
6.46E-04
-5.86E-04
3.12E-05
2.24E-04
6.45E-04
-5.82E-04
3.09E-05
2.25E-04
6.48E-04
-5.86E-04
2.98E-05
2.27E-04
6.53E-04
-5.94E-04
-1.48E-04
1.64E-04
3.02E-04
-5.98E-04
-8.00E-04
PASS
8.00E-04
PASS
-1.78E-04
1.62E-04
2.66E-04
-6.22E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.92E-04
1.61E-04
2.50E-04
-6.34E-04
-9.50E-04
PASS
9.50E-04
PASS
-2.03E-04
1.64E-04
2.48E-04
-6.54E-04
-9.50E-04
PASS
9.50E-04
PASS
-2.09E-04
1.61E-04
2.33E-04
-6.52E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
15
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I OFFSET (A) @ +/-15V VCM=0V A
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.5. Plot of I OFFSET (A) @ +/-15V VCM=0V A versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
16
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.5. Raw data for I OFFSET (A) @ +/-15V VCM=0V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I OFFSET (A) @ +/-15V VCM=0V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
3.06E-09
1.40E-09
3.31E-09
-4.32E-09
-1.53E-09
-1.28E-09
-2.44E-09
2.88E-09
2.23E-09
3.03E-09
-1.19E-09
1.43E-09
Total
20
2.98E-09
1.19E-09
2.48E-09
-4.99E-09
-1.89E-09
-1.44E-09
-3.04E-09
2.52E-09
2.29E-09
3.47E-09
-1.23E-09
1.43E-09
Dose (krad(Si))
50
100
2.68E-09 3.79E-09
1.24E-09 1.18E-09
4.01E-09 4.20E-09
-5.67E-09 -5.70E-09
-1.92E-09 -1.92E-09
-1.69E-09 -2.72E-09
-2.54E-09 -3.66E-09
1.86E-09 7.70E-10
2.20E-09 2.05E-09
3.11E-09 2.48E-09
-1.23E-09 -1.20E-09
1.41E-09 1.39E-09
200
3.33E-09
1.88E-09
4.91E-09
-5.64E-09
-2.06E-09
-3.99E-09
-1.57E-09
1.61E-09
2.17E-09
8.66E-10
-1.25E-09
1.39E-09
3.82E-10
3.26E-09
9.32E-09
-8.56E-09
-4.72E-11
3.35E-09
9.13E-09
-9.23E-09
6.90E-11
3.89E-09
1.07E-08
-1.06E-08
3.09E-10
4.16E-09
1.17E-08
-1.11E-08
4.85E-10
4.29E-09
1.22E-08
-1.13E-08
8.82E-10
2.56E-09
7.89E-09
-6.13E-09
-7.00E-08
PASS
7.00E-08
PASS
7.59E-10
2.83E-09
8.52E-09
-7.00E-09
-1.00E-07
PASS
1.00E-07
PASS
5.89E-10
2.52E-09
7.51E-09
-6.33E-09
-1.00E-07
PASS
1.00E-07
PASS
-2.16E-10
2.80E-09
7.47E-09
-7.91E-09
-1.00E-07
PASS
1.00E-07
PASS
-1.83E-10
2.56E-09
6.84E-09
-7.20E-09
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
17
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I OFFSET (A) @ +/-15V VCM=0V B
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.6. Plot of I OFFSET (A) @ +/-15V VCM=0V B versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
18
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.6. Raw data for I OFFSET (A) @ +/-15V VCM=0V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I OFFSET (A) @ +/-15V VCM=0V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
2.45E-09
2.80E-09
1.87E-09
-1.23E-09
-2.80E-10
-3.37E-09
1.70E-10
-5.20E-09
-3.69E-09
-1.43E-09
-4.42E-09
3.80E-09
Total
20
2.58E-09
2.56E-09
1.09E-09
-2.11E-09
-6.11E-10
-2.97E-09
2.49E-10
-5.35E-09
-3.68E-09
-1.96E-09
-4.53E-09
3.85E-09
Dose (krad(Si))
50
100
2.12E-09 1.43E-09
2.19E-09 1.37E-09
-3.09E-10 -4.79E-10
-1.18E-09 -1.22E-09
-6.03E-10 -8.27E-10
-3.38E-09 -2.88E-09
6.26E-10 1.33E-09
-5.49E-09 -3.88E-09
-4.00E-09 -4.56E-09
-2.28E-09 -2.22E-09
-4.54E-09 -4.50E-09
3.82E-09 3.81E-09
200
2.02E-09
5.52E-10
-2.07E-09
-1.11E-09
-1.44E-09
-2.29E-09
1.47E-09
-3.72E-09
-3.55E-09
-3.31E-09
-4.53E-09
3.84E-09
1.12E-09
1.78E-09
5.99E-09
-3.75E-09
7.00E-10
2.05E-09
6.31E-09
-4.91E-09
4.43E-10
1.59E-09
4.81E-09
-3.92E-09
5.32E-11
1.25E-09
3.49E-09
-3.38E-09
-4.10E-10
1.67E-09
4.16E-09
-4.98E-09
-2.71E-09
2.09E-09
3.03E-09
-8.44E-09
-7.00E-08
PASS
7.00E-08
PASS
-2.74E-09
2.08E-09
2.96E-09
-8.44E-09
-1.00E-07
PASS
1.00E-07
PASS
-2.91E-09
2.29E-09
3.37E-09
-9.18E-09
-1.00E-07
PASS
1.00E-07
PASS
-2.44E-09
2.29E-09
3.84E-09
-8.72E-09
-1.00E-07
PASS
1.00E-07
PASS
-2.28E-09
2.17E-09
3.66E-09
-8.22E-09
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
19
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I BIAS + (A) @ +/-15V VCM=0V A
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.7. Plot of I BIAS + (A) @ +/-15V VCM=0V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
20
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.7. Raw data for I BIAS + (A) @ +/-15V VCM=0V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I BIAS + (A) @ +/-15V VCM=0V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-2.43E-07
-2.62E-07
-2.49E-07
-2.72E-07
-2.54E-07
-2.55E-07
-2.59E-07
-2.50E-07
-2.82E-07
-2.48E-07
-2.81E-07
-2.63E-07
Total
20
-2.58E-07
-2.75E-07
-2.64E-07
-2.86E-07
-2.68E-07
-2.74E-07
-2.78E-07
-2.70E-07
-3.02E-07
-2.67E-07
-2.87E-07
-2.68E-07
Dose (krad(Si))
50
100
-2.68E-07 -2.83E-07
-2.86E-07 -3.00E-07
-2.73E-07 -2.88E-07
-2.94E-07 -3.07E-07
-2.78E-07 -2.91E-07
-2.90E-07 -3.12E-07
-2.92E-07 -3.11E-07
-2.87E-07 -3.07E-07
-3.16E-07 -3.35E-07
-2.81E-07 -3.00E-07
-2.85E-07 -2.85E-07
-2.66E-07 -2.66E-07
200
-3.09E-07
-3.26E-07
-3.17E-07
-3.34E-07
-3.20E-07
-3.49E-07
-3.39E-07
-3.39E-07
-3.73E-07
-3.33E-07
-2.86E-07
-2.67E-07
-2.56E-07
1.14E-08
-2.25E-07
-2.87E-07
-2.70E-07
1.08E-08
-2.41E-07
-3.00E-07
-2.80E-07
1.04E-08
-2.51E-07
-3.09E-07
-2.94E-07
9.62E-09
-2.67E-07
-3.20E-07
-3.21E-07
9.46E-09
-2.95E-07
-3.47E-07
-2.59E-07
1.36E-08
-2.21E-07
-2.96E-07
-7.15E-07
PASS
7.15E-07
PASS
-2.78E-07
1.41E-08
-2.40E-07
-3.17E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.93E-07
1.34E-08
-2.56E-07
-3.30E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.13E-07
1.32E-08
-2.77E-07
-3.49E-07
-9.15E-07
PASS
9.15E-07
PASS
-3.47E-07
1.57E-08
-3.04E-07
-3.90E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
21
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I BIAS + (A) @ +/-15V VCM=0V B
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.8. Plot of I BIAS + (A) @ +/-15V VCM=0V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
22
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.8. Raw data for I BIAS + (A) @ +/-15V VCM=0V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I BIAS + (A) @ +/-15V VCM=0V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-2.47E-07
-2.61E-07
-2.51E-07
-2.67E-07
-2.52E-07
-2.55E-07
-2.61E-07
-2.54E-07
-2.79E-07
-2.43E-07
-2.78E-07
-2.62E-07
Total
20
-2.61E-07
-2.72E-07
-2.65E-07
-2.81E-07
-2.66E-07
-2.73E-07
-2.78E-07
-2.73E-07
-2.99E-07
-2.61E-07
-2.83E-07
-2.67E-07
Dose (krad(Si))
50
100
-2.71E-07 -2.88E-07
-2.82E-07 -2.94E-07
-2.76E-07 -2.91E-07
-2.88E-07 -3.01E-07
-2.77E-07 -2.90E-07
-2.88E-07 -3.09E-07
-2.92E-07 -3.08E-07
-2.89E-07 -3.08E-07
-3.11E-07 -3.29E-07
-2.76E-07 -2.94E-07
-2.82E-07 -2.81E-07
-2.65E-07 -2.65E-07
200
-3.12E-07
-3.22E-07
-3.21E-07
-3.27E-07
-3.19E-07
-3.41E-07
-3.36E-07
-3.39E-07
-3.63E-07
-3.25E-07
-2.82E-07
-2.66E-07
-2.55E-07
8.07E-09
-2.33E-07
-2.77E-07
-2.69E-07
7.53E-09
-2.48E-07
-2.90E-07
-2.79E-07
6.36E-09
-2.61E-07
-2.96E-07
-2.93E-07
5.22E-09
-2.78E-07
-3.07E-07
-3.20E-07
5.22E-09
-3.06E-07
-3.35E-07
-2.58E-07
1.32E-08
-2.22E-07
-2.95E-07
-7.15E-07
PASS
7.15E-07
PASS
-2.77E-07
1.37E-08
-2.39E-07
-3.15E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.91E-07
1.29E-08
-2.56E-07
-3.26E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.10E-07
1.27E-08
-2.75E-07
-3.44E-07
-9.15E-07
PASS
9.15E-07
PASS
-3.41E-07
1.39E-08
-3.03E-07
-3.79E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
23
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I BIAS - (A) @ +/-15V VCM=0V A
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.9. Plot of I BIAS - (A) @ +/-15V VCM=0V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
24
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.9. Raw data for I BIAS - (A) @ +/-15V VCM=0V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I BIAS - (A) @ +/-15V VCM=0V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-2.46E-07
-2.64E-07
-2.52E-07
-2.67E-07
-2.52E-07
-2.54E-07
-2.57E-07
-2.53E-07
-2.84E-07
-2.51E-07
-2.80E-07
-2.64E-07
Total
20
-2.61E-07
-2.77E-07
-2.66E-07
-2.81E-07
-2.66E-07
-2.73E-07
-2.75E-07
-2.72E-07
-3.04E-07
-2.70E-07
-2.85E-07
-2.69E-07
Dose (krad(Si))
50
100
-2.71E-07 -2.87E-07
-2.87E-07 -3.01E-07
-2.77E-07 -2.92E-07
-2.88E-07 -3.01E-07
-2.76E-07 -2.90E-07
-2.88E-07 -3.09E-07
-2.89E-07 -3.06E-07
-2.88E-07 -3.08E-07
-3.18E-07 -3.36E-07
-2.83E-07 -3.03E-07
-2.84E-07 -2.84E-07
-2.67E-07 -2.67E-07
200
-3.12E-07
-3.28E-07
-3.22E-07
-3.28E-07
-3.18E-07
-3.40E-07
-3.37E-07
-3.41E-07
-3.75E-07
-3.33E-07
-2.85E-07
-2.69E-07
-2.56E-07
9.02E-09
-2.32E-07
-2.81E-07
-2.70E-07
8.20E-09
-2.48E-07
-2.93E-07
-2.80E-07
7.62E-09
-2.59E-07
-3.01E-07
-2.94E-07
6.58E-09
-2.76E-07
-3.12E-07
-3.22E-07
6.80E-09
-3.03E-07
-3.40E-07
-2.60E-07
1.37E-08
-2.22E-07
-2.97E-07
-7.15E-07
PASS
7.15E-07
PASS
-2.79E-07
1.42E-08
-2.40E-07
-3.18E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.93E-07
1.39E-08
-2.55E-07
-3.31E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.12E-07
1.36E-08
-2.75E-07
-3.50E-07
-9.15E-07
PASS
9.15E-07
PASS
-3.45E-07
1.69E-08
-2.99E-07
-3.91E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
25
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I BIAS - (A) @ +/-15V VCM=0V B
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.10. Plot of I BIAS - (A) @ +/-15V VCM=0V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
26
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.10. Raw data for I BIAS - (A) @ +/-15V VCM=0V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I BIAS - (A) @ +/-15V VCM=0V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-2.49E-07
-2.63E-07
-2.53E-07
-2.65E-07
-2.51E-07
-2.52E-07
-2.61E-07
-2.49E-07
-2.75E-07
-2.41E-07
-2.73E-07
-2.66E-07
Total
20
-2.64E-07
-2.75E-07
-2.66E-07
-2.78E-07
-2.66E-07
-2.70E-07
-2.78E-07
-2.68E-07
-2.95E-07
-2.59E-07
-2.78E-07
-2.70E-07
Dose (krad(Si))
50
100
-2.73E-07 -2.89E-07
-2.84E-07 -2.96E-07
-2.76E-07 -2.90E-07
-2.87E-07 -3.00E-07
-2.76E-07 -2.89E-07
-2.84E-07 -3.06E-07
-2.92E-07 -3.09E-07
-2.83E-07 -3.04E-07
-3.07E-07 -3.24E-07
-2.73E-07 -2.92E-07
-2.77E-07 -2.77E-07
-2.69E-07 -2.69E-07
200
-3.14E-07
-3.22E-07
-3.18E-07
-3.26E-07
-3.18E-07
-3.37E-07
-3.38E-07
-3.34E-07
-3.62E-07
-3.21E-07
-2.78E-07
-2.70E-07
-2.56E-07
7.40E-09
-2.36E-07
-2.77E-07
-2.70E-07
6.28E-09
-2.53E-07
-2.87E-07
-2.79E-07
5.90E-09
-2.63E-07
-2.95E-07
-2.93E-07
4.68E-09
-2.80E-07
-3.06E-07
-3.20E-07
4.40E-09
-3.08E-07
-3.32E-07
-2.55E-07
1.30E-08
-2.20E-07
-2.91E-07
-7.15E-07
PASS
7.15E-07
PASS
-2.74E-07
1.34E-08
-2.37E-07
-3.11E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.88E-07
1.26E-08
-2.53E-07
-3.23E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.07E-07
1.17E-08
-2.75E-07
-3.39E-07
-9.15E-07
PASS
9.15E-07
PASS
-3.39E-07
1.48E-08
-2.98E-07
-3.79E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
27
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
V OFFSET (V) @ +/-15V VCM=15V A
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.11. Plot of V OFFSET (V) @ +/-15V VCM=15V A versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
28
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.11. Raw data for V OFFSET (V) @ +/-15V VCM=15V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
V OFFSET (V) @ +/-15V VCM=15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
1.97E-04
7.02E-05
3.76E-04
-5.15E-05
-7.64E-05
1.89E-04
2.95E-04
3.74E-04
8.86E-05
1.80E-04
2.29E-04
2.78E-04
Total
20
1.73E-04
5.81E-05
3.57E-04
-5.69E-05
-9.74E-05
1.71E-04
2.68E-04
3.48E-04
6.37E-05
1.54E-04
2.18E-04
2.75E-04
Dose (krad(Si))
50
100
1.78E-04 1.84E-04
6.49E-05 7.29E-05
3.64E-04 3.78E-04
-4.21E-05 -2.70E-05
-9.58E-05 -8.76E-05
1.70E-04 1.78E-04
2.64E-04 2.63E-04
3.36E-04 3.37E-04
5.32E-05 4.99E-05
1.47E-04 1.44E-04
2.21E-04 2.22E-04
2.76E-04 2.75E-04
200
2.03E-04
8.27E-05
3.93E-04
-1.53E-05
-6.97E-05
1.88E-04
2.66E-04
3.33E-04
5.19E-05
1.33E-04
2.20E-04
2.75E-04
1.03E-04
1.87E-04
6.16E-04
-4.11E-04
8.68E-05
1.84E-04
5.92E-04
-4.18E-04
9.37E-05
1.84E-04
5.98E-04
-4.11E-04
1.04E-04
1.85E-04
6.11E-04
-4.02E-04
1.19E-04
1.85E-04
6.26E-04
-3.89E-04
2.25E-04
1.11E-04
5.29E-04
-7.82E-05
-8.00E-04
PASS
8.00E-04
PASS
2.01E-04
1.10E-04
5.01E-04
-9.95E-05
-9.50E-04
PASS
9.50E-04
PASS
1.94E-04
1.09E-04
4.93E-04
-1.05E-04
-9.50E-04
PASS
9.50E-04
PASS
1.94E-04
1.10E-04
4.97E-04
-1.08E-04
-9.50E-04
PASS
9.50E-04
PASS
1.94E-04
1.10E-04
4.96E-04
-1.07E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
29
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
V OFFSET (V) @ +/-15V VCM=15V B
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.12. Plot of V OFFSET (V) @ +/-15V VCM=15V B versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
30
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.12. Raw data for V OFFSET (V) @ +/-15V VCM=15V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
V OFFSET (V) @ +/-15V VCM=15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
1.88E-04
4.34E-04
2.46E-04
-2.49E-05
1.31E-04
2.57E-05
7.89E-05
-6.28E-06
5.90E-05
2.53E-04
-1.93E-04
1.40E-04
Total
20
1.69E-04
4.13E-04
2.28E-04
-4.77E-05
1.11E-04
2.53E-06
6.35E-05
-3.16E-05
3.81E-05
2.24E-04
-1.95E-04
1.39E-04
Dose (krad(Si))
50
100
1.75E-04 1.82E-04
4.21E-04 4.31E-04
2.36E-04 2.44E-04
-4.44E-05 -4.12E-05
1.20E-04 1.26E-04
-9.66E-06 -2.23E-05
6.24E-05 6.80E-05
-4.23E-05 -5.50E-05
3.79E-05 3.02E-05
2.10E-04 2.06E-04
-1.94E-04 -1.93E-04
1.39E-04 1.39E-04
200
1.95E-04
4.45E-04
2.62E-04
-2.73E-05
1.35E-04
-3.53E-05
8.26E-05
-5.72E-05
3.21E-05
1.95E-04
-1.96E-04
1.38E-04
1.95E-04
1.68E-04
6.54E-04
-2.65E-04
1.74E-04
1.68E-04
6.35E-04
-2.86E-04
1.81E-04
1.70E-04
6.46E-04
-2.84E-04
1.88E-04
1.72E-04
6.60E-04
-2.84E-04
2.02E-04
1.73E-04
6.77E-04
-2.72E-04
8.20E-05
1.01E-04
3.58E-04
-1.94E-04
-8.00E-04
PASS
8.00E-04
PASS
5.93E-05
9.88E-05
3.30E-04
-2.12E-04
-9.50E-04
PASS
9.50E-04
PASS
5.17E-05
9.76E-05
3.19E-04
-2.16E-04
-9.50E-04
PASS
9.50E-04
PASS
4.54E-05
1.02E-04
3.24E-04
-2.33E-04
-9.50E-04
PASS
9.50E-04
PASS
4.35E-05
1.01E-04
3.21E-04
-2.34E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
31
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I OFFSET (A) @ +/-15V VCM=15V A
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.13. Plot of I OFFSET (A) @ +/-15V VCM=15V A versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
32
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.13. Raw data for I OFFSET (A) @ +/-15V VCM=15V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
I OFFSET (A) @ +/-15V VCM=15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
5.68E-09
2.18E-09
8.99E-09
1.78E-09
-1.33E-08
6.96E-09
-3.12E-09
1.98E-09
-1.20E-10
1.33E-08
-5.60E-10
2.01E-09
Total
20
5.19E-09
1.41E-09
8.89E-09
-4.99E-10
-1.40E-08
7.14E-09
-2.55E-09
9.01E-10
-1.20E-09
1.38E-08
-7.03E-10
1.93E-09
Dose (krad(Si))
50
100
6.58E-09 7.55E-09
1.44E-09 1.77E-09
9.68E-09 1.17E-08
-1.27E-09 -1.59E-09
-1.29E-08 -9.23E-09
6.02E-09 6.94E-09
-2.22E-09 -1.83E-09
2.51E-09 2.32E-09
-2.82E-09 -5.33E-09
1.28E-08 1.35E-08
-7.31E-10 -7.82E-10
1.83E-09 1.83E-09
200
6.66E-09
3.23E-09
1.25E-08
-1.78E-09
-9.28E-09
9.60E-09
5.07E-10
1.95E-09
-8.24E-09
8.54E-09
-8.07E-10
1.82E-09
1.07E-09
8.53E-09
2.45E-08
-2.23E-08
1.92E-10
8.73E-09
2.41E-08
-2.37E-08
7.11E-10
8.71E-09
2.46E-08
-2.32E-08
2.05E-09
8.14E-09
2.44E-08
-2.03E-08
2.28E-09
8.30E-09
2.50E-08
-2.05E-08
3.81E-09
6.47E-09
2.16E-08
-1.39E-08
-7.00E-08
PASS
7.00E-08
PASS
3.61E-09
6.78E-09
2.22E-08
-1.50E-08
-1.00E-07
PASS
1.00E-07
PASS
3.25E-09
6.43E-09
2.09E-08
-1.44E-08
-1.00E-07
PASS
1.00E-07
PASS
3.11E-09
7.39E-09
2.34E-08
-1.71E-08
-1.00E-07
PASS
1.00E-07
PASS
2.47E-09
7.18E-09
2.22E-08
-1.72E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
33
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I OFFSET (A) @ +/-15V VCM=15V B
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.14. Plot of I OFFSET (A) @ +/-15V VCM=15V B versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
34
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.14. Raw data for I OFFSET (A) @ +/-15V VCM=15V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
I OFFSET (A) @ +/-15V VCM=15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
1.22E-09
6.50E-11
-2.45E-09
-1.65E-10
1.07E-08
1.43E-08
3.53E-10
1.16E-09
6.87E-09
1.62E-08
-3.66E-10
2.58E-08
Total
20
4.07E-09
-9.02E-10
-4.94E-09
-2.33E-09
1.10E-08
1.42E-08
4.22E-10
4.41E-10
4.41E-09
1.80E-08
-3.97E-10
2.82E-08
Dose (krad(Si))
50
100
5.67E-09 8.41E-09
-1.00E-10 -4.39E-10
-5.36E-09 -4.54E-09
-2.35E-09 -5.04E-09
1.03E-08 9.33E-09
1.22E-08 1.33E-08
-4.21E-09 -3.24E-09
-2.45E-10 1.09E-09
5.73E-09 6.18E-09
1.73E-08 2.04E-08
-4.82E-10 -5.04E-10
2.72E-08 2.72E-08
200
1.10E-08
1.34E-10
-6.09E-09
-4.43E-10
1.26E-08
1.06E-08
-3.67E-09
1.88E-09
3.04E-09
1.78E-08
-5.41E-10
2.76E-08
1.88E-09
5.12E-09
1.59E-08
-1.22E-08
1.39E-09
6.31E-09
1.87E-08
-1.59E-08
1.64E-09
6.32E-09
1.90E-08
-1.57E-08
1.54E-09
6.93E-09
2.05E-08
-1.75E-08
3.43E-09
8.01E-09
2.54E-08
-1.85E-08
7.78E-09
7.31E-09
2.78E-08
-1.23E-08
-7.00E-08
PASS
7.00E-08
PASS
7.50E-09
8.15E-09
2.98E-08
-1.48E-08
-1.00E-07
PASS
1.00E-07
PASS
6.17E-09
8.81E-09
3.03E-08
-1.80E-08
-1.00E-07
PASS
1.00E-07
PASS
7.54E-09
9.46E-09
3.35E-08
-1.84E-08
-1.00E-07
PASS
1.00E-07
PASS
5.92E-09
8.35E-09
2.88E-08
-1.70E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
35
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I BIAS + (A) @ +/-15V VCM=15V A
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.15. Plot of I BIAS + (A) @ +/-15V VCM=15V A versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
36
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.15. Raw data for I BIAS + (A) @ +/-15V VCM=15V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
I BIAS + (A) @ +/-15V VCM=15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
3.88E-07
4.07E-07
4.05E-07
4.19E-07
3.94E-07
4.05E-07
4.09E-07
3.93E-07
4.39E-07
4.00E-07
4.13E-07
4.18E-07
Total
20
4.48E-07
4.64E-07
4.72E-07
4.80E-07
4.52E-07
4.80E-07
4.78E-07
4.72E-07
5.16E-07
4.74E-07
4.16E-07
4.19E-07
Dose (krad(Si))
50
100
5.18E-07 5.97E-07
5.36E-07 6.12E-07
5.47E-07 6.31E-07
5.49E-07 6.26E-07
5.17E-07 5.90E-07
5.59E-07 6.44E-07
5.56E-07 6.29E-07
5.57E-07 6.32E-07
5.99E-07 6.77E-07
5.53E-07 6.26E-07
4.16E-07 4.16E-07
4.20E-07 4.20E-07
4.03E-07
1.20E-08
4.36E-07
3.70E-07
4.63E-07
1.32E-08
4.99E-07
4.27E-07
5.34E-07
1.51E-08
5.75E-07
4.92E-07
6.11E-07
1.77E-08
6.60E-07
5.63E-07
7.20E-07
2.11E-08
7.78E-07
6.62E-07
4.09E-07
1.79E-08
4.58E-07
3.60E-07
-7.15E-07
PASS
7.15E-07
PASS
4.84E-07
1.84E-08
5.34E-07
4.34E-07
-8.15E-07
PASS
8.15E-07
PASS
5.65E-07
1.92E-08
6.18E-07
5.12E-07
-8.65E-07
PASS
8.65E-07
PASS
6.42E-07
2.07E-08
6.98E-07
5.85E-07
-9.15E-07
PASS
9.15E-07
PASS
7.34E-07
2.11E-08
7.92E-07
6.76E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
37
200
7.03E-07
7.17E-07
7.43E-07
7.40E-07
6.97E-07
7.34E-07
7.27E-07
7.22E-07
7.70E-07
7.17E-07
4.13E-07
4.19E-07
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I BIAS + (A) @ +/-15V VCM=15V B
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.16. Plot of I BIAS + (A) @ +/-15V VCM=15V B versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
38
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.16. Raw data for I BIAS + (A) @ +/-15V VCM=15V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
I BIAS + (A) @ +/-15V VCM=15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
3.94E-07
3.90E-07
3.97E-07
4.19E-07
4.00E-07
4.03E-07
4.17E-07
4.04E-07
4.44E-07
3.99E-07
4.08E-07
4.46E-07
Total
20
4.53E-07
4.46E-07
4.58E-07
4.83E-07
4.58E-07
4.77E-07
4.86E-07
4.82E-07
5.16E-07
4.73E-07
4.10E-07
4.52E-07
Dose (krad(Si))
50
100
5.23E-07 6.04E-07
5.17E-07 5.92E-07
5.36E-07 6.16E-07
5.55E-07 6.28E-07
5.25E-07 5.96E-07
5.56E-07 6.38E-07
5.64E-07 6.43E-07
5.65E-07 6.40E-07
5.98E-07 6.76E-07
5.53E-07 6.28E-07
4.12E-07 4.12E-07
4.51E-07 4.49E-07
4.00E-07
1.14E-08
4.31E-07
3.68E-07
4.59E-07
1.39E-08
4.98E-07
4.21E-07
5.31E-07
1.47E-08
5.71E-07
4.91E-07
6.07E-07
1.50E-08
6.48E-07
5.66E-07
7.17E-07
1.83E-08
7.67E-07
6.67E-07
4.13E-07
1.85E-08
4.64E-07
3.63E-07
-7.15E-07
PASS
7.15E-07
PASS
