ONSEMI MCR08BT1

MCR08B, MCR08M
Preferred Device
Sensitive Gate
Silicon Controlled Rectifiers
Reverse Blocking Thyristors
PNPN devices designed for line powered consumer applications
such as relay and lamp drivers, small motor controls, gate drivers for
larger thyristors, and sensing and detection circuits. Supplied in
surface mount package for use in automated manufacturing.
• Sensitive Gate Trigger Current
• Blocking Voltage to 600 Volts
• Glass Passivated Surface for Reliability and Uniformity
• Surface Mount Package
• Device Marking: MCR08BT1: CR08B; MCR08MT1: CR08M, and
Date Code
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SCRs
0.8 AMPERES RMS
200 thru 600 VOLTS
G
A
K
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating
Symbol
Peak Repetitive Off–State Voltage(1)
(Sine Wave, RGK = 1000 Ω,
TJ = 25 to 110°C)
MCR08BT1
MCR08MT1
VDRM,
VRRM
On-State Current RMS
(All Conduction Angles; TC = 80°C)
IT(RMS)
0.8
Amps
ITSM
8.0
Amps
Peak Non-repetitive Surge Current
(1/2 Cycle Sine Wave, 60 Hz,
TC = 25°C)
Circuit Fusing Considerations
(t = 8.3 ms)
Value
Unit
1
200
600
I2t
A2s
0.4
Forward Peak Gate Power
(TC = 80°C, t = 1.0 µs)
PGM
0.1
Watts
Average Gate Power
(TC = 80°C, t = 8.3 ms)
PG(AV)
0.01
Watts
Operating Junction Temperature Range
Storage Temperature Range
May, 2000 – Rev. 3
2 3
SOT–223
CASE 318E
STYLE 10
PIN ASSIGNMENT
1
Cathode
2
Anode
3
Gate
4
Anode
ORDERING INFORMATION
TJ
– 40 to
+110
°C
Tstg
– 40 to
+150
°C
(1) VDRM and VRRM for all types can be applied on a continuous basis. Ratings
apply for zero or negative gate voltage; however, positive gate voltage shall
not be applied concurrent with negative potential on the anode. Blocking
voltages shall not be tested with a constant source such that the voltage
ratings of the devices are exceeded.
 Semiconductor Components Industries, LLC, 2000
4
Volts
1
Device
Package
Shipping
MCR08BT1
SOT223
16mm Tape and Reel
(1K/Reel)
MCR08MT1
SOT223
16mm Tape and Reel
(1K/Reel)
Preferred devices are recommended choices for future use
and best overall value.
Publication Order Number:
MCR08BT1/D
MCR08B, MCR08M
THERMAL CHARACTERISTICS
Symbol
Value
Unit
Thermal Resistance, Junction to Ambient
PCB Mounted per Figure 1
Characteristic
RθJA
156
°C/W
Thermal Resistance, Junction to Tab
Measured on Anode Tab Adjacent to Epoxy
RθJT
25
°C/W
TL
260
°C
Maximum Device Temperature for Soldering Purposes (for 10 Seconds Maximum)
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)
Symbol
Characteristic
Min
Typ
Max
Unit
—
—
—
—
10
200
µA
µA
OFF CHARACTERISTICS
Peak Repetitive Forward or Reverse Blocking Current(2)
(VAK = Rated VDRM or VRRM, RGK = 1000 Ω)
IDRM, IRRM
TJ = 25°C
TJ = 110°C
ON CHARACTERISTICS
Peak Forward On-State Voltage(1)
(IT = 1.0 A Peak)
VTM
—
—
1.7
Volts
Gate Trigger Current (Continuous dc)(3)
(VAK = 12 Vdc, RL = 100 Ω)
Holding Current(3)
(VAK = 12 Vdc, Initiating Current = 20 mA)
IGT
—
—
200
µA
IH
—
—
5.0
mA
Gate Trigger Voltage (Continuous dc)(3)
(VAK = 12 Vdc, RL = 100 Ω)
VGT
—
—
0.8
Volts
dv/dt
10
—
—
V/µs
DYNAMIC CHARACTERISTICS
Critical Rate-of-Rise of Off State Voltage
(Vpk = Rated VDRM, TC = 110°C, RGK = 1000 Ω, Exponential Method)
(1) Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%.
