STMICROELECTRONICS STGW20NB60K

STGW20NB60K
N-CHANNEL 20A - 600V - TO-247
SHORT CIRCUIT PROOF PowerMESH™ IGBT
TYPE
STGW20NB60K
■
■
■
■
■
■
■
■
■
VCES
VCE(sat)
IC
600 V
< 2.8 V
20 A
HIGH INPUT IMPEDANCE (VOLTAGE DRIVEN)
LOW ON-VOLTAGE DROP (Vcesat)
LOW ON-LOSSES
LOW GATE CHARGE
HIGH CURRENT CAPABILITY
OFF LOSSES INCLUDE TAIL CURRENT
VERY HIGH FREQUENCY OPERATION
SHORT CIRCUIT RATED
LATCH CURRENT FREE OPERATION
3
2
1
TO-247
DESCRIPTION
INTERNAL SCHEMATIC DIAGRAM
Using the latest high voltage technology based on a
patented strip layout, STMicroelectronics has
designed an advanced family of IGBTs, the
PowerMESH ™ IGBTs, with outstanding
performances. The suffix “K” identifies a family
optimized for high frequency motor control
applications with short circuit withstand capability.
APPLICATIONS
■ HIGH FREQUENCY MOTOR CONTROLS
■ U.P.S.
■ WELDING EQUIPMENTS
ABSOLUTE MAXIMUM RATINGS
Symbol
Value
Unit
VCES
Collector-Emitter Voltage (VGS = 0)
600
V
VECR
Emitter-Collector Voltage
20
V
VGE
Gate-Emitter Voltage
±20
V
IC
Collector Current (continuos) at TC = 25°C
40
A
IC
Collector Current (continuos) at TC = 100°C
20
A
Collector Current (pulsed)
80
A
Short Circuit Withstand
10
µs
Total Dissipation at TC = 25°C
150
W
ICM ()
Tsc
PTOT
Parameter
Derating Factor
Tstg
Tj
May 2003
Storage Temperature
Max. Operating Junction Temperature
1
W/°C
–65 to 150
°C
150
°C
1/8
STGW20NB60K
THERMAL DATA
Rthj-case
Thermal Resistance Junction-case Max
0.83
Rthj-amb
Thermal Resistance Junction-ambient Max
62.5
°C/W
Thermal Resistance Case-heatsink Typ
0.5
°C/W
Rthc-h
°C/W
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
Symbol
VBR(CES)
Parameter
Collectro-Emitter Breakdown
Voltage
ICES
Collector cut-off
(VGE = 0)
IGES
Gate-Emitter Leakage
Current (VCE = 0)
Test Conditions
IC = 250 µA, VGE = 0
Min.
Typ.
Max.
600
Unit
V
VCE = Max Rating, TC = 25 °C
10
µA
VCE = Max Rating, TC = 125 °C
100
µA
VGE = ±20V , VCE = 0
±100
nA
Max.
Unit
7
V
2.8
V
ON (1)
Symbol
Parameter
Test Conditions
Min.
Typ.
VGE(th)
Gate Threshold Voltage
VCE = VGE, IC = 250µA
VCE(sat)
Collector-Emitter Saturation
Voltage
VGE = 15V, IC = 20 A
2.3
VGE = 15V, IC = 20 A, Tj =125°C
1.9
5
V
DYNAMIC
Symbol
Parameter
gfs
Forward Transconductance
Cies
Input Capacitance
Coes
Output Capacitance
Cres
Reverse Transfer
Capacitance
Qg
Total Gate Charge
Qge
Test Conditions
Min.
VCE = 25 V , IC =20 A
Typ.
Max.
Unit
8
S
1300
pF
200
pF
30
pF
90
nC
Gate-Emitter Charge
T.B.D.
nC
Qgc
Gate-Collector Charge
T.B.D.
nC
tscw
Short Circuit Withstand Time
VCE = 25V, f = 1 MHz, VGE = 0
VCE = 480V, IC = 20 A,
VGE = 15V
Vce = 0.5 BVces , VGE = 15 V,
Tj = 125°C , RG = 10 Ω
10
µs
SWITCHING ON
Symbol
td(on)
tr
(di/dt)on
Eon
2/8
Parameter
Turn-on Delay Time
Rise Time
Turn-on Current Slope
Turn-on Switching Losses
Test Conditions
VCC = 480 V, IC = 20 A
RG = 10Ω , VGE = 15 V
VCC= 480 V, IC = 20 A RG=10Ω
VGE = 15 V,Tj = 125°C
Min.
Typ.
Max.
Unit
20
ns
70
ns
350
A/µs
300
µJ
STGW20NB60K
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING OFF
Symbol
tc
Parameter
Cross-over Time
tr(Voff)
Off Voltage Rise Time
td(off)
Delay Time
tf
Eoff(**)
Ets
tc
Test Conditions
Vcc = 480 V, IC = 20 A,
RGE = 10 Ω , VGE = 15 V
Fall Time
Min.
Typ.
Max.
Unit
120
ns
35
ns
130
ns
80
ns
Turn-off Switching Loss
0.45
mJ
Total Switching Loss
0.6
mJ
190
ns
Cross-over Time
Vcc = 480 V, IC = 20 A,
RGE = 10 Ω , VGE = 15 V
Tj = 125 °C
tr(Voff)
Off Voltage Rise Time
55
ns
td(off)
Delay Time
160
ns
Fall Time
150
ns
Turn-off Switching Loss
0.75
mJ
Total Switching Loss
1.05
mJ
tf
Eoff(**)
Ets
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by max. junction temperature.
(**)Losses include Also the Tail (Jedec Standardization)
3/8
STGW20NB60K
Thermal Impedance
Switching Off Safe Operating Area
Output Characteristics
Transfer Characteristics
Normalized Gate Threshold Voltage vs Temp.
Transconductance
4/8
STGW20NB60K
Collector-Emitter On Voltage vs Temperature
Gate-Charge vs Gate-Emitter Voltage
Capacitance Variations
Normalized Break-down Voltage vs Temp.
Collector-Emitter on Voltage vs Collector
Current
Turn-Off Energy Losses vs Temperature
5/8
STGW20NB60K
Fig. 1: Gate Charge test Circuit
6/8
Fig. 2: Test Circuit For Inductive Load Switching
STGW20NB60K
TO-247 MECHANICAL DATA
DIM.
mm.
MIN.
TYP
inch
MAX.
MIN.
TYP.
MAX.
A
4.85
5.15
0.19
0.20
D
2.20
2.60
0.08
0.10
E
0.40
0.80
0.015
0.03
F
1
1.40
0.04
F1
3
F2
0.05
0.11
2
0.07
F3
2
2.40
0.07
0.09
F4
3
3.40
0.11
0.13
G
10.90
0.43
H
15.45
15.75
0.60
0.62
L
19.85
20.15
0.78
0.79
L1
3.70
4.30
0.14
0.17
L2
L3
18.50
14.20
L4
14.80
0.56
34.60
L5
M
0.72
5.50
2
0.58
1.36
0.21
3
0.07
0.11
V
5º
5º
V2
60º
60º
Dia
3.55
3.65
0.14
0.143
7/8
STGW20NB60K
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from
its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications
mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or
systems without express written approval of STMicroelectronics.
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© 2003 STMicroelectronics - Printed in Italy - All Rights Reserved
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