4.87E-07
1.72E-08
5.34E-07
4.39E-07
-8.15E-07
PASS
8.15E-07
PASS
5.67E-07
1.80E-08
6.17E-07
5.18E-07
-8.65E-07
PASS
8.65E-07
PASS
6.45E-07
1.84E-08
6.95E-07
5.94E-07
-9.15E-07
PASS
9.15E-07
PASS
7.37E-07
2.34E-08
8.01E-07
6.73E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
39
200
7.13E-07
6.97E-07
7.31E-07
7.41E-07
7.04E-07
7.25E-07
7.33E-07
7.35E-07
7.77E-07
7.16E-07
4.09E-07
4.49E-07
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I BIAS - (A) @ +/-15V VCM=15V A
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.17. Plot of I BIAS - (A) @ +/-15V VCM=15V A versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
40
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.17. Raw data for I BIAS - (A) @ +/-15V VCM=15V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
I BIAS - (A) @ +/-15V VCM=15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
3.81E-07
4.04E-07
3.95E-07
4.15E-07
4.05E-07
3.97E-07
4.08E-07
3.91E-07
4.37E-07
3.85E-07
4.12E-07
4.15E-07
Total
20
4.38E-07
4.61E-07
4.59E-07
4.77E-07
4.63E-07
4.70E-07
4.77E-07
4.70E-07
5.15E-07
4.60E-07
4.13E-07
4.17E-07
Dose (krad(Si))
50
100
5.08E-07 5.88E-07
5.34E-07 6.08E-07
5.36E-07 6.17E-07
5.50E-07 6.27E-07
5.28E-07 5.96E-07
5.52E-07 6.32E-07
5.56E-07 6.34E-07
5.54E-07 6.27E-07
5.96E-07 6.80E-07
5.38E-07 6.13E-07
4.15E-07 4.14E-07
4.17E-07 4.16E-07
4.00E-07
1.29E-08
4.36E-07
3.65E-07
4.60E-07
1.40E-08
4.98E-07
4.21E-07
5.31E-07
1.51E-08
5.73E-07
4.90E-07
6.07E-07
1.55E-08
6.50E-07
5.64E-07
7.16E-07
1.83E-08
7.66E-07
6.66E-07
4.04E-07
2.04E-08
4.60E-07
3.48E-07
-7.15E-07
PASS
7.15E-07
PASS
4.78E-07
2.14E-08
5.37E-07
4.20E-07
-8.15E-07
PASS
8.15E-07
PASS
5.59E-07
2.20E-08
6.19E-07
4.99E-07
-8.65E-07
PASS
8.65E-07
PASS
6.37E-07
2.52E-08
7.06E-07
5.68E-07
-9.15E-07
PASS
9.15E-07
PASS
7.30E-07
2.78E-08
8.06E-07
6.53E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
41
200
6.95E-07
7.13E-07
7.29E-07
7.40E-07
7.04E-07
7.25E-07
7.25E-07
7.18E-07
7.77E-07
7.03E-07
4.13E-07
4.15E-07
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I BIAS - (A) @ +/-15V VCM=15V B
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.18. Plot of I BIAS - (A) @ +/-15V VCM=15V B versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
42
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.18. Raw data for I BIAS - (A) @ +/-15V VCM=15V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
I BIAS - (A) @ +/-15V VCM=15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
3.89E-07
3.88E-07
3.95E-07
4.20E-07
3.88E-07
3.88E-07
4.15E-07
4.01E-07
4.35E-07
3.82E-07
4.07E-07
4.19E-07
Total
20
4.45E-07
4.43E-07
4.60E-07
4.82E-07
4.44E-07
4.60E-07
4.85E-07
4.79E-07
5.09E-07
4.55E-07
4.08E-07
4.22E-07
Dose (krad(Si))
50
100
5.14E-07 5.95E-07
5.15E-07 5.90E-07
5.40E-07 6.22E-07
5.55E-07 6.32E-07
5.12E-07 5.84E-07
5.43E-07 6.23E-07
5.68E-07 6.41E-07
5.62E-07 6.42E-07
5.89E-07 6.72E-07
5.35E-07 6.05E-07
4.09E-07 4.09E-07
4.22E-07 4.20E-07
3.96E-07
1.37E-08
4.33E-07
3.59E-07
4.55E-07
1.66E-08
5.01E-07
4.09E-07
5.27E-07
1.92E-08
5.80E-07
4.75E-07
6.05E-07
2.11E-08
6.62E-07
5.47E-07
7.13E-07
2.41E-08
7.79E-07
6.47E-07
4.04E-07
2.15E-08
4.63E-07
3.45E-07
-7.15E-07
PASS
7.15E-07
PASS
4.78E-07
2.18E-08
5.37E-07
4.18E-07
-8.15E-07
PASS
8.15E-07
PASS
5.59E-07
2.13E-08
6.18E-07
5.01E-07
-8.65E-07
PASS
8.65E-07
PASS
6.37E-07
2.48E-08
7.05E-07
5.68E-07
-9.15E-07
PASS
9.15E-07
PASS
7.29E-07
2.72E-08
8.04E-07
6.55E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
43
200
7.02E-07
6.94E-07
7.36E-07
7.42E-07
6.92E-07
7.15E-07
7.32E-07
7.28E-07
7.71E-07
6.98E-07
4.09E-07
4.21E-07
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
V OFFSET (V) @ +/-15V VCM=-15V A
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.19. Plot of V OFFSET (V) @ +/-15V VCM=-15V A versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
44
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.19. Raw data for V OFFSET (V) @ +/-15V VCM=-15V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
V OFFSET (V) @ +/-15V VCM=-15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-2.79E-04
-1.70E-04
2.67E-04
-2.88E-04
-4.33E-05
2.63E-04
1.85E-04
2.30E-04
1.02E-04
-5.25E-05
-9.85E-05
1.54E-04
Total
20
-2.94E-04
-1.82E-04
2.45E-04
-3.00E-04
-6.41E-05
2.30E-04
1.51E-04
1.98E-04
6.99E-05
-8.12E-05
-1.08E-04
1.49E-04
Dose (krad(Si))
50
100
-2.89E-04 -2.85E-04
-1.77E-04 -1.76E-04
2.47E-04 2.55E-04
-2.89E-04 -2.76E-04
-6.92E-05 -6.88E-05
2.18E-04 2.12E-04
1.38E-04 1.30E-04
1.77E-04 1.72E-04
5.55E-05 5.07E-05
-9.66E-05 -1.05E-04
-1.04E-04 -1.04E-04
1.50E-04 1.51E-04
200
-2.82E-04
-1.78E-04
2.53E-04
-2.71E-04
-6.27E-05
1.97E-04
1.24E-04
1.75E-04
5.33E-05
-1.13E-04
-1.07E-04
1.48E-04
-1.03E-04
2.29E-04
5.26E-04
-7.31E-04
-1.19E-04
2.25E-04
4.98E-04
-7.36E-04
-1.15E-04
2.22E-04
4.94E-04
-7.25E-04
-1.10E-04
2.22E-04
4.99E-04
-7.19E-04
-1.08E-04
2.20E-04
4.96E-04
-7.12E-04
1.46E-04
1.26E-04
4.92E-04
-2.00E-04
-8.00E-04
PASS
8.00E-04
PASS
1.13E-04
1.24E-04
4.54E-04
-2.27E-04
-9.50E-04
PASS
9.50E-04
PASS
9.83E-05
1.24E-04
4.39E-04
-2.43E-04
-9.50E-04
PASS
9.50E-04
PASS
9.19E-05
1.25E-04
4.35E-04
-2.51E-04
-9.50E-04
PASS
9.50E-04
PASS
8.73E-05
1.25E-04
4.30E-04
-2.55E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
45
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
V OFFSET (V) @ +/-15V VCM=-15V B
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.20. Plot of V OFFSET (V) @ +/-15V VCM=-15V B versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
46
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.20. Raw data for V OFFSET (V) @ +/-15V VCM=-15V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
V OFFSET (V) @ +/-15V VCM=-15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-1.05E-04
3.28E-04
1.65E-04
1.83E-04
-2.32E-04
-3.28E-04
2.84E-05
-3.29E-04
-5.96E-05
1.69E-04
-1.20E-04
1.24E-04
Total
20
-1.23E-04
3.04E-04
1.37E-04
1.41E-04
-2.56E-04
-3.54E-04
1.80E-06
-3.57E-04
-8.51E-05
1.23E-04
-1.27E-04
1.19E-04
Dose (krad(Si))
50
100
-1.22E-04 -1.20E-04
3.07E-04 3.12E-04
1.35E-04 1.33E-04
1.38E-04 1.31E-04
-2.49E-04 -2.53E-04
-3.70E-04 -3.86E-04
-3.39E-06 -5.92E-06
-3.74E-04 -3.88E-04
-9.01E-05 -1.00E-04
9.81E-05 7.86E-05
-1.27E-04 -1.23E-04
1.21E-04 1.21E-04
200
-1.30E-04
3.12E-04
1.35E-04
1.28E-04
-2.56E-04
-3.94E-04
1.80E-06
-3.89E-04
-9.98E-05
4.69E-05
-1.28E-04
1.20E-04
6.78E-05
2.29E-04
6.96E-04
-5.61E-04
4.05E-05
2.25E-04
6.59E-04
-5.78E-04
4.19E-05
2.23E-04
6.54E-04
-5.71E-04
4.06E-05
2.25E-04
6.56E-04
-5.75E-04
3.77E-05
2.27E-04
6.61E-04
-5.86E-04
-1.04E-04
2.21E-04
5.02E-04
-7.09E-04
-8.00E-04
PASS
8.00E-04
PASS
-1.34E-04
2.15E-04
4.55E-04
-7.23E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.48E-04
2.15E-04
4.42E-04
-7.38E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.60E-04
2.17E-04
4.33E-04
-7.54E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.67E-04
2.12E-04
4.14E-04
-7.48E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
47
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I OFFSET (A) @ +/-15V VCM=-15V A
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.21. Plot of I OFFSET (A) @ +/-15V VCM=-15V A versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
48
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.21. Raw data for I OFFSET (A) @ +/-15V VCM=-15V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
I OFFSET (A) @ +/-15V VCM=-15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
2.78E-09
1.76E-09
3.47E-09
-4.90E-09
-7.71E-10
-4.10E-11
-2.14E-09
3.10E-09
2.38E-09
3.89E-09
-1.01E-09
1.75E-09
Total
20
2.52E-09
1.66E-09
2.52E-09
-5.75E-09
-1.09E-09
-7.05E-10
-2.93E-09
2.71E-09
2.16E-09
4.67E-09
-1.09E-09
1.80E-09
Dose (krad(Si))
50
100
2.36E-09 3.27E-09
1.50E-09 1.40E-09
3.92E-09 4.31E-09
-6.45E-09 -6.87E-09
-1.35E-09 -1.27E-09
-3.61E-10 -1.64E-09
-2.42E-09 -3.35E-09
1.84E-09 8.60E-11
1.97E-09 1.74E-09
3.79E-09 3.63E-09
-1.08E-09 -1.08E-09
1.75E-09 1.73E-09
200
2.28E-09
1.82E-09
4.45E-09
-7.19E-09
-1.80E-09
-3.96E-09
-1.05E-09
1.82E-09
1.80E-09
1.42E-09
-1.08E-09
1.81E-09
4.68E-10
3.41E-09
9.81E-09
-8.87E-09
-2.86E-11
3.53E-09
9.64E-09
-9.70E-09
-6.40E-12
4.08E-09
1.12E-08
-1.12E-08
1.69E-10
4.47E-09
1.24E-08
-1.21E-08
-8.58E-11
4.56E-09
1.24E-08
-1.26E-08
1.44E-09
2.48E-09
8.24E-09
-5.36E-09
-7.00E-08
PASS
7.00E-08
PASS
1.18E-09
3.00E-09
9.40E-09
-7.04E-09
-1.00E-07
PASS
1.00E-07
PASS
9.63E-10
2.40E-09
7.53E-09
-5.61E-09
-1.00E-07
PASS
1.00E-07
PASS
9.18E-11
2.74E-09
7.60E-09
-7.42E-09
-1.00E-07
PASS
1.00E-07
PASS
8.00E-12
2.52E-09
6.91E-09
-6.89E-09
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
49
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I OFFSET (A) @ +/-15V VCM=-15V B
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.22. Plot of I OFFSET (A) @ +/-15V VCM=-15V B versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
50
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.22. Raw data for I OFFSET (A) @ +/-15V VCM=-15V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
I OFFSET (A) @ +/-15V VCM=-15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
2.68E-09
3.17E-09
3.08E-09
-1.20E-09
-9.50E-11
-3.86E-09
9.42E-10
-6.33E-09
-4.04E-09
-1.18E-10
-4.17E-09
4.77E-09
Total
20
2.94E-09
2.72E-09
2.22E-09
-2.16E-09
-4.37E-10
-3.80E-09
1.19E-09
-6.59E-09
-4.06E-09
-7.71E-10
-4.30E-09
4.84E-09
Dose (krad(Si))
50
100
2.39E-09 1.73E-09
2.39E-09 1.23E-09
6.01E-10 6.49E-10
-1.26E-09 -1.47E-09
-6.33E-10 -9.63E-10
-3.61E-09 -3.26E-09
1.71E-09 2.01E-09
-6.37E-09 -4.96E-09
-4.20E-09 -5.54E-09
-7.50E-10 -8.72E-10
-4.29E-09 -4.29E-09
4.80E-09 4.81E-09
200
2.10E-09
3.04E-10
-1.50E-09
-1.57E-09
-1.47E-09
-3.12E-09
2.52E-09
-4.90E-09
-5.42E-09
-1.83E-09
-4.35E-09
4.86E-09
1.53E-09
2.03E-09
7.09E-09
-4.04E-09
1.06E-09
2.25E-09
7.22E-09
-5.11E-09
6.97E-10
1.68E-09
5.31E-09
-3.92E-09
2.36E-10
1.39E-09
4.05E-09
-3.57E-09
-4.26E-10
1.62E-09
4.01E-09
-4.86E-09
-2.68E-09
3.01E-09
5.58E-09
-1.09E-08
-7.00E-08
PASS
7.00E-08
PASS
-2.81E-09
3.04E-09
5.53E-09
-1.11E-08
-1.00E-07
PASS
1.00E-07
PASS
-2.64E-09
3.15E-09
6.01E-09
-1.13E-08
-1.00E-07
PASS
1.00E-07
PASS
-2.53E-09
3.12E-09
6.02E-09
-1.11E-08
-1.00E-07
PASS
1.00E-07
PASS
-2.55E-09
3.17E-09
6.15E-09
-1.13E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
51
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I BIAS + (A) @ +/-15V VCM=-15V A
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.23. Plot of I BIAS + (A) @ +/-15V VCM=-15V A versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
52
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.23. Raw data for I BIAS + (A) @ +/-15V VCM=-15V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
I BIAS + (A) @ +/-15V VCM=-15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-2.96E-07
-3.16E-07
-3.03E-07
-3.28E-07
-3.08E-07
-3.08E-07
-3.17E-07
-3.03E-07
-3.40E-07
-3.00E-07
-3.37E-07
-3.20E-07
Total
20
-3.14E-07
-3.32E-07
-3.19E-07
-3.48E-07
-3.26E-07
-3.30E-07
-3.39E-07
-3.26E-07
-3.68E-07
-3.22E-07
-3.48E-07
-3.26E-07
Dose (krad(Si))
50
100
-3.26E-07 -3.47E-07
-3.48E-07 -3.64E-07
-3.31E-07 -3.52E-07
-3.58E-07 -3.74E-07
-3.37E-07 -3.58E-07
-3.51E-07 -3.76E-07
-3.58E-07 -3.83E-07
-3.47E-07 -3.76E-07
-3.83E-07 -4.07E-07
-3.38E-07 -3.64E-07
-3.45E-07 -3.41E-07
-3.24E-07 -3.24E-07
200
-3.79E-07
-3.97E-07
-3.89E-07
-4.06E-07
-3.93E-07
-4.18E-07
-4.16E-07
-4.13E-07
-4.42E-07
-4.05E-07
-3.48E-07
-3.25E-07
-3.10E-07
1.24E-08
-2.76E-07
-3.44E-07
-3.28E-07
1.33E-08
-2.91E-07
-3.64E-07
-3.40E-07
1.31E-08
-3.04E-07
-3.76E-07
-3.59E-07
1.06E-08
-3.30E-07
-3.88E-07
-3.93E-07
9.78E-09
-3.66E-07
-4.20E-07
-3.14E-07
1.61E-08
-2.70E-07
-3.58E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.37E-07
1.86E-08
-2.86E-07
-3.88E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.56E-07
1.68E-08
-3.10E-07
-4.02E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.81E-07
1.57E-08
-3.38E-07
-4.24E-07
-9.15E-07
PASS
9.15E-07
PASS
-4.19E-07
1.37E-08
-3.81E-07
-4.56E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
53
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I BIAS + (A) @ +/-15V VCM=-15V B
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.24. Plot of I BIAS + (A) @ +/-15V VCM=-15V B versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
54
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.24. Raw data for I BIAS + (A) @ +/-15V VCM=-15V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
I BIAS + (A) @ +/-15V VCM=-15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.01E-07
-3.15E-07
-3.04E-07
-3.22E-07
-3.07E-07
-3.09E-07
-3.18E-07
-3.08E-07
-3.37E-07
-2.95E-07
-3.33E-07
-3.19E-07
Total
20
-3.18E-07
-3.29E-07
-3.21E-07
-3.38E-07
-3.24E-07
-3.30E-07
-3.38E-07
-3.30E-07
-3.65E-07
-3.16E-07
-3.39E-07
-3.25E-07
Dose (krad(Si))
50
100
-3.30E-07 -3.52E-07
-3.40E-07 -3.60E-07
-3.33E-07 -3.56E-07
-3.51E-07 -3.66E-07
-3.36E-07 -3.58E-07
-3.50E-07 -3.77E-07
-3.57E-07 -3.78E-07
-3.51E-07 -3.74E-07
-3.78E-07 -3.99E-07
-3.33E-07 -3.58E-07
-3.37E-07 -3.37E-07
-3.23E-07 -3.23E-07
200
-3.81E-07
-3.92E-07
-3.92E-07
-3.98E-07
-3.91E-07
-4.12E-07
-4.13E-07
-4.13E-07
-4.37E-07
-3.95E-07
-3.38E-07
-3.24E-07
-3.10E-07
8.71E-09
-2.86E-07
-3.34E-07
-3.26E-07
8.09E-09
-3.04E-07
-3.48E-07
-3.38E-07
8.10E-09
-3.16E-07
-3.60E-07
-3.58E-07
5.13E-09
-3.44E-07
-3.72E-07
-3.91E-07
6.04E-09
-3.74E-07
-4.08E-07
-3.13E-07
1.57E-08
-2.70E-07
-3.57E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.36E-07
1.80E-08
-2.87E-07
-3.85E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.54E-07
1.66E-08
-3.08E-07
-3.99E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.77E-07
1.49E-08
-3.36E-07
-4.18E-07
-9.15E-07
PASS
9.15E-07
PASS
-4.14E-07
1.50E-08
-3.73E-07
-4.55E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
55
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I BIAS - (A) @ +/-15V VCM=-15V A
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.25. Plot of I BIAS - (A) @ +/-15V VCM=-15V A versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
56
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.25. Raw data for I BIAS - (A) @ +/-15V VCM=-15V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
I BIAS - (A) @ +/-15V VCM=-15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-2.99E-07
-3.18E-07
-3.06E-07
-3.23E-07
-3.07E-07
-3.08E-07
-3.15E-07
-3.06E-07
-3.48E-07
-3.04E-07
-3.35E-07
-3.22E-07
Total
20
-3.17E-07
-3.33E-07
-3.22E-07
-3.39E-07
-3.25E-07
-3.29E-07
-3.36E-07
-3.29E-07
-3.72E-07
-3.26E-07
-3.50E-07
-3.28E-07
Dose (krad(Si))
50
100
-3.28E-07 -3.50E-07
-3.50E-07 -3.65E-07
-3.35E-07 -3.59E-07
-3.51E-07 -3.70E-07
-3.36E-07 -3.58E-07
-3.49E-07 -3.79E-07
-3.58E-07 -3.80E-07
-3.52E-07 -3.72E-07
-3.84E-07 -4.09E-07
-3.47E-07 -3.69E-07
-3.40E-07 -3.39E-07
-3.26E-07 -3.25E-07
200
-3.83E-07
-3.99E-07
-3.96E-07
-3.98E-07
-3.94E-07
-4.10E-07
-4.16E-07
-4.14E-07
-4.46E-07
-4.06E-07
-3.41E-07
-3.27E-07
-3.11E-07
9.77E-09
-2.84E-07
-3.37E-07
-3.27E-07
8.94E-09
-3.03E-07
-3.52E-07
-3.40E-07
9.90E-09
-3.13E-07
-3.67E-07
-3.60E-07
7.47E-09
-3.40E-07
-3.81E-07
-3.94E-07
6.22E-09
-3.77E-07
-4.11E-07
-3.16E-07
1.81E-08
-2.67E-07
-3.66E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.38E-07
1.91E-08
-2.86E-07
-3.91E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.58E-07
1.51E-08
-3.16E-07
-3.99E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.82E-07
1.57E-08
-3.39E-07
-4.25E-07
-9.15E-07
PASS
9.15E-07
PASS
-4.18E-07
1.57E-08
-3.75E-07
-4.62E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
57
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I BIAS - (A) @ +/-15V VCM=-15V B
1.50E-06
1.00E-06
5.00E-07
0.00E+00
-5.00E-07
-1.00E-06
-1.50E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.26. Plot of I BIAS - (A) @ +/-15V VCM=-15V B versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
58
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.26. Raw data for I BIAS - (A) @ +/-15V VCM=-15V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
I BIAS - (A) @ +/-15V VCM=-15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.03E-07
-3.18E-07
-3.07E-07
-3.21E-07
-3.07E-07
-3.05E-07
-3.19E-07
-3.02E-07
-3.33E-07
-2.95E-07
-3.29E-07
-3.24E-07
Total
20
-3.21E-07
-3.32E-07
-3.23E-07
-3.36E-07
-3.24E-07
-3.26E-07
-3.39E-07
-3.24E-07
-3.62E-07
-3.15E-07
-3.34E-07
-3.29E-07
Dose (krad(Si))
50
100
-3.32E-07 -3.54E-07
-3.47E-07 -3.62E-07
-3.34E-07 -3.56E-07
-3.51E-07 -3.69E-07
-3.36E-07 -3.55E-07
-3.47E-07 -3.73E-07
-3.60E-07 -3.80E-07
-3.47E-07 -3.72E-07
-3.72E-07 -3.96E-07
-3.31E-07 -3.56E-07
-3.32E-07 -3.32E-07
-3.27E-07 -3.27E-07
200
-3.88E-07
-3.94E-07
-3.91E-07
-4.00E-07
-3.92E-07
-4.09E-07
-4.16E-07
-4.06E-07
-4.33E-07
-3.92E-07
-3.34E-07
-3.29E-07
-3.11E-07
7.72E-09
-2.90E-07
-3.32E-07
-3.27E-07
6.58E-09
-3.09E-07
-3.45E-07
-3.40E-07
8.29E-09
-3.17E-07
-3.63E-07
-3.59E-07
6.45E-09
-3.42E-07
-3.77E-07
-3.93E-07
4.69E-09
-3.80E-07
-4.06E-07
-3.11E-07
1.53E-08
-2.69E-07
-3.53E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.33E-07
1.83E-08
-2.83E-07
-3.84E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.52E-07
1.55E-08
-3.09E-07
-3.94E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.75E-07
1.46E-08
-3.35E-07
-4.15E-07
-9.15E-07
PASS
9.15E-07
PASS
-4.11E-07
1.51E-08
-3.70E-07
-4.53E-07
-9.65E-07
PASS
9.65E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
59
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
+VOUT (V) IL=0MA @ +/-15V A
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.27. Plot of +VOUT (V) IL=0MA @ +/-15V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
60
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.27. Raw data for +VOUT (V) IL=0MA @ +/-15V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+VOUT (V) IL=0MA @ +/-15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
3.49E-03
3.30E-03
3.27E-03
3.09E-03
3.22E-03
3.37E-03
3.10E-03
3.37E-03
3.15E-03
3.37E-03
3.29E-03
3.22E-03
Total
20
3.74E-03
3.49E-03
3.41E-03
3.44E-03
3.32E-03
3.47E-03
3.26E-03
3.51E-03
3.39E-03
3.52E-03
3.46E-03
3.19E-03
Dose (krad(Si))
50
100
4.11E-03 4.27E-03
3.59E-03 3.81E-03
3.71E-03 3.80E-03
3.52E-03 3.69E-03
3.56E-03 3.64E-03
3.64E-03 3.80E-03
3.49E-03 3.85E-03
3.71E-03 3.96E-03
3.47E-03 3.86E-03
3.66E-03 3.96E-03
3.26E-03 3.27E-03
3.22E-03 3.12E-03
200
4.44E-03
3.89E-03
3.95E-03
4.00E-03
3.83E-03
4.31E-03
4.09E-03
4.41E-03
4.07E-03
4.32E-03
3.19E-03
3.19E-03
3.27E-03
1.45E-04
3.67E-03
2.88E-03
3.48E-03
1.58E-04
3.91E-03
3.05E-03
3.70E-03
2.41E-04
4.36E-03
3.04E-03
3.84E-03
2.50E-04
4.53E-03
3.16E-03
4.02E-03
2.42E-04
4.69E-03
3.36E-03
3.27E-03
1.35E-04
3.64E-03
2.90E-03
1.00E-02
PASS
3.43E-03
1.08E-04
3.73E-03
3.13E-03
2.00E-02
PASS
3.59E-03
1.07E-04
3.89E-03
3.30E-03
2.00E-02
PASS
3.89E-03
7.13E-05
4.08E-03
3.69E-03
2.00E-02
PASS
4.24E-03
1.51E-04
4.65E-03
3.83E-03
2.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
61
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
+VOUT (V) IL=0MA @ +/-15V B
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.28. Plot of +VOUT (V) IL=0MA @ +/-15V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
62
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.28. Raw data for +VOUT (V) IL=0MA @ +/-15V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+VOUT (V) IL=0MA @ +/-15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
3.32E-03
3.29E-03
3.34E-03
3.37E-03
3.19E-03
3.41E-03
3.12E-03
3.27E-03
3.27E-03
3.34E-03
3.42E-03
3.24E-03
Total
20
3.52E-03
3.44E-03
3.46E-03
3.39E-03
3.32E-03
3.49E-03
3.42E-03
3.42E-03
3.41E-03
3.52E-03
3.34E-03
3.24E-03
Dose (krad(Si))
50
100
3.68E-03 3.76E-03
3.78E-03 3.90E-03
3.63E-03 3.86E-03
3.56E-03 3.81E-03
3.51E-03 3.76E-03
3.64E-03 4.13E-03
3.44E-03 3.76E-03
3.61E-03 3.96E-03
3.52E-03 3.80E-03
3.68E-03 4.03E-03
3.41E-03 3.42E-03
3.19E-03 3.22E-03
200
3.93E-03
4.12E-03
4.04E-03
4.09E-03
3.97E-03
4.41E-03
4.07E-03
4.49E-03
4.27E-03
4.56E-03
3.25E-03
3.19E-03
3.30E-03
6.91E-05
3.49E-03
3.11E-03
3.43E-03
7.54E-05
3.63E-03
3.22E-03