(2) RGK = 1000 Ω is included in measurement.
(3) RGK is not included in measurement.
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MCR08B, MCR08M
Voltage Current Characteristic of SCR
+ Current
Symbol
Parameter
VDRM
IDRM
Peak Repetitive Off State Forward Voltage
VRRM
IRRM
Peak Repetitive Off State Reverse Voltage
VTM
IH
Anode +
VTM
on state
Peak Forward Blocking Current
IRRM at VRRM
IH
Peak Reverse Blocking Current
Peak On State Voltage
Holding Current
Reverse Blocking Region
(off state)
Reverse Avalanche Region
+ Voltage
IDRM at VDRM
Forward Blocking Region
(off state)
Anode –
0.15
3.8
0.079
2.0
0.091 0.091
2.3
2.3
0.244
6.2
0.079
2.0
0.984
25.0
0.059 0.059 0.059
1.5
1.5
1.5
0.096
2.44
0.096
2.44
0.059
1.5
ǒinchesǓ
mm
BOARD MOUNTED VERTICALLY IN CINCH 8840 EDGE CONNECTOR.
BOARD THICKNESS = 65 MIL., FOIL THICKNESS = 2.5 MIL.
MATERIAL: G10 FIBERGLASS BASE EPOXY
0.096
2.44
0.059
1.5
0.472
12.0
Figure 1. PCB for Thermal Impedance and
Power Testing of SOT-223
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3
10
1.0
0.1
TYPICAL AT TJ = 110°C
MAX AT TJ = 110°C
MAX AT TJ = 25°C
0.01
2.0
1.0
0
3.0
R θJA , JUNCTION TO AMBIENT
THERMAL RESISTANCE, ( °C/W)
IT, INSTANTANEOUS ON-STATE CURRENT (AMPS)
MCR08B, MCR08M
4.0
160
150
140
130
120
110
100
90
80
70
60
50
40
30
DEVICE MOUNTED ON
FIGURE 1 AREA = L2
PCB WITH TAB AREA
AS SHOWN
MINIMUM
FOOTPRINT = 0.076 cm2
0
1.0
2.0
3.0
110
110
100
100
α
α = CONDUCTION
ANGLE
80
dc
70
180°
60
120°
50
α = 30°
40
60°
90°
0
0.1
0.2
180°
120°
70
α = 30°
60
60°
50
40
90°
α
CONDUCTION
ANGLE
0
0.1
0.2
0.3
0.4
0.5
180°
120°
60°
70
90°
α
180°
120°
α = 30°
60°
90°
α
α = CONDUCTION
α = CONDUCTION
ANGLE
ANGLE
0.1
50 OR 60 Hz HALFWAVE
dc
T(tab) , MAXIMUM ALLOWABLE
TAB TEMPERATURE ( ° C)
T A , MAXIMUM ALLOWABLE
AMBIENT TEMPERATURE ( °C)
dc
110
PAD AREA = 4.0 cm2, 50
OR 60 Hz HALFWAVE
α = 30°
10
1.0 cm2 FOIL, 50 OR
60 Hz HALFWAVE
Figure 5. Current Derating, 1.0 cm Square Pad
Reference: Ambient Temperature
dc
0
9.0
Figure 4. Current Derating, Minimum Pad Size
Reference: Ambient Temperature
90
50
8.0
IT(AV), AVERAGE ON-STATE CURRENT (AMPS)
100
60
7.0
IT(AV), AVERAGE ON-STATE CURRENT (AMPS)
110
80
6.0
FOIL AREA (cm2)
80
20
0.5
0.4
0.3
5.0
90
30 α =
30
20
4.0
Figure 3. Junction to Ambient Thermal
Resistance versus Copper Tab Area
T A , MAXIMUM ALLOWABLE
AMBIENT TEMPERATURE ( °C)
T A , MAXIMUM ALLOWABLE
AMBIENT TEMPERATURE ( °C)
Figure 2. On-State Characteristics
50 OR 60 Hz HALFWAVE
L
4
1 2 3
vT, INSTANTANEOUS ON-STATE VOLTAGE (VOLTS)
90
L
TYPICAL
MAXIMUM
0.2
0.3
0.4
85
0.5
0
0.1
0.2
0.3
0.4
IT(AV), AVERAGE ON-STATE CURRENT (AMPS)
IT(AV), AVERAGE ON-STATE CURRENT (AMPS)
Figure 6. Current Derating, 2.0 cm Square Pad
Reference: Ambient Temperature
Figure 7. Current Derating
Reference: Anode Tab
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0.5
MCR08B, MCR08M
1.0
MAXIMUM AVERAGE POWER
P(AV),DISSIPATION (WATTS)
0.9
α