3.63E-03
1.05E-04
3.92E-03
3.34E-03
3.82E-03
6.18E-05
3.99E-03
3.65E-03
4.03E-03
7.97E-05
4.25E-03
3.81E-03
3.28E-03
1.08E-04
3.58E-03
2.99E-03
1.00E-02
PASS
3.45E-03
4.97E-05
3.59E-03
3.32E-03
2.00E-02
PASS
3.58E-03
9.71E-05
3.84E-03
3.31E-03
2.00E-02
PASS
3.94E-03
1.55E-04
4.36E-03
3.51E-03
2.00E-02
PASS
4.36E-03
1.95E-04
4.89E-03
3.83E-03
2.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
63
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
1.60E-01
+VOUT (V) IL=1MA @ +/-15V A
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.29. Plot of +VOUT (V) IL=1MA @ +/-15V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
64
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.29. Raw data for +VOUT (V) IL=1MA @ +/-15V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+VOUT (V) IL=1MA @ +/-15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
7.09E-02
6.99E-02
7.05E-02
6.93E-02
6.92E-02
7.07E-02
6.78E-02
7.09E-02
6.87E-02
7.09E-02
7.01E-02
6.82E-02
Total
20
7.22E-02
7.14E-02
7.20E-02
7.07E-02
7.07E-02
7.10E-02
6.80E-02
7.13E-02
6.86E-02
7.09E-02
6.94E-02
6.78E-02
Dose (krad(Si))
50
100
7.34E-02 7.41E-02
7.27E-02 7.33E-02
7.33E-02 7.40E-02
7.16E-02 7.26E-02
7.17E-02 7.27E-02
7.21E-02 7.29E-02
6.89E-02 7.04E-02
7.24E-02 7.36E-02
6.96E-02 7.09E-02
7.20E-02 7.34E-02
6.94E-02 6.97E-02
6.78E-02 6.76E-02
200
7.41E-02
7.32E-02
7.38E-02
7.29E-02
7.26E-02
7.42E-02
7.15E-02
7.47E-02
7.19E-02
7.46E-02
6.94E-02
6.74E-02
7.00E-02
7.41E-04
7.20E-02
6.79E-02
7.14E-02
6.85E-04
7.33E-02
6.95E-02
7.26E-02
8.52E-04
7.49E-02
7.02E-02
7.33E-02
6.95E-04
7.52E-02
7.14E-02
7.33E-02
6.47E-04
7.51E-02
7.16E-02
6.98E-02
1.44E-03
7.37E-02
6.59E-02
1.50E-01
PASS
7.00E-02
1.53E-03
7.41E-02
6.58E-02
1.50E-01
PASS
7.10E-02
1.60E-03
7.54E-02
6.66E-02
1.50E-01
PASS
7.22E-02
1.48E-03
7.63E-02
6.82E-02
1.50E-01
PASS
7.34E-02
1.55E-03
7.76E-02
6.91E-02
1.50E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
65
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
1.60E-01
+VOUT (V) IL=1MA @ +/-15V B
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.30. Plot of +VOUT (V) IL=1MA @ +/-15V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
66
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.30. Raw data for +VOUT (V) IL=1MA @ +/-15V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+VOUT (V) IL=1MA @ +/-15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
7.03E-02
7.02E-02
7.07E-02
6.96E-02
6.96E-02
7.06E-02
6.83E-02
7.09E-02
6.87E-02
7.08E-02
7.02E-02
6.83E-02
Total
20
7.16E-02
7.14E-02
7.22E-02
7.11E-02
7.07E-02
7.10E-02
6.80E-02
7.13E-02
6.85E-02
7.10E-02
6.94E-02
6.73E-02
Dose (krad(Si))
50
100
7.29E-02 7.35E-02
7.29E-02 7.34E-02
7.33E-02 7.44E-02
7.23E-02 7.31E-02
7.19E-02 7.28E-02
7.19E-02 7.31E-02
6.92E-02 7.00E-02
7.26E-02 7.35E-02
6.96E-02 7.08E-02
7.22E-02 7.30E-02
6.94E-02 6.96E-02
6.79E-02 6.76E-02
200
7.35E-02
7.32E-02
7.44E-02
7.31E-02
7.28E-02
7.44E-02
7.16E-02
7.47E-02
7.18E-02
7.49E-02
6.94E-02
6.75E-02
7.01E-02
4.96E-04
7.15E-02
6.87E-02
7.14E-02
5.55E-04
7.29E-02
6.99E-02
7.27E-02
5.70E-04
7.42E-02
7.11E-02
7.34E-02
5.91E-04
7.50E-02
7.18E-02
7.34E-02
5.97E-04
7.50E-02
7.18E-02
6.99E-02
1.26E-03
7.33E-02
6.64E-02
1.50E-01
PASS
7.00E-02
1.57E-03
7.43E-02
6.57E-02
1.50E-01
PASS
7.11E-02
1.57E-03
7.54E-02
6.68E-02
1.50E-01
PASS
7.21E-02
1.56E-03
7.64E-02
6.78E-02
1.50E-01
PASS
7.35E-02
1.63E-03
7.79E-02
6.90E-02
1.50E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
67
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
9.00E-01
+VOUT (V) IL=10MA @ +/-15V A
8.00E-01
7.00E-01
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.31. Plot of +VOUT (V) IL=10MA @ +/-15V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
68
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.31. Raw data for +VOUT (V) IL=10MA @ +/-15V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+VOUT (V) IL=10MA @ +/-15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
3.64E-01
3.60E-01
3.63E-01
3.57E-01
3.56E-01
3.63E-01
3.49E-01
3.65E-01
3.53E-01
3.64E-01
3.59E-01
3.52E-01
Total
20
3.69E-01
3.66E-01
3.69E-01
3.62E-01
3.60E-01
3.65E-01
3.50E-01
3.67E-01
3.54E-01
3.65E-01
3.56E-01
3.49E-01
Dose (krad(Si))
50
100
3.75E-01 3.80E-01
3.72E-01 3.78E-01
3.76E-01 3.82E-01
3.68E-01 3.74E-01
3.66E-01 3.71E-01
3.71E-01 3.79E-01
3.56E-01 3.62E-01
3.75E-01 3.83E-01
3.59E-01 3.65E-01
3.73E-01 3.81E-01
3.57E-01 3.57E-01
3.50E-01 3.50E-01
200
3.82E-01
3.79E-01
3.83E-01
3.77E-01
3.72E-01
3.92E-01
3.72E-01
3.97E-01
3.75E-01
3.96E-01
3.56E-01
3.49E-01
3.60E-01
3.71E-03
3.70E-01
3.50E-01
3.65E-01
3.97E-03
3.76E-01
3.54E-01
3.71E-01
4.37E-03
3.83E-01
3.59E-01
3.77E-01
4.57E-03
3.90E-01
3.64E-01
3.79E-01
4.32E-03
3.91E-01
3.67E-01
3.59E-01
7.26E-03
3.79E-01
3.39E-01
8.00E-01
PASS
3.60E-01
7.74E-03
3.82E-01
3.39E-01
8.00E-01
PASS
3.67E-01
8.59E-03
3.90E-01
3.43E-01
8.00E-01
PASS
3.74E-01
9.68E-03
4.01E-01
3.48E-01
8.00E-01
PASS
3.86E-01
1.19E-02
4.19E-01
3.54E-01
8.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
69
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
9.00E-01
+VOUT (V) IL=10MA @ +/-15V B
8.00E-01
7.00E-01
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.32. Plot of +VOUT (V) IL=10MA @ +/-15V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
70
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.32. Raw data for +VOUT (V) IL=10MA @ +/-15V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+VOUT (V) IL=10MA @ +/-15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
3.63E-01
3.61E-01
3.64E-01
3.58E-01
3.56E-01
3.63E-01
3.50E-01
3.65E-01
3.53E-01
3.64E-01
3.59E-01
3.51E-01
Total
20
3.66E-01
3.67E-01
3.70E-01
3.64E-01
3.60E-01
3.65E-01
3.51E-01
3.67E-01
3.53E-01
3.66E-01
3.56E-01
3.49E-01
Dose (krad(Si))
50
100
3.72E-01 3.77E-01
3.73E-01 3.79E-01
3.77E-01 3.83E-01
3.70E-01 3.75E-01
3.66E-01 3.71E-01
3.71E-01 3.79E-01
3.56E-01 3.63E-01
3.74E-01 3.82E-01
3.58E-01 3.65E-01
3.73E-01 3.82E-01
3.57E-01 3.57E-01
3.49E-01 3.50E-01
200
3.79E-01
3.81E-01
3.84E-01
3.78E-01
3.73E-01
3.92E-01
3.73E-01
3.96E-01
3.75E-01
3.96E-01
3.57E-01
3.49E-01
3.60E-01
3.26E-03
3.69E-01
3.51E-01
3.65E-01
3.68E-03
3.75E-01
3.55E-01
3.72E-01
4.01E-03
3.83E-01
3.61E-01
3.77E-01
4.31E-03
3.89E-01
3.65E-01
3.79E-01
3.97E-03
3.90E-01
3.68E-01
3.59E-01
6.80E-03
3.78E-01
3.41E-01
8.00E-01
PASS
3.60E-01
7.66E-03
3.81E-01
3.39E-01
8.00E-01
PASS
3.67E-01
8.45E-03
3.90E-01
3.43E-01
8.00E-01
PASS
3.74E-01
9.44E-03
4.00E-01
3.48E-01
8.00E-01
PASS
3.86E-01
1.14E-02
4.17E-01
3.55E-01
8.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
71
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
7.00E-02
-VOUT (V) IL=0MA @ +/-15V A
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.33. Plot of -VOUT (V) IL=0MA @ +/-15V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
72
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.33. Raw data for -VOUT (V) IL=0MA @ +/-15V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-VOUT (V) IL=0MA @ +/-15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
1.89E-02
1.83E-02
1.85E-02
1.81E-02
1.90E-02
1.85E-02
1.90E-02
1.88E-02
1.82E-02
1.89E-02
1.81E-02
1.86E-02
Total
20
1.89E-02
1.86E-02
1.88E-02
1.83E-02
1.92E-02
1.85E-02
1.90E-02
1.88E-02
1.82E-02
1.87E-02
1.77E-02
1.84E-02
Dose (krad(Si))
50
100
1.94E-02 1.98E-02
1.90E-02 1.95E-02
1.89E-02 1.94E-02
1.86E-02 1.92E-02
1.96E-02 2.00E-02
1.89E-02 1.95E-02
1.95E-02 2.00E-02
1.94E-02 1.98E-02
1.86E-02 1.92E-02
1.94E-02 1.98E-02
1.79E-02 1.80E-02
1.85E-02 1.84E-02
200
2.04E-02
2.00E-02
1.99E-02
1.96E-02
2.06E-02
2.01E-02
2.07E-02
2.04E-02
1.98E-02
2.06E-02
1.79E-02
1.84E-02
1.85E-02
3.71E-04
1.96E-02
1.75E-02
1.88E-02
3.52E-04
1.97E-02
1.78E-02
1.91E-02
3.82E-04
2.01E-02
1.80E-02
1.96E-02
3.29E-04
2.05E-02
1.87E-02
2.01E-02
4.03E-04
2.12E-02
1.90E-02
1.87E-02
3.34E-04
1.96E-02
1.78E-02
3.00E-02
PASS
1.86E-02
3.15E-04
1.95E-02
1.78E-02
6.00E-02
PASS
1.92E-02
4.03E-04
2.03E-02
1.80E-02
6.00E-02
PASS
1.96E-02
3.21E-04
2.05E-02
1.88E-02
6.00E-02
PASS
2.03E-02
3.67E-04
2.13E-02
1.93E-02
6.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
73
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
7.00E-02
-VOUT (V) IL=0MA @ +/-15V B
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.34. Plot of -VOUT (V) IL=0MA @ +/-15V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
74
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.34. Raw data for -VOUT (V) IL=0MA @ +/-15V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-VOUT (V) IL=0MA @ +/-15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
1.91E-02
1.91E-02
1.87E-02
1.87E-02
1.94E-02
1.88E-02
1.98E-02
1.87E-02
1.87E-02
1.93E-02
1.86E-02
1.92E-02
Total
20
1.92E-02
1.93E-02
1.90E-02
1.89E-02
1.96E-02
1.87E-02
1.95E-02
1.87E-02
1.86E-02
1.91E-02
1.82E-02
1.89E-02
Dose (krad(Si))
50
100
1.96E-02 2.01E-02
1.98E-02 2.02E-02
1.95E-02 1.98E-02
1.95E-02 1.98E-02
1.99E-02 2.03E-02
1.93E-02 1.98E-02
1.99E-02 2.08E-02
1.93E-02 1.99E-02
1.89E-02 1.94E-02
1.96E-02 2.02E-02
1.84E-02 1.86E-02
1.88E-02 1.90E-02
200
2.05E-02
2.07E-02
2.03E-02
2.04E-02
2.05E-02
2.06E-02
2.10E-02
2.05E-02
2.02E-02
2.09E-02
1.86E-02
1.87E-02
1.90E-02
2.85E-04
1.98E-02
1.82E-02
1.92E-02
2.40E-04
1.99E-02
1.85E-02
1.96E-02
1.91E-04
2.02E-02
1.91E-02
2.00E-02
2.17E-04
2.06E-02
1.94E-02
2.05E-02
1.51E-04
2.09E-02
2.01E-02
1.91E-02
4.38E-04
2.03E-02
1.79E-02
3.00E-02
PASS
1.89E-02
3.75E-04
2.00E-02
1.79E-02
6.00E-02
PASS
1.94E-02
3.98E-04
2.05E-02
1.83E-02
6.00E-02
PASS
2.00E-02
5.09E-04
2.14E-02
1.86E-02
6.00E-02
PASS
2.06E-02
3.54E-04
2.16E-02
1.97E-02
6.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
75
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
-VOUT (V) IL=1MA @ +/-15V A
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.35. Plot of -VOUT (V) IL=1MA @ +/-15V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
76
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.35. Raw data for -VOUT (V) IL=1MA @ +/-15V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-VOUT (V) IL=1MA @ +/-15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
5.34E-02
5.26E-02
5.26E-02
5.25E-02
5.34E-02
5.28E-02
5.28E-02
5.31E-02
5.21E-02
5.34E-02
5.21E-02
5.29E-02
Total
20
5.35E-02
5.28E-02
5.29E-02
5.27E-02
5.35E-02
5.24E-02
5.25E-02
5.27E-02
5.17E-02
5.30E-02
5.13E-02
5.22E-02
Dose (krad(Si))
50
100
5.40E-02 5.44E-02
5.35E-02 5.38E-02
5.33E-02 5.38E-02
5.32E-02 5.39E-02
5.40E-02 5.45E-02
5.34E-02 5.38E-02
5.31E-02 5.38E-02
5.35E-02 5.41E-02
5.23E-02 5.28E-02
5.35E-02 5.42E-02
5.16E-02 5.16E-02
5.25E-02 5.23E-02
200
5.53E-02
5.42E-02
5.44E-02
5.41E-02
5.48E-02
5.43E-02
5.42E-02
5.49E-02
5.35E-02
5.47E-02
5.15E-02
5.24E-02
5.29E-02
4.73E-04
5.42E-02
5.16E-02
5.31E-02
3.96E-04
5.42E-02
5.20E-02
5.36E-02
3.70E-04
5.46E-02
5.26E-02
5.41E-02
3.25E-04
5.50E-02
5.32E-02
5.45E-02
4.91E-04
5.59E-02
5.32E-02
5.29E-02
4.73E-04
5.41E-02
5.16E-02
1.00E-01
PASS
5.25E-02
4.95E-04
5.38E-02
5.11E-02
1.00E-01
PASS
5.31E-02
5.06E-04
5.45E-02
5.18E-02
1.00E-01
PASS
5.37E-02
5.36E-04
5.52E-02
5.23E-02
1.00E-01
PASS
5.43E-02
5.69E-04
5.59E-02
5.28E-02
1.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
77
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
-VOUT (V) IL=1MA @ +/-15V B
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.36. Plot of -VOUT (V) IL=1MA @ +/-15V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
78
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.36. Raw data for -VOUT (V) IL=1MA @ +/-15V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-VOUT (V) IL=1MA @ +/-15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
5.37E-02
5.36E-02
5.33E-02
5.33E-02
5.38E-02
5.35E-02
5.38E-02
5.36E-02
5.27E-02
5.42E-02
5.30E-02
5.36E-02
Total
20
5.38E-02
5.38E-02
5.35E-02
5.33E-02
5.39E-02
5.34E-02
5.34E-02
5.33E-02
5.23E-02
5.38E-02
5.25E-02
5.29E-02
Dose (krad(Si))
50
100
5.45E-02 5.48E-02
5.42E-02 5.50E-02
5.40E-02 5.45E-02
5.39E-02 5.44E-02
5.43E-02 5.48E-02
5.37E-02 5.45E-02
5.38E-02 5.46E-02
5.37E-02 5.44E-02
5.28E-02 5.35E-02
5.43E-02 5.48E-02
5.26E-02 5.27E-02
5.32E-02 5.31E-02
200
5.54E-02
5.55E-02
5.50E-02
5.49E-02
5.49E-02
5.49E-02
5.51E-02
5.51E-02
5.38E-02
5.57E-02
5.24E-02
5.30E-02
5.35E-02
2.23E-04
5.41E-02
5.29E-02
5.37E-02
2.49E-04
5.43E-02
5.30E-02
5.42E-02
2.68E-04
5.49E-02
5.34E-02
5.47E-02
2.39E-04
5.54E-02
5.40E-02
5.52E-02
2.92E-04
5.60E-02
5.44E-02
5.35E-02
5.46E-04
5.50E-02
5.20E-02
1.00E-01
PASS
5.32E-02
5.71E-04
5.48E-02
5.17E-02
1.00E-01
PASS
5.36E-02
5.30E-04
5.51E-02
5.22E-02
1.00E-01
PASS
5.44E-02
5.14E-04
5.58E-02
5.30E-02
1.00E-01
PASS
5.49E-02
7.07E-04
5.68E-02
5.30E-02
1.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
79
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
-VOUT (V) IL=10MA @ +/-15V A
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.37. Plot of -VOUT (V) IL=10MA @ +/-15V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
80
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.37. Raw data for -VOUT (V) IL=10MA @ +/-15V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-VOUT (V) IL=10MA @ +/-15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
2.18E-01
2.15E-01
2.15E-01
2.16E-01
2.17E-01
2.17E-01
2.14E-01
2.17E-01
2.15E-01
2.16E-01
2.13E-01
2.16E-01
Total
20
2.17E-01
2.14E-01
2.15E-01
2.15E-01
2.16E-01
2.15E-01
2.12E-01
2.14E-01
2.13E-01
2.14E-01
2.11E-01
2.13E-01
Dose (krad(Si))
50
100
2.18E-01 2.18E-01
2.15E-01 2.16E-01
2.15E-01 2.16E-01
2.16E-01 2.17E-01
2.16E-01 2.17E-01
2.16E-01 2.17E-01
2.13E-01 2.14E-01
2.16E-01 2.17E-01
2.14E-01 2.14E-01
2.15E-01 2.16E-01
2.12E-01 2.12E-01
2.14E-01 2.14E-01
200
2.19E-01
2.16E-01
2.16E-01
2.16E-01
2.18E-01
2.17E-01
2.14E-01
2.17E-01
2.14E-01
2.16E-01
2.11E-01
2.14E-01
2.16E-01
1.38E-03
2.20E-01
2.12E-01
2.15E-01
1.05E-03
2.18E-01
2.12E-01
2.16E-01
1.14E-03
2.19E-01
2.13E-01
2.17E-01
9.11E-04
2.19E-01
2.14E-01
2.17E-01
1.48E-03
2.21E-01
2.13E-01
2.16E-01
1.07E-03
2.19E-01
2.13E-01
5.00E-01
PASS
2.13E-01
1.17E-03
2.17E-01
2.10E-01
5.00E-01
PASS
2.15E-01
1.55E-03
2.19E-01
2.11E-01
5.00E-01
PASS
2.15E-01
1.39E-03
2.19E-01
2.12E-01
5.00E-01
PASS
2.15E-01
1.48E-03
2.20E-01
2.11E-01
5.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
81
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
-VOUT (V) IL=10MA @ +/-15V B
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.38. Plot of -VOUT (V) IL=10MA @ +/-15V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
82
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.38. Raw data for -VOUT (V) IL=10MA @ +/-15V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-VOUT (V) IL=10MA @ +/-15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
2.21E-01
2.19E-01
2.18E-01
2.18E-01
2.19E-01
2.19E-01
2.17E-01
2.19E-01
2.17E-01
2.19E-01
2.17E-01
2.18E-01
Total
20
2.19E-01
2.18E-01
2.17E-01
2.17E-01
2.18E-01
2.18E-01
2.15E-01
2.17E-01
2.14E-01
2.17E-01
2.15E-01
2.16E-01
Dose (krad(Si))
50
100
2.21E-01 2.21E-01
2.18E-01 2.20E-01
2.18E-01 2.19E-01
2.18E-01 2.18E-01
2.19E-01 2.20E-01
2.19E-01 2.19E-01
2.16E-01 2.17E-01
2.19E-01 2.19E-01
2.16E-01 2.17E-01
2.18E-01 2.19E-01
2.15E-01 2.15E-01
2.17E-01 2.17E-01
200
2.21E-01
2.19E-01
2.19E-01
2.19E-01
2.19E-01
2.19E-01
2.17E-01
2.20E-01
2.17E-01
2.19E-01
2.14E-01
2.16E-01
2.19E-01
1.17E-03
2.22E-01
2.16E-01
2.18E-01
9.55E-04
2.20E-01
2.15E-01
2.19E-01
1.10E-03
2.22E-01
2.16E-01
2.20E-01
9.83E-04
2.22E-01
2.17E-01
2.20E-01
1.06E-03
2.23E-01
2.17E-01
2.18E-01
1.07E-03
2.21E-01
2.16E-01
5.00E-01
PASS
2.16E-01
1.51E-03
2.20E-01
2.12E-01
5.00E-01
PASS
2.18E-01
1.27E-03
2.21E-01
2.14E-01
5.00E-01
PASS
2.18E-01
1.28E-03
2.22E-01
2.15E-01
5.00E-01
PASS
2.18E-01
1.28E-03
2.22E-01
2.15E-01
5.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
83
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
AVOL (V/mV) RL=10K VO=+/-14.5V A
6.00E+03
5.00E+03
4.00E+03
3.00E+03
2.00E+03
1.00E+03
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.39. Plot of AVOL (V/mV) RL=10K VO=+/-14.5V A versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
84
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.39. Raw data for AVOL (V/mV) RL=10K VO=+/-14.5V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
AVOL (V/mV) RL=10K VO=+/-14.5V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
5.49E+03
5.02E+03
6.32E+03
4.50E+03
5.88E+03
5.50E+03
4.97E+03
5.45E+03
5.81E+03
5.03E+03
6.34E+03
4.93E+03
Total
20
4.89E+03
4.65E+03
6.09E+03
4.52E+03
5.57E+03
6.12E+03
5.10E+03
4.71E+03
4.77E+03
5.21E+03
6.02E+03
5.15E+03
Dose (krad(Si))
50
100
4.39E+03 4.26E+03
4.72E+03 4.61E+03
5.60E+03 4.93E+03
4.01E+03 4.12E+03
5.02E+03 4.59E+03
5.42E+03 4.60E+03
4.87E+03 3.93E+03
4.63E+03 4.85E+03
4.61E+03 4.86E+03
5.41E+03 4.06E+03
6.36E+03 6.07E+03
4.91E+03 4.92E+03
200
4.18E+03
3.81E+03
5.14E+03
3.94E+03
4.82E+03
4.60E+03
3.62E+03
4.53E+03
4.54E+03
4.73E+03
6.96E+03
4.94E+03
5.44E+03
7.10E+02
7.39E+03
3.49E+03
5.15E+03
6.65E+02
6.97E+03
3.32E+03
4.75E+03
6.06E+02
6.41E+03
3.08E+03
4.50E+03
3.18E+02
5.37E+03
3.63E+03
4.38E+03
5.77E+02
5.96E+03
2.79E+03
5.35E+03
3.50E+02
6.31E+03
4.39E+03
1.00E+03
PASS
5.18E+03
5.65E+02
6.73E+03
3.63E+03
5.00E+02
PASS
4.99E+03
4.02E+02
6.09E+03
3.89E+03
5.00E+02
PASS
4.46E+03
4.38E+02
5.66E+03
3.26E+03
5.00E+02
PASS
4.40E+03
4.45E+02
5.62E+03
3.18E+03
5.00E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
85
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
AVOL (V/mV) RL=10K VO=+/-14.5V B
7.00E+03
6.00E+03
5.00E+03
4.00E+03
3.00E+03
2.00E+03
1.00E+03
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.40. Plot of AVOL (V/mV) RL=10K VO=+/-14.5V B versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
86
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.40. Raw data for AVOL (V/mV) RL=10K VO=+/-14.5V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
AVOL (V/mV) RL=10K VO=+/-14.5V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
5.69E+03
6.45E+03
6.03E+03
8.90E+03
5.90E+03
5.98E+03
4.98E+03
5.86E+03
5.88E+03
6.11E+03
6.29E+03
5.66E+03
Total
20
5.89E+03
5.98E+03
5.85E+03
5.64E+03
5.73E+03
5.57E+03
5.16E+03
4.99E+03
5.42E+03
5.75E+03
6.49E+03
5.71E+03
Dose (krad(Si))
50
100
4.92E+03 5.41E+03
5.30E+03 5.15E+03
5.53E+03 5.05E+03
6.07E+03 7.21E+03
5.71E+03 5.40E+03
5.89E+03 5.26E+03
4.93E+03 4.27E+03
5.34E+03 5.31E+03
5.28E+03 5.53E+03
5.69E+03 5.63E+03
6.45E+03 6.20E+03
5.71E+03 5.97E+03
200
4.73E+03
4.95E+03
4.37E+03
4.75E+03
4.88E+03
4.97E+03
4.15E+03
5.31E+03
4.64E+03
4.93E+03
9.11E+03
5.78E+03
6.59E+03
1.32E+03
1.02E+04
2.97E+03
5.82E+03
1.33E+02
6.18E+03
5.45E+03
5.51E+03
4.30E+02
6.69E+03
4.33E+03
5.64E+03
8.91E+02
8.09E+03
3.20E+03
4.74E+03
2.27E+02
5.36E+03
4.11E+03
5.76E+03
4.50E+02
6.99E+03
4.53E+03
1.00E+03
PASS
5.38E+03
3.08E+02
6.22E+03
4.53E+03
5.00E+02
PASS
5.43E+03
3.73E+02
6.45E+03
4.40E+03
5.00E+02
PASS
5.20E+03
5.43E+02
6.69E+03
3.71E+03
5.00E+02
PASS
4.80E+03
4.36E+02
6.00E+03
3.60E+03
5.00E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
87
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
AVOL (V/mV) RL=2K VO=+/-10V A
2.50E+03
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.41. Plot of AVOL (V/mV) RL=2K VO=+/-10V A versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
88
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.41. Raw data for AVOL (V/mV) RL=2K VO=+/-10V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
AVOL (V/mV) RL=2K VO=+/-10V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
2.18E+03
2.06E+03
2.30E+03
2.03E+03
2.42E+03
2.36E+03
2.06E+03
2.36E+03
2.21E+03
2.23E+03
2.60E+03
2.05E+03
Total
20
2.05E+03
2.01E+03
2.10E+03
1.92E+03
2.24E+03
2.16E+03
1.99E+03
2.22E+03
2.32E+03
2.41E+03
2.46E+03
2.07E+03
Dose (krad(Si))
50
100
1.89E+03 1.75E+03
1.93E+03 1.87E+03
2.00E+03 2.00E+03
1.89E+03 1.76E+03
2.20E+03 2.02E+03
2.09E+03 2.01E+03
1.95E+03 1.78E+03
1.98E+03 1.95E+03
2.22E+03 1.89E+03
1.95E+03 1.93E+03
2.66E+03 2.51E+03
2.05E+03 2.08E+03
200
1.69E+03
1.77E+03
1.75E+03
1.64E+03
1.86E+03
1.85E+03
1.62E+03
1.60E+03
1.74E+03
1.54E+03
2.54E+03
2.08E+03
2.20E+03
1.67E+02
2.65E+03
1.74E+03
2.06E+03
1.19E+02
2.39E+03
1.74E+03
1.98E+03
1.30E+02
2.34E+03
1.62E+03
1.88E+03
1.28E+02
2.23E+03
1.53E+03
1.74E+03
8.30E+01
1.97E+03
1.51E+03
2.24E+03
1.28E+02
2.59E+03
1.89E+03
5.00E+02
PASS
2.22E+03
1.63E+02
2.67E+03
1.77E+03
2.50E+02
PASS
2.04E+03
1.18E+02
2.36E+03
1.71E+03
2.50E+02
PASS
1.91E+03
8.29E+01
2.14E+03
1.68E+03
2.50E+02
PASS
1.67E+03
1.25E+02
2.01E+03
1.32E+03
2.50E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
89
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
AVOL (V/mV) RL=2K VO=+/-10V B
2.50E+03
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.42. Plot of AVOL (V/mV) RL=2K VO=+/-10V B versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
90
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.42. Raw data for AVOL (V/mV) RL=2K VO=+/-10V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
AVOL (V/mV) RL=2K VO=+/-10V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
2.12E+03
2.19E+03
2.22E+03
2.26E+03
2.30E+03
2.37E+03
1.90E+03
2.18E+03
2.22E+03
2.36E+03
2.38E+03
2.09E+03
Total
20
2.04E+03
2.08E+03
2.08E+03
2.25E+03
2.17E+03
2.10E+03
1.91E+03
2.18E+03
2.13E+03
2.21E+03
2.48E+03
2.13E+03
Dose (krad(Si))
50
100
1.91E+03 1.84E+03
2.17E+03 1.85E+03
1.96E+03 1.88E+03
1.99E+03 2.03E+03
1.97E+03 2.00E+03
1.96E+03 1.97E+03
1.75E+03 1.65E+03
1.91E+03 1.94E+03
2.10E+03 2.00E+03
2.11E+03 1.97E+03
2.39E+03 2.43E+03
2.12E+03 2.09E+03
200
1.77E+03
1.72E+03
1.82E+03
1.71E+03
1.82E+03
1.82E+03
1.42E+03
1.61E+03
1.76E+03
1.68E+03
2.40E+03
2.10E+03
2.22E+03
6.86E+01
2.40E+03
2.03E+03
2.12E+03
8.53E+01
2.36E+03
1.89E+03
2.00E+03
1.00E+02
2.27E+03
1.73E+03
1.92E+03
8.91E+01
2.17E+03
1.68E+03
1.77E+03
5.14E+01
1.91E+03
1.62E+03
2.21E+03
1.90E+02
2.73E+03
1.69E+03
5.00E+02
PASS
2.11E+03
1.18E+02
2.43E+03
1.78E+03
2.50E+02
PASS
1.96E+03
1.50E+02
2.38E+03
1.55E+03
2.50E+02
PASS
1.91E+03
1.44E+02
2.30E+03
1.51E+03
2.50E+02
PASS
1.66E+03
1.53E+02
2.08E+03
1.24E+03
2.50E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
91
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
CMRR (dB) @ +/-15V VCM=+/-15V A
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.43. Plot of CMRR (dB) @ +/-15V VCM=+/-15V A versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
92
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.43. Raw data for CMRR (dB) @ +/-15V VCM=+/-15V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
CMRR (dB) @ +/-15V VCM=+/-15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
9.62E+01
1.02E+02
1.09E+02
1.02E+02
1.20E+02
1.12E+02
1.09E+02
1.06E+02
1.24E+02
1.02E+02
9.92E+01
1.08E+02
Total
20
9.63E+01
1.02E+02
1.09E+02
1.02E+02
1.20E+02
1.14E+02
1.08E+02
1.06E+02
1.29E+02
1.02E+02
9.92E+01
1.08E+02
Dose (krad(Si))
50
100
9.62E+01 9.62E+01
1.02E+02 1.02E+02
1.08E+02 1.08E+02
1.02E+02 1.02E+02
1.21E+02 1.23E+02
1.16E+02 1.18E+02
1.08E+02 1.07E+02
1.06E+02 1.05E+02
1.38E+02 1.37E+02
1.02E+02 1.02E+02
9.93E+01 9.92E+01
1.08E+02 1.08E+02
200
9.60E+01
1.01E+02
1.07E+02
1.02E+02
1.33E+02
1.26E+02
1.07E+02
1.06E+02
1.48E+02
1.02E+02
9.92E+01
1.08E+02
1.06E+02
8.99E+00
1.30E+02
8.12E+01
1.06E+02
8.91E+00
1.30E+02
8.12E+01
1.06E+02
9.57E+00
1.32E+02
7.96E+01
1.06E+02
1.05E+01
1.35E+02
7.74E+01
1.08E+02
1.46E+01
1.48E+02
6.76E+01
1.11E+02
8.09E+00
1.33E+02
8.85E+01
9.00E+01
PASS
1.12E+02
1.05E+01
1.41E+02
8.31E+01
8.60E+01
PASS
1.14E+02
1.46E+01
1.54E+02
7.38E+01
8.60E+01
PASS
1.14E+02
1.45E+01
1.54E+02
7.43E+01
8.60E+01
PASS
1.18E+02
1.94E+01
1.71E+02
6.44E+01
8.60E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
93
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
CMRR (dB) @ +/-15V VCM=+/-15V B
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.44. Plot of CMRR (dB) @ +/-15V VCM=+/-15V B versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
94
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.44. Raw data for CMRR (dB) @ +/-15V VCM=+/-15V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
CMRR (dB) @ +/-15V VCM=+/-15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.00E+02
1.09E+02
1.11E+02
1.03E+02
9.83E+01
9.86E+01
1.15E+02
9.93E+01
1.08E+02
1.11E+02
1.13E+02
1.25E+02
Total
20
1.00E+02
1.08E+02
1.10E+02
1.04E+02
9.81E+01
9.85E+01
1.13E+02
9.92E+01
1.08E+02
1.09E+02
1.13E+02
1.24E+02
Dose (krad(Si))
50
100
1.00E+02 9.99E+01
1.08E+02 1.07E+02
1.09E+02 1.08E+02
1.04E+02 1.05E+02
9.80E+01 9.79E+01
9.84E+01 9.83E+01
1.13E+02 1.12E+02
9.91E+01 9.91E+01
1.07E+02 1.07E+02
1.08E+02 1.07E+02
1.13E+02 1.13E+02
1.24E+02 1.24E+02
200
9.94E+01
1.07E+02
1.07E+02
1.06E+02
9.77E+01
9.84E+01
1.11E+02
9.91E+01
1.07E+02
1.06E+02
1.13E+02
1.23E+02
1.04E+02
5.43E+00
1.19E+02
8.94E+01
1.04E+02
5.01E+00
1.18E+02
9.04E+01
1.04E+02
4.78E+00
1.17E+02
9.07E+01
1.04E+02
4.63E+00
1.16E+02
9.10E+01
1.03E+02
4.47E+00
1.16E+02
9.11E+01
1.06E+02
7.24E+00
1.26E+02
8.65E+01
9.00E+01
PASS
1.06E+02
6.50E+00
1.23E+02
8.77E+01
8.60E+01
PASS
1.05E+02
6.15E+00
1.22E+02
8.82E+01
8.60E+01
PASS
1.05E+02
5.79E+00
1.21E+02
8.88E+01
8.60E+01
PASS
1.04E+02
5.36E+00
1.19E+02
8.96E+01
8.60E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
95
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
1.20E+02
CMRR (dB) MATCHING
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.45. Plot of CMRR (dB) MATCHING versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
96
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.45. Raw data for CMRR (dB) MATCHING versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
CMRR (dB) MATCHING
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.05E+02
1.07E+02
1.23E+02
9.67E+01
9.75E+01
9.69E+01
1.14E+02
1.04E+02
1.07E+02
1.06E+02
9.76E+01
1.09E+02
Total
20
1.05E+02
1.08E+02
1.26E+02
9.69E+01
9.74E+01
9.72E+01
1.15E+02
1.04E+02
1.07E+02
1.07E+02
9.76E+01
1.09E+02
Dose (krad(Si))
50
100
1.05E+02 1.05E+02
1.08E+02 1.08E+02
1.30E+02 1.32E+02
9.70E+01 9.72E+01
9.75E+01 9.75E+01
9.73E+01 9.75E+01
1.15E+02 1.15E+02
1.05E+02 1.05E+02
1.07E+02 1.07E+02
1.08E+02 1.08E+02
9.77E+01 9.77E+01
1.09E+02 1.09E+02
200
1.06E+02
1.08E+02
1.37E+02
9.74E+01
9.75E+01
9.81E+01
1.15E+02
1.05E+02
1.07E+02
1.10E+02
9.77E+01
1.09E+02
1.06E+02
1.06E+01
1.35E+02
7.68E+01
1.07E+02
1.16E+01
1.38E+02
7.46E+01
1.07E+02
1.33E+01
1.44E+02
7.09E+01
1.08E+02
1.44E+01
1.48E+02
6.85E+01
1.09E+02
1.62E+01
1.53E+02
6.47E+01
1.06E+02
6.16E+00
1.23E+02
8.88E+01
8.40E+01
PASS
1.06E+02
6.35E+00
1.24E+02
8.88E+01
8.30E+01
PASS
1.06E+02
6.32E+00
1.24E+02
8.90E+01
8.30E+01
PASS
1.06E+02
6.28E+00
1.24E+02
8.92E+01
8.30E+01
PASS
1.07E+02
6.12E+00
1.24E+02
9.00E+01
8.30E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
97
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
1.40E+02
PSRR (dB) @ +/-2V TO +/-16V A
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.46. Plot of PSRR (dB) @ +/-2V TO +/-16V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
98
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.46. Raw data for PSRR (dB) @ +/-2V TO +/-16V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
PSRR (dB) @ +/-2V TO +/-16V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.26E+02
1.19E+02
1.17E+02
1.13E+02
1.03E+02
1.11E+02
1.08E+02
1.32E+02
1.18E+02
1.12E+02
1.07E+02
1.40E+02
Total
20
1.25E+02
1.19E+02
1.18E+02
1.13E+02
1.03E+02
1.11E+02
1.08E+02
1.36E+02
1.18E+02
1.12E+02
1.07E+02
1.43E+02
Dose (krad(Si))
50
100
1.25E+02 1.28E+02
1.20E+02 1.18E+02
1.18E+02 1.17E+02
1.13E+02 1.14E+02
1.03E+02 1.03E+02
1.12E+02 1.12E+02
1.08E+02 1.08E+02
1.36E+02 1.37E+02
1.18E+02 1.18E+02
1.12E+02 1.12E+02
1.07E+02 1.07E+02
1.42E+02 1.42E+02
200
1.26E+02
1.18E+02
1.20E+02
1.15E+02
1.04E+02
1.12E+02
1.08E+02
1.41E+02
1.18E+02
1.12E+02
1.07E+02
1.42E+02
1.16E+02
8.51E+00
1.39E+02
9.22E+01
1.16E+02
8.26E+00
1.38E+02
9.31E+01
1.16E+02
8.31E+00
1.39E+02
9.31E+01
1.16E+02
8.88E+00
1.40E+02
9.17E+01
1.17E+02
8.14E+00
1.39E+02
9.43E+01
1.16E+02
9.69E+00
1.43E+02
8.96E+01
9.00E+01
PASS
1.17E+02
1.10E+01
1.47E+02
8.69E+01
9.00E+01
PASS
1.17E+02
1.11E+01
1.48E+02
8.66E+01
9.00E+01
PASS
1.17E+02
1.14E+01
1.49E+02
8.61E+01
9.00E+01
PASS
1.18E+02
1.32E+01
1.55E+02
8.21E+01
9.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
99
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
PSRR (dB) @ +/-2V TO +/-16V B
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.47. Plot of PSRR (dB) @ +/-2V TO +/-16V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.47. Raw data for PSRR (dB) @ +/-2V TO +/-16V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
PSRR (dB) @ +/-2V TO +/-16V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.17E+02
1.13E+02
1.04E+02
1.06E+02
1.23E+02
1.10E+02
1.25E+02
1.12E+02
1.18E+02
1.02E+02
1.08E+02
1.16E+02
Total
20
1.17E+02
1.13E+02
1.04E+02
1.06E+02
1.23E+02
1.11E+02
1.25E+02
1.13E+02
1.18E+02
1.03E+02
1.08E+02
1.16E+02
Dose (krad(Si))
50
100
1.18E+02 1.17E+02
1.13E+02 1.13E+02
1.04E+02 1.04E+02
1.06E+02 1.06E+02
1.24E+02 1.23E+02
1.10E+02 1.11E+02
1.25E+02 1.25E+02
1.12E+02 1.12E+02
1.19E+02 1.18E+02
1.03E+02 1.03E+02
1.08E+02 1.08E+02
1.16E+02 1.16E+02
200
1.18E+02
1.14E+02
1.05E+02
1.07E+02
1.23E+02
1.11E+02
1.23E+02
1.12E+02
1.19E+02
1.03E+02
1.08E+02
1.16E+02
1.12E+02
7.76E+00
1.34E+02
9.11E+01
1.13E+02
7.89E+00
1.34E+02
9.11E+01
1.13E+02
8.07E+00
1.35E+02
9.09E+01
1.12E+02
7.60E+00
1.33E+02
9.17E+01
1.13E+02
7.35E+00
1.34E+02
9.33E+01
1.14E+02
8.64E+00
1.37E+02
9.01E+01
9.00E+01
PASS
1.14E+02
8.43E+00
1.37E+02
9.08E+01
9.00E+01
PASS
1.14E+02
8.42E+00
1.37E+02
9.08E+01
9.00E+01
PASS
1.14E+02
8.22E+00
1.36E+02
9.12E+01
9.00E+01
PASS
1.14E+02
7.78E+00
1.35E+02
9.24E+01
9.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
101
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
1.40E+02
PSRR (dB) MATCHING
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.48. Plot of PSRR (dB) MATCHING versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
102
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.48. Raw data for PSRR (dB) MATCHING versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
PSRR (dB) MATCHING
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.14E+02
1.18E+02
1.06E+02
1.03E+02
1.04E+02
1.32E+02
1.09E+02
1.13E+02
1.12E+02
1.06E+02
1.28E+02
1.17E+02
Total
20
1.14E+02
1.19E+02
1.06E+02
1.03E+02
1.04E+02
1.30E+02
1.09E+02
1.13E+02
1.12E+02
1.06E+02
1.28E+02
1.17E+02
Dose (krad(Si))
50
100
1.15E+02 1.14E+02
1.19E+02 1.20E+02
1.06E+02 1.06E+02
1.03E+02 1.03E+02
1.04E+02 1.04E+02
1.29E+02 1.28E+02
1.09E+02 1.09E+02
1.13E+02 1.13E+02
1.12E+02 1.12E+02
1.06E+02 1.07E+02
1.28E+02 1.27E+02
1.17E+02 1.17E+02
200
1.15E+02
1.23E+02
1.07E+02
1.04E+02
1.05E+02
1.26E+02
1.10E+02
1.12E+02
1.12E+02
1.07E+02
1.28E+02
1.17E+02
1.09E+02
6.97E+00
1.28E+02
8.98E+01
1.09E+02
7.05E+00
1.29E+02
8.99E+01
1.09E+02
7.12E+00
1.29E+02
8.99E+01
1.10E+02
7.21E+00
1.29E+02
8.97E+01
1.11E+02
8.05E+00
1.33E+02
8.87E+01
1.14E+02
1.00E+01
1.42E+02
8.71E+01
8.30E+01
PASS
1.14E+02
9.40E+00
1.40E+02
8.86E+01
8.30E+01
PASS
1.14E+02
8.98E+00
1.39E+02
8.95E+01
8.30E+01
PASS
1.14E+02
8.13E+00
1.36E+02
9.14E+01
8.30E+01
PASS
1.13E+02
7.19E+00
1.33E+02
9.37E+01
8.30E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
103
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
0.00E+00
+ISC (A) VOUT=0V @ +/-15V A
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.49. Plot of +ISC (A) VOUT=0V @ +/-15V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
104
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.49. Raw data for +ISC (A) VOUT=0V @ +/-15V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+ISC (A) VOUT=0V @ +/-15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-3.36E-02
-3.27E-02
-3.31E-02
-3.27E-02
-3.34E-02
-3.36E-02
-3.26E-02
-3.35E-02
-3.37E-02
-3.21E-02
-3.24E-02
-3.32E-02
Total
20
-3.12E-02
-3.04E-02
-3.06E-02
-3.03E-02
-3.09E-02
-3.16E-02
-3.07E-02
-3.14E-02
-3.16E-02
-3.01E-02
-3.13E-02
-3.21E-02
Dose (krad(Si))
50
100
-3.04E-02 -2.96E-02
-2.96E-02 -2.88E-02
-2.97E-02 -2.89E-02
-2.95E-02 -2.86E-02
-3.01E-02 -2.94E-02
-3.09E-02 -2.97E-02
-3.01E-02 -2.89E-02
-3.07E-02 -2.94E-02
-3.11E-02 -2.99E-02
-2.95E-02 -2.83E-02
-3.18E-02 -3.18E-02
-3.25E-02 -3.26E-02
200
-2.91E-02
-2.79E-02
-2.83E-02
-2.76E-02
-2.86E-02
-2.74E-02
-2.68E-02
-2.70E-02
-2.76E-02
-2.60E-02
-3.14E-02
-3.21E-02
-3.31E-02
4.20E-04
-3.19E-02
-3.43E-02
-3.07E-02
3.83E-04
-2.96E-02
-3.17E-02
-2.98E-02
3.70E-04
-2.88E-02
-3.09E-02
-2.91E-02
3.86E-04
-2.80E-02
-3.01E-02
-2.83E-02
5.64E-04
-2.67E-02
-2.98E-02
-3.31E-02
6.83E-04
-3.12E-02
-3.50E-02
-1.50E-02
PASS
-3.11E-02
6.57E-04
-2.93E-02
-3.29E-02
-1.00E-02
PASS
-3.05E-02
6.69E-04
-2.86E-02
-3.23E-02
-1.00E-02
PASS
-2.92E-02
6.38E-04
-2.75E-02
-3.10E-02
-1.00E-02
PASS
-2.69E-02
6.24E-04
-2.52E-02
-2.87E-02
-1.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
105
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
0.00E+00
+ISC (A) VOUT=0V @ +/-15V B
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.50. Plot of +ISC (A) VOUT=0V @ +/-15V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
106
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.50. Raw data for +ISC (A) VOUT=0V @ +/-15V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+ISC (A) VOUT=0V @ +/-15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-3.49E-02
-3.32E-02
-3.37E-02
-3.31E-02
-3.41E-02
-3.45E-02
-3.33E-02
-3.43E-02
-3.46E-02
-3.28E-02
-3.30E-02
-3.41E-02
Total
20
-3.25E-02
-3.09E-02
-3.11E-02
-3.06E-02
-3.15E-02
-3.25E-02
-3.14E-02
-3.22E-02
-3.24E-02
-3.08E-02
-3.19E-02
-3.30E-02
Dose (krad(Si))
50
100
-3.16E-02 -3.07E-02
-3.01E-02 -2.93E-02
-3.03E-02 -2.95E-02
-2.98E-02 -2.90E-02
-3.07E-02 -2.99E-02
-3.18E-02 -3.04E-02
-3.07E-02 -2.96E-02
-3.15E-02 -3.01E-02
-3.19E-02 -3.06E-02
-3.01E-02 -2.89E-02
-3.24E-02 -3.24E-02
-3.34E-02 -3.35E-02
200
-3.02E-02
-2.84E-02
-2.88E-02
-2.80E-02
-2.91E-02
-2.81E-02
-2.73E-02
-2.77E-02
-2.83E-02
-2.65E-02
-3.20E-02
-3.30E-02
-3.38E-02
7.32E-04
-3.18E-02
-3.58E-02
-3.13E-02
7.10E-04
-2.94E-02
-3.33E-02
-3.05E-02
6.90E-04
-2.86E-02
-3.24E-02
-2.97E-02
6.85E-04
-2.78E-02
-3.16E-02
-2.89E-02
8.30E-04
-2.66E-02
-3.12E-02
-3.39E-02
7.71E-04
-3.18E-02
-3.60E-02
-1.50E-02
PASS
-3.19E-02
7.39E-04
-2.98E-02
-3.39E-02
-1.00E-02
PASS
-3.12E-02
7.48E-04
-2.91E-02
-3.32E-02
-1.00E-02
PASS
-2.99E-02
7.16E-04
-2.79E-02
-3.19E-02
-1.00E-02
PASS
-2.76E-02
6.92E-04
-2.57E-02
-2.95E-02
-1.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
107
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
6.00E-02
-ISC (A) VOUT=0V @ +/-15V A
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.51. Plot of -ISC (A) VOUT=0V @ +/-15V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
108
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.51. Raw data for -ISC (A) VOUT=0V @ +/-15V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-ISC (A) VOUT=0V @ +/-15V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
5.29E-02
5.40E-02
5.39E-02
5.28E-02
5.26E-02
5.33E-02
5.24E-02
5.35E-02
5.25E-02
5.32E-02
5.39E-02
5.23E-02
Total
20
5.38E-02
5.48E-02
5.48E-02
5.36E-02
5.36E-02
5.44E-02
5.36E-02
5.47E-02
5.38E-02
5.44E-02
5.54E-02
5.37E-02
Dose (krad(Si))
50
100
5.31E-02 5.28E-02
5.41E-02 5.37E-02
5.41E-02 5.37E-02
5.29E-02 5.25E-02
5.30E-02 5.26E-02
5.37E-02 5.33E-02
5.29E-02 5.24E-02
5.38E-02 5.34E-02
5.30E-02 5.26E-02
5.35E-02 5.32E-02
5.48E-02 5.47E-02
5.32E-02 5.31E-02
200
5.32E-02
5.42E-02
5.41E-02
5.28E-02
5.31E-02
5.34E-02
5.26E-02
5.35E-02
5.27E-02
5.33E-02
5.53E-02
5.37E-02
5.33E-02
6.62E-04
5.51E-02
5.14E-02
5.41E-02
6.23E-04
5.58E-02
5.24E-02
5.34E-02
6.19E-04
5.51E-02
5.17E-02
5.31E-02
5.93E-04
5.47E-02
5.14E-02
5.35E-02
6.24E-04
5.52E-02
5.18E-02
5.30E-02
4.96E-04
5.43E-02
5.16E-02
1.50E-02
PASS
5.42E-02
4.39E-04
5.54E-02
5.30E-02
1.00E-02
PASS
5.34E-02
4.20E-04
5.45E-02
5.22E-02
1.00E-02
PASS
5.30E-02
4.37E-04
5.42E-02
5.18E-02
1.00E-02
PASS
5.31E-02
4.35E-04
5.43E-02
5.19E-02
1.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
109
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
6.00E-02
-ISC (A) VOUT=0V @ +/-15V B
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.52. Plot of -ISC (A) VOUT=0V @ +/-15V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
110
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.52. Raw data for -ISC (A) VOUT=0V @ +/-15V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-ISC (A) VOUT=0V @ +/-15V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
5.12E-02
5.22E-02
5.21E-02
5.07E-02
5.08E-02
5.16E-02
5.05E-02
5.17E-02
5.06E-02
5.11E-02
5.18E-02
5.05E-02
Total
20
5.21E-02
5.29E-02
5.29E-02
5.15E-02
5.17E-02
5.27E-02
5.16E-02
5.27E-02
5.18E-02
5.24E-02
5.32E-02
5.18E-02
Dose (krad(Si))
50
100
5.14E-02 5.11E-02
5.23E-02 5.19E-02
5.22E-02 5.18E-02
5.08E-02 5.05E-02
5.11E-02 5.07E-02
5.19E-02 5.16E-02
5.08E-02 5.05E-02
5.19E-02 5.15E-02
5.10E-02 5.06E-02
5.15E-02 5.12E-02
5.27E-02 5.25E-02
5.13E-02 5.12E-02
200
5.14E-02
5.24E-02
5.22E-02
5.08E-02
5.12E-02
5.17E-02
5.06E-02
5.16E-02
5.07E-02
5.13E-02
5.31E-02
5.18E-02
5.14E-02
6.95E-04
5.33E-02
4.95E-02
5.22E-02
6.62E-04
5.40E-02
5.04E-02
5.16E-02
6.54E-04
5.33E-02
4.98E-02
5.12E-02
6.34E-04
5.29E-02
4.95E-02
5.16E-02
6.80E-04
5.35E-02
4.97E-02
5.11E-02
5.54E-04
5.26E-02
4.96E-02
1.50E-02
PASS
5.22E-02
5.09E-04
5.36E-02
5.09E-02
1.00E-02
PASS
5.14E-02
4.96E-04
5.28E-02
5.01E-02
1.00E-02
PASS
5.11E-02
5.03E-04
5.25E-02
4.97E-02
1.00E-02
PASS
5.12E-02
5.08E-04
5.26E-02
4.98E-02
1.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
111
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
5.00E-03
4.50E-03
4.00E-03
+ICC (A) @ +5V
3.50E-03
3.00E-03
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.53. Plot of +ICC (A) @ +5V versus total dose. The solid diamonds are the average of the measured data
points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured
data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
112
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.53. Raw data for +ICC (A) @ +5V versus total dose, including the statistical analysis, specification and
the status of the testing (pass/fail).
+ICC (A) @ +5V
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
3.57E-03
3.57E-03
3.55E-03
3.59E-03
3.55E-03
3.56E-03
3.60E-03
3.59E-03
3.68E-03
3.51E-03
3.61E-03
3.61E-03
Total
20
3.47E-03
3.48E-03
3.45E-03
3.49E-03
3.45E-03
3.49E-03
3.52E-03
3.50E-03
3.60E-03
3.43E-03
3.56E-03
3.57E-03
Dose (krad(Si))
50
100
3.42E-03 3.38E-03
3.43E-03 3.40E-03
3.40E-03 3.37E-03
3.44E-03 3.40E-03
3.41E-03 3.37E-03
3.46E-03 3.41E-03
3.49E-03 3.45E-03
3.48E-03 3.42E-03
3.57E-03 3.52E-03
3.40E-03 3.35E-03
3.57E-03 3.58E-03
3.58E-03 3.59E-03
200
3.37E-03
3.35E-03
3.34E-03
3.35E-03
3.34E-03
3.31E-03
3.35E-03
3.32E-03
3.42E-03
3.25E-03
3.56E-03
3.57E-03
3.57E-03
1.67E-05
3.61E-03
3.52E-03
3.47E-03
1.79E-05
3.52E-03
3.42E-03
3.42E-03
1.58E-05
3.46E-03
3.38E-03
3.38E-03
1.52E-05
3.43E-03
3.34E-03
3.35E-03
1.22E-05
3.38E-03
3.32E-03
3.59E-03
6.22E-05
3.76E-03
3.42E-03
4.40E-03
PASS
3.51E-03
6.14E-05
3.68E-03
3.34E-03
4.40E-03
PASS
3.48E-03
6.12E-05
3.65E-03
3.31E-03
4.40E-03
PASS
3.43E-03
6.20E-05
3.60E-03
3.26E-03
4.40E-03
PASS
3.33E-03
6.20E-05
3.50E-03
3.16E-03
4.40E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
113
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
0.00E+00
-5.00E-04
-1.00E-03
-IEE (A) @ +5V
-1.50E-03
-2.00E-03
-2.50E-03
-3.00E-03
-3.50E-03
-4.00E-03
-4.50E-03
-5.00E-03
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.54. Plot of -IEE (A) @ +5V versus total dose. The solid diamonds are the average of the measured data
points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured
data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
114
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.54. Raw data for -IEE (A) @ +5V versus total dose, including the statistical analysis, specification and
the status of the testing (pass/fail).