0.8 α =
0.7
r T , TRANSIENT THERMAL RESISTANCE
NORMALIZED
1.0
α = 30°
CONDUCTION
ANGLE
60°
0.6
90°
0.5
0.4
dc
0.3
180°
0.2
120°
0.1
0
0
0.1
0.2
0.01
0.0001
0.5
0.4
0.3
0.1
0.001
VAK = 12 V
RL = 100 Ω
0.6
I H , HOLDING CURRENT
(NORMALIZED)
VGT , GATE TRIGGER VOLTAGE (VOLTS)
100
2.0
0.5
0.4
–20
0
20
40
60
80
VAK = 12 V
RL = 3.0 kΩ
1.0
0
–40
110
–20
0
20
40
60
80
110
TJ, JUNCTION TEMPERATURE, (°C)
TJ, JUNCTION TEMPERATURE, (°C)
Figure 11. Typical Normalized Holding Current
versus Junction Temperature
Figure 10. Typical Gate Trigger Voltage
versus Junction Temperature
1000
I GT , GATE TRIGGER CURRENT ( µA)
0.7
V GT , GATE TRIGGER VOLTAGE (VOLTS)
10
Figure 9. Thermal Response Device
Mounted on Figure 1 Printed Circuit Board
0.7
0.65
0.6
RGK = 1000 Ω, RESISTOR
CURRENT INCLUDED
100
0.55
0.5
VAK = 12 V
RL = 100 Ω
TJ = 25°C
0.45
0.4
0.35
0.3
0.1
1.0
t, TIME (SECONDS)
Figure 8. Power Dissipation
0.3
–40
0.1
0.01
IT(AV), AVERAGE ON-STATE CURRENT (AMPS)
1.0
10
100
1000
VAK = 12 V
RL = 100 Ω
WITHOUT GATE RESISTOR
10
1.0
–40
–20
0
20
40
60
80
TJ, JUNCTION TEMPERATURE (°C)
IGT, GATE TRIGGER CURRENT (µA)
Figure 12. Typical Range of VGT
versus Measured IGT
Figure 13. Typical Gate Trigger Current
versus Junction Temperature
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110
MCR08B, MCR08M
10000
100
IGT = 48 µA
10
Vpk = 400 V
1000
STATIC dv/dt (V/ µS)
IH , HOLDING CURRENT (mA)
5000
TJ = 25°C
IGT = 7 µA
1.0
500
100
TJ = 25°
50
10
125°
5.0
50°
110°
1.0
75°
0.5
0.1
1.0
10
1000
10,000
0.1
10
100
1000
10,000
100,000
RGK, GATE-CATHODE RESISTANCE (OHMS)
Figure 14. Holding Current Range versus
Gate-Cathode Resistance
Figure 15. Exponential Static dv/dt versus Junction
Temperature and Gate-Cathode Termination Resistance
10000
300 V
1000
TJ = 110°C
1000
200 V
500
100,000
RGK, GATE-CATHODE RESISTANCE (OHMS)
10000
100 V
TJ = 110°C
400 V (PEAK)
500
100
STATIC dv/dt (V/ µS)
400 V
50 V
50
500 V
10
5.0
100
RGK = 100
50
10
RGK = 1.0 k
5.0
1.0
10
100
1000
10,000
RGK = 10 k
1.0
0.01
0.1
1.0
10
RGK, GATE-CATHODE RESISTANCE (OHMS)
CGK, GATE-CATHODE CAPACITANCE (nF)
Figure 16. Exponential Static dv/dt versus Peak
Voltage and Gate-Cathode Termination Resistance
Figure 17. Exponential Static dv/dt versus
Gate-Cathode Capacitance and Resistance
10000
1000
500
STATIC dv/dt (V/ µS)
STATIC dv/dt (V/ µS)
100
100
50
IGT = 70 µA
10
IGT = 5 µA
IGT = 35 µA
5.0
1.0
10
100
IGT = 15 µA
1000
10,000
GATE-CATHODE RESISTANCE (OHMS)
Figure 18. Exponential Static dv/dt versus
Gate-Cathode Termination Resistance and
Product Trigger Current Sensitivity
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100,000
100
MCR08B, MCR08M
INFORMATION FOR USING THE SOT-223 SURFACE MOUNT PACKAGE
MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the
total design. The footprint for the semiconductor packages
must be the correct size to insure proper solder connection
interface between the board and the package. With the