-IEE (A) @ +5V
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-3.57E-03
-3.57E-03
-3.56E-03
-3.59E-03
-3.55E-03
-3.57E-03
-3.60E-03
-3.58E-03
-3.68E-03
-3.51E-03
-3.60E-03
-3.62E-03
Total
20
-3.47E-03
-3.48E-03
-3.45E-03
-3.49E-03
-3.44E-03
-3.49E-03
-3.52E-03
-3.51E-03
-3.60E-03
-3.43E-03
-3.56E-03
-3.57E-03
Dose (krad(Si))
50
100
-3.42E-03 -3.38E-03
-3.43E-03 -3.40E-03
-3.40E-03 -3.37E-03
-3.45E-03 -3.40E-03
-3.40E-03 -3.37E-03
-3.46E-03 -3.41E-03
-3.49E-03 -3.44E-03
-3.48E-03 -3.42E-03
-3.57E-03 -3.52E-03
-3.40E-03 -3.35E-03
-3.57E-03 -3.58E-03
-3.58E-03 -3.59E-03
200
-3.37E-03
-3.35E-03
-3.34E-03
-3.35E-03
-3.34E-03
-3.31E-03
-3.35E-03
-3.32E-03
-3.42E-03
-3.25E-03
-3.56E-03
-3.57E-03
-3.57E-03
1.48E-05
-3.53E-03
-3.61E-03
-3.47E-03
2.07E-05
-3.41E-03
-3.52E-03
-3.42E-03
2.12E-05
-3.36E-03
-3.48E-03
-3.38E-03
1.52E-05
-3.34E-03
-3.43E-03
-3.35E-03
1.22E-05
-3.32E-03
-3.38E-03
-3.59E-03
6.14E-05
-3.42E-03
-3.76E-03
-4.40E-03
PASS
-3.51E-03
6.12E-05
-3.34E-03
-3.68E-03
-4.40E-03
PASS
-3.48E-03
6.12E-05
-3.31E-03
-3.65E-03
-4.40E-03
PASS
-3.43E-03
6.14E-05
-3.26E-03
-3.60E-03
-4.40E-03
PASS
-3.33E-03
6.20E-05
-3.16E-03
-3.50E-03
-4.40E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
115
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
V OFFSET (V) @ +5V VCM=0V A
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.55. Plot of V OFFSET (V) @ +5V VCM=0V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
116
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.55. Raw data for V OFFSET (V) @ +5V VCM=0V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
V OFFSET (V) @ +5V VCM=0V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-2.13E-04
-1.37E-04
3.53E-04
-3.48E-04
8.77E-05
2.52E-04
2.47E-04
2.85E-04
1.09E-04
8.81E-06
1.19E-05
1.62E-04
Total
20
-2.28E-04
-1.51E-04
3.26E-04
-3.60E-04
6.13E-05
2.16E-04
2.09E-04
2.51E-04
7.50E-05
-2.39E-05
-2.54E-06
1.57E-04
Dose (krad(Si))
50
100
-2.25E-04 -2.22E-04
-1.45E-04 -1.45E-04
3.31E-04 3.37E-04
-3.47E-04 -3.33E-04
5.50E-05 5.38E-05
2.05E-04 1.96E-04
2.00E-04 1.89E-04
2.30E-04 2.22E-04
6.01E-05 5.48E-05
-3.94E-05 -5.12E-05
1.92E-06 2.89E-06
1.58E-04 1.59E-04
200
-2.17E-04
-1.46E-04
3.32E-04
-3.19E-04
5.14E-05
1.82E-04
1.83E-04
2.26E-04
5.71E-05
-5.98E-05
-1.00E-08
1.57E-04
-5.17E-05
2.76E-04
7.05E-04
-8.08E-04
-7.03E-05
2.69E-04
6.67E-04
-8.07E-04
-6.61E-05
2.66E-04
6.63E-04
-7.95E-04
-6.18E-05
2.64E-04
6.62E-04
-7.86E-04
-5.98E-05
2.58E-04
6.46E-04
-7.66E-04
1.80E-04
1.17E-04
5.02E-04
-1.42E-04
-8.00E-04
PASS
8.00E-04
PASS
1.45E-04
1.16E-04
4.63E-04
-1.72E-04
-9.50E-04
PASS
9.50E-04
PASS
1.31E-04
1.16E-04
4.50E-04
-1.88E-04
-9.50E-04
PASS
9.50E-04
PASS
1.22E-04
1.17E-04
4.43E-04
-1.98E-04
-9.50E-04
PASS
9.50E-04
PASS
1.18E-04
1.17E-04
4.40E-04
-2.05E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
117
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
V OFFSET (V) @ +5V VCM=0V B
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.56. Plot of V OFFSET (V) @ +5V VCM=0V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
118
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.56. Raw data for V OFFSET (V) @ +5V VCM=0V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
V OFFSET (V) @ +5V VCM=0V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.48E-05
4.18E-04
2.80E-04
3.12E-04
-2.15E-04
-2.51E-04
3.98E-06
-2.51E-04
-3.69E-05
2.59E-04
-6.77E-05
1.63E-04
Total
20
-5.73E-05
3.90E-04
2.49E-04
2.66E-04
-2.40E-04
-2.80E-04
-2.20E-05
-2.81E-04
-6.33E-05
2.08E-04
-7.88E-05
1.57E-04
Dose (krad(Si))
50
100
-5.57E-05 -5.37E-05
3.95E-04 3.98E-04
2.44E-04 2.40E-04
2.64E-04 2.53E-04
-2.35E-04 -2.36E-04
-2.95E-04 -3.09E-04
-2.66E-05 -2.87E-05
-2.93E-04 -3.09E-04
-6.92E-05 -7.99E-05
1.87E-04 1.59E-04
-7.46E-05 -7.28E-05
1.59E-04 1.60E-04
200
-6.18E-05
3.94E-04
2.31E-04
2.45E-04
-2.39E-04
-3.17E-04
-1.80E-05
-3.08E-04
-8.38E-05
1.20E-04
-7.85E-05
1.58E-04
1.52E-04
2.66E-04
8.81E-04
-5.76E-04
1.22E-04
2.61E-04
8.37E-04
-5.94E-04
1.22E-04
2.59E-04
8.32E-04
-5.88E-04
1.20E-04
2.58E-04
8.28E-04
-5.87E-04
1.14E-04
2.57E-04
8.19E-04
-5.91E-04
-5.50E-05
2.12E-04
5.25E-04
-6.35E-04
-8.00E-04
PASS
8.00E-04
PASS
-8.77E-05
2.04E-04
4.73E-04
-6.48E-04
-9.50E-04
PASS
9.50E-04
PASS
-9.94E-05
2.02E-04
4.56E-04
-6.54E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.13E-04
1.99E-04
4.34E-04
-6.60E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.21E-04
1.89E-04
3.98E-04
-6.41E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
119
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I OFFSET (A) @ +5V VCM=0V A
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.57. Plot of I OFFSET (A) @ +5V VCM=0V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
120
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.57. Raw data for I OFFSET (A) @ +5V VCM=0V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I OFFSET (A) @ +5V VCM=0V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
3.18E-09
1.92E-09
4.12E-09
-5.44E-09
1.01E-10
-2.05E-10
-1.79E-09
3.49E-09
2.34E-09
4.34E-09
-2.88E-10
1.82E-09
Total
20
2.98E-09
1.91E-09
3.36E-09
-5.98E-09
-2.24E-10
-8.14E-10
-2.60E-09
3.28E-09
2.16E-09
4.81E-09
-3.13E-10
1.80E-09
Dose (krad(Si))
50
100
2.95E-09 3.88E-09
1.69E-09 1.90E-09
4.60E-09 5.03E-09
-6.78E-09 -7.09E-09
-3.66E-10 -7.50E-11
-9.20E-11 -1.28E-09
-1.83E-09 -2.91E-09
2.11E-09 1.42E-09
1.55E-09 2.39E-09
4.50E-09 3.65E-09
-2.70E-10 -2.85E-10
1.80E-09 1.81E-09
200
3.18E-09
2.60E-09
5.81E-09
-6.84E-09
-2.54E-10
-3.42E-09
-7.32E-10
2.87E-09
1.20E-09
2.52E-09
-2.90E-10
1.85E-09
7.76E-10
3.79E-09
1.12E-08
-9.61E-09
4.09E-10
3.83E-09
1.09E-08
-1.01E-08
4.19E-10
4.41E-09
1.25E-08
-1.17E-08
7.28E-10
4.79E-09
1.39E-08
-1.24E-08
8.98E-10
4.83E-09
1.42E-08
-1.24E-08
1.63E-09
2.57E-09
8.67E-09
-5.41E-09
-6.50E-08
PASS
6.50E-08
PASS
1.37E-09
3.03E-09
9.67E-09
-6.93E-09
-6.50E-08
PASS
6.50E-08
PASS
1.25E-09
2.38E-09
7.78E-09
-5.28E-09
-6.50E-08
PASS
6.50E-08
PASS
6.54E-10
2.69E-09
8.04E-09
-6.73E-09
-6.50E-08
PASS
6.50E-08
PASS
4.87E-10
2.60E-09
7.62E-09
-6.65E-09
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
121
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I OFFSET (A) @ +5V VCM=0V B
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.58. Plot of I OFFSET (A) @ +5V VCM=0V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
122
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.58. Raw data for I OFFSET (A) @ +5V VCM=0V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I OFFSET (A) @ +5V VCM=0V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
3.15E-09
3.79E-09
3.88E-09
-2.81E-10
-6.40E-11
-3.35E-09
7.67E-10
-5.93E-09
-3.91E-09
4.95E-10
-3.80E-09
5.11E-09
Total
20
3.23E-09
3.42E-09
3.13E-09
-1.17E-09
-2.80E-10
-3.46E-09
1.17E-09
-5.96E-09
-3.86E-09
-4.46E-10
-4.00E-09
5.20E-09
Dose (krad(Si))
50
100
2.78E-09 2.15E-09
2.92E-09 2.20E-09
1.24E-09 1.47E-09
-1.96E-10 -5.18E-10
-5.09E-10 -9.22E-10
-2.72E-09 -2.20E-09
1.46E-09 1.16E-09
-5.90E-09 -4.16E-09
-4.02E-09 -5.00E-09
1.47E-10 -5.96E-10
-3.96E-09 -4.00E-09
5.13E-09 5.14E-09
200
2.51E-09
1.19E-09
-7.24E-10
-7.30E-11
-1.26E-09
-2.17E-09
1.99E-09
-4.05E-09
-4.16E-09
-7.38E-10
-3.99E-09
5.18E-09
2.10E-09
2.09E-09
7.83E-09
-3.64E-09
1.67E-09
2.21E-09
7.72E-09
-4.38E-09
1.25E-09
1.61E-09
5.65E-09
-3.16E-09
8.75E-10
1.49E-09
4.96E-09
-3.21E-09
3.29E-10
1.53E-09
4.51E-09
-3.86E-09
-2.39E-09
2.92E-09
5.61E-09
-1.04E-08
-6.50E-08
PASS
6.50E-08
PASS
-2.51E-09
2.85E-09
5.30E-09
-1.03E-08
-6.50E-08
PASS
6.50E-08
PASS
-2.21E-09
3.01E-09
6.04E-09
-1.04E-08
-6.50E-08
PASS
6.50E-08
PASS
-2.16E-09
2.52E-09
4.76E-09
-9.08E-09
-6.50E-08
PASS
6.50E-08
PASS
-1.83E-09
2.56E-09
5.20E-09
-8.85E-09
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
123
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
I BIAS + (A) @ +5V VCM=0V A
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.59. Plot of I BIAS + (A) @ +5V VCM=0V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
124
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.59. Raw data for I BIAS + (A) @ +5V VCM=0V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I BIAS + (A) @ +5V VCM=0V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.02E-07
-3.22E-07
-3.08E-07
-3.32E-07
-3.11E-07
-3.11E-07
-3.22E-07
-3.11E-07
-3.48E-07
-3.07E-07
-3.37E-07
-3.24E-07
Total
20
-3.18E-07
-3.36E-07
-3.24E-07
-3.49E-07
-3.27E-07
-3.31E-07
-3.48E-07
-3.32E-07
-3.68E-07
-3.27E-07
-3.49E-07
-3.29E-07
Dose (krad(Si))
50
100
-3.28E-07 -3.46E-07
-3.49E-07 -3.65E-07
-3.34E-07 -3.54E-07
-3.58E-07 -3.71E-07
-3.37E-07 -3.56E-07
-3.51E-07 -3.75E-07
-3.60E-07 -3.83E-07
-3.52E-07 -3.77E-07
-3.81E-07 -4.01E-07
-3.47E-07 -3.70E-07
-3.45E-07 -3.41E-07
-3.28E-07 -3.27E-07
200
-3.75E-07
-3.92E-07
-3.84E-07
-4.01E-07
-3.86E-07
-4.09E-07
-4.13E-07
-4.11E-07
-4.33E-07
-4.03E-07
-3.49E-07
-3.29E-07
-3.15E-07
1.18E-08
-2.83E-07
-3.47E-07
-3.31E-07
1.22E-08
-2.97E-07
-3.64E-07
-3.41E-07
1.24E-08
-3.07E-07
-3.75E-07
-3.59E-07
1.00E-08
-3.31E-07
-3.86E-07
-3.88E-07
9.99E-09
-3.60E-07
-4.15E-07
-3.20E-07
1.65E-08
-2.75E-07
-3.65E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.41E-07
1.68E-08
-2.95E-07
-3.87E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.58E-07
1.35E-08
-3.21E-07
-3.95E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.81E-07
1.23E-08
-3.47E-07
-4.15E-07
-8.50E-07
PASS
8.50E-07
PASS
-4.14E-07
1.12E-08
-3.83E-07
-4.44E-07
-9.00E-07
PASS
9.00E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
125
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
I BIAS + (A) @ +5V VCM=0V B
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.60. Plot of I BIAS + (A) @ +5V VCM=0V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
126
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.60. Raw data for I BIAS + (A) @ +5V VCM=0V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I BIAS + (A) @ +5V VCM=0V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.02E-07
-3.20E-07
-3.10E-07
-3.26E-07
-3.11E-07
-3.14E-07
-3.24E-07
-3.17E-07
-3.39E-07
-3.02E-07
-3.37E-07
-3.23E-07
Total
20
-3.17E-07
-3.33E-07
-3.25E-07
-3.41E-07
-3.27E-07
-3.34E-07
-3.50E-07
-3.37E-07
-3.65E-07
-3.22E-07
-3.48E-07
-3.29E-07
Dose (krad(Si))
50
100
-3.27E-07 -3.47E-07
-3.47E-07 -3.61E-07
-3.37E-07 -3.57E-07
-3.53E-07 -3.67E-07
-3.37E-07 -3.57E-07
-3.52E-07 -3.74E-07
-3.61E-07 -3.79E-07
-3.56E-07 -3.78E-07
-3.75E-07 -3.96E-07
-3.37E-07 -3.61E-07
-3.41E-07 -3.41E-07
-3.27E-07 -3.26E-07
200
-3.73E-07
-3.91E-07
-3.87E-07
-3.93E-07
-3.87E-07
-4.06E-07
-4.09E-07
-4.09E-07
-4.25E-07
-3.94E-07
-3.49E-07
-3.28E-07
-3.14E-07
9.45E-09
-2.88E-07
-3.40E-07
-3.29E-07
8.90E-09
-3.04E-07
-3.53E-07
-3.40E-07
1.02E-08
-3.12E-07
-3.68E-07
-3.58E-07
7.25E-09
-3.38E-07
-3.77E-07
-3.86E-07
7.78E-09
-3.64E-07
-4.07E-07
-3.19E-07
1.39E-08
-2.81E-07
-3.57E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.42E-07
1.66E-08
-2.96E-07
-3.87E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.56E-07
1.41E-08
-3.18E-07
-3.95E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.78E-07
1.23E-08
-3.44E-07
-4.11E-07
-8.50E-07
PASS
8.50E-07
PASS
-4.09E-07
1.09E-08
-3.79E-07
-4.39E-07
-9.00E-07
PASS
9.00E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
127
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
I BIAS - (A) @ +5V VCM=0V A
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.61. Plot of I BIAS - (A) @ +5V VCM=0V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
128
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.61. Raw data for I BIAS - (A) @ +5V VCM=0V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I BIAS - (A) @ +5V VCM=0V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.06E-07
-3.24E-07
-3.13E-07
-3.27E-07
-3.12E-07
-3.11E-07
-3.21E-07
-3.15E-07
-3.51E-07
-3.12E-07
-3.38E-07
-3.26E-07
Total
20
-3.22E-07
-3.39E-07
-3.28E-07
-3.48E-07
-3.28E-07
-3.31E-07
-3.41E-07
-3.37E-07
-3.72E-07
-3.33E-07
-3.51E-07
-3.32E-07
Dose (krad(Si))
50
100
-3.31E-07 -3.54E-07
-3.53E-07 -3.68E-07
-3.39E-07 -3.58E-07
-3.53E-07 -3.67E-07
-3.38E-07 -3.56E-07
-3.52E-07 -3.73E-07
-3.62E-07 -3.78E-07
-3.60E-07 -3.81E-07
-3.84E-07 -4.07E-07
-3.50E-07 -3.74E-07
-3.47E-07 -3.47E-07
-3.30E-07 -3.29E-07
200
-3.81E-07
-3.97E-07
-3.92E-07
-3.96E-07
-3.89E-07
-4.08E-07
-4.13E-07
-4.11E-07
-4.34E-07
-4.05E-07
-3.50E-07
-3.31E-07
-3.16E-07
9.05E-09
-2.92E-07
-3.41E-07
-3.33E-07
1.04E-08
-3.04E-07
-3.61E-07
-3.43E-07
9.68E-09
-3.16E-07
-3.69E-07
-3.60E-07
6.49E-09
-3.43E-07
-3.78E-07
-3.91E-07
6.48E-09
-3.73E-07
-4.09E-07
-3.22E-07
1.66E-08
-2.77E-07
-3.68E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.43E-07
1.70E-08
-2.96E-07
-3.89E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.62E-07
1.36E-08
-3.24E-07
-3.99E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.82E-07
1.39E-08
-3.44E-07
-4.21E-07
-8.50E-07
PASS
8.50E-07
PASS
-4.14E-07
1.17E-08
-3.82E-07
-4.46E-07
-9.00E-07
PASS
9.00E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
129
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
I BIAS - (A) @ +5V VCM=0V B
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.62. Plot of I BIAS - (A) @ +5V VCM=0V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
130
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.62. Raw data for I BIAS - (A) @ +5V VCM=0V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I BIAS - (A) @ +5V VCM=0V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.06E-07
-3.25E-07
-3.14E-07
-3.26E-07
-3.11E-07
-3.11E-07
-3.26E-07
-3.11E-07
-3.36E-07
-3.03E-07
-3.34E-07
-3.29E-07
Total
20
-3.21E-07
-3.37E-07
-3.29E-07
-3.40E-07
-3.27E-07
-3.31E-07
-3.52E-07
-3.32E-07
-3.65E-07
-3.22E-07
-3.39E-07
-3.34E-07
Dose (krad(Si))
50
100
-3.31E-07 -3.50E-07
-3.50E-07 -3.64E-07
-3.38E-07 -3.59E-07
-3.54E-07 -3.67E-07
-3.37E-07 -3.56E-07
-3.49E-07 -3.73E-07
-3.64E-07 -3.81E-07
-3.53E-07 -3.76E-07
-3.72E-07 -3.92E-07
-3.37E-07 -3.61E-07
-3.38E-07 -3.37E-07
-3.32E-07 -3.32E-07
200
-3.78E-07
-3.92E-07
-3.88E-07
-3.96E-07
-3.87E-07
-4.09E-07
-4.12E-07
-4.07E-07
-4.23E-07
-3.93E-07
-3.39E-07
-3.34E-07
-3.16E-07
8.88E-09
-2.92E-07
-3.41E-07
-3.31E-07
7.89E-09
-3.09E-07
-3.53E-07
-3.42E-07
9.57E-09
-3.16E-07
-3.68E-07
-3.59E-07
6.93E-09
-3.40E-07
-3.78E-07
-3.88E-07
6.86E-09
-3.69E-07
-4.07E-07
-3.18E-07
1.34E-08
-2.81E-07
-3.54E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.40E-07
1.75E-08
-2.92E-07
-3.88E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.55E-07
1.35E-08
-3.18E-07
-3.92E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.77E-07
1.14E-08
-3.45E-07
-4.08E-07
-8.50E-07
PASS
8.50E-07
PASS
-4.09E-07
1.08E-08
-3.79E-07
-4.38E-07
-9.00E-07
PASS
9.00E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
131
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
V OFFSET (V) @ +5V VCM=5V A
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.63. Plot of V OFFSET (V) @ +5V VCM=5V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
132
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.63. Raw data for V OFFSET (V) @ +5V VCM=5V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
V OFFSET (V) @ +5V VCM=5V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
2.46E-04
7.81E-05
4.39E-04
-1.41E-04
3.15E-05
1.36E-04
3.22E-04
4.04E-04
6.30E-05
2.14E-04
3.16E-04
2.54E-04
Total
20
2.22E-04
6.60E-05
4.18E-04
-1.42E-04
4.34E-06
1.19E-04
2.93E-04
3.77E-04
3.97E-05
1.86E-04
3.04E-04
2.50E-04
Dose (krad(Si))
50
100
2.27E-04 2.32E-04
7.31E-05 7.98E-05
4.27E-04 4.40E-04
-1.30E-04 -1.17E-04
6.99E-06 1.45E-05
1.20E-04 1.27E-04
2.92E-04 2.91E-04
3.63E-04 3.64E-04
3.23E-05 2.80E-05
1.82E-04 1.74E-04
3.08E-04 3.08E-04
2.50E-04 2.52E-04
200
2.40E-04
8.79E-05
4.46E-04
-9.98E-05
2.04E-05
1.38E-04
2.94E-04
3.66E-04
3.46E-05
1.68E-04
3.05E-04
2.50E-04
1.31E-04
2.21E-04
7.36E-04
-4.75E-04
1.14E-04
2.14E-04
7.02E-04
-4.74E-04
1.21E-04
2.14E-04
7.07E-04
-4.65E-04
1.30E-04
2.14E-04
7.17E-04
-4.57E-04
1.39E-04
2.11E-04
7.18E-04
-4.40E-04
2.28E-04
1.37E-04
6.05E-04
-1.49E-04
-8.00E-04
PASS
8.00E-04
PASS
2.03E-04
1.35E-04
5.72E-04
-1.66E-04
-9.50E-04
PASS
9.50E-04
PASS
1.98E-04
1.32E-04
5.60E-04
-1.64E-04
-9.50E-04
PASS
9.50E-04
PASS
1.97E-04
1.33E-04
5.61E-04
-1.68E-04
-9.50E-04
PASS
9.50E-04
PASS
2.00E-04
1.31E-04
5.59E-04
-1.59E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
133
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
V OFFSET (V) @ +5V VCM=5V B
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.64. Plot of V OFFSET (V) @ +5V VCM=5V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
134
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.64. Raw data for V OFFSET (V) @ +5V VCM=5V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
V OFFSET (V) @ +5V VCM=5V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
2.28E-04
4.99E-04
3.23E-04
7.24E-05
1.20E-04
7.87E-05
1.45E-05
5.07E-05
5.08E-05
2.96E-04
-1.76E-04
1.42E-04
Total
20
2.08E-04
4.75E-04
3.05E-04
4.88E-05
1.00E-04
5.44E-05
2.05E-06
2.56E-05
2.99E-05
2.67E-04
-1.81E-04
1.42E-04
Dose (krad(Si))
50
100
2.13E-04 2.20E-04
4.83E-04 4.92E-04
3.12E-04 3.18E-04
5.38E-05 5.42E-05
1.11E-04 1.15E-04
4.53E-05 3.40E-05
1.08E-06 9.29E-06
1.68E-05 5.67E-06
3.03E-05 2.23E-05
2.59E-04 2.54E-04
-1.79E-04 -1.78E-04
1.42E-04 1.43E-04
200
2.26E-04
5.00E-04
3.26E-04
6.29E-05
1.23E-04
2.44E-05
3.04E-05
4.82E-06
2.40E-05
2.37E-04
-1.81E-04
1.41E-04
2.48E-04
1.70E-04
7.15E-04
-2.18E-04
2.27E-04
1.70E-04
6.93E-04
-2.39E-04
2.35E-04
1.70E-04
7.02E-04
-2.33E-04
2.40E-04
1.73E-04
7.15E-04
-2.36E-04
2.48E-04
1.73E-04
7.22E-04
-2.27E-04
9.81E-05
1.13E-04
4.08E-04
-2.11E-04
-8.00E-04
PASS
8.00E-04
PASS
7.57E-05
1.08E-04
3.73E-04
-2.21E-04
-9.50E-04
PASS
9.50E-04
PASS
7.05E-05
1.07E-04
3.63E-04
-2.22E-04
-9.50E-04
PASS
9.50E-04
PASS
6.51E-05
1.06E-04
3.56E-04
-2.26E-04
-9.50E-04
PASS
9.50E-04
PASS
6.41E-05
9.70E-05
3.30E-04
-2.02E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
135
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I OFFSET (A) @ +5V VCM=5V A
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.65. Plot of I OFFSET (A) @ +5V VCM=5V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
136
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.65. Raw data for I OFFSET (A) @ +5V VCM=5V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I OFFSET (A) @ +5V VCM=5V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
6.61E-09
2.26E-09
9.94E-09
1.06E-09
-1.13E-08
6.73E-09
-2.75E-09
2.57E-09
-2.40E-11
1.37E-08
4.04E-10
1.98E-09
Total
20
6.59E-09
1.26E-09
9.45E-09
-9.34E-10
-1.41E-08
6.77E-09
-2.26E-09
1.56E-09
-6.84E-10
1.53E-08
2.45E-10
1.88E-09
Dose (krad(Si))
50
100
8.17E-09 8.58E-09
1.04E-09 2.95E-09
1.16E-08 1.23E-08
-1.11E-09 -3.45E-09
-1.11E-08 -7.18E-09
7.42E-09 5.99E-09
-1.05E-09 -1.28E-09
9.33E-10 2.48E-09
-1.19E-09 -4.83E-09
1.49E-08 1.38E-08
2.94E-10 2.79E-10
1.88E-09 1.75E-09
200
7.64E-09
3.92E-09
1.42E-08
-1.29E-09
-7.58E-09
9.36E-09
1.10E-09
1.08E-09
-8.28E-09
9.99E-09
1.62E-10
1.85E-09
1.72E-09
8.07E-09
2.39E-08
-2.04E-08
4.47E-10
9.14E-09
2.55E-08
-2.46E-08
1.72E-09
8.81E-09
2.59E-08
-2.24E-08
2.65E-09
8.11E-09
2.49E-08
-1.96E-08
3.38E-09
8.32E-09
2.62E-08
-1.94E-08
4.03E-09
6.41E-09
2.16E-08
-1.35E-08
-6.50E-08
PASS
6.50E-08
PASS
4.14E-09
7.11E-09
2.36E-08
-1.54E-08
-6.50E-08
PASS
6.50E-08
PASS
4.20E-09
6.92E-09
2.32E-08
-1.48E-08
-6.50E-08
PASS
6.50E-08
PASS
3.24E-09
7.17E-09
2.29E-08
-1.64E-08
-6.50E-08
PASS
6.50E-08
PASS
2.65E-09
7.47E-09
2.31E-08
-1.78E-08
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
137
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
I OFFSET (A) @ +5V VCM=5V B
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.66. Plot of I OFFSET (A) @ +5V VCM=5V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
138
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.66. Raw data for I OFFSET (A) @ +5V VCM=5V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I OFFSET (A) @ +5V VCM=5V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
1.72E-09
8.16E-10
-1.53E-09
8.56E-10
1.13E-08
1.54E-08
1.55E-10
2.23E-09
7.10E-09
1.74E-08
-6.40E-11
2.67E-08
Total
20
4.99E-09
6.53E-10
-2.84E-09
-1.28E-10
1.13E-08
1.49E-08
-8.40E-11
1.85E-09
5.14E-09
1.94E-08
-1.10E-10
2.95E-08
Dose (krad(Si))
50
100
6.93E-09 8.65E-09
-1.10E-11 8.41E-10
-3.11E-09 -4.27E-09
-9.43E-10 -2.05E-09
1.13E-08 8.42E-09
1.38E-08 1.50E-08
-5.80E-09 -2.47E-09
3.84E-10 1.64E-09
5.74E-09 5.00E-09
1.92E-08 2.04E-08
-7.70E-11 -1.55E-10
2.82E-08 2.80E-08
200
1.33E-08
7.42E-10
-4.79E-09
1.61E-09
1.23E-08
1.16E-08
-3.36E-09
3.27E-09
4.90E-09
2.11E-08
-1.00E-10
2.86E-08
2.63E-09
4.99E-09
1.63E-08
-1.10E-08
2.79E-09
5.52E-09
1.79E-08
-1.23E-08
2.83E-09
6.04E-09
1.94E-08
-1.37E-08
2.32E-09
5.96E-09
1.87E-08
-1.40E-08
4.62E-09
7.84E-09
2.61E-08
-1.69E-08
8.47E-09
7.73E-09
2.97E-08
-1.27E-08
-6.50E-08
PASS
6.50E-08
PASS
8.24E-09
8.49E-09
3.15E-08
-1.50E-08
-6.50E-08
PASS
6.50E-08
PASS
6.67E-09
1.01E-08
3.42E-08
-2.09E-08
-6.50E-08
PASS
6.50E-08
PASS
7.91E-09
9.51E-09
3.40E-08
-1.82E-08
-6.50E-08
PASS
6.50E-08
PASS
7.50E-09
9.28E-09
3.29E-08
-1.79E-08
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
139
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
I BIAS + (A) @ +5V VCM=5V A
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.67. Plot of I BIAS + (A) @ +5V VCM=5V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
140
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.67. Raw data for I BIAS + (A) @ +5V VCM=5V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I BIAS + (A) @ +5V VCM=5V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
4.08E-07
4.28E-07
4.24E-07
4.36E-07
4.11E-07
4.19E-07
4.28E-07
4.15E-07
4.56E-07
4.20E-07
4.25E-07
4.34E-07
Total
20
4.66E-07
4.82E-07
4.91E-07
4.96E-07
4.67E-07
4.92E-07
4.98E-07
4.95E-07
5.27E-07
4.96E-07
4.26E-07
4.37E-07
Dose (krad(Si))
50
100
5.34E-07 6.13E-07
5.54E-07 6.28E-07
5.67E-07 6.50E-07
5.63E-07 6.43E-07
5.33E-07 6.02E-07
5.73E-07 6.50E-07
5.77E-07 6.50E-07
5.79E-07 6.55E-07
6.06E-07 6.84E-07