correct pad geometry, the packages will self align when
subjected to a solder reflow process.
0.15
3.8
0.079
2.0
0.091
2.3
0.248
6.3
0.091
2.3
0.079
2.0
0.059
1.5
0.059
1.5
0.059
1.5
inches
mm
SOT-223
SOT-223 POWER DISSIPATION
The power dissipation of the SOT-223 is a function of the
anode pad size. This can vary from the minimum pad size
for soldering to a pad size given for maximum power
dissipation. Power dissipation for a surface mount device is
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient, and the operating
temperature, TA. Using the values provided on the data
sheet for the SOT-223 package, PD can be calculated as
follows:
PD =
The 156°C/W for the SOT-223 package assumes the use
of the recommended footprint on a glass epoxy printed
circuit board to achieve a power dissipation of 550
milliwatts. There are other alternatives to achieving higher
power dissipation from the SOT-223 package. One is to
increase the area of the anode pad. By increasing the area of
the anode pad, the power dissipation can be increased.
Although one can almost double the power dissipation with
this method, one will be giving up area on the printed
circuit board which can defeat the purpose of using surface
mount technology. A graph of RθJA versus anode pad area
is shown in Figure 3.
Another alternative would be to use a ceramic substrate
or an aluminum core board such as Thermal Clad. Using
a board material such as Thermal Clad, an aluminum core
board, the power dissipation can be doubled using the same
footprint.
TJ(max) – TA
RθJA
The values for the equation are found in the maximum
ratings table on the data sheet. Substituting these values
into the equation for an ambient temperature TA of 25°C,
one can calculate the power dissipation of the device which
in this case is 550 milliwatts.
PD = 110°C – 25°C = 550 milliwatts
156°C/W
SOLDER STENCIL GUIDELINES
or stainless steel with a typical thickness of 0.008 inches.
The stencil opening size for the SOT-223 package should
be the same as the pad size on the printed circuit board, i.e.,
a 1:1 registration.
Prior to placing surface mount components onto a printed
circuit board, solder paste must be applied to the pads. A
solder stencil is required to screen the optimum amount of
solder paste onto the footprint. The stencil is made of brass
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MCR08B, MCR08M
SOLDERING PRECAUTIONS
• The soldering temperature and time should not exceed
260°C for more than 10 seconds.
• When shifting from preheating to soldering, the
maximum temperature gradient should be 5°C or less.
• After soldering has been completed, the device should
be allowed to cool naturally for at least three minutes.
Gradual cooling should be used as the use of forced
cooling will increase the temperature gradient and
result in latent failure due to mechanical stress.
• Mechanical stress or shock should not be applied
during cooling.
The melting temperature of solder is higher than the rated
temperature of the device. When the entire device is heated
to a high temperature, failure to complete soldering within
a short time could result in device failure. Therefore, the
following items should always be observed in order to
minimize the thermal stress to which the devices are
subjected.
• Always preheat the device.
• The delta temperature between the preheat and
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When
using infrared heating with the reflow soldering
method, the difference should be a maximum of 10°C.
* Soldering a device without preheating can cause
excessive thermal shock and stress which can result in
damage to the device.
TYPICAL SOLDER HEATING PROFILE
The line on the graph shows the actual temperature that
might be experienced on the surface of a test board at or
near a central solder joint. The two profiles are based on a
high density and a low density board. The Vitronics
SMD310 convection/infrared reflow soldering system was
used to generate this profile. The type of solder used was
62/36/2 Tin Lead Silver with a melting point between
177–189°C. When this type of furnace is used for solder
reflow work, the circuit boards and solder joints tend to
heat first. The components on the board are then heated by
conduction. The circuit board, because it has a large surface
area, absorbs the thermal energy more efficiently, then
distributes this energy to the components. Because of this
effect, the main body of a component may be up to 30
degrees cooler than the adjacent solder joints.
For any given circuit board, there will be a group of
control settings that will give the desired heat pattern. The
operator must set temperatures for several heating zones,
and a figure for belt speed. Taken together, these control
settings make up a heating “profile” for that particular
circuit board. On machines controlled by a computer, the
computer remembers these profiles from one operating
session to the next. Figure 19 shows a typical heating
profile for use when soldering a surface mount device to a
printed circuit board. This profile will vary among
soldering systems but it is a good starting point. Factors that
can affect the profile include the type of soldering system in
use, density and types of components on the board, type of
solder used, and the type of board or substrate material
being used. This profile shows temperature versus time.
STEP 1
PREHEAT
ZONE 1
“RAMP”
200°C
STEP 2
STEP 3
VENT
HEATING
“SOAK” ZONES 2 & 5
“RAMP”
DESIRED CURVE FOR HIGH
MASS ASSEMBLIES
150°C
STEP 5
STEP 6 STEP 7
STEP 4
HEATING
VENT COOLING
HEATING
ZONES 3 & 6 ZONES 4 & 7
205° TO
“SPIKE”
“SOAK”
219°C
170°C
PEAK AT
SOLDER
160°C
JOINT
150°C
100°C
140°C
100°C
SOLDER IS LIQUID FOR
40 TO 80 SECONDS
(DEPENDING ON
MASS OF ASSEMBLY)
DESIRED CURVE FOR LOW
MASS ASSEMBLIES
50°C
TMAX
TIME (3 TO 7 MINUTES TOTAL)
Figure 19. Typical Solder Heating Profile
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MCR08B, MCR08M
PACKAGE DIMENSIONS
SOT–223
CASE 318E–04
ISSUE J
A
F
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
4
S
B
1
2
3
D
L
G
J
C
0.08 (0003)
H
M
INCHES
DIM MIN
MAX
A
0.249
0.263
B
0.130
0.145
C
0.060
0.068
D
0.024
0.035
F
0.115
0.126
G
0.087
0.094
H 0.0008 0.0040
J
0.009
0.014
K
0.060
0.078
L
0.033
0.041
M
0_
10 _
S
0.264
0.287
K
STYLE 10:
PIN 1. CATHODE
2. ANODE
3. GATE
4. ANODE
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MILLIMETERS
MIN
MAX
6.30
6.70
3.30
3.70
1.50
1.75
0.60
0.89
2.90
3.20
2.20
2.40
0.020
0.100
0.24
0.35
1.50
2.00
0.85
1.05
0_
10 _
6.70
7.30
MCR08B, MCR08M
Notes
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MCR08B, MCR08M
Notes
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11
MCR08B, MCR08M
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes
without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular
purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability,
including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be
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MCR08BT1/D