5.79E-07 6.45E-07
4.27E-07 4.29E-07
4.38E-07 4.34E-07
4.21E-07
1.18E-08
4.54E-07
3.89E-07
4.80E-07
1.34E-08
5.17E-07
4.44E-07
5.50E-07
1.61E-08
5.94E-07
5.06E-07
6.27E-07
1.98E-08
6.82E-07
5.73E-07
7.27E-07
2.18E-08
7.86E-07
6.67E-07
4.28E-07
1.66E-08
4.73E-07
3.82E-07
-6.50E-07
PASS
6.50E-07
PASS
5.02E-07
1.46E-08
5.42E-07
4.62E-07
-7.50E-07
PASS
7.50E-07
PASS
5.83E-07
1.31E-08
6.19E-07
5.47E-07
-8.00E-07
PASS
8.00E-07
PASS
6.57E-07
1.58E-08
7.00E-07
6.13E-07
-8.50E-07
PASS
8.50E-07
PASS
7.45E-07
1.70E-08
7.91E-07
6.98E-07
-9.00E-07
PASS
9.00E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
141
200
7.07E-07
7.26E-07
7.52E-07
7.45E-07
7.03E-07
7.40E-07
7.39E-07
7.37E-07
7.75E-07
7.32E-07
4.27E-07
4.36E-07
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
I BIAS + (A) @ +5V VCM=5V B
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.68. Plot of I BIAS + (A) @ +5V VCM=5V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
142
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.68. Raw data for I BIAS + (A) @ +5V VCM=5V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I BIAS + (A) @ +5V VCM=5V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
4.05E-07
4.08E-07
4.15E-07
4.40E-07
4.17E-07
4.24E-07
4.35E-07
4.27E-07
4.59E-07
4.23E-07
4.25E-07
4.65E-07
Total
20
4.66E-07
4.64E-07
4.77E-07
5.01E-07
4.75E-07
4.95E-07
5.08E-07
5.04E-07
5.31E-07
4.97E-07
4.27E-07
4.69E-07
Dose (krad(Si))
50
100
5.32E-07 6.12E-07
5.37E-07 6.06E-07
5.56E-07 6.35E-07
5.70E-07 6.45E-07
5.38E-07 6.10E-07
5.76E-07 6.52E-07
5.83E-07 6.59E-07
5.87E-07 6.65E-07
6.10E-07 6.86E-07
5.77E-07 6.48E-07
4.27E-07 4.24E-07
4.70E-07 4.68E-07
4.17E-07
1.35E-08
4.54E-07
3.80E-07
4.77E-07
1.47E-08
5.17E-07
4.36E-07
5.46E-07
1.58E-08
5.90E-07
5.03E-07
6.22E-07
1.72E-08
6.69E-07
5.74E-07
7.22E-07
2.00E-08
7.77E-07
6.67E-07
4.34E-07
1.49E-08
4.74E-07
3.93E-07
-6.50E-07
PASS
6.50E-07
PASS
5.07E-07
1.45E-08
5.47E-07
4.67E-07
-7.50E-07
PASS
7.50E-07
PASS
5.87E-07
1.40E-08
6.25E-07
5.48E-07
-8.00E-07
PASS
8.00E-07
PASS
6.62E-07
1.50E-08
7.03E-07
6.21E-07
-8.50E-07
PASS
8.50E-07
PASS
7.49E-07
1.94E-08
8.02E-07
6.96E-07
-9.00E-07
PASS
9.00E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
143
200
7.09E-07
7.05E-07
7.39E-07
7.48E-07
7.08E-07
7.38E-07
7.43E-07
7.51E-07
7.82E-07
7.33E-07
4.26E-07
4.70E-07
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
I BIAS - (A) @ +5V VCM=5V A
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.69. Plot of I BIAS - (A) @ +5V VCM=5V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
144
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.69. Raw data for I BIAS - (A) @ +5V VCM=5V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I BIAS - (A) @ +5V VCM=5V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
4.01E-07
4.24E-07
4.16E-07
4.34E-07
4.21E-07
4.11E-07
4.30E-07
4.14E-07
4.54E-07
4.07E-07
4.24E-07
4.31E-07
Total
20
4.56E-07
4.81E-07
4.80E-07
4.93E-07
4.80E-07
4.84E-07
4.97E-07
4.92E-07
5.27E-07
4.78E-07
4.26E-07
4.35E-07
Dose (krad(Si))
50
100
5.26E-07 6.04E-07
5.51E-07 6.25E-07
5.55E-07 6.36E-07
5.64E-07 6.43E-07
5.44E-07 6.10E-07
5.66E-07 6.45E-07
5.77E-07 6.50E-07
5.75E-07 6.49E-07
6.07E-07 6.88E-07
5.63E-07 6.32E-07
4.28E-07 4.26E-07
4.35E-07 4.34E-07
4.19E-07
1.18E-08
4.51E-07
3.87E-07
4.78E-07
1.33E-08
5.14E-07
4.41E-07
5.48E-07
1.43E-08
5.87E-07
5.09E-07
6.24E-07
1.63E-08
6.68E-07
5.79E-07
7.22E-07
1.89E-08
7.74E-07
6.71E-07
4.23E-07
1.91E-08
4.76E-07
3.71E-07
-6.50E-07
PASS
6.50E-07
PASS
4.96E-07
1.93E-08
5.48E-07
4.43E-07
-7.50E-07
PASS
7.50E-07
PASS
5.78E-07
1.73E-08
6.25E-07
5.30E-07
-8.00E-07
PASS
8.00E-07
PASS
6.53E-07
2.10E-08
7.11E-07
5.95E-07
-8.50E-07
PASS
8.50E-07
PASS
7.41E-07
2.18E-08
8.00E-07
6.81E-07
-9.00E-07
PASS
9.00E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
145
200
7.01E-07
7.21E-07
7.37E-07
7.46E-07
7.08E-07
7.29E-07
7.37E-07
7.37E-07
7.78E-07
7.22E-07
4.27E-07
4.35E-07
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
I BIAS - (A) @ +5V VCM=5V B
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.70. Plot of I BIAS - (A) @ +5V VCM=5V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
146
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.70. Raw data for I BIAS - (A) @ +5V VCM=5V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
I BIAS - (A) @ +5V VCM=5V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
4.03E-07
4.08E-07
4.16E-07
4.36E-07
4.05E-07
4.07E-07
4.39E-07
4.24E-07
4.51E-07
4.05E-07
4.23E-07
4.38E-07
Total
20
4.58E-07
4.62E-07
4.81E-07
5.01E-07
4.62E-07
4.79E-07
5.05E-07
5.03E-07
5.24E-07
4.76E-07
4.27E-07
4.39E-07
Dose (krad(Si))
50
100
5.25E-07 6.02E-07
5.34E-07 6.07E-07
5.58E-07 6.39E-07
5.70E-07 6.44E-07
5.28E-07 5.96E-07
5.59E-07 6.36E-07
5.87E-07 6.59E-07
5.85E-07 6.62E-07
6.03E-07 6.80E-07
5.57E-07 6.27E-07
4.27E-07 4.25E-07
4.40E-07 4.40E-07
4.14E-07
1.34E-08
4.50E-07
3.77E-07
4.73E-07
1.80E-08
5.22E-07
4.23E-07
5.43E-07
1.98E-08
5.97E-07
4.89E-07
6.18E-07
2.22E-08
6.79E-07
5.57E-07
7.14E-07
2.61E-08
7.86E-07
6.43E-07
4.25E-07
1.99E-08
4.80E-07
3.71E-07
-6.50E-07
PASS
6.50E-07
PASS
4.98E-07
2.00E-08
5.52E-07
4.43E-07
-7.50E-07
PASS
7.50E-07
PASS
5.78E-07
1.99E-08
6.33E-07
5.24E-07
-8.00E-07
PASS
8.00E-07
PASS
6.53E-07
2.16E-08
7.12E-07
5.94E-07
-8.50E-07
PASS
8.50E-07
PASS
7.40E-07
2.32E-08
8.04E-07
6.77E-07
-9.00E-07
PASS
9.00E-07
PASS
An ISO 9001:2008 and DSCC Certified Company
147
200
6.94E-07
7.02E-07
7.41E-07
7.44E-07
6.91E-07
7.22E-07
7.45E-07
7.48E-07
7.73E-07
7.14E-07
4.27E-07
4.39E-07
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
+VOUT (V) IL=0MA @ +5V A
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.71. Plot of +VOUT (V) IL=0MA @ +5V A versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
148
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.71. Raw data for +VOUT (V) IL=0MA @ +5V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+VOUT (V) IL=0MA @ +5V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
1.87E-03
1.79E-03
1.99E-03
2.07E-03
1.92E-03
2.01E-03
1.82E-03
1.89E-03
2.02E-03
2.04E-03
1.89E-03
2.06E-03
Total
20
2.04E-03
2.03E-03
1.99E-03
2.21E-03
1.82E-03
2.11E-03
2.08E-03
2.08E-03
1.98E-03
2.03E-03
1.94E-03
1.93E-03
Dose (krad(Si))
50
100
2.11E-03 2.36E-03
2.08E-03 2.41E-03
2.11E-03 2.36E-03
2.03E-03 2.30E-03
1.91E-03 2.33E-03
2.26E-03 2.57E-03
2.25E-03 2.40E-03
2.09E-03 2.52E-03
2.04E-03 2.58E-03
2.26E-03 2.50E-03
1.91E-03 2.04E-03
2.06E-03 2.13E-03
200
2.43E-03
2.52E-03
2.45E-03
2.64E-03
2.44E-03
2.81E-03
2.69E-03
2.71E-03
2.84E-03
2.91E-03
1.97E-03
1.92E-03
1.93E-03
1.08E-04
2.22E-03
1.63E-03
2.02E-03
1.39E-04
2.40E-03
1.64E-03
2.05E-03
8.38E-05
2.28E-03
1.82E-03
2.35E-03
4.09E-05
2.46E-03
2.24E-03
2.50E-03
8.79E-05
2.74E-03
2.25E-03
1.96E-03
9.61E-05
2.22E-03
1.69E-03
1.00E-02
PASS
2.06E-03
5.13E-05
2.20E-03
1.92E-03
2.00E-02
PASS
2.18E-03
1.07E-04
2.47E-03
1.89E-03
2.00E-02
PASS
2.51E-03
7.20E-05
2.71E-03
2.32E-03
2.00E-02
PASS
2.79E-03
9.18E-05
3.04E-03
2.54E-03
2.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
149
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
+VOUT (V) IL=0MA @ +5V B
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.72. Plot of +VOUT (V) IL=0MA @ +5V B versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
150
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.72. Raw data for +VOUT (V) IL=0MA @ +5V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+VOUT (V) IL=0MA @ +5V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
2.01E-03
1.99E-03
2.04E-03
1.99E-03
2.02E-03
2.19E-03
2.06E-03
1.91E-03
1.89E-03
1.96E-03
2.01E-03
1.94E-03
Total
20
2.01E-03
1.93E-03
2.03E-03
2.18E-03
2.01E-03
2.08E-03
1.86E-03
2.08E-03
1.96E-03
2.04E-03
1.93E-03
1.93E-03
Dose (krad(Si))
50
100
2.03E-03 2.36E-03
2.06E-03 2.25E-03
2.14E-03 2.41E-03
2.21E-03 2.33E-03
2.08E-03 2.40E-03
2.25E-03 2.57E-03
2.16E-03 2.45E-03
2.18E-03 2.43E-03
2.35E-03 2.55E-03
2.21E-03 2.58E-03
1.93E-03 2.09E-03
2.01E-03 2.15E-03
200
2.58E-03
2.34E-03
2.56E-03
2.64E-03
2.35E-03
2.84E-03
2.71E-03
2.86E-03
3.04E-03
2.93E-03
1.95E-03
1.93E-03
2.01E-03
2.12E-05
2.07E-03
1.95E-03
2.03E-03
9.12E-05
2.28E-03
1.78E-03
2.10E-03
7.16E-05
2.30E-03
1.91E-03
2.35E-03
6.44E-05
2.53E-03
2.17E-03
2.49E-03
1.39E-04
2.88E-03
2.11E-03
2.00E-03
1.24E-04
2.34E-03
1.66E-03
1.00E-02
PASS
2.00E-03
9.42E-05
2.26E-03
1.75E-03
2.00E-02
PASS
2.23E-03
7.52E-05
2.44E-03
2.02E-03
2.00E-02
PASS
2.52E-03
7.06E-05
2.71E-03
2.32E-03
2.00E-02
PASS
2.88E-03
1.21E-04
3.21E-03
2.54E-03
2.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
151
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
1.60E-01
+VOUT (V) IL=1MA @ +5V A
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.73. Plot of +VOUT (V) IL=1MA @ +5V A versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
152
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.73. Raw data for +VOUT (V) IL=1MA @ +5V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+VOUT (V) IL=1MA @ +5V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
6.89E-02
6.83E-02
6.88E-02
6.75E-02
6.78E-02
6.92E-02
6.65E-02
6.90E-02
6.71E-02
6.89E-02
6.88E-02
6.67E-02
Total
20
7.07E-02
6.95E-02
7.04E-02
6.91E-02
6.92E-02
6.96E-02
6.63E-02
6.93E-02
6.74E-02
6.92E-02
6.80E-02
6.61E-02
Dose (krad(Si))
50
100
7.18E-02 7.28E-02
7.09E-02 7.24E-02
7.19E-02 7.30E-02
7.07E-02 7.16E-02
7.06E-02 7.15E-02
7.08E-02 7.20E-02
6.77E-02 6.87E-02
7.09E-02 7.18E-02
6.82E-02 6.95E-02
7.01E-02 7.15E-02
6.82E-02 6.85E-02
6.64E-02 6.63E-02
200
7.33E-02
7.24E-02
7.31E-02
7.21E-02
7.17E-02
7.33E-02
7.04E-02
7.34E-02
7.11E-02
7.33E-02
6.78E-02
6.63E-02
6.82E-02
6.03E-04
6.99E-02
6.66E-02
6.98E-02
7.15E-04
7.17E-02
6.78E-02
7.12E-02
6.24E-04
7.29E-02
6.95E-02
7.22E-02
6.69E-04
7.41E-02
7.04E-02
7.25E-02
6.66E-04
7.43E-02
7.07E-02
6.81E-02
1.23E-03
7.15E-02
6.47E-02
1.50E-01
PASS
6.83E-02
1.44E-03
7.23E-02
6.44E-02
1.50E-01
PASS
6.95E-02
1.49E-03
7.36E-02
6.55E-02
1.50E-01
PASS
7.07E-02
1.51E-03
7.48E-02
6.66E-02
1.50E-01
PASS
7.23E-02
1.41E-03
7.61E-02
6.84E-02
1.50E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
153
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
1.60E-01
+VOUT (V) IL=1MA @ +5V B
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.74. Plot of +VOUT (V) IL=1MA @ +5V B versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
154
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.74. Raw data for +VOUT (V) IL=1MA @ +5V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+VOUT (V) IL=1MA @ +5V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
6.87E-02
6.85E-02
6.86E-02
6.80E-02
6.79E-02
6.87E-02
6.63E-02
6.90E-02
6.70E-02
6.89E-02
6.85E-02
6.67E-02
Total
20
7.05E-02
6.99E-02
7.06E-02
6.95E-02
6.91E-02
6.90E-02
6.66E-02
6.94E-02
6.70E-02
6.91E-02
6.78E-02
6.58E-02
Dose (krad(Si))
50
100
7.18E-02 7.28E-02
7.11E-02 7.24E-02
7.21E-02 7.33E-02
7.11E-02 7.22E-02
7.06E-02 7.18E-02
7.01E-02 7.16E-02
6.76E-02 6.89E-02
7.07E-02 7.17E-02
6.83E-02 6.95E-02
7.05E-02 7.16E-02
6.79E-02 6.80E-02
6.61E-02 6.61E-02
200
7.33E-02
7.26E-02
7.34E-02
7.27E-02
7.20E-02
7.31E-02
7.02E-02
7.33E-02
7.11E-02
7.32E-02
6.80E-02
6.60E-02
6.83E-02
3.69E-04
6.94E-02
6.73E-02
6.99E-02
6.68E-04
7.17E-02
6.81E-02
7.14E-02
5.96E-04
7.30E-02
6.97E-02
7.25E-02
5.64E-04
7.40E-02
7.09E-02
7.28E-02
5.76E-04
7.44E-02
7.12E-02
6.80E-02
1.28E-03
7.15E-02
6.45E-02
1.50E-01
PASS
6.82E-02
1.33E-03
7.19E-02
6.46E-02
1.50E-01
PASS
6.94E-02
1.38E-03
7.32E-02
6.56E-02
1.50E-01
PASS
7.07E-02
1.33E-03
7.43E-02
6.70E-02
1.50E-01
PASS
7.22E-02
1.43E-03
7.61E-02
6.82E-02
1.50E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
155
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
+VOUT (V) IL=2.5MA @ +5V A
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.75. Plot of +VOUT (V) IL=2.5MA @ +5V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
156
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.75. Raw data for +VOUT (V) IL=2.5MA @ +5V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+VOUT (V) IL=2.5MA @ +5V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
1.25E-01
1.23E-01
1.24E-01
1.23E-01
1.23E-01
1.25E-01
1.20E-01
1.25E-01
1.22E-01
1.24E-01
1.24E-01
1.21E-01
Total
20
1.26E-01
1.24E-01
1.26E-01
1.24E-01
1.24E-01
1.24E-01
1.20E-01
1.25E-01
1.21E-01
1.24E-01
1.22E-01
1.20E-01
Dose (krad(Si))
50
100
1.28E-01 1.29E-01
1.26E-01 1.28E-01
1.27E-01 1.29E-01
1.25E-01 1.27E-01
1.25E-01 1.27E-01
1.26E-01 1.28E-01
1.21E-01 1.23E-01
1.26E-01 1.28E-01
1.23E-01 1.24E-01
1.26E-01 1.27E-01
1.23E-01 1.23E-01
1.20E-01 1.20E-01
200
1.29E-01
1.28E-01
1.29E-01
1.28E-01
1.27E-01
1.29E-01
1.25E-01
1.29E-01
1.26E-01
1.29E-01
1.22E-01
1.20E-01
1.23E-01
9.56E-04
1.26E-01
1.21E-01
1.25E-01
9.89E-04
1.27E-01
1.22E-01
1.26E-01
1.11E-03
1.29E-01
1.23E-01
1.28E-01
1.05E-03
1.31E-01
1.25E-01
1.28E-01
1.03E-03
1.31E-01
1.25E-01
1.23E-01
1.96E-03
1.29E-01
1.18E-01
2.50E-01
PASS
1.23E-01
2.05E-03
1.28E-01
1.17E-01
2.50E-01
PASS
1.24E-01
2.19E-03
1.30E-01
1.18E-01
2.50E-01
PASS
1.26E-01
2.14E-03
1.32E-01
1.20E-01
2.50E-01
PASS
1.28E-01
2.17E-03
1.34E-01
1.22E-01
2.50E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
157
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
+VOUT (V) IL=2.5MA @ +5V B
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.76. Plot of +VOUT (V) IL=2.5MA @ +5V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
158
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.76. Raw data for +VOUT (V) IL=2.5MA @ +5V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
+VOUT (V) IL=2.5MA @ +5V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
1.25E-01
1.23E-01
1.24E-01
1.23E-01
1.23E-01
1.25E-01
1.21E-01
1.25E-01
1.22E-01
1.24E-01
1.24E-01
1.21E-01
Total
20
1.26E-01
1.25E-01
1.26E-01
1.24E-01
1.23E-01
1.24E-01
1.20E-01
1.24E-01
1.21E-01
1.24E-01
1.22E-01
1.20E-01
Dose (krad(Si))
50
100
1.27E-01 1.29E-01
1.26E-01 1.28E-01
1.27E-01 1.29E-01
1.26E-01 1.27E-01
1.25E-01 1.27E-01
1.26E-01 1.28E-01
1.22E-01 1.23E-01
1.26E-01 1.27E-01
1.23E-01 1.24E-01
1.26E-01 1.27E-01
1.22E-01 1.22E-01
1.20E-01 1.20E-01
200
1.29E-01
1.28E-01
1.29E-01
1.28E-01
1.27E-01
1.29E-01
1.25E-01
1.29E-01
1.26E-01
1.29E-01
1.22E-01
1.20E-01
1.24E-01
8.58E-04
1.26E-01
1.21E-01
1.25E-01
9.89E-04
1.27E-01
1.22E-01
1.26E-01
8.93E-04
1.29E-01
1.24E-01
1.28E-01
9.34E-04
1.31E-01
1.25E-01
1.28E-01
9.37E-04
1.31E-01
1.26E-01
1.23E-01
1.83E-03
1.28E-01
1.18E-01
2.50E-01
PASS
1.23E-01
1.93E-03
1.28E-01
1.17E-01
2.50E-01
PASS
1.24E-01
2.03E-03
1.30E-01
1.19E-01
2.50E-01
PASS
1.26E-01
2.01E-03
1.31E-01
1.20E-01
2.50E-01
PASS
1.28E-01
2.09E-03
1.33E-01
1.22E-01
2.50E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
159
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
7.00E-02
-VOUT (V) IL=0MA @ +5V A
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.77. Plot of -VOUT (V) IL=0MA @ +5V A versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
160
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.77. Raw data for -VOUT (V) IL=0MA @ +5V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-VOUT (V) IL=0MA @ +5V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
1.51E-02
1.48E-02
1.48E-02
1.50E-02
1.53E-02
1.49E-02
1.51E-02
1.50E-02
1.50E-02
1.52E-02
1.49E-02
1.50E-02
Total
20
1.53E-02
1.50E-02
1.49E-02
1.50E-02
1.53E-02
1.48E-02
1.52E-02
1.50E-02
1.49E-02
1.50E-02
1.47E-02
1.47E-02
Dose (krad(Si))
50
100
1.56E-02 1.53E-02
1.54E-02 1.53E-02
1.51E-02 1.53E-02
1.55E-02 1.55E-02
1.56E-02 1.56E-02
1.54E-02 1.59E-02
1.55E-02 1.61E-02
1.56E-02 1.61E-02
1.54E-02 1.59E-02
1.56E-02 1.60E-02
1.46E-02 1.46E-02
1.48E-02 1.50E-02
200
1.65E-02
1.60E-02
1.62E-02
1.63E-02
1.63E-02
1.64E-02
1.67E-02
1.67E-02
1.63E-02
1.68E-02
1.45E-02
1.49E-02
1.50E-02
2.18E-04
1.56E-02
1.44E-02
1.51E-02
1.79E-04
1.56E-02
1.46E-02
1.54E-02
1.86E-04
1.59E-02
1.49E-02
1.54E-02
1.32E-04
1.57E-02
1.50E-02
1.63E-02
1.85E-04
1.68E-02
1.58E-02
1.50E-02
1.07E-04
1.53E-02
1.47E-02
3.00E-02
PASS
1.50E-02
1.30E-04
1.53E-02
1.46E-02
6.00E-02
PASS
1.55E-02
9.31E-05
1.57E-02
1.52E-02
6.00E-02
PASS
1.60E-02
1.04E-04
1.63E-02
1.57E-02
6.00E-02
PASS
1.66E-02
2.01E-04
1.71E-02
1.60E-02
6.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
161
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
7.00E-02
-VOUT (V) IL=0MA @ +5V B
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.78. Plot of -VOUT (V) IL=0MA @ +5V B versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
162
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.78. Raw data for -VOUT (V) IL=0MA @ +5V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-VOUT (V) IL=0MA @ +5V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
1.54E-02
1.55E-02
1.51E-02
1.53E-02
1.57E-02
1.52E-02
1.57E-02
1.50E-02
1.54E-02
1.53E-02
1.55E-02
1.55E-02
Total
20
1.56E-02
1.56E-02
1.53E-02
1.54E-02
1.57E-02
1.52E-02
1.56E-02
1.52E-02
1.52E-02
1.54E-02
1.50E-02
1.50E-02
Dose (krad(Si))
50
100
1.60E-02 1.56E-02
1.59E-02 1.57E-02
1.57E-02 1.55E-02
1.58E-02 1.58E-02
1.60E-02 1.59E-02
1.56E-02 1.60E-02
1.61E-02 1.66E-02
1.55E-02 1.62E-02
1.56E-02 1.63E-02
1.59E-02 1.63E-02
1.50E-02 1.51E-02
1.52E-02 1.53E-02
200
1.67E-02
1.67E-02
1.65E-02
1.67E-02
1.66E-02
1.68E-02
1.72E-02
1.68E-02
1.69E-02
1.71E-02
1.50E-02
1.52E-02
1.54E-02
2.42E-04
1.61E-02
1.47E-02
1.55E-02
1.80E-04
1.60E-02
1.50E-02
1.58E-02
1.29E-04
1.62E-02
1.55E-02
1.57E-02
1.68E-04
1.62E-02
1.52E-02
1.66E-02
1.01E-04
1.69E-02
1.63E-02
1.53E-02
2.70E-04
1.61E-02
1.46E-02
3.00E-02
PASS
1.53E-02
1.73E-04
1.58E-02
1.48E-02
6.00E-02
PASS
1.57E-02
2.54E-04
1.64E-02
1.50E-02
6.00E-02
PASS
1.63E-02
2.14E-04
1.69E-02
1.57E-02
6.00E-02
PASS
1.70E-02
1.75E-04
1.74E-02
1.65E-02
6.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
163
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
1.20E-01
-VOUT (V) IL=1MA @ +5V A
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.79. Plot of -VOUT (V) IL=1MA @ +5V A versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
164
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.79. Raw data for -VOUT (V) IL=1MA @ +5V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-VOUT (V) IL=1MA @ +5V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
3.47E-02
3.43E-02
3.42E-02
3.44E-02
3.50E-02
3.46E-02
3.46E-02
3.45E-02
3.42E-02
3.47E-02
3.43E-02
3.44E-02
Total
20
3.50E-02
3.45E-02
3.44E-02
3.47E-02
3.51E-02
3.44E-02
3.44E-02
3.45E-02
3.41E-02
3.46E-02
3.38E-02
3.41E-02
Dose (krad(Si))
50
100
3.55E-02 3.55E-02
3.50E-02 3.53E-02
3.51E-02 3.52E-02
3.52E-02 3.53E-02
3.55E-02 3.57E-02
3.49E-02 3.55E-02
3.49E-02 3.56E-02
3.52E-02 3.56E-02
3.47E-02 3.51E-02
3.50E-02 3.57E-02
3.39E-02 3.38E-02
3.43E-02 3.42E-02
200
3.68E-02
3.60E-02
3.63E-02
3.62E-02
3.65E-02
3.62E-02
3.63E-02
3.63E-02
3.59E-02
3.66E-02
3.38E-02
3.41E-02
3.45E-02
3.31E-04
3.54E-02
3.36E-02
3.47E-02
2.93E-04
3.55E-02
3.39E-02
3.52E-02
2.34E-04
3.59E-02
3.46E-02
3.54E-02
2.06E-04
3.60E-02
3.48E-02
3.64E-02
2.95E-04
3.72E-02
3.56E-02
3.45E-02
1.78E-04
3.50E-02
3.40E-02
1.00E-01
PASS
3.44E-02
1.98E-04
3.50E-02
3.39E-02
1.00E-01
PASS
3.50E-02
1.81E-04
3.55E-02
3.45E-02
1.00E-01
PASS
3.55E-02
2.35E-04
3.61E-02
3.49E-02
1.00E-01
PASS
3.63E-02
2.78E-04
3.70E-02
3.55E-02
1.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
165
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
1.20E-01
-VOUT (V) IL=1MA @ +5V B
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.80. Plot of -VOUT (V) IL=1MA @ +5V B versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
166
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.80. Raw data for -VOUT (V) IL=1MA @ +5V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-VOUT (V) IL=1MA @ +5V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
3.53E-02
3.50E-02
3.48E-02
3.49E-02
3.51E-02
3.49E-02
3.51E-02
3.48E-02
3.45E-02
3.52E-02
3.48E-02
3.49E-02
Total
20
3.54E-02
3.51E-02
3.51E-02
3.49E-02
3.52E-02
3.47E-02
3.50E-02
3.47E-02
3.43E-02
3.51E-02
3.43E-02
3.46E-02
Dose (krad(Si))
50
100
3.58E-02 3.59E-02
3.58E-02 3.58E-02
3.54E-02 3.55E-02
3.55E-02 3.59E-02
3.58E-02 3.59E-02
3.54E-02 3.60E-02
3.55E-02 3.63E-02
3.52E-02 3.60E-02
3.49E-02 3.56E-02
3.57E-02 3.63E-02
3.46E-02 3.45E-02
3.48E-02 3.49E-02
200
3.69E-02
3.70E-02
3.69E-02
3.67E-02
3.68E-02
3.67E-02
3.68E-02
3.67E-02
3.63E-02
3.71E-02
3.44E-02
3.44E-02
3.50E-02
1.90E-04
3.55E-02
3.45E-02
3.51E-02
1.66E-04
3.56E-02
3.47E-02
3.57E-02
2.02E-04
3.62E-02
3.51E-02
3.58E-02
1.70E-04
3.63E-02
3.53E-02
3.69E-02
1.07E-04
3.71E-02
3.66E-02
3.49E-02
2.90E-04
3.57E-02
3.41E-02
1.00E-01
PASS
3.48E-02
2.95E-04
3.56E-02
3.40E-02
1.00E-01
PASS
3.53E-02
3.05E-04
3.62E-02
3.45E-02
1.00E-01
PASS
3.60E-02
3.08E-04
3.69E-02
3.52E-02
1.00E-01
PASS
3.67E-02
2.97E-04
3.75E-02
3.59E-02
1.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
167
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
-VOUT (V) IL=2.5MA @ +5V A
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.81. Plot of -VOUT (V) IL=2.5MA @ +5V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
168
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.81. Raw data for -VOUT (V) IL=2.5MA @ +5V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-VOUT (V) IL=2.5MA @ +5V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
7.52E-02
7.46E-02
7.44E-02
7.47E-02
7.55E-02
7.48E-02
7.45E-02
7.47E-02
7.43E-02
7.50E-02
7.41E-02
7.48E-02
Total
20
7.51E-02
7.46E-02
7.43E-02
7.47E-02
7.51E-02
7.43E-02
7.39E-02
7.44E-02
7.36E-02
7.44E-02
7.33E-02
7.39E-02
Dose (krad(Si))
50
100
7.58E-02 7.62E-02
7.50E-02 7.56E-02
7.51E-02 7.57E-02
7.56E-02 7.58E-02
7.60E-02 7.64E-02
7.51E-02 7.58E-02
7.46E-02 7.55E-02
7.50E-02 7.58E-02
7.43E-02 7.49E-02
7.52E-02 7.59E-02
7.35E-02 7.35E-02
7.41E-02 7.42E-02
200
7.75E-02
7.63E-02
7.66E-02
7.66E-02
7.72E-02
7.65E-02
7.59E-02
7.66E-02
7.58E-02
7.67E-02
7.32E-02
7.38E-02
7.49E-02
4.48E-04
7.61E-02
7.37E-02
7.48E-02
3.39E-04
7.57E-02
7.38E-02
7.55E-02
4.19E-04
7.67E-02
7.43E-02
7.59E-02
3.53E-04
7.69E-02
7.50E-02
7.69E-02
5.07E-04
7.82E-02
7.55E-02
7.47E-02
2.81E-04
7.54E-02
7.39E-02
2.00E-01
PASS
7.41E-02
3.61E-04
7.51E-02
7.31E-02
2.00E-01
PASS
7.48E-02
3.60E-04
7.58E-02
7.38E-02
2.00E-01
PASS
7.56E-02
3.96E-04
7.67E-02
7.45E-02
2.00E-01
PASS
7.63E-02
4.29E-04
7.75E-02
7.51E-02
2.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
169
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
-VOUT (V) IL=2.5MA @ +5V B
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.82. Plot of -VOUT (V) IL=2.5MA @ +5V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
170
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.82. Raw data for -VOUT (V) IL=2.5MA @ +5V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
-VOUT (V) IL=2.5MA @ +5V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
7.61E-02
7.55E-02
7.53E-02
7.54E-02
7.59E-02
7.56E-02
7.54E-02
7.53E-02
7.47E-02
7.58E-02
7.52E-02
7.55E-02
Total
20
7.59E-02
7.56E-02
7.52E-02
7.53E-02
7.57E-02
7.51E-02
7.49E-02
7.50E-02
7.40E-02
7.54E-02
7.41E-02
7.46E-02
Dose (krad(Si))
50
100
7.67E-02 7.69E-02
7.62E-02 7.66E-02
7.60E-02 7.65E-02
7.61E-02 7.64E-02
7.64E-02 7.66E-02
7.60E-02 7.65E-02
7.56E-02 7.64E-02
7.57E-02 7.65E-02
7.50E-02 7.54E-02
7.60E-02 7.68E-02
7.45E-02 7.45E-02
7.51E-02 7.49E-02
200
7.81E-02
7.77E-02
7.76E-02
7.77E-02
7.74E-02
7.72E-02
7.68E-02
7.70E-02
7.63E-02
7.76E-02
7.43E-02
7.45E-02
7.57E-02
3.56E-04
7.66E-02
7.47E-02
7.55E-02
2.73E-04
7.63E-02
7.48E-02
7.63E-02
2.77E-04
7.70E-02
7.55E-02
7.66E-02
1.73E-04
7.71E-02
7.61E-02
7.77E-02
2.69E-04
7.84E-02
7.70E-02
7.54E-02
4.27E-04
7.65E-02
7.42E-02
2.00E-01
PASS
7.49E-02
5.20E-04
7.63E-02
7.35E-02
2.00E-01
PASS
7.57E-02
3.97E-04
7.68E-02
7.46E-02
2.00E-01
PASS
7.63E-02
5.42E-04
7.78E-02
7.49E-02
2.00E-01
PASS
7.70E-02
4.98E-04
7.83E-02
7.56E-02
2.00E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
171
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
AVOL (V/mV) RL=10K VO=75MV TO 4.8V A
6.00E+04
4.00E+04
2.00E+04
0.00E+00
-2.00E+04
-4.00E+04
-6.00E+04
-8.00E+04
-1.00E+05
-1.20E+05
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.83. Plot of AVOL (V/mV) RL=10K VO=75MV TO 4.8V A versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
172
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.83. Raw data for AVOL (V/mV) RL=10K VO=75MV TO 4.8V A versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
AVOL (V/mV) RL=10K VO=75MV TO 4.8V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
2.87E+03
2.42E+03
2.21E+04
2.00E+03
7.62E+03
2.20E+04
4.72E+03
5.23E+03
4.76E+03
7.63E+03
4.89E+03
3.00E+03
Total
20
2.71E+03
4.77E+03
1.31E+04
2.70E+03
1.88E+04
1.26E+04
3.91E+03
5.45E+04
7.49E+03
1.28E+05
2.76E+04
3.43E+03
Dose (krad(Si))
50
100
2.37E+03 3.82E+03
5.23E+03 4.82E+03
2.22E+04 7.09E+03
2.12E+03 4.73E+03
1.12E+04 1.34E+04
3.92E+04 6.60E+03
3.38E+03 5.75E+03
4.17E+04 1.06E+04
4.08E+03 2.51E+03
3.70E+04 3.21E+04
1.31E+04 1.06E+04
3.33E+03 3.33E+03
200
3.48E+03
5.22E+03
9.59E+03
2.57E+03
1.05E+04
1.45E+04
2.23E+03
3.08E+03
5.66E+03
5.67E+03
1.06E+04
3.41E+03
7.40E+03
8.52E+03
3.08E+04
-1.60E+04
8.41E+03
7.22E+03
2.82E+04
-1.14E+04
8.62E+03
8.44E+03
3.18E+04
-1.45E+04
6.77E+03
3.88E+03
1.74E+04
-3.88E+03
6.28E+03
3.59E+03
1.61E+04
-3.58E+03
8.87E+03
7.44E+03
2.93E+04
-1.15E+04
6.00E+02
PASS
4.13E+04
5.25E+04
1.85E+05
-1.03E+05
3.00E+02
PASS
2.51E+04
1.96E+04
7.87E+04
-2.86E+04
3.00E+02
PASS
1.15E+04
1.18E+04
4.40E+04
-2.10E+04
3.00E+02
PASS
6.22E+03
4.85E+03
1.95E+04
-7.09E+03
3.00E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
173
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
AVOL (V/mV) RL=10K VO=75MV TO 4.8V B
1.00E+04
8.00E+03
6.00E+03
4.00E+03
2.00E+03
0.00E+00
-2.00E+03
-4.00E+03
-6.00E+03
-8.00E+03
-1.00E+04
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.84. Plot of AVOL (V/mV) RL=10K VO=75MV TO 4.8V B versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
174
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.84. Raw data for AVOL (V/mV) RL=10K VO=75MV TO 4.8V B versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
AVOL (V/mV) RL=10K VO=75MV TO 4.8V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
4.40E+03
2.97E+03
3.61E+03
1.10E+04
3.95E+03
5.13E+03
4.01E+03
4.27E+03
4.36E+03
4.12E+03
3.71E+03
3.59E+03
Total
20
3.47E+03
3.09E+03
4.54E+03
1.08E+04
2.73E+03
2.98E+03
2.69E+03
4.11E+03
4.12E+03
3.61E+03
1.99E+03
4.21E+03
Dose (krad(Si))
50
100
4.57E+03 2.90E+03
1.81E+03 2.55E+03
3.97E+03 3.16E+03
2.16E+03 5.07E+03
3.10E+03 4.41E+03
8.16E+03 3.49E+03
3.75E+03 1.77E+04
3.43E+03 6.37E+03
2.31E+03 4.00E+03
3.61E+03 8.72E+03
3.38E+03 1.60E+05
3.54E+03 3.83E+03
200
3.38E+03
2.27E+03
2.68E+03
2.74E+03
3.35E+03
2.98E+03
1.60E+03
1.56E+03
3.26E+03
3.15E+03
3.66E+03
3.38E+03
5.18E+03
3.29E+03
1.42E+04
-3.83E+03
4.93E+03
3.36E+03
1.41E+04
-4.28E+03
3.12E+03
1.17E+03
6.33E+03
-8.82E+01
3.61E+03
1.07E+03
6.56E+03
6.73E+02
2.88E+03
4.75E+02
4.18E+03
1.58E+03
4.38E+03
4.44E+02
5.59E+03
3.16E+03
6.00E+02
PASS
3.50E+03
6.49E+02
5.28E+03
1.72E+03
3.00E+02
PASS
4.25E+03
2.26E+03
1.04E+04
-1.94E+03
3.00E+02
PASS
8.05E+03
5.77E+03
2.39E+04
-7.77E+03
3.00E+02
PASS
2.51E+03
8.56E+02
4.86E+03
1.61E+02
3.00E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
175
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
CMRR (dB) @ +5V VCM=0 TO +5V A
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.85. Plot of CMRR (dB) @ +5V VCM=0 TO +5V A versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
176
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.85. Raw data for CMRR (dB) @ +5V VCM=0 TO +5V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
CMRR (dB) @ +5V VCM=0 TO +5V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
8.06E+01
8.70E+01
9.43E+01
8.75E+01
1.00E+02
9.30E+01
9.54E+01
9.19E+01
1.02E+02
8.74E+01
8.41E+01
9.42E+01
Total
20
8.08E+01
8.70E+01
9.37E+01
8.72E+01
1.01E+02
9.46E+01
9.45E+01
9.13E+01
1.04E+02
8.72E+01
8.40E+01
9.39E+01
Dose (krad(Si))
50
100
8.08E+01 8.07E+01
8.69E+01 8.67E+01
9.33E+01 9.28E+01
8.71E+01 8.72E+01
1.02E+02 1.04E+02
9.61E+01 9.75E+01
9.39E+01 9.32E+01
9.08E+01 9.05E+01
1.06E+02 1.06E+02
8.69E+01 8.67E+01
8.40E+01 8.40E+01
9.40E+01 9.41E+01
200
8.07E+01
8.64E+01
9.19E+01
8.71E+01
1.07E+02
1.02E+02
9.25E+01
9.06E+01
1.07E+02
8.65E+01
8.40E+01
9.39E+01
8.99E+01
7.49E+00
1.10E+02
6.94E+01
8.98E+01
7.54E+00
1.11E+02
6.92E+01
9.00E+01
8.04E+00
1.12E+02
6.80E+01
9.03E+01
8.78E+00
1.14E+02
6.62E+01
9.07E+01
1.01E+01
1.18E+02
6.29E+01
9.39E+01
5.31E+00
1.09E+02
7.94E+01
7.60E+01
PASS
9.43E+01
6.22E+00
1.11E+02
7.73E+01
7.00E+01
PASS
9.48E+01
7.26E+00
1.15E+02
7.49E+01
7.00E+01
PASS
9.49E+01
7.57E+00
1.16E+02
7.41E+01
7.00E+01
PASS
9.57E+01
8.51E+00
1.19E+02
7.24E+01
7.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
177
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
1.00E+02
CMRR (dB) @ +5V VCM=0 TO +5V B
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
2.00E+01
1.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.86. Plot of CMRR (dB) @ +5V VCM=0 TO +5V B versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
178
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.86. Raw data for CMRR (dB) @ +5V VCM=0 TO +5V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
CMRR (dB) @ +5V VCM=0 TO +5V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
8.54E+01
9.51E+01
1.00E+02
8.66E+01
8.34E+01
8.35E+01
1.12E+02
8.44E+01
9.48E+01
1.02E+02
9.35E+01
1.09E+02
Total
20
8.54E+01
9.46E+01
9.80E+01
8.75E+01
8.33E+01
8.34E+01
1.06E+02
8.42E+01
9.42E+01
9.82E+01
9.39E+01
1.12E+02
Dose (krad(Si))
50
100
8.52E+01 8.51E+01
9.42E+01 9.36E+01
9.65E+01 9.57E+01
8.79E+01 8.83E+01
8.31E+01 8.30E+01
8.33E+01 8.32E+01
1.03E+02 1.01E+02
8.41E+01 8.40E+01
9.39E+01 9.36E+01
9.63E+01 9.47E+01
9.38E+01 9.38E+01
1.12E+02 1.11E+02
200
8.47E+01
9.28E+01
9.38E+01
8.92E+01
8.27E+01
8.33E+01
9.97E+01
8.40E+01
9.33E+01
9.26E+01
9.39E+01
1.13E+02
9.02E+01
7.26E+00
1.10E+02
7.03E+01
8.98E+01
6.28E+00
1.07E+02
7.25E+01
8.94E+01
5.76E+00
1.05E+02
7.36E+01
8.91E+01
5.42E+00
1.04E+02
7.43E+01
8.86E+01
4.84E+00
1.02E+02
7.54E+01
9.52E+01
1.19E+01
1.28E+02
6.26E+01
7.60E+01
PASS
9.31E+01
9.44E+00
1.19E+02
6.73E+01
7.00E+01
PASS
9.22E+01
8.56E+00
1.16E+02
6.87E+01
7.00E+01
PASS
9.14E+01
7.74E+00
1.13E+02
7.02E+01
7.00E+01
PASS
9.06E+01
6.90E+00
1.09E+02
7.17E+01
7.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
179
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
1.00E+02
9.00E+01
CMRR (dB) MATCHING
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
2.00E+01
1.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.87. Plot of CMRR (dB) MATCHING versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
180
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.87. Raw data for CMRR (dB) MATCHING versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
CMRR (dB) MATCHING
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
8.81E+01
9.14E+01
1.00E+02
8.11E+01
8.22E+01
8.10E+01
9.69E+01
8.91E+01
9.16E+01
8.93E+01
8.15E+01
9.28E+01
Total
20
8.85E+01
9.17E+01
1.02E+02
8.13E+01
8.22E+01
8.13E+01
9.73E+01
8.93E+01
9.18E+01
9.00E+01
8.16E+01
9.30E+01
Dose (krad(Si))
50
100
8.87E+01 8.88E+01
9.17E+01 9.19E+01
1.03E+02 1.04E+02
8.15E+01 8.17E+01
8.22E+01 8.22E+01
8.15E+01 8.16E+01
9.74E+01 9.74E+01
8.94E+01 8.96E+01
9.20E+01 9.18E+01
9.04E+01 9.11E+01
8.16E+01 8.16E+01
9.29E+01 9.29E+01
200
8.92E+01
9.20E+01
1.06E+02
8.21E+01
8.22E+01
8.23E+01
9.76E+01
8.95E+01
9.17E+01
9.24E+01
8.16E+01
9.29E+01
8.86E+01
7.73E+00
1.10E+02
6.74E+01
8.91E+01
8.28E+00
1.12E+02
6.63E+01
8.95E+01
8.92E+00
1.14E+02
6.50E+01
8.97E+01
8.99E+00
1.14E+02
6.50E+01
9.04E+01
9.97E+00
1.18E+02
6.31E+01
8.96E+01
5.73E+00
1.05E+02
7.39E+01
7.50E+01
PASS
8.99E+01
5.76E+00
1.06E+02
7.41E+01
7.00E+01
PASS
9.02E+01
5.74E+00
1.06E+02
7.44E+01
7.00E+01
PASS
9.03E+01
5.68E+00
1.06E+02
7.48E+01
7.00E+01
PASS
9.07E+01
5.54E+00
1.06E+02
7.55E+01
7.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
181
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
1.40E+02
PSRR (dB) @ +4.5V TO +12V A
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.88. Plot of PSRR (dB) @ +4.5V TO +12V A versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
182
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.88. Raw data for PSRR (dB) @ +4.5V TO +12V A versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
PSRR (dB) @ +4.5V TO +12V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.14E+02
1.22E+02
1.12E+02
1.12E+02
1.08E+02
1.23E+02
1.15E+02
1.16E+02
1.43E+02
1.16E+02
1.09E+02
1.41E+02
Total
20
1.15E+02
1.23E+02
1.12E+02
1.13E+02
1.08E+02
1.23E+02
1.15E+02
1.16E+02
1.37E+02
1.16E+02
1.09E+02
1.44E+02
Dose (krad(Si))
50
100
1.14E+02 1.14E+02
1.23E+02 1.20E+02
1.13E+02 1.11E+02
1.13E+02 1.13E+02
1.08E+02 1.08E+02
1.23E+02 1.21E+02
1.16E+02 1.15E+02
1.17E+02 1.18E+02
1.39E+02 1.48E+02
1.16E+02 1.16E+02
1.09E+02 1.09E+02
1.46E+02 1.42E+02
200
1.14E+02
1.22E+02
1.13E+02
1.13E+02
1.09E+02
1.21E+02
1.16E+02
1.17E+02
1.35E+02
1.17E+02
1.09E+02
1.39E+02
1.14E+02
5.07E+00
1.27E+02
9.97E+01
1.14E+02
5.52E+00
1.29E+02
9.91E+01
1.14E+02
5.36E+00
1.29E+02
9.95E+01
1.13E+02
4.45E+00
1.26E+02
1.01E+02
1.14E+02
4.99E+00
1.28E+02
1.00E+02
1.23E+02
1.18E+01
1.55E+02
9.02E+01
8.80E+01
PASS
1.22E+02
9.18E+00
1.47E+02
9.63E+01
8.80E+01
PASS
1.22E+02
9.95E+00
1.49E+02
9.49E+01
8.80E+01
PASS
1.24E+02
1.37E+01
1.61E+02
8.60E+01
8.80E+01
PASS
1.21E+02
7.68E+00
1.42E+02
1.00E+02
8.80E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
183
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
1.40E+02
PSRR (dB) @ +4.5V TO +12V B
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.89. Plot of PSRR (dB) @ +4.5V TO +12V B versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
184
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.89. Raw data for PSRR (dB) @ +4.5V TO +12V B versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
PSRR (dB) @ +4.5V TO +12V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.14E+02
1.11E+02
1.09E+02
1.08E+02
1.32E+02
1.13E+02
1.20E+02
1.13E+02
1.23E+02
1.11E+02
1.17E+02
1.19E+02
Total
20
1.14E+02
1.12E+02
1.09E+02
1.08E+02
1.33E+02
1.13E+02
1.21E+02
1.13E+02
1.25E+02
1.12E+02
1.17E+02
1.19E+02
Dose (krad(Si))
50
100
1.14E+02 1.13E+02
1.12E+02 1.11E+02
1.10E+02 1.09E+02
1.09E+02 1.08E+02
1.33E+02 1.32E+02
1.13E+02 1.13E+02
1.21E+02 1.22E+02
1.13E+02 1.13E+02
1.25E+02 1.25E+02
1.12E+02 1.13E+02
1.17E+02 1.17E+02
1.19E+02 1.19E+02
200
1.15E+02
1.12E+02
1.10E+02
1.09E+02
1.34E+02
1.13E+02
1.21E+02
1.13E+02
1.24E+02
1.14E+02
1.17E+02
1.19E+02
1.15E+02
9.98E+00
1.42E+02
8.75E+01
1.15E+02
1.00E+01
1.43E+02
8.78E+01
1.15E+02
9.98E+00
1.43E+02
8.80E+01
1.15E+02
9.71E+00
1.41E+02
8.81E+01
1.16E+02
1.05E+01
1.45E+02
8.70E+01
1.16E+02
5.39E+00
1.31E+02
1.01E+02
8.80E+01
PASS
1.17E+02
5.80E+00
1.33E+02
1.01E+02
8.80E+01
PASS
1.17E+02
5.68E+00
1.32E+02
1.01E+02
8.80E+01
PASS
1.17E+02
5.88E+00
1.33E+02
1.01E+02
8.80E+01
PASS
1.17E+02
5.28E+00
1.32E+02
1.03E+02
8.80E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
185
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
PSRR (dB) MATCHING @ +4.5V TO +12V
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.90. Plot of PSRR (dB) MATCHING @ +4.5V TO +12V versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
186
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.90. Raw data for PSRR (dB) MATCHING @ +4.5V TO +12V versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
PSRR (dB) MATCHING @ +4.5V TO +12V
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.55E+02
1.14E+02
1.20E+02
1.04E+02
1.08E+02
1.10E+02
1.12E+02
1.24E+02
1.23E+02
1.19E+02
1.14E+02
1.20E+02
Total
20
1.40E+02
1.14E+02
1.20E+02
1.04E+02
1.09E+02
1.10E+02
1.12E+02
1.24E+02
1.23E+02
1.20E+02
1.14E+02
1.20E+02
Dose (krad(Si))
50
100
1.45E+02 1.39E+02
1.15E+02 1.15E+02
1.20E+02 1.22E+02
1.04E+02 1.04E+02
1.09E+02 1.09E+02
1.11E+02 1.10E+02
1.12E+02 1.12E+02
1.23E+02 1.20E+02
1.23E+02 1.24E+02
1.20E+02 1.22E+02
1.14E+02 1.14E+02
1.20E+02 1.20E+02
200
1.30E+02
1.15E+02
1.22E+02
1.05E+02
1.09E+02
1.10E+02
1.12E+02
1.22E+02
1.22E+02
1.23E+02
1.14E+02
1.20E+02
1.20E+02
2.01E+01
1.75E+02
6.51E+01
1.18E+02
1.41E+01
1.56E+02
7.91E+01
1.19E+02
1.60E+01
1.63E+02
7.47E+01
1.18E+02
1.35E+01
1.55E+02
8.07E+01
1.16E+02
1.02E+01
1.44E+02
8.80E+01
1.18E+02
6.20E+00
1.35E+02
1.00E+02
8.20E+01
PASS
1.18E+02
6.33E+00
1.35E+02
1.00E+02
8.20E+01
PASS
1.18E+02
6.10E+00
1.34E+02
1.01E+02
8.20E+01
PASS
1.18E+02
6.47E+00
1.35E+02
9.99E+01
8.20E+01
PASS
1.18E+02
6.26E+00
1.35E+02
1.01E+02
8.20E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
187
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
+ISC (A) VOUT=1/2 SUPPLY @ +5V A
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.91. Plot of +ISC (A) VOUT=1/2 SUPPLY @ +5V A versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
188
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.91. Raw data for +ISC (A) VOUT=1/2 SUPPLY @ +5V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
+ISC (A) VOUT=1/2 SUPPLY @ +5V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-2.42E-02
-2.43E-02
-2.41E-02
-2.45E-02
-2.46E-02
-2.40E-02
-2.52E-02
-2.42E-02
-2.49E-02
-2.41E-02
-2.41E-02
-2.51E-02
Total
20
-2.34E-02
-2.35E-02
-2.33E-02
-2.36E-02
-2.37E-02
-2.34E-02
-2.44E-02
-2.36E-02
-2.42E-02
-2.34E-02
-2.39E-02
-2.48E-02
Dose (krad(Si))
50
100
-2.29E-02 -2.20E-02
-2.29E-02 -2.21E-02
-2.27E-02 -2.18E-02
-2.31E-02 -2.22E-02
-2.32E-02 -2.23E-02
-2.30E-02 -2.24E-02
-2.39E-02 -2.32E-02
-2.31E-02 -2.25E-02
-2.39E-02 -2.32E-02
-2.29E-02 -2.23E-02
-2.40E-02 -2.40E-02
-2.49E-02 -2.49E-02
200
-2.17E-02
-2.16E-02
-2.15E-02
-2.16E-02
-2.19E-02
-2.12E-02
-2.18E-02
-2.13E-02
-2.19E-02
-2.10E-02
-2.39E-02
-2.48E-02
-2.43E-02
2.23E-04
-2.37E-02
-2.50E-02
-2.35E-02
1.71E-04
-2.30E-02
-2.39E-02
-2.29E-02
1.81E-04
-2.24E-02
-2.34E-02
-2.21E-02
1.86E-04
-2.16E-02
-2.26E-02
-2.17E-02
1.58E-04
-2.12E-02
-2.21E-02
-2.45E-02
5.49E-04
-2.30E-02
-2.60E-02
-1.25E-02
PASS
-2.38E-02
4.70E-04
-2.25E-02
-2.51E-02
-8.00E-03
PASS
-2.34E-02
4.75E-04
-2.21E-02
-2.47E-02
-8.00E-03
PASS
-2.27E-02
4.61E-04
-2.14E-02
-2.40E-02
-8.00E-03
PASS
-2.14E-02
3.87E-04
-2.04E-02
-2.25E-02
-8.00E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
189
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
+ISC (A) VOUT=1/2 SUPPLY @ +5V B
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.92. Plot of +ISC (A) VOUT=1/2 SUPPLY @ +5V B versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
190
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
Table 5.92. Raw data for +ISC (A) VOUT=1/2 SUPPLY @ +5V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
+ISC (A) VOUT=1/2 SUPPLY @ +5V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-2.41E-02
-2.41E-02
-2.40E-02
-2.43E-02
-2.45E-02
-2.40E-02
-2.50E-02
-2.41E-02
-2.49E-02
-2.39E-02
-2.42E-02
-2.50E-02
Total
20
-2.33E-02
-2.32E-02
-2.31E-02
-2.32E-02
-2.35E-02
-2.34E-02
-2.42E-02
-2.35E-02
-2.42E-02
-2.32E-02
-2.39E-02
-2.47E-02
Dose (krad(Si))
50
100
-2.27E-02 -2.19E-02
-2.27E-02 -2.18E-02
-2.25E-02 -2.16E-02
-2.27E-02 -2.18E-02
-2.30E-02 -2.21E-02
-2.30E-02 -2.24E-02
-2.37E-02 -2.30E-02
-2.31E-02 -2.24E-02
-2.37E-02 -2.31E-02
-2.28E-02 -2.21E-02
-2.40E-02 -2.40E-02
-2.48E-02 -2.48E-02
200
-2.16E-02
-2.13E-02
-2.13E-02
-2.12E-02
-2.17E-02
-2.12E-02
-2.15E-02
-2.12E-02
-2.17E-02
-2.08E-02
-2.39E-02
-2.47E-02
-2.42E-02
1.96E-04
-2.36E-02
-2.47E-02
-2.33E-02
1.49E-04
-2.29E-02
-2.37E-02
-2.27E-02
1.62E-04
-2.23E-02
-2.32E-02
-2.18E-02
1.84E-04
-2.13E-02
-2.23E-02
-2.14E-02
2.05E-04
-2.09E-02
-2.20E-02
-2.44E-02
5.13E-04
-2.30E-02
-2.58E-02
-1.25E-02
PASS
-2.37E-02
4.32E-04
-2.25E-02
-2.49E-02
-8.00E-03
PASS
-2.33E-02
4.34E-04
-2.21E-02
-2.45E-02
-8.00E-03
PASS
-2.26E-02
4.26E-04
-2.14E-02
-2.37E-02
-8.00E-03
PASS
-2.13E-02
3.62E-04
-2.03E-02
-2.23E-02
-8.00E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
191
RLAT Report
11-009 110509 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
-ISC (A) VOUT=1/2 SUPPLY @ +5V A
5.00E-02
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.93. Plot of -ISC (A) VOUT=1/2 SUPPLY @ +5V A versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
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Table 5.93. Raw data for -ISC (A) VOUT=1/2 SUPPLY @ +5V A versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
-ISC (A) VOUT=1/2 SUPPLY @ +5V A
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
4.52E-02
4.56E-02
4.56E-02
4.53E-02
4.56E-02
4.52E-02
4.59E-02
4.55E-02
4.53E-02
4.55E-02
4.60E-02
4.55E-02
Total
20
4.58E-02
4.62E-02
4.62E-02
4.58E-02
4.63E-02
4.60E-02
4.68E-02
4.63E-02
4.63E-02
4.64E-02
4.71E-02
4.66E-02
Dose (krad(Si))
50
100
4.53E-02 4.51E-02
4.56E-02 4.54E-02
4.56E-02 4.54E-02
4.53E-02 4.51E-02
4.58E-02 4.56E-02
4.54E-02 4.51E-02
4.62E-02 4.59E-02
4.56E-02 4.53E-02
4.56E-02 4.54E-02
4.57E-02 4.54E-02
4.66E-02 4.66E-02
4.61E-02 4.61E-02
200
4.52E-02
4.56E-02
4.55E-02
4.52E-02
4.58E-02
4.51E-02
4.59E-02
4.53E-02
4.54E-02
4.54E-02
4.70E-02
4.65E-02
4.54E-02
1.94E-04
4.60E-02
4.49E-02
4.61E-02
2.30E-04
4.67E-02
4.54E-02
4.55E-02
2.28E-04
4.62E-02
4.49E-02
4.53E-02
2.33E-04
4.60E-02
4.47E-02
4.55E-02
2.81E-04
4.62E-02
4.47E-02
4.55E-02
2.66E-04
4.62E-02
4.47E-02
1.25E-02
PASS
4.64E-02
2.94E-04
4.72E-02
4.56E-02
8.00E-03
PASS
4.57E-02
3.03E-04
4.65E-02
4.49E-02
8.00E-03
PASS
4.54E-02
2.79E-04
4.62E-02
4.46E-02
8.00E-03
PASS
4.54E-02
2.90E-04
4.62E-02
4.46E-02
8.00E-03
PASS
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Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
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Ps90%/90% (-KTL) Biased
-ISC (A) VOUT=1/2 SUPPLY @ +5V B
5.00E-02
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
50
100
150
200
Total Dose (krad(Si))
Figure 5.94. Plot of -ISC (A) VOUT=1/2 SUPPLY @ +5V B versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
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Table 5.94. Raw data for -ISC (A) VOUT=1/2 SUPPLY @ +5V B versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
-ISC (A) VOUT=1/2 SUPPLY @ +5V B
Device
1058
1059
1060
1062
1063
1064
1065
1066
1067
1068
1069
1070
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
4.47E-02
4.51E-02
4.50E-02
4.45E-02
4.50E-02
4.49E-02
4.52E-02
4.49E-02
4.47E-02
4.48E-02
4.53E-02
4.49E-02
Total
20
4.53E-02
4.57E-02
4.56E-02
4.51E-02
4.57E-02
4.58E-02
4.61E-02
4.57E-02
4.57E-02
4.58E-02
4.64E-02
4.60E-02
Dose (krad(Si))
50
100
4.48E-02 4.46E-02
4.52E-02 4.49E-02
4.51E-02 4.49E-02
4.46E-02 4.43E-02
4.52E-02 4.50E-02
4.51E-02 4.48E-02
4.55E-02 4.51E-02
4.50E-02 4.47E-02
4.50E-02 4.47E-02
4.51E-02 4.48E-02
4.59E-02 4.59E-02
4.56E-02 4.55E-02
200
4.47E-02
4.52E-02
4.50E-02
4.45E-02
4.52E-02
4.49E-02
4.52E-02
4.48E-02
4.48E-02
4.48E-02
4.63E-02
4.60E-02
4.49E-02
2.29E-04
4.55E-02
4.42E-02
4.55E-02
2.64E-04
4.62E-02
4.48E-02
4.50E-02
2.68E-04
4.57E-02
4.42E-02
4.47E-02
2.66E-04
4.55E-02
4.40E-02
4.49E-02
3.11E-04
4.58E-02
4.41E-02
4.49E-02
1.80E-04
4.54E-02
4.44E-02
1.25E-02
PASS
4.58E-02
1.81E-04
4.63E-02
4.53E-02
8.00E-03
PASS
4.51E-02
1.98E-04
4.57E-02
4.46E-02
8.00E-03
PASS
4.48E-02
1.73E-04
4.53E-02
4.44E-02
8.00E-03
PASS
4.49E-02
1.82E-04
4.54E-02
4.44E-02
8.00E-03
PASS
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6.0. Summary / Conclusions
The total ionizing dose testing described in this final report was performed using the facilities at
Radiation Assured Devices' Longmire Laboratories in Colorado Springs, CO. The high dose rate total
ionizing dose (TID) source is a JLSA 81-24 irradiator modified to provide a panoramic exposure. The
Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures
the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for
this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately
120rad(Si)/s, determined by the distance from the source.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the total ionizing dose test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could
be logged as a failure.
Based on this criterion the RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp
(from the lot date code identified on the first page of this test report) PASSED the total ionizing dose
test to the maximum tested dose level of 200krad(Si) with all parameters remaining within their
datasheet specifications.
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Appendix A: Photograph of a Sample Unit-Under-Test to Show Part Traceability
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Appendix B: Radiation Bias Connections
TID Radiation Biased Conditions:
Extracted from Linear Technology RH1498M datasheet.
Pin Function
1
OUT A
2
-IN A
3
+IN A
4
NC
5
V-
6
NC
7
+IN B
8
-IN B
9
OUT B
10
V+
Connection / Bias
To Pin2 Via 5kΩ Resistor,
To Pin2 Via 40pF Capacitor
To Pin1 Via 5kΩ Resistor,
To Pin1 Via 40pF Capacitor
To 8V via 5kΩ Resistor
NC
To -15V,
0.1µF Decoupling Capacitor to GND
NC
To 8V via 5kΩ Resistor
To Pin9 Via 5kΩ Resistor,
To Pin9 Via 40pF Capacitor
To Pin8 Via 5kΩ Resistor,
To Pin8 Via 40pF Capacitor
To +15V,
0.1µF Decoupling Capacitor to GND
TID Radiation Unbiased Conditions:
Pin Function Connection / Bias
1
OUT A
GND
2
-IN A
GND
3
+IN A
GND
4
NC
GND
5
V-
GND
6
NC
GND
7
+IN B
GND
8
-IN B
GND
9
OUT B
GND
10
V+
GND
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Absolute Maximum Rating:
Parameter
Max Rating
Total Supply Voltage 36V
Input Current
±10mA
Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted
from Linear Technology RH1498M Datasheet.
Figure B.2. W package drawing (for reference only). This figure was extracted from the Linear Technology
RH1498M Datasheet.
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Appendix C: Electrical Test Parameters and Conditions
The expected ranges of values as well as the measurement conditions are taken from Linear Technology
RH1498M datasheet Reivsion E. All electrical tests for this device are performed on one of Radiation
Assured Device's LTS2020 Test Systems. The LTS2020 Test System is a programmable parametric
tester that provides parameter measurements for a variety of digital, analog and mixed signal products
including voltage regulators, voltage comparators, D to A and A to D converters. The LTS2020 Test
System achieves accuracy and sensitivity through the use of software self-calibration and an internal
relay matrix with separate family boards and custom personality adapter boards. The tester uses this
relay matrix to connect the required test circuits, select the appropriate voltage / current sources and
establish the needed measurement loops for all the tests performed. The measured parameters and test
conditions are shown in Table C.1 (VS=±15V) and Table C.2 (VS=5V).
A listing of the measurement precision/resolution for each parameter is shown in Table C.3 (VS=±15V)
and Table C.4 (VS=5V). The precision/resolution values were obtained from test data or from the DAC
resolution of the LTS-2020 for the particular test shown, whichever is greater. To generate the
precision/resolution shown in Table C.2, one of the units-under-test was tested repetitively (a total of 10times with re-insertion between tests) to obtain the average test value and standard deviation. Using this
test data MIL-HDBK-814 90/90 KTL statistics were applied to the measured standard deviation to
generate the final measurement range. This value encompasses the precision/resolution of all aspects of
the test system, including the LTS2020 mainframe, family board, socket assembly and DUT board as
well as insertion error. In some cases, the measurement resolution is limited by the internal DACs,
which results in a measured standard deviation of zero. In these instances the precision/resolution will be
reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Not all measured parameters are well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify
these parameters using an “attributes” approach.
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Table C.1. Measured parameters and test conditions at VS=±15V for the RH1498MW Dual Rail-to-Rail Input
and Output Precision C-Load Op Amp.
Parameter
+ICC (A) @ +/-15V
-IEE (A) @ +/-15V
V OFFSET (V) @ +/-15V VCM=0V
I OFFSET (A) @ +/-15V VCM=0V
I BIAS + (A) @ +/-15V VCM=0V
I BIAS - (A) @ +/-15V VCM=0V
V OFFSET (V) @ +/-15V VCM=15V
I OFFSET (A) @ +/-15V VCM=15V
I BIAS + (A) @ +/-15V VCM=15V
I BIAS - (A) @ +/-15V VCM=15V
V OFFSET (V) @ +/-15V VCM=-15V
I OFFSET (A) @ +/-15V VCM=-15V
I BIAS + (A) @ +/-15V VCM=-15V
I BIAS - (A) @ +/-15V VCM=-15V
+VOUT (V) IL=0MA @ +/-15V
+VOUT (V) IL=1MA @ +/-15V
+VOUT (V) IL=10MA @ +/-15V
-VOUT (V) IL=0MA @ +/-15V
-VOUT (V) IL=1MA @ +/-15V
-VOUT (V) IL=10MA @ +/-15V
AVOL (V/mV) RL=10K VO=+/-14.5V
AVOL (V/mV) RL=2K VO=+/-10V
CMRR (dB) @ +/-15V VCM=+/-15V
CMRR (dB) MATCHING
PSRR (dB) @ +/-2V TO +/-16V
PSRR (dB) MATCHING
+ISC (A) VOUT=0V @ +/-15V
-ISC (A) VOUT=0V @ +/-15V
Test Conditions
VS= +/-15V
VS= +/-15V
VS=+/-15V VCM=0V
VS=+/-15V VCM=0V
VS=+/-15V VCM=0V
VS=+/-15V VCM=0V
VS=+/-15V VCM=15V
VS=+/-15V VCM=15V
VS=+/-15V VCM=15V
VS=+/-15V VCM=15V
VS=+/-15V VCM=-15V
VS=+/-15V VCM=-15V
VS=+/-15V VCM=-15V
VS=+/-15V VCM=-15V
IL=0MA, VS=+/-15V
IL=1MA, VS=+/-15V
IL=10MA, VS=+/-15V
IL=0MA, VS=+/-15V
IL=1MA, VS=+/-15V
IL=10MA, VS=+/-15V
RL=10K VO=+/-14.5V
RL=2K VO=+/-10V
VS=+/-15V VCM=+/-15V
VS=+/-15V VCM=+/-15V
VS=+/-2V TO +/-16V
VS=+/-2V TO +/-16V
VOUT=0V, VS=+/-15V
VOUT=0V, VS=+/-15V
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Table C.2. Measured parameters and test conditions at VS=5V for the RH1498MW Dual Rail-to-Rail Input and
Output Precision C-Load Op Amp.
Parameter
+ICC (A) @ +5V
-IEE (A) @ +5V
V OFFSET (V) @ +5V VCM=0V
I OFFSET (A) @ +5V VCM=0V
I BIAS + (A) @ +5V VCM=0V
I BIAS - (A) @ +5V VCM=0V
V OFFSET (V) @ +5V VCM=5V
I OFFSET (A) @ +5V VCM=5V
I BIAS + (A) @ +5V VCM=5V
I BIAS - (A) @ +5V VCM=5V
+VOUT (V) IL=0MA @ +5V
+VOUT (V) IL=1MA @ +5V
+VOUT (V) IL=2.5MA @ +5V
-VOUT (V) IL=0MA @ +5V
-VOUT (V) IL=1MA @ +5V
-VOUT (V) IL=2.5MA @ +5V
AVOL (V/mV) RL=10K VO=75MV TO 4.8V
CMRR (dB) @ +5V VCM=0 TO +5V
CMRR (dB) MATCHING
PSRR (dB) @ +4.5V TO +12V
PSRR (dB) MATCHING @ +4.5V TO +12V
+ISC (A) VOUT=1/2 SUPPLY @ +5V
-ISC (A) VOUT=1/2 SUPPLY @ +5V
Test Conditions
VS=+5V
VS=+5V
VS=+5V VCM=0V
VS=+5V VCM=0V
VS=+5V VCM=0V
VS=+5V VCM=0V
VS=+5V VCM=5V
VS=+5V VCM=5V
VS=+5V VCM=5V
VS=+5V VCM=5V
IL=0MA, VS=+5V
IL=1MA, VS=+5V
IL=2.5MA, VS=+5V
IL=0MA, VS=+5V
IL=1MA, VS=+5V
IL=2.5MA, VS=+5V
RL=10K VO=75MV TO 4.8V
VS=+5V VCM=0 TO +5V
VS=+5V VCM=0 TO +5V
VS=+4.5V TO +12V
VS=+4.5V TO +12V
VOUT=1/2 SUPPLY, VS=+5V
VOUT=1/2 SUPPLY, VS=+5V
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Table C.3. Measured parameters, pre-irradiation specifications and measurement precision at VS=±15V for the
RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp.
Parameter
+ICC (A) @ +/-15V
-IEE (A) @ +/-15V
V OFFSET (V) @ +/-15V VCM=0V
I OFFSET (A) @ +/-15V VCM=0V
I BIAS + (A) @ +/-15V VCM=0V
I BIAS - (A) @ +/-15V VCM=0V
V OFFSET (V) @ +/-15V VCM=15V
I OFFSET (A) @ +/-15V VCM=15V
I BIAS + (A) @ +/-15V VCM=15V
I BIAS - (A) @ +/-15V VCM=15V
V OFFSET (V) @ +/-15V VCM=-15V
I OFFSET (A) @ +/-15V VCM=-15V
I BIAS + (A) @ +/-15V VCM=-15V
I BIAS - (A) @ +/-15V VCM=-15V
+VOUT (V) IL=0MA @ +/-15V
+VOUT (V) IL=1MA @ +/-15V
+VOUT (V) IL=10MA @ +/-15V
-VOUT (V) IL=0MA @ +/-15V
-VOUT (V) IL=1MA @ +/-15V
-VOUT (V) IL=10MA @ +/-15V
AVOL (V/mV) RL=10K VO=+/-14.5V
AVOL (V/mV) RL=2K VO=+/-10V
CMRR (dB) @ +/-15V VCM=+/-15V
CMRR (dB) MATCHING
PSRR (dB) @ +/-2V TO +/-16V
PSRR (dB) MATCHING
+ISC (A) VOUT=0V @ +/-15V
-ISC (A) VOUT=0V @ +/-15V
Pre-Irradiation Specification
MIN
MAX
5.00E-03
-5.00E-03
-8.00E-04
8.00E-04
-7.00E-08
7.00E-08
-7.15E-07
7.15E-07
-7.15E-07
7.15E-07
-8.00E-04
8.00E-04
-7.00E-08
7.00E-08
-7.15E-07
7.15E-07
-7.15E-07
7.15E-07
-8.00E-04
8.00E-04
-7.00E-08
7.00E-08
-7.15E-07
7.15E-07
-7.15E-07
7.15E-07
1.00E-02
1.50E-01
8.00E-01
3.00E-02
1.00E-01
5.00E-01
1.00E+03
5.00E+02
9.00E+01
8.40E+01
9.00E+01
8.30E+01
-1.50E-02
1.50E-02
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Measurement
Precision/Resolution
±2.27E-05
±1.99E-05
±1.60E-06
±6.64E-11
±2.00E-09
±1.93E-09
±1.01E-06
±4.99E-10
±2.41E-09
±1.77E-09
±1.33E-06
±7.39E-11
±1.77E-09
±1.73E-09
±2.01E-04
±3.89E-04
±1.13E-03
±1.65E-04
±2.26E-04
±9.49E-04
±1.83E+02
±4.70E+01
±4.68E-01
±1.37E-01
±1.37E+00
±1.16E-01
±8.92E-05
±9.48E-05
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Table C.4. Measured parameters, pre-irradiation specifications and measurement precision at VS=5V for the
RH1498MW Dual Rail-to-Rail Input and Output Precision C-Load Op Amp.
Parameter
+ICC (A) @ +5V
-IEE (A) @ +5V
V OFFSET (V) @ +5V VCM=0V
I OFFSET (A) @ +5V VCM=0V
I BIAS + (A) @ +5V VCM=0V
I BIAS - (A) @ +5V VCM=0V
V OFFSET (V) @ +5V VCM=5V
I OFFSET (A) @ +5V VCM=5V
I BIAS + (A) @ +5V VCM=5V
I BIAS - (A) @ +5V VCM=5V
+VOUT (V) IL=0MA @ +5V
+VOUT (V) IL=1MA @ +5V
+VOUT (V) IL=2.5MA @ +5V
-VOUT (V) IL=0MA @ +5V
-VOUT (V) IL=1MA @ +5V
-VOUT (V) IL=2.5MA @ +5V
AVOL (V/mV) RL=10K VO=75MV TO 4.8V
CMRR (dB) @ +5V VCM=0 TO +5V
CMRR (dB) MATCHING
PSRR (dB) @ +4.5V TO +12V
PSRR (dB) MATCHING @ +4.5V TO +12V
+ISC (A) VOUT=1/2 SUPPLY @ +5V
-ISC (A) VOUT=1/2 SUPPLY @ +5V
Pre-Irradiation Specification
MIN
MAX
4.40E-03
-4.40E-03
-8.00E-04
8.00E-04
-6.50E-08
6.50E-08
-6.50E-07
6.50E-07
-6.50E-07
6.50E-07
-8.00E-04
8.00E-04
-6.50E-08
6.50E-08
-6.50E-07
6.50E-07
-6.50E-07
6.50E-07
1.00E-02
1.50E-01
2.50E-01
3.00E-02
1.00E-01
2.00E-01
6.00E+02
7.60E+01
7.50E+01
8.80E+01
8.20E+01
-1.25E-02
1.25E-02
An ISO 9001:2008 and DSCC Certified Company
204
Measurement
Precision/Resolution
±6.53E-06
±1.39E-05
±1.73E-06
±6.30E-11
±1.30E-09
±1.29E-09
±1.34E-06
±3.13E-10
±1.98E-09
±1.92E-09
±1.44E-04
±2.55E-04
±3.81E-04
±1.77E-04
±2.03E-04
±2.71E-04
±6.50E+02
±4.42E-01
±3.88E-02
±5.09E+00
±5.01E-01
±1.96E-05
±8.14E-05
RLAT Report
11-009 110509 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Appendix D: List of Figures Used in the Results Section (Section 5)
5.1.
5.2.
5.3.
5.4.
5.5.
5.6.
5.7.
5.8.
5.9.
5.10.
5.11.
5.12.
5.13.
5.14.
5.15.
5.16.
5.17.
5.18.
5.19.
5.20.
5.21.
5.22.
5.23.
5.24.
5.25.
5.26.
5.27.
5.28.
5.29.
5.30.
5.31.
5.32.
5.33.
5.34.
5.35.
5.36.
5.37.
5.38.
+ICC (A) @ +/-15V
-IEE (A) @ +/-15V
V OFFSET (V) @ +/-15V VCM=0V A
V OFFSET (V) @ +/-15V VCM=0V B
I OFFSET (A) @ +/-15V VCM=0V A
I OFFSET (A) @ +/-15V VCM=0V B
I BIAS + (A) @ +/-15V VCM=0V A
I BIAS + (A) @ +/-15V VCM=0V B
I BIAS - (A) @ +/-15V VCM=0V A
I BIAS - (A) @ +/-15V VCM=0V B
V OFFSET (V) @ +/-15V VCM=15V A
V OFFSET (V) @ +/-15V VCM=15V B
I OFFSET (A) @ +/-15V VCM=15V A
I OFFSET (A) @ +/-15V VCM=15V B
I BIAS + (A) @ +/-15V VCM=15V A
I BIAS + (A) @ +/-15V VCM=15V B
I BIAS - (A) @ +/-15V VCM=15V A
I BIAS - (A) @ +/-15V VCM=15V B
V OFFSET (V) @ +/-15V VCM=-15V A
V OFFSET (V) @ +/-15V VCM=-15V B
I OFFSET (A) @ +/-15V VCM=-15V A
I OFFSET (A) @ +/-15V VCM=-15V B
I BIAS + (A) @ +/-15V VCM=-15V A
I BIAS + (A) @ +/-15V VCM=-15V B
I BIAS - (A) @ +/-15V VCM=-15V A
I BIAS - (A) @ +/-15V VCM=-15V B
+VOUT (V) IL=0MA @ +/-15V A
+VOUT (V) IL=0MA @ +/-15V B
+VOUT (V) IL=1MA @ +/-15V A
+VOUT (V) IL=1MA @ +/-15V B
+VOUT (V) IL=10MA @ +/-15V A
+VOUT (V) IL=10MA @ +/-15V B
-VOUT (V) IL=0MA @ +/-15V A
-VOUT (V) IL=0MA @ +/-15V B
-VOUT (V) IL=1MA @ +/-15V A
-VOUT (V) IL=1MA @ +/-15V B
-VOUT (V) IL=10MA @ +/-15V A
-VOUT (V) IL=10MA @ +/-15V B
An ISO 9001:2008 and DSCC Certified Company
205
RLAT Report
11-009 110509 R1.1
5.39.
5.40.
5.41.
5.42.
5.43.
5.44.
5.45.
5.46.
5.47.
5.48.
5.49.
5.50.
5.51.
5.52.
5.53.
5.54.
5.55.
5.56.
5.57.
5.58.
5.59.
5.60.
5.61.
5.62.
5.63.
5.64.
5.65.
5.66.
5.67.
5.68.
5.69.
5.70.
5.71.
5.72.
5.73.
5.74.
5.75.
5.76.
5.77.
5.78.
5.79.
5.80.
AVOL (V/mV) RL=10K VO=+/-14.5V A
AVOL (V/mV) RL=10K VO=+/-14.5V B
AVOL (V/mV) RL=2K VO=+/-10V A
AVOL (V/mV) RL=2K VO=+/-10V B
CMRR (dB) @ +/-15V VCM=+/-15V A
CMRR (dB) @ +/-15V VCM=+/-15V B
CMRR (dB) MATCHING
PSRR (dB) @ +/-2V TO +/-16V A
PSRR (dB) @ +/-2V TO +/-16V B
PSRR (dB) MATCHING
+ISC (A) VOUT=0V @ +/-15V A
+ISC (A) VOUT=0V @ +/-15V B
-ISC (A) VOUT=0V @ +/-15V A
-ISC (A) VOUT=0V @ +/-15V B
+ICC (A) @ +5V
-IEE (A) @ +5V
V OFFSET (V) @ +5V VCM=0V A
V OFFSET (V) @ +5V VCM=0V B
I OFFSET (A) @ +5V VCM=0V A
I OFFSET (A) @ +5V VCM=0V B
I BIAS + (A) @ +5V VCM=0V A
I BIAS + (A) @ +5V VCM=0V B
I BIAS - (A) @ +5V VCM=0V A
I BIAS - (A) @ +5V VCM=0V B
V OFFSET (V) @ +5V VCM=5V A
V OFFSET (V) @ +5V VCM=5V B
I OFFSET (A) @ +5V VCM=5V A
I OFFSET (A) @ +5V VCM=5V B
I BIAS + (A) @ +5V VCM=5V A
I BIAS + (A) @ +5V VCM=5V B
I BIAS - (A) @ +5V VCM=5V A
I BIAS - (A) @ +5V VCM=5V B
+VOUT (V) IL=0MA @ +5V A
+VOUT (V) IL=0MA @ +5V B
+VOUT (V) IL=1MA @ +5V A
+VOUT (V) IL=1MA @ +5V B
+VOUT (V) IL=2.5MA @ +5V A
+VOUT (V) IL=2.5MA @ +5V B
-VOUT (V) IL=0MA @ +5V A
-VOUT (V) IL=0MA @ +5V B
-VOUT (V) IL=1MA @ +5V A
-VOUT (V) IL=1MA @ +5V B
An ISO 9001:2008 and DSCC Certified Company
206
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
RLAT Report
11-009 110509 R1.1
5.81.
5.82.
5.83.
5.84.
5.85.
5.86.
5.87.
5.88.
5.89.
5.90.
5.91.
5.92.
5.93.
5.94.
-VOUT (V) IL=2.5MA @ +5V A
-VOUT (V) IL=2.5MA @ +5V B
AVOL (V/mV) RL=10K VO=75MV TO 4.8V A
AVOL (V/mV) RL=10K VO=75MV TO 4.8V B
CMRR (dB) @ +5V VCM=0 TO +5V A
CMRR (dB) @ +5V VCM=0 TO +5V B
CMRR (dB) MATCHING
PSRR (dB) @ +4.5V TO +12V A
PSRR (dB) @ +4.5V TO +12V B
PSRR (dB) MATCHING @ +4.5V TO +12V
+ISC (A) VOUT=1/2 SUPPLY @ +5V A
+ISC (A) VOUT=1/2 SUPPLY @ +5V B
-ISC (A) VOUT=1/2 SUPPLY @ +5V A
-ISC (A) VOUT=1/2 SUPPLY @ +5V B
An ISO 9001:2008 and DSCC Certified Company
207
